[go: up one dir, main page]

CN111430379B - Display panel and manufacturing method thereof - Google Patents

Display panel and manufacturing method thereof Download PDF

Info

Publication number
CN111430379B
CN111430379B CN202010289130.7A CN202010289130A CN111430379B CN 111430379 B CN111430379 B CN 111430379B CN 202010289130 A CN202010289130 A CN 202010289130A CN 111430379 B CN111430379 B CN 111430379B
Authority
CN
China
Prior art keywords
layer
metal
oxide semiconductor
sub
metal oxide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202010289130.7A
Other languages
Chinese (zh)
Other versions
CN111430379A (en
Inventor
代楚宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TCL China Star Optoelectronics Technology Co Ltd
Original Assignee
TCL China Star Optoelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TCL China Star Optoelectronics Technology Co Ltd filed Critical TCL China Star Optoelectronics Technology Co Ltd
Priority to CN202010289130.7A priority Critical patent/CN111430379B/en
Publication of CN111430379A publication Critical patent/CN111430379A/en
Application granted granted Critical
Publication of CN111430379B publication Critical patent/CN111430379B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/421Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer
    • H10D86/423Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer comprising semiconductor materials not belonging to the Group IV, e.g. InGaZnO
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01Manufacture or treatment
    • H10D86/021Manufacture or treatment of multiple TFTs
    • H10D86/0221Manufacture or treatment of multiple TFTs comprising manufacture, treatment or patterning of TFT semiconductor bodies
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/441Interconnections, e.g. scanning lines
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

Landscapes

  • Liquid Crystal (AREA)
  • Thin Film Transistor (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

本发明提供一种显示面板及其制作方法,该方法包括:使用精细金属掩膜板对光阻层进行图案化处理,形成多个平坦部和多个凸起部,其中所述平坦部部在所述衬底基板上的正投影的位置与所述栅极在所述衬底基板上的正投影的位置和所述第一金属部在所述衬底基板上的正投影的位置均不重叠;将与所述平坦部对应的金属氧化物半导体层蚀刻掉,以形成第一子部;将所述凸起部去除,并在剩余的金属氧化物半导体层上制作第二金属层,对所述第二金属层进行图案化处理形成源极和漏极;其中所述源极和漏极覆盖所述第一子部;在所述第二金属层上形成钝化层;在所述钝化层上制作像素电极。本发明的显示面板及其制作方法,能够提高开口率。

Figure 202010289130

The present invention provides a display panel and a manufacturing method thereof. The method includes: using a fine metal mask to pattern a photoresist layer to form a plurality of flat parts and a plurality of raised parts, wherein the flat parts are in the The position of the orthographic projection on the base substrate does not overlap with the position of the orthographic projection of the gate on the base substrate and the position of the orthographic projection of the first metal portion on the base substrate ; etch away the metal oxide semiconductor layer corresponding to the flat portion to form a first sub-portion; remove the raised portion, and make a second metal layer on the remaining metal oxide semiconductor layer, The second metal layer is patterned to form a source electrode and a drain electrode; wherein the source electrode and the drain electrode cover the first subsection; a passivation layer is formed on the second metal layer; Pixel electrodes are fabricated on the layer. The display panel and the manufacturing method thereof of the present invention can improve the aperture ratio.

Figure 202010289130

Description

一种显示面板及其制作方法A display panel and method of making the same

【技术领域】【Technical field】

本发明涉及显示技术领域,特别是涉及一种显示面板及其制作方法。The present invention relates to the field of display technology, in particular to a display panel and a manufacturing method thereof.

【背景技术】【Background technique】

金属氧化物半导体层相较于非晶硅(A-si)具有高电子迁移率,且具有尺寸小等特点。Compared with amorphous silicon (A-si), the metal oxide semiconductor layer has the characteristics of high electron mobility and small size.

常见的金属氧化物薄膜晶体管的结构主要有共平面(Coplanar)、蚀刻阻障层(Island Stop/Etch Stop Layer,IS/ESL)和背通道蚀刻(Back Channel Etch,BCE)三种,但是受工艺的限制,使得现有的源极和漏极的下方金属氧化物半导体层会凸出在源极和漏极的外部,这部分容易受背光影响产生电性漂移,从而使得显示面板产生垂直串扰等现象,降低了显示质量。Common metal oxide thin film transistor structures mainly include coplanar (Coplanar), etch barrier layer (Island Stop/Etch Stop Layer, IS/ESL) and back channel etching (Back Channel Etch, BCE). Due to the limitation of the existing source and drain electrodes, the metal oxide semiconductor layer below the source electrode and the drain electrode will protrude outside the source electrode and the drain electrode, and this part is easily affected by the backlight to generate electrical drift, which will cause the display panel to generate vertical crosstalk, etc. phenomenon, which reduces the display quality.

目前为了避免裸露在外的金属氧化物半导体层受背光的影响,通过增大栅极的尺寸以对其进行遮挡,然而这样会降低开口率。At present, in order to prevent the exposed metal oxide semiconductor layer from being affected by the backlight, the size of the gate is increased to shield it, but this will reduce the aperture ratio.

因此,有必要提供一种显示面板及其制作方法,以解决现有技术所存在的问题。Therefore, it is necessary to provide a display panel and a manufacturing method thereof to solve the problems existing in the prior art.

【发明内容】[Content of the invention]

本发明的目的在于提供一种显示面板及其制作方法,能够提高开口率。An object of the present invention is to provide a display panel and a manufacturing method thereof, which can improve the aperture ratio.

