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CN111524924A - Chip packaging method and chip packaging structure - Google Patents

Chip packaging method and chip packaging structure Download PDF

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CN111524924A
CN111524924A CN202010600939.7A CN202010600939A CN111524924A CN 111524924 A CN111524924 A CN 111524924A CN 202010600939 A CN202010600939 A CN 202010600939A CN 111524924 A CN111524924 A CN 111524924A
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wafer
light
film layer
bonding pad
chip
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CN111524924B (en
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庞宏林
钟磊
李利
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Forehope Electronic Ningbo Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011Manufacture or treatment of image sensors covered by group H10F39/12
    • H10F39/024Manufacture or treatment of image sensors covered by group H10F39/12 of coatings or optical elements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/198Contact-type image sensors [CIS]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/805Coatings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/806Optical elements or arrangements associated with the image sensors

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Abstract

本申请提供一种芯片封装方法及芯片封装结构,涉及芯片封装技术领域。其中,芯片封装方法包括:提供一晶圆,所述晶圆包括多个晶片区域,每一所述晶片区域包括感光区域以及焊盘区域,所述焊盘区域设置有焊盘;在所述晶圆的上表面设置一透光膜层;将所述透光膜层的位于每一所述焊盘区域上的部分去除以露出每一所述焊盘区域的焊盘,从而得到一晶圆结构;对所述晶圆结构进行切割及封装操作,以得到多个芯片封装结构。本申请提供的芯片封装方法,相对于其他方式的封装方法,加工流程短,工艺控制难度低,得到的封装体厚度更薄,使用材料更少。

Figure 202010600939

The present application provides a chip packaging method and a chip packaging structure, which relate to the technical field of chip packaging. The chip packaging method includes: providing a wafer, the wafer includes a plurality of wafer regions, each of the wafer regions includes a photosensitive region and a pad region, and the pad region is provided with a pad; A light-transmitting film layer is arranged on the upper surface of the circle; the part of the light-transmitting film layer located on each of the pad regions is removed to expose the pads of each of the pad regions, thereby obtaining a wafer structure ; Perform cutting and packaging operations on the wafer structure to obtain a plurality of chip packaging structures. Compared with other packaging methods, the chip packaging method provided by the present application has the advantages of short processing flow, low difficulty in process control, thinner thickness of the obtained package body, and fewer materials used.

Figure 202010600939

Description

芯片封装方法及芯片封装结构Chip packaging method and chip packaging structure

技术领域technical field

本申请涉及芯片封装技术领域,具体而言,涉及一种芯片封装方法及芯片封装结构。The present application relates to the technical field of chip packaging, and in particular, to a chip packaging method and a chip packaging structure.

背景技术Background technique

CIS(Contact Image Sensor)又称接触式图像传感器,是一种新型线型图像传感器,是近几年来继CCD(Charge-coupled Device,电荷耦合器件)之后研究和开发的光电耦合器件。它可以对光学信号进行感知,并将其转换成承载图像信息的电子信号,作为这样一种处理电子器件,目前在市场上具有广泛的应用,如应用于智能终端、相机、扫描态势感知等方向。这种器件设计之初,为了提高产品的成像质量和实用性一般都是需要进行封装后再安装在终端设备之中。CIS (Contact Image Sensor), also known as contact image sensor, is a new type of line image sensor. It can perceive optical signals and convert them into electronic signals that carry image information. As such a processing electronic device, it has a wide range of applications in the market, such as applications in smart terminals, cameras, scanning situational awareness, etc. . At the beginning of the design of this kind of device, in order to improve the imaging quality and practicability of the product, it generally needs to be packaged and then installed in the terminal equipment.

目前传统的封装结构主要是通过在芯片的感光区上用一块玻璃进行透光密封,制造时需要在感光区四周用胶或者其他材质的材料做一个支撑结构,以便玻璃盖板与芯片之间存在一定的高度。但是现有的这种生产方式对于封装的要求过高,并且工序过于繁杂,对于批量生产时的质量和效率控制提出了新的挑战。At present, the traditional packaging structure mainly uses a piece of glass on the photosensitive area of the chip for light-transmitting sealing. When manufacturing, it is necessary to use glue or other materials to make a support structure around the photosensitive area, so that there is a gap between the glass cover and the chip. a certain height. However, the existing production method has too high requirements for packaging and complicated processes, which poses new challenges to the quality and efficiency control during mass production.

