CN111007350A - Multifunctional instrument control automatic test system and method thereof - Google Patents
Multifunctional instrument control automatic test system and method thereof Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention discloses a multifunctional instrument control automatic test system and a method thereof, and the system comprises a microwave solid-state power amplifier, an automatic combination test system and a test instrument, wherein the automatic combination test system controls the access of the test instrument, the test instrument is connected with the microwave solid-state power amplifier, and a plurality of test instruments can be simultaneously accessed through a transfer switch; the automatic combined test system is used for carrying out single index measurement or integrated system test, and can also select at most 8 external devices for automatic test, and test data and test processes are stored in a computer through text or excel; the test instrument comprises a peak power meter, an oscilloscope, a frequency spectrograph, a programmable direct current power supply, a signal source and a pulse signal generator; the invention can quickly connect and test the microwave solid-state power amplifier complete machine with the same design index, reduces the development of a tool control box, and saves the company cost and the product time period.
Description
Technical Field
The invention relates to the technical field of automatic test systems, in particular to a multifunctional instrument control automatic test system and a method thereof.
Background
With the rapid development of science and technology and the complication of international situation, the demand of various microwave solid-state power amplifiers is greatly increased, performance index testing and environmental testing of the solid-state power amplifiers in the production process are important links in the manufacturing field of the microwave industry, whether a tested object achieves an initial design target or not is judged through the testing and the testing, and therefore the testing of the solid-state power amplifiers is more and more emphasized by various companies and scientific research institutions.
The microwave solid-state power amplifier is not only a precise electronic device, but also high in manufacturing cost, the whole testing link of the current solid-state power amplifier is a labor-intensive production mode, the testing wiring is complex, the requirement on the power-on time sequence is strict, once a product is directly damaged by mistake in the operation process, the maintenance cost is high, the reproduction period is long, the psychological pressure of testers is increased, and the production efficiency is restricted.
At present, the automatic test of the microwave solid-state power amplifier is basically a set of system test model in China, the current system can not be used for testing other models, the transportability is poor, the software development cost is high, if the number of test products is limited, the cost can be greatly improved by developing a set of test system, and the cost is not as high as the cost of manual test. For most companies, the number of microwave solid-state power amplifiers in a single model is not large, more workers are needed for manual testing, the environmental test consumes more time, the test data processing workload is large, if one set of automatic test system capable of aiming at different models of products is available, the working efficiency can be greatly improved, the automatic test system can work uninterruptedly for a long time, and the environmental test consumption can be greatly reduced. Through the control direct test to the instrument, can also reduce the development of frock control box, practice thrift company's cost and product time cycle.
Disclosure of Invention
The invention aims to: the system and the method can be used for quickly connecting and testing the microwave solid-state power amplifier complete machine with the same design index, reduce the development of a tool control box, and save the company cost and the product time period.
The technical scheme adopted by the invention is as follows:
a multifunctional instrument control automatic test system comprises a microwave solid-state power amplifier, an automatic combination test system and a test instrument, wherein the automatic combination test system controls the access of the test instrument, the test instrument is connected with the microwave solid-state power amplifier, and a plurality of test instruments can be simultaneously accessed through a transfer switch; the automatic combined test system is used for carrying out single index measurement or integrated system test, and can also select at most 8 external devices for automatic test, and test data and test processes are stored in a computer through text or excel; the test instrument comprises a peak power meter, an oscilloscope, a frequency spectrograph, a programmable direct current power supply, a signal source and a pulse signal generator; the automatic combination test system is a test program installed on a computer and comprises a pulse generator output parameter setting module, a signal source output parameter setting module, a power output parameter setting module, an oscilloscope reading data parameter setting module, a power meter reading data parameter setting module, a frequency spectrograph reading data parameter setting module, a pulse generator opening module, a signal source opening module, a power source opening module, an oscilloscope reading module, a power meter reading module, a frequency spectrograph reading module, a pulse generator closing module, a signal source closing module, a power source closing module, a data recording module and a test process recording module;
the pulse generator output parameter setting module is connected with the signal source output parameter setting module, and the signal source output parameter setting module is connected with the power output parameter setting module;
the power output parameter setting module is respectively connected with the oscilloscope read data parameter setting module, the power meter read data parameter setting module and the spectrometer read data parameter setting module;
the oscilloscope read data parameter setting module, the power meter read data parameter setting module and the spectrometer read data parameter setting module are all connected with the pulse generator mold opening block, the pulse generator mold opening block is connected with the signal source mold opening block, and the signal source mold opening block is connected with the power supply mold opening block;
the power supply open module is respectively connected with the oscilloscope reading module, the power meter reading module and the spectrometer reading module, the oscilloscope reading module, the power meter reading module and the spectrometer reading module are respectively connected with the pulse generator close module, the pulse generator close module is connected with the signal source close module, and the signal source close module is connected with the power supply close module;
and the power supply switch module is respectively connected with the data recording module and the test process recording module.
