CN111157925B - Method and device for measuring large-range B-H loop of soft magnetic material - Google Patents
Method and device for measuring large-range B-H loop of soft magnetic material Download PDFInfo
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Abstract
The invention discloses a method and a device for measuring a large-range B-H loop of a soft magnetic material. The method carries out measurement by arranging two parallel current channels, when the output voltage value of the power supply is smaller, only the current channel where the second sampling resistor is positioned is put into the circuit to form a small current range, when the output voltage value of the power supply is increased and exceeds the conducting voltage of the semiconductor voltage-controlled device, the second current channel is put into the circuit, thereby forming a large current range, compared with the existing mode of switching the current range by using a mechanical switch or an electronic switch, the current path can not be in a state of being temporarily opened and returned to zero, the transient of a magnetic field does not exist any more, the magnetization process of the sample excitation coil is continuously carried out, the continuous and stable adjustment of the current in the ultra-wide range and the accurate measurement of the current magnitude are ensured, and the obtained B-H loop is also continuous.
Description
Technical Field
The invention relates to the technical field of B-H loop measurement of soft magnetic materials, in particular to a method for carrying out large-range B-H loop measurement on a soft magnetic material, and further relates to a device for carrying out large-range B-H loop measurement on the soft magnetic material.
Background
In order to further improve the competitiveness of companies, manufacturers of soft magnetic materials need to perform comprehensive analysis on products of the soft magnetic materials, and quantitatively analyze magnetic performance parameters of the soft magnetic materials when performing quality control, and the measurement and drawing of B-H loops are generally effective and quick ways for achieving the purpose. In practical applications, we usually use a fast scanning method to obtain a B-H loop of the sample to be tested. In the measurement process, B is usually obtained by directly integrating the induced voltage on the secondary side, and H is converted by directly converting the current on the primary side. Due to the particularity of the measurement of the B-H loop, high accuracy of the magnetic field at three points of peak value, zero and near coercive force needs to be ensured simultaneously
H＝NI/L (1)，
Wherein, H represents the size of the magnetization field, the unit is A/m, N represents the number of turns of the primary winding, I represents the size of the magnetization power supply, and L represents the equivalent magnetic path length of the tested sample.
As can be seen from equation (1), it is equivalent to accurately measuring the current values corresponding to the three magnetic field points. While during measurement by a scanning method, the corresponding dynamic range of the current is very wide and can reach the range of 1 muA-25A, the traditional design is as shown in FIG. 1, a mechanical switch or an electronic switch is usually adopted to switch the measuring range to realize accurate measurement of the current (magnetic field intensity H), and the measuring range needs to be switched in the current scanning process to ensure the accuracy of current sampling. However, because the measuring range of the current is switched in the measuring process, firstly, the current path can have a state of short open circuit and return to zero, so that the magnetization process of the sample is discontinuous, and the final test result, such as accuracy and even repeatability, can be influenced to a certain extent; secondly, the inconsistency of the current switching points also causes the discontinuity of the B-H loop, as shown in fig. 2.
Disclosure of Invention
The invention provides a method and a device for measuring a large-range B-H loop of a soft magnetic material, which are used for solving the technical problems of poor accuracy and repeatability of a test result and discontinuity of an obtained B-H loop caused by switching a measuring range by adopting a mechanical switch or an electronic switch in the conventional measuring mode.
According to one aspect of the present invention, there is provided a method for wide range B-H loop measurements on soft magnetic materials, comprising the steps of:
step S1: connecting two current channels in parallel and then connecting the two current channels in series with a sample excitation coil and a power supply, wherein one current channel comprises a semiconductor voltage-controlled device and a first sampling resistor which are sequentially connected, the other current channel comprises a switch and a second sampling resistor which are sequentially connected, and the sample excitation coil is wound on a soft magnetic material to be detected;
step S2: and closing the switch and obtaining a B-H loop of the excitation coil of the sample by adopting a fast scanning method.
Further, the resistance value of the first sampling resistor is in the milliohm level, and the resistance value of the second sampling resistor is in the ohm or kiloohm level.
Further, the power supply is a bipolar adjustable voltage source, and the step S2 specifically includes the following steps:
step S21: controlling the voltage waveform output by the bipolar adjustable voltage source according to the required magnetic field waveform, and monitoring the scanning current of the first sampling resistor and the second sampling resistor in real time;
step S22: and obtaining the magnetic induction intensity measurement result and the current scanning measurement result of the soft magnetic material to be measured, and drawing a B-H loop.
