CN110987970A - Object surface defect detection system and detection method - Google Patents
Object surface defect detection system and detection method Download PDFInfo
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- 230000007547 defect Effects 0.000 title claims abstract description 43
- 238000001514 detection method Methods 0.000 title claims abstract description 42
- 238000000034 method Methods 0.000 claims description 14
- 230000001154 acute effect Effects 0.000 claims description 3
- 238000005286 illumination Methods 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000005498 polishing Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8809—Adjustment for highlighting flaws
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
- G01N2021/8825—Separate detection of dark field and bright field
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8835—Adjustable illumination, e.g. software adjustable screen
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- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8838—Stroboscopic illumination; synchronised illumination
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8841—Illumination and detection on two sides of object
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06186—Resistance heated; wire sources; lamelle sources
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Abstract
The invention relates to an object surface defect detection system, which belongs to the field of product detection and comprises a stroboscopic light source lighting device, an image acquisition device, image processing equipment and a controller, wherein the controller is connected with the stroboscopic light source lighting device, the image acquisition device and the image processing equipment, and the stroboscopic light source lighting device is arranged above the surface to be detected of an object to be detected and used for providing a light source for setting a control time sequence for the object to be detected.
Description
Technical Field
The invention relates to the field of product detection, in particular to a system and a method for detecting surface defects of an object.
Background
At present, the detection of the defects of the smooth surfaces of various products almost adopts a manual detection method assisted by tools such as a microscope, a magnifier and the like. However, this manual detection method has disadvantages and limitations: because human eyes detect defects under strong light, the efficiency is low, the human eyes are easy to be tired to cause wrong judgment or missed detection, in addition, the manual detection is also easy to be influenced by subjective factors, the detection results of people with different eyesight have larger difference, and the unified judgment standard is difficult to control. For product manufacturers, the surface defects of the products directly determine the quality of the products, and the manufacturers can occupy larger market share only if the quality is guaranteed to be over-qualified. For example, for a mobile phone screen manufacturer, the quality of a product is determined by the surface defects of a glass cover plate, the quality can be guaranteed to pass through by detecting when the glass cover plate is fed, the defective cover plate cannot flow to the rear end for attaching production, the defective cover plate is found to be repaired or scrapped at a delivery end, one process is finished and detected once, the defect is tracked and analyzed, the production process is improved pertinently, the defects in the production process are reduced, the cost can be lowered truly, and the quality is improved. Therefore, how to improve the method for detecting the surface defects of the product to improve the detection efficiency and accuracy has become a bottleneck restricting the development and the improvement of the benefit of the production enterprises.
Disclosure of Invention
Based on this, it is necessary to provide an object surface defect detecting system, including stroboscopic light source lighting device, image acquisition device, image processing equipment and controller, the controller is connected with stroboscopic light source lighting device, image acquisition device and image processing equipment, stroboscopic light source lighting device sets up in the top that awaits measuring the surperficial of awaiting measuring and is used for providing the light source for the object that awaits measuring, image acquisition device set up in stroboscopic light source lighting device top.
Further, the image acquisition device comprises a first line scanning camera and a second line scanning camera, the first line scanning camera comprises a first line scanning camera body and a first lens arranged on the first line scanning camera body, the shooting direction of the first line scanning camera is perpendicular to the surface to be detected of the object to be detected, the second line scanning camera comprises a second line scanning camera body and a second lens arranged on the second line scanning camera body, and the included angle between the shooting direction of the second line scanning camera and the surface to be detected of the object to be detected is an acute angle.
Further, stroboscopic light source lighting device includes the support and sets up linear light source one, linear light source two, linear light source three, linear light source four and the linear light source five of mutual parallel arrangement on the support, linear light source one, linear light source two, linear light source three and linear light source four set gradually and are semi-cylindric, linear light source five set up in between linear light source one and the linear light source two.
Further, the device also comprises a line light source six, and the line light source six is arranged below the object to be measured.
Furthermore, the line light source five and the line scanning camera two are respectively positioned on two sides of a central plane of a semi-cylindrical structure formed by the line light source one, the line light source two, the line light source three and the line light source four, and the shooting direction of the line scanning camera two is positioned on a reflected light ray of the line light source five on the surface of the object to be measured.