Further, the test instrument is controlled through a GPIB communication port.
Further, the setting parameters of the pulse generator output parameter setting module comprise a period and a bias pulse width; the setting parameters of the signal source output parameter setting module comprise frequency; the setting parameters of the power output parameter setting module comprise voltage and bias voltage; the setting parameters of the power meter reading data parameter setting module comprise a time period and a reading position; the setting parameters of the frequency spectrograph read data parameter setting module comprise a discrete spectrum, a modulation depth and a phase noise; the setting parameters of the oscilloscope read data parameter setting module comprise voltage amplitude, time scale and trigger level.
A multifunctional instrument control automatic test method comprises the following steps:
(1) connecting a plurality of test instruments with a microwave solid-state power amplifier;
(2) setting the period and the bias pulse width of a pulse generator, setting the frequency and the intensity of a signal source, and setting the voltage and the current limiting value of a programmable direct-current power supply;
(3) then, continuously setting the data reading modes and parameters of the oscilloscope, the power meter and the spectrometer;
(4) sequentially turning on a signal source, a pulse generator and a programmable direct current power supply, and reading data;
(5) and closing the programmable direct current power supply, storing data, saving a test record and finishing the test, wherein the data is stored in the computer in a text or excel form.
Further, the parameters of the spectrometer in the step (3) include discrete spectrum, modulation depth and phase noise.
Furthermore, before the step (1), the number of the frequency points to be tested is set on a software interface, and the frequency of the frequency points is set according to the sequence, so that the continuous test of a plurality of frequency points can be completed.
Further, after the step (5) is completed, if the test index does not meet the requirement, the mark is displayed in a red mark in the test process, so that the subsequent check is facilitated; wherein, the abnormal reading of the current or power meter can carry out automatic power-off protection in the test process.
In summary, due to the adoption of the technical scheme, the invention has the beneficial effects that:
1. a multifunctional instrument control automatic test system and a method thereof can quickly connect and test the whole microwave solid-state power amplifier with the same design index, reduce the development of a tool control box, and save the company cost and the product time period.
2. The invention can greatly improve the working efficiency, can work uninterruptedly for a long time and can greatly save the time consumed by environmental test.
Drawings
The invention will now be described, by way of example, with reference to the accompanying drawings, in which:
FIG. 1 is a flow chart of the operation of a multi-function instrument controlled automatic test system and method thereof;
FIG. 2 is a block schematic of the present invention;
Detailed Description
All of the features disclosed in this specification, or all of the steps in any method or process so disclosed, may be combined in any combination, except combinations of features and/or steps that are mutually exclusive.
The present invention will be described in detail with reference to fig. 1 to 2.
Example 1
As shown in fig. 1 to 2, an automatic testing system controlled by a multifunctional instrument includes a microwave solid-state power amplifier, an automatic combination testing system and a testing instrument, wherein the automatic combination testing system controls the access of the testing instrument, the testing instrument is connected with the microwave solid-state power amplifier, and a plurality of testing instruments can be simultaneously accessed through a transfer switch; the automatic combined test system is used for carrying out single index measurement or integrated system test, and can also select at most 8 external devices for automatic test, and test data and test processes are stored in a computer through text or excel; the test instrument comprises a peak power meter, an oscilloscope, a frequency spectrograph, a programmable direct current power supply, a signal source and a pulse signal generator; the automatic combination test system is a test program installed on a computer and comprises a pulse generator output parameter setting module, a signal source output parameter setting module, a power output parameter setting module, an oscilloscope reading data parameter setting module, a power meter reading data parameter setting module, a frequency spectrograph reading data parameter setting module, a pulse generator opening module, a signal source opening module, a power source opening module, an oscilloscope reading module, a power meter reading module, a frequency spectrograph reading module, a pulse generator closing module, a signal source closing module, a power source closing module, a data recording module and a test process recording module;
the pulse generator output parameter setting module is connected with the signal source output parameter setting module, and the signal source output parameter setting module is connected with the power output parameter setting module;
the power output parameter setting module is respectively connected with the oscilloscope read data parameter setting module, the power meter read data parameter setting module and the spectrometer read data parameter setting module;
the oscilloscope read data parameter setting module, the power meter read data parameter setting module and the spectrometer read data parameter setting module are all connected with the pulse generator mold opening block, the pulse generator mold opening block is connected with the signal source mold opening block, and the signal source mold opening block is connected with the power supply mold opening block;
the power supply open module is respectively connected with the oscilloscope reading module, the power meter reading module and the spectrometer reading module, the oscilloscope reading module, the power meter reading module and the spectrometer reading module are respectively connected with the pulse generator close module, the pulse generator close module is connected with the signal source close module, and the signal source close module is connected with the power supply close module;
and the power supply switch module is respectively connected with the data recording module and the test process recording module.