发明内容SUMMARY OF THE INVENTION

本申请实施例的目的在于提供一种芯片封装方法及芯片封装结构,在进行芯片封装时,在感光区上方仅采用了一种材料,可以减少光线在界面间的折射次数,同时,由于只需要在感光区上方设置透光膜层,封装工序更加简单。The purpose of the embodiments of the present application is to provide a chip packaging method and a chip packaging structure. During chip packaging, only one material is used above the photosensitive area, which can reduce the number of refractions of light between the interfaces. The light-transmitting film layer is arranged above the photosensitive area, and the encapsulation process is simpler.

第一方面,本申请实施例提供一种芯片封装方法,所述方法包括:提供一晶圆,所述晶圆包括多个晶片区域,每一所述晶片区域包括感光区域以及焊盘区域,所述焊盘区域设置有焊盘;在所述晶圆的上表面设置一透光膜层;将所述透光膜层的位于每一所述焊盘区域上的部分去除以露出每一所述焊盘区域的焊盘,从而得到一晶圆结构;对所述晶圆结构进行切割及封装操作,以得到多个芯片封装结构。In a first aspect, an embodiment of the present application provides a chip packaging method, the method includes: providing a wafer, the wafer includes a plurality of chip areas, each of the chip areas includes a photosensitive area and a pad area, so The pad area is provided with pads; a light-transmitting film layer is arranged on the upper surface of the wafer; the part of the light-transmitting film layer located on each of the pad areas is removed to expose each of the pads in the pad area to obtain a wafer structure; cutting and packaging operations are performed on the wafer structure to obtain a plurality of chip packaging structures.

本申请提供的芯片封装方法,相对于其他方式的封装方法,加工流程短,工艺控制难度低,使用材料更少,由于其仅在感光区域上方使用一种材料,相较于在感光区域上方设置多种材料的封装方式,能够有效减少光线在界面间的折射次数,感光效果更好。Compared with other packaging methods, the chip packaging method provided by the present application has the advantages of short processing flow, low process control difficulty, and fewer materials used. The packaging method of various materials can effectively reduce the number of refractions of light between the interfaces, and the photosensitive effect is better.

在一种可能的实施方式中,所述对所述晶圆结构进行切割及封装操作,以得到多个芯片封装结构,包括:将所述晶圆结构切割分离成多个与晶片区域对应的晶片,利用导线将所述晶片上的焊盘连接到载板;在载板与导线之间涂抹胶水,并对胶水进行固化,以支撑和固定导线形成的线弧。In a possible implementation manner, the cutting and packaging operations on the wafer structure to obtain a plurality of chip packaging structures include: cutting and separating the wafer structure into a plurality of chips corresponding to the chip regions , using wires to connect the pads on the wafer to the carrier board; apply glue between the carrier board and the wires, and cure the glue to support and fix the arc formed by the wires.

在一种可能的实施方式中,在所述晶圆的上表面设置一透光膜层之后,所述方法还包括:对晶圆的下表面进行减薄处理。In a possible implementation manner, after disposing a light-transmitting film layer on the upper surface of the wafer, the method further includes: thinning the lower surface of the wafer.

由于透光膜层是在进行晶圆减薄前固化在晶圆的上表面,所以在进行减薄操作时,晶圆可以减薄得更薄,从而,得到的芯片封装结构的厚度也会更薄,在投入应用后,如用于制造相机,将使制造得到的相机也会更薄。Since the light-transmitting film layer is cured on the upper surface of the wafer before thinning the wafer, the wafer can be thinner during the thinning operation, so that the thickness of the obtained chip package structure will also be thinner. Thin, after being put into application, such as for the manufacture of cameras, the resulting cameras will also be thinner.

在一种可能的实施方式中,所述在所述晶圆的上表面设置一透光膜层,包括:对晶圆的上表面进行覆膜处理,并对覆膜的材料进行固化,使膜表面贴合于所述上表面,形成透光膜层。In a possible implementation manner, arranging a light-transmitting film layer on the upper surface of the wafer includes: coating the upper surface of the wafer, and curing the film-coated material to make the film The surface is attached to the upper surface to form a light-transmitting film layer.

