CN111025945A - Variable resistance analog circuit and parameter design method of variable resistance analog circuit - Google Patents
Variable resistance analog circuit and parameter design method of variable resistance analog circuit Download PDFInfo
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- CN111025945A CN111025945A CN201911324115.5A CN201911324115A CN111025945A CN 111025945 A CN111025945 A CN 111025945A CN 201911324115 A CN201911324115 A CN 201911324115A CN 111025945 A CN111025945 A CN 111025945A
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Abstract
The application provides a variable resistance analog circuit and a parameter design method thereof, wherein the variable resistance analog circuit comprises a fine tuning circuit, a coarse tuning circuit and a controller which is respectively connected with a first control end of the fine tuning circuit and a second control end of the coarse tuning circuit; the controller is used for adjusting the resistance value of the fine adjustment circuit and/or the coarse adjustment circuit; the input end of the coarse tuning circuit is connected with the input end of the variable resistance analog circuit, and the output end of the coarse tuning circuit is connected with the input end of the fine tuning circuit; the input end of the fine adjusting circuit is connected with the output end of the coarse adjusting circuit, the output end of the fine adjusting circuit is connected with the output end of the variable resistance analog circuit, and the input end of the fine adjusting circuit is connected with the input end of the variable resistance analog circuit. Therefore, under the condition that the fine tuning circuit is combined with the coarse tuning circuit, the tuning precision of the variable resistance simulation circuit is improved, and the resistance value of the resistor to be simulated is simulated more accurately.
Description
Technical Field
The present disclosure relates to electronic circuits, and particularly to a variable resistance analog circuit and a parameter design method thereof.
Background
A digital potentiometer (also called a digitally controlled programmable resistor) is a new type of integrated circuit for digital and analog mixed signal processing of Complementary Metal Oxide Semiconductor (CMOS) instead of a traditional mechanical potentiometer (i.e., an analog potentiometer). The digital potentiometer is controlled by a digital input and generates an analog output. The tap current maximum can range from a few hundred microamperes to a few milliamperes depending on the digital potentiometer.
At present, a digital potentiometer is generally used for simulating the resistance value of a temperature-variable resistor, and a resistance value signal of the temperature-variable resistor is converted into an analog signal, and the adjustable minimum resistance value of a resistor network in the digital potentiometer is too large, that is, the adjustment precision of the digital potentiometer is too large, so that the resistance value of the temperature-variable resistor cannot be accurately simulated.
Disclosure of Invention
In view of this, an object of the present application is to provide a variable resistance analog circuit and a parameter design method for the variable resistance analog circuit, in which a variable resistance analog circuit is divided into a fine tuning circuit and a coarse tuning circuit, and the resistance value of a to-be-simulated resistor is simulated by different circuits, which is helpful for improving the tuning precision of the variable resistance analog circuit, so as to more accurately simulate the resistance value of the to-be-simulated resistor.
The embodiment of the application provides a variable resistance analog circuit, variable resistance analog circuit includes:
the variable resistance simulation circuit comprises a fine adjustment circuit, a coarse adjustment circuit and a controller which is respectively connected with a first control end of the fine adjustment circuit and a second control end of the coarse adjustment circuit;
the controller is used for adjusting the resistance value of the fine adjustment circuit and/or the coarse adjustment circuit;
the input end of the coarse tuning circuit is connected with the input end of the variable resistance simulation circuit, the output end of the coarse tuning circuit is connected with the input end of the fine tuning circuit, and the coarse tuning circuit is used for simulating the resistance value of the resistor to be simulated;
the input end of the fine tuning circuit is connected with the output end of the coarse tuning circuit, the output end of the fine tuning circuit is connected with the output end of the variable resistance analog circuit, the input end of the fine tuning circuit is connected with the input end of the variable resistance analog circuit, and the fine tuning circuit is used for simulating the resistance value of the resistor to be simulated; the resistance range simulated by the fine tuning circuit is smaller than the resistance range simulated by the coarse tuning circuit.