为解决上述技术问题,本发明提供一种显示面板的制作方法,包括:In order to solve the above technical problems, the present invention provides a manufacturing method of a display panel, including:

在衬底基板上制作第一金属层,对所述第一金属层进行图案化处理形成栅极和第一金属部;forming a first metal layer on a base substrate, and patterning the first metal layer to form a gate electrode and a first metal portion;

在所述第一金属层上依次制作栅绝缘层、金属氧化物半导体层以及光阻层;forming a gate insulating layer, a metal oxide semiconductor layer and a photoresist layer in sequence on the first metal layer;

使用精细金属掩膜板对所述光阻层进行图案化处理,形成多个平坦部和多个凸起部,其中所述平坦部部在所述衬底基板上的正投影的位置与所述栅极在所述衬底基板上的正投影的位置和所述第一金属部在所述衬底基板上的正投影的位置均不重叠;The photoresist layer is patterned by using a fine metal mask to form a plurality of flat parts and a plurality of raised parts, wherein the position of the orthographic projection of the flat parts on the base substrate is the same as that of the The position of the orthographic projection of the gate on the base substrate and the position of the orthographic projection of the first metal portion on the base substrate do not overlap;

将与所述平坦部对应的金属氧化物半导体层蚀刻掉,以形成第一子部;etching away the metal oxide semiconductor layer corresponding to the flat portion to form a first sub-portion;

将所述凸起部去除,并在剩余的金属氧化物半导体层上制作第二金属层,对所述第二金属层进行图案化处理形成源极和漏极;其中所述源极和漏极覆盖所述第一子部;The raised portion is removed, a second metal layer is formed on the remaining metal oxide semiconductor layer, and the second metal layer is patterned to form a source electrode and a drain electrode; wherein the source electrode and the drain electrode covering the first subsection;

在所述第二金属层上形成钝化层;forming a passivation layer on the second metal layer;

在所述钝化层上制作像素电极,其中像素电极与所述漏极连接。A pixel electrode is fabricated on the passivation layer, wherein the pixel electrode is connected to the drain electrode.

本发明还提供一种显示面板,包括:The present invention also provides a display panel, comprising:

衬底基板;substrate substrate;

第一金属层,包括栅极和第一金属部;a first metal layer, including a gate electrode and a first metal part;

栅绝缘层,设于所述第一金属层上;a gate insulating layer, disposed on the first metal layer;

金属氧化物半导体层,设于所述栅绝缘层上,所述金属氧化物半导体层包括第一子部;所述第一子部的位置与所述栅极的位置对应;a metal oxide semiconductor layer, disposed on the gate insulating layer, the metal oxide semiconductor layer includes a first subsection; the position of the first subsection corresponds to the position of the gate;

第二金属层,设于所述金属氧化物半导体层上,所述第二金属层包括源极和漏极;所述源极覆盖所述第一子部的其中一个端部;所述漏极覆盖所述第一子部的另一个端部;a second metal layer, disposed on the metal oxide semiconductor layer, the second metal layer includes a source electrode and a drain electrode; the source electrode covers one end of the first sub-section; the drain electrode covering the other end of the first subsection;

钝化层,设于所述第二金属层上;a passivation layer, disposed on the second metal layer;

像素电极,设于在所述钝化层上。The pixel electrode is arranged on the passivation layer.

本发明的显示面板及其制作方法,包括使用精细金属掩膜板对所述光阻层进行图案化处理,形成多个平坦部和多个凸起部,其中所述平坦部部在所述衬底基板上的正投影的位置与所述栅极在所述衬底基板上的正投影的位置和所述第一金属部在所述衬底基板上的正投影的位置均不重叠;将与所述平坦部对应的金属氧化物半导体层蚀刻掉,以形成第一子部;将所述凸起部去除,并在剩余的金属氧化物半导体层上制作第二金属层,对所述第二金属层进行图案化处理形成源极和漏极;其中所述源极和漏极覆盖所述第一子部;由于将位于源极和漏极外侧的金属氧化物半导体层蚀刻掉,因此避免金属氧化物半导体层裸露在外,避免影响显示质量,此外由于不需要增大栅极的尺寸,因此可以提高开口率。The display panel and its manufacturing method of the present invention include patterning the photoresist layer using a fine metal mask to form a plurality of flat parts and a plurality of raised parts, wherein the flat parts are on the substrate The position of the orthographic projection on the base substrate does not overlap with the position of the orthographic projection of the gate on the base substrate and the position of the orthographic projection of the first metal part on the base substrate; The metal oxide semiconductor layer corresponding to the flat portion is etched away to form a first sub-portion; the raised portion is removed, and a second metal layer is formed on the remaining metal oxide semiconductor layer, and the second metal layer is formed on the remaining metal oxide semiconductor layer. The metal layer is patterned to form a source electrode and a drain electrode; wherein the source electrode and the drain electrode cover the first subsection; since the metal oxide semiconductor layer outside the source electrode and the drain electrode is etched away, the metal oxide semiconductor layer is avoided The oxide semiconductor layer is exposed to avoid affecting the display quality, and since it is not necessary to increase the size of the gate, the aperture ratio can be increased.

【附图说明】【Description of drawings】

图1为现有显示面板的结构示意图;1 is a schematic structural diagram of a conventional display panel;

图2为现有显示面板的制备工艺流程示意图;FIG. 2 is a schematic diagram of a manufacturing process flow diagram of an existing display panel;

图3为本发明一实施例的显示面板的结构示意图;FIG. 3 is a schematic structural diagram of a display panel according to an embodiment of the present invention;

图4为本发明的显示面板的制备工艺流程示意图。FIG. 4 is a schematic diagram of the manufacturing process flow of the display panel of the present invention.

【具体实施方式】【Detailed ways】

以下各实施例的说明是参考附加的图式,用以例示本发明可用以实施的特定实施例。本发明所提到的方向用语,例如「上」、「下」、「前」、「后」、「左」、「右」、「内」、「外」、「侧面」等,仅是参考附加图式的方向。因此,使用的方向用语是用以说明及理解本发明,而非用以限制本发明。在图中,结构相似的单元是以相同标号表示。The following descriptions of the various embodiments refer to the accompanying drawings to illustrate specific embodiments in which the invention may be practiced. The directional terms mentioned in the present invention, such as "up", "down", "front", "rear", "left", "right", "inside", "outside", "side", etc., are only for reference Additional schema orientation. Therefore, the directional terms used are for describing and understanding the present invention, not for limiting the present invention. In the figures, structurally similar elements are denoted by the same reference numerals.

