CN111474458A - L ED light source test tool and L ED light source test system - Google Patents
L ED light source test tool and L ED light source test system Download PDFInfo
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- CN111474458A CN111474458A CN202010310058.1A CN202010310058A CN111474458A CN 111474458 A CN111474458 A CN 111474458A CN 202010310058 A CN202010310058 A CN 202010310058A CN 111474458 A CN111474458 A CN 111474458A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
- G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R31/44—Testing lamps
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- Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
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Abstract
本发明公开一种LED光源测试工装及LED光源测试系统,LED光源测试工装包括:LED安装基板,被配置为安装待测LED灯珠;散热器,被配置为在对待测LED灯珠测试进行时,给LED安装基板进行接触散热;机械按压开关,与散热器驱动连接,被配置为在被触发时,驱动散热器朝向LED安装基板运动;光电检测开关,被配置为检测散热器的运动位置,并输出相应的检测信号;供电控制模块,与光电检测开关电连接,被配置为在根据光电检测开关输出的检测信号确定散热器运动至预设位置时,给待测LED灯珠供电。本发明可以确保在散热器与LED安装基板接触良好时进行测试,保护光源测试工装及LED灯珠,有利于提高LED光源测试的准确性。
The invention discloses an LED light source testing tool and an LED light source testing system. The LED light source testing tool includes: an LED mounting substrate, which is configured to install the LED lamp beads to be tested; , to conduct contact heat dissipation for the LED mounting substrate; the mechanical press switch, which is driven and connected to the radiator, is configured to drive the radiator to move toward the LED mounting substrate when triggered; the photoelectric detection switch is configured to detect the moving position of the radiator, and output the corresponding detection signal; the power supply control module is electrically connected to the photoelectric detection switch, and is configured to supply power to the LED lamp bead to be tested when the radiator is determined to move to the preset position according to the detection signal output by the photoelectric detection switch. The invention can ensure that the radiator and the LED mounting substrate are in good contact with the test, protect the light source test tool and the LED lamp beads, and help improve the accuracy of the LED light source test.
Description
技术领域technical field
本发明涉及LED测试技术领域,特别涉及一种LED光源测试工装及LED光源测试系统。The invention relates to the technical field of LED testing, in particular to an LED light source testing tool and an LED light source testing system.
背景技术Background technique
LED多采用金属安装基板和散热基板来实现承载和散热功能,LED光源具有亮度高,功率大,并且发热严重等特点,因此在对LED进行测试时,需要保证LED光源的热能够及时有效的被散掉,若金属安装基板和散热基板支架接触不良,则会导致LED光源散热不好会导致LED光源光通量低,使得测试时准确性降低,并且容易导致发光亮度受限、寿命受损、LED灯珠烧毁等问题发生。LEDs mostly use metal mounting substrates and heat dissipation substrates to achieve carrying and heat dissipation functions. LED light sources have the characteristics of high brightness, high power, and serious heat generation. Therefore, when testing LEDs, it is necessary to ensure that the heat of the LED light source can be timely and effective. If the metal mounting substrate and the heat dissipation substrate bracket are not in good contact, the heat dissipation of the LED light source will be poor, the luminous flux of the LED light source will be low, the accuracy of the test will be reduced, and it will easily lead to limited luminous brightness, damaged life, and LED lights. Problems such as bead burning occur.
发明内容SUMMARY OF THE INVENTION
本发明的主要目的是提出一种LED光源测试工装及LED光源测试系统,旨在提高LED光源测试的准确性。The main purpose of the present invention is to propose an LED light source test tool and an LED light source test system, aiming at improving the accuracy of the LED light source test.
为实现上述目的,本发明提出一种LED光源测试工装,所述LED光源测试工装包括:In order to achieve the above purpose, the present invention provides an LED light source test tool, the LED light source test tool includes:
LED安装基板,被配置为安装待测LED灯珠;The LED mounting substrate is configured to install the LED lamp beads to be tested;
散热器,被配置为在对待测LED灯珠测试进行时,给所述LED安装基板进行接触散热;a heat sink, configured to contact and dissipate heat to the LED mounting substrate when the LED lamp bead to be tested is tested;
机械按压开关,与所述散热器驱动连接,被配置为在被触发时,驱动散热器朝向所述LED安装基板运动;a mechanical push switch, drivingly connected to the heat sink, configured to drive the heat sink to move toward the LED mounting substrate when triggered;
光电检测开关,被配置为检测所述散热器的运动位置,并输出相应的检测信号;a photoelectric detection switch, configured to detect the moving position of the radiator, and output a corresponding detection signal;
供电控制模块,与所述光电检测开关电连接,被配置为在根据所述光电检测开关输出的检测信号确定所述散热器运动至预设位置时,给待测LED灯珠供电。A power supply control module, electrically connected to the photoelectric detection switch, is configured to supply power to the LED lamp beads to be tested when it is determined according to the detection signal output by the photoelectric detection switch that the heat sink moves to a preset position.
