CN111584518B - Array substrate, manufacturing method thereof and display panel - Google Patents
Array substrate, manufacturing method thereof and display panel Download PDFInfo
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- 239000000758 substrate Substances 0.000 title claims abstract description 82
- 238000004519 manufacturing process Methods 0.000 title abstract description 11
- 229910052751 metal Inorganic materials 0.000 claims abstract description 69
- 239000002184 metal Substances 0.000 claims abstract description 69
- 229910052755 nonmetal Inorganic materials 0.000 claims abstract description 5
- 239000010410 layer Substances 0.000 claims description 222
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 claims description 28
- 239000011229 interlayer Substances 0.000 claims description 23
- 239000002131 composite material Substances 0.000 claims description 12
- 238000002161 passivation Methods 0.000 claims description 11
- 239000004973 liquid crystal related substance Substances 0.000 claims description 4
- 238000003466 welding Methods 0.000 claims description 3
- 239000010408 film Substances 0.000 description 27
- 238000000151 deposition Methods 0.000 description 19
- 238000005516 engineering process Methods 0.000 description 15
- 238000005530 etching Methods 0.000 description 9
- 239000010409 thin film Substances 0.000 description 8
- 150000002500 ions Chemical class 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229920005591 polysilicon Polymers 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
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- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1345—Conductors connecting electrodes to cell terminals
- G02F1/13452—Conductors connecting driver circuitry and terminals of panels
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- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136277—Active matrix addressed cells formed on a semiconductor substrate, e.g. of silicon
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- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
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Abstract
一种阵列基板和其制作方法,以及一种显示面板,所述阵列基板包括与软性电路板相连接的侧面绑定结构,所述软性电路板包括驱动晶片,所述侧面绑定结构与所述驱动晶片通过所述软性电路板电性连接。所述侧面绑定结构包括第一区域和第二区域,所述第一区域包括衬底、多层非金属膜层和多层金属膜层,所述第二区域包括所述衬底和所述多层金属膜层。
An array substrate and a manufacturing method thereof, and a display panel, the array substrate includes a side binding structure connected to a flexible circuit board, the flexible circuit board includes a driving chip, and the side binding structure is The driving chip is electrically connected through the flexible circuit board. The side bonding structure includes a first region and a second region, the first region includes a substrate, a multi-layer non-metal film layer and a multi-layer metal film layer, and the second region includes the substrate and the multi-layer metal film layer. Multi-layer metal film layers.
Description
技术领域technical field
本发明涉及显示技术领域,尤其涉及于一种阵列基板和其制作方法,以及一种显示面板。The present invention relates to the field of display technology, in particular to an array substrate and a manufacturing method thereof, and a display panel.
背景技术Background technique
随着液晶显示屏(liquid crystal display,LCD)技术的不断发展,消费者对于轻薄化电子产品的屏占比要求越来越高,全面屏已成为移动终端发展的主流。因此,人们开发了各种微型组件技术,例如:覆晶玻璃(chip on glass,COG)技术和覆晶薄膜(chip onfilm,COF)技术。具体地,COG技术是将驱动晶片绑定在薄膜电晶体阵列基板(TFT arraysubstrate)的玻璃底板之上,而COF技术是将驱动晶片绑定在软性板上,再将软性版与薄膜电晶体阵列基板(TFT array substrate)的玻璃基板连接。然而,无论是COG技术或COF技术均无法满足全面屏的需求,促使了侧面绑定技术的诞生。With the continuous development of liquid crystal display (LCD) technology, consumers have higher and higher requirements for the screen ratio of thin and light electronic products, and full screen has become the mainstream of mobile terminal development. Therefore, various micro-component technologies have been developed, such as: chip on glass (COG) technology and chip on film (COF) technology. Specifically, the COG technology is to bind the driver wafer on the glass bottom plate of the thin film transistor array substrate (TFT array substrate), while the COF technology is to bind the driver wafer to the flexible board, and then the flexible plate and the TFT array substrate are bound. The glass substrate of the TFT array substrate is connected. However, neither COG technology nor COF technology can meet the needs of full screen, which prompted the birth of side binding technology.
