CN110834385B - Cutting device - Google Patents
Cutting device Download PDFInfo
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- CN110834385B CN110834385B CN201910675421.7A CN201910675421A CN110834385B CN 110834385 B CN110834385 B CN 110834385B CN 201910675421 A CN201910675421 A CN 201910675421A CN 110834385 B CN110834385 B CN 110834385B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26D—CUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
- B26D3/00—Cutting work characterised by the nature of the cut made; Apparatus therefor
- B26D3/06—Grooving involving removal of material from the surface of the work
- B26D3/065—On sheet material
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26D—CUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
- B26D1/00—Cutting through work characterised by the nature or movement of the cutting member or particular materials not otherwise provided for; Apparatus or machines therefor; Cutting members therefor
- B26D1/01—Cutting through work characterised by the nature or movement of the cutting member or particular materials not otherwise provided for; Apparatus or machines therefor; Cutting members therefor involving a cutting member which does not travel with the work
- B26D1/12—Cutting through work characterised by the nature or movement of the cutting member or particular materials not otherwise provided for; Apparatus or machines therefor; Cutting members therefor involving a cutting member which does not travel with the work having a cutting member moving about an axis
- B26D1/14—Cutting through work characterised by the nature or movement of the cutting member or particular materials not otherwise provided for; Apparatus or machines therefor; Cutting members therefor involving a cutting member which does not travel with the work having a cutting member moving about an axis with a circular cutting member, e.g. disc cutter
- B26D1/141—Cutting through work characterised by the nature or movement of the cutting member or particular materials not otherwise provided for; Apparatus or machines therefor; Cutting members therefor involving a cutting member which does not travel with the work having a cutting member moving about an axis with a circular cutting member, e.g. disc cutter for thin material, e.g. for sheets, strips or the like
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26D—CUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
- B26D5/00—Arrangements for operating and controlling machines or devices for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting
- B26D5/005—Computer numerical control means
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26D—CUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
- B26D7/00—Details of apparatus for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting
- B26D7/08—Means for treating work or cutting member to facilitate cutting
- B26D7/088—Means for treating work or cutting member to facilitate cutting by cleaning or lubricating
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0076—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for removing dust, e.g. by spraying liquids; for lubricating, cooling or cleaning tool or work
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
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Abstract
Description
技术领域technical field
本发明涉及切削装置,其通过高速旋转的切削刀具对被加工物进行切削。The present invention relates to a cutting device which cuts a workpiece with a high-speed rotating cutting tool.
背景技术Background technique
晶片由交叉的多条分割预定线划分而在正面上形成有IC、LSI等多个器件,该晶片在通过磨削装置对背面进行磨削而形成为期望的厚度之后,通过切削装置分割成各个器件芯片,分割得到的各器件芯片被用于移动电话、个人计算机等电子设备。The wafer is divided by a plurality of intersecting dividing lines, and a plurality of devices such as IC and LSI are formed on the front surface. Device chips, each device chip obtained by dividing is used in electronic devices such as mobile phones and personal computers.
切削装置具有:卡盘工作台,其具有对被加工物进行保持的保持面;切削单元,其以能够旋转的方式具有对卡盘工作台所保持的被加工物进行切削的切削刀具;切削水提供机构,其对切削刀具和被加工物提供切削水;加工进给机构,其将卡盘工作台和切削单元在与保持面平行的X轴方向上相对地进行加工进给;以及分度进给机构,其将卡盘工作台和切削单元在与保持面平行且与X轴方向垂直的Y轴方向上相对地进行分度进给,该切削装置能够对晶片进行高精度地切削(例如,参照专利文献1)。The cutting device has: a chuck table having a holding surface for holding a workpiece; a cutting unit having a rotatable cutting tool for cutting the workpiece held by the chuck table; a cutting water supply mechanism, which supplies cutting water to the cutting tool and the workpiece; a machining feed mechanism, which performs machining feeding of the chuck table and the cutting unit in an X-axis direction parallel to the holding surface; and index feeding mechanism, which index-feeds the chuck table and the cutting unit in the Y-axis direction parallel to the holding surface and perpendicular to the X-axis direction, and the cutting device can cut the wafer with high precision (for example, refer to Patent Document 1).