可选地,所述LED光源测试工装还包括风机,所述风机与所述供电控制电连接;Optionally, the LED light source test tool further includes a fan, and the fan is electrically connected to the power supply control;
供电控制模块,还被配置为在根据所述光电检测开关输出的检测信号确定所述散热器运动至预设位置时,驱动所述风机工作,以给待测LED安装基板进行散热。The power supply control module is further configured to drive the fan to work when it is determined according to the detection signal output by the photoelectric detection switch that the heat sink moves to a preset position, so as to dissipate heat to the LED mounting substrate to be tested.
可选地,所述光电检测开关包括:Optionally, the photoelectric detection switch includes:
光控电路板;Light control circuit board;
光电发射器和光电接收器,设置于所述光控电路板上;a photoelectric transmitter and a photoelectric receiver, arranged on the light control circuit board;
光电检测件,所述光电检测件背离所述光控电路板的方向凹槽形成有相对设置的第一容置腔和第二容置腔,所述光电发射器容置于所述第一容置腔内,所述光电接收器容置于所述第二容置腔。A photodetector, the photodetector is formed with a first accommodating cavity and a second accommodating cavity opposite to the groove in the direction away from the light control circuit board, and the phototransmitter is accommodated in the first container The photoelectric receiver is accommodated in the second accommodating cavity.
可选地,所述LED光源测试工装还包括:Optionally, the LED light source test tool also includes:
箱体,所述箱体上端开口,所述光电检测开关设置于所述箱体的一侧壁上;a box body, the upper end of the box body is open, and the photoelectric detection switch is arranged on one side wall of the box body;
箱盖,设置于所述箱体的上方;a box cover, arranged above the box body;
光栅挡片,设置于所述箱盖的一侧壁上,所述光栅挡片的位置与所述光电检测开关对应;所述光栅挡片在所述散热器运动至预设位置时,伸入至所述第一容置腔和所述第二容置腔形成的凹槽内。The grating block is arranged on a side wall of the box cover, and the position of the grating block corresponds to the photoelectric detection switch; when the radiator moves to a preset position, the grating block extends into the into the groove formed by the first accommodating cavity and the second accommodating cavity.
可选地,所述LED光源测试工装还包括:Optionally, the LED light source test tool also includes:
支撑部,设置于所述箱体上,所述光电检测开关固定安装于所述支撑部上。The support part is arranged on the box body, and the photoelectric detection switch is fixedly installed on the support part.
可选地,所述箱体和箱盖上还设置有安装槽,所述机械按压开关设置于所述箱体上的安装槽内;Optionally, the box body and the box cover are further provided with installation grooves, and the mechanical press switch is arranged in the installation grooves on the box body;
所述机械按压开关具有锁紧状态和解除闩锁状态;所述机械按压开关在处于锁紧状态时,将所述箱体和箱盖锁紧连接,以使所述光栅挡片伸入至所述第一容置腔和所述第二容置腔形成的凹槽内;The mechanical push switch has a locked state and an unlatched state; when the mechanical push switch is in a locked state, the box body and the box cover are locked and connected, so that the grating block extends into all in the groove formed by the first accommodating cavity and the second accommodating cavity;
所述机械按压开关在处于解除闩锁状态时,将所述箱盖自所述箱体打开连接,以使所述光栅挡片自所述第一容置腔和所述第二容置腔形成的凹槽内移出。When the mechanical push switch is in the unlocked state, the box cover is opened and connected from the box body, so that the grating block is formed from the first accommodating cavity and the second accommodating cavity out of the groove.