在一种可能的实施方式中,所述对覆膜的材料进行固化,包括:对覆膜的材料进行紫外固化或者烘烤固化,使覆膜的材料固化在所述上表面。In a possible implementation manner, the curing of the coating material includes: performing ultraviolet curing or baking curing on the coating material, so that the coating material is cured on the upper surface.

在一种可能的实施方式中,所述将所述透光膜层的位于每一所述焊盘区域上的部分去除以露出每一所述焊盘区域的焊盘,包括:利用激光测距确定透光膜层远离上表面的面到焊盘的距离,根据所述距离使用机械去除方式将焊盘区域上的透光膜层去除;或者,使用激光镭射方式将焊盘区域上的透光膜层去除。In a possible implementation manner, the removing the part of the light-transmitting film layer located on each of the pad regions to expose the pads of each of the pad regions includes: using laser distance measurement Determine the distance from the surface of the light-transmitting film layer away from the upper surface to the pad, and use a mechanical removal method to remove the light-transmitting film layer on the pad area according to the distance; Film removal.

第二方面,本申请实施例提供一种芯片封装结构,所述芯片封装结构包括:一载板;一晶片,其设置于所述载板上,所述晶片包括感光区域以及焊盘区域,所述焊盘区域设置有焊盘;一透光膜层,其设置于所述晶片的感光区域上;导线,其用于将所述载板与所述焊盘电连接。In a second aspect, an embodiment of the present application provides a chip package structure, the chip package structure includes: a carrier board; a chip, which is disposed on the carrier board, and the chip includes a photosensitive area and a pad area, and the The pad area is provided with a pad; a light-transmitting film layer is arranged on the photosensitive area of the wafer; and a wire is used for electrically connecting the carrier board and the pad.

在一种可能的实施方式中,所述芯片封装结构还包括:位于载板与导线之间的支撑胶体,以支撑和固定导线形成的线弧。In a possible implementation manner, the chip packaging structure further includes: a support glue between the carrier board and the wires, so as to support and fix the arcs formed by the wires.

在一种可能的实施方式中,所述透光膜层的厚度为65至95微米。In a possible embodiment, the thickness of the light-transmitting film layer is 65 to 95 microns.

在一种可能的实施方式中,所述透光膜层对于380至780纳米波段的光线的透光率大于93%。In a possible implementation manner, the light transmittance of the light-transmitting film layer for light in the wavelength band of 380 to 780 nanometers is greater than 93%.

为使本申请实施例所要实现的上述目的、特征和优点能更明显易懂,下文特举较佳实施例,并配合所附附图,作详细说明如下。In order to make the above-mentioned objects, features and advantages to be achieved by the embodiments of the present application more obvious and easy to understand, the preferred embodiments are hereinafter described in detail together with the accompanying drawings.

附图说明Description of drawings

为了更清楚地说明本申请实施例的技术方案,下面将对本申请实施例中所需要使用的附图作简单地介绍,应当理解,以下附图仅示出了本申请的某些实施例,因此不应被看作是对范围的限定,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他相关的附图。In order to explain the technical solutions of the embodiments of the present application more clearly, the following briefly introduces the accompanying drawings that need to be used in the embodiments of the present application. It should be understood that the following drawings only show some embodiments of the present application, therefore It should not be regarded as a limitation of the scope. For those of ordinary skill in the art, other related drawings can also be obtained from these drawings without any creative effort.

图1为本申请实施例提供的芯片封装方法的流程图;FIG. 1 is a flowchart of a chip packaging method provided by an embodiment of the present application;

图2为本申请实施例提供的晶圆的示意图;2 is a schematic diagram of a wafer provided by an embodiment of the present application;

图3为本申请实施例提供的步骤10-40的执行过程示意图;FIG. 3 is a schematic diagram of the execution process of steps 10-40 provided in this embodiment of the present application;

图4为本申请实施例提供的芯片封装结构的示意图;4 is a schematic diagram of a chip packaging structure provided by an embodiment of the present application;

图5为本申请实施例提供的芯片封装结构的应用实例示意图。FIG. 5 is a schematic diagram of an application example of the chip packaging structure provided by the embodiment of the present application.

