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CN111351420A - Magnetic position sensing device and method - Google Patents

Magnetic position sensing device and method Download PDF

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Publication number
CN111351420A
CN111351420A CN201811596977.9A CN201811596977A CN111351420A CN 111351420 A CN111351420 A CN 111351420A CN 201811596977 A CN201811596977 A CN 201811596977A CN 111351420 A CN111351420 A CN 111351420A
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voltage
pattern
induced voltage
induction
ruler
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CN111351420B (en
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王裕铭
杜陈忠
陈柏安
张祯元
胡竹生
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Industrial Technology Research Institute ITRI
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques

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  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)

Abstract

The magnetic position sensing device and method utilizes the pattern of induction rule to produce induction voltage change according to the position change of alternating magnetic field of excitation element, and then utilizes the technical means of analyzing position by voltage value to analyze out the position of said excitation element.

Description

磁性位置感知装置与方法Magnetic position sensing device and method

技术领域technical field

本发明有关位置感知技术,尤指一种磁性位置感知装置与方法。The present invention relates to position sensing technology, in particular to a magnetic position sensing device and method.

背景技术Background technique

高精度位置检知元件包括光学尺与磁性尺等,其广泛应用于精密机械产业(如工具机)以及智慧制造产业(如精密机械手臂)等,其中因应加工设备常需在恶劣环境进行产品加工,磁性尺相较光学尺的抗污染能力好且结构简单,近年来高阶磁性尺研发日益积极,逐渐有取代中阶光学尺市场趋势。High-precision position detection components include optical scales and magnetic scales, etc., which are widely used in precision machinery industries (such as machine tools) and smart manufacturing industries (such as precision robotic arms), etc. The processing equipment often needs to process products in harsh environments , Compared with optical rulers, magnetic rulers have better anti-pollution ability and simple structure. In recent years, the research and development of high-end magnetic rulers has become increasingly active, and there is a trend to replace the market of middle-grade optical rulers.

然而,传统磁性尺遭遇磁极宽度微细化瓶颈,以及电压相位差解析图案位置因组装控制造成检知稳定度问题,致使一般磁性尺精度不高且稳定性不好,另一方面,充磁耗时问题也使高阶磁性尺更不易于长尺寸化(Scale up)。However, the traditional magnetic scale encounters the bottleneck of the miniaturization of the magnetic pole width, and the detection stability problem of the position of the voltage phase difference analysis pattern due to the assembly control, resulting in the low accuracy and poor stability of the general magnetic scale. On the other hand, the magnetization takes time. The problem also makes high-order magnetic rulers less prone to scale up.

因此,如何有效改善充磁耗时、安装精度不易控制以及生产长度受限等问题,实为目前业界所亟待解决的课题之一。Therefore, how to effectively improve the time-consuming magnetization, the difficulty in controlling the installation accuracy, and the limited production length is one of the urgent issues to be solved in the current industry.

公开内容public content

为克服现有技术的缺点,本发明提供一种磁性位置感知装置,包括:一激磁元件,其产生一交变磁场;一感应尺,其形成有图案,且该图案依该交变磁场变化产生感应电压;以及一位置解析元件,其提取该感应电压,以依据该感应电压解析出该激磁元件位于该感应尺上的位置。In order to overcome the shortcomings of the prior art, the present invention provides a magnetic position sensing device, comprising: an excitation element, which generates an alternating magnetic field; an induction ruler, which is formed with a pattern, and the pattern is generated according to the change of the alternating magnetic field an induced voltage; and a position analysis element, which extracts the induced voltage to resolve the position of the excitation element on the induction ruler according to the induced voltage.

本发明还提供一种磁性位置感知方法,包括:于一感应尺上形成图案;令一激磁元件产生一交变磁场;利用该感应尺的图案依该交变磁场变化产生感应电压;以及利用一位置解析元件提取该感应电压,并依据该感应电压解析出该激磁元件位于该感应尺上的位置。The present invention also provides a magnetic position sensing method, comprising: forming a pattern on an induction ruler; causing an excitation element to generate an alternating magnetic field; using the pattern of the induction ruler to generate an induced voltage according to the change of the alternating magnetic field; and using a The position analysis element extracts the induced voltage, and analyzes the position of the excitation element on the induction ruler according to the induced voltage.

由上述可得知,本发明利用感应尺的图案随激磁元件的交变磁场位置变化产生感应电压,进而以电压值解析位置的技术手段,提高位置检出精度与稳定度,以及金属线图案转印工艺易于长尺寸化(Scale up)等优点,以解决现有技术采用磁极图案感知以及电压相位差解析所遭遇的充磁耗时、安装精度不易控制以及生产长度受限的问题。It can be seen from the above that the present invention utilizes the pattern of the induction ruler to generate an induced voltage with the change of the position of the alternating magnetic field of the exciting element, and then uses the technical means of analyzing the position of the voltage value to improve the position detection accuracy and stability, as well as the rotation of the metal wire pattern. The printing process is easy to scale up and other advantages, so as to solve the problems of time-consuming magnetization, difficult control of installation accuracy and limited production length encountered in the prior art using magnetic pole pattern sensing and voltage phase difference analysis.

附图说明Description of drawings

图1为本公开的磁性位置感知装置的第一实施例的示意图;FIG. 1 is a schematic diagram of a first embodiment of the disclosed magnetic position sensing device;

图2为本公开的磁性位置感知装置的第一实施例的激磁元件的示意图;2 is a schematic diagram of an excitation element of a first embodiment of the disclosed magnetic position sensing device;

图3为本公开的磁性位置感知装置的第一实施例的位置解析元件的示意图;3 is a schematic diagram of a position resolving element of the first embodiment of the magnetic position sensing device of the present disclosure;

图4为本公开的磁性位置感知装置的第一实施例的感应电压信号处理单元的示意图;4 is a schematic diagram of an induced voltage signal processing unit of the first embodiment of the magnetic position sensing device of the present disclosure;

图5A为本公开的磁性位置感知装置的第一实施例的感应尺的图案的示意图;5A is a schematic diagram of a pattern of a sensing ruler of the first embodiment of the magnetic position sensing device of the present disclosure;

图5B至5C为本公开的磁性位置感知装置的第一实施例的感应电压进行信号处理的示意图;5B to 5C are schematic diagrams of signal processing of the induced voltage of the first embodiment of the magnetic position sensing device of the present disclosure;

图5D为本公开的磁性位置感知装置的第一实施例的磁性位置感知图的示意图;5D is a schematic diagram of a magnetic position sensing diagram of the first embodiment of the disclosed magnetic position sensing device;

图5E为本公开的磁性位置感知装置的第一实施例的方波图形与处理电压的关系的示意图;5E is a schematic diagram of the relationship between the square wave pattern and the processing voltage of the first embodiment of the disclosed magnetic position sensing device;

图5F为本公开的磁性位置感知装置的第一实施例的处理电压的转折处放大的示意图;5F is an enlarged schematic diagram of a turning point of processing voltage of the first embodiment of the disclosed magnetic position sensing device;

图6A为本公开的磁性位置感知装置的第二实施例的感应尺的图案的示意图;6A is a schematic diagram of a pattern of a sensing ruler of the second embodiment of the magnetic position sensing device of the present disclosure;

图6B为本公开的磁性位置感知装置的第二实施例的磁性位置感知图的示意图;6B is a schematic diagram of a magnetic position sensing diagram of the second embodiment of the disclosed magnetic position sensing device;

图6C为本公开的磁性位置感知装置的第二实施例的分析区段的示意图;6C is a schematic diagram of an analysis section of the second embodiment of the disclosed magnetic position sensing device;

图7为本公开的磁性位置感知方法的第一实施例的流程示意图;以及FIG. 7 is a schematic flowchart of the first embodiment of the magnetic position sensing method of the present disclosure; and

图8为本公开的磁性位置感知方法的第一实施例的步骤S74的流程示意图。FIG. 8 is a schematic flowchart of step S74 of the first embodiment of the magnetic position sensing method of the present disclosure.