本申请的说明书和权利要求书及上述附图中的术语“第一”、“第二”等是用于区别不同对象,而不是用于描述特定顺序。此外,术语“包括”和“具有”以及它们任何变形,意图在于覆盖不排他的包含。The terms "first", "second" and the like in the description and claims of the present application and the above drawings are used to distinguish different objects, rather than to describe a specific order. Furthermore, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion.

如图1所示,现有的显示面板包括衬底基板11、以及依次设于衬底基板11上的第一金属层12、栅绝缘层13、金属氧化物半导体层14、第二金属层15、钝化层16、彩膜层17、保护层18以及像素电极19。图1中虚线框内所示的金属氧化物半导体层14未被第二金属层以及第一金属层覆盖,也即裸露在外。As shown in FIG. 1 , a conventional display panel includes a base substrate 11 , and a first metal layer 12 , a gate insulating layer 13 , a metal oxide semiconductor layer 14 , and a second metal layer 15 sequentially disposed on the base substrate 11 . , a passivation layer 16 , a color filter layer 17 , a protective layer 18 and a pixel electrode 19 . The metal oxide semiconductor layer 14 shown in the dotted frame in FIG. 1 is not covered by the second metal layer and the first metal layer, that is, exposed.

结合图2和图1,现有的显示面板的制作方法包括:With reference to FIG. 2 and FIG. 1 , the manufacturing method of the existing display panel includes:

S101、在衬底基板11上制作第一金属层12,对第一金属层12进行图案化处理,形成栅极121和第一金属部122。S101 , forming a first metal layer 12 on the base substrate 11 , and patterning the first metal layer 12 to form a gate electrode 121 and a first metal portion 122 .

S102、在第一金属层12上制作栅绝缘层13。S102 , forming a gate insulating layer 13 on the first metal layer 12 .

S103、在栅绝缘层13上依次制作金属氧化物半导体层14和光阻层20。S103 , forming the metal oxide semiconductor layer 14 and the photoresist layer 20 on the gate insulating layer 13 in sequence.

S104、对光阻层20进行图案化处理,形成开口211。S104 , patterning the photoresist layer 20 to form openings 211 .

S105、将与所述开口211对应的金属氧化物半导体层14刻蚀掉。S105, the metal oxide semiconductor layer 14 corresponding to the opening 211 is etched away.

S106、将被刻蚀掉的金属氧化物半导体层对应的栅绝缘层13进行蚀刻,形成连接孔101。S106 , etching the gate insulating layer 13 corresponding to the etched metal oxide semiconductor layer to form a connection hole 101 .

S107、将剩余的光阻层剥离,之后对金属氧化物半导体层14进行再次图案化处理,形成第一子部141、第二子部142以及第三子部143;S107, peeling off the remaining photoresist layer, and then patterning the metal oxide semiconductor layer 14 again to form the first sub-section 141, the second sub-section 142 and the third sub-section 143;

S108、在连接孔101以及所述金属氧化物半导体层14上制作第二金属层15,对第二金属层15进行图案化处理,形成源极151、漏极152和第二金属部153;S108 , forming a second metal layer 15 on the connection hole 101 and the metal oxide semiconductor layer 14 , and patterning the second metal layer 15 to form a source electrode 151 , a drain electrode 152 and a second metal portion 153 ;

其中第二金属部153与第一金属部通过连接孔101连接。The second metal portion 153 is connected to the first metal portion through the connection hole 101 .

S109、在所述第二金属层15上形成钝化层16;S109, forming a passivation layer 16 on the second metal layer 15;

S110、在所述钝化层16上形成彩膜层17;S110, forming a color filter layer 17 on the passivation layer 16;

S111、在所述彩膜层17上形成保护层18;S111, forming a protective layer 18 on the color filter layer 17;

S112、在保护层18上形成像素电极19,其中像素电极19与漏极152连接。S112 , forming a pixel electrode 19 on the protective layer 18 , wherein the pixel electrode 19 is connected to the drain electrode 152 .

请参照图3至图4,图3为本发明一实施例的显示面板的结构示意图。Please refer to FIG. 3 to FIG. 4 . FIG. 3 is a schematic structural diagram of a display panel according to an embodiment of the present invention.

在一实施例中,如图3和图4所示,本发明的显示面板包括衬底基板21、以及依次设于衬底基板21上的第一金属层22、栅绝缘层23、金属氧化物半导体层24、第二金属层25、钝化层26以及像素电极29,此外还可包括彩膜层27和/或保护层28。In one embodiment, as shown in FIG. 3 and FIG. 4 , the display panel of the present invention includes a base substrate 21 , a first metal layer 22 , a gate insulating layer 23 , and a metal oxide sequentially disposed on the base substrate 21 . The semiconductor layer 24 , the second metal layer 25 , the passivation layer 26 and the pixel electrode 29 may further include a color filter layer 27 and/or a protective layer 28 .

衬底基板21可以为玻璃基板,也可为柔性基板。The base substrate 21 may be a glass substrate or a flexible substrate.

第一金属层22包括栅极221和第一金属部222。第一金属层22的材料包括Mo、Al、Ti、Cu等金属。第一金属部222可以用于形成连接线,此外还可用于形成电极。当然第一金属部222的作用不限于此。The first metal layer 22 includes a gate electrode 221 and a first metal part 222 . The material of the first metal layer 22 includes Mo, Al, Ti, Cu and other metals. The first metal part 222 can be used to form connection lines, and can also be used to form electrodes. Of course, the role of the first metal portion 222 is not limited to this.