Example 2
As shown in fig. 1 to 2, the present embodiment is different from embodiment 1 in that a method for controlling and automatically testing a multifunctional apparatus includes the following steps: (1) connecting a plurality of test instruments with a microwave solid-state power amplifier; (2) setting the period and the bias pulse width of a pulse generator, setting the frequency and the intensity of a signal source, and setting the voltage and the current limiting value of a programmable direct-current power supply; (3) then, continuously setting the data reading modes and parameters of the oscilloscope, the power meter and the spectrometer; (4) sequentially turning on a signal source, a pulse generator and a programmable direct current power supply, and reading data; (5) and closing the programmable direct current power supply, storing data, saving a test record and finishing the test, wherein the data is stored in the computer in a text or excel form.
The above description is only a preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be made by those skilled in the art without inventive work within the technical scope of the present invention are included in the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope defined by the claims.
Claims (7)
1. The utility model provides a multi-functional instrument control automatic test system which characterized in that: the automatic combination test system controls the access of the test instrument, the test instrument is connected with the microwave solid-state power amplifier, and a plurality of test instruments can be simultaneously accessed through the transfer switch; the automatic combined test system is used for carrying out single index measurement or integrated system test, and can also select at most 8 external devices for automatic test, and test data and test processes are stored in a computer through text or excel; the test instrument comprises a peak power meter, an oscilloscope, a frequency spectrograph, a programmable direct current power supply, a signal source and a pulse signal generator; the automatic combination test system is a test program installed on a computer and comprises a pulse generator output parameter setting module, a signal source output parameter setting module, a power output parameter setting module, an oscilloscope reading data parameter setting module, a power meter reading data parameter setting module, a frequency spectrograph reading data parameter setting module, a pulse generator opening module, a signal source opening module, a power source opening module, an oscilloscope reading module, a power meter reading module, a frequency spectrograph reading module, a pulse generator closing module, a signal source closing module, a power source closing module, a data recording module and a test process recording module;
the pulse generator output parameter setting module is connected with the signal source output parameter setting module, and the signal source output parameter setting module is connected with the power output parameter setting module;
the power output parameter setting module is respectively connected with the oscilloscope read data parameter setting module, the power meter read data parameter setting module and the spectrometer read data parameter setting module;
the oscilloscope read data parameter setting module, the power meter read data parameter setting module and the spectrometer read data parameter setting module are all connected with the pulse generator mold opening block, the pulse generator mold opening block is connected with the signal source mold opening block, and the signal source mold opening block is connected with the power supply mold opening block;
the power supply open module is respectively connected with the oscilloscope reading module, the power meter reading module and the spectrometer reading module, the oscilloscope reading module, the power meter reading module and the spectrometer reading module are respectively connected with the pulse generator close module, the pulse generator close module is connected with the signal source close module, and the signal source close module is connected with the power supply close module;
and the power supply switch module is respectively connected with the data recording module and the test process recording module.
2. The multifunctional instrument control automatic test system according to claim 1, characterized in that: the test instrument is controlled through a GPIB communication port.
3. The multifunctional instrument control automatic test system according to claim 1, characterized in that: the setting parameters of the pulse generator output parameter setting module comprise a period and a bias pulse width; the setting parameters of the signal source output parameter setting module comprise frequency; the setting parameters of the power output parameter setting module comprise voltage and bias voltage; the setting parameters of the power meter reading data parameter setting module comprise a time period and a reading position; the setting parameters of the frequency spectrograph read data parameter setting module comprise a discrete spectrum, a modulation depth and a phase noise; the setting parameters of the oscilloscope read data parameter setting module comprise voltage amplitude, time scale and trigger level.