Further, the fine-tuning circuit includes: a first resistor and a digital potentiometer;
the input end of the first resistor is connected with the input end of the digital potentiometer and the input end of the fine adjustment circuit respectively, and the output end of the first resistor is connected with the output end of the digital potentiometer and the output end of the fine adjustment circuit respectively.
Further, the coarse tuning circuit comprises at least one resistance adjusting circuit arranged in series;
the input end of the first resistance adjusting circuit in the coarse adjusting circuit is connected with the input end of the coarse adjusting circuit, and the output end of the last resistance adjusting circuit in the coarse adjusting circuit is connected with the input end and the output end of the coarse adjusting circuit.
Further, the resistance adjustment circuit includes: the circuit comprises a first switch, a second switch and a second resistor;
the input end of the first switch is respectively connected with the input end of the resistance adjusting circuit and the input end of the second switch, the output end of the first switch is connected with the input end of the second resistor, and the output end of the second switch is respectively connected with the output end of the second resistor and the output end of the resistance adjusting circuit.
Further, the first switch is an analog switch and/or an electronic relay; the second switch is an analog switch and/or an electronic relay.
The embodiment of the present application further provides a parameter design method for a variable resistance analog circuit, where the parameter design method is applied to any one of the variable resistance analog circuits, and the parameter design method includes:
acquiring the resistance value change range of a resistor to be simulated, and determining the resistance value resolution of the variable resistance simulation circuit;
determining parameter values of all devices in a fine tuning circuit in the variable resistance analog circuit based on the resistance value change range and the resistance value resolution of the resistor to be simulated, and determining an adjustable resistance value range of the fine tuning circuit in the variable resistance analog circuit;
and determining parameter values of all devices in a coarse tuning circuit in the analog circuit based on the resistance value change range of the resistor to be simulated and the adjustable resistance value range of the fine tuning circuit.
Further, the obtaining of the resistance value variation range of the resistor to be simulated and the determining of the resistance value resolution of the digital potentiometer in the variable resistance simulation circuit include:
acquiring a temperature resistance table of the resistor to be simulated, and determining the resistance value change range of the resistor to be simulated within a preset temperature range;
and determining the resistance resolution of the variable resistance analog circuit according to the acquired temperature resistance table and a preset temperature precision value.
Further, the determining the parameter values of each device in the fine tuning circuit in the variable resistance analog circuit and the adjustable resistance value range of the fine tuning circuit in the variable resistance analog circuit based on the resistance value variation range of the to-be-simulated resistor and the resistance value resolution includes:
determining the resistance value of a first resistor in the fine tuning circuit and the model selection parameter of the digital potentiometer based on the resistance value change range of the resistor to be simulated and the resistance value resolution;
and determining the adjustable resistance range of a fine tuning circuit in the analog circuit according to the resistance variation range of the resistor to be simulated and the model selection parameters of the digital potentiometer.
Further, the determining parameter values of each device in the coarse tuning circuit in the analog circuit based on the resistance value variation range of the resistor to be simulated and the adjustable resistance value range of the fine tuning circuit includes:
and determining the number of the resistance adjusting circuits in the coarse adjusting circuit and the resistance value of the second resistor in each resistance adjusting circuit based on the resistance value change range of the resistor to be simulated and the adjustable resistance value range of the fine adjusting circuit.
Further, the resistance value of the second resistor in each resistance adjusting circuit is an arbitrary value multiplied by 10.
According to the variable resistance analog circuit and the parameter design method of the variable resistance analog circuit, the variable resistance analog circuit comprises a fine tuning circuit, a coarse tuning circuit and a controller, wherein the controller is respectively connected with a first control end of the fine tuning circuit and a second control end of the coarse tuning circuit; the controller is used for controlling a transistor in a digital potentiometer of the fine adjustment circuit and a first switch and a second switch in the coarse adjustment circuit; the input end of the coarse tuning circuit is connected with the input end of the variable resistance simulation circuit, the output end of the coarse tuning circuit is connected with the input end of the fine tuning circuit, and the coarse tuning circuit is used for simulating the resistance value of the resistor to be simulated; the input end of the fine tuning circuit is connected with the output end of the coarse tuning circuit, the output end of the fine tuning circuit is connected with the output end of the variable resistance analog circuit, the input end of the fine tuning circuit is connected with the input end of the variable resistance analog circuit, and the fine tuning circuit is used for simulating the resistance value of the resistor to be simulated; the resistance range simulated by the fine tuning circuit is smaller than the resistance range simulated by the coarse tuning circuit.