栅绝缘层23的材料可以为SiNx、SiOx等材料,栅绝缘层23可以为单层膜或者双层膜。在一实施方式中,所述栅绝缘层23上可设置有连接孔。The material of the gate insulating layer 23 may be SiNx, SiOx or the like, and the gate insulating layer 23 may be a single-layer film or a double-layer film. In one embodiment, a connection hole may be provided on the gate insulating layer 23 .

所述金属氧化物半导体层24包括第一子部241。其中在一实施方式中,所述金属氧化物半导体层24还可可包括第二子部242以及第三子部243;所述第一子部241的位置与所述栅极221的位置对应,所述第二子部242与所述第一金属部222的其中一个端部的位置对应;所述第三子部243与所述第一金属部222的另一个端部的位置对应。其中金属氧化物半导体层24的材料包括不限于IGZO和ITZO。The metal oxide semiconductor layer 24 includes a first subsection 241 . In one embodiment, the metal oxide semiconductor layer 24 may further include a second sub-section 242 and a third sub-section 243; the position of the first sub-section 241 corresponds to the position of the gate electrode 221, so The second sub-portion 242 corresponds to the position of one end of the first metal portion 222 ; the third sub-portion 243 corresponds to the position of the other end of the first metal portion 222 . The material of the metal oxide semiconductor layer 24 includes but is not limited to IGZO and ITZO.

所述第二金属层25包括源极251和漏极252,此外为了简化制程工艺,提高生产效率,所述第二金属层25还可包括第二金属部253;所述源极251和漏极252位于所述第一子部241上,所述第二金属部253位于第二子部242以及第三子部243上。所述第二金属层25的材料包括Mo、Al、Ti、Cu等金属,所述第二金属层25可以为单层膜或者多层膜。其中,所述源极251覆盖所述第一子部241的其中一个端部;所述漏极252覆盖所述第一子部241的另一个端部。在一实施方式中,为了进一步提高显示质量,所述第二金属部253覆盖所述第二子部242以及第三子部243。在一实施方式中,为了减小阻抗,所述第二金属部253可通过连接孔与所述第一金属部222连接。The second metal layer 25 includes a source electrode 251 and a drain electrode 252. In addition, in order to simplify the manufacturing process and improve production efficiency, the second metal layer 25 may further include a second metal portion 253; the source electrode 251 and the drain electrode 252 is located on the first sub-portion 241 , and the second metal portion 253 is located on the second sub-portion 242 and the third sub-portion 243 . The material of the second metal layer 25 includes Mo, Al, Ti, Cu and other metals, and the second metal layer 25 may be a single-layer film or a multi-layer film. The source electrode 251 covers one end of the first sub-section 241 ; the drain electrode 252 covers the other end of the first sub-section 241 . In one embodiment, in order to further improve the display quality, the second metal portion 253 covers the second sub-portion 242 and the third sub-portion 243 . In one embodiment, in order to reduce impedance, the second metal portion 253 may be connected to the first metal portion 222 through a connection hole.

钝化层26的材料可以包括SiO2、SiNx以及SiON中的至少一种,比如可以是上述任意两个材料的复合层。The material of the passivation layer 26 may include at least one of SiO 2 , SiNx and SiON, for example, it may be a composite layer of any two of the above materials.

彩膜层27包括多个间隔设置的彩膜色阻271至273,比如包括红色彩膜、绿色彩膜以及蓝色彩膜。多个所述彩膜色阻的位置与所述第二金属部242的位置对应。The color filter layer 27 includes a plurality of color filter color resists 271 to 273 arranged at intervals, for example, including a red color filter, a green color filter, and a blue color filter. The positions of the plurality of color filter resists correspond to the positions of the second metal portion 242 .

保护层28的材料可以包括SiO2、SiNx以及SiON中的至少一种,比如可以是上述任意两个材料的复合层。The material of the protective layer 28 may include at least one of SiO 2 , SiNx and SiON, for example, it may be a composite layer of any two of the above materials.

像素电极29的材料可为氧化铟锡,像素电极29与漏极252连接。The material of the pixel electrode 29 can be indium tin oxide, and the pixel electrode 29 is connected to the drain electrode 252 .

结合图4和图3,在一实施方式中,本发明的显示面板的制作方法包括:4 and 3, in one embodiment, the manufacturing method of the display panel of the present invention includes:

S201、在衬底基板21上制作第一金属层22,对所述第一金属层22进行图案化处理形成栅极221和第一金属部222。S201 , forming a first metal layer 22 on the base substrate 21 , and patterning the first metal layer 22 to form a gate electrode 221 and a first metal portion 222 .

其中比如在第一金属层上涂布光阻层,之后对光阻层图案化处理的过程包括曝光、显影、之后采用图案化的光阻层对第一金属层22进行蚀刻形成栅极221和第一金属部222。For example, a photoresist layer is coated on the first metal layer, and then the process of patterning the photoresist layer includes exposure, development, and then using the patterned photoresist layer to etch the first metal layer 22 to form the gate 221 and The first metal part 222 .

S202、在所述第一金属层上依次制作栅绝缘层、金属氧化物半导体层以及光阻层;S202, forming a gate insulating layer, a metal oxide semiconductor layer and a photoresist layer in sequence on the first metal layer;

例如,在所述第一金属层22上依次制作栅绝缘层23、金属氧化物半导体层24以及光阻层30。For example, a gate insulating layer 23 , a metal oxide semiconductor layer 24 and a photoresist layer 30 are sequentially formed on the first metal layer 22 .