Further, in the step S21, when it is monitored that the current value of the second sampling resistor is smaller than the set current value, only the current value of the second sampling resistor is taken as the current scanning measurement value; and when the current value of the second sampling resistor is monitored to be larger than the set current value, adding the current value of the first sampling resistor as the current scanning measurement value.
Further, the semiconductor voltage-controlled device is a diode.
The invention also provides a device for measuring the large-range B-H loop of the soft magnetic material, which comprises a controller, a measuring circuit and a display screen, wherein the measuring circuit comprises a bipolar adjustable voltage source, a sample excitation coil, a switch, a first sampling resistor, a semiconductor voltage-controlled device and a second sampling resistor, the sample excitation coil is wound on the soft magnetic material to be measured, the switch is connected with the second sampling resistor in series to form a current channel, the semiconductor voltage-controlled device is connected with the first sampling resistor in series to form another current channel, the two current channels are connected with the bipolar adjustable voltage source and the excitation coil in series after being connected in parallel, the controller is respectively connected with the bipolar adjustable voltage source, the first sampling resistor and the second sampling resistor, the controller is also connected with the display screen, and the controller is used for outputting a control signal through a DA interface of the controller according to the required magnetic field waveform to control the bipolar adjustable voltage source to output a corresponding voltage waveform, and sampling the current value flowing through the first sampling resistor and the second sampling resistor, measuring the magnetic induction intensity of the soft magnetic material to be measured, and finally automatically generating a B-H loop for displaying through a display screen.
Further, the switch is an electronic switch, and the controller is also connected with the electronic switch.
Further, the controller is a single chip microcomputer.
Furthermore, the resistance value of the second sampling resistor is 1-1000 omega, and the resistance value of the first sampling resistor is 0.001-0.005 omega.
Further, the controller is further configured to monitor a magnitude of the scanning current, and when the current value of the second sampling resistor is monitored to be less than or equal to a set current value, only the current value of the second sampling resistor is used as a current scanning measurement value, and when the current value of the second sampling resistor is monitored to be greater than the set current value, the current value of the first sampling resistor is added as the current scanning measurement value.
The invention has the following beneficial effects:
the invention relates to a method for measuring a large-range B-H loop of a soft magnetic material, which is characterized in that two parallel current channels are arranged for measurement, when the output voltage value of a power supply is smaller, only the current channel where a second sampling resistor is arranged is put into a circuit to form a small current range, the scanning measurement precision is determined by a first current channel, when the output voltage value of the power supply is larger, and when the output voltage value of the power supply exceeds the conducting voltage of a semiconductor voltage-controlled device, a second current channel is put into the circuit, the scanning measurement current value is the sum of the current values of the two current channels, so that a large current range is formed, and the large current range and the small current range are always in a working state in the whole measurement process, compared with the existing mode of switching the current ranges by using a mechanical switch or an electronic switch, the current path cannot be temporarily opened and return to zero, and the transient of a magnetic field does not exist any more, the magnetizing process of the sample excitation coil is continuously carried out, so that continuous and stable current regulation in an ultra-wide range and accurate measurement of a current magnitude are ensured, and the obtained B-H loop is also continuous.
In addition, the device for measuring the B-H loop line in a large range on the soft magnetic material has the advantages.
In addition to the objects, features and advantages described above, other objects, features and advantages of the present invention are also provided. The present invention will be described in further detail below with reference to the drawings.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate embodiments of the invention and, together with the description, serve to explain the invention and not to limit the invention. In the drawings:
fig. 1 is a schematic diagram of a current measurement in a conventional measurement mode in which a mechanical switch or an electronic switch is used to switch a range.
Fig. 2 is a schematic diagram of a B-H loop obtained by a scanning method in a conventional measurement mode of switching a range by using a mechanical switch or an electronic switch.
Fig. 3 is a flow chart of a method for extensive B-H loop measurement of soft magnetic materials in accordance with a preferred embodiment of the present invention.
Fig. 4 is a schematic diagram of a measurement circuit in accordance with a preferred embodiment of the present invention.
Fig. 5 is a sub-flowchart of step S2 in fig. 3 according to the preferred embodiment of the present invention.