Therefore, the variable resistance analog circuit is divided into the fine tuning circuit and the coarse tuning circuit, the resistance value of the resistor to be simulated is simulated through different circuits, the fine tuning circuit can finely adjust the resistance value of the variable resistance analog circuit, and therefore under the condition that the fine tuning circuit is combined with the coarse tuning circuit, the adjustment precision of the variable resistance analog circuit is improved, and the resistance value of the resistor to be simulated is simulated more accurately.
In order to make the aforementioned objects, features and advantages of the present application more comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained from the drawings without inventive effort.
Fig. 1 is a schematic structural diagram of a variable resistance analog circuit according to an embodiment of the present disclosure;
FIG. 2 is a schematic diagram of the fine tuning circuit shown in FIG. 1;
FIG. 3 is a schematic diagram of the coarse tuning circuit shown in FIG. 1;
fig. 4 is a flowchart of a parameter design method of a variable resistance analog circuit according to an embodiment of the present disclosure.
Reference numerals:
100: a variable resistance analog circuit; 110: a fine tuning circuit; 120: a coarse tuning circuit; 130: a controller; 111: a first resistor; 112: a digital potentiometer; 121: a resistance adjustment circuit; 1211: a first switch; 1212: a second switch; 1213: a second resistor.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all the embodiments. The components of the embodiments of the present application, generally described and illustrated in the figures herein, can be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. Every other embodiment that can be obtained by a person skilled in the art without making creative efforts based on the embodiments of the present application falls within the protection scope of the present application.
First, an application scenario to which the present application is applicable will be described. The application can be applied to the technical field of electronic circuits. The variable resistance simulation circuit is divided into a fine adjustment circuit and a coarse adjustment circuit, and the resistance value of the resistor to be simulated is simulated through different circuits, wherein the fine adjustment circuit can finely adjust the resistance value of the variable resistance simulation circuit, so that under the condition that the fine adjustment circuit is combined with the coarse adjustment circuit, the adjustment precision of the variable resistance simulation circuit is improved, and the resistance value of the resistor to be simulated is simulated more accurately.
Research shows that at present, a digital potentiometer is generally used for simulating the resistance value of a temperature-variable resistor and converting the resistance value signal of the temperature-variable resistor into an analog signal, and the adjustable minimum resistance value of a resistor network in the digital potentiometer is too large, namely the adjustment precision of the digital potentiometer is too large, so that the resistance value of the temperature-variable resistor cannot be accurately simulated.
Based on this, the embodiment of the application provides an analog circuit of a variable resistor, wherein a coarse tuning circuit and a fine tuning circuit are arranged in the analog circuit of the variable resistor, and the resistance value of a resistor to be simulated can be simulated more precisely by arranging the fine tuning circuit and the coarse tuning circuit in series.
Referring to fig. 1, fig. 1 is a schematic diagram of a variable resistance analog circuit according to an embodiment of the present disclosure. As shown in fig. 1, an embodiment of the present application provides a variable resistance analog circuit 100, including: a fine tuning circuit 110 and a coarse tuning circuit 120, and a controller 130 respectively connected to a first control terminal of the fine tuning circuit 110 and a second control terminal of the coarse tuning circuit 120; the controller 130 is configured to control a resistance value for adjusting the fine tuning circuit 110 and/or the coarse tuning circuit 120, and specifically, the resistance value of the fine tuning circuit 110 and/or the coarse tuning circuit 120 may be adjusted by adjusting a transistor of a digital potentiometer 112 in the fine tuning circuit 110 and a first switch 1211 and a second switch 1212 in the coarse tuning circuit 120; the input end of the coarse tuning circuit 120 is connected to the input end of the variable resistance analog circuit 100, the output end of the coarse tuning circuit 120 is connected to the input end of the fine tuning circuit 110, and the coarse tuning circuit 120 is used for simulating the resistance value of the resistor to be simulated; the input end of the fine tuning circuit 110 is connected to the output end of the coarse tuning circuit 120, the output end of the fine tuning circuit 110 is connected to the output end of the variable resistance analog circuit 100, the input end of the fine tuning circuit 110 is connected to the input end of the variable resistance analog circuit 100, and the fine tuning circuit 110 is used for simulating the resistance value of the resistor to be simulated; the simulated resistance range of the fine tuning circuit 110 is smaller than the simulated resistance range of the coarse tuning circuit 120.