可选地,所述光电检测开关还包括第一上拉电阻及第二上拉电阻,所述第一上拉电阻串联设置于第一直流电源与光电发射器之间,所述第二上拉电阻串联设置于所述第一直流电源与光电接收器之间。Optionally, the photoelectric detection switch further includes a first pull-up resistor and a second pull-up resistor, the first pull-up resistor is arranged in series between the first DC power supply and the photoelectric transmitter, and the second pull-up resistor is connected in series. A pull-up resistor is arranged in series between the first DC power supply and the photoelectric receiver.
可选地,所述供电控制模块包括主控制器及供电电源,所述主控制器的信号反馈端与所述光电检测开关连接,所述主控制器的控制端与所述供电电源连接;Optionally, the power supply control module includes a main controller and a power supply, a signal feedback terminal of the main controller is connected to the photoelectric detection switch, and a control terminal of the main controller is connected to the power supply;
所述主控制器,被配置为在根据所述光电检测开关输出的检测信号确定所述散热器运动至预设位置时,控制所述供电电源给待测LED灯珠供电。The main controller is configured to control the power supply to supply power to the LED lamp beads to be tested when it is determined according to the detection signal output by the photoelectric detection switch that the heat sink moves to a preset position.
可选地,所述主控制器还配置为,在根据所述光电检测开关输出的检测信号确定所述散热器运动至预设位置时进入测试模式,以对待测LED灯珠进行测试。Optionally, the main controller is further configured to enter a test mode when it is determined according to the detection signal output by the photoelectric detection switch that the heat sink moves to a preset position, so as to test the LED lamp bead to be tested.
本发明还提出一种LED光源测试系统,所述LED光源测试系统包括如上所述的LED光源测试工装。The present invention also provides an LED light source testing system, the LED light source testing system includes the above-mentioned LED light source testing tool.
本发明通过设置LED安装基板,以将LED灯珠安装至待测LED灯珠;散热器,以在待测LED灯珠测试时,给所述LED安装基板进行接触散热;同时还设置有所述散热器驱动连接的机械按压开关,从而在被触发时驱动散热器朝向LED安装基板运动,以及通过设置光电检测开关来检测所述散热器的运动位置,并输出相应的检测信号,以使供电控制模块在根据光电检测开关输出的检测信号确定散热器运动至预设位置时,给待测LED灯珠供电。本发明通过光电检测开关来检测散热器与LED安装基板之间接触是否良好,以触发供电控制模块给LED灯珠供电的通断,可以防止在机械按压开关未按下,或者未按压到位时给LED灯珠供电,有利于确保在散热器与LED安装基板接触良好时进行LED光源测试,有效保护光源测试工装及LED灯珠,有利于提高LED光源测试的准确性。In the present invention, an LED mounting substrate is arranged to mount the LED lamp beads to the LED lamp bead to be tested; a heat sink is used to conduct contact heat dissipation for the LED mounting substrate when the LED lamp bead to be tested is tested; The heat sink drives the connected mechanical push switch, so as to drive the heat sink to move toward the LED mounting substrate when triggered, and detect the movement position of the heat sink by setting the photoelectric detection switch, and output the corresponding detection signal, so that the power supply control When the module determines that the radiator moves to the preset position according to the detection signal output by the photoelectric detection switch, it supplies power to the LED lamp beads to be tested. The invention detects whether the contact between the heat sink and the LED mounting substrate is good through the photoelectric detection switch, so as to trigger the power supply control module to supply power to the LED lamp beads on and off, which can prevent the mechanical pressing switch from being pressed or not pressed in place. The power supply of the LED lamp beads is beneficial to ensure that the LED light source test is performed when the heat sink and the LED mounting substrate are in good contact, effectively protecting the light source test tool and the LED lamp beads, and improving the accuracy of the LED light source test.
附图说明Description of drawings
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图示出的结构获得其他的附图。In order to illustrate the embodiments of the present invention or the technical solutions in the prior art more clearly, the following briefly introduces the accompanying drawings that are used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only These are some embodiments of the present invention, and for those of ordinary skill in the art, other drawings can also be obtained according to the structures shown in these drawings without creative efforts.