【附图中本公开实施例主要元件符号说明】[Description of Symbols of Main Elements of the Embodiments of the Present Disclosure in the Drawings]

1 磁性位置感知装置1 Magnetic position sensing device

10 激磁元件10 Exciting element

20 感应尺20 sensor ruler

21 正面21 Front

22 反面22 reverse

30,30′ 图案30, 30' pattern

31 方波图形31 Square Wave Graphics

31′ 第一图形31′ first figure

32 第二图形32 Second Graphic

40 位置解析元件40 Position Resolution Elements

41 感应电压信号处理单元41 Induced voltage signal processing unit

42 感应电压解析位置单元42 Induced voltage analysis position unit

61 正方波区域61 Square wave area

62 负方波区域62 Negative square wave area

63 交变磁场63 Alternating magnetic field

101 导磁部101 Magnetically conductive part

102 绕线部102 Winding section

103 交流电源供应单元103 AC power supply unit

104 第一磁极部104 First magnetic pole part

105 第二磁极部105 Second magnetic pole part

106 开口106 Openings

311 处理电压311 Processing voltage

311′ 第一处理电压311' first processing voltage

313,313′ 第一峰谷水平部313, 313′ The first peak and valley level

314,314′ 第一垂直部314, 314' first vertical part

315,315′ 第一峰顶水平部315, 315′ first peak level

321 第二处理电压321 Second processing voltage

323 第二峰谷水平部323 Second peak and valley level

324 第二垂直部324 Second Vertical Section

325 第二峰顶水平部325 Second Peak Level

411 滤波器411 Filter

412 包络检波器412 Envelope Detector

511 第一非转折曲线区段511 First non-turning curve section

512 第一转折曲线区段512 First inflection curve section

513 第一上升线段513 First rising line segment

514 第一下降线段514 First descending segment

515 第一山峰区域515 First Mountain Area

516 第一低谷区域516 First trough area

521 第二非转折曲线区段521 Second non-turning curve section

522 第二转折曲线区段522 Second inflection curve section

523 第二上升线段523 Second ascending segment

524 第二下降线段524 Second descending segment

525 第二山峰区域525 Second Peak Area

526 第二低谷区域526 Second trough area

B 波峰转折区B wave crest turning area

X 距离X distance

VS,VS1,VS2 感应电压V S , V S1 , V S2 induced voltage

VP,VP1,VP2 处理电压 VP, VP1 , VP2 handle voltage

S71~S74,S81~S82 步骤。Steps S71~S74, S81~S82.

具体实施方式Detailed ways

以下通过特定的具体实施例说明本公开的实施方式,本领域技术人员可由本说明书所揭示的内容轻易地了解本公开的其它优点及功效。The embodiments of the present disclosure are described below through specific specific examples, and those skilled in the art can easily understand other advantages and effects of the present disclosure from the content disclosed in this specification.

须知,本说明书附图所绘示的结构、比例、大小等,均仅用以配合说明书所揭示的内容,以供本领域技术人员的了解与阅读,并非用以限定本公开可实施的限定条件,因此不具技术上的实质意义,任何结构的修饰、比例关系的改变或大小的调整,在不影响本公开所能产生的功效及所能达成的目的下,均应仍落在本公开所揭示的技术内容得能涵盖之范围内。同时,本说明书中所引用的如“第一”及“第二”等用语,也仅为便于叙述的明了,而非用以限定本公开可实施的范围,其相对关系的改变或调整,在无实质变更技术内容下,当视为本公开可实施的范畴。It should be noted that the structures, proportions, sizes, etc. shown in the drawings of this specification are only used to cooperate with the contents disclosed in the specification for the understanding and reading of those skilled in the art, and are not used to limit the conditions for the implementation of the present disclosure. Therefore, it has no technical substantive significance, and any modification of the structure, the change of the proportional relationship or the adjustment of the size should still fall within the scope of the disclosure without affecting the effect that the disclosure can produce and the purpose that can be achieved. The technical content must be within the scope of coverage. At the same time, the terms such as "first" and "second" quoted in this specification are only for the convenience of description and clarity, and are not used to limit the scope of implementation of the present disclosure. If the technical content is not substantially changed, it should be regarded as the scope in which the present disclosure can be implemented.

图1其为本公开的磁性位置感知装置1的第一实施例的示意图。如图所示,该磁性位置感知装置1包括激磁元件10,其被施加交流电源以产生交变磁场;感应尺20,其形成有图案30,且图案30随该交变磁场变化产生感应电压;以及位置解析元件40,其与感应尺20连接,以读取该感应尺20所产生的该感应电压,并依据该感应电压解析出激磁元件10位于感应尺20上的位置。FIG. 1 is a schematic diagram of a first embodiment of a magnetic position sensing device 1 of the present disclosure. As shown in the figure, the magnetic position sensing device 1 includes an excitation element 10, which is applied with an AC power source to generate an alternating magnetic field; an induction ruler 20, which is formed with a pattern 30, and the pattern 30 generates an induced voltage with the change of the alternating magnetic field; and a position analyzing element 40 , which is connected with the sensing ruler 20 to read the induced voltage generated by the sensing ruler 20 , and analyze the position of the excitation element 10 on the sensing ruler 20 according to the induced voltage.

在一实施例中,感应尺20的图案30由金属线构成。In one embodiment, the pattern 30 of the sensing ruler 20 is formed of metal wires.

在一实施例中,感应尺20的图案30为周期性波形图案,且该周期性波形图案的两端皆与位置解析元件40连接,以供位置解析元件40读取该图案30随该交变磁场变化产生的该感应电压。In one embodiment, the pattern 30 of the sensor ruler 20 is a periodic waveform pattern, and both ends of the periodic waveform pattern are connected to the position analysis element 40 , so that the position analysis element 40 can read the pattern 30 as the pattern 30 alternates. This induced voltage is generated by changes in the magnetic field.

图2其为本公开的该第一实施例的激磁元件10的侧示图。如图所示,激磁元件10包括导磁部101、绕线部102、交流电源供应单元103、第一磁极部104、第二磁极部105及开口106。FIG. 2 is a side view of the excitation element 10 of the first embodiment of the present disclosure. As shown in the figure, the excitation element 10 includes a magnetic conductive portion 101 , a winding portion 102 , an AC power supply unit 103 , a first magnetic pole portion 104 , a second magnetic pole portion 105 and an opening 106 .

导磁部101呈具开口106的环状,第一磁极部104及第二磁极部105位于导磁部101的两端,开口106位于第一磁极部104及第二磁极部105之间,且绕线部102为线圈结构并缠绕于导磁部101上。同时,激磁元件10通过开口106在感应尺20的图案30上移动,或激磁元件10固定而使感应尺20在开口106中移动。The magnetic conductive portion 101 is annular with an opening 106 , the first magnetic pole portion 104 and the second magnetic pole portion 105 are located at both ends of the magnetic conductive portion 101 , the opening 106 is located between the first magnetic pole portion 104 and the second magnetic pole portion 105 , and The winding portion 102 is a coil structure and is wound on the magnetic conductive portion 101 . At the same time, the excitation element 10 moves on the pattern 30 of the induction scale 20 through the opening 106 , or the excitation element 10 is fixed so that the induction scale 20 moves in the opening 106 .

交流电源供应单元103施加交流电源至绕线部102产生该交变磁场,以使感应尺20的图案30随该交变磁场变化而产生该感应电压。The AC power supply unit 103 applies the AC power to the winding portion 102 to generate the alternating magnetic field, so that the pattern 30 of the sensing ruler 20 changes with the alternating magnetic field to generate the induced voltage.