Fig. 6 is a schematic diagram of the B-H loop obtained by the scanning method for the method of wide-range B-H loop measurement of the soft magnetic material according to the preferred embodiment of the present invention.
Detailed Description
The embodiments of the invention will be described in detail below with reference to the accompanying drawings, but the invention can be embodied in many different forms, which are defined and covered by the following description.
For easy understanding, as shown in fig. 3, the preferred embodiment of the present invention provides a method for performing a wide range of B-H loop measurement on a soft magnetic material, which can ensure that the current changes monotonically and continuously during the measurement process, thereby ensuring the accuracy and repeatability of the measurement result, and the obtained B-H loop is also continuous. Specifically, the method for measuring the wide-range B-H loop of the soft magnetic material comprises the following steps:
step S1: connecting two current channels in parallel and then connecting the two current channels in series with a sample excitation coil and a power supply, wherein one current channel comprises a semiconductor voltage-controlled device and a first sampling resistor which are sequentially connected, the other current channel comprises a switch and a second sampling resistor which are sequentially connected, and the sample excitation coil is wound on a soft magnetic material to be detected;
step S2: and closing the switch and obtaining a B-H loop of the excitation coil of the sample by adopting a fast scanning method.
In step S1, as shown in fig. 4, two current paths are connected in parallel and then connected in series with the sample excitation coil and the power supply, where the switch is connected in series with the second sampling resistor Rs2 to form a first current path, and the switch controls the on/off of the first current path, and the semiconductor voltage-controlled device is connected in series with the first sampling resistor Rs1 to form a second current path, and the semiconductor voltage-controlled device controls the on/off of the second current path. When the voltage value output by the power supply is small, the voltage values of the two ends of the semiconductor voltage-controlled device are low, the semiconductor voltage-controlled device is not conducted, only very weak and negligible current flows through the semiconductor voltage-controlled device, at the moment, the current of the measuring circuit basically flows only from the first current channel, the current of the first current channel is obtained by scanning the current, and the measuring precision is ensured by the sampling precision of the first current channel; when the voltage value output by the power supply is gradually increased, the semiconductor voltage-controlled device is conducted when the voltage values at two ends of the semiconductor voltage-controlled device reach the conducting voltage of the semiconductor voltage-controlled device, the second current channel is put into the measuring circuit, the current flows through the first current channel and the second current channel respectively, and the scanning current is measured to be the sum of the current values of the two current channels. When only the first current channel is put into the measuring circuit, the current measurement of the first circuit channel is used as a small range, and when the second current channel is also put into the measuring circuit, the two current channels work simultaneously so as to be used as a large range. In addition, the semiconductor voltage-controlled device is a diode.
It will be appreciated that, preferably, the resistance value of the first sampling resistor is much smaller than that of the second sampling resistor, for example, the resistance value of the first sampling resistor is in the order of milli-ohms or micro-ohms, and the resistance value of the second sampling resistor is in the order of ohms, kilo-ohms or mega-ohms. Further preferably, the resistance value of the first sampling resistor is in the milliohm range, and the resistance value of the second sampling resistor is in the ohm or kiloohm range. In an embodiment of the invention, the resistance of the second sampling resistor is 1 to 1000 Ω, and the resistance of the first sampling resistor is 0.001 to 0.005 Ω. Namely, the first current channel is a small current channel, the second current channel is a large current channel, the current sampling of the small current channel is used as a small current range, and the common sampling of the small current channel and the large current channel is used as a large current range. When only the small current channel has current circulation, the measurement accuracy of the scanning current is ensured by the sampling accuracy of the small current channel, after the large current channel starts to circulate current, because the resistance value of the first sampling resistor is far smaller than that of the second sampling resistor, at the moment, most of the current flows through the large current channel, and the measurement accuracy of the scanning current is mainly ensured by the sampling accuracy of the large current channel, so that the continuous stable adjustment of the current in an ultra-wide range and the accurate measurement of the current magnitude are ensured.
It is to be understood that in the step S2, when the power source is a current source, the fast scan measurement is performed in a constant current source mode, and when the power source is a voltage source, the fast scan measurement is performed in a voltage source control mode. The present embodiment preferably employs a voltage source control mode. Because the current source can not realize the superposition of two current channels of large and small current channels, the accurate measurement of the whole range of 1 muA-25A can not be realized, and in the mode of using a voltage source and a semiconductor switch, the accurate measurement of small current can be obtained by using large-resistance-value resistance sampling when the output voltage is small, and the accurate measurement of large current can be obtained by using small-resistance-value resistance sampling when the voltage is large enough to enable the semiconductor switch to be conducted.