Specifically, the controller 130 in the variable resistance analog circuit 100 can adjust the resistance of the fine tuning circuit 110 and/or the coarse tuning circuit 120, and specifically, the controller 130 simulates resistors with different resistances by adjusting the opening and closing of the CMOS transistor in the digital potentiometer 112 and the opening and closing of the first switch 1211 and the second switch 1212 in the coarse tuning circuit 120.
Referring to fig. 2, fig. 2 is a schematic diagram of the fine tuning circuit shown in fig. 1. As shown in fig. 2, the fine adjustment circuit 110 includes: a first resistor 111 and a digital potentiometer 112; the input end of the first resistor 111 is connected to the input end of the digital potentiometer 112 and the input end of the fine tuning circuit 110, and the output end of the first resistor 111 is connected to the output end of the digital potentiometer 112 and the output end of the fine tuning circuit 110.
In this step, the first resistor 111 is connected in parallel with the digital potentiometer 112, so that the adjustment precision of the fine adjustment circuit 110 can be changed, and the resistance value of the resistor to be simulated can be simulated more accurately.
The first resistor 111 is a precision resistor. The precision resistor refers to a resistor with indexes such as resistance value error of the resistor, thermal stability (temperature coefficient) of the resistor, distribution parameters (distributed capacitance and distributed inductance) of the resistor and the like reaching a certain standard.
Referring to fig. 3, fig. 3 is a schematic structural diagram of the coarse tuning circuit shown in fig. 1. As shown in fig. 3, the coarse tuning circuit 120 includes at least one resistance adjusting circuit 121 arranged in series; an input end of a first resistance adjusting circuit 121 in the coarse tuning circuit 120 is connected to an input end of the coarse tuning circuit 120, and an output end of a last resistance adjusting circuit 121 in the coarse tuning circuit 120 is connected to an output end of the coarse tuning circuit 120.
Specifically, the coarse tuning circuit 120 includes at least one resistance adjusting circuit 121, the resistance adjusting circuits 121 are connected in series, an input end of a first resistance adjusting circuit 121 of the at least one resistance adjusting circuit 121 is connected to an input end of the coarse tuning circuit 120, and an output end of a last resistance adjusting circuit 121 of the at least one resistance adjusting circuit 121 is connected to an output end of the coarse tuning circuit 120, so as to form a complete coarse tuning circuit 120 for roughly simulating a resistance value of a resistance to be simulated.
Further, referring to fig. 4, fig. 4 is a schematic structural diagram of the resistance adjusting circuit shown in fig. 3. As shown in fig. 4, the resistance adjustment circuit 121 includes: a first switch 1211, a second switch 1212, and a second resistor 1213; the input end of the first switch 1211 is connected to the input end of the resistance adjustment circuit 121 and the input end of the second switch 1212, the output end of the first switch 1211 is connected to the input end of the second resistor 1213, and the output end of the second switch 1212 is connected to the output end of the second resistor 1213 and the output end of the resistance adjustment circuit 121.
Wherein the second resistor 1213 is a precision resistor. The precision resistor refers to a resistor with indexes such as resistance value error of the resistor, thermal stability (temperature coefficient) of the resistor, distribution parameters (distributed capacitance and distributed inductance) of the resistor and the like reaching a certain standard.
