CN111125990A - Method for judging result correctness of parasitic parameters - Google Patents
Method for judging result correctness of parasitic parameters Download PDFInfo
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- CN111125990A CN111125990A CN201911317694.0A CN201911317694A CN111125990A CN 111125990 A CN111125990 A CN 111125990A CN 201911317694 A CN201911317694 A CN 201911317694A CN 111125990 A CN111125990 A CN 111125990A
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- 230000003071 parasitic effect Effects 0.000 title claims abstract description 55
- 238000000034 method Methods 0.000 title claims abstract description 34
- 238000012360 testing method Methods 0.000 claims abstract description 37
- 238000000605 extraction Methods 0.000 claims abstract description 27
- 238000013461 design Methods 0.000 abstract description 11
- 238000010586 diagram Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 238000012790 confirmation Methods 0.000 description 2
- 238000012938 design process Methods 0.000 description 2
- 239000000284 extract Substances 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
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- 230000007547 defect Effects 0.000 description 1
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- 230000006872 improvement Effects 0.000 description 1
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Abstract
A method for judging the correctness of a parasitic parameter result comprises the following steps: 1) specifying a test case library, operating a catalogue and reporting a generation catalogue; 2) setting an extraction mode and a threshold of parasitic parameters; 3) extracting the layout data according to a set extraction mode; 4) writing the extracted parasitic parameters of all the test cases into a test table; 5) and judging the correctness of the parasitic parameter result to generate a summary report. The method for judging the correctness of the parasitic parameter result supports the calculation of complex data types and the automatic analysis of mass data, and greatly improves the correctness and efficiency of design.
Description
Technical Field
The invention relates to the technical field of EDA (electronic design automation), in particular to a method for judging the correctness of a parasitic parameter result.
Background
The parasitic parameters in the layout are the most important and most critical steps in the design of the integrated circuit and the liquid crystal panel, and directly determine the success or failure of the whole integrated circuit design process. In the integrated circuit layout design and liquid crystal panel design process, parasitic parameter extraction and result judgment are continuously carried out on each functional module, the accuracy and precision of extraction directly determine whether a chip or a panel tape-out can be successful, so that the accuracy and precision of massive parasitic parameters are required to be judged, manual judgment wastes a large amount of time, the accuracy cannot be guaranteed, and once errors occur, the performance of the chip or the panel is greatly influenced, and even the function is failed.
Disclosure of Invention
In order to solve the defects in the prior art, the invention aims to provide a method for judging the correctness of parasitic parameter results, which supports the calculation of complex data types, supports the automatic analysis of mass data and greatly improves the correctness and efficiency of design.
In order to achieve the above object, the present invention provides a method for determining the correctness of parasitic parameter results, which comprises the following steps:
1) specifying a test case library, operating a catalogue and reporting a generation catalogue;
2) setting an extraction mode and a threshold of parasitic parameters;
3) extracting the layout data according to a set extraction mode;
4) writing the extracted parasitic parameters of all the test cases into a test table;
5) and judging the correctness of the parasitic parameter result to generate a summary report.
Further, the step 1) further includes setting a time threshold for the parasitic parameter extraction and the number of instances running in parallel.
Further, when the extraction time exceeds the time threshold, the parameter extraction of the corresponding test case is stopped.
Further, the step 3) further comprises:
decompressing data in the test library to the running directory according to the setting;
the test case comprises an execution code, and the extraction mode of the parasitic parameters is called according to the execution code.
Further, the step 4) further includes, during writing, determining whether the corresponding test table exists in the report directory, if not, generating and writing the test table, and if so, overwriting data in the test table.
Further, the step 5) further comprises:
writing the test table data and the standard data in parallel and in sequence to generate comparison table data;
and subtracting the test data and the standard data and comparing the subtraction result with the set threshold value.
Further, marking the data as failed when the threshold is exceeded.
Further, the summary report includes failure data information and pass data information.