In this embodiment, the method for measuring a wide range of B-H loops for soft magnetic materials is to set two parallel current channels for measurement, when the output voltage value of the power supply is small, only the current channel where the second sampling resistor is located is put into the circuit to form a small current range, the accuracy of scanning measurement is determined by the first current channel, and when the output voltage value of the power supply is large, and when the output voltage value exceeds the on-state voltage of the semiconductor voltage-controlled device, the second current channel is put into the circuit, the current value of scanning measurement is the sum of the current values of the two current channels to form a large current range, during the whole measurement process, the large and small current ranges are always in working state, compared with the existing mode of switching the current ranges by using a mechanical switch or an electronic switch, the current path does not have a transient state of short circuit opening and returning to zero, and there is no longer a transient of a magnetic field, the magnetizing process of the sample excitation coil is continuously carried out, so that continuous and stable current regulation in an ultra-wide range and accurate measurement of a current magnitude are ensured, and the obtained B-H loop is also continuous.
It can be understood that, as shown in fig. 5, the step S2 specifically includes the following steps:
step S21: controlling the voltage waveform output by the bipolar adjustable voltage source according to the required magnetic field waveform, and monitoring the scanning current of the first sampling resistor and the second sampling resistor in real time;
step S22: and obtaining the magnetic induction intensity measurement result and the current scanning measurement result of the soft magnetic material to be measured, and drawing a B-H loop.
It can be understood that, in the step S21, the power supply uses a bipolar adjustable voltage source, outputs a control signal through a DA interface of the controller to control a voltage waveform output by the bipolar adjustable voltage source, samples a current value flowing through the first sampling resistor and a current value flowing through the second sampling resistor in real time by using the controller, and monitors the magnitude of the scanning current of the first sampling resistor and the magnitude of the scanning current of the second sampling resistor in real time. When the voltage value output by the bipolar adjustable voltage source is small, the current value of the second sampling resistor is monitored to be smaller than or equal to a set current value, wherein the set current value is a current value corresponding to the second sampling resistor when the semiconductor voltage-controlled device is switched on, the large current channel does not work, only the current value of the second sampling resistor is used as the current scanning measurement value, the current scanning measurement value is small, and the measurement precision is ensured by the sampling precision of the small current channel, so that the measurement precision when the scanning current value is small is ensured, and particularly the measurement accuracy is high when the current is zero. When the scanning current value of the second sampling resistor is monitored to be larger than the set current value, the voltages at two ends of the semiconductor voltage-controlled device are enough to be conducted, the current mainly flows through the large current channel, the current value of the first sampling resistor is used as the current scanning measurement value, the current value of the scanning measurement is the sum of the current values of the two current channels, and the measurement precision of the scanning current is ensured by the sampling precision of the large current channel, so that the measurement precision of the scanning current value in large current and small current is ensured, and the measurement accuracy of the current value at two points, namely the current peak value and the current value corresponding to the coercive force, is ensured to be high.
It is understood that, in the step S22, the controller draws a B-H loop based on the measurement result of the scanning current and the measurement result of the magnetic induction, and displays the B-H loop through the display screen, and the obtained B-H loop is as shown in fig. 6. The magnetic induction intensity is obtained by integrating the induced voltage on the secondary side, and this part of the content belongs to the known technology, and therefore is not described herein again.
In order to further show the advantages of the method for measuring the wide-range B-H loop of the soft magnetic material in comparison with the existing measuring method adopting the mechanical or electronic switch switching range, the inventor also carries out repeated tests on the same sample by respectively using two different methods, and the test results are shown in the following table:
the method 1 represents the existing measuring method adopting a mechanical or electronic switch to switch the measuring range, the method 2 represents the method for measuring the B-H loop of the soft magnetic material in a large range, Hs represents the set testing magnetic field size and has the unit of A/m, Bm represents the saturation magnetic flux density under the testing magnetic field and has the unit of T, Br represents the residual magnetic flux density under the testing magnetic field and has the unit of T, and Hc represents the coercive force of the set testing magnetic field and has the unit of A/m. As can be seen from the data in the table I, no matter the measurement result is the saturation magnetic flux density, the residual magnetic flux density or the coercive force, the measurement method has better measurement repeatability compared with the existing measurement method, and the data measured for multiple times are more concentrated and stable.