专利文献1:日本特开2005-46979号公报Patent Document 1: Japanese Patent Laid-Open No. 2005-46979
但是,存在如下的问题:有时根据切削单元与卡盘工作台的相对的加工进给方向而导致器件芯片上所产生的崩边的大小及数量等不同,在器件芯片的品质上产生差异。However, there is a problem that the size and number of chipping generated on the device chip may vary depending on the relative processing feeding direction of the cutting unit and the chuck table, resulting in a difference in the quality of the device chip.
发明内容Contents of the invention
由此,本发明的目的在于提供切削装置,能够生成品质良好的器件芯片。Therefore, an object of the present invention is to provide a cutting device capable of producing high-quality device chips.
根据本发明,提供切削装置,其中,该切削装置具有:卡盘工作台,其具有对被加工物进行保持的保持面;切削单元,其具有对该卡盘工作台所保持的被加工物进行切削的切削刀具并且该切削刀具能够旋转;切削水提供机构,其对该切削刀具和被加工物提供切削水;加工进给机构,其将该卡盘工作台和该切削单元在与该保持面平行的X轴方向上相对地进行加工进给;分度进给机构,其将该卡盘工作台和该切削单元在与该保持面平行且与该X轴方向垂直的Y轴方向上相对地进行分度进给;以及加工进给方向判定机构,该加工进给方向判定机构包含:拍摄单元,其对包含切削槽的区域进行拍摄;以及记录单元,其对所拍摄的切削槽的崩边数据进行记录,在该记录单元中记录有:从第一方向对被加工物进行切削而得的切削槽的第一崩边数据;从与该第一方向相反的方向对被加工物进行切削而得的切削槽的第二崩边数据;从与该第一方向交叉的第二方向对被加工物进行切削而得的切削槽的第三崩边数据;以及从与该第二方向相反的方向对被加工物进行切削而得的切削槽的第四崩边数据。According to the present invention, a cutting device is provided, wherein the cutting device includes: a chuck table having a holding surface for holding a workpiece; a cutting unit having a cutting unit for cutting the workpiece held by the chuck table. The cutting tool and the cutting tool can be rotated; the cutting water supply mechanism, which provides cutting water to the cutting tool and the workpiece; the processing feed mechanism, which makes the chuck table and the cutting unit parallel to the holding surface The processing feed is carried out relatively in the direction of the X-axis; the index feed mechanism, which performs relative processing of the chuck table and the cutting unit in the direction of the Y-axis parallel to the holding surface and perpendicular to the X-axis direction indexing feed; and a processing feed direction judging mechanism, the processing feed direction judging mechanism includes: a photographing unit, which photographs the area containing the cutting groove; and a recording unit, which records the chipping data of the photographed cutting groove Recording is carried out, and the recording unit is recorded with: the first chipping data of the cutting groove obtained by cutting the workpiece from the first direction; The second chipping data of the cutting groove; the third chipping data of the cutting groove obtained by cutting the workpiece from the second direction intersecting with the first direction; and the third chipping data of the cutting groove from the direction opposite to the second direction The fourth chipping data of the cutting groove obtained by cutting the workpiece.
优选该拍摄单元通过透过被加工物的波长的光而对形成于被加工物的背面的切削槽进行拍摄,在该记录单元中记录有:从第一方向对被加工物进行切削而得的切削槽的背面侧的第一背面崩边数据;从与该第一方向相反的方向对被加工物进行切削而得的切削槽的背面侧的第二背面崩边数据;从与该第一方向垂直的第二方向对被加工物进行切削而得的切削槽的背面侧的第三背面崩边数据;以及从与该第二方向相反的方向对被加工物进行切削而得的切削槽的背面侧的第四背面崩边数据。优选该加工进给判定机构具有判断单元,该判断单元对该记录单元中所记录的该第一崩边数据、该第二崩边数据、该第三崩边数据以及该第四崩边数据进行比较,从而确定形成切削槽的方向。Preferably, the photographing unit photographs the cutting groove formed on the back surface of the workpiece by transmitting light of a wavelength of the workpiece, and the recording unit records: First back chipping data on the back side of the cutting groove; second back chipping data on the back side of the cutting groove obtained by cutting the workpiece from a direction opposite to the first direction; Third back chipping data on the back side of the cut groove obtained by cutting the workpiece in the second direction perpendicular to the second direction; and the back surface of the cut groove obtained by cutting the workpiece in a direction opposite to the second direction Edge chipping data on the fourth back of the side. Preferably, the processing feed judging mechanism has a judging unit, and the judging unit performs the first edge chipping data, the second edge chipping data, the third edge chipping data and the fourth edge chipping data recorded in the recording unit. Compare to determine the direction in which the cutting groove is formed.