According to the variable resistance analog circuit provided by the embodiment of the application, the variable resistance analog circuit comprises a fine tuning circuit, a coarse tuning circuit and a controller, wherein the controller is respectively connected with a first control end of the fine tuning circuit and a second control end of the coarse tuning circuit; the controller is used for controlling a transistor in a digital potentiometer of the fine adjustment circuit and a first switch and a second switch in the coarse adjustment circuit; the input end of the coarse tuning circuit is connected with the input end of the variable resistance simulation circuit, the output end of the coarse tuning circuit is connected with the input end of the fine tuning circuit, and the coarse tuning circuit is used for simulating the resistance value of the resistor to be simulated; the input end of the fine tuning circuit is connected with the output end of the coarse tuning circuit, the output end of the fine tuning circuit is connected with the output end of the variable resistance analog circuit, the input end of the fine tuning circuit is connected with the input end of the variable resistance analog circuit, and the fine tuning circuit is used for simulating the resistance value of the resistor to be simulated; the resistance range simulated by the fine tuning circuit is smaller than the resistance range simulated by the coarse tuning circuit.
Therefore, the variable resistance analog circuit is divided into the fine tuning circuit and the coarse tuning circuit, the resistance value of the resistor to be simulated is simulated through different circuits, the fine tuning circuit can finely adjust the resistance value of the variable resistance analog circuit, and therefore under the condition that the fine tuning circuit is combined with the coarse tuning circuit, the adjustment precision of the variable resistance analog circuit is improved, and the resistance value of the resistor to be simulated is simulated more accurately.
Referring to fig. 4, fig. 4 is a flowchart of a parameter design method of a variable resistance analog circuit according to an embodiment of the present application. As shown in fig. 4, a method for designing parameters of a variable resistance analog circuit provided in an embodiment of the present application includes:
s401, obtaining the resistance value change range of the resistor to be simulated, and determining the resistance value resolution of the variable resistor simulation circuit.
In this step, the resistance to be simulated is a temperature-variable resistor, the resistance of the temperature-variable resistor changes with the change of temperature, and the resistance change range of the resistance to be simulated is obtained according to the external temperature change condition, for example, the resistance of the temperature-variable resistor PT100 at-50 ℃ is 80.31 Ω, and the resistance of the resistance at +250 ℃ is 197.35 Ω, and the resistance resolution of the variable resistance simulation circuit to be designed is determined.
The resistance resolution refers to the resistance which can be increased or decreased by adjusting the variable resistance analog circuit once, for example, the resolution is 0.18 Ω, that is, in the variable resistance analog circuit, the resistance which can be increased or decreased by 0.18 Ω is adjusted once.
S402, determining parameter values of all devices in a fine tuning circuit in the variable resistance analog circuit of the digital potentiometer circuit based on the resistance value change range of the resistor to be simulated and the resistance value resolution, and determining the adjustable resistance value range of the fine tuning circuit in the variable resistance analog circuit of the digital potentiometer circuit.
In the step, according to the obtained resistance value change range of the resistor to be simulated and the determined resistance value resolution, the parameter values of all devices in the fine tuning circuit in the variable resistance simulation circuit are determined, and the resistance value range of the variable resistor which can be simulated by the fine tuning circuit, namely the adjustable resistance value range of the fine tuning circuit, is determined.
Specifically, the minimum value of the adjustable resistance value range of the fine tuning circuit is determined according to the minimum value of the resistance value in the resistance value change range of the resistor to be simulated, for example, the resistance value corresponding to the temperature-variable resistor PT100 at-50 ℃ is 80.31 Ω, and then the minimum value of the adjustable resistance value range of the fine tuning circuit needs to be less than 80.31 Ω, and can be 80 Ω; and then, according to the resistance resolution and the minimum value of the adjustable resistance range, calculating and determining the maximum value of the adjustable resistance range of the fine tuning circuit, the parameter value of a digital potentiometer in the fine tuning circuit and the parameter value of a first resistor in the fine tuning circuit.
The parameter values of the digital potentiometer comprise the model, the tap number, the resistance value and the like of the digital potentiometer.