In another aspect, the present invention provides a method for detecting surface defects of an object using a system for detecting surface defects of an object, including the steps of:
s1, setting the lighting sequence of a line light source I, a line light source II, a line light source III, a line light source IV, a line light source V and a line light source VI and the shooting sequence of a line scanning camera I and a line scanning camera II in the stroboscopic light source lighting device, wherein the specific sequence is as follows:
a. the line light source I, the line light source II, the line light source III and the line light source IV work, the line scanning camera I works, the other line light sources and the line scanning camera do not work, the light scanning mode of the stroboscopic light source lighting device is a dark field light scanning mode, and the line scanning camera I shoots an object to be measured to obtain a picture;
b. the line light source six works, the line scanning camera one works, the other line light sources and the line scanning camera do not work, the lighting mode of the stroboscopic light source lighting device is a light-transmitting lighting mode, and the line scanning camera one shoots an object to be detected to obtain a picture;
c. the line light source five works, the line scanning camera two works, the other line light sources and the line scanning camera do not work, the lighting mode of the stroboscopic light source lighting device is a bright field lighting mode, and the line scanning camera two shoots an object to be measured to obtain a picture;
and S2, the image processing device receives the pictures from the first line scanning camera and the second line scanning camera, and analyzes and detects the pictures to detect the defects on the surface of the object to be detected.
Furthermore, the first line scanning camera and the second line scanning camera shoot the object to be detected in a line-by-line shooting mode.
The principle and effect of the present invention will be further explained by combining the above technical scheme and the accompanying drawings:
when the surface defect of the object to be detected is detected, the multiple light sources on the stroboscopic light source illuminating device are used for pulsing at different intensities and durations in a preset sequence, different multiple illuminating modes can be formed, and each different illuminating mode can highlight specific characteristics in an image, so that the surface defect detection device can detect more defects on the surface of the object to be detected. In addition, the invention realizes the switching of multiple illumination modes by arranging a plurality of light sources in the stroboscopic light source illumination device, thereby realizing the effect of measuring for multiple times by a single camera station, simplifying the mechanical structure and reducing the manufacturing cost. Compared with the existing detection system, the detection system can save the cost of at least one camera and accessories thereof and related installation structures, and the invention is more convenient to maintain in the later use process, so that the cost can be saved by 3 ten thousand yuan.
In addition, the stroboscopic light source lighting device can synthesize a plurality of images to eliminate the influence of random reflection on the surface, is favorable for positioning an object to be detected and is favorable for subsequent image processing and analysis.
Drawings
FIG. 1 is a schematic structural diagram of a system for detecting surface defects of an object according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a stroboscopic light source illumination device according to an embodiment of the present invention;
fig. 3 is a timing diagram illustrating the control of the stroboscopic light source illumination apparatus according to the embodiment of the present invention;
FIG. 4 is a flow chart of a system for detecting surface defects of an object according to an embodiment of the present invention;
fig. 5 is a schematic diagram of each polishing method according to the embodiment of the present invention.
Description of reference numerals:
the method comprises the following steps of 1-support, 11-linear light source I, 12-linear light source II, 13-linear light source III, 14-linear light source IV, 15-linear light source V, 21-linear scanning camera I body, 22-lens I, 31-linear scanning camera II body, 32-lens II, 4-object to be detected and 5-linear light source VI.
Detailed Description
For the convenience of understanding of those skilled in the art, the present invention will be described in further detail below with reference to the accompanying drawings and examples:
as shown in fig. 1-2, an object surface defect detecting system includes a stroboscopic light source lighting device, an image acquisition device, an image processing apparatus and a controller, the controller is connected to the stroboscopic light source lighting device, the image acquisition device and the image processing apparatus, and the stroboscopic light source lighting device is disposed above a surface to be measured of an object to be measured 4 to provide a light source for the object to be measured 4.
Further, the image acquisition device comprises a first line scanning camera and a second line scanning camera, the first line scanning camera comprises a first line scanning camera body 21 and a first lens 22 arranged on the first line scanning camera body 21, the shooting direction of the first line scanning camera is perpendicular to the surface to be detected of the object to be detected, the second line scanning camera comprises a second line scanning camera body 31 and a second lens 32 arranged on the second line scanning camera body 31, and the shooting direction of the second line scanning camera and the included angle of the surface to be detected of the object to be detected 4 are acute angles.