传统侧面绑定技术受限于薄膜电晶体阵列基板(TFT array substrate)侧面金属面积(通常仅有栅极层与软性版连接),使得导电离子个数较少,器件的导通性较差。The traditional side bonding technology is limited by the metal area on the side of the thin film transistor array substrate (usually only the gate layer is connected to the flexible plate), which makes the number of conductive ions less and the conductivity of the device is poor. .
发明内容SUMMARY OF THE INVENTION
本申请的目的在于提供一种阵列基板和其制作方法,以及一种显示面板,通过掩模板对薄膜电晶体阵列基板(TFT array substrate)的侧面膜层进行优化,大幅度提升了绑定区域的导通面积。The purpose of the present application is to provide an array substrate and a manufacturing method thereof, and a display panel, which optimizes the side film layer of a thin film transistor array substrate (TFT array substrate) through a mask, which greatly improves the binding area. conduction area.
本申请提供一种阵列基板,包括与软性电路板相连接的侧面绑定结构,所述软性电路板包括驱动晶片,所述侧面绑定结构与所述驱动晶片通过所述软性电路板电性连接;The present application provides an array substrate, which includes a side binding structure connected to a flexible circuit board, the flexible circuit board includes a driving chip, and the side binding structure and the driving chip pass through the flexible circuit board electrical connection;
其中,所述侧面绑定结构包括第一区域和第二区域,所述第一区域包括衬底、多层非金属膜层和多层金属膜层,所述第二区域包括所述衬底和所述多层金属膜层。Wherein, the side bonding structure includes a first region and a second region, the first region includes a substrate, a multi-layer non-metal film layer and a multi-layer metal film layer, and the second region includes the substrate and the multi-layer metal film layer. the multi-layer metal film layer.
根据本发明的一个实施例,所述第一区域内之所述多层金属膜层与所述第二区域内之所述多层金属膜层为连续的结构。According to an embodiment of the present invention, the multi-layer metal film layer in the first region and the multi-layer metal film layer in the second region are continuous structures.
根据本发明的一个实施例,所述第一区域从下至上包括:所述衬底、复合层、栅极绝缘层、栅极层、层间介电层、第一金属层、平坦层、第一氧化铟锡层、层间绝缘层、第二金属层、钝化层以及第二氧化铟锡层。According to an embodiment of the present invention, the first region includes from bottom to top: the substrate, the composite layer, the gate insulating layer, the gate layer, the interlayer dielectric layer, the first metal layer, the flat layer, the first An indium tin oxide layer, an interlayer insulating layer, a second metal layer, a passivation layer and a second indium tin oxide layer.
根据本发明的一个实施例,所述第二区域从下至上包括:所述衬底、栅极层、第一金属层、第一氧化铟锡层、第二金属层以及第二氧化铟锡层。According to an embodiment of the present invention, the second region includes from bottom to top: the substrate, a gate layer, a first metal layer, a first indium tin oxide layer, a second metal layer, and a second indium tin oxide layer .
根据本发明的一个实施例,所述侧面绑定结构与所述软性电路板通过焊接的方式相连接。According to an embodiment of the present invention, the side binding structure is connected to the flexible circuit board by welding.