It will be appreciated that another embodiment of the present invention also provides an apparatus for performing extensive B-H loop measurements on soft magnetic materials, comprising a controller (not shown), a measuring circuit and a display screen (not shown), the measuring circuit being shown in particular in figure 4, the controller is respectively connected with a bipolar adjustable voltage source of the measuring circuit, a first sampling resistor Rs1 and a second sampling resistor Rs2, the controller is also connected with the display screen and is used for outputting a control signal through a DA interface of the controller according to the required magnetic field waveform to control the bipolar adjustable voltage source to output a corresponding voltage waveform, then, the current value flowing through the first sampling resistor Rs1 and the second sampling resistor Rs2 is sampled and the magnetic induction intensity of the soft magnetic material to be measured is measured, then the B-H loop is automatically drawn according to the measurement result, and finally the drawn B-H loop is displayed through a display screen. The switch and the second sampling resistor Rs2 are connected in series to form a first current channel, the switch is used for controlling the on-off of the current channel, the semiconductor voltage-controlled device and the first sampling resistor Rs1 are connected in series to form a second current channel, and the semiconductor voltage-controlled device is used for controlling the on-off of the current channel. The specific measurement process has been described in detail in the above method embodiments, and is not described herein again. In addition, the switch can be a mechanical switch or an electronic switch, in the case of the mechanical switch, the mechanical switch needs to be manually closed before measurement is carried out, in the case of the electronic switch, for example, a relay or a transistor is used as the switch, and the controller needs to be connected with the electronic switch to control the on-off of the switch. The controller is preferably a single chip microcomputer, and the semiconductor voltage control device is preferably a diode. In addition, the controller obtains the magnetic induction intensity of the soft magnetic material to be measured by performing integral calculation on the induced voltage of the secondary side, and a specific integral circuit belongs to the prior art, so that the detailed description is omitted here. .
In this embodiment, the device for measuring the wide-range B-H loop of the soft magnetic material performs measurement by arranging two current channels connected in parallel, when the output voltage value of the power supply is small, only the current channel where the second sampling resistor Rs2 is located is put into the circuit to form a small current range, the accuracy of current scanning measurement is determined by the first current channel, and when the output voltage value of the power supply is large, and when the output voltage value exceeds the on-state voltage of the semiconductor voltage-controlled device, the second current channel is put into the circuit, the current value of the scanning measurement is the sum of the current values of the two current channels, so as to form a large current range, during the whole measurement process, the large current range and the small current range are always in the working state, compared with the existing mode of switching the current range by using a mechanical switch or an electronic switch, the current path does not have a transient open circuit and return to zero state, the transient of the magnetic field does not exist any more, the magnetizing process of the sample excitation coil is continuously carried out, the continuous and stable adjustment of the current in the ultra-wide range and the accurate measurement of the current magnitude are ensured, and the obtained B-H loop is also continuous.
It will be appreciated that, preferably, the resistance value of the first sampling resistor is much smaller than that of the second sampling resistor, for example, the resistance value of the first sampling resistor is in the milliohm range, and the resistance value of the second sampling resistor is in the ohm or kiloohm range. More preferably, the resistance value of the first sampling resistor is in the milliohm range, and the resistance value of the second sampling resistor is in the kiloohm range. In an embodiment of the invention, the resistance of the second sampling resistor is 1 to 1000 Ω, and the resistance of the first sampling resistor is 0.001 to 0.005 Ω. Namely, the first current channel is a small current channel, the second current channel is a large current channel, the sampling of the small current channel is used as a small current range, and the common sampling of the small current channel and the large current channel is used as a large current range. When only the small current channel has current flowing, the measurement precision of the scanning current is ensured by the sampling precision of the small current channel, after the large current channel starts to flow current, the current value of the scanning measurement is the sum of the current values of the two current channels, and the measurement precision of the scanning current is ensured by the sampling precision of the large current channel, so that the measurement precision of the current with the large current value is ensured, and the continuous and stable regulation of the current in an ultra-wide range and the accurate measurement of the current magnitude are ensured.