图1为本发明LED光源测试工装一实施例的电路结构示意图;FIG. 1 is a schematic diagram of the circuit structure of an embodiment of an LED light source testing tool of the present invention;
图2为本发明LED光源测试工装一实施例的结构示意图;FIG. 2 is a schematic structural diagram of an embodiment of an LED light source testing tool of the present invention;
图3为图2中LED光源测试工装一实施例的侧视图;3 is a side view of an embodiment of the LED light source test fixture in FIG. 2;
图4为图3中A处的局部放大图;Fig. 4 is the partial enlarged view of A place in Fig. 3;
图5为本发明LED光源测试工装中光电检测开关一实施例的电路结构示意图;5 is a schematic diagram of the circuit structure of an embodiment of a photoelectric detection switch in an LED light source test fixture of the present invention;
图6为本发明LED光源测试工装另一实施例的电路结构示意图。FIG. 6 is a schematic diagram of a circuit structure of another embodiment of the LED light source testing tool of the present invention.
附图标号说明:Description of reference numbers:
本发明目的的实现、功能特点及优点将结合实施例,参照附图做进一步说明。The realization, functional characteristics and advantages of the present invention will be further described with reference to the accompanying drawings in conjunction with the embodiments.
具体实施方式Detailed ways
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明的一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
需要说明,若本发明实施例中有涉及方向性指示(诸如上、下、左、右、前、后……),则该方向性指示仅用于解释在某一特定姿态(如附图所示)下各部件之间的相对位置关系、运动情况等,如果该特定姿态发生改变时,则该方向性指示也相应地随之改变。It should be noted that if there are directional indications (such as up, down, left, right, front, back, etc.) involved in the embodiments of the present invention, the directional indications are only used to explain a certain posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication also changes accordingly.
另外,若本发明实施例中有涉及“第一”、“第二”等的描述,则该“第一”、“第二”等的描述仅用于描述目的,而不能理解为指示或暗示其相对重要性或者隐含指明所指示的技术特征的数量。由此,限定有“第一”、“第二”的特征可以明示或者隐含地包括至少一个该特征。另外,各个实施例之间的技术方案可以相互结合,但是必须是以本领域普通技术人员能够实现为基础,当技术方案的结合出现相互矛盾或无法实现时应当认为这种技术方案的结合不存在,也不在本发明要求的保护范围之内。In addition, if there are descriptions involving "first", "second", etc. in the embodiments of the present invention, the descriptions of "first", "second", etc. are only used for the purpose of description, and should not be construed as indicating or implying Its relative importance or implicitly indicates the number of technical features indicated. Thus, a feature delimited with "first", "second" may expressly or implicitly include at least one of that feature. In addition, the technical solutions between the various embodiments can be combined with each other, but must be based on the realization by those of ordinary skill in the art. When the combination of technical solutions is contradictory or cannot be realized, it should be considered that the combination of such technical solutions does not exist. , is not within the scope of protection required by the present invention.
本文中术语“和/或”,仅仅是一种描述关联对象的关联关系,表示可以存在三种关系,例如,A和/或B,可以表示:单独存在A,同时存在A和B,单独存在B这三种情况。另外,本文中字符“/”,一般表示前后关联对象是一种“或”的关系。The term "and/or" in this article is only an association relationship to describe the associated objects, indicating that there can be three kinds of relationships, for example, A and/or B, it can mean that A exists alone, A and B exist at the same time, and A and B exist independently B these three cases. In addition, the character "/" in this document generally indicates that the related objects are an "or" relationship.
本发明提出一种LED光源测试工装。The invention provides an LED light source testing tool.