图标:100-晶圆;101-晶片区域;102-焊盘;110-透光膜层;120-载板;130-晶片;140-导线;150-支撑胶体。Icons: 100-wafer; 101-wafer area; 102-pad; 110-transparent film; 120-carrier; 130-wafer; 140-wire; 150-supporting colloid.

具体实施方式Detailed ways

下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行描述。The technical solutions in the embodiments of the present application will be described below with reference to the accompanying drawings in the embodiments of the present application.

本申请实施例提供一种芯片封装方法,能够用于透光芯片(CIS芯片)的封装工艺,同时,提供一种芯片封装结构,该芯片封装结构可采用上述芯片封装方法制成,获得透光芯片封装体。图1示出了芯片封装方法的流程图,如图1所示,该芯片封装方法包括:The embodiments of the present application provide a chip packaging method, which can be used in the packaging process of light-transmitting chips (CIS chips), and at the same time, provide a chip packaging structure, which can be fabricated by the above-mentioned chip packaging method to obtain light-transmitting chips. chip package. Figure 1 shows a flowchart of a chip packaging method. As shown in Figure 1, the chip packaging method includes:

步骤10:提供一晶圆,该晶圆包括多个晶片区域,每一晶片区域包括感光区域以及焊盘区域,焊盘区域设置有焊盘。Step 10: Provide a wafer, the wafer includes a plurality of wafer regions, each wafer region includes a photosensitive region and a pad region, and the pad region is provided with pads.

图2示出了晶圆的示意图,在晶圆100上包括多个晶片区域101,每个晶片区域101上制造有所需的集成功能电路,集成功能电路将感知的光信号转换为电信号。晶圆100包括上表面和下表面,在每个晶片区域101的上表面上具有感光区域和焊盘区域(图未示出),集成功能电路通过晶片区域101上的感光区域感知外部光线。2 shows a schematic diagram of a wafer, the wafer 100 includes a plurality of wafer areas 101, each wafer area 101 is fabricated with required integrated functional circuits, and the integrated functional circuits convert sensed optical signals into electrical signals. The wafer 100 includes an upper surface and a lower surface, and a photosensitive area and a pad area (not shown) are provided on the upper surface of each wafer area 101 , and the integrated functional circuit senses external light through the photosensitive area on the wafer area 101 .

步骤20:在该晶圆的上表面设置一透光膜层。Step 20: Disposing a light-transmitting film layer on the upper surface of the wafer.

步骤10-40的执行过程示意图如图3所示。图3中(a)提供了一晶圆,图3中(a)仅可看到晶圆上的两个晶片区域,在晶片区域上设有焊盘102。具体的,步骤20对晶圆的上表面进行覆膜处理,并对覆膜的材料进行固化,使膜表面贴合于晶圆的上表面,形成透光膜层。其中,对覆膜的材料进行固化的方式包括:紫外(UV)固化或者烘烤固化。A schematic diagram of the execution process of steps 10-40 is shown in FIG. 3 . In FIG. 3( a ), a wafer is provided, and in FIG. 3( a ), only two wafer regions on the wafer can be seen, and pads 102 are provided on the wafer regions. Specifically, in step 20, the upper surface of the wafer is covered with a film, and the material of the film is cured, so that the film surface is attached to the upper surface of the wafer to form a light-transmitting film layer. Wherein, the method of curing the material of the coating includes: ultraviolet (UV) curing or baking curing.