In addition, preferably, when the controller monitors that the current value of the second sampling resistor is smaller than a set current value, only the current value of the second sampling resistor is used as a current scanning measurement value, when the current value of the second sampling resistor is larger than the set current value, wherein the set current value is a current value corresponding to the second sampling resistor when the semiconductor voltage-controlled device is switched on, at this time, the voltage at two ends of the semiconductor voltage-controlled device is already large enough to be switched on, the current will mainly flow through the large current channel, the current value of the first sampling resistor is used as the current scanning measurement value, that is, the current value to be scanned and measured is the sum of the current values of the two current channels, and the measurement accuracy of the scanning current is ensured by the sampling accuracy of the large current channel, so that the measurement accuracy of the current with the large scanning current value is ensured, and therefore, the measurement accuracy of the current at the current peak value is ensured, The two-point measurement of the current value corresponding to the coercive force has high accuracy.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (7)
1. A method for wide-range B-H loop measurement of soft magnetic materials,
the method comprises the following steps:
step S1: connecting two current channels in parallel and then connecting the two current channels in series with a sample excitation coil and a power supply, wherein one current channel comprises a semiconductor voltage-controlled device and a first sampling resistor which are sequentially connected, the other current channel comprises a switch and a second sampling resistor which are sequentially connected, and the sample excitation coil is wound on a soft magnetic material to be detected;
step S2: closing the switch and obtaining a B-H loop of the excitation coil of the sample by adopting a fast scanning method;
the power supply is a bipolar adjustable voltage source, and the step S2 specifically includes the following steps:
step S21: controlling the voltage waveform output by the bipolar adjustable voltage source according to the required magnetic field waveform, monitoring the scanning current of the first sampling resistor and the second sampling resistor in real time, and only taking the current value of the second sampling resistor as the current scanning measurement value when the current value of the second sampling resistor is monitored to be smaller than the set current value; when the current value of the second sampling resistor is monitored to be larger than the set current value, adding the current value of the first sampling resistor as the current scanning measurement value;
step S22: and obtaining the magnetic induction intensity measurement result and the current scanning measurement result of the soft magnetic material to be measured, and drawing a B-H loop.
2. The method for extensive B-H loop measurement of soft magnetic materials of claim 1,
the resistance value of the first sampling resistor is in the milliohm level, and the resistance value of the second sampling resistor is in the ohm or kiloohm level.
3. The method for extensive B-H loop measurement of soft magnetic materials of claim 1,
the semiconductor voltage-controlled device is a diode.
4. A device for wide-range B-H loop measurement of soft magnetic materials is characterized in that,
the measurement circuit comprises a bipolar adjustable voltage source, a sample excitation coil, a switch, a first sampling resistor, a semiconductor voltage-controlled device and a second sampling resistor, wherein the sample excitation coil is wound on a soft magnetic material to be measured, the switch and the second sampling resistor are connected in series to form a current channel, the semiconductor voltage-controlled device and the first sampling resistor are connected in series to form another current channel, the two current channels are connected in series with the bipolar adjustable voltage source and the excitation coil after being connected in parallel, the controller is respectively connected with the bipolar adjustable voltage source, the first sampling resistor and the second sampling resistor, the controller is further connected with the display screen, and the controller is used for outputting a control signal through a DA interface of the controller according to a required magnetic field waveform to control the bipolar adjustable voltage source to output a corresponding voltage waveform, sampling a current value flowing through the first sampling resistor and the second sampling resistor and measuring the soft magnetic material to be measured, and is used for sampling the current value flowing through the first sampling resistor and the second sampling resistor Finally, automatically generating a B-H loop line to be displayed through a display screen;
the controller is further used for monitoring the magnitude of the scanning current, only taking the current value of the second sampling resistor as the current scanning measurement value when the current value of the second sampling resistor is monitored to be smaller than the set current value, and adding the current value of the first sampling resistor as the current scanning measurement value when the current value of the second sampling resistor is monitored to be larger than the set current value.
5. The apparatus for extensive B-H loop measurement of soft magnetic material of claim 4,
the switch is an electronic switch, and the controller is further connected with the electronic switch.
6. The apparatus for extensive B-H loop measurement of soft magnetic material of claim 4,
the controller is a single chip microcomputer.
7. The apparatus for extensive B-H loop measurement of soft magnetic material of claim 4,
the resistance value of the second sampling resistor is 1-1000 omega, and the resistance value of the first sampling resistor is 0.001-0.005 omega.
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