CN111104309B - Method for quickly realizing comprehensive test flow - Google Patents

Abstract

The invention relates to a method for quickly realizing a comprehensive test flow, which comprises the following steps: performing test function class division according to the type of the hardware interface of the system to be tested; designing a test function unit for each test function class; all the test functional units adopt unified interface parameters; designing a test configuration information interface, and establishing a mapping relation between configuration information and a test functional unit; establishing a corresponding relation between test flow requirements and test flow configuration information, wherein the test configuration information is stored in a configuration file, and one row of the file corresponds to one test item; and sequentially reading each piece of configuration information from the configuration file, analyzing, judging the type of the test function and the corresponding test function unit, transmitting the configuration information to interface parameters of the test function unit, completing the execution of the current test item by the test function unit, and outputting a test result through the interface parameters until all the test items are executed to complete the test flow.

Description

A quick implementation method of comprehensive testing process

Technical field

This project belongs to the field of ground comprehensive testing and provides a method to quickly implement the comprehensive testing process of the measurement and control system.

Background technique

The various test functions of the comprehensive test system mainly send control instructions to the system under test through different hardware function boards such as analog, digital, and communication. At the same time, it collects and displays various status indication information of the system, conducts data communication according to the communication protocol requirements, and performs data processing. judgment of effectiveness. The diversification and complexity of equipment continue to increase, putting forward higher requirements for ground comprehensive test systems. However, in the current comprehensive test process, the test process is easy to change and the test process is quite different in different test states, including test items, tests Criteria, etc. all need to be redesigned and coded. The traditional comprehensive test process design and development model can easily cause problems such as repeated design, low development efficiency, and high maintenance costs.

Contents of the invention

The technical problem solved by the present invention is to provide a method for rapid implementation of a comprehensive test process, respond quickly to test process requirements, implement the test process with as few codes as possible, shorten the model development cycle, and reduce development costs.

The technical solution of the present invention is: a method for rapid implementation of a comprehensive testing process, which is implemented in the following manner:

Divide test function categories according to the hardware interface type of the system to be tested;

Based on the divided test function categories, design test function units for each test function category; all test function units use unified interface parameters;

Based on the designed test functional units and unified interface parameters, design the test configuration information interface and establish the mapping relationship between the configuration information and the test functional units;

According to the test process requirements, the test process configuration is performed according to the test configuration information interface, and all test items in the same test process are used in the form of configuration information to establish the corresponding relationship between the test process requirements and the test process configuration information. The test configuration information is stored in the configuration file. One line in the file corresponds to one test project;

Read each configuration information sequentially from the configuration file, analyze it, determine the test function category and its corresponding test function unit, and pass the configuration information to the interface parameters of the test function unit, and the test function unit completes the current test project Execute and output the test results through the interface parameters until all test items are executed to complete the test process.

Preferably, for the measurement and control system under test, the test function categories include AD test, DI test, DO test, 1553B test, and serial port test.

Preferably, each test function category corresponds to one or more test function units. The test function units are obtained by encapsulating different types of test board driver interface functions and are currently verified stable test function units;

Among them, the AD test function category at least includes a single-channel voltage acquisition and interpretation functional unit, the DI test function category at least includes a single-channel digital input and interpretation functional unit, the DO test function category at least includes a single-channel switching output functional unit, and the 1553B test function category It includes at least single message command output and reply command interpretation functional units, and the serial port test function category at least includes single frame command output and reply command interpretation functional units.

Preferably, the unified interface parameters include input parameters, output parameters and return values; the input parameters include test function categories, test project names, test parameter names, and test function unit associated parameters; the output parameters include test project names, Test parameter name, required value, actual measured value, conclusion; return value identifies the normal/abnormal status of test execution.

Preferably, the configuration information is based on the input parameters of the test function unit, including test function category, test item name, test parameter name, test function unit identifier, and test function unit associated parameters. Each piece of configuration information is combined with the test function unit identifier and The test functional unit establishes a unique correspondence.