参照图1,在本发明一实施例中,该所述LED光源测试工装包括:Referring to FIG. 1, in an embodiment of the present invention, the LED light source test tool includes:
LED安装基板10,被配置为安装待测LED灯珠;The
散热器20,被配置为在待测LED灯珠测试时,给所述LED安装基板10进行接触散热;The
机械按压开关30,与所述散热器20驱动连接,被配置为在被触发时,驱动散热器20朝向所述LED安装基板10运动;a
光电检测开关40,被配置为检测所述散热器20的运动位置,并输出相应的检测信号;The
供电控制模块50,与所述光电检测开关40电连接,被配置为在根据所述光电检测开关40输出的检测信号确定所述散热器20运动至预设位置时,给待测LED灯珠供电。The power
本实施例中,LED安装基板10用于安装LED灯珠,在实际应用时,LED安装基板10上设置有电路布线层和焊盘,可以通过导电胶、焊锡等将LED灯珠焊接,在LED安装基板10的焊盘上,通过绑线将LED灯珠实现LED安装基板10上的电路器件与LED灯珠的连接。LED安装基板10可以采用金属基板,例如铝基板或者铜基板来实现,以提高LED灯珠的散热效率。In this embodiment, the
散热器20可选采用金属散热片,金属散热片用于提高LED灯珠的散热效率,在对LED灯珠进行光通量、色泽等测试时,散热器20与安装有LED灯的LED安装基板10进行接触,以对LED灯珠产生的热量进行及时散热。The
机械按压开关30与散热器20驱动连接,具体可以通过弹性件进行弹性连接,在机械按压开关30被按下时,散热器20朝向LED安装基板10运动,以使散热器20与LED安装基板10接触连接。在机械按压开关30被复位时,散热器20背离LED安装基板10运动,此时散热器20与LED安装基板10间隔设置。The
需要说明的是,LED光源亮度高且功率大,因此LED灯珠在工作过程中产生的热量较多,若不能及时对LED灯珠进行散热,会影响LED灯珠的使用寿命,严重时甚至烧毁LED灯珠。而在测试的过程中,若不能及时对LED灯珠进行散热,则会导致LED光源光通量低,使得发光亮度受限、寿命受损、甚至烧毁LED灯珠。因此,在测试的过程中,测试的过程中,需要确保散热器20与LED安装基板10之间接触良好。因此,如何能够识别检测LED安装基板10与散热器20的接触是否良好成为保护LED灯珠的研究方向。一般地,在检测LED安装基板10与散热器20的接触是否良,通常采用霍尔式、电容式、涡流式等开关来实现,然而霍尔式开关需要检测对象需要是磁性物体;电容式开关通常用于检测各种导电或不导电的液体或固体;涡流式开关由于高频振荡线圈产生的交变磁场是散射的,这样当金属物件不断接近感测器的前端或其周围时感测器也会发出讯号,容易对测试结果产生干扰,并且容易被环境所影响而误触发。It should be noted that the LED light source has high brightness and high power, so the LED lamp beads generate a lot of heat during the working process. If the LED lamp beads cannot be dissipated in time, the service life of the LED lamp beads will be affected, and even burn out in severe cases. LED lamp beads. During the test, if the LED lamp beads cannot be dissipated in time, the luminous flux of the LED light source will be low, which will limit the luminous brightness, damage the lifespan, and even burn the LED lamp beads. Therefore, in the process of testing, it is necessary to ensure good contact between the
为此,本实施例通过设置光电检测开关40,光电检测开关40内设置有光源电路,光电检测开关40的输出端S_P与供电控制模块50连接,可以利用光发射器藉由物体表面反射回来的光量强度,来判断物体的有无,以在LED安装基板10与散热器20之间通过机械按压开关30进行按压实现接触连接时,检测机械按压开关30是否按压,以及是否按压到位。例如,在光电检测开关40检测到散热器20的运动位置未达到预设位置时,则输出低电平的检测信号,而在检测到散热器20的运动位置达到预设位置时,则输出高电平的检测信号。To this end, in this embodiment, a