The method is used for detecting the defects on the surface of the object, wherein the object 4 to be detected can be a transparent medium, such as glass, PVC transparent body and the like, or can also be a non-transparent medium, such as an object with a smooth surface structure, such as a mirror surface and the like.
The system comprises a stroboscopic light source illuminating device, a line scan camera I, a line scan camera II, a control system and a control system, wherein the stroboscopic light source illuminating device is arranged right above the surface to be detected of an object to be detected 4, an image acquisition system consisting of the line scan camera I and the line scan camera II is arranged above the stroboscopic light source illuminating device, the line scan camera I and the line scan camera II are respectively vertically arranged and obliquely arranged at a certain angle, and the line scan camera I and the line scan camera II focus on the surface; the controller controls the stroboscopic light source lighting device to output specific light according to a certain sequence, and simultaneously the controller controls the image acquisition device to acquire images in a corresponding sequence according to a certain sequence, and finally the images are processed by the rear-end image processing equipment.
When the device works, light emitted by the stroboscopic light source lighting device irradiates the surface of the object 4 to be detected to provide a light source for the object 4 to be detected, then the image acquisition device shoots a picture of the object 4 to be detected and sends the picture to the image processing equipment for detection, so that the defect on the surface of the object 4 to be detected is detected.
The stroboscopic light source can provide different illumination modes under the control of the controller, so that the image acquisition device can acquire photos of the object 4 to be detected in different illumination modes, and each illumination mode can highlight different defects on the surface of the object 4 to be detected, so that the image processing equipment can detect more defects on the surface of the object 4 to be detected; in addition, the object to be detected does not need to be contacted in the detection of the object to be detected, and the damage to the object to be detected 4 in the detection process can be effectively avoided.
Further, stroboscopic light source lighting device includes the support and sets up the linear light source 11, linear light source two 12, linear light source three 13, linear light source four 14 and the linear light source five 15 of mutual parallel arrangement on the support, linear light source 11, linear light source two 12, linear light source three 13 and linear light source four 14 set gradually and are semi-cylindric, linear light source five 15 set up in between linear light source 11 and linear light source two 12.
The bracket is provided with a gap for the reflected light of the linear light source I11, the linear light source II 12, the linear light source III 13, the linear light source IV 14 and the linear light source V15 on the object to be detected to pass through, and the image acquisition device acquires the image of the surface to be detected of the object to be detected 4 through the gap.
Further, the device also comprises a line light source six 5, wherein the line light source six 5 is arranged below the object to be measured 4.
Wherein the irradiation direction of the linear light source six 5 is arranged towards the object 4 to be measured.
The line scan camera comprises a first line scan camera body 21 and a first lens 22, and the second line scan camera comprises a second line scan camera body 31 and a second lens 32; the linear light source is a light source with columnar emitted light, and the light irradiates towards one direction. The line light source I11, the line light source II 12, the line light source III 13, the line light source IV 14 and the line light source V15 can form different lighting modes through different light and dark combinations, and then the line scanning camera I and the line scanning camera II can obtain pictures of the object 4 to be detected in different lighting modes, so that the image processing equipment can detect more defects on the surface of the object 4 to be detected.
The structure of the detection system is a structure of forward-projection forward-shooting, oblique-projection oblique-shooting combined shooting, and as shown in fig. 1-2, the detection process of the invention comprises three detection modes: firstly, forming a combined light source by a first line light source 11, a second line light source 12, a third line light source 13 and a fourth line light source 14, lighting, shooting by a first line scanning camera, and processing the shot picture by image processing equipment to obtain a detection result; in the second mode, the line light source five 15 independently shines light and the line scanning camera two shoots the light, and then the image processing equipment processes the shot picture to obtain a detection result; and thirdly, the light is transmitted by the line light at the bottom, the shot picture is shot by the first line scanning camera, and then the shot picture is processed by the image processing equipment to obtain a detection result.