图3其为本公开的磁性位置感知装置1的位置解析元件40的示意图。如图所示,位置解析元件40包括感应电压信号处理单元41,其与感应尺20上的图案30连接,以读取图案30随该交变磁场变化产生的该感应电压VS,并对该感应电压VS进行滤波及检波的信号处理,以得到处理电压VP;以及感应电压解析位置单元42,其与感应电压信号处理单元41连接,以接收该处理电压VP,并依据该处理电压VP的周期对应于X座标上的长度等于感应尺20上的图案30的周期对应于X座标上的距离的关系,以解析出该激磁元件10位于该感应尺20上的位置。FIG. 3 is a schematic diagram of the position analysis element 40 of the magnetic position sensing device 1 of the present disclosure. As shown in the figure, the position analysis element 40 includes an induced voltage signal processing unit 41, which is connected to the pattern 30 on the sensor ruler 20, so as to read the induced voltage V S generated by the pattern 30 with the change of the alternating magnetic field, and respond to the The induced voltage VS is subjected to signal processing of filtering and detection to obtain the processing voltage VP ; and the induced voltage analysis position unit 42 is connected to the induced voltage signal processing unit 41 to receive the processing voltage VP , and according to the processing voltage The period of VP corresponds to the length on the X-coordinate and is equal to the relationship between the period of the pattern 30 on the sensing scale 20 and the distance on the X-coordinate to resolve the position of the excitation element 10 on the sensing scale 20 .

图4其为本公开的感应电压信号处理单元41第一实施例的示意图。如图所示,感应电压信号处理单元41包括滤波器411,其对该感应电压VS进行滤波,以将该感应电压VS中的交流电源的载波频率过滤掉;以及包络检波器(envelope detector)412,其与滤波器(filter)411连接,以将过滤掉载波频率的感应电压VS进行检波,以得到该处理电压VPFIG. 4 is a schematic diagram of the first embodiment of the induced voltage signal processing unit 41 of the present disclosure. As shown in the figure, the induced voltage signal processing unit 41 includes a filter 411, which filters the induced voltage V S to filter out the carrier frequency of the AC power source in the induced voltage V S ; and an envelope detector (envelope detector). A detector 412 is connected to a filter 411 to detect the induced voltage VS with the carrier frequency filtered out, so as to obtain the processing voltage VP .

在本实施例中,滤波器411为低通滤波器。In this embodiment, the filter 411 is a low-pass filter.

在本实施例中,感应电压信号处理单元41还包括:第一放大器(amplifier,未图示),该第一放大器的输出端连接于滤波器411的输入端,该第一放大器的输入端与感应尺20的图案30连接,以自感应尺20取得图案30随该交变磁场位置变化所产生的感应电压,并将该感应电压进行信号放大后输出至滤波器411中,但不以此为限。In this embodiment, the induced voltage signal processing unit 41 further includes: a first amplifier (amplifier, not shown), the output end of the first amplifier is connected to the input end of the filter 411 , and the input end of the first amplifier is connected to the input end of the filter 411 . The pattern 30 of the induction ruler 20 is connected to obtain the induced voltage generated by the pattern 30 with the change of the position of the alternating magnetic field from the induction ruler 20, and the induced voltage is amplified and output to the filter 411, but this is not the case. limit.

在本实施例中,感应电压信号处理单元41还包括:位准偏移器(1evelshifter,未图示),其与包络检波器412连接,并将完成滤波及检波的信号处理的处理电压VP进行位准偏移的处理,以取得该处理电压VP于后续工作所需的位准(此处指电压位准);以及第二放大器(未图示),其与该位准偏移器连接,以将完成位准偏移处理的处理电压VP放大输出至感应电压解析位置单元42,但不以此为限。In the present embodiment, the induced voltage signal processing unit 41 further includes: a level shifter (levelshifter, not shown), which is connected to the envelope detector 412 and transmits the processing voltage V after the signal processing of filtering and detection is completed. P performs a level shift process to obtain the level required by the processing voltage VP for subsequent operations (here refers to a voltage level); and a second amplifier (not shown), which is shifted from the level The device is connected to amplify and output the processing voltage VP after the level shift processing is completed to the induced voltage analysis position unit 42, but not limited to this.

在本实施例中,该位置解析元件40还包括:模数转换器(analog digitalconverter,未图示),其位于感应电压信号处理单元41与感应电压解析位置单元42之间,以将感应电压信号处理单元41所得该处理电压VP转换成数位信号的处理电压VP并传送给感应电压解析位置单元42,但不以此为限。In this embodiment, the position analysis element 40 further includes: an analog digital converter (not shown), which is located between the induced voltage signal processing unit 41 and the induced voltage analysis position unit 42 to convert the induced voltage signal The processing voltage VP obtained by the processing unit 41 is converted into a processing voltage VP of a digital signal and sent to the induced voltage analyzing and positioning unit 42, but not limited thereto.

图5A其为本公开的感应尺20的图案30第一实施例的示意图。如图所示,该第一实施例的图案30为方波图形31且只形成在图1所示感应尺20的正面21或与正面21相对的反面22的其中一面,方波图形31由多个第一峰谷水平部313、多个第一垂直部314及多个第一峰顶水平部315所组成,且方波图形31的线宽为1mm,各该第一垂直部314的间的线距(A)为4mm,而方波图形31的周期(TD)对应于X座标上的距离为8mm,且方波图形31的开口朝下的区域为正方波区域61而开口朝上的区域为负方波区域62。FIG. 5A is a schematic diagram of a first embodiment of the pattern 30 of the sensor ruler 20 of the present disclosure. As shown in the figure, the pattern 30 of the first embodiment is a square wave pattern 31 and is only formed on one of the front side 21 or the back side 22 opposite to the front side 21 of the sensor ruler 20 shown in FIG. The first peak-to-valley horizontal portions 313 , a plurality of first vertical portions 314 and a plurality of first peak-top horizontal portions 315 are formed, and the line width of the square wave pattern 31 is 1 mm. The line spacing (A) is 4mm, and the period (T D ) of the square wave pattern 31 corresponds to a distance on the X coordinate of 8mm, and the area where the opening of the square wave pattern 31 faces downward is the square wave area 61 and the opening faces upward. The area of is the negative square wave area 62 .

图5B其为本公开的位置解析元件40解析图案30随该交变磁场变化产生的第一实施例的感应电压的波形示意图。如图所示,激磁元件10在感应尺20上移动距离ΔX后,该距离ΔX的移动会带动该交变磁场变化,进而使感应尺20上的图案30感应该交变磁场变化产生对应的该感应电压的变化(波形的振幅改变)。因此,感应电压VS1到感应电压VS2的关系为激磁元件10在感应尺20上移动距离ΔX的关系,且由于感应电压包含有交流电源103的载波频率的振幅,故感应电压VS1移动距离ΔX到感应电压VS2会有振幅的变化。FIG. 5B is a schematic waveform diagram of the induced voltage of the first embodiment generated by the position analyzing element 40 analyzing the pattern 30 of the present disclosure as the alternating magnetic field changes. As shown in the figure, after the excitation element 10 moves a distance ΔX on the sensing ruler 20, the movement of the distance ΔX will drive the change of the alternating magnetic field, so that the pattern 30 on the sensing ruler 20 senses the change of the alternating magnetic field to generate the corresponding change in the alternating magnetic field. Change in induced voltage (change in amplitude of waveform). Therefore, the relationship between the induced voltage V S1 and the induced voltage V S2 is the relationship between the moving distance ΔX of the exciting element 10 on the inductive scale 20 , and since the induced voltage includes the amplitude of the carrier frequency of the AC power source 103 , the induced voltage V S1 moves by the distance ΔX. There will be a change in amplitude from ΔX to the induced voltage V S2 .

图5C其为图5B中的感应电压经由位置解析元件40解析后所得到的处理电压的示意图。如图所示,具有振幅变化的感应电压VS1及VS2经由感应电压信号处理单元41进行滤波及检波的信号处理后,得到没有该载波频率的处理电压VP1及VP2,由于该处理电压是对应该感应电压,因此处理电压VP1到处理电压VP2的变化ΔV关系也为该ΔX距离的变化。FIG. 5C is a schematic diagram of the processing voltage obtained after the induced voltage in FIG. 5B is analyzed by the position analysis element 40 . As shown in the figure, after the induced voltages V S1 and V S2 with amplitude changes are filtered and detected by the induced voltage signal processing unit 41 , the processed voltages V P1 and V P2 without the carrier frequency are obtained. It corresponds to the induced voltage, so the relationship ΔV between the processing voltage V P1 and the processing voltage V P2 is also the change in the ΔX distance.