In order to achieve the above object, the present invention further provides a computer readable storage medium, on which computer instructions are stored, and when the computer instructions are executed, the method for determining the correctness of the parasitic parameter result as described above is performed.
In order to achieve the above object, the present invention further provides a device for determining correctness of result of parasitic parameter, including a memory and a processor, where the memory stores computer instructions running on the processor, and the processor executes the computer instructions to perform the above method steps for determining correctness of result of parasitic parameter.
The method for judging the correctness of the parasitic parameter result has the following beneficial effects:
1) the method supports the calculation of complex data types, supports the automatic analysis of mass data, and greatly improves the design accuracy and efficiency.
2) The workload of a user can be reduced, meanwhile, errors caused by manual operation of the user can be effectively avoided, and the correctness of layout design is effectively guaranteed.
3) The interface operation process exists, and the use is easy.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
The accompanying drawings are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. In the drawings:
FIG. 1 is a flow chart of a method for determining the correctness of parasitic parameter results according to the present invention;
FIG. 2 is a schematic diagram of a basic parameter setting conventional interface according to the present invention;
FIG. 3 is a schematic diagram of a basic parameter setting selection interface according to the present invention;
FIG. 4 is a schematic view of an operational settings confirmation interface according to the present invention;
FIG. 5 is a schematic illustration of an operational procedure display interface according to the present invention;
FIG. 6 is a schematic view of a run record result display interface according to the present invention;
FIG. 7 is a schematic diagram of a run result auto-compare command generation result interface according to the present invention;
fig. 8 is a schematic view of an operation result automatic comparison result display interface according to the present invention.
Detailed Description
The preferred embodiments of the present invention will be described in conjunction with the accompanying drawings, and it will be understood that they are described herein for the purpose of illustration and explanation and not limitation.
Fig. 1 is a flowchart of a method for determining the correctness of parasitic parameter results according to the present invention, and the method for determining the correctness of parasitic parameter results according to the present invention will be described in detail with reference to fig. 1.
First, in step 101, a test case library is specified, a catalog is run, and a report generation catalog is generated. In this step, configuration is first performed, a test base to be tested is specified in a General (regular) page, a run directory, and a report generation directory.
Preferably, the timeout time and the number of instances running in parallel are set.
Preferably, when the parasitic parameter extraction time exceeds a prescribed time, the extraction operation of the test module is stopped. In the step, the abnormal condition (such as dead loop) in the extraction process of the individual module is prevented, endless waiting is caused, and a plurality of modules can be operated in parallel.
In step 102, a parasitic parameter extraction mode and a threshold are set. In the step, an extraction mode of parasitic parameters and a threshold value of parameters such as rc are set in an Option interface so as to automatically judge whether the extracted related parameters meet requirements.
In step 103, the correctness of the parasitic parameter result is extracted and judged, and the relevant setting and test conditions are recorded. In the step, a Run button is clicked, the page can automatically jump to a Log (record) page, relevant running settings can be displayed at the beginning of the Log (record) page, and the completion condition of each measurement case can be displayed in the running process.
Preferably, the data in the test library is decompressed to the run catalog according to the settings.
Preferably, each test case has a corresponding execution code, and the execution code automatically calls an engine for extracting parasitic parameters, and extracts the layout data according to a set extraction mode.
Preferably, when each instance is extracted, the system calls the data processing module to write the parasitic parameter value of each instance into the Excel.
Preferably, when the write operation is executed, whether a corresponding Excel Report exists in a Report directory is judged, if not, a new Excel is generated, an Excel write-in module is called, and data is written in sequentially; and if the corresponding Excel already exists, executing the write operation by adopting the additional mode, namely, if the data of the example already exists, performing the overwriting write operation.
Preferably, after the parasitic parameters are extracted, the data merging processing module is called, and the data in the tested Excel report and the standard data are written into a new comparison Excel table in parallel and sequentially.