Preferably, the test function unit associated parameters include one or more parameter items, which are uniquely determined by the specific test function unit;

Among them, the parameters associated with the single-channel voltage acquisition and interpretation functional unit of the AD test function include AD board identification, channel number, and AD criterion; the parameters associated with the single-channel digital input and interpretation functional unit of the DI test function include the DI board identification, channel number, DI criterion; DO test functional single-channel switch output functional unit associated parameters include DO board identification, channel number, output value; 1553B test functional single message command output and callback interpretation functional unit associated parameters include BC write RT message address, BC write RT data, delay, BC read RT message address, criteria; parameters associated with the serial port test single frame command output and command response interpretation functional unit include sending serial port ID, sending serial port data, delay, receiving serial port ID, criterion.

Preferably, the configuration information is stored in a CSV format file, and each line of configuration information in the file corresponds to a test project;

The configuration information format expresses different parameters in the form of regular strings. The expression rules for the same type of parameters should be consistent. Strings are separated by commas, and the strings do not contain commas. Configuration parameters represent test function categories and test project names in column order. , test parameter name, functional unit identification, functional unit associated parameters.

Preferably, when configuring the test process, open the CSV format file through Excel table for configuration. First, compare the test function category and the test function unit, and map the test items required by the test process to the corresponding test function unit as an independent test item. According to The test process configuration information format is used to configure the process to form a test process configuration file that is consistent with the test process requirements.

Preferably, the test process analysis is completed in the following manner:

First, read a piece of configuration information from the configuration file sequentially in the form of a string, use comma delimiters to separate parameters, complete a parsing and extract the functional unit identifier, and enter the corresponding functional unit based on the functional unit identifier;

Then, in the test functional unit, a corresponding regular expression is established based on the expression rules of the associated parameters of each functional unit in the configuration information, and the regular matching method is used for secondary analysis to extract the functional unit associated parameters.

Preferably, after the configuration information is parsed, the parameters are passed to the corresponding functional unit for processing. After the processing is completed, the output parameters are formed, including test project names, test parameter names, required values, actual measured values, and conclusions.

Compared with the prior art, the beneficial effects of the present invention are:

In order to quickly realize the system comprehensive test process, the present invention combines the test characteristics of the measurement and control system to separate the test process from the program, complete the rapid implementation of the test process through configuration files, and improve the implementation efficiency of the test process.

Compared with the existing technology, which is mostly oriented to specific test applications and implements each test item of the test process one by one through code, the present invention makes full use of modular multiplexing of test function units based on hardware interface type division and efficient processing of configuration file table information. Advantages: The test process is implemented by formatting table configuration, and only the basic test function unit module program is written. The test process uses table information editing to minimize the test process implementation time, especially for long test process sequences, test items, and tests. The effect is obvious in test application scenarios with variable parameters and criteria. This configuration file-based rapid implementation method of the test process can be well applied to the comprehensive test process of multi-state systems under different models, reducing the design and testing workload and facilitating transplantation and promotion.

Description of the drawings

Figure 1 is a schematic diagram of the test process configuration file of the present invention;

Figure 2 is a schematic diagram of the execution of the test process of the present invention;

Figure 3 is a flow chart of the present invention based on configuration file test execution.

Detailed ways

The present invention will be further described below in conjunction with the examples.

The invention combines the testing characteristics of the measurement and control system, writes the variable part information of the test process into the configuration file, retains relatively stable test function unit modules in the software program, and designs independent test process configuration files for each test process. Decompose the test items according to the test process requirements, divide the test function types, use the unified process test item configuration interface to configure the process, and quickly implement the comprehensive test process through the configuration of the test process.

a) Test process requirements

Based on the system task input, system test requirements are analyzed, including interface types, test items and other detailed information to form specific requirements for the test process. See Table 1 for part of the test process.