激磁元件10产生该交变磁场后,经由该感应电压信号处理单元41对各该图案30随该交变磁场变化产生的该感应电压VS进行滤波及检波的信号处理,以取得如图5D所示呈类三角波的该处理电压311后,感应电压解析位置单元42提取图5D所示的该呈类三角波的处理电压311的所有区段作为分析区段,并将该分析区段的处理电压的周期(TL)对应于X座标上的长度,以方波图形31的周期(TD)对应于X座标上的距离单位表示,再令该分析区段的处理电压随该距离单位的变化即为激磁元件10在感应尺20上的移动距离,进而从该分析区段的中解析出该激磁元件10位于该感应尺20上的位置。After the excitation element 10 generates the alternating magnetic field, the induced voltage signal processing unit 41 performs signal processing of filtering and detection on the induced voltage V S generated by the pattern 30 with the change of the alternating magnetic field, so as to obtain the signal as shown in FIG. 5D . After the processing voltage 311 in the shape of a triangle wave is displayed, the induced voltage analysis location unit 42 extracts all the sections of the processing voltage 311 in the shape of a triangle wave shown in FIG. 5D as the analysis section, and uses the processing voltage of the analysis section The period (T L ) corresponds to the length on the X coordinate, and is represented by the period (T D ) of the square wave pattern 31 corresponding to the distance unit on the X coordinate, and then let the processing voltage of the analysis section vary with the distance unit. The change is the moving distance of the excitation element 10 on the induction ruler 20 , and then the position of the excitation element 10 on the induction ruler 20 is analyzed from the analysis section.

需理解的是,由于处理电压VP1对应感应电压VS1,而感应电压VS1的变化相对于该激磁元件10在图案30上移动的距离,因此,图5D所示的处理电压的周期(TL)对应于X座标上的长度以图案30的周期(TD)对应于X座标上的距离单位表示,X=S×TL+X0=S×TL+(Vt-V0)/m,其中,X为激磁元件10在感应尺20上的位置,S为分析区段的周期数(0、0.5、1、1.5、...),TL为分析区段的周期的距离,X0为第S周期处理电压至X的距离,Vt为处理电压值,V0为第S周期线性起始电压值,m为(X,Vt)的斜率值。It should be understood that, since the processing voltage V P1 corresponds to the induced voltage V S1 , and the variation of the induced voltage V S1 is relative to the distance that the excitation element 10 moves on the pattern 30 , therefore, the period of the processing voltage shown in FIG. 5D (T L ) corresponds to the length on the X coordinate in terms of the period (T D ) of the pattern 30 corresponding to the distance unit on the X coordinate, X=S×T L +X 0 =S×T L +(V t −V 0 )/m, where X is the position of the excitation element 10 on the induction ruler 20, S is the period number of the analysis section (0, 0.5, 1, 1.5, ...), and T L is the period of the analysis section distance, X 0 is the distance from the S-th cycle processing voltage to X, V t is the processing voltage value, V 0 is the S-th cycle linear starting voltage value, and m is the slope value of (X, V t ).

图5E其为本公开的第一实施例的感应尺20上的方波图形31与处理电压311的关系的示意图。如图所示,方波图形31随激磁元件10交变磁场63位置变化产生对应类三角波形的处理电压311,图5F所示为类三角波形的处理电压311于波峰与波谷转折区(如图5E所示波峰转折区B)呈现类圆弧状。FIG. 5E is a schematic diagram of the relationship between the square wave pattern 31 on the sensor ruler 20 and the processing voltage 311 according to the first embodiment of the present disclosure. As shown in the figure, the square wave pattern 31 generates a processing voltage 311 corresponding to a triangular waveform with the change of the position of the alternating magnetic field 63 of the exciting element 10. FIG. 5F shows the processing voltage 311 of a triangular waveform at the turning area of the peak and the trough (as shown in FIG. 5F ). The wave crest transition area B) shown in 5E presents an arc-like shape.

图6A其为本公开的磁性位置感知装置1的第二实施例的图案30′的示意图。如图所示,本实施例与第一实施例的差异在于图案30′,因此以下将说明不同处,而不再赘述相同处。本实施例的图案30′其包含第一图形31′及第二图形32,第一图形31′形成在图1所示感应尺20的正面21上,而第二图形32形成在图1所示感应尺20的反面22上,其中,该第一图形31′及第二图形32位于同一水平线上,且第一图形31′及第二图形32的图形相同并彼此相差1/2线距(A)或1/4周期(TD),其中,第一图形31′由多个第一峰谷水平部313′、多个第一垂直部314′及多个第一峰顶水平部315′所组成的方波图形,第二图形32由多个第二峰谷水平部323、多个第二垂直部324及多个第二峰顶水平部325所组成的方波图形。FIG. 6A is a schematic diagram of a pattern 30 ′ of the second embodiment of the magnetic position sensing device 1 of the present disclosure. As shown in the figure, the difference between the present embodiment and the first embodiment lies in the pattern 30 ′, so the difference will be described below, and the similarities will not be repeated. The pattern 30 ′ of this embodiment includes a first pattern 31 ′ and a second pattern 32 . The first pattern 31 ′ is formed on the front surface 21 of the sensor ruler 20 shown in FIG. On the reverse side 22 of the sensor ruler 20, the first pattern 31' and the second pattern 32 are located on the same horizontal line, and the patterns of the first pattern 31' and the second pattern 32 are the same and differ from each other by 1/2 line spacing (A ) or 1/4 period (T D ), wherein the first pattern 31 ′ is defined by a plurality of first peak-valley horizontal portions 313 ′, a plurality of first vertical portions 314 ′ and a plurality of first peak-top horizontal portions 315 ′ The square wave pattern formed, the second pattern 32 is a square wave pattern formed by a plurality of second peak-valley horizontal portions 323 , a plurality of second vertical portions 324 and a plurality of second peak-top horizontal portions 325 .

该第二实施例的第一图形31′随交变磁场变化产生第一感应电压及第二图形32随该交变磁场变化产生第二感应电压后,各该感应电压再经由感应电压信号处理单元41的处理,得到如图6B所示位于同一水平线且彼此相差1/4周期的两个呈类三角波的处理电压,第一处理电压311′对应第一图形31′而第二处理电压321对应第二图形32,第一处理电压311′及第二处理电压321皆呈类三角波的波形,由图6A所示可知,第一图形31′及第二图形32彼此相差1/2线距(A)或1/4周期(TD),因此,第一处理电压311′与第二处理电压321之间也彼此相差1/4周期(TD)。After the first pattern 31 ′ of the second embodiment generates a first induced voltage with the change of the alternating magnetic field and the second pattern 32 generates a second induced voltage with the change of the alternating magnetic field, each of the induced voltages is then passed through the induced voltage signal processing unit 41 , two processing voltages like a triangle wave are obtained which are located on the same horizontal line and differ from each other by 1/4 cycle as shown in FIG. 6B , the first processing voltage 311 ′ corresponds to the first pattern 31 ′ and the second processing voltage 321 corresponds to the first In the two graphs 32 , the first processing voltage 311 ′ and the second processing voltage 321 are both triangular-like waveforms. As shown in FIG. 6A , the first graph 31 ′ and the second graph 32 differ from each other by 1/2 line spacing (A) or 1/4 period (TD), therefore, the first processing voltage 311 ′ and the second processing voltage 321 are also different from each other by 1/4 period (TD).