如图3中(b)所示,对整个晶圆进行覆膜操作,在晶圆上表面形成薄膜(透光膜层110),薄膜的厚度为65至95微米,其中,厚度选择的原则为:保证透光膜层的透光率和膜层的材料强度,且降低下一步去除焊盘表面的膜层材料的难度,如果膜层太厚,会影响透光膜层的透光率参数,导致透光膜层的透光率降低,不利于芯片感光,如果膜层太薄(比如1微米),则会导致膜层的材料强度过低,导致膜层易碎,反而不利于芯片封装和下一步的材料去除操作。透光膜层110为高透光率薄膜,在一种实施例中,透光膜层的透光率要求为:对于380至780纳米波段的光线的透光率大于93%。可以理解的是,对于一些要求较低的产品,也可以适当降低透光率要求,如对于380至780纳米波段的光线的透光率大于60%。As shown in (b) of Figure 3, the entire wafer is covered with a film, and a thin film (transparent film layer 110) is formed on the upper surface of the wafer. The thickness of the thin film is 65 to 95 microns. The principle of thickness selection is : Ensure the light transmittance of the light-transmitting film and the material strength of the film, and reduce the difficulty of removing the film material on the surface of the pad in the next step. If the film is too thick, it will affect the light transmittance parameters of the light-transmitting film. This leads to a decrease in the light transmittance of the light-transmitting film layer, which is not conducive to the light-sensing of the chip. If the film layer is too thin (such as 1 micron), the material strength of the film layer will be too low, resulting in the film layer being fragile, which is not conducive to chip packaging and Next step material removal operation. The light-transmitting film layer 110 is a high light-transmittance film. In one embodiment, the light-transmitting film layer requires that the light-transmitting rate for light in the wavelength band of 380 to 780 nanometers be greater than 93%. It can be understood that, for some products with lower requirements, the light transmittance requirement can also be appropriately reduced, for example, the light transmittance for the light in the 380 to 780 nm wavelength band is greater than 60%.

覆膜后采用紫外(UV)固化或者烘烤固化,使覆膜的材料固化在晶圆的上表面,烘烤固化使用高压烘烤的方式,以排除覆膜气泡,或者,使用真空覆膜,并使用普通烤箱烘烤。After lamination, ultraviolet (UV) curing or baking curing is used to cure the coating material on the upper surface of the wafer, and high pressure baking is used for baking curing to eliminate lamination bubbles, or, vacuum lamination is used. And bake in a regular oven.

步骤30:将该透光膜层的位于每一焊盘区域上的部分去除以露出每一焊盘区域的焊盘,从而得到一晶圆结构。Step 30: Remove the part of the transparent film layer on each pad area to expose the pads of each pad area, thereby obtaining a wafer structure.

对整个晶圆进行覆膜后,每个晶片区域上的焊盘区域上的焊盘被透光膜层覆盖,通过技术手段将其去除,便于后续连接导线,如图3中(c)所示,可见,焊盘102上方的透光膜层被去除,从而暴露出焊盘102。After laminating the entire wafer, the pads on the pad area on each wafer area are covered with a light-transmitting film layer, which is removed by technical means to facilitate subsequent connection of wires, as shown in (c) in Figure 3 , it can be seen that the light-transmitting film layer above the pad 102 is removed, thereby exposing the pad 102 .

材料去除方式包括:通过晶圆表面图形或导电焊盘位置进行定位,采用机械去除或激光镭射去除每一焊盘区域上的透光膜层,以露出每一焊盘区域的焊盘。机械去除方式,需先通过测距手段(如激光测距)确定透光膜层远离上表面的面到焊盘的距离,根据确定的距离进行机械去除,比如,使用宽刀具切割焊盘位置,从而暴露原本覆盖在透光膜层下方的焊盘。激光镭射去除,可以控制激光能量大小,无需测距、精度要求低、稳定、无机械切割应力残留,去除效果更好。The material removal method includes: positioning through the wafer surface pattern or the position of the conductive pads, and removing the light-transmitting film layer on each pad area by mechanical removal or laser laser to expose the pads in each pad area. For the mechanical removal method, the distance from the surface of the light-transmitting film layer away from the upper surface to the pad must be determined by ranging means (such as laser ranging), and the mechanical removal is performed according to the determined distance. For example, use a wide tool to cut the position of the pad, Thus, the pads originally covered under the light-transmitting film layer are exposed. Laser laser removal can control the amount of laser energy, no need for ranging, low precision requirements, stability, no residual mechanical cutting stress, and better removal effect.