In the detection mode, the four line lights form a combined light source for lighting, and a dark field lighting mode is formed by shooting by the line scanning camera I, so that the defects of scratches, dirt, ink black points, white edges, scratches and the like on the surface of the object 4 to be detected can be effectively shot, and aiming at the scratches, the combined light source lighting mode formed by the four line lights emitted by the line light source I11, the line light source II 12, the line light source III 13 and the line light source IV 14 strengthens the shooting effect of the scratches, particularly the shooting effect of the scratches with directionality, and the light sources in multiple directions can make the scratches, particularly the directional scratches, more obvious in shooting, and facilitate the image processing for detection; the line light source five 15 independently polishes the light and the line scanning camera two shoots the light to form a bright field polishing mode, so that the defects of concave-convex sense on the surface of the object 4 to be detected, such as concave-convex points, orange grains, hairbrush printing, pockmarks, mold printing and the like, can be effectively extracted; a line light source six 5 at the bottom of the object 4 to be detected is used for emitting light, a line scanning camera I is used for shooting to form a light emitting lighting mode, the outline of the cover plate can be effectively extracted for positioning, and defects such as sand holes, edge penetration and edge breakage can be extracted. The invention detects the defects on the surface of the object by the detection mode, can detect more defects and further increases the accuracy of the detection result.
The light generated by the stroboscopic light source illumination device in the present invention is a combined light, and the stroboscopic light source illumination device lights up and lights out sequentially and repeatedly according to a programmed sequence, as shown in fig. 3, wherein the high level duration time is represented as the lighting duration time of the corresponding linear light source.
In addition, for the detection of the surface of the object 4 to be detected, one of the three detection modes can be independently adopted for detection, and two or three of the three detection modes can be adopted for detection in a combined mode, specifically based on the detection requirement of the object 4 to be detected.
For example, if the object 4 to be detected is a transparent medium, when the object 4 to be detected is detected, surface detection can be performed by adopting a method combining three detection modes, namely a mode 1, a mode 2 and a mode 3; if the object 4 to be detected is a non-transparent medium, the material to be detected is opaque, so that surface detection can be performed by combining the mode 1 and the mode 2.
Wherein, the polishing modes of the first mode and the second mode are used for detecting the defects of the surface of the object 4 to be detected, such as scratches, dirt, black ink points, white edges, scratches, concave-convex points, orange stripes, hairbrush printing, pockmarks, mold printing and the like on the window area; the polishing mode of the third mode is used for detecting the profile of the object 4 to be detected and detecting the integrity of the profile of the object 4 to be detected.
Further, in the invention, the light emitted by the stroboscopic light source lighting device is irradiated on the surface to be measured of the object 4 to be measured, reflected and imaged in the image acquisition device through the lens, and the line scan camera, the lens and the surface to be measured of the object 4 to be measured satisfy the gaussian formula:
wherein: u is the object distance, i.e. the distance between the surface to be measured of the object 4 to be measured and the main surface of the lens, v is the image distance, i.e. the distance between the line scan camera in operation and the main surface of the lens, and f is the focal length of the image space.
Further, the linear light source five 15 and the linear scanning camera two are respectively located on two sides of a central plane of a semi-cylindrical structure formed by the linear light source one 11, the linear light source two 12, the linear light source three 13 and the linear light source four 14, and the shooting direction of the linear scanning camera two is located on a reflected light ray of the linear light source five 15 on the surface of the object 4 to be measured.
The linear light sources I11, II 12, III 13 and IV 14 are preferably uniformly distributed on the surface of the semi-cylindrical structure, and the linear light source V15 is also positioned at the edge of the plate cylindrical structure.
In another aspect, the present invention provides a method for detecting surface defects of an object using a system for detecting surface defects of an object, comprising the steps of:
s1, setting the lighting sequence of the line light source I11, the line light source II 12, the line light source III 13, the line light source IV 14, the line light source V15 and the line light source VI 5 and the shooting sequence of the line scanning camera I and the line scanning camera II in the stroboscopic light source lighting device, wherein the specific sequence is as follows:
a. the line light source I11, the line light source II 12, the line light source III 13 and the line light source IV 14 work, the line scanning camera I works, the other line light sources and the line scanning camera do not work, the light scanning mode of the stroboscopic light source illuminating device is a dark field light scanning mode, and the line scanning camera I shoots the object 4 to be measured to obtain a picture;
b. the line light source six 5 works, the line scanning camera I works, the other line light sources and the line scanning camera do not work, the lighting mode of the stroboscopic light source lighting device is a light-transmitting lighting mode, and the line scanning camera I shoots an object 4 to be detected to obtain a picture;
c. the line light source five 15 works, the line scanning camera two works, the other line light sources and the line scanning camera do not work, the lighting mode of the stroboscopic light source lighting device is a bright field lighting mode, and the line scanning camera two shoots the object 4 to be detected to obtain a picture;
and S2, the image processing device receives the pictures from the first line scanning camera and the second line scanning camera and analyzes the pictures.