The parameter values of the first resistor are resistance value, temperature coefficient and the like, and in addition, the first resistor is a precision resistor. The precision resistor refers to a resistor with indexes such as resistance value error of the resistor, thermal stability (temperature coefficient) of the resistor, distribution parameters (distributed capacitance and distributed inductance) of the resistor and the like reaching a certain standard.
And S403, determining parameter values of each device in the coarse tuning circuit in the analog circuit based on the resistance value change range of the resistor to be simulated and the adjustable resistance value range of the fine tuning circuit.
In this step, first, according to the adjustable resistance range of the fine tuning circuit, the maximum resistance value that needs to be simulated in the coarse tuning circuit is determined, for example, the range that can be simulated in the fine tuning circuit is 80 Ω to 90 Ω, for the PT100 temperature-variable resistor, the resistance value that needs to be simulated is 80.31 Ω to 197.35 Ω, and the fine tuning circuit can simulate only the 80 Ω to 90 Ω resistor, so that it is desired to simulate a 197.35 Ω resistor, and it is also necessary to simulate 197.35 Ω to 107.35 Ω, that is, the maximum resistance value that needs to be simulated by the coarse tuning circuit is 107.35 Ω, so that the resistance value of each second resistor in the coarse tuning circuit is determined according to the determined maximum resistance value that needs to be simulated by the coarse tuning circuit.
In the coarse tuning circuit, the resistance values of the second resistors are different, and the difference value of the resistance values of every two second resistors is a multiple of 10.
Wherein, the second resistor can be a precision resistor.
Further, step S401 includes: acquiring a temperature resistance table of the resistor to be simulated, and determining the resistance value change range of the resistor to be simulated within a preset temperature range; and determining the resistance resolution of the variable resistance analog circuit according to the acquired temperature resistance table and a preset temperature precision value.
In the step, a temperature resistance value table of the resistor to be simulated is obtained, the resistance values of the resistor to be simulated at different temperatures are indicated in the temperature resistance value table, the resistance value change range of the resistor to be simulated in a preset temperature range is determined, and the resistance value resolution of the variable resistance simulation circuit is calculated and determined according to the determined resistance value change range of the resistor to be simulated and the preset adjusting temperature precision value of the variable resistance simulation circuit.
The temperature precision value means that the variable resistance analog circuit can adjust the self-simulated resistance value according to the change of the temperature every time the temperature increases or decreases by a preset degree, for example, the temperature precision value is 0.5 ℃, that is, when the temperature of the variable resistance analog circuit increases or decreases by 0.5 ℃, the variable resistance analog circuit can adjust the self-simulated resistance value.
Further, S402 includes: determining the resistance value of a first resistor in the fine tuning circuit and the model selection parameter of the digital potentiometer based on the resistance value change range of the resistor to be simulated and the resistance value resolution; and determining the adjustable resistance range of a fine tuning circuit in the analog circuit according to the resistance variation range of the resistor to be simulated and the model selection parameters of the digital potentiometer.
Determining the minimum value in the resistance value change range of the resistor to be simulated according to the determined resistance value change range of the resistor to be simulated, determining the minimum value of the adjustable resistance value range of the fine tuning circuit based on the minimum value in the resistance value change range, wherein the adjustable resistance value range of the fine tuning circuit is smaller than the minimum value in the resistance value change range of the resistor to be simulated, determining the model selection parameter of the digital potentiometer suitable for the resistor to be simulated according to the resistance value change range of the resistor to be simulated and the resistance value resolution of the variable resistance simulation circuit, and determining the resistance value of the first resistor in the fine tuning circuit according to the model selection parameter of the digital potentiometer; and then determining the maximum value of the adjustable resistance range of the fine tuning resistor in the variable circuit according to the resistance value change range of the resistor to be simulated and the model selection parameters of the digital potentiometer, thereby determining the adjustable resistance range of the fine tuning circuit.