S203、使用精细金属掩膜板40对所述光阻层30进行图案化处理,形成多个平坦部302以及多个凸起部303,其中所述第一开口301与所述第一金属部222的位置对应;所述平坦部302部在所述衬底基板21上的正投影的位置与所述栅极在所述衬底基板21上的正投影的位置和所述第一金属部222在所述衬底基板21上的正投影的位置均不重叠;S203 , using the fine metal mask 40 to pattern the photoresist layer 30 to form a plurality of flat portions 302 and a plurality of raised portions 303 , wherein the first opening 301 and the first metal portion 222 are formed The position of the orthographic projection of the flat portion 302 on the base substrate 21 corresponds to the position of the orthographic projection of the gate on the base substrate 21 and the first metal portion 222 The positions of the orthographic projections on the base substrate 21 do not overlap;

S204、将与所述平坦部302对应的金属氧化物半导体层蚀刻掉,以形成第一子部241;也即该实施方式中,金属氧化物半导体层不包括第二子部和第三子部。S204 , etch away the metal oxide semiconductor layer corresponding to the flat portion 302 to form the first subsection 241 ; that is, in this embodiment, the metal oxide semiconductor layer does not include the second subsection and the third subsection .

在一实施方式中,所述将与所述平坦部302对应的金属氧化物半导体层蚀刻掉的步骤包括:In one embodiment, the step of etching away the metal oxide semiconductor layer corresponding to the flat portion 302 includes:

S2041、对所述平坦部302进行灰化处理,以将所述平坦部302去除,形成第二开口(图中未标出);S2041, performing ashing treatment on the flat portion 302 to remove the flat portion 302 to form a second opening (not marked in the figure);

S2042、将与所述第二开口对应的金属氧化物半导体层24蚀刻掉。S2042, the metal oxide semiconductor layer 24 corresponding to the second opening is etched away.

S205、将所述凸起部303去除,并在剩余的金属氧化物半导体层24上制作第二金属层25,对所述第二金属层25进行图案化处理形成源极251、漏极252;其中所述源极251和漏极252覆盖所述第一子部241;S205, removing the raised portion 303, forming a second metal layer 25 on the remaining metal oxide semiconductor layer 24, and patterning the second metal layer 25 to form a source electrode 251 and a drain electrode 252; wherein the source electrode 251 and the drain electrode 252 cover the first sub-section 241;

S206、在所述第二金属层25上形成钝化层26;S206, forming a passivation layer 26 on the second metal layer 25;

S207、在所述保护层28上制作像素电极29,其中像素电极29与所述漏极252连接。S207 , forming a pixel electrode 29 on the protective layer 28 , wherein the pixel electrode 29 is connected to the drain electrode 252 .

在另一实施方式中,本发明的显示面板的制作方法包括:In another embodiment, the manufacturing method of the display panel of the present invention includes:

S301、在衬底基板21上制作第一金属层22,对所述第一金属层22进行图案化处理形成栅极221和第一金属部222。S301 , forming a first metal layer 22 on the base substrate 21 , and patterning the first metal layer 22 to form a gate electrode 221 and a first metal portion 222 .

其中结合图3和图4,比如在第一金属层上涂布光阻层,之后对光阻层图案化处理的过程包括曝光、显影、之后采用图案化的光阻层对第一金属层22进行蚀刻形成栅极221和第一金属部222。3 and FIG. 4, for example, a photoresist layer is coated on the first metal layer, and then the photoresist layer is patterned in the process including exposure, development, and then the first metal layer 22 using the patterned photoresist layer. Etching is performed to form the gate electrode 221 and the first metal portion 222 .

S302、在所述第一金属层上依次制作栅绝缘层、金属氧化物半导体层以及光阻层;S302, forming a gate insulating layer, a metal oxide semiconductor layer and a photoresist layer in sequence on the first metal layer;

例如,在所述第一金属层22上依次制作栅绝缘层23、金属氧化物半导体层24以及光阻层30。For example, a gate insulating layer 23 , a metal oxide semiconductor layer 24 and a photoresist layer 30 are sequentially formed on the first metal layer 22 .

S303、使用精细金属掩膜板40对所述光阻层30进行图案化处理,形成第一开口301、多个平坦部302以及多个凸起部303,其中所述第一开口301与所述第一金属部的位置对应;所述平坦部302部在所述衬底基板21上的正投影的位置与所述栅极在所述衬底基板21上的正投影的位置和所述第一金属部222在所述衬底基板21上的正投影的位置均不重叠。S303 , using the fine metal mask 40 to pattern the photoresist layer 30 to form a first opening 301 , a plurality of flat portions 302 and a plurality of raised portions 303 , wherein the first opening 301 and the The position of the first metal portion corresponds to the position of the orthographic projection of the flat portion 302 on the base substrate 21 and the position of the orthographic projection of the gate on the base substrate 21 and the first The positions of the orthographic projections of the metal portions 222 on the base substrate 21 do not overlap.

S304、将与所述第一开口对应的金属氧化物半导体层蚀刻掉,并将位于所述第一开口下方的栅绝缘层进行蚀刻,形成连接孔;S304, etching away the metal oxide semiconductor layer corresponding to the first opening, and etching the gate insulating layer under the first opening to form a connection hole;

比如,可与先与所述第一开口对应的金属氧化物半导体层24进行蚀刻掉,再对下方的栅绝缘层23进行再次蚀刻,形成连接孔202。For example, the metal oxide semiconductor layer 24 corresponding to the first opening can be etched away first, and then the lower gate insulating layer 23 can be etched again to form the connection hole 202 .

S305、将与所述平坦部302对应的金属氧化物半导体层24蚀刻掉,以形成第一子部241、第二子部242以及第三子部243;S305 , etching away the metal oxide semiconductor layer 24 corresponding to the flat portion 302 to form a first sub-portion 241 , a second sub-portion 242 and a third sub-portion 243 ;

在一实施方式中,所述将与所述平坦部302对应的金属氧化物半导体层蚀刻掉的步骤包括:In one embodiment, the step of etching away the metal oxide semiconductor layer corresponding to the flat portion 302 includes:

S3051、对所述平坦部302进行灰化处理,以将所述平坦部302去除,形成第二开口(图中未标出);S3051, performing ashing treatment on the flat portion 302 to remove the flat portion 302 to form a second opening (not marked in the figure);

S3052、将与所述第二开口对应的金属氧化物半导体层24蚀刻掉。S3052, the metal oxide semiconductor layer 24 corresponding to the second opening is etched away.