第一处理电压311′的第一非转折曲线区段511及第二处理电压321的第二非转折曲线区段521的波形为非反转部,因此斜率趋近定值,第一处理电压311′的第一转折曲线区段512及第二处理电压321的第二转折曲线区段522的波形为反转部,因此斜率会因正负斜率交换而无法趋近定值。第一非转折曲线区段511包含第一上升线段513及第一下降线段514,第二非转折曲线区段521包含第二上升线段523及第二下降线段524,第一转折曲线区段512包含第一山峰区域515及第一低谷区域516,第二转折曲线区段522包含第二山峰区域525及第二低谷区域526。The waveforms of the first non-turning curve section 511 of the first processing voltage 311 ′ and the second non-turning curve section 521 of the second processing voltage 321 are non-inversion parts, so the slopes approach a constant value, and the first processing voltage 311 The waveforms of the first turning curve section 512 of ' and the second turning curve section 522 of the second processing voltage 321 are inversion parts, so the slopes cannot approach a constant value due to the exchange of positive and negative slopes. The first non-inflection curve segment 511 includes a first ascending line segment 513 and a first descending line segment 514, the second non-inflection curve segment 521 includes a second ascending line segment 523 and a second descending line segment 524, and the first inflection curve segment 512 includes The first peak area 515 and the first trough area 516 , and the second inflection curve section 522 includes the second peak area 525 and the second trough area 526 .

接着,利用感应电压解析位置单元42扣除第一处理电压311′的第一山峰区域515与第一低谷区域516,只提取第一上升线段513与第一下降线段514,同样地,感应电压解析位置单元42扣除第二处理电压321的第二山峰区域525与第二低谷区域526,只提取第二上升线段523与第二下降线段524(如图6B的粗线段所示),以令第一处理电压311和第二处理电压321的所有上升线段与下降线段形成如图6C所示的正反交错三角波的分析区段,并将该分析区段的处理电压的周期(TL)对应于X座标上的长度,以第一图形31′或第二图形32的周期(TD)对应于X座标上的距离单位表示,以令该分析区段的处理电压随该距离单位的变化即为激磁元件10在感应尺20上的移动距离,以完成如图6C所示的位置感知波形图,进而从该分析区段的中解析出该激磁元件10位于该感应尺20上的位置。Next, the induced voltage analysis position unit 42 is used to deduct the first peak area 515 and the first valley area 516 of the first processing voltage 311 ′, and only the first rising line segment 513 and the first falling line segment 514 are extracted. Similarly, the induced voltage analysis position The unit 42 deducts the second peak region 525 and the second valley region 526 of the second processing voltage 321, and only extracts the second rising line segment 523 and the second falling line segment 524 (as shown by the thick line in FIG. 6B ), so that the first processing All the rising line segments and falling line segments of the voltage 311 and the second processing voltage 321 form an analysis section of the triangular wave shown in FIG. 6C , and the period (T L ) of the processing voltage in the analysis section corresponds to the X block The marked length is represented by the period (T D ) of the first pattern 31 ′ or the second pattern 32 corresponding to the distance unit on the X coordinate, so that the change of the processing voltage of the analysis section with the distance unit is The moving distance of the exciting element 10 on the sensing ruler 20 is used to complete the position sensing waveform as shown in FIG.

需理解的是,由于第一图形31′对应第一处理电压311′而第二图形32对应第二处理电压321,因此,图6C所示的处理电压的周期(TL)对应于X座标的长度以第一图形31′或第二图形32的周期(TD)对应于X座标上的距离单位表示。It should be understood that, since the first pattern 31 ′ corresponds to the first processing voltage 311 ′ and the second pattern 32 corresponds to the second processing voltage 321 , the period (T L ) of the processing voltage shown in FIG. 6C corresponds to the X coordinate The length is expressed in units of distance corresponding to the period (T D ) of the first pattern 31 ′ or the second pattern 32 corresponding to the X coordinate.

因感应电压解析位置单元42只提取斜率趋近定值的非转折曲线区段511及521,因此,该第二实施例的图案30′相较于该第一实施例的图案30更能有效提高激磁元件10的位置感知的准确度,其中,在该第二实施例中,回到图6A,当第一图形31′及第二图形32的周期(TD)对应于X座标上的距离为8mm、线距(A)为4mm及线宽为1mm,且第一图形31′及第二图形32两者错位2mm(

Figure BDA0001921095640000091
TD或
Figure BDA0001921095640000092
)时,从第一处理电压311′与第二处理电压321的非转折曲线区段的分析区段中,可取得激磁元件10的位置感知的最佳往覆精度误差范围及定位精度,其最佳往覆精度误差范围为±0.003mm及最佳定位精度为0.01mm。Since the induced voltage analysis position unit 42 only extracts the non-turning curve segments 511 and 521 whose slopes approach a constant value, the pattern 30 ′ of the second embodiment can effectively improve the performance compared with the pattern 30 of the first embodiment. The accuracy of the position perception of the excitation element 10, wherein, in this second embodiment, returning to FIG. 6A, when the period (T D ) of the first pattern 31 ′ and the second pattern 32 corresponds to the distance on the X coordinate is 8mm, the line spacing (A) is 4mm and the line width is 1mm, and the first pattern 31' and the second pattern 32 are both misaligned by 2mm (
Figure BDA0001921095640000091
TD or
Figure BDA0001921095640000092
), from the analysis section of the non-turning curve section of the first processing voltage 311 ′ and the second processing voltage 321 , the best reciprocating accuracy error range and positioning accuracy of the position sensing of the exciting element 10 can be obtained. The best reciprocating accuracy error range is ±0.003mm and the best positioning accuracy is 0.01mm.

在该第二实施例中图6C所示,感应电压解析位置单元42还包括提供位置换算演算法直接换出激磁元件10在感应尺20上的位置(X),其中,X=S×1/2(TL)+X0=S×1/2(TL)+(Vt-V0)/m,其中,X为激磁元件10在感应尺20上的位置,S为分析区段的周期数(0、0.5、1、1.5,...),TL为分析区段的周期的距离,X0为第S周期处理电压至X的距离,Vt为处理电压值,V0为第S周期线性起始电压值,m为(X,Vt)的斜率值,其位置换算演算法众多,不以上述为限。计算经过几个周期TL,可得知S×1/2(TL),由三角波的上升区段与下降区段已知斜率值m,第S周期线性起始电压值V0为已知,量测到处理电压值Vt后,可运算出第S周期感应电压至X的距离X0,借此可求出激磁元件10在感应尺20上的位置X。In the second embodiment, as shown in FIG. 6C , the induced voltage analysis position unit 42 further includes providing a position conversion algorithm to directly exchange the position (X) of the excitation element 10 on the induction ruler 20 , where X=S×1/ 2(T L )+X 0 =S×1/2( TL )+(V t -V 0 )/m, where X is the position of the excitation element 10 on the induction ruler 20 , and S is the position of the analysis section. The number of cycles (0, 0.5, 1, 1.5, ...), TL is the distance of the cycle of the analysis section, X 0 is the distance from the S-th cycle processing voltage to X, V t is the processing voltage value, and V 0 is The linear starting voltage value of the S-th cycle, m is the slope value of (X, V t ), and there are many position conversion algorithms, which are not limited to the above. After several cycles TL are calculated, S×1/2( TL ) can be obtained. The slope value m is known from the rising and falling sections of the triangular wave, and the linear starting voltage value V 0 of the S-th cycle is known. , after measuring the processing voltage value V t , the distance X 0 from the induced voltage in the S-th cycle to X can be calculated, thereby the position X of the excitation element 10 on the induction ruler 20 can be obtained.

图7其为本公开的磁性位置感知方法的第一实施例(也即图5A单面图案尺)的流程示意图。如图所示,包括下列步骤:在步骤S71中,于一感应尺20上形成图案30;在步骤S72中,令一激磁元件10产生一交变磁场;在步骤S73中,利用感应尺20的图案30随该交变磁场变化产生感应电压;以及在步骤S74中,利用一位置解析元件40提取该感应电压,并依据该感应电压解析出该激磁元件10位于该感应尺20上的位置。FIG. 7 is a schematic flowchart of the first embodiment of the magnetic position sensing method of the present disclosure (ie, the single-sided pattern ruler in FIG. 5A ). As shown in the figure, it includes the following steps: in step S71, forming a pattern 30 on an induction ruler 20; in step S72, making an excitation element 10 generate an alternating magnetic field; in step S73, using the The pattern 30 generates an induced voltage with the change of the alternating magnetic field; and in step S74 , a position analysis element 40 is used to extract the induced voltage, and the position of the excitation element 10 on the induction ruler 20 is analyzed according to the induced voltage.