Table 1 Test process requirements

serial number Test items Test parameters Required value 1 AI measurement IN0 28±3V 2 DI measurement I1 1 3 AI measurement CH1 5±1V 4 DI measurement I34 1 5 DI measurement I35 1 6 DO output COM1 7 AI measurement IN1 28±3V 8 DI measurement I2 1 9 AI measurement CH2 5±1V 10 DO output COM2 11 AI measurement IN2 28±3V 12 DI measurement I3 1

b) Test process configuration and deployment

Analyze the test process requirements, map the test requirements to the configuration file interface, configure the test items, test types, test channels/addresses, test criteria, etc., to form the test process configuration file as shown in Figure 1.

c) Test process execution

After the test process configuration is completed, test execution can begin. The software test process execution process is shown in Figure 2. The test information list displays the current test item information, in which the test item identifies the name of the current test item, and the test parameters are the data that need to be tested. The software displays the required values and actual measured values and automatically interprets them to give a test conclusion on whether they are qualified or not.

The above rapid implementation method of comprehensive test process based on configuration files can be well applied to multi-state system testing under different models, and is compatible with equivalence inspection, unit testing, bulk testing, matching testing, and final assembly testing processes in multi-states.

Example

The present invention is a method for rapid implementation of a comprehensive test process. The specific implementation process mainly includes test function category division, test function unit design, configuration information format design, test process configuration, configuration information analysis and test execution. The following is explained by taking a certain system test process as an example. Detailed ways.

a) Division of test function categories

Comprehensive testing generally includes sending control instructions through the simulation of switching boards, voltage acquisition with AD boards, digital DI status monitoring, and communication instruction testing with 1553B or serial ports. Since the hardware interface is relatively stable, the test process changes greatly, and the test process can be followed It is required to divide the test items of the test process into functional categories according to the test hardware interface type, and divide the test types into AD test, DI test, DO test, 1553B test, and serial port test.

b) Test functional unit design

According to the test type and specific test items, the test function unit is designed separately for each board function type. The basic functions of the test function unit are completed by encapsulating different types of test board driver interface functions. Each function function adopts unified interface parameters, and the parameter interface includes Input parameters, output parameters, return value. Among them, the input parameters include the test function category, test project name, test parameter name, and functional unit associated parameters. The output parameters include the test project name, test parameter name, required value, actual measured value, and conclusion. The return value identifies the normal/abnormal test execution. state. The design content of each test type functional unit of AD test, DI test, DO test, 1553B test, and serial port test is detailed in Table 2 below.

Table 2 Test function unit design

c) Configuration information format design

For different test items of the same test type in the test process, they are distinguished in the form of configuration information. According to the interface parameters of the test functional unit, the AD single-channel voltage acquisition and interpretation unit, DI single-channel digital input and interpretation unit, and DO are designed respectively. Parameter configuration format of single-channel switch output unit, 1553B single message command and reply interpretation unit, and serial port single frame command sending and reply interpretation unit. Configuration information is stored in CSV files. The configuration content is based on the input parameters of the test functional unit, including test function category, test project name, test parameter name, functional unit identification, functional unit associated parameters, specific design and configuration information format of different functional units. See Table 3 for instructions.

The associated parameters of the test functional unit include one or more parameter items, which are uniquely determined by the specific test functional unit; among them, the associated parameters of the AD test functional single-channel voltage acquisition and interpretation functional unit include AD board identification, channel number, and AD criterion; Parameters associated with the single-channel digital input and interpretation functional unit of the DI test function include DI board identification, channel number, and DI criteria; parameters associated with the single-channel switching output functional unit of the DO test function include DO board identification, channel number, and output Value; 1553B test function type single message command output and response command interpretation functional unit associated parameters include BC write RT message address, BC write RT data, delay, BC read RT message address, criteria; serial port test type single frame command output and Parameters associated with the command-back interpretation functional unit include sending serial port ID, sending serial port data, delay, receiving serial port ID, and criteria.