S306、将所述凸起部303去除,并在剩余的金属氧化物半导体层24上制作第二金属层25,对所述第二金属层25进行图案化处理形成源极251、漏极252以及第二金属部253;其中所述源极251和漏极252覆盖所述第一子部241,所述第二金属部位253覆盖第二子部242以及第三子部243。S306, removing the raised portion 303, forming a second metal layer 25 on the remaining metal oxide semiconductor layer 24, and patterning the second metal layer 25 to form the source electrode 251, the drain electrode 252 and the The second metal portion 253 ; wherein the source electrode 251 and the drain electrode 252 cover the first sub-portion 241 , and the second metal portion 253 covers the second sub-portion 242 and the third sub-portion 243 .

S307、在所述第二金属层25上形成钝化层26;S307, forming a passivation layer 26 on the second metal layer 25;

S308、在所述钝化层26上制作彩膜层27,所述彩膜层27的位置与所述第二金属部222的位置对应;S308 , forming a color filter layer 27 on the passivation layer 26 , and the position of the color filter layer 27 corresponds to the position of the second metal portion 222 ;

S309、在所述彩膜层27上制作保护层28。其中钝化层26和保护层28上制作有过孔。S309 , forming a protective layer 28 on the color filter layer 27 . The passivation layer 26 and the protective layer 28 are formed with via holes.

S310、在所述保护层28上制作像素电极29。S310 , forming a pixel electrode 29 on the protective layer 28 .

其中像素电极29通过过孔与所述漏极252连接。The pixel electrode 29 is connected to the drain electrode 252 through a via hole.

当然,在其他实施例中,上述制作方法可以不包括S308和/或S309。Of course, in other embodiments, the above manufacturing method may not include S308 and/or S309.

可以理解的上述蚀刻的具体方式不限。It can be understood that the specific manner of the above etching is not limited.

由于将位于源极和漏极外侧的金属氧化物半导体层蚀刻掉,因此避免金属氧化物半导体层裸露在外,避免影响显示质量,此外由于不需要增大栅极的尺寸,因此可以提高开口率。Since the metal oxide semiconductor layers located outside the source and drain electrodes are etched away, the metal oxide semiconductor layers are prevented from being exposed to the outside to avoid affecting the display quality. In addition, since the size of the gate does not need to be increased, the aperture ratio can be increased.

本发明的显示面板及其制作方法,包括使用精细金属掩膜板对所述光阻层进行图案化处理,形成多个平坦部和多个凸起部,其中所述平坦部部在所述衬底基板上的正投影的位置与所述栅极在所述衬底基板上的正投影的位置和所述第一金属部在所述衬底基板上的正投影的位置均不重叠;将与所述平坦部对应的金属氧化物半导体层蚀刻掉,以形成第一子部;将所述凸起部去除,并在剩余的金属氧化物半导体层上制作第二金属层,对所述第二金属层进行图案化处理形成源极和漏极;其中所述源极和漏极覆盖所述第一子部;由于将位于源极和漏极外侧的金属氧化物半导体层蚀刻掉,因此避免金属氧化物半导体层裸露在外,避免影响显示质量,此外由于不需要增大栅极的尺寸,因此可以提高开口率。The display panel and its manufacturing method of the present invention include patterning the photoresist layer using a fine metal mask to form a plurality of flat parts and a plurality of raised parts, wherein the flat parts are on the substrate The position of the orthographic projection on the base substrate does not overlap with the position of the orthographic projection of the gate on the base substrate and the position of the orthographic projection of the first metal part on the base substrate; The metal oxide semiconductor layer corresponding to the flat portion is etched away to form a first sub-portion; the raised portion is removed, and a second metal layer is formed on the remaining metal oxide semiconductor layer, and the second metal layer is formed on the remaining metal oxide semiconductor layer. The metal layer is patterned to form a source electrode and a drain electrode; wherein the source electrode and the drain electrode cover the first subsection; since the metal oxide semiconductor layer outside the source electrode and the drain electrode is etched away, the metal oxide semiconductor layer is avoided The oxide semiconductor layer is exposed to avoid affecting the display quality, and since it is not necessary to increase the size of the gate, the aperture ratio can be increased.

综上所述,虽然本发明已以优选实施例揭露如上,但上述优选实施例并非用以限制本发明,本领域的普通技术人员,在不脱离本发明的精神和范围内,均可作各种更动与润饰,因此本发明的保护范围以权利要求界定的范围为准。In summary, although the present invention has been disclosed above with preferred embodiments, the above preferred embodiments are not intended to limit the present invention. Those of ordinary skill in the art can make various Therefore, the protection scope of the present invention is subject to the scope defined by the claims.