4. A multifunctional instrument control automatic test method is characterized by comprising the following steps:
(1) connecting a plurality of test instruments with a microwave solid-state power amplifier;
(2) setting the period and the bias pulse width of a pulse generator, setting the frequency and the intensity of a signal source, and setting the voltage and the current limiting value of a programmable direct-current power supply;
(3) then, continuously setting the data reading modes and parameters of the oscilloscope, the power meter and the spectrometer;
(4) sequentially turning on a signal source, a pulse generator and a programmable direct current power supply, and reading data;
(5) and closing the programmable direct current power supply, storing data, saving a test record and finishing the test, wherein the data is stored in the computer in a text or excel form.
5. The multifunctional instrument control automatic test method according to claim 4, characterized in that: the parameters of the spectrometer in the step (3) comprise discrete spectrum, modulation depth and phase noise.
6. The multifunctional instrument control automatic test method according to claim 4, characterized in that: before the step (1), the number of the frequency points to be tested is set on a software interface, and the frequency of the frequency points is set according to the sequence, so that the continuous test of a plurality of frequency points can be completed.
7. The multifunctional instrument control automatic test method according to claim 4, characterized in that: after the step (5) is finished, if the test index does not meet the requirement, the mark is displayed in a red mark in the test process, so that the subsequent check is facilitated; wherein, the abnormal reading of the current or power meter can carry out automatic power-off protection in the test process.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113804992A (en) * | 2020-06-16 | 2021-12-17 | 普源精电科技股份有限公司 | Test function module, multifunctional test system and method |
| CN114487652A (en) * | 2021-12-30 | 2022-05-13 | 北京航天测控技术有限公司 | Fault verification method for long-term power-on equipment |
| CN114636911A (en) * | 2022-03-23 | 2022-06-17 | 汕头市瑞升电子有限公司 | Varistor automatic test system and test method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5617238A (en) * | 1993-02-04 | 1997-04-01 | International Business Machines Corporation | Automated system, and corresponding method, for measuring transmitter duty cycle distortion of electro-optic modules |
| CN103499755A (en) * | 2013-09-26 | 2014-01-08 | 工业和信息化部电子第五研究所 | Automatic testing method and automatic testing device for parameters of microwave oscillator |
| CN107733539A (en) * | 2017-08-21 | 2018-02-23 | 西安空间无线电技术研究所 | A kind of spaceborne multichannel microwave receiver frequency converter test system |
| CN108470232A (en) * | 2018-01-25 | 2018-08-31 | 南京第五十五所技术开发有限公司 | The automatic detecting and analysing system of microwave components based on flow and method |
| CN109302713A (en) * | 2018-10-28 | 2019-02-01 | 西南电子技术研究所（中国电子科技集团公司第十研究所） | Height covering RF index automatic test device |
-
2019
- 2019-12-23 CN CN201911338590.8A patent/CN111007350A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5617238A (en) * | 1993-02-04 | 1997-04-01 | International Business Machines Corporation | Automated system, and corresponding method, for measuring transmitter duty cycle distortion of electro-optic modules |
| CN103499755A (en) * | 2013-09-26 | 2014-01-08 | 工业和信息化部电子第五研究所 | Automatic testing method and automatic testing device for parameters of microwave oscillator |
| CN107733539A (en) * | 2017-08-21 | 2018-02-23 | 西安空间无线电技术研究所 | A kind of spaceborne multichannel microwave receiver frequency converter test system |
| CN108470232A (en) * | 2018-01-25 | 2018-08-31 | 南京第五十五所技术开发有限公司 | The automatic detecting and analysing system of microwave components based on flow and method |
| CN109302713A (en) * | 2018-10-28 | 2019-02-01 | 西南电子技术研究所（中国电子科技集团公司第十研究所） | Height covering RF index automatic test device |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113804992A (en) * | 2020-06-16 | 2021-12-17 | 普源精电科技股份有限公司 | Test function module, multifunctional test system and method |
| CN114487652A (en) * | 2021-12-30 | 2022-05-13 | 北京航天测控技术有限公司 | Fault verification method for long-term power-on equipment |
| CN114636911A (en) * | 2022-03-23 | 2022-06-17 | 汕头市瑞升电子有限公司 | Varistor automatic test system and test method |
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Application publication date: 20200414 |