CN111257352B - 一种利用单一纳米微粒的化学成分数据预测隐伏矿床的方法 - Google Patents
一种利用单一纳米微粒的化学成分数据预测隐伏矿床的方法 Download PDFInfo
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- CN111257352B CN111257352B CN202010100162.8A CN202010100162A CN111257352B CN 111257352 B CN111257352 B CN 111257352B CN 202010100162 A CN202010100162 A CN 202010100162A CN 111257352 B CN111257352 B CN 111257352B
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- G01N23/2206—Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
- G01N23/2255—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident ion beams, e.g. proton beams
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CN202010100162.8A CN111257352B (zh) | 2020-02-18 | 2020-02-18 | 一种利用单一纳米微粒的化学成分数据预测隐伏矿床的方法 |
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CN202010100162.8A CN111257352B (zh) | 2020-02-18 | 2020-02-18 | 一种利用单一纳米微粒的化学成分数据预测隐伏矿床的方法 |
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CN111257352A CN111257352A (zh) | 2020-06-09 |
CN111257352B true CN111257352B (zh) | 2022-02-22 |
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CN117191827B (zh) * | 2023-11-01 | 2024-01-30 | 核工业北京地质研究院 | 在待勘查区圈定砂岩型铀矿成矿有利地段的方法 |
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FI120560B (fi) * | 2005-12-21 | 2009-11-30 | Outotec Oyj | Menetelmä alkuaineen ja/tai mineraalin pitoisuuden määrittämiseksi |
CN101819169B (zh) * | 2010-04-16 | 2012-06-27 | 中山大学 | 一种地气微粒找矿方法 |
CN103135144B (zh) * | 2013-01-04 | 2015-07-22 | 中山大学 | 一种利用含碳微粒寻找隐伏矿床的方法 |
CN104458774B (zh) * | 2014-12-12 | 2017-05-17 | 中山大学 | 一种利用生物内部纳米微粒寻找隐伏矿床的方法 |
CN108956227A (zh) * | 2018-07-03 | 2018-12-07 | 中山大学 | 一种用于透射电镜分析的液体纳米微粒样品的制备方法 |
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Application publication date: 20200609 Assignee: GUANGZHOU GUOCHUANG TECHNOLOGY Co.,Ltd. Assignor: SUN YAT-SEN University Contract record no.: X2024980027919 Denomination of invention: A method for predicting hidden mineral deposits using chemical composition data of a single nanoparticle Granted publication date: 20220222 License type: Open License Record date: 20241127 |
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Application publication date: 20200609 Assignee: Guangxi Yilian Commercial Management Co.,Ltd. Assignor: SUN YAT-SEN University Contract record no.: X2024980039885 Denomination of invention: A method for predicting hidden mineral deposits using chemical composition data of a single nanoparticle Granted publication date: 20220222 License type: Open License Record date: 20241219 |