Preferably, the comparison module is invoked to perform a subtraction operation on the test data and the standard data, compare the subtraction operation with a threshold value set by each parameter, highlight the row of data when the corresponding threshold value is exceeded, and mark the row of data as a failure in a result column.
Preferably, a summary report is automatically generated in Excel after running, and the summary report comprises failure data information and passing data information.
The method for determining the correctness of the parasitic parameter result according to the present invention is further described with reference to an embodiment.
Fig. 2 is a schematic diagram of a conventional interface for setting basic parameters according to the present invention, as shown in fig. 2, a user first needs to configure, select a directory in an input box, and select a directory of a test library through a Browser; clicking the Browser (browsing program) corresponding to the work dir in an output frame to select an operation directory, and then clicking the Browser (browsing program) corresponding to the report dir to select a directory for storing the report in the excel format.
FIG. 3 is a schematic diagram of a basic parameter set selection interface according to the present invention, as shown in FIG. 3, for selecting a parasitic parameter extraction mode in the BoundarCondition line; the Number of processes used in the Multiprocessor Number one line selection fetch; thresholds (above which an error will be reported and highlighted in Excel) are specified for each parameter in Threshold Setting.
FIG. 4 is a schematic view of an operational settings confirmation interface according to the present invention.
According to the settings, the system firstly decompresses the data in the test case library into the operation directory, each test case has a corresponding execution code, and the execution code can automatically call an engine for extracting parasitic parameters and extract the layout data according to the set extraction mode.
Fig. 5 is a schematic view of an operation display interface according to the present invention.
When one example is extracted, the system calls a data processing module, each parasitic parameter value of each example is automatically written into Excel, whether a corresponding Excel Report exists in a Report directory is judged firstly when writing operation is executed, if not, a new Excel is generated firstly, and then the system calls an Excel writing module to write data in sequence; if the corresponding Excel already exists, the write operation is executed by adopting an additional mode during the write, and if the data of the test example already exists, the overwriting operation is carried out.
After parasitic parameters of all the test cases are extracted, the system calls a data merging processing module, data in a tested Excel report and standard data are written in parallel and sequentially, new Excel table data is generated, then the system calls a comparison module to perform subtraction operation on two rows of data, then the two rows of data are compared with a threshold value set by each parameter, when the corresponding threshold value is exceeded, the system automatically displays the row of data in red, meanwhile, the row of data is marked as failure in a result column, and finally, a summary report (which data fails and which data passes) is automatically generated in the Excel.
Fig. 6 is a schematic view of a running record result display interface according to the present invention.
FIG. 7 is a schematic diagram of an interface for generating results of the run result auto-compare command according to the present invention.
Fig. 8 is a schematic view of an operation result automatic comparison result display interface according to the present invention.
In the whole operation process, a user can also specify the timeout detection value of each module in real Time, as shown in fig. 2, the Number of hours is specified in a Time Out (timeout) frame, if the parasitic parameter extraction Time of one module exceeds the set Number of hours, the system can forcibly stop the extraction operation of the module, prevent the occurrence of an abnormality (for example, a dead loop) in the extraction process of the individual module, and cause endless waiting, and simultaneously can perform Parallel operation on a plurality of modules, as shown in fig. 2, specify the Number of simultaneously-operated examples in a parallell RunCase Number, so that the total operation Time can be greatly saved. The verification method for the mass parasitic parameters guarantees the correctness of layout design and greatly improves the design efficiency of layout personnel.
The invention relates to a method for carrying out one-key starting and automatic judgment on the excessive parasitic parameters in a layout in integrated circuit design and liquid crystal panel design for the first time.
In order to achieve the above object, the present invention further provides a computer readable storage medium, on which computer instructions are stored, and when the computer instructions are executed, the method for determining the correctness of the parasitic parameter result as described above is performed.
In order to achieve the above object, the present invention further provides a device for determining correctness of result of parasitic parameter, including a memory and a processor, where the memory stores computer instructions running on the processor, and the processor executes the computer instructions to execute the steps of the method for determining correctness of result of parasitic parameter as described above.