Corresponding to the embodiment, the minimum resistance value of the resistor to be simulated is 80.31 Ω, so that the minimum value of the adjustable resistance value range of the fine tuning circuit is less than 80.31 Ω, and then 80 Ω is obtained, the model selection parameter of the digital potentiometer is determined according to the minimum value of the adjustable resistance value range and the preset adjustment temperature precision value, here, the AD8400 digital potentiometer with 256 taps and 1K Ω is selected and used, and then the adjustable resistance value range of the fine tuning circuit is determined to be 80 Ω -90 Ω according to the model selection parameter of the digital potentiometer and the resistance value change range of the resistor to be simulated, so that the preset adjustment precision can be met.
Further, S403 includes: and determining the number of the resistance adjusting circuits in the coarse adjusting circuit and the resistance value of the second resistor in each resistance adjusting circuit based on the resistance value change range of the resistor to be simulated and the adjustable resistance value range of the fine adjusting circuit.
In the step, the maximum resistance value to be simulated by the coarse tuning circuit is determined according to the determined resistance value change range of the resistor to be simulated and the adjustable resistance value range of the fine tuning circuit, and the number of the resistor adjusting circuits required in the coarse tuning circuit and the resistance value of the second resistor in each resistor adjusting circuit are determined according to the maximum resistance value to be simulated by the coarse tuning circuit.
The resistance of the second resistor in each resistor adjusting circuit is different and is an arbitrary value which is multiplied by 10.
Corresponding to the above embodiment, the coarse tuning circuit needs to simulate a maximum resistance value of 107.35 Ω, and according to this maximum resistance value, it can be determined that a 107.35 Ω resistor is to be simulated, and 10 Ω, 20 Ω, 40 Ω, and 80 Ω second resistors are needed, so that a 107.35 Ω resistor can be simulated by connecting the second resistors in series and arranging the second resistors.
The parameter design method of the variable resistance analog circuit provided by the embodiment of the application comprises the following steps: acquiring the resistance value change range of a resistor to be simulated, and determining the resistance value resolution of the variable resistance simulation circuit; determining parameter values of all devices in a fine tuning circuit in the variable resistance analog circuit based on the resistance value change range and the resistance value resolution of the resistor to be simulated, and determining an adjustable resistance value range of the fine tuning circuit in the variable resistance analog circuit; and determining parameter values of all devices in a coarse tuning circuit in the analog circuit based on the resistance value change range of the resistor to be simulated and the adjustable resistance value range of the fine tuning circuit.
Therefore, the parameter values of each device in the fine tuning circuit and the coarse tuning circuit in the variable resistance analog circuit are determined according to the resistance value change range of the resistor to be simulated and the determined resistance value resolution ratio of the variable resistance analog circuit, so that under the condition that the fine tuning circuit is combined with the coarse tuning circuit, the adjustment precision of the variable resistance analog circuit is improved, and the resistance value of the resistor to be simulated is simulated more accurately.
Finally, it should be noted that: the above-mentioned embodiments are only specific embodiments of the present application, and are used for illustrating the technical solutions of the present application, but not limiting the same, and the scope of the present application is not limited thereto, and although the present application is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: any person skilled in the art can modify or easily conceive the technical solutions described in the foregoing embodiments or equivalent substitutes for some technical features within the technical scope disclosed in the present application; such modifications, changes or substitutions do not depart from the spirit and scope of the exemplary embodiments of the present application, and are intended to be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A variable resistance analog circuit is characterized by comprising a fine adjustment circuit, a coarse adjustment circuit and a controller, wherein the controller is respectively connected with a first control end of the fine adjustment circuit and a second control end of the coarse adjustment circuit;
the controller is used for adjusting the resistance value of the fine adjustment circuit and/or the coarse adjustment circuit;
the input end of the coarse tuning circuit is connected with the input end of the variable resistance simulation circuit, the output end of the coarse tuning circuit is connected with the input end of the fine tuning circuit, and the coarse tuning circuit is used for simulating the resistance value of the resistor to be simulated;
the input end of the fine tuning circuit is connected with the output end of the coarse tuning circuit, the output end of the fine tuning circuit is connected with the output end of the variable resistance analog circuit, the input end of the fine tuning circuit is connected with the input end of the variable resistance analog circuit, and the fine tuning circuit is used for simulating the resistance value of the resistor to be simulated; the resistance range simulated by the fine tuning circuit is smaller than the resistance range simulated by the coarse tuning circuit.