可选的,在步骤20之后,即在晶圆的上表面设置一透光膜层之后,该芯片封装方法还包括:对晶圆的下表面进行减薄处理,即对晶圆下表面多余的基体材料去除一定的厚度。在进行减薄处理后,可以进一步降低集成功能电路的器件热阻、提高芯片的工作散热及冷却能力、便于后续的封装。晶圆减薄属于常规的工艺流程,可通过研磨机来进行减薄。晶圆减薄的过程可以在步骤20之后、步骤30之前,也可以在步骤30之后,本实施例对此过程的顺序并不做限定。Optionally, after step 20, that is, after disposing a light-transmitting film layer on the upper surface of the wafer, the chip packaging method further includes: thinning the lower surface of the wafer, that is, removing excess film on the lower surface of the wafer. The base material is removed by a certain thickness. After the thinning process, the device thermal resistance of the integrated functional circuit can be further reduced, the working heat dissipation and cooling capacity of the chip can be improved, and subsequent packaging can be facilitated. Wafer thinning is a conventional process and can be thinned by a grinder. The wafer thinning process may be performed after step 20, before step 30, or after step 30, and the order of the process is not limited in this embodiment.

步骤40:对该晶圆结构进行切割及封装操作,以得到多个芯片封装结构。Step 40: Perform cutting and packaging operations on the wafer structure to obtain a plurality of chip packaging structures.

如图3中(d)所示,将获得的晶圆结构切割成单颗的晶片,获得多颗晶片。将单颗晶片贴装到一载板上,将晶片与载板打线互联,完成电路连接。具体的,步骤140包括:将该晶圆结构切割分离成多个与晶片区域对应的晶片,将晶片贴装到载板上,并利用导线将晶片上的焊盘连接到载板;在载板与导线之间涂抹胶水,并对胶水进行固化,以支撑和固定导线形成的线弧。As shown in (d) of FIG. 3 , the obtained wafer structure is cut into single wafers to obtain multiple wafers. A single chip is mounted on a carrier board, and the chip and the carrier board are connected by wires to complete the circuit connection. Specifically, step 140 includes: cutting and separating the wafer structure into a plurality of wafers corresponding to the wafer area, mounting the wafers on the carrier board, and connecting the pads on the wafer to the carrier board by using wires; Apply glue to the wire and cure the glue to support and secure the arc formed by the wire.

来自前一道工艺的晶圆结构通过切割工序后,被切割为多个小的晶片,每个晶片对应于晶圆上的一个晶片区域,每个晶片包括感光区域以及焊盘区域,焊盘区域设置有相应的焊盘,然后将切割好的晶片使用胶水或者其他连接方式贴装到相应的载板,然后,使用较细的金属导线(比如金线)或者导电性树脂将晶片的焊盘连接到载板的相应引脚,构成所要求的电路。下一步,使用胶水固定和保护线弧,对胶水进行固化处理,使其固化后在载板和导线之间形成支撑胶体。分别对切割得到的每个晶片进行上述封装步骤,得到多个芯片封装结构。The wafer structure from the previous process is cut into a plurality of small wafers after the cutting process, each wafer corresponds to a wafer area on the wafer, and each wafer includes a photosensitive area and a pad area, and the pad area is set There are corresponding pads, and then the cut chip is attached to the corresponding carrier board using glue or other connection methods, and then, the pads of the chip are connected to the The corresponding pins of the carrier board form the required circuit. In the next step, glue is used to secure and protect the wire arcs, and the glue is cured to form a support gel between the carrier board and the wires. The above-mentioned packaging steps are respectively performed on each wafer obtained by cutting to obtain a plurality of chip packaging structures.

图4示出了本申请实施例提供的芯片封装结构的示意图,该芯片封装结构可通过上述的芯片封装方法制得,请参阅图4,该芯片封装结构包括:FIG. 4 shows a schematic diagram of a chip packaging structure provided by an embodiment of the present application. The chip packaging structure can be manufactured by the above-mentioned chip packaging method. Please refer to FIG. 4 . The chip packaging structure includes:

一载板120;a carrier board 120;

一晶片130,其设置于载板120上,晶片130包括感光区域以及焊盘区域,焊盘区域设置有焊盘102;A wafer 130, which is disposed on the carrier board 120, the wafer 130 includes a photosensitive area and a pad area, and the pad area is provided with the pad 102;

一透光膜层110,其设置于晶片130的感光区域上;a light-transmitting film layer 110 disposed on the photosensitive area of the wafer 130;

导线140,其用于将载板120与焊盘102电连接。Wires 140 are used to electrically connect the carrier board 120 to the pads 102 .