该步骤S72令一交流电源供应单元103施加交流电源至该激磁元件10产生该交变磁场。In step S72, an AC power supply unit 103 applies AC power to the excitation element 10 to generate the alternating magnetic field.

图8其为该步骤S74的步骤流程图。如图所示,包括下列步骤:在步骤S81中,令一感应电压信号处理单元41向该感应尺20读取该图案30依该交变磁场变化产生的该感应电压VS,并对该感应电压VS进行滤波及检波的信号处理,以得到处理电压VP;以及在步骤S82中,令一感应电压解析位置单元42读取该处理电压VP,依据该处理电压的周期对应于X座标上的长度等于感应尺20上的图案30的周期对应于X座标上的距离的关系,以从该处理电压中解析出该激磁元件10位于该感应尺20上的位置。FIG. 8 is a flow chart of the steps of this step S74. As shown in the figure, the following steps are included: in step S81, an induced voltage signal processing unit 41 is made to read the induced voltage Vs generated by the pattern 30 according to the change of the alternating magnetic field from the sensor ruler 20, and the induced voltage Vs The voltage VS is subjected to signal processing of filtering and detection to obtain the processing voltage VP ; and in step S82, an induced voltage analysis position unit 42 is made to read the processing voltage VP , which corresponds to the X block according to the period of the processing voltage The length on the scale is equal to the relationship between the period of the pattern 30 on the induction ruler 20 and the distance on the X coordinate, so as to resolve the position of the excitation element 10 on the induction ruler 20 from the processing voltage.

在本实施例中,该步骤S81包括:利用低通滤波器(也即图4的滤波器411)对该感应电压进行滤波,以将该感应电压VS中的该交流电源的载波频率过滤掉;利用包络检波器(也即图4的包络检波器412)将过滤掉该载波频率的感应电压VS进行检波,以得到该处理电压VPIn this embodiment, the step S81 includes: filtering the induced voltage with a low-pass filter (ie, the filter 411 in FIG. 4 ), so as to filter out the carrier frequency of the AC power source in the induced voltage VS ; Use an envelope detector (that is, the envelope detector 412 in FIG. 4 ) to detect the induced voltage VS filtered out of the carrier frequency to obtain the processing voltage VP .

在第一实施例中,该步骤S71于该感应尺20的正面21或与正面21相对的反面22的其中一面上形成方波图形31的图案30;使该步骤S81中的感应电压信号处理单元41向该感应尺20读取方波图形31依该交变磁场变化产生的该感应电压,并对该感应电压VS进行滤波及检波的信号处理,以取得呈类三角波的该处理电压311;以及使该步骤S82中的感应电压解析位置单元42读取该呈类三角波的处理电压311,及令该呈类三角波的处理电压311的所有区段为分析区段,并依据该处理电压的周期对应于X座标上的长度等于感应尺20上的方波图形31的周期对应于X座标上的距离的关系,将该分析区段的处理电压的周期(TL)对应于X座标上长度以方波图形31的周期(TD)对应于X座标上的距离单位表示,以完成如图5B所示的位置感知波形图,并令该分析区段的处理电压随该距离单位的变化即为激磁元件10在感应尺20上的移动距离,进而从该分析区段中解析出激磁元件10位于感应尺20上的位置。In the first embodiment, in step S71, the pattern 30 of the square wave pattern 31 is formed on the front side 21 of the sensor ruler 20 or one of the sides of the back side 22 opposite to the front side 21; the induced voltage signal processing unit in step S81 is made 41 Read the induced voltage generated by the square wave pattern 31 according to the change of the alternating magnetic field from the induction ruler 20, and perform signal processing of filtering and detection on the induced voltage V S to obtain the processing voltage 311 in the form of a triangular wave; And make the induced voltage analysis position unit 42 in the step S82 read the processing voltage 311 in the form of a triangular wave, and make all sections of the processing voltage 311 in the triangular wave form an analysis section, and according to the period of the processing voltage Corresponding to the relationship that the length on the X-coordinate is equal to the period of the square wave pattern 31 on the induction ruler 20 and the distance on the X-coordinate, the period (T L ) of the processing voltage of the analysis section corresponds to the X-coordinate The upper length is represented by the period (T D ) of the square wave pattern 31 corresponding to the distance unit on the X-coordinate, so as to complete the position sensing waveform shown in FIG. 5B , and make the processing voltage of the analysis section vary with the distance unit. The change of is the moving distance of the excitation element 10 on the induction ruler 20 , and then the position of the excitation element 10 on the induction ruler 20 is analyzed from the analysis section.

本公开复提供磁性位置感知方法的第二实施例(也即图6A双面图案尺),本实施例与前述的第一实施例的差异在于图案30′,故以下将说明不同处,而不再赘述相同处。该步骤S71于该感应尺20的正面21及反面22上各形成具有同一水平线上的图案,各该图案为方波图形的第一图形31′及第二图形32且彼此相差1/2线距或1/4周期(如图6A所示);使该步骤S81中的该感应电压信号处理单元41对各该图案随该交变磁场变化产生的该感应电压进行该信号处理,以取得位于同一水平线且彼此相差1/4周期的两个呈类三角波的该处理电压(即第一处理电压311′及第二处理电压321);以及使该步骤S82中的感应电压解析位置单元42读取该两个呈类三角波的处理电压(即第一处理电压311′及第二处理电压321),并提取该两个呈类三角波的处理电压(即第一处理电压311′及第二处理电压321)的非转折曲线区段(即第一非转折曲线区段511及第二非转折曲线区段521),以得到正反交错三角波的分析区段(如图6C所示),并依据该处理电压的周期对应于X座标上的长度等于感应尺20上的第一图形31′或第二图形32的周期对应于X座标上的距离的关系,将该分析区段的处理电压的周期(TL)对应于X座标上长度以第一图形31′或第二图形32的周期(TD)对应于X座标上的距离单位表示,以完成如图6C所示的位置感知波形图,并令该分析区段的处理电压随该距离单位的变化即为激磁元件10在感应尺20上的移动距离,进而从该分析区段中解析出激磁元件10位于感应尺20上的位置。The present disclosure further provides a second embodiment of the magnetic position sensing method (that is, the double-sided pattern ruler in FIG. 6A ). The difference between this embodiment and the aforementioned first embodiment lies in the pattern 30 ′, so the following will describe the difference without Repeat the same. In step S71, patterns with the same horizontal line are formed on the front side 21 and the back side 22 of the sensor ruler 20, respectively, and the patterns are the first pattern 31' and the second pattern 32 of the square wave pattern and differ from each other by 1/2 line spacing or 1/4 cycle (as shown in FIG. 6A ); make the induced voltage signal processing unit 41 in step S81 perform the signal processing on the induced voltages generated by the changes of the patterns with the alternating magnetic field, so as to obtain signals at the same The two processing voltages (ie, the first processing voltage 311 ′ and the second processing voltage 321 ) which are horizontal lines and differ from each other by 1/4 cycle in the form of a triangular wave; and cause the induced voltage analysis position unit 42 in the step S82 to read the Two triangular-like processing voltages (ie, the first processing voltage 311 ′ and the second processing voltage 321 ) are extracted, and the two processing voltages that are similar to the triangular wave (ie, the first processing voltage 311 ′ and the second processing voltage 321 ) are extracted The non-turnover curve section (ie, the first non-turnover curve section 511 and the second non-turnover curve section 521 ), to obtain the analysis section of the forward and reverse staggered triangular wave (as shown in FIG. 6C ), and according to the processing voltage The period corresponding to the length on the X coordinate is equal to the relationship between the period of the first pattern 31' or the second pattern 32 on the induction ruler 20 corresponding to the distance on the X coordinate, the period of the processing voltage of the analysis section ( T L ) corresponds to the length on the X-coordinate and is represented by the cycle (TD) of the first pattern 31 ′ or the second pattern 32 corresponding to the distance unit on the X-coordinate, so as to complete the position-aware waveform diagram as shown in FIG. 6C , The change of the processing voltage of the analysis section with the distance unit is the moving distance of the excitation element 10 on the induction ruler 20 , and the position of the excitation element 10 on the induction ruler 20 is analyzed from the analysis section.