2. The variable resistance analog circuit of claim 1, wherein the fine tuning circuit comprises: a first resistor and a digital potentiometer;
the input end of the first resistor is connected with the input end of the digital potentiometer and the input end of the fine adjustment circuit respectively, and the output end of the first resistor is connected with the output end of the digital potentiometer and the output end of the fine adjustment circuit respectively.
3. The variable resistance analog circuit of claim 1, wherein the coarse tuning circuit comprises at least one resistance adjusting circuit arranged in series;
the input end of the first resistance adjusting circuit in the coarse adjusting circuit is connected with the input end of the coarse adjusting circuit, and the output end of the last resistance adjusting circuit in the coarse adjusting circuit is connected with the input end and the output end of the coarse adjusting circuit.
4. The variable resistance analog circuit according to claim 3, wherein the resistance adjusting circuit comprises: the circuit comprises a first switch, a second switch and a second resistor;
the input end of the first switch is respectively connected with the input end of the resistance adjusting circuit and the input end of the second switch, the output end of the first switch is connected with the input end of the second resistor, and the output end of the second switch is respectively connected with the output end of the second resistor and the output end of the resistance adjusting circuit.
5. A variable resistance analog circuit according to claim 4, wherein the first switch is an analog switch and/or an electronic relay; the second switch is an analog switch and/or an electronic relay.
6. A parameter design method for a variable resistance analog circuit, wherein the parameter design method is applied to the variable resistance analog circuit of any one of claims 1 to 5, and the parameter design method comprises:
acquiring the resistance value change range of a resistor to be simulated, and determining the resistance value resolution of the variable resistance simulation circuit;
determining parameter values of all devices in a fine tuning circuit in the variable resistance analog circuit based on the resistance value change range and the resistance value resolution of the resistor to be simulated, and determining an adjustable resistance value range of the fine tuning circuit in the variable resistance analog circuit;
and determining parameter values of all devices in a coarse tuning circuit in the analog circuit based on the resistance value change range of the resistor to be simulated and the adjustable resistance value range of the fine tuning circuit.
7. The parameter design method according to claim 6, wherein the obtaining of the resistance value variation range of the resistor to be simulated and the determining of the resistance value resolution of the variable resistance simulation circuit comprise:
acquiring a temperature resistance table of the resistor to be simulated, and determining the resistance value change range of the resistor to be simulated within a preset temperature range;
and determining the resistance value resolution in the variable resistance analog circuit according to the acquired temperature resistance value table and a preset temperature precision value.
8. The parameter design method according to claim 6, wherein the determining the parameter values of each device in the fine tuning circuit in the variable resistance analog circuit and the determining the adjustable resistance range of the fine tuning circuit in the variable resistance analog circuit based on the resistance value variation range and the resistance value resolution of the resistor to be simulated comprises:
determining the resistance value of a first resistor in the fine tuning circuit and the model selection parameter of the digital potentiometer based on the resistance value change range of the resistor to be simulated and the resistance value resolution;
and determining the adjustable resistance range of a fine tuning circuit in the analog circuit according to the resistance variation range of the resistor to be simulated and the model selection parameters of the digital potentiometer.
9. The parameter design method according to claim 6, wherein the determining the parameter values of each device in the coarse tuning circuit in the analog circuit based on the resistance variation range of the resistor to be simulated and the adjustable resistance range of the fine tuning circuit comprises:
and determining the number of the resistance adjusting circuits in the coarse adjusting circuit and the resistance value of the second resistor in each resistance adjusting circuit based on the resistance value change range of the resistor to be simulated and the adjustable resistance value range of the fine adjusting circuit.
10. The parameter design method according to claim 9, wherein the resistance value of the second resistor in each of the resistor adjusting circuits is an arbitrary value multiplied by 10.
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