供电控制模块50与LED安装基板10之间可以通过排线或者柔性基板实现电连接,以在测试的过程中,控制LED灯珠的电能输出,从而为LED灯珠供电。具体地,供电控制模块50根据光电检测开关40输出的控制信号确定散热器20是否运动到预设位置:在输出的是低电平的检测信号时,则确定此时散热器20与LED安装基板10之间间隔设置,供电控制模块50不对LED灯珠进行供电;而在输出的是高电平的检测信号时,则确定此时散热器20与LED安装基板10之间接触连接,供电控制模块50则开始给LED灯珠供电进行供电。也即,本实施例仅在供电控制模块50确定散热器20与LED安装基板10之间接触良好时,才启动LED灯珠供电,而在供电模块确定散热器20与LED安装基板10之间接触不良时,不启动LED灯珠的供电。如此设置,有利于确保LED灯珠在测试的过程中散热良好,防止LED灯珠因散热不及时而被烧毁。The power
本发明通过设置LED安装基板10,以将LED灯珠安装至待测LED灯珠;散热器20,以在待测LED灯珠测试时,给所述LED安装基板10进行接触散热;同时还设置有所述散热器20驱动连接的机械按压开关30,从而在被触发时驱动散热器20朝向LED安装基板10运动,以及通过设置光电检测开关40来检测所述散热器20的运动位置,并输出相应的检测信号,以使供电控制模块50在根据光电检测开关40输出的检测信号确定散热器20运动至预设位置时,给待测LED灯珠供电。本发明通过光电检测开关40来检测散热器20与LED安装基板10之间接触是否良好,以触发供电控制模块50给LED灯珠供电的通断,可以防止在机械按压开关30未按下,或者未按压到位时给LED灯珠供电,有利于确保在散热器20与LED安装基板10接触良好时进行LED光源测试,有效保护光源测试工装及LED灯珠,有利于提高LED光源测试的准确性。In the present invention, the
参照图1,在一实施例中,所述LED光源测试工装还包括风机60,所述风机60与所述供电控制电连接;1, in one embodiment, the LED light source test tool further includes a
供电控制模块50,还被配置为在根据所述光电检测开关40输出的检测信号确定所述散热器20运动至预设位置时,驱动所述风机60工作,以给待测LED安装基板10进行散热。The power
本实施例中,风机60的位置与LED安装基板10对应,且基于供电控制模块50的控制,并在工作时给LED灯珠散热。具体地,供电控制模块50根据光电检测开关40输出的控制信号确定散热器20是否运动到预设位置:在输出的是低电平的检测信号时,则确定此时散热器20与LED安装基板10之间间隔设置,供电控制模块50控制风机60待机;而在输出的是高电平的检测信号时,则确定此时散热器20与LED安装基板10之间接触连接,供电控制模块50则控制风机60给LED灯珠散热。In this embodiment, the position of the
参照图2或图3,在一实施例中,所述光电检测开关40包括:Referring to FIG. 2 or FIG. 3 , in one embodiment, the
光控电路板41;Light
光电发射器42和光电接收器43,设置于所述光控电路板41上;The
光电检测件44,所述光电检测件44背离所述光控电路板41的方向凸设有相对设置的第一容置腔441和第二容置腔442,所述光电发射器42容置于所述第一容置腔441内,所述光电接收器43容置于所述第二容置腔442。A
本实施例中,光控电路板41用于安装光电发射器42和光电接收器43,光电检测件44可以采用透明材质来实现,光电检测件44可以罩设于光控电路板41,也可以与光控电路板41卡合固定连接。光电发射器42伸入至第一容置腔441内,光电接收器43伸入至第二容置腔442内,第一容置腔441和第二容置腔442之间形成有凹槽。在散热器20未运动至预设位置时,供光电检测开关40检测的光栅挡片90未伸入至该凹槽内,光电发射器42发出的光信号被光电接收器43接收,从而产生并输出低电平的电信号。在散热器20运动至预设位置时,光栅挡片90则伸入至该凹槽内,从而阻挡光电发射器42发出的光信号被光电接收器43接收,此时光电检测开关40输出高电平的电信号。如此设置,供电控制模块50则可以根据光电检测开关40的信号翻转确定散热器20与LED安装基板10之间是否接触良好。第一容置腔441和第二容置腔442的大小可根据实际需要进行设置,第一容置腔441和第二容置腔442形成的凹槽间隙大于光栅挡片90的厚度,以保证该间隙供光栅挡片90伸入至凹槽内。第一容置腔441略大于光电发射器42,第二容置腔442略大于光电接收器43。In this embodiment, the light
参照图2或图3,在一实施例中,所述LED光源测试工装还包括:Referring to FIG. 2 or FIG. 3 , in one embodiment, the LED light source test fixture further includes:
箱体70,所述箱体70上端开口,所述光电检测开关40设置于所述箱体70的一侧壁上;a
箱盖80,设置于所述箱体70的上方;The