进一步地,本申请还提供一种阵列基板的制作方法,包括以下步骤:Further, the present application also provides a method for fabricating an array substrate, comprising the following steps:
提供衬底;provide a substrate;
在所述衬底之上沉积复合层,在所述复合层之上沉积栅极绝缘层;depositing a composite layer on the substrate, depositing a gate insulating layer on the composite layer;
使用掩模板将第二区域内之所述复合层和所述栅极绝缘层刻蚀;etching the composite layer and the gate insulating layer in the second region using a mask;
在第一区域内之所述栅极绝缘层之上和所述第二区域内之所述衬底之上沉积栅极层;depositing a gate layer over the gate insulating layer in the first region and over the substrate in the second region;
在所述栅极层之上沉积层间介电层,使用掩模板将所述第二区域内之所述层间介电层刻蚀;depositing an interlayer dielectric layer on the gate layer, and etching the interlayer dielectric layer in the second region using a mask;
在所述第一区域内之所述层间介电层之上和所述第二区域内之所述栅极层之上沉积第一金属层;depositing a first metal layer over the interlayer dielectric layer in the first region and over the gate layer in the second region;
在所述第一金属层之上沉积平坦层,使用掩模板将所述第二区域内之所述平坦层刻蚀;depositing a flat layer on the first metal layer, and etching the flat layer in the second region using a mask;
在所述第一区域内之所述平坦层之上和所述第二区域内之所述第一金属层之上沉积第一氧化铟锡层;depositing a first indium tin oxide layer over the planar layer in the first region and over the first metal layer in the second region;
在所述第一氧化铟锡层之上沉积层间绝缘层,使用掩模板将所述第二区域内之所述层间绝缘层刻蚀;depositing an interlayer insulating layer on the first indium tin oxide layer, and etching the interlayer insulating layer in the second region using a mask;
在所述第一区域内之所述层间绝缘层之上和所述第二区域内之所述第一氧化铟锡层之上沉积第二金属层;depositing a second metal layer over the interlayer insulating layer in the first region and over the first indium tin oxide layer in the second region;
在所述第二金属层之上沉积钝化层,使用掩模板将所述第二区域内之所述钝化层刻蚀;以及depositing a passivation layer over the second metal layer, and etching the passivation layer in the second region using a mask; and
在所述第一区域内之所述钝化层之上和所述第二区域内之所述第二金属层之上沉积第二氧化铟锡层。A second indium tin oxide layer is deposited over the passivation layer in the first region and over the second metal layer in the second region.
进一步地,本申请还提供一种显示面板,包括阵列基板、彩膜基板以及设置在所述阵列基板和所述彩膜基板之间的液晶层,所述阵列基板包括与软性电路板相连接的侧面绑定结构,所述软性电路板包括驱动晶片,所述侧面绑定结构与所述驱动晶片通过所述软性电路板电性连接;Further, the present application also provides a display panel, including an array substrate, a color filter substrate, and a liquid crystal layer disposed between the array substrate and the color filter substrate, the array substrate including a flexible circuit board connected The side binding structure, the flexible circuit board includes a driving chip, and the side binding structure and the driving chip are electrically connected through the flexible circuit board;
其中,所述侧面绑定结构包括第一区域和第二区域,所述第一区域包括衬底、多层金属膜层和多层金属膜层,所述第二区域包括所述衬底和所述多层金属膜层。Wherein, the side bonding structure includes a first region and a second region, the first region includes a substrate, a multi-layer metal film layer and a multi-layer metal film layer, and the second region includes the substrate and the The multi-layer metal film layer.
根据本发明的一个实施例,所述第一区域内之所述多层金属膜层与所述第二区域内之所述多层金属膜层为连续的结构。According to an embodiment of the present invention, the multi-layer metal film layer in the first region and the multi-layer metal film layer in the second region are continuous structures.
根据本发明的一个实施例,所述第一区域从下至上包括:所述衬底、复合层、栅极绝缘层、栅极层、层间介电层、第一金属层、平坦层、第一氧化铟锡层、层间绝缘层、第二金属层、钝化层以及第二氧化铟锡层。According to an embodiment of the present invention, the first region includes from bottom to top: the substrate, the composite layer, the gate insulating layer, the gate layer, the interlayer dielectric layer, the first metal layer, the flat layer, the first An indium tin oxide layer, an interlayer insulating layer, a second metal layer, a passivation layer and a second indium tin oxide layer.
根据本发明的一个实施例,所述第二区域从下至上包括:所述衬底、栅极层、第一金属层、第一氧化铟锡层、第二金属层以及第二氧化铟锡层。According to an embodiment of the present invention, the second region includes from bottom to top: the substrate, a gate layer, a first metal layer, a first indium tin oxide layer, a second metal layer, and a second indium tin oxide layer .
本申请提供了一种阵列基板和其制作方法,以及一种显示面板,通过掩模板对薄膜电晶体阵列基板(TFT array substrate)的侧面膜层进行优化,大幅度提升了绑定区域的导通面积,解决了传统侧面绑定技术受限于薄膜电晶体阵列基板(TFT arraysubstrate)侧面金属面积,使得导电离子个数较少,器件的导通性较差的问题。The present application provides an array substrate and a manufacturing method thereof, and a display panel. The side film layer of a thin film transistor array substrate (TFT array substrate) is optimized through a mask, which greatly improves the conduction of the bonding area. It solves the problem that the traditional side bonding technology is limited by the metal area on the side of the thin film transistor array substrate (TFT array substrate), so that the number of conductive ions is small and the conductivity of the device is poor.
附图说明Description of drawings
为了更清楚地说明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单介绍,显而易见地,下面描述中的附图仅仅是发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to more clearly illustrate the embodiments or technical solutions in the prior art, the following briefly introduces the accompanying drawings that are used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only for invention. In some embodiments, for those of ordinary skill in the art, other drawings can also be obtained according to these drawings without any creative effort.
附图中,In the attached drawings,
图1为本申请实施例所提供的阵列基板之侧面绑定结构的剖面示意图。FIG. 1 is a schematic cross-sectional view of a side bonding structure of an array substrate according to an embodiment of the present application.
图2为本申请实施例所提供的阵列基板的制作方法的步骤流程图。FIG. 2 is a flow chart of steps of a method for fabricating an array substrate provided by an embodiment of the present application.
图3为本申请实施例所提供的显示面板的透视示意图。FIG. 3 is a schematic perspective view of a display panel provided by an embodiment of the present application.
图4为本申请实施例所提供的显示面板的侧视图。FIG. 4 is a side view of a display panel provided by an embodiment of the present application.
具体实施方式Detailed ways
为更进一步阐述本发明所采取的技术手段及其效果,以下结合本发明的优选实施例及其附图进行详细描述。In order to further illustrate the technical means adopted by the present invention and its effects, a detailed description is given below in conjunction with the preferred embodiments of the present invention and the accompanying drawings.
在本申请的描述中,需要理解的是,术语“上”、“下”等指示的方位或位置关系为基于附图所示的方位或位置关系,仅是为了便于描述本申请和简化描述,而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作,因此不能理解为对本申请的限制。In the description of the present application, it should be understood that the orientation or positional relationship indicated by the terms "upper", "lower", etc. is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing the present application and simplifying the description, It is not intended to indicate or imply that the device or element referred to must have a particular orientation, be constructed and operate in a particular orientation, and therefore should not be construed as limiting the application.
请参考图1,本申请的一个实施例提供一种阵列基板,包括与软性电路板相连接的侧面绑定结构100,所述软性电路板包括驱动晶片,所述侧面绑定结构100与所述驱动晶片通过所述软性电路板电性连接。Referring to FIG. 1 , an embodiment of the present application provides an array substrate, which includes a
请参考图1,所述侧面绑定结构100可以包括第一区域和第二区域,所述第一区域从下至上包括:所述衬底1000、复合层1001、栅极绝缘层1002、栅极层1003、层间介电层1004、第一金属层1005、平坦层1006、第一氧化铟锡层1007、层间绝缘层1008、第二金属层1009、钝化层1010以及第二氧化铟锡层1011。所述第二区域从下至上包括:所述衬底1000、第一金属层1005、第一氧化铟锡层1007、第二金属层1009以及第二氧化铟锡层1011。在本实施例中,所述第一区域包括所述衬底1000、多层金属膜层以及多层非金属膜层,所述第二区域仅包括衬底1000和所述多层金属膜层,因此,所述侧面绑定结构100的上表面为凸凹结构,而所述第一区域相较于所述第二区域多了非金属膜层。本实施例所提供的侧面绑定结构100相较于传统的侧面绑定结构多出了多层金属膜层,因此,与具有驱动晶片的软性电路板的导通面积大幅增加,克服了传统侧面绑定技术导电离子个数较少,器件的导通性较差的问题,并显著降低了产品的失效风险。另一方面,所述非金属膜层能够增加所述多层金属膜层的稳定性,防止其剥落或产生异常,确保器件能够正常运作。Referring to FIG. 1 , the
需要说明的是,本实施例所限定的所述第一区域与所述第二区域可以为不规则的形状。It should be noted that, the first region and the second region defined in this embodiment may have irregular shapes.
在本实施例中,所述阵列基板可以为薄膜电晶体阵列基板。In this embodiment, the array substrate may be a thin film transistor array substrate.
在本实施例中,所述复合层1001可以包括氮化硅(SIN)层、氧化硅(SIO)层以及多晶硅(Poly-Si)层。In this embodiment, the
在本实施例中,所述第一金属层1005可以为源漏极层。In this embodiment, the
在本实施例中,所述层间绝缘层1008的材料可以为SIN或SIO。In this embodiment, the material of the interlayer insulating
在本实施例中,所述第二金属层1009可以为像素电极层。In this embodiment, the
在本实施例中,由于所述第一区域内之所述多层金属膜层与所述第二区域内之所述多层金属膜层为一体成型,其具有连续的结构,可以确保所述侧面绑定结构100与所述软性电路板的电连接,并加强器件的稳定性。In this embodiment, since the multi-layer metal film layer in the first area and the multi-layer metal film layer in the second area are integrally formed, they have a continuous structure, which can ensure the The
在本实施例中,所述第一区域和所述第二区域的数量可以为多个,且交替设置,使得所述侧面绑定结构100的表面形成凹凸不平的结构,在此不对所述第一区域和所述第二区域的数量做限制,所述领域技术人员可依据本实施例所提供的构思决定其数量已达到预设的器件性能。In this embodiment, the number of the first area and the second area may be multiple and alternately arranged, so that the surface of the
在本实施例中,由于所述侧面绑定结构100与所述软性电路板的导通面积增加,所述绑定结构100和所述软性电路板可以直接通过焊接的方式实现电连接,而无须使用中间物将两者黏接,降低了产品的生产成本,简化了生产工艺,并增加了产品的可靠性。In this embodiment, since the conductive area between the
进一步地,请参考图2,本申请的另一个实施例还提供一种阵列基板的制作方法,包括以下步骤:Further, please refer to FIG. 2 , another embodiment of the present application further provides a method for fabricating an array substrate, including the following steps:
S1:提供衬底;S1: Provide substrate;
S2:在所述衬底之上沉积复合层,在所述复合层之上沉积栅极绝缘层;S2: depositing a composite layer on the substrate, and depositing a gate insulating layer on the composite layer;
S3:使用掩模板将第二区域内之所述复合层和所述栅极绝缘层刻蚀;S3: etching the composite layer and the gate insulating layer in the second region using a mask;
S4:在第一区域内之所述栅极绝缘层之上和所述第二区域内之所述衬底之上沉积栅极层;S4: depositing a gate layer on the gate insulating layer in the first region and on the substrate in the second region;
S5:在所述栅极层上沉积层间介电层,使用掩模板将所述第二区域内之所述层间介电层刻蚀;S5: depositing an interlayer dielectric layer on the gate layer, and etching the interlayer dielectric layer in the second region using a mask;
S6:在所述第一区域内之所述层间介电层之上和所述第二区域内之所述栅极层上沉积第一金属层;S6: depositing a first metal layer on the interlayer dielectric layer in the first region and on the gate layer in the second region;
S7:在所述第一金属层之上沉积平坦层,使用掩模板将所述第二区域内之所述平坦层刻蚀;S7: deposit a flat layer on the first metal layer, and use a mask to etch the flat layer in the second region;
S8:在所述第一区域内之所述平坦层之上和所述第二区域内之所述第一金属层之上沉积第一氧化铟锡层;S8: depositing a first indium tin oxide layer on the flat layer in the first region and on the first metal layer in the second region;
S9:在所述第一氧化铟锡层之上沉积层间绝缘层,使用掩模板将所述第二区域内之所述层间绝缘层刻蚀;S9: depositing an interlayer insulating layer on the first indium tin oxide layer, and etching the interlayer insulating layer in the second region using a mask;
S10:在所述第一区域内之所述层间绝缘层之上和所述第二区域内之所第一氧化铟锡层之上沉积第二金属层;S10: depositing a second metal layer on the interlayer insulating layer in the first region and on the first indium tin oxide layer in the second region;
S11:在所述第二金属层之上沉积钝化层,使用掩模板将所述第二区域之所述钝化层刻蚀;以及S11: depositing a passivation layer on the second metal layer, and etching the passivation layer in the second region using a mask; and
S12:在所述第一区域内之所述钝化层之上和所述第二区域内之所述第金属层之上沉积第二氧化铟锡层。S12: Deposit a second indium tin oxide layer on the passivation layer in the first region and on the metal layer in the second region.