可选的,在芯片封装过程中,在载板120与导线140之间涂抹胶水,并对胶水进行固化,固化后在载板120和导线140之间形成支撑胶体150,用于支撑和固定导线形成的线弧。Optionally, during the chip packaging process, glue is applied between the carrier board 120 and the wires 140, and the glue is cured. After curing, a support glue 150 is formed between the carrier board 120 and the wires 140 for supporting and fixing the wires. arc formed.

可选的,透光膜层110的厚度为65至95微米,这一厚度范围内能够保证透光膜层的透光率和膜层的材料强度。透光膜层110为高透光率薄膜,在一种实施例中,透光膜层的透光率要求为:对于380至780纳米波段的光线的透光率大于93%。可以理解的是,对于一些要求较低的产品,也可以适当降低透光率要求,如对于380至780纳米波段的光线的透光率大于60%。Optionally, the thickness of the light-transmitting film layer 110 is 65 to 95 microns, and within this thickness range, the light transmittance of the light-transmitting film layer and the material strength of the film layer can be guaranteed. The light-transmitting film layer 110 is a high light-transmittance film. In one embodiment, the light-transmitting film layer requires that the light-transmitting rate for light in the wavelength band of 380 to 780 nanometers be greater than 93%. It can be understood that, for some products with lower requirements, the light transmittance requirement can also be appropriately reduced, for example, the light transmittance for the light in the 380 to 780 nm wavelength band is greater than 60%.

本实施例提供的芯片封装结构的应用实例如图5所示,当外部光线入射时,光线进入透明的透光膜层,由于透光膜层的高透光性,绝大部分光线通过透光膜层进入透光膜层下方的芯片感光区域,并被其感知。An application example of the chip packaging structure provided in this embodiment is shown in FIG. 5 . When external light is incident, the light enters the transparent light-transmitting film layer. Due to the high light transmittance of the light-transmitting film layer, most of the light passes through The film layer enters and is sensed by the light-sensitive area of the chip under the light-transmitting film layer.

可以理解的,本实施例提供的芯片封装方法的工艺流程包括:晶圆覆膜、固化、晶圆减薄、去除材料、切割晶圆、装片(使晶片与载板成为一个整体)、打线、点胶、胶水固化,可见,相较于现有技术中的其他芯片封装方法,加工流程短。并且,由于本实施例仅在感光区域上方使用一种材料(即透光膜层),相较于在感光区域上方设置多种材料的封装方式,能够有效减少光线在界面间的折射次数,感光效果更好。进一步的,由于透光膜层是一层很薄的薄膜,所以透光膜层、晶片、载板三者之间只需简单安装即可保证相互水平,避免光线到达后由于折射导致损失光信号变多,工艺控制难度低。由于透光膜层是在进行晶圆减薄前固化在晶圆的上表面,所以在进行减薄操作时,晶圆可以减薄得更薄,从而,得到的芯片封装结构的厚度也会更薄,在投入应用后,如用于制造相机,将使制造得到的相机也会更薄。It can be understood that the process flow of the chip packaging method provided in this embodiment includes: wafer coating, curing, wafer thinning, material removal, wafer cutting, wafer loading (making the wafer and the carrier into a whole), printing. It can be seen that compared with other chip packaging methods in the prior art, the processing flow is shorter. Moreover, since only one material (ie, a light-transmitting film layer) is used above the photosensitive area in this embodiment, compared with the packaging method in which multiple materials are arranged above the photosensitive area, the number of refractions of light between the interfaces can be effectively reduced, and the photosensitive area can be effectively reduced. Better results. Further, since the light-transmitting film layer is a very thin film, the light-transmitting film layer, the wafer and the carrier only need to be simply installed to ensure the level of each other, avoiding the loss of optical signals due to refraction after the light arrives. It is more difficult to control the process. Since the light-transmitting film layer is cured on the upper surface of the wafer before thinning the wafer, the wafer can be thinner during the thinning operation, so that the thickness of the obtained chip package structure will also be thinner. Thin, after being put into application, such as for the manufacture of cameras, the resulting cameras will also be thinner.