优选该加工进给判定机构具有判断单元,该判断单元不仅对该记录单元中所记录的该第一崩边数据、该第二崩边数据、该第三崩边数据以及该第四崩边数据进行比较,还对该记录单元中所记录的该第一背面崩边数据、该第二背面崩边数据、该第三背面崩边数据以及该第四背面崩边数据进行比较,从而确定形成切削槽的方向。优选该加工进给判定机构包含显示该崩边数据的显示单元或输出该崩边数据的输出单元中的至少任意一方。优选该崩边数据中包含崩边的大小、数量。优选该崩边数据中包含图像。Preferably, the processing feed judging mechanism has a judging unit, and the judging unit not only checks the first edge chipping data, the second edge chipping data, the third edge chipping data, and the fourth edge chipping data recorded in the recording unit For comparison, also compare the first backside chipping data, the second backside chipping data, the third backside chipping data and the fourth backside chipping data recorded in the recording unit, so as to determine the formation of cutting The direction of the slot. Preferably, the processing feed determination means includes at least one of a display unit that displays the chipping data or an output unit that outputs the chipping data. Preferably, the chipping data includes the size and quantity of chipping. Preferably, the edge chipping data includes an image.
根据本发明,对第一~第四崩边数据进行比较而能够确定形成切削槽的方向,能够从适当的方向对晶片进行切削而生成品质良好的器件芯片。According to the present invention, the direction in which the cutting groove is formed can be determined by comparing the first to fourth chipping data, and the wafer can be cut from an appropriate direction to produce a high-quality device chip.
附图说明Description of drawings
图1是按照本发明构成的切削装置的立体图。Figure 1 is a perspective view of a cutting device constructed in accordance with the present invention.
图2是图1所示的切削单元的放大立体图。Fig. 2 is an enlarged perspective view of the cutting unit shown in Fig. 1 .
图3的(a)是形成了从第一方向进行切削而得的切削槽的晶片的俯视图,图3的(b)是图3的(a)中的A部放大图。3( a ) is a plan view of a wafer formed with cutting grooves cut from the first direction, and FIG. 3( b ) is an enlarged view of part A in FIG. 3( a ).
图4的(a)是在图3的(a)所示的晶片上进一步形成了从与第一方向相反的方向进行切削而得的切削槽的晶片的俯视图,图4的(b)是图4的(a)中的B部放大图。(a) of Fig. 4 is a top view of a wafer in which cutting grooves obtained by cutting from a direction opposite to the first direction are further formed on the wafer shown in (a) of Fig. 3 , and (b) of Fig. 4 is a plan view of Enlarged view of part B in (a) of 4.
图5的(a)是在图4的(a)所示的晶片上进一步形成了从与第一方向垂直的第二方向进行切削而得的切削槽的晶片的俯视图,图5的(b)是图5的(a)中的C部放大图。(a) of Fig. 5 is a top view of a wafer in which cutting grooves obtained by cutting from a second direction perpendicular to the first direction are further formed on the wafer shown in (a) of Fig. 4 , and (b) of Fig. 5 It is an enlarged view of part C in (a) of FIG. 5 .
图6的(a)是在图5的(a)所示的晶片上进一步形成了从与第二方向相反的方向进行切削而得的切削槽的晶片的俯视图,图6的(b)是图6的(a)中的D部放大图。(a) of Fig. 6 is a top view of a wafer in which cutting grooves obtained by cutting from a direction opposite to the second direction are further formed on the wafer shown in (a) of Fig. 5 , and (b) of Fig. 6 is a plan view of Enlarged view of part D in (a) of 6.