Table 3 Configuration information interface format

For other test types and functional units, they can be re-identified and independently implemented according to items a) and b), and their corresponding parameter configuration interface identifiers are provided.

d) Test process configuration

When configuring the test process, open the CSV configuration file through an Excel table. Each row of configuration information in the table corresponds to a test project. The configuration parameters represent different parameter types in column order, including test function category, test project name, test parameter name, Functional unit identification, functional unit associated parameters, and each test item configuration information are configured according to this rule (as shown in Figure 1);

First, compare the test function category and the test function unit (as shown in Table 2), and map the test items of the test process requirements to the corresponding test function unit as an independent test item according to the test process requirements (as shown in Table 1). The test process configuration information format (as shown in Table 3) is used to configure the process to form a test process configuration file that is consistent with the test process requirements (as shown in Figure 1).

e) Configuration information analysis and test execution

The execution of the test process is driven by the process configuration file. When there are multiple test processes, an independent process configuration file is set for each test process. Each line of configuration information in the configuration file corresponds to a test project. When executing the test, it is read sequentially in the form of a string. A piece of test item configuration information in the configuration file uses comma delimiters to separate parameters and complete one parsing to extract the functional unit identifier.

Through the judgment of functional unit identification parameters, enter the corresponding functional unit processing branch to establish regular expressions corresponding to the associated parameters of different functional units, and use the regular matching method to perform secondary analysis to extract the functional unit associated parameters. Pass the relevant parameters of the test unit to perform AD voltage acquisition and interpretation, DI digital input and interpretation, DO switch output, 1553B command test, and serial port command test operations respectively. After the processing is completed, the output parameters are formed, including test project name, test parameter name, and requirements. values, measured values, and conclusions. After the execution is completed, enter the next test. After all test items are executed, exit the automatic test process. The test execution process is shown in Figure 3.

Specifically, for the AD test function single-channel voltage acquisition and interpretation functional unit, based on the board identification and channel number, the specified channel voltage (actual measured value) of the corresponding board is collected, and then the voltage value is compared with the voltage criterion (required value) Draw conclusions from judgments (pass/fail);

For the single-channel digital input and interpretation functional unit of the DI test function, according to the board identification and channel number, collect the DI value (actual measured value) of the specified channel of the corresponding board, and then compare the DI value with the DI criterion (required value) Judgment and conclusion (pass/fail);

For the DO test functional single-channel switching output functional unit, based on the board identification, channel number, and output value, the designated channel of the corresponding board will perform DO output;

For the 1553B test function single message command output and callback interpretation functional unit, send the specified data according to the BC write RT message address, wait for the delay time and read back the data (actual measured value) from the BC read RT message address, and compare it with the criterion ( Required value) for comparison and judgment to draw a conclusion (pass/fail);

For the serial port test type single frame command output and command response interpretation functional unit, data is sent through the sending serial port, and after waiting for a delay, the data (actual measured value) is read back from the receiving serial port and compared with the criterion (required value) to draw a conclusion. (pass/fail).

Through the five steps a)-e), the test process configuration is completed, and the configuration and deployment of the test process, automated execution, and test result interpretation and processing are quickly realized to meet the test process requirements of the measurement and control system. The test execution effect is shown in Figure 2.

The parts not described in detail in the present invention belong to the common knowledge of those skilled in the art.