The image processing device is an image processing device in the prior art, and can analyze the picture taken by the image acquisition device to identify the defect that the surface of the object 4 to be detected is full.
Further, the first line scan camera and the second line scan camera shoot the object 4 to be detected in a line-by-line shooting mode.
The above examples only show some embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for those skilled in the art, without departing from the concept of the present invention, several variations and improvements can be made, such as replacing the object with an illumination detection mode on a smooth surface, such as a PVC transparent body, a mirror surface, etc.; for example, the strobe control is set as the switching control of other multi-way combination modes, and the like, including but not limited to this, all belong to the protection scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (7)
1. The utility model provides an object surface defect detecting system, its characterized in that, includes stroboscopic light source lighting device, image acquisition device, image processing equipment and controller, the controller is connected with stroboscopic light source lighting device, image acquisition device and image processing equipment, stroboscopic light source lighting device sets up in the top of the awaiting measuring surface of the object that awaits measuring and is used for providing the light source for the object that awaits measuring, image acquisition device set up in stroboscopic light source lighting device top.
2. The system for detecting surface defects according to claim 1, wherein the image capturing device comprises a first line scan camera and a second line scan camera, the first line scan camera comprises a first line scan camera body and a first lens arranged on the first line scan camera body, the shooting direction of the first line scan camera is arranged perpendicular to the surface to be measured of the object to be measured, the second line scan camera comprises a second line scan camera body and a second lens arranged on the second line scan camera body, and the shooting direction of the second line scan camera forms an acute angle with the surface to be measured of the object to be measured.
3. The system for detecting the surface defects of the object according to claim 2, wherein the stroboscopic light source lighting device comprises a support and a first linear light source, a second linear light source, a third linear light source, a fourth linear light source and a fifth linear light source which are arranged on the support in parallel, the first linear light source, the second linear light source, the third linear light source and the fourth linear light source are sequentially arranged to form a semi-cylindrical shape, and the fifth linear light source is arranged between the first linear light source and the second linear light source.
4. The system of claim 3, further comprising a line light source six, wherein the line light source six is disposed below the object to be measured.
5. The system for detecting the surface defects of the object according to claim 3, wherein the linear light source five and the linear scanning camera two are respectively positioned at two sides of a central plane of a semi-cylindrical structure formed by the linear light source one, the linear light source two, the linear light source three and the linear light source four, and the shooting direction of the linear scanning camera two is positioned on a reflected light ray of the linear light source five on the surface of the object to be detected.
6. An object surface defect detection method using the object surface defect detection system according to any one of claims 1 to 5, comprising the steps of:
s1, setting the lighting sequence of a line light source I, a line light source II, a line light source III, a line light source IV, a line light source V and a line light source VI and the shooting sequence of a line scanning camera I and a line scanning camera II in the stroboscopic light source lighting device, wherein the specific sequence is as follows:
a. the line light source I, the line light source II, the line light source III and the line light source IV work, the line scanning camera I works, the other line light sources and the line scanning camera do not work, the light scanning mode of the stroboscopic light source lighting device is a dark field light scanning mode, and the line scanning camera I shoots an object to be measured to obtain a picture;
b. the line light source six works, the line scanning camera one works, the other line light sources and the line scanning camera do not work, the lighting mode of the stroboscopic light source lighting device is a light-transmitting lighting mode, and the line scanning camera one shoots an object to be detected to obtain a picture;
c. the line light source five works, the line scanning camera two works, the other line light sources and the line scanning camera do not work, the lighting mode of the stroboscopic light source lighting device is a bright field lighting mode, and the line scanning camera two shoots an object to be measured to obtain a picture;
and S2, the image processing device receives the pictures from the first line scanning camera and the second line scanning camera, and analyzes and detects the pictures to detect the defects on the surface of the object to be detected.