Claims (8)

1.一种显示面板的制作方法,其特征在于,包括:1. A method of making a display panel, comprising: 在衬底基板上制作第一金属层,对所述第一金属层进行图案化处理形成栅极和第一金属部;forming a first metal layer on a base substrate, and patterning the first metal layer to form a gate electrode and a first metal portion; 在所述第一金属层上依次制作栅绝缘层、金属氧化物半导体层以及光阻层;forming a gate insulating layer, a metal oxide semiconductor layer and a photoresist layer in sequence on the first metal layer; 使用精细金属掩膜板对所述光阻层进行图案化处理,形成多个平坦部和多个凸起部,其中所述平坦部在所述衬底基板上的正投影的位置与所述栅极在所述衬底基板上的正投影的位置和所述第一金属部在所述衬底基板上的正投影的位置均不重叠;The photoresist layer is patterned using a fine metal mask to form a plurality of flat parts and a plurality of raised parts, wherein the position of the orthographic projection of the flat parts on the base substrate is the same as that of the gate The position of the orthographic projection of the pole on the base substrate and the position of the orthographic projection of the first metal portion on the base substrate do not overlap; 将与所述平坦部对应的金属氧化物半导体层蚀刻掉,以形成第一子部;etching away the metal oxide semiconductor layer corresponding to the flat portion to form a first sub-portion; 将所述凸起部去除,并在剩余的金属氧化物半导体层上制作第二金属层,对所述第二金属层进行图案化处理形成源极和漏极;其中所述源极和漏极覆盖所述第一子部;The raised portion is removed, a second metal layer is formed on the remaining metal oxide semiconductor layer, and the second metal layer is patterned to form a source electrode and a drain electrode; wherein the source electrode and the drain electrode covering the first subsection; 在所述第二金属层上形成钝化层;forming a passivation layer on the second metal layer; 在所述钝化层上制作像素电极,其中像素电极与所述漏极连接;forming a pixel electrode on the passivation layer, wherein the pixel electrode is connected to the drain electrode; 其中,所述将与所述平坦部对应的金属氧化物半导体层蚀刻掉,以形成第一子部的步骤包括:Wherein, the step of etching away the metal oxide semiconductor layer corresponding to the flat portion to form the first sub-portion includes: 将与所述平坦部对应的金属氧化物半导体层蚀刻掉,以形成第一子部、第二子部以及第三子部;etching away the metal oxide semiconductor layer corresponding to the flat portion to form a first sub-section, a second sub-section and a third sub-section; 所述对所述第二金属层进行图案化处理形成源极和漏极的步骤包括:The step of patterning the second metal layer to form a source electrode and a drain electrode includes: 对所述第二金属层进行图案化处理形成源极、漏极以及第二金属部,所述第二金属部覆盖第二子部以及第三子部。The second metal layer is patterned to form a source electrode, a drain electrode and a second metal portion, and the second metal portion covers the second sub-portion and the third sub-portion. 2.根据权利要求1所述的显示面板的制作方法,其特征在于,2. The manufacturing method of the display panel according to claim 1, wherein, 所述将与所述平坦部对应的金属氧化物半导体层蚀刻掉的步骤包括:The step of etching away the metal oxide semiconductor layer corresponding to the flat portion includes: 对所述平坦部进行灰化处理,以将所述平坦部去除,形成第二开口;performing ashing treatment on the flat portion to remove the flat portion to form a second opening; 将与所述第二开口对应的金属氧化物半导体层蚀刻掉。The metal oxide semiconductor layer corresponding to the second opening is etched away. 3.根据权利要求1所述的显示面板的制作方法,其特征在于,所述使用精细金属掩膜板对所述光阻层进行图案化处理,形成多个平坦部以及多个凸起部的步骤包括:3 . The method for manufacturing a display panel according to claim 1 , wherein the photoresist layer is patterned by using a fine metal mask to form a plurality of flat portions and a plurality of raised portions. 4 . Steps include: 使用精细金属掩膜板对所述光阻层进行图案化处理,形成多个平坦部、多个凸起部以及第一开口,其中所述第一开口与所述第一金属部的位置对应。The photoresist layer is patterned using a fine metal mask to form a plurality of flat parts, a plurality of raised parts and a first opening, wherein the first opening corresponds to the position of the first metal part. 4.根据权利要求3所述的显示面板的制作方法,其特征在于,4. The manufacturing method of the display panel according to claim 3, wherein, 所述将与所述平坦部对应的金属氧化物半导体层蚀刻掉,以形成第一子部、第二子部以及第三子部的步骤之前,所述方法还包括:Before the step of etching away the metal oxide semiconductor layer corresponding to the flat portion to form the first sub-section, the second sub-section and the third sub-section, the method further includes: 将与所述第一开口对应的金属氧化物半导体层蚀刻掉,并将位于所述第一开口下方的栅绝缘层进行蚀刻,形成连接孔;etching away the metal oxide semiconductor layer corresponding to the first opening, and etching the gate insulating layer under the first opening to form a connection hole; 所述在剩余的金属氧化物半导体层上制作第二金属层的步骤包括:The step of forming the second metal layer on the remaining metal oxide semiconductor layer includes: 在剩余的金属氧化物半导体层上以及所述连接孔内制作第二金属层。A second metal layer is formed on the remaining metal oxide semiconductor layer and in the connection hole. 5.根据权利要求1所述的显示面板的制作方法,其特征在于,5. The manufacturing method of the display panel according to claim 1, wherein, 所述在所述第二金属层上形成钝化层的步骤之后,以及所述在所述钝化层上制作像素电极的步骤之前,所述方法还包括:After the step of forming a passivation layer on the second metal layer and before the step of forming a pixel electrode on the passivation layer, the method further includes: 在所述钝化层上制作彩膜层,所述彩膜层的位置与所述第二金属部的位置对应;forming a color filter layer on the passivation layer, the position of the color filter layer corresponds to the position of the second metal part; 所述在所述钝化层上制作像素电极的步骤包括:The step of fabricating the pixel electrode on the passivation layer includes: 在所述彩膜层上制作像素电极。Pixel electrodes are fabricated on the color filter layer. 6.根据权利要求5所述的显示面板的制作方法,其特征在于,6. The manufacturing method of the display panel according to claim 5, wherein, 所述在所述彩膜层上制作像素电极的步骤包括:The step of fabricating pixel electrodes on the color filter layer includes: 在所述彩膜层上制作保护层;making a protective layer on the color filter layer; 在所述保护层上制作像素电极。A pixel electrode is fabricated on the protective layer. 7.一种显示面板,其特征在于,包括:7. A display panel, comprising: 衬底基板;substrate substrate; 第一金属层,包括栅极和第一金属部;a first metal layer, including a gate electrode and a first metal part; 栅绝缘层,设于所述第一金属层上;a gate insulating layer, disposed on the first metal layer; 金属氧化物半导体层,设于所述栅绝缘层上,所述金属氧化物半导体层包括第一子部;所述第一子部的位置与所述栅极的位置对应;a metal oxide semiconductor layer, disposed on the gate insulating layer, the metal oxide semiconductor layer includes a first subsection; the position of the first subsection corresponds to the position of the gate; 第二金属层,设于所述金属氧化物半导体层上,所述第二金属层包括源极和漏极;所述源极覆盖所述第一子部的其中一个端部;所述漏极覆盖所述第一子部的另一个端部;A second metal layer is disposed on the metal oxide semiconductor layer, the second metal layer includes a source electrode and a drain electrode; the source electrode covers one end of the first sub-section; the drain electrode covering the other end of the first subsection; 钝化层,设于所述第二金属层上;a passivation layer, disposed on the second metal layer; 像素电极,设于在所述钝化层上;a pixel electrode, disposed on the passivation layer; 其中,所述金属氧化物半导体层还包括第二子部以及第三子部;所述第二金属层包括还第二金属部,所述第二子部与所述第一金属部的其中一个端部的位置对应;所述第三子部与所述第一金属部的另一个端部的位置对应;所述第二金属部覆盖第二子部以及第三子部上。Wherein, the metal oxide semiconductor layer further includes a second sub-section and a third sub-section; the second metal layer further includes a second metal section, one of the second sub-section and the first metal section The position of the end portion corresponds to that of the third sub-portion; the position of the third sub-portion corresponds to the position of the other end portion of the first metal portion; the second metal portion covers the second sub-portion and the third sub-portion. 8.根据权利要求7所述的显示面板,其特征在于,8. The display panel according to claim 7, wherein, 所述栅绝缘层上设置有连接孔,所述第二金属部通过所述连接孔与所述第一金属部连接。A connection hole is provided on the gate insulating layer, and the second metal part is connected to the first metal part through the connection hole.
CN202010289130.7A 2020-04-14 2020-04-14 Display panel and manufacturing method thereof Active CN111430379B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010289130.7A CN111430379B (en) 2020-04-14 2020-04-14 Display panel and manufacturing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010289130.7A CN111430379B (en) 2020-04-14 2020-04-14 Display panel and manufacturing method thereof