在该方法的第一实施例(也即图5A单面图案尺)时,该步骤S82还包括提供一位置换算演算法从该位置感知波形图上直接换出激磁元件10在感应尺20上的位置(X),其中,X=S×TL+X0=S×TL+(Vt-V0)/m,其中,X为激磁元件10在感应尺20上的位置,S为分析区段的周期数(0、0.5、1、1.5、...),TL为分析区段的周期的距离,X0为第S周期处理电压的位置,Vt为处理电压值,V0为第S周期线性起始电压值,m为Vt的斜率值,其位置换算演算法众多,不以上述为限。In the first embodiment of the method (that is, the single-sided pattern ruler in FIG. 5A ), the step S82 further includes providing a position conversion algorithm to directly exchange the position of the excitation element 10 on the sensing ruler 20 from the position sensing waveform diagram. Position (X), where X=S×T L +X 0 =S× TL +(V t -V 0 )/m, where X is the position of the excitation element 10 on the induction ruler 20 , and S is the analysis The cycle number of the segment (0, 0.5, 1, 1.5, ...), TL is the distance of the cycle of the analysis segment, X 0 is the position of the processing voltage in the S-th cycle, V t is the processing voltage value, and V 0 is the linear starting voltage value of the S-th cycle, m is the slope value of V t , and there are many position conversion algorithms, which are not limited to the above.

在该方法的第二实施例(也即图6A双面图案尺)时,该步骤S82还包括提供一位置换算演算法从该位置感知波形图上直接换出激磁元件10在感应尺20上的位置(X),其中,X=S×1/2(TL)+X0=S×1/2(TL)+(Vt-V0)/m,其中,X为激磁元件10在感应尺20上的位置,S为分析区段的周期数(0、0.5、1、1.5、...),TL为分析区段的周期的距离,X0为第S周期处理电压的位置,Vt为处理电压值,V0为第S周期线性起始电压值,m为Vt的斜率值,其位置换算演算法众多,不以上述为限。In the second embodiment of the method (that is, the double-sided pattern ruler in FIG. 6A ), the step S82 further includes providing a position conversion algorithm to directly replace the excitation element 10 on the sensing ruler 20 from the position sensing waveform diagram. Position (X), where X=S×1/2(T L )+X 0 =S×1/2( TL )+(V t −V 0 )/m, where X is the excitation element 10 at The position on the sensing ruler 20, S is the cycle number of the analysis section (0, 0.5, 1, 1.5, ...), TL is the distance of the cycle of the analysis section, X 0 is the position of the processing voltage in the S-th cycle , V t is the processing voltage value, V 0 is the linear starting voltage value of the S-th cycle, m is the slope value of Vt, and there are many position conversion algorithms, which are not limited to the above.

本公开由上述可得知,本公开利用感应尺的图案随激磁元件的交变磁场位置变化产生感应电压,进而以电压值解析位置的技术手段,提高位置检出精度与稳定度,以及金属线图案转印工艺易于长尺寸化(Scale up)等优点,以解决现有技术采用磁极图案感知以及电压相位差解析所遭遇的充磁耗时、安装精度不易控制以及生产长度受限的问题。It can be known from the above that the present disclosure uses the pattern of the induction ruler to generate an induced voltage with the position change of the alternating magnetic field of the excitation element, and then uses the technical means of analyzing the position of the voltage value to improve the accuracy and stability of position detection, and the metal wire The pattern transfer process has the advantages of being easy to scale up, so as to solve the problems of time-consuming magnetization, difficult control of installation accuracy and limited production length encountered in the prior art using magnetic pole pattern sensing and voltage phase difference analysis.

Claims (14)