Those of ordinary skill in the art will understand that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A method for judging the correctness of a parasitic parameter result is characterized by comprising the following steps:
1) specifying a test case library, operating a catalogue and reporting a generation catalogue;
2) setting an extraction mode and a threshold of parasitic parameters;
3) extracting the layout data according to a set extraction mode;
4) writing the extracted parasitic parameters of all the test cases into a test table;
5) and judging the correctness of the parasitic parameter result to generate a summary report.
2. The method for judging the correctness of the result of the parasitic parameter as claimed in claim 1, wherein the step 1) further comprises setting a time threshold value for the extraction of the parasitic parameter and the number of the examples running in parallel.
3. The method as claimed in claim 2, wherein the parameter extraction of the corresponding test case is stopped when the extraction time exceeds the time threshold.
4. The method for determining the correctness of the parasitic parameter result according to claim 1, wherein the step 3) further comprises:
decompressing data in the test library to the running directory according to the setting;
the test case comprises an execution code, and the extraction mode of the parasitic parameters is called according to the execution code.
5. The method as claimed in claim 4, wherein the step 4) further comprises, during writing, determining whether the corresponding test table exists in the report directory, if not, generating and writing the test table, and if so, overwriting data in the test table.
6. The method for determining the correctness of the parasitic parameter result according to claim 1, wherein the step 5) further comprises:
writing the test table data and the standard data in parallel and in sequence to generate comparison table data;
and subtracting the test data and the standard data and comparing the subtraction result with the set threshold value.
7. The method of claim 6, further comprising marking the data as failed when the threshold is exceeded.
8. The method as claimed in claim 1, wherein the summary report includes failure data information and passing data information.
9. A computer-readable storage medium having stored thereon computer instructions, wherein the computer instructions when executed perform the method steps of determining the correctness of the result of a parasitic parameter according to any one of claims 1 to 8.
10. A device for determining correctness of results of parasitic parameters, comprising a memory and a processor, wherein the memory stores computer instructions running on the processor, and the processor executes the computer instructions to execute the steps of the method for determining correctness of results of parasitic parameters according to any one of claims 1 to 8.
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Cited By (2)
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CN112131830A (en) * | 2020-09-25 | 2020-12-25 | 成都海光微电子技术有限公司 | Parasitic parameter verification method and device, electronic equipment and storage medium |
CN112668259A (en) * | 2020-12-24 | 2021-04-16 | 北京华大九天科技股份有限公司 | System verification method of post-simulation netlist |
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CN109214023A (en) * | 2017-07-05 | 2019-01-15 | 中国科学院微电子研究所 | Test method and device for process design toolkit |
CN109255167A (en) * | 2018-08-27 | 2019-01-22 | 珠海市微半导体有限公司 | The method of adjustment of ESD resistance between a kind of IC domain weld pad |
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- 2019-12-19 CN CN201911317694.0A patent/CN111125990A/en active Pending
Patent Citations (4)
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US20020147946A1 (en) * | 2001-04-05 | 2002-10-10 | Yong Jaimsomporn | Method and system for automatic test report generation from memory device reliabilty testing |
CN103838894A (en) * | 2012-11-26 | 2014-06-04 | 北京华大九天软件有限公司 | Method for achieving automatic PDK testing |
CN109214023A (en) * | 2017-07-05 | 2019-01-15 | 中国科学院微电子研究所 | Test method and device for process design toolkit |
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Cited By (3)
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CN112131830A (en) * | 2020-09-25 | 2020-12-25 | 成都海光微电子技术有限公司 | Parasitic parameter verification method and device, electronic equipment and storage medium |
CN112131830B (en) * | 2020-09-25 | 2021-06-15 | 成都海光微电子技术有限公司 | Parasitic parameter verification method and device, electronic equipment and storage medium |
CN112668259A (en) * | 2020-12-24 | 2021-04-16 | 北京华大九天科技股份有限公司 | System verification method of post-simulation netlist |
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