7. The method for detecting the surface defects of the object according to claim 6, wherein the first line scan camera and the second line scan camera shoot the object to be detected in a line-by-line shooting mode.
Applications Claiming Priority (2)
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| CN2019218120129 | 2019-10-26 | ||
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Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111707670A (en) * | 2020-06-28 | 2020-09-25 | 武汉精立电子技术有限公司 | Defect detection method and device based on rotary carrying platform |
| CN111999316A (en) * | 2020-09-02 | 2020-11-27 | 惠州高视科技有限公司 | Curved glass detection system and method |
| CN112285118A (en) * | 2020-10-22 | 2021-01-29 | 苏州佳智彩光电科技有限公司 | A kind of AMOLED screen appearance visual inspection method and device |
| CN112964727A (en) * | 2021-02-07 | 2021-06-15 | 厦门威芯泰科技有限公司 | Surface defect developing device and surface defect detecting apparatus |
| CN113030112A (en) * | 2021-05-26 | 2021-06-25 | 苏州高视半导体技术有限公司 | Multi-light-field imaging method based on stripe light source, electronic equipment and storage medium |
| CN113689432A (en) * | 2021-10-27 | 2021-11-23 | 常州微亿智造科技有限公司 | Detection method for identifying special point-like defects |
| CN114740616A (en) * | 2022-03-08 | 2022-07-12 | 广州超音速自动化科技股份有限公司 | Imaging device and method based on line scanning camera photometric stereo |
| CN115369759A (en) * | 2022-08-09 | 2022-11-22 | 浙江中技建设工程检测有限公司 | A bridge detection method |
| CN115494069A (en) * | 2022-09-23 | 2022-12-20 | 惠州志合砺行科技有限公司 | Polishing method of multi-angle light source structure |
| CN117929391A (en) * | 2024-02-29 | 2024-04-26 | 东莞市沃德普自动化科技有限公司 | Programmable phase shift control illumination method and light source |
| CN118209561A (en) * | 2024-05-21 | 2024-06-18 | 宁德时代新能源科技股份有限公司 | Coil stock detection method and system |
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| CN111707670B (en) * | 2020-06-28 | 2023-10-27 | 武汉精立电子技术有限公司 | Defect detection method and device based on rotary carrier |
| CN111707670A (en) * | 2020-06-28 | 2020-09-25 | 武汉精立电子技术有限公司 | Defect detection method and device based on rotary carrying platform |
| CN111999316A (en) * | 2020-09-02 | 2020-11-27 | 惠州高视科技有限公司 | Curved glass detection system and method |
| CN112285118A (en) * | 2020-10-22 | 2021-01-29 | 苏州佳智彩光电科技有限公司 | A kind of AMOLED screen appearance visual inspection method and device |
| CN112964727A (en) * | 2021-02-07 | 2021-06-15 | 厦门威芯泰科技有限公司 | Surface defect developing device and surface defect detecting apparatus |
| CN112964727B (en) * | 2021-02-07 | 2022-08-16 | 厦门威芯泰科技有限公司 | Surface defect developing device and surface defect detecting apparatus |
| CN113030112A (en) * | 2021-05-26 | 2021-06-25 | 苏州高视半导体技术有限公司 | Multi-light-field imaging method based on stripe light source, electronic equipment and storage medium |
| CN113689432A (en) * | 2021-10-27 | 2021-11-23 | 常州微亿智造科技有限公司 | Detection method for identifying special point-like defects |
| CN114740616A (en) * | 2022-03-08 | 2022-07-12 | 广州超音速自动化科技股份有限公司 | Imaging device and method based on line scanning camera photometric stereo |
| CN115369759A (en) * | 2022-08-09 | 2022-11-22 | 浙江中技建设工程检测有限公司 | A bridge detection method |
| CN115494069A (en) * | 2022-09-23 | 2022-12-20 | 惠州志合砺行科技有限公司 | Polishing method of multi-angle light source structure |
| CN117929391A (en) * | 2024-02-29 | 2024-04-26 | 东莞市沃德普自动化科技有限公司 | Programmable phase shift control illumination method and light source |
| CN118209561A (en) * | 2024-05-21 | 2024-06-18 | 宁德时代新能源科技股份有限公司 | Coil stock detection method and system |
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