图7是示出输出单元所输出的崩边数据的一例的图表。FIG. 7 is a graph showing an example of chipping data output by an output unit.
标号说明Label description
2:切削装置;4:卡盘工作台;6:切削单元;8:切削水提供机构;22:切削刀具;28:拍摄单元;38:显示单元。2: cutting device; 4: chuck table; 6: cutting unit; 8: cutting water supply mechanism; 22: cutting tool; 28: photographing unit; 38: display unit.
具体实施方式Detailed ways
以下,参照附图对按照本发明构成的切削装置的优选实施方式进行说明。Hereinafter, preferred embodiments of the cutting device according to the present invention will be described with reference to the drawings.
图1所示的切削装置2具有:卡盘工作台4,其具有对被加工物进行保持的保持面;切削单元6,其以能够旋转的方式具有对卡盘工作台4所保持的被加工物进行切削的切削刀具;切削水提供机构8,其对切削刀具和被加工物提供切削水;加工进给机构(未图示),其将卡盘工作台4和切削单元6在与保持面平行的X轴方向(图1中箭头X所示的方向)上相对地进行加工进给;分度进给机构(未图示),其将卡盘工作台4和切削单元6在与保持面平行且与X轴方向垂直的Y轴方向(图1中箭头Y所示的方向)上相对地进行分度进给;以及加工进给方向判定机构。另外,由X轴方向和Y轴方向所限定的平面实质上是水平的。The cutting device 2 shown in FIG. 1 has: a chuck table 4 that has a holding surface for holding a workpiece; a cutting unit 6 that has a workpiece held by the chuck table 4 in a rotatable manner. The cutting tool for cutting the object; the cutting water supply mechanism 8, which provides cutting water to the cutting tool and the workpiece; the processing feed mechanism (not shown), which connects the chuck table 4 and the cutting unit 6 to the holding surface On the parallel X-axis direction (the direction shown by the arrow X in Fig. 1), the processing feed is relatively carried out; the indexing feed mechanism (not shown), which places the chuck table 4 and the cutting unit 6 on the holding surface Relatively indexed feeding is performed in the Y-axis direction (the direction indicated by arrow Y in FIG. 1 ) parallel to and perpendicular to the X-axis direction; and a processing feed direction determination mechanism. In addition, the plane defined by the X-axis direction and the Y-axis direction is substantially horizontal.
卡盘工作台4包含旋转自如且在X轴方向上移动自如地安装于装置壳体10的卡盘工作台12。卡盘工作台12通过内置于装置壳体10的卡盘工作台用电动机(未图示)而以沿上下方向延伸的轴线为中心进行旋转。在卡盘工作台12的上端部分配置有与吸引单元(未图示)连接的多孔质的圆形状吸附卡盘14。并且,在卡盘工作台12中,利用吸引单元在吸附卡盘14上生成吸引力,从而对载置于上表面的被加工物进行吸引保持。这样,在本实施方式中,对被加工物进行保持的保持面由吸附卡盘14的上表面构成。另外,在卡盘工作台12的周缘沿周向隔开间隔而配置有多个夹具16。The chuck table 4 includes a chuck table 12 , which is rotatably attached to the device case 10 so as to be able to move in the X-axis direction. The chuck table 12 is rotated around an axis extending in the vertical direction by a chuck table motor (not shown) built in the device case 10 . A porous circular suction chuck 14 connected to a suction unit (not shown) is disposed on the upper end portion of the chuck table 12 . In addition, in the chuck table 12 , suction means is used to generate suction force on the suction chuck 14 , thereby suctioning and holding the workpiece placed on the upper surface. Thus, in the present embodiment, the holding surface for holding the workpiece is constituted by the upper surface of the suction chuck 14 . In addition, a plurality of jigs 16 are arranged at intervals in the circumferential direction on the periphery of the chuck table 12 .