Publications (2)

Publication Number Publication Date
CN111430379A CN111430379A (en) 2020-07-17
CN111430379B true CN111430379B (en) 2022-09-27

Family

ID=71558265

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010289130.7A Active CN111430379B (en) 2020-04-14 2020-04-14 Display panel and manufacturing method thereof

Country Status (1)

Country Link
CN (1) CN111430379B (en)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101294232B1 (en) * 2007-06-08 2013-08-07 엘지디스플레이 주식회사 Fringe field switching mode liquid crystal display device and the method for fabricating the same
TWI373141B (en) * 2007-12-28 2012-09-21 Au Optronics Corp Liquid crystal display unit structure and the manufacturing method thereof
KR101294235B1 (en) * 2008-02-15 2013-08-07 엘지디스플레이 주식회사 Liquid Crystal Display Device and Method of Fabricating the same
CN101887897B (en) * 2009-05-13 2013-02-13 北京京东方光电科技有限公司 TFT-LCD (Thin Film Transistor Liquid Crystal Display) array base plate and manufacturing method thereof
KR101287478B1 (en) * 2009-06-02 2013-07-19 엘지디스플레이 주식회사 Display device having oxide thin film transistor and method of fabricating thereof
CN104950541B (en) * 2015-07-20 2018-05-01 深圳市华星光电技术有限公司 BOA type liquid crystal display panels and preparation method thereof

Also Published As

Publication number Publication date
CN111430379A (en) 2020-07-17

Similar Documents

Publication Publication Date Title
CN104617102B (en) Array base palte and manufacturing method of array base plate
CN103227147B (en) TFT-LCD array substrate and manufacture method, liquid crystal display
CN103811417B (en) How to make pixel structure
CN109494257B (en) Thin film transistor, manufacturing method thereof, array substrate and display device
US8748320B2 (en) Connection to first metal layer in thin film transistor process
WO2021031312A1 (en) Organic light-emitting display panel and preparation method thereof
CN110164873A (en) Production method, array substrate, display panel and the display device of array substrate
CN104617152A (en) Oxide film transistor and manufacturing method thereof
CN102779783B (en) Pixel structure, as well as manufacturing method and display device thereof
WO2015067068A1 (en) Low-temperature polycrystalline silicon film transistor array substrate, manufacturing method thereof, and display apparatus
CN111081737A (en) Method for preparing an array substrate and array substrate
CN110993695B (en) GSD TFT device and manufacturing method thereof
CN103681514B (en) Array base palte and preparation method thereof, display unit
CN111063695A (en) Display panel and preparation method thereof
WO2020077861A1 (en) Array substrate and preparation method therefor
CN110931510B (en) Array substrate, display panel and preparation method of array substrate
TWI383502B (en) Pixel structure and its manufacturing method
CN111129038A (en) TFT array substrate and manufacturing method thereof
CN108538725B (en) Thin film transistor and method of manufacturing the same
WO2021026990A1 (en) Array substrate and method for manufacturing same
WO2019095562A1 (en) Method for manufacturing tft substrate
CN102723310A (en) Array substrate manufacturing method, array substrate and liquid crystal display device
CN103165530B (en) Thin film transistor (TFT) array substrate and manufacture method and display device thereof
CN105826248A (en) FFS-mode type array substrate and manufacturing method thereof
CN110176462B (en) A kind of transparent OLED display manufacturing method and display

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant