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CN111569963B - Horizontal nano-channel array, micro-nano fluidic chip and manufacturing method thereof - Google Patents

Horizontal nano-channel array, micro-nano fluidic chip and manufacturing method thereof Download PDF

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CN111569963B
CN111569963B CN202010438674.5A CN202010438674A CN111569963B CN 111569963 B CN111569963 B CN 111569963B CN 202010438674 A CN202010438674 A CN 202010438674A CN 111569963 B CN111569963 B CN 111569963B
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周娜
李俊杰
高建峰
杨涛
李俊峰
王文武
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Abstract

一种水平纳米通道阵列、微纳流控芯片及其制作方法,所述制作方法包括如下步骤:步骤1:在衬底上形成图形化的掩膜层;步骤2:以图形化的掩膜层为掩膜,对衬底进行刻蚀形成若干个扇贝状柱;步骤3:利用自限制氧化,在扇贝状柱上形成水平纳米线阵列;步骤4:对衬底的被刻蚀区域进行填充;步骤5:采用湿法腐蚀释放水平纳米线阵列,形成水平纳米通道阵列。本发明提出了一种工艺简单,与集成电路工艺相兼容且适宜批量生产的硅基水平纳米通道阵列制作方法。

Figure 202010438674

A horizontal nanochannel array, a micro-nanofluidic chip and a manufacturing method thereof, the manufacturing method comprises the following steps: step 1: forming a patterned mask layer on a substrate; step 2: using the patterned mask layer As a mask, the substrate is etched to form several scallop-shaped columns; step 3: using self-limited oxidation to form a horizontal nanowire array on the scallop-shaped columns; step 4: filling the etched area of the substrate; Step 5: using wet etching to release the horizontal nanowire array to form a horizontal nanochannel array. The present invention provides a silicon-based horizontal nano-channel array fabrication method which is simple in process, compatible with integrated circuit process and suitable for mass production.

Figure 202010438674

Description

Horizontal nano-channel array, micro-nano fluidic chip and manufacturing method thereof
Technical Field
The invention relates to the technical field of semiconductor integrated circuits, in particular to a horizontal nanochannel array, a micro-nanofluidic chip and a manufacturing method thereof.
Background
The Micro-nano fluidic chip integrates some functional components on a chip with the size of a coin to form a Micro-nano channel network for controlling fluid to penetrate through the whole system, so that partial functions of a conventional chemical or biological laboratory are realized. When the size of the flow channel features integrated on the micro-nano fluidic chip is reduced to the micro-scale or even nano-scale, the fluid passing through the flow channel can generate fluid features different from the macro-scale under the combined influence of van der waals force, electrostatic force, capillary force and the like. The characteristics have important influence on the application of the micro-nano fluidic chip in the aspects of fluid control, biosensing, protein detection, DNA sequencing and the like. Therefore, in order to explore the special properties of the fluid in the micro-nano fluidic system, a suitable micro-nano fluidic system with specific nano channels needs to be established.
At present, the main structural forms of the micro-nano flow control chip based on the nano channel include a horizontal channel and a vertical channel, wherein the nano channel of the horizontal nano flow control chip is positioned in the horizontal direction and is connected with micro liquid storage tanks at two sides. The micro-nano flow control channel with the structure form still has certain problems in the process technology at present. For example, the manufacturing method for manufacturing the micro-nano flow channel chip with the horizontal structure is complex, the process is incompatible with the integrated circuit process, the electron beam lithography technology has low lithography efficiency, and batch production cannot be realized.
Disclosure of Invention
In view of the above, the main objective of the present invention is to provide a horizontal nanochannel array, a micro-nanofluidic chip and a manufacturing method thereof, so as to at least partially solve at least one of the above-mentioned technical problems.
In order to achieve the purpose, the scheme of the invention is as follows:
as an aspect of the present invention, there is provided a method for fabricating a horizontal nanochannel array, comprising the steps of:
step 1: forming a patterned mask layer on a substrate;
step 2: etching the substrate by taking the patterned mask layer as a mask to form a plurality of scallop-shaped columns;
and step 3: forming a horizontal nanowire array on the scallop-shaped column by self-limiting oxidation;
and 4, step 4: filling the etched area of the substrate;
and 5: and releasing the horizontal nano-wire array by adopting wet etching to form a horizontal nano-channel array.
As another aspect of the present invention, there is also provided a horizontal nanochannel array produced by the method for producing a horizontal nanochannel array as described above.
As a further aspect of the present invention, there is also provided a micro-nanofluidic chip comprising the horizontal nanochannel array as described above.
Based on the technical scheme, compared with the prior art, the invention has at least one or one part of the following beneficial effects:
the method adopts a conventional silicon-based material as a substrate, scalloped columns are formed by etching, a horizontal nano-wire array is formed by self-limiting oxidation, and a horizontal nano-channel array is formed by wet corrosion release; in summary, the invention provides a method for manufacturing a silicon-based horizontal nano-channel array, which has simple process, is compatible with integrated circuit process and is suitable for batch production;
(1) the invention adopts a cycle etching method of anisotropic etching-oxidation-isotropic etching or Bosch process to form one or more scallop columns, and then controls the minimum size and precision by a self-limiting oxidation mode to form a horizontal nanowire array without completely depending on the photoetching technology;
(2) the patterned mask layer can be formed by adopting film growth and electron beam patterning or by adopting a side wall transfer mode, and the side wall transfer mode is favorable for realizing the small-size patterned mask layer;
(3) the invention adopts the double-layer structure of the silicon oxide layer and the silicon nitride layer as the mask, which is beneficial to ensuring the circular shape of the etched and self-limited oxidized nanowire.
Drawings
FIG. 1 is a schematic flow chart illustrating the fabrication of horizontal nanochannel arrays according to examples 1-3 of the present invention;
FIG. 2 is a schematic view of a horizontal nanochannel array of example 1 of the present invention;
fig. 3 is a schematic process diagram of the patterned mask layer formed in step 1 in embodiment 1 of the present invention;
fig. 4 is a schematic process diagram of the patterned mask layer formed in step 1 in embodiment 3 of the present invention;
FIG. 5 is a schematic view of a scallop-shaped column formed in step 2 in example 1 of the present invention;
FIG. 6 is a top view of a real object of a scallop-shaped column of example 1 of the invention;
FIG. 7 is a side view of a real object of a scallop-shaped column of example 1 of the invention;
FIG. 8 is a schematic view of an array of horizontal nanowires formed in step 3 of example 1;
FIG. 9 is a schematic side view of an array of self-limiting oxidized horizontal nanowires of example 1 of the invention;
FIG. 10 is a schematic representation of a filled sample formed in step 4 of example 1 of the present invention.
In the above figures, the reference numerals have the following meanings:
1. a substrate; 2. a patterned mask layer; 21. a silicon oxide layer; 22. a silicon nitride layer; 23. a silicon layer; 3. a scallop-shaped column; 31. a vertical portion; 32. an inner concave portion; 4. a horizontal nanowire array; 5. a horizontal nanochannel array.
Detailed Description
The invention provides a silicon-based nano-channel technology which is simple in process, compatible with an integrated circuit process and suitable for batch production. The invention adopts a conventional silicon substrate, manufactures silicon nanowires through film growth and common photoetching (or electron beams) and special etching technology, and then releases the silicon nanowires to form one or more horizontal nano-channel arrays.
In order that the objects, technical solutions and advantages of the present invention will become more apparent, the present invention will be further described in detail with reference to the accompanying drawings in conjunction with the following specific embodiments.
Example 1
In a first exemplary embodiment of the present invention, a method for fabricating a horizontal nanochannel array is provided, as shown in fig. 1, comprising the steps of:
step 1: forming a patterned mask layer 2 on a substrate 1;
step 2: etching the substrate 1 by taking the patterned mask layer 2 as a mask to form a plurality of scallop-shaped columns 3;
and step 3: forming a horizontal nanowire array 4 on the scallop-shaped column 3 by self-limiting oxidation;
and 4, step 4: filling the etched area of the substrate 1;
and 5: and (3) releasing the horizontal nano-wire array 4 by adopting wet etching to form a horizontal nano-channel array 5.
In the embodiment of the present invention, as shown in fig. 3, step 1 specifically includes the following sub-steps:
substep 111: forming a mask layer on a substrate 1;
more specifically, the mask layer includes a silicon oxide layer 21 and a silicon nitride layer 22 from bottom to top, the silicon oxide layer 21 may be grown by a chemical vapor deposition method or a thermal oxidation method, and the silicon nitride layer 22 may be grown by a chemical vapor deposition method.
Substep 112: forming a pattern on the mask layer by adopting electron beam lithography;
in other embodiments of the present invention, the mask layer is not limited thereto, and the mask layer may be the silicon nitride layer 22 alone, but when only the silicon nitride layer 22 is used as the mask, the first nanowire after self-limiting oxidation is triangular, and when the mask layer with a double-layer structure is used as the mask, the nanowire is more favorable to form a circular shape.
In the embodiment of the invention, in the step 2, the specific steps of etching the substrate 1 to form the plurality of scalloped pillars 3 are to repeatedly and alternately perform anisotropic etching, oxidation and isotropic etching on the substrate 1 to form the plurality of scalloped pillars 3 as shown in fig. 5;
in the embodiment of the invention, the single-period anisotropic etching, oxidation and isotropic etching specifically comprises the following sub-steps:
substep 211: removing an oxide layer on the surface of the substrate 1;
substep 212: forming a vertical portion 31 on the substrate 1 by anisotropic etching;
substep 213: oxidizing the surface of the vertical portion 31 to form a protective layer;
substep 214: removing the protective layer on the surface of the substrate 1;
substep 215: forming an inner concave portion 32 on the substrate 1 by isotropic etching;
substep 216: oxidizing the surface of the inner recess 32;
the anisotropic etching specifically comprises the following steps: the upper radio frequency power is 500W-5000W, and the lower radio frequency power is 10W-200W; etching by adopting fluorine-based gas; the etching time is 1-100 s;
more specifically, the fluorine-based gas may be CF4、CHF3Or SF6Preferably SF6A gas;
the isotropic etching specifically comprises the following steps: only starting an upper radio frequency source, wherein the upper radio frequency power is 500-5000W; etching by adopting fluorine-based gas; the etching time is 1 s-100 s; fluorine radicalThe gas may be CF4、CHF3Or SF6Preferably SF6A gas;
wherein, the oxidation is specifically as follows: only starting an upper radio frequency source, wherein the upper radio frequency power is 500-5000W; by the use of O2Oxidizing by using fluorine-based gas; the oxidation time is 1 s-100 s; the fluorine-based gas may be CF4、CHF3Or SF6Preferably SF6A gas.
In an embodiment of the present invention, the anisotropic etching-oxidation-isotropic etching process is performed cyclically, the number of cycles being related to the number of nanowires formed. In example 1 of the present invention, the number of cycles of anisotropic etch-oxidation-isotropic etch is three.
In the embodiment of the present invention, as shown in fig. 6 and 7, the scallop-shaped pillar shape and the size rule obtained by the method for manufacturing the horizontal nano-channel array of the present invention are controllable.
In the embodiment of the present invention, as shown in fig. 8, in step 3, the self-limiting oxidation means that the oxidation stops automatically when the oxidation is completed to a certain degree, so as to form the nanowire structure wrapped by the oxide layer.
Wherein, the self-limiting oxidation adopts high-temperature furnace tube oxidation or rapid thermal annealing oxidation;
wherein the self-limiting oxidation temperature is 800-1100 ℃, and the time is 10 min-5 h.
Wherein the cross-sectional shape of the single horizontal nanowire is circular or elliptical.
In the embodiment of the present invention, as shown in fig. 9, the nanowire array obtained by the method for manufacturing a horizontal nanochannel array of the present invention has controllable nanowire morphology and size rules.
In the embodiment of the invention, in step 4, the etched area of the substrate 1 is filled by adopting a chemical vapor deposition method, and then the surface is mechanically flattened;
the fill dielectric comprises silicon oxide or silicon nitride, preferably silicon oxide.
In an embodiment of the invention, the silicon oxide is filled, and the substrate 1 is filled with HARP (high Aspect Ratio Process)The grooves have good HARP filling capacity, and mainly use large flow of tetraethyl orthosilicate (TEOS) and O3Carrying out thermochemical reaction to form; chemical mechanical planarization is then used to the surface of the mask layer, resulting in the filled sample shown in fig. 10.
In the embodiment of the invention, in step 5, the horizontal nanowire array 4 is released by wet etching to form the horizontal nanochannel array 5 as shown in fig. 2;
in the step 5, the etching solution adopted by the wet etching comprises tetramethyl ammonium hydroxide or potassium hydroxide; the material of the substrate 1 includes monocrystalline silicon, silicon carbide, silicon germanium or glass silicon.
Thus, a method for fabricating a horizontal nanochannel array according to the first exemplary embodiment of the present invention has been described.
Example 2
In a second exemplary embodiment of the present invention, a method for fabricating a horizontal nanochannel array is provided, wherein this embodiment differs from embodiment 1 in that: in the step 2, the substrate 1 is etched to form a plurality of scalloped columns 3, and the substrate 1 is etched to form a plurality of scalloped columns 3 by adopting a bosch process;
wherein the Boshi process specifically adopts C4F8And SF6The gas repeatedly and alternately deposits and etches the substrate 1 to form a plurality of scallop-shaped columns 3;
wherein the number of etching cycles is the same as the number of nanowires in the horizontal nanowire array 4.
Thus, a method for fabricating a horizontal nanochannel array according to a second exemplary embodiment of the present invention is described.
Example 3
In a third exemplary embodiment of the present invention, a method for fabricating a horizontal nanochannel array is provided, wherein this embodiment differs from embodiment 1 in that: as shown in fig. 4, step 1 includes the following sub-steps:
substep 121: forming a silicon oxide layer 21 and a silicon layer 23 in this order on the substrate 1;
substep 122: performing anisotropic etching on the silicon layer 23 to form a silicon step;
substep 123: forming a silicon nitride layer 22 on the silicon oxide layer 21 having the silicon step;
substep 124: forming a silicon nitride side wall by adopting self-aligned etching;
substep 125: removing the silicon steps and the exposed silicon oxide layer 21 in sequence by adopting wet etching to form a patterned mask layer 2;
wherein, the silicon layer 23 is a polysilicon layer or an amorphous silicon layer;
in the embodiment of the invention, the silicon step is in a smooth and steep shape by anisotropic etching, and then the silicon nitride layer 22 is deposited, and the thickness of the silicon nitride layer 22 determines the size of the subsequent scallop-shaped column 3. The mask layer is manufactured in a side wall transfer mode, so that the horizontal nanowire array can be made denser under the condition of not depending on photoetching.
More specifically, the structure of the patterned mask layer 2 includes a plurality of arrayed cuboids, and the width of a single cuboid is 10nm to 500 nm.
Thus, a method for fabricating a horizontal nanochannel array according to a third exemplary embodiment of the present invention is described.
Example 4
In a fourth exemplary embodiment of the present invention, as shown in fig. 2, there is provided a horizontal nanochannel array fabricated by the method of fabricating a horizontal nanochannel array as described above.
In an embodiment of the present invention, the structure of the horizontal nanochannel array of the present invention is specifically that its channels extend in the horizontal direction, its cross-section is circular or elliptical, and a plurality of horizontal nanochannels are arrayed in the vertical direction to form one group, and include 1 group or more groups in the horizontal direction, which can be adjusted according to the actual situation.
To this end, a horizontal nanochannel array according to a fourth exemplary embodiment of the present invention has been described.
Example 5
In a fifth exemplary embodiment of the invention, a micro nanofluidic chip is provided, comprising a horizontal nanochannel array 5 as described above. More specifically, the micro-nanofluidic chip with the horizontal nanochannel array 5 can be applied to aspects of fluid manipulation, biosensing, protein detection, DNA sequencing and the like, and in addition, the horizontal nanochannel array 5 can also be applied to a cell screener.