光栅挡片90,设置于所述箱盖80的一侧壁上,所述光栅挡片90的位置与所述光电检测开关40对应;所述光栅挡片90在所述散热器20运动至预设位置时,伸入至所述第一容置腔441和所述第二容置腔442形成的凹槽内。The grating blocking piece 90 is arranged on a side wall of the
本实施例中,箱体70内设置有供LED灯珠进行光学测试的测试模组,例如光通量测试模组等,在需要进行避光的测试环境时,箱盖80盖合在箱体70上,形成密闭空间,箱盖80与箱体70之间可以实现转动连接或者滑动连接,本实施例可选为铰接,具体为在竖直上转动连接。光栅挡片90设置在箱盖80上,随箱盖80的运动而运动,当箱盖80盖合在箱体70上,并在机械按压开关30被按下时,箱盖80和箱体70之间完全盖合。此时光栅挡片90伸入至第一容置腔441和第二容置腔442形成的凹槽内,从而可以在机械按压开关30驱动散热器20运动至预设位置时,通过光栅挡片90是否伸入至凹槽内,并阻挡光电发射器42发出的光信号被光电接收器43接收来检测散热片与LED安装基板10至的接触是否良好。如此,光电检测开关40无需直接接触LED安装基板10和/或散热基板,即可实现散热片与LED安装基板10至的接触是否良好的检测,操作简单,便于实现,并且可以提高检测的准确性。In this embodiment, the
参照图2或图3,在一实施例中,所述LED光源测试工装还包括:Referring to FIG. 2 or FIG. 3 , in one embodiment, the LED light source test fixture further includes:
支撑部61,设置于所述箱体70上,所述光电检测开关40固定安装于所述支撑部61上。The
本实施例中,LED光源测试工装还包括电控板,该电控板可以是用于安装光电检测开关40中光电发射器42和光电接收器43的电路板。光控电路板41集成有给LED灯珠散热和供电的电路模块,或者还可以集成有LED灯源测试的控制电路和检测电路等。支撑部61设置于箱体70上,可以与箱体70一体成型设置,或者可拆卸的安装于箱体70上。安装有光电检测开关40的光控电路板41安装在支撑部61上,从而在进行LED光源测试时,可以使光电检测开关40检测LED安装基板10和散热基板接触是否良好。In this embodiment, the LED light source testing tool also includes an electric control board, which may be a circuit board for installing the
在一实施例中,所述箱体70和箱盖80上还设置有安装槽(图未标示),所述机械按压开关30设置于所述箱体70上的安装槽内;In one embodiment, the
所述机械按压开关30具有锁紧状态和解除闩锁状态;所述机械按压开关30在处于锁紧状态时,将所述箱体70和箱盖80锁紧连接,以使所述光栅挡片90伸入至所述第一容置腔441和所述第二容置腔442形成的凹槽内;The
所述机械按压开关30在处于解除闩锁状态时,将所述箱盖80自所述箱体70打开连接,以使所述光栅挡片90自所述第一容置腔441和所述第二容置腔442形成的凹槽内移出。When the
本实施例中,机械按压开关30可以复用于锁紧箱体70和实现散热器20与LED安装基板10之间的接触连接。机械按压开关30与散热器20之间可以通过弹性件,例如弹片或者弹簧等弹性连接。机械按压开关30具有操作部,通过对操作部进行按压挤压操作而将散热器20和箱盖80闩锁在预定位置处,并通过随后的第二次按压操作而解除该闩锁状态,使操作部复原至初始位置处的。当箱盖80闩锁在预定位置处时,光栅挡片90伸入至第一容置腔441和第二容置腔442形成的凹槽内。如此设置,即可以实现箱盖80的锁紧和散热器20的驱动。In this embodiment, the mechanical
参照图5,在一实施例中,所述光电检测开关40还包括第一上拉电阻R1及第二上拉电阻R2,所述第一上拉电阻R1串联设置于第一直流电源VCC与光电发射器42之间,所述第二上拉电阻R2串联设置于所述第一直流电源VCC与光电接收器43之间。Referring to FIG. 5 , in one embodiment, the
第一上拉电阻R1是光电发射器42的上拉电阻,可选采用不大于1KΩ阻值的电阻,通过调节第一上拉电阻R1的阻值可以控制发射二极管的正向导通电阻的大小。The first pull-up resistor R1 is the pull-up resistor of the
第二上拉电阻R2是光电接收器43的上拉电阻,可选采用10KΩ阻值的电阻,可以实现光电接收器43的接收端三极管集电极电源的上拉。The second pull-up resistor R2 is the pull-up resistor of the photoelectric receiver 43 , and a 10KΩ resistor can be optionally used to realize the pull-up of the triode collector power supply at the receiving end of the photoelectric receiver 43 .