参照图1以及图2进行说明,切削单元6包含:主轴壳体18,其按着升降自如且在Y轴方向上移动自如的方式支承于装置壳体10;主轴20,其以能够将Y轴方向作为轴心进行旋转的方式支承于主轴壳体18;切削刀具22,其固定于主轴20的前端;电动机(未图示),其使切削刀具22与主轴20一起在图2中箭头α所示的方向上旋转;以及刀具罩24,其安装于主轴壳体18的前端。1 and FIG. 2, the cutting unit 6 includes: a main shaft housing 18, which is supported on the device housing 10 in a manner that can be lifted and moved freely in the Y-axis direction; a main shaft 20, which can move the Y-axis The direction is supported on the main shaft housing 18 so as to rotate as the axis; the cutting tool 22 is fixed on the front end of the main shaft 20; and a tool cover 24 mounted on the front end of the spindle housing 18.
如图2所示,切削水提供机构8包含附设于刀具罩24的切削水提供喷嘴26。沿着切削刀具22的侧面延伸的切削水提供喷嘴26夹着切削刀具22而成对设置于两侧,但在图2中仅示出单侧的切削水提供喷嘴26。切削水提供喷嘴26与切削水提供源(未图示)连接,在利用切削刀具22对卡盘工作台12所保持的被加工物实施切削加工时,将从切削水提供源提供的切削水从切削水提供喷嘴26的多个喷射口(未图示)朝向切削刀具22和被加工物喷射。As shown in FIG. 2 , the cutting water supply mechanism 8 includes a cutting water supply nozzle 26 attached to the cutter cover 24 . The cutting water supply nozzles 26 extending along the side surfaces of the cutting insert 22 are provided as a pair on both sides of the cutting insert 22 , but only the cutting water supply nozzle 26 on one side is shown in FIG. 2 . The cutting water supply nozzle 26 is connected to a cutting water supply source (not shown), and when cutting the workpiece held by the chuck table 12 with the cutting tool 22, the cutting water supplied from the cutting water supply source is A plurality of injection ports (not shown) of the cutting water supply nozzle 26 are injected toward the cutting tool 22 and the workpiece.
本实施方式的加工进给机构具有:滚珠丝杠(未图示),其与卡盘工作台12连结,沿X轴方向延伸;以及电动机(未图示),其使该滚珠丝杠旋转,该加工进给机构将卡盘工作台12在X轴方向上相对于切削单元6相对地进行加工进给。The machining feed mechanism of this embodiment includes: a ball screw (not shown) connected to the chuck table 12 and extending in the X-axis direction; and a motor (not shown) that rotates the ball screw, This machining feeding mechanism performs machining feeding of the chuck table 12 relative to the cutting unit 6 in the X-axis direction.
本实施方式的分度进给机构具有:滚珠丝杠(未图示),其与主轴壳体18连结,沿Y轴方向延伸;以及电动机(未图示),其使该滚珠丝杠旋转,该分度进给机构将主轴壳体18在Y轴方向上相对于卡盘工作台4相对地进行分度进给。另外,主轴壳体18通过切入进给单元在上下方向上进行切入进给(升降),该切入进给单元具有沿上下方向延伸的滚珠丝杠(未图示)以及使该滚珠丝杠旋转的电动机(未图示)。The index feed mechanism of this embodiment includes: a ball screw (not shown) connected to the spindle housing 18 and extending in the Y-axis direction; and a motor (not shown) that rotates the ball screw, This index feed mechanism index-feeds the spindle housing 18 relative to the chuck table 4 in the Y-axis direction. In addition, the main shaft housing 18 is plunged and fed (raised and lowered) in the vertical direction by a plunge and feed unit having a ball screw (not shown) extending in the vertical direction and a mechanism for rotating the ball screw. motor (not shown).
加工进给方向判定机构具有拍摄单元28,该拍摄单元28对包含借助切削刀具22而在被加工物上形成的切削槽的区域进行拍摄。配置在卡盘工作台12的上方的拍摄单元28具有:通常的拍摄元件(CCD),其通过可见光线对被加工物进行拍摄;红外线照射单元,其照射透过被加工物的波长的光;光学系统,其捕捉红外线照射单元所照射的红外线;以及拍摄元件(红外线CCD),其输出与光学系统所捕捉的红外线对应的电信号(均未图示)。The machining feed direction determination mechanism includes an imaging unit 28 that captures an image of a region including a cutting groove formed on the workpiece by the cutting tool 22 . The photographing unit 28 disposed above the chuck table 12 has: a common photographing element (CCD), which photographs the workpiece through visible light; an infrared ray irradiation unit, which irradiates light of a wavelength that passes through the workpiece; An optical system that captures infrared rays irradiated by the infrared irradiating unit; and an imaging element (infrared CCD) that outputs electrical signals corresponding to the infrared rays captured by the optical system (both are not shown).