在本发明的描述中,需要理解的是,术语“中心”、“纵向”、“横向”、“长度”、“宽度”、“厚度”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”、“内”、“外”、“顺时针”、“逆时针”等指示的方位或位置关系为基于附图所示的方位或位置关系,仅是为了便于描述本发明和简化描述,而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作,因此不能理解为对本发明的限制。此外,术语“第一”、“第二”仅用于描述目的,而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此,限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个所述特征。在本发明的描述中,“多个”的含义是两个或两个以上,除非另有明确具体的限定。In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", " rear, left, right, vertical, horizontal, top, bottom, inside, outside, clockwise, counterclockwise, etc., or The positional relationship is based on the orientation or positional relationship shown in the accompanying drawings, which is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, Therefore, it should not be construed as a limitation of the present invention. In addition, the terms "first" and "second" are only used for descriptive purposes, and should not be construed as indicating or implying relative importance or implying the number of indicated technical features. Thus, features defined as "first", "second" may expressly or implicitly include one or more of said features. In the description of the present invention, "plurality" means two or more, unless otherwise expressly and specifically defined.

以上所述仅为本申请的实施例而已,并不用于限制本申请的保护范围,对于本领域的技术人员来说,本申请可以有各种更改和变化。凡在本申请的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本申请的保护范围之内。The above descriptions are merely examples of the present application, and are not intended to limit the protection scope of the present application. For those skilled in the art, various modifications and changes may be made to the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of this application shall be included within the protection scope of this application.

Claims (10)

1. A method of chip packaging, the method comprising:
providing a wafer, wherein the wafer comprises a plurality of chip areas, each chip area comprises a photosensitive area and a bonding pad area, and the bonding pad area is provided with a bonding pad;
arranging a light-transmitting film layer on the upper surface of the wafer;
removing the part of the light-transmitting film layer, which is positioned on each bonding pad area, so as to expose the bonding pad of each bonding pad area, thereby obtaining a wafer structure;
and cutting and packaging the wafer structure to obtain a plurality of chip packaging structures.
2. The method of claim 1, wherein the dicing and packaging the wafer structure to obtain a plurality of chip package structures comprises:
cutting and separating the wafer structure into a plurality of chips corresponding to the chip areas, mounting the chips on a carrier plate, and connecting bonding pads on the chips to the carrier plate by using wires;
and coating glue between the carrier plate and the lead, and curing the glue to support and fix the arc formed by the lead.
3. The method of claim 1 or 2, wherein after disposing a light-transmissive film on the top surface of the wafer, the method further comprises:
and thinning the lower surface of the wafer.
4. The method of claim 1, wherein disposing a light-transmissive film on the top surface of the wafer comprises:
and carrying out film coating treatment on the upper surface of the wafer, and curing the film coated material to enable the film surface to be attached to the upper surface to form a light-transmitting film layer.
5. The method of claim 4, wherein curing the material of the cover film comprises: and carrying out ultraviolet curing or baking curing on the material of the coating film to cure the material of the coating film on the upper surface.
6. The method of claim 1, wherein removing the portion of the light-transmissive film layer over each of the pad regions to expose the pad of each of the pad regions comprises:
determining the distance from the surface of the light-transmitting film layer far away from the upper surface to the bonding pad by using laser ranging, and removing the light-transmitting film layer on the bonding pad region by using a mechanical removal mode according to the distance; or, removing the light-transmitting film layer on the bonding pad area by using a laser mode.
7. A chip package structure, comprising:
a carrier plate;
the wafer is arranged on the carrier plate and comprises a photosensitive area and a bonding pad area, and the bonding pad area is provided with a bonding pad;
a light-transmitting film layer arranged on the photosensitive region of the wafer;
and the wire is used for electrically connecting the carrier plate with the bonding pad.
8. The structure of claim 7, wherein the chip package structure further comprises:
and the support colloid is positioned between the carrier plate and the lead so as to support and fix a wire arc formed by the lead.
9. The structure of claim 7 or 8, wherein the light-transmissive film layer has a thickness of 65 to 95 microns.
10. The structure of claim 7 or 8, wherein the light-transmissive film layer has a light transmittance of greater than 93% for light in the 380-780 nm wavelength band.
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