Claims (7)

1. The method for rapidly realizing the comprehensive test flow is characterized by comprising the following steps of:

performing test function class division according to the type of the hardware interface of the system to be tested; aiming at the system to be tested in the measurement and control class, the class division of the test function comprises AD test, DI test, DO test, 1553B test and serial port test;

designing test function units for each test function class according to the divided test function classes; all the test functional units adopt unified interface parameters;

designing a test configuration information interface according to the designed test function unit and the unified interface parameters, and establishing a mapping relation between configuration information and the test function unit;

aiming at the test flow demand, carrying out test flow configuration according to a test configuration information interface, and establishing a corresponding relation between the test flow demand and the test flow configuration information by adopting a configuration information form for all test items in the same test flow, wherein the test configuration information is stored in a configuration file, and one row of the file corresponds to one test item;

sequentially reading each piece of configuration information from the configuration file, analyzing, judging the type of the test function and the corresponding test function unit, transmitting the configuration information to interface parameters of the test function unit, completing the execution of the current test item by the test function unit, and outputting a test result through the interface parameters until all the test items are executed to complete the test flow;

each test function class corresponds to one or more test function units, wherein the test function units are obtained by packaging different types of test board card driving interface functions and are stable test function units verified at present;

the AD test function class at least comprises a single-channel voltage acquisition and interpretation function unit, the DI test function class at least comprises a single-channel digital input and interpretation function unit, the DO test function class at least comprises a single-channel switching value output function unit, the 1553B test function class at least comprises a single message instruction output and feedback interpretation function unit, and the serial port test function class at least comprises a single frame instruction output and feedback interpretation function unit;

the configuration information comprises a test function category, a test item name, a test parameter name, a test function unit identifier and a test function unit association parameter according to the input parameters of the test function unit, and each configuration information establishes a unique corresponding relation with the test function unit through the test function unit identifier.

2. The method according to claim 1, characterized in that: the unified interface parameters comprise input parameters, output parameters and return values; the input parameters comprise a test function category, a test item name, a test parameter name and a test function unit association parameter; the output parameters comprise test item names, test parameter names, required values, actual measurement values and conclusions; the return value identifies the normal/abnormal state of test execution.

3. The method according to claim 1, characterized in that: the test function unit association parameters comprise one or more parameter items which are uniquely determined by a specific test function unit;

the related parameters of the AD test function single-channel voltage acquisition and interpretation function unit comprise an AD board card identifier, a channel number and an AD criterion; the related parameters of the DI test function type single-channel digital input and interpretation function unit comprise DI board card identification, channel number and DI criterion; the DO test function single-channel switching value output function unit association parameters comprise DO board card identification, channel number and output value; the 1553B test function class single message instruction output and loop interpretation function unit associated parameters comprise BC write RT message address, BC write RT data, delay, BC read RT message address and criteria; the serial port test single frame instruction output and loop interpretation function unit association parameters comprise a transmission serial port ID, transmission serial port data, delay, a reception serial port ID and a criterion.

4. The method according to claim 1, characterized in that: the configuration information is stored by adopting a CSV format file, and each row of configuration information in the file corresponds to one test item;

the configuration information format expresses different parameters in a mode of regular character strings, the expression rules of the same parameters are consistent, the character strings are separated by commas, and the character strings do not contain commas; the configuration parameters represent the test function category, the test item name, the test parameter name, the function unit identification and the function unit association parameters in the column order.

5. The method according to claim 4, wherein: when the test flow is configured, a CSV format file is opened for configuration in an Excel table mode, firstly, test function types and test function units are compared, test items required by the test flow are mapped to corresponding test function units to serve as independent test items, flow configuration is conducted according to a test flow configuration information format, and a test flow configuration file consistent with the test flow requirements is formed.

6. The method according to claim 5, wherein: the test flow analysis is completed by the following steps:

firstly, sequentially reading a piece of configuration information of a configuration file in a character string mode, performing parameter segmentation by adopting comma separators, completing one-time analysis and extraction of function unit identifiers, and entering corresponding function units according to the function unit identifiers;

and then, establishing a regular expression corresponding to each functional unit association parameter expression rule in the configuration information in the test functional unit, and performing secondary analysis by adopting a regular matching method to extract the functional unit association parameters.

7. The method according to claim 1, characterized in that: after the configuration information is analyzed, the parameters are transmitted to the corresponding functional units for processing, and output parameters comprising test item names, test parameter names, required values, actual measurement values and conclusions are formed after the processing is completed.