在供光电检测开关40检测的光栅挡片90伸入至光电检测开关40的凹槽内时,可以阻挡光电发射器42发出的光信号被光电接收器43接收,此时光电接收器43不导通,从而输出上拉电源高电平的电信号。而在光栅挡片90未伸入至光电检测开关40的凹槽内时,光电发射器42发出的光信号被光电接收器43接收,此时光电接收器43导通,从而输出低电平的电信号。When the grating block 90 for detection by the
参照图6,在一实施例中,所述供电控制模块50包括主控制器51及供电电源52,所述主控制器51的信号反馈端与所述光电检测开关40连接,所述主控制器51的控制端与所述供电电源52连接;6, in one embodiment, the power
所述主控制器51,被配置为在根据所述光电检测开关40输出的检测信号确定所述散热器20运动至预设位置时,控制所述供电电源52给待测LED灯珠供电。The
本实施例中,供电电源52可以包括多个输出端,或者多个输出模块,以输出不同的供电电源52至风机60和LED灯珠,从而为风机60和LED灯珠提供工作电压。主控制器51可以是单片机、DSP、FPGA等微处理器,用于根据光电检测开关40输出的检测信号,确定散热片与LED安装基板10至的接触是否良好,并在接触良好时,控制供电电源52分别为风机60和LED灯珠供电。具体地,主控制器51在接收到高电平的检测信号时,则输出开机上电使能信号至供电电源52,而在接收到低电平的检测信号时,则输出待机使能信号至供电电源52,以实现供电电源52待机,此时工作不工作。当然在其他实施例中,主控制器51还可以控制LED光源测试工装中的其他电路模块进行供电,以实现LED光源测试。In this embodiment, the
参照图6,在一实施例中,所述主控制器51还配置为,在根据所述光电检测开关40输出的检测信号确定所述散热器20运动至预设位置时进入测试模式,以对待测LED灯珠进行测试。6 , in one embodiment, the
本实施例中,主控制器51在确定散热片与LED安装基板10至的接触良好时,则可以进入测试模式,实现对LED灯珠的光源测试。In this embodiment, when the
在实际应用时,在进行光源测试前,可以使用风机60电缆线材将风机60接入工装的光控电路板41上,风机60通过电缆线和接线端子实现与供电电源52的电连接。将待测LED光源安装在测试工装上,同时使用LED电缆线材将其连接在光控电路板41上。检查光电检测开关40中间是否有其他物体以免干扰工装接触检测。完成以上标定动作后即可,按压机械按压开关30,并在散热器20与LED安装基板10接触良好后,给LED灯珠进行供电,实现对待测LED光源的测试。若LED光源供电不成功,则可以检测散热器20与LED安装基板10是否接触好。In practical application, before the light source test, the
本发明还提出一种LED光源测试系统,所述LED光源测试系统包括如上所述的LED光源测试工装。该LED光源测试工装的详细结构可参照上述实施例,此处不再赘述;可以理解的是,由于在本发明LED光源测试系统中使用了上述LED光源测试工装,因此,本发明LED光源测试系统的实施例包括上述LED光源测试工装全部实施例的全部技术方案,且所达到的技术效果也完全相同,在此不再赘述。The present invention also provides an LED light source testing system, the LED light source testing system includes the above-mentioned LED light source testing tool. The detailed structure of the LED light source test tool can refer to the above-mentioned embodiment, and will not be repeated here; The embodiment includes all the technical solutions of all the above-mentioned embodiments of the LED light source test tool, and the technical effects achieved are also the same, which will not be repeated here.
本实施例中,LED灯源测试系统可以实现对待测LED灯珠的光通量(Lm)、光强(cd)、光谱分布、色度(x,y),(u',v')、均匀性、色差(Δu'v')光谱主波长等光学特性进行测试,同时也可以对LED灯源的两端的电压值(V)、流经LED灯珠的电流值(I,mA)等电学特性进行检测。In this embodiment, the LED lamp source test system can realize the luminous flux (Lm), light intensity (cd), spectral distribution, chromaticity (x, y), (u', v'), uniformity of the LED lamp beads to be tested. , chromatic aberration (Δu'v') spectral dominant wavelength and other optical characteristics to test, and also can test the voltage value (V) at both ends of the LED light source, the current value (I, mA) flowing through the LED lamp bead and other electrical characteristics. detection.
以上所述仅为本发明的可选实施例,并非因此限制本发明的专利范围,凡是在本发明的发明构思下,利用本发明说明书及附图内容所作的等效结构变换,或直接/间接运用在其他相关的技术领域均包括在本发明的专利保护范围内。The above descriptions are only optional embodiments of the present invention, and are not intended to limit the scope of the present invention. Under the inventive concept of the present invention, any equivalent structural transformations made by using the contents of the description and drawings of the present invention, or direct/indirect Applications in other related technical fields are included in the scope of patent protection of the present invention.
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