如图1所示,在拍摄单元28上电连接有对切削装置2的动作进行控制的控制单元30。该控制单元30由计算机构成,具有:中央处理装置(CPU)32,其按照控制程序进行运算处理;只读存储器(ROM)34,其对控制程序等进行保存;以及能够读写的随机存取存储器(RAM)36,其对运算结果等进行保存。As shown in FIG. 1 , a control unit 30 for controlling the operation of the cutting device 2 is electrically connected to the imaging unit 28 . The control unit 30 is composed of a computer, and has: a central processing unit (CPU) 32, which performs calculation processing according to a control program; a read-only memory (ROM) 34, which stores the control program, etc.; The memory (RAM) 36 stores calculation results and the like.
控制单元30的随机存取存储器36作为对拍摄单元28所拍摄的切削槽的崩边数据(在切削槽的两侧所产生的缺损的数据)进行记录的记录单元发挥功能。另外,在控制单元30的只读存储器34中保存有如下的控制程序:作为根据随机存取存储器36中所记录的崩边数据而确定在被加工物上形成切削槽的方向的判断单元发挥功能的控制程序;以及作为输出随机存取存储器36中所记录的崩边数据的输出单元发挥功能的控制程序等。另外,在控制单元30上电连接有显示随机存取存储器36中所记录的崩边数据的显示单元38。The random access memory 36 of the control unit 30 functions as a recording unit that records chipping data of the cutting groove (data of defects generated on both sides of the cutting groove) captured by the imaging unit 28 . In addition, in the read-only memory 34 of the control unit 30 is stored a control program that functions as a judging unit that determines the direction in which cutting grooves are to be formed on the workpiece based on chipping data recorded in the random access memory 36. and a control program that functions as an output unit that outputs the edge collapse data recorded in the random access memory 36, and the like. In addition, a display unit 38 for displaying edge chipping data recorded in the random access memory 36 is electrically connected to the control unit 30 .
这样,本实施方式的加工进给判定机构除了拍摄单元28和记录单元(随机存取存储器36)以外,还具有:判断单元,其根据记录单元中所记录的崩边数据而确定在被加工物上形成切削槽的方向;显示单元38,其显示崩边数据;以及输出单元,其输出崩边数据。In this way, in addition to the imaging unit 28 and the recording unit (random access memory 36), the machining feed judging mechanism of the present embodiment includes a judging unit that determines whether the edge chipping of the workpiece is performed based on the edge chipping data recorded in the recording unit. The direction in which the cutting groove is formed on; the display unit 38, which displays the chipping data; and the output unit, which outputs the chipping data.
这里,对通过切削装置2实施加工的被加工物进行说明。在图1和图2中还示出了作为被加工物的圆盘状的晶片40。如图2所示,晶片40的正面40a由格子状的分割预定线42划分成多个矩形区域,在多个矩形区域内分别形成有IC、LSI等器件44。另外,在晶片40的周缘形成有表示晶体取向的定向平面46。另外,在本实施方式中,将晶片40的背面40b粘贴于周缘固定于环状框架48的粘接带50上,也可以将晶片40的正面40a粘贴于粘接带50上。Here, the workpiece processed by the cutting device 2 will be described. Also shown in FIGS. 1 and 2 is a disk-shaped wafer 40 as a workpiece. As shown in FIG. 2 , the front surface 40 a of the wafer 40 is divided into a plurality of rectangular areas by grid-like dividing lines 42 , and devices 44 such as ICs and LSIs are respectively formed in the plurality of rectangular areas. In addition, an orientation flat 46 indicating crystal orientation is formed on the periphery of the wafer 40 . In addition, in this embodiment, the back surface 40b of the wafer 40 is attached to the adhesive tape 50 whose peripheral edge is fixed to the ring frame 48, but the front surface 40a of the wafer 40 may be attached to the adhesive tape 50.