需要说明的是,由于所述第一区域内之所述多层金属膜层与所述第二区域内之所述多层金属膜层为一体成型,其具有连续的结构,可以确保所述侧面绑定结构与所述软性电路板的电连接,并加强器件的稳定性。It should be noted that, since the multi-layer metal film layer in the first area and the multi-layer metal film layer in the second area are integrally formed, they have a continuous structure, which can ensure the side surface. The binding structure is electrically connected to the flexible circuit board and enhances the stability of the device.
本实施例所提供的阵列基板的制作方法流程简单,通过优化阵列基板绑定区域的膜层设计以解决传统侧面绑定技术受限于TFT array substrate侧面金属面积,使得导电离子个数较少,器件的导通性较差的问题。The manufacturing method of the array substrate provided in this embodiment is simple. By optimizing the film layer design of the bonding area of the array substrate, the traditional side bonding technology is limited by the metal area on the side of the TFT array substrate, so that the number of conductive ions is small. The problem of poor conductivity of the device.
进一步地,请参考图3和图4,本申请的另一个实施例还提供一种显示面板1,包括阵列基板10、彩膜基板30以及设置在所述阵列基板10和所述彩膜基板30之间的液晶层20,所述阵列基板10包括与软性电路板50相连接的侧面绑定结构100,所述软性电路板50包括驱动晶片40,所述侧面绑定结构100与所述驱动晶片40通过所述软性电路板50电性连接,关于所述侧面绑定结构100之具体结构可参考前述实施例,在此不再赘述。Further, please refer to FIG. 3 and FIG. 4 , another embodiment of the present application further provides a
需要说明的是,请参考图4,由于所述侧面绑定结构100与所述软性电路板50的导通面积增加,所述软性电路板50可以直接焊接在所述侧面绑定结构100的侧面以实现所述驱动晶片40与所述阵列基板10的电连接,无须通过中间物将两者黏接,降低了产品的生产成本,简化了生产工艺,并增加了产品的可靠性。It should be noted that, please refer to FIG. 4 , since the conductive area between the
本申请提供了一种阵列基板和其制作方法,以及一种显示面板,通过掩模板对薄膜电晶体阵列基板(TFT array substrate)的侧面膜层进行优化,大幅度提升了绑定区域的导通面积,解决了传统侧面绑定技术受限于薄膜电晶体阵列基板(TFT arraysubstrate)侧面金属面积,使得导电离子个数较少,器件的导通性较差的问题。The present application provides an array substrate and a manufacturing method thereof, and a display panel. The side film layer of a thin film transistor array substrate (TFT array substrate) is optimized through a mask, which greatly improves the conduction of the bonding area. It solves the problem that the traditional side bonding technology is limited by the metal area on the side of the thin film transistor array substrate (TFT array substrate), so that the number of conductive ions is small and the conductivity of the device is poor.
以上所述,仅是本发明的较佳实施例而已,并非对本发明作任何形式上的限制,虽然本发明已以较佳实施例揭露如上,然而并非用以限定本发明,任何熟悉本专业的技术人员,在不脱离本发明技术方案范围内,当可利用上述揭示的技术内容作出些许更动或修饰为等同变化的等效实施例,但凡是未脱离本发明技术方案内容,依据本发明的技术实质对以上实施例所作的任何简单修改、等同变化与修饰,均仍属于本发明技术方案的范围内。The above are only preferred embodiments of the present invention, and do not limit the present invention in any form. Although the present invention has been disclosed above with preferred embodiments, it is not intended to limit the present invention. Technical personnel, within the scope of the technical solution of the present invention, can make some changes or modifications to equivalent examples of equivalent changes by using the technical content disclosed above, provided that the content of the technical solution of the present invention is not deviated from, according to the present invention. Any simple modifications, equivalent changes and modifications made to the above embodiments still fall within the scope of the technical solutions of the present invention.
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