So far, the introduction of the micro-nanofluidic chip according to the fifth exemplary embodiment of the present invention is completed.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are only exemplary embodiments of the present invention and are not intended to limit the present invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (10)

1.一种水平纳米通道阵列的制作方法,其特征在于,包括如下步骤:1. a preparation method of horizontal nano-channel array, is characterized in that, comprises the steps: 步骤1:在衬底上形成图形化的掩膜层,其中,所述掩膜层由下至上包括氧化硅层和氮化硅层;Step 1: forming a patterned mask layer on the substrate, wherein the mask layer includes a silicon oxide layer and a silicon nitride layer from bottom to top; 步骤2:以图形化的掩膜层为掩膜,对衬底重复交替进行各向异性刻蚀、氧化和各向同性刻蚀形成若干个扇贝状柱;Step 2: using the patterned mask layer as a mask, repeatedly and alternately performing anisotropic etching, oxidation and isotropic etching on the substrate to form several scalloped columns; 步骤3:利用自限制氧化,在扇贝状柱上形成水平纳米线阵列,其中,单个水平纳米线的截面形状为圆形或者椭圆形;Step 3: using self-limited oxidation to form a horizontal nanowire array on the scalloped column, wherein the cross-sectional shape of a single horizontal nanowire is a circle or an ellipse; 步骤4:对衬底的被刻蚀区域进行填充;Step 4: filling the etched area of the substrate; 步骤5:采用湿法腐蚀释放水平纳米线阵列,形成水平纳米通道阵列。Step 5: using wet etching to release the horizontal nanowire array to form a horizontal nanochannel array. 2.如权利要求1所述的制作方法,其特征在于,所述步骤1包括如下子步骤:2. The manufacturing method of claim 1, wherein the step 1 comprises the following substeps: 子步骤111:在衬底上形成掩膜层;Sub-step 111: forming a mask layer on the substrate; 子步骤112:对掩膜层采用电子束光刻形成图形化。Sub-step 112: The mask layer is patterned by electron beam lithography. 3.如权利要求1所述的制作方法,其特征在于,所述步骤1包括如下子步骤:3. The manufacturing method of claim 1, wherein the step 1 comprises the following substeps: 子步骤121:在衬底上依次形成氧化硅层和硅层;Sub-step 121: forming a silicon oxide layer and a silicon layer on the substrate in sequence; 子步骤122:对硅层进行各向异性刻蚀,形成硅台阶;Sub-step 122: performing anisotropic etching on the silicon layer to form silicon steps; 子步骤123:在具有硅台阶的氧化硅层上形成氮化硅层;Sub-step 123: forming a silicon nitride layer on the silicon oxide layer with silicon steps; 子步骤124:采用自对准刻蚀,形成氮化硅侧墙;Sub-step 124: use self-aligned etching to form silicon nitride spacers; 子步骤125:采用湿法腐蚀依次去除硅台阶和裸露的氧化硅层,形成图形化的掩膜层;Sub-step 125: use wet etching to sequentially remove the silicon steps and the exposed silicon oxide layer to form a patterned mask layer; 其中,硅层为多晶硅层或者非晶硅层;Wherein, the silicon layer is a polysilicon layer or an amorphous silicon layer; 其中,所述图形化的掩膜层的结构包括多个阵列的长方体,单个长方体的宽度为10nm~500nm。Wherein, the structure of the patterned mask layer includes a plurality of arrays of rectangular parallelepipeds, and the width of a single rectangular parallelepiped is 10 nm˜500 nm. 4.如权利要求1所述的制作方法,其特征在于,所述步骤2中,单个周期的各向异性刻蚀、氧化和各向同性刻蚀,具体包括如下子步骤:4. The manufacturing method of claim 1, wherein, in the step 2, a single cycle of anisotropic etching, oxidation and isotropic etching specifically includes the following sub-steps: 子步骤211:去除衬底表面的氧化层;Sub-step 211: removing the oxide layer on the surface of the substrate; 子步骤212:采用各向异性刻蚀在衬底上形成垂直部;Sub-step 212: using anisotropic etching to form a vertical portion on the substrate; 子步骤213:氧化垂直部的表面形成保护层;Sub-step 213: oxidizing the surface of the vertical portion to form a protective layer; 子步骤214:去除衬底表面的保护层;Sub-step 214: remove the protective layer on the surface of the substrate; 子步骤215:采用各向同性刻蚀在衬底上形成内凹部;Sub-step 215: using isotropic etching to form an inner recess on the substrate; 子步骤216:氧化内凹部的表面;Sub-step 216: Oxidize the surface of the inner recess; 其中,各向异性刻蚀具体为:上射频功率为500W~5000W,下射频功率为10W~200W;采用氟基气体进行刻蚀;刻蚀时间为1s~100s;Among them, the anisotropic etching is specifically: the upper radio frequency power is 500W-5000W, the lower radio frequency power is 10W-200W; fluorine-based gas is used for etching; the etching time is 1s-100s; 其中,各向同性刻蚀具体为:只开启上射频源,上射频功率为500W~5000W;采用氟基气体进行刻蚀;刻蚀时间为1s~100s;Specifically, the isotropic etching is as follows: only the upper radio frequency source is turned on, and the upper radio frequency power is 500W-5000W; fluorine-based gas is used for etching; the etching time is 1s-100s; 其中,氧化具体为:只开启上射频源,上射频功率为500W~5000W;采用O2和氟基气体进行氧化;氧化时间为1s~100s;Specifically, the oxidation is as follows: only the upper radio frequency source is turned on, and the upper radio frequency power is 500W to 5000W; O 2 and fluorine-based gas are used for oxidation; the oxidation time is 1s to 100s; 其中,氟基气体包括CF4、CHF3或者SF6Among them, the fluorine-based gas includes CF 4 , CHF 3 or SF 6 . 5.如权利要求1所述的制作方法,其特征在于,所述步骤2中,对衬底进行刻蚀形成若干个扇贝状柱的具体步骤为,采用博世工艺对衬底进行刻蚀形成若干个扇贝状柱;5. The manufacturing method according to claim 1, wherein in the step 2, the specific step of etching the substrate to form several scallop-shaped columns is to use a Bosch process to etch the substrate to form several a scalloped column; 其中,博世工艺具体为采用C4F8和SF6气体对衬底重复交替进行沉积和刻蚀,形成若干个扇贝状柱;Among them, the Bosch process is to use C 4 F 8 and SF 6 gas to repeatedly and alternately deposit and etch the substrate to form several scallop-shaped columns; 其中,刻蚀循环次数与水平纳米线阵列中的纳米线数目相同。The number of etching cycles is the same as the number of nanowires in the horizontal nanowire array. 6.如权利要求1所述的制作方法,其特征在于,所述步骤3中,6. The manufacturing method of claim 1, wherein in the step 3, 其中,自限制氧化采用高温炉管氧化或者快速热退火氧化;Among them, self-limiting oxidation adopts high temperature furnace tube oxidation or rapid thermal annealing oxidation; 其中,自限制氧化的温度为800℃~1100℃,时间为10min~5h。Among them, the temperature of self-limiting oxidation is 800℃~1100℃, and the time is 10min~5h. 7.如权利要求1所述的制作方法,其特征在于,所述步骤4中,采用化学气相沉积法对衬底的被刻蚀区域进行填充,然后机械平坦化表面;7. The manufacturing method according to claim 1, wherein in the step 4, the etched region of the substrate is filled by chemical vapor deposition, and then the surface is mechanically planarized; 填充介质包括氧化硅或者氮化硅。The fill dielectric includes silicon oxide or silicon nitride. 8.如权利要求1所述的制作方法,其特征在于,所述步骤5中,所述湿法腐蚀所采用的刻蚀液包括四甲基氢氧化铵或者氢氧化钾;8. The manufacturing method of claim 1, wherein, in the step 5, the etching solution used in the wet etching comprises tetramethylammonium hydroxide or potassium hydroxide; 所述衬底的材质包括单晶硅、碳化硅、锗硅或者玻璃硅。The material of the substrate includes single crystal silicon, silicon carbide, silicon germanium or glass silicon. 9.一种采用如权利要求1至8任一项所述的水平纳米通道阵列的制作方法制备得到的水平纳米通道阵列。9 . A horizontal nanochannel array prepared by using the method for manufacturing a horizontal nanochannel array according to any one of claims 1 to 8 . 10.一种微纳流控芯片,其特征在于,包括如权利要求9所述的水平纳米通道阵列。10 . A micro-nanofluidic chip, characterized in that, comprising the horizontal nanochannel array as claimed in claim 9 .
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