1. A magnetic position sensing device, comprising:
an excitation element for generating an alternating magnetic field;
an induction ruler, which is formed with a pattern and the pattern generates an induction voltage according to the change of the alternating magnetic field; and
and the position analyzing element extracts the induction voltage so as to analyze the position of the excitation element on the induction scale according to the induction voltage.
2. A magnetic position sensing device according to claim 1, wherein the pattern of the sensing ruler is formed of metal wires.
3. The magnetic position sensing device of claim 1, further comprising:
an AC power supply unit for applying AC power to the exciting element to generate the alternating magnetic field.
4. A magnetic position sensing device according to claim 3, wherein the position resolving element further comprises:
an induced voltage signal processing unit which reads the induced voltage and sequentially performs signal processing of filtering and detecting on the induced voltage to obtain a processed voltage, wherein the carrier frequency of the alternating current power supply contained in the induced voltage is filtered by the filtering; and
the induced voltage analyzing position unit analyzes the position of the exciting element on the induction scale according to the relation that the length of the period of the processing voltage on the X coordinate is equal to the distance of the period of the pattern on the induction scale on the X coordinate.
5. The magnetic position sensor according to claim 4, wherein the pattern on the sensing scale is a square wave pattern and is located on the front or back of the sensing scale, so that the induced voltage signal processing unit processes the induced voltage generated by the pattern changing with the alternating magnetic field to obtain the processing voltage in a triangle-like wave, and the induced voltage analyzing location unit extracts all sections of the processing voltage in a triangle-like wave to obtain an analyzing section, and analyzes the position of the excitation element on the sensing scale from the analyzing section according to the relationship that the period of the processing voltage corresponds to the distance on the X-coordinate, the length of the processing voltage on the X-coordinate is equal to the period of the pattern on the sensing scale on the X-coordinate.
6. The magnetic position sensor according to claim 4, wherein the front and back surfaces of the sensing ruler have patterns on the same horizontal line, each of the patterns is a square wave pattern and differs from each other by 1/2 line distance or 1/4 period, so that the induced voltage signal processing unit performs signal processing on the induced voltage generated by each of the patterns according to the variation of the alternating magnetic field, so as to obtain two triangular-like processing voltages on the same horizontal line and differing from each other by 1/4 period, and the induced voltage analyzing unit extracts non-inflected curve sections of the two triangular-like processing voltages to obtain forward and backward staggered triangular analysis sections, and based on the relationship that the length of the processed voltage on the X coordinate is equal to the distance of the pattern on the sensing ruler on the X coordinate, and analyzing the position of the excitation element on the induction scale from the analysis section.
7. The magnetic position sensing device according to claim 4, wherein the induced voltage signal processing unit obtains the processed voltage without the carrier frequency after performing signal processing of filtering and detecting the induced voltage with amplitude variation, and the voltage variation of the processed voltage corresponds to the variation of the moving distance of the laser element on the sensing scale.
8. A magnetic position sensing device according to claim 1, wherein the excitation element further comprises a first magnetic pole portion, a second magnetic pole portion, and an opening between the first magnetic pole portion and the second magnetic pole portion, such that the excitation element moves the pattern on the sensing ruler through the first magnetic pole portion and the second magnetic pole portion into the opening.
9. A method of magnetic position sensing, comprising:
forming a pattern on an induction ruler;
making an excitation element generate an alternating magnetic field;
generating an induction voltage according to the change of the alternating magnetic field by using the pattern of the induction ruler; and
a position analyzing element is used for extracting the induction voltage, and the position of the exciting element on the induction ruler is analyzed according to the induction voltage.
10. The method of claim 9, wherein the alternating magnetic field is generated by an ac power supply unit applying ac power to the excitation element.
11. The method of claim 10, wherein the step of the position analyzing element analyzing the position of the exciting element on the sensing scale comprises:
an induced voltage signal processing unit reads the induced voltage generated by the pattern according to the change of the alternating magnetic field from the induction ruler, and then sequentially carries out signal processing of filtering and detecting on the induced voltage to obtain a processed voltage, wherein the carrier frequency of the alternating current power supply contained in the induced voltage is filtered by the filtering; and
and analyzing the position of the exciting element on the induction scale from the processing voltage by an induction voltage analyzing position unit according to the relation that the length of the period of the processing voltage on the X coordinate is equal to the distance of the period of the pattern on the induction scale on the X coordinate.
12. The method as claimed in claim 11, wherein a square-wave pattern is formed on the front or back surface of the induction ruler, the induced voltage signal processing unit processes the induced voltage generated by the pattern according to the variation of the alternating magnetic field to obtain the processing voltage in a triangular wave form, the induced voltage analyzing position unit extracts all sections of the processing voltage in a triangular wave form to obtain an analyzing section, and the position of the exciting element on the induction ruler is analyzed from the analyzing section according to the relationship that the period of the processing voltage corresponds to the distance on the X coordinate corresponding to the length on the X coordinate and the period of the pattern on the induction ruler.
13. The magnetic position sensing method of claim 11, wherein the front and the back of the sensing ruler are respectively formed with patterns on the same horizontal line, each of the patterns is a square wave pattern and has a difference of 1/2 line distance or 1/4 period, so that the induced voltage signal processing unit processes the induced voltage generated by each of the patterns along with the change of the alternating magnetic field to obtain two triangular-like processing voltages on the same horizontal line and having a difference of 1/4 period, and the induced voltage analyzing unit extracts the non-turning curve sections of the two triangular-like processing voltages to obtain the analysis sections of the front and back staggered triangular waves, and according to the relationship that the period of the processing voltage corresponds to the distance on the X coordinate equal to the period of the pattern on the sensing ruler, and analyzing the position of the excitation element on the induction scale from the analysis section.
14. The magnetic position sensing method of claim 11, wherein the induced voltage signal processing unit performs signal processing of filtering and detecting the induced voltage having a variation in amplitude to obtain the processed voltage without the carrier frequency, and a variation in voltage of the processed voltage corresponds to a variation in a moving distance of the laser element on the induction scale.
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Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3509469A (en) * 1967-05-17 1970-04-28 Nasa Position sensing device employing misaligned magnetic field generating and detecting apparatus
US4262526A (en) * 1978-07-21 1981-04-21 Nippondenso Co., Ltd. Rotational position detecting apparatus
US4853604A (en) * 1984-10-19 1989-08-01 Kollmorgen Technologies Corporation Position and speed sensors
US5444370A (en) * 1993-03-18 1995-08-22 Honeywell Inc. Magnetic angular position sensor with two magnetically sensitive components arranged proximate two target tracks having complimentary magnetic and nonmagnetic segments
JPH0843126A (en) * 1994-03-25 1996-02-16 Dr Johannes Heidenhain Gmbh Magnetism measuring system
CN1194365A (en) * 1997-01-29 1998-09-30 株式会社三丰 Inductive current absolute position sensor by using code rail type staff and read out head
JPH10274503A (en) * 1997-03-25 1998-10-13 Samsung Heavy Ind Co Ltd Absolute position detecting method for stroke sensing cylinder
CN1272620A (en) * 1998-12-17 2000-11-08 株式会社三丰 Offset-reduced high-accuracy induced current absolute position energy converter
CN1582385A (en) * 2001-10-30 2005-02-16 金特克投资集团股份公司 Induction sensing apparatus and method
CN1590954A (en) * 2003-08-29 2005-03-09 株式会社电装 Angular position determining apparatus with malfunction detector
US6922051B2 (en) * 1999-02-05 2005-07-26 Horst Siedle Gmbh & Co. Kg Displacement and/or angle sensor with a meander-shaped measuring winding
CN1695037A (en) * 2002-11-08 2005-11-09 北京航天峰光电子技术有限责任公司 Magnetic Displacement Measuring Device
CN1906466A (en) * 2004-02-02 2007-01-31 日本电产三协株式会社 Magnetic sensor and its manufacturing method
CN101021422A (en) * 2006-02-14 2007-08-22 发那科株式会社 Linear drive apparatus
DE102006061577A1 (en) * 2006-12-27 2008-07-03 Robert Bosch Gmbh Crankshaft shaft rotation angle determining method for e.g. otto engine, involves utilizing output signals of sensor units for determining angle of rotation of crankshaft additional to output signal of differential sensor
CN101416020A (en) * 2006-03-02 2009-04-22 移动磁体技术公司 Position sensor with variable direction of magnetization and method of production
CN106461420A (en) * 2014-06-18 2017-02-22 卡特彼勒环球矿业欧洲有限公司 Sensing device for a digital linear position sensor
CN107796293A (en) * 2017-10-26 2018-03-13 重庆理工大学 A kind of induction linear displacement transducer

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200806956A (en) * 2006-07-26 2008-02-01 Hiwin Mikrosystem Corp Calibration device in magnetic sensor for inducting magnetic scale
TWM312654U (en) * 2006-12-01 2007-05-21 Hiwin Mikrosystem Corp Induction magnetic head capable of anti-magnetic interference

Patent Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3509469A (en) * 1967-05-17 1970-04-28 Nasa Position sensing device employing misaligned magnetic field generating and detecting apparatus
US4262526A (en) * 1978-07-21 1981-04-21 Nippondenso Co., Ltd. Rotational position detecting apparatus
US4853604A (en) * 1984-10-19 1989-08-01 Kollmorgen Technologies Corporation Position and speed sensors
US5444370A (en) * 1993-03-18 1995-08-22 Honeywell Inc. Magnetic angular position sensor with two magnetically sensitive components arranged proximate two target tracks having complimentary magnetic and nonmagnetic segments
JPH0843126A (en) * 1994-03-25 1996-02-16 Dr Johannes Heidenhain Gmbh Magnetism measuring system
CN1194365A (en) * 1997-01-29 1998-09-30 株式会社三丰 Inductive current absolute position sensor by using code rail type staff and read out head
JPH10274503A (en) * 1997-03-25 1998-10-13 Samsung Heavy Ind Co Ltd Absolute position detecting method for stroke sensing cylinder
CN1272620A (en) * 1998-12-17 2000-11-08 株式会社三丰 Offset-reduced high-accuracy induced current absolute position energy converter
US6922051B2 (en) * 1999-02-05 2005-07-26 Horst Siedle Gmbh & Co. Kg Displacement and/or angle sensor with a meander-shaped measuring winding
CN1582385A (en) * 2001-10-30 2005-02-16 金特克投资集团股份公司 Induction sensing apparatus and method
CN1695037A (en) * 2002-11-08 2005-11-09 北京航天峰光电子技术有限责任公司 Magnetic Displacement Measuring Device
CN1590954A (en) * 2003-08-29 2005-03-09 株式会社电装 Angular position determining apparatus with malfunction detector
CN1906466A (en) * 2004-02-02 2007-01-31 日本电产三协株式会社 Magnetic sensor and its manufacturing method
CN101021422A (en) * 2006-02-14 2007-08-22 发那科株式会社 Linear drive apparatus
CN101416020A (en) * 2006-03-02 2009-04-22 移动磁体技术公司 Position sensor with variable direction of magnetization and method of production
DE102006061577A1 (en) * 2006-12-27 2008-07-03 Robert Bosch Gmbh Crankshaft shaft rotation angle determining method for e.g. otto engine, involves utilizing output signals of sensor units for determining angle of rotation of crankshaft additional to output signal of differential sensor
CN106461420A (en) * 2014-06-18 2017-02-22 卡特彼勒环球矿业欧洲有限公司 Sensing device for a digital linear position sensor
CN107796293A (en) * 2017-10-26 2018-03-13 重庆理工大学 A kind of induction linear displacement transducer

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
LIU HONGCHI等: "Position Sensing and Signal Transmission of Linear Synchronous Motor for High Speed Maglev", 《THE 21ST INTERNATIONAL CONFERENCE ON MAGNETICALLY LEVITATED SYSTEMS AND LINEAR DRIVES》 *

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