参照图1继续对切削装置2进行说明。在切削装置2的装置壳体10上,将收纳有多张借助粘接带50而支承于环状框架48的晶片40的盒52载置于升降自如的盒载置台54。该盒载置台54通过具有滚珠丝杠和电动机的升降单元(未图示)而进行升降。另外,切削装置2还具有:搬入搬出单元58,其将切削前的晶片40从盒52中拉出并搬出至暂放工作台56,并且将定位于暂放工作台56的切削完成的晶片40搬入至盒52中;第一搬送机构60,其将从盒52中搬出至暂放工作台56的切削前的晶片40搬送至卡盘工作台12;清洗单元62,其对切削完成的晶片40进行清洗;以及第二搬送机构64,其将切削完成的晶片40从卡盘工作台12搬送至清洗单元62。The description of the cutting device 2 will continue with reference to FIG. 1 . On the device case 10 of the cutting device 2 , a cassette 52 containing a plurality of wafers 40 supported by an annular frame 48 via an adhesive tape 50 is placed on a cassette mounting table 54 which can be moved up and down. The cartridge mounting table 54 is raised and lowered by a lifting unit (not shown) having a ball screw and a motor. In addition, the cutting device 2 further includes: a loading and unloading unit 58 that pulls out the wafer 40 before cutting from the cassette 52 and carries it out to the temporary storage table 56, and places the chipped wafer 40 positioned on the temporary storage table 56 Carried into the box 52; the first transfer mechanism 60, which will be carried out from the box 52 to the wafer 40 before cutting of the temporarily placed workbench 56 to the chuck workbench 12; cleaning; and the second transfer mechanism 64 , which transfers the chipped wafer 40 from the chuck table 12 to the cleaning unit 62 .
在使用切削装置2将晶片40按照每个器件44分割成各个器件芯片时,首先使晶片40的正面40a朝上而利用卡盘工作台12的上表面对晶片40进行吸引保持,利用多个夹具16对环状框架48进行固定。接着,利用拍摄单元28从上方对晶片40进行拍摄,根据拍摄单元28所拍摄的晶片40的图像,使分割预定线42与X轴方向一致,并且将切削刀具22定位于与X轴方向一致的分割预定线42的上方。接着,利用电动机使切削刀具22与主轴20一起旋转。When using the cutting device 2 to divide the wafer 40 into individual device chips for each device 44, firstly, the wafer 40 is sucked and held by the upper surface of the chuck table 12 with the front surface 40a of the wafer 40 facing upward, and a plurality of chucks are used to hold the wafer 40. 16 is fixed to the ring frame 48. Next, the wafer 40 is photographed from above by the photographing unit 28, and the planned dividing line 42 is aligned with the X-axis direction based on the image of the wafer 40 photographed by the photographing unit 28, and the cutting tool 22 is positioned in the same position as the X-axis direction. Above the planned dividing line 42 . Next, the cutting tool 22 is rotated together with the spindle 20 by a motor.
接着,如图2所示,使主轴壳体18下降而使切削刀具22的刃尖在与X轴方向一致的分割预定线42上从晶片40的正面40a切入直至到达背面40b,并且将卡盘工作台12在X轴方向上相对于切削单元6相对地进行加工进给而沿着分割预定线42实施形成切削槽66的切削加工。接着,按照分割预定线42的Y轴方向间隔,一边将切削单元6在Y轴方向上相对于卡盘工作台12进行分度进给一边重复进行切削加工,在与X轴方向一致的所有分割预定线42上形成切削槽66。接着,在使卡盘工作台12旋转90度之后,一边进行分度进给一边重复进行切削加工,在与先形成了切削槽66的分割预定线42垂直的所有分割预定线42上也形成切削槽66。这样,将晶片40按照每个器件44分割成各个器件芯片。Next, as shown in FIG. 2 , the spindle housing 18 is lowered so that the edge of the cutting tool 22 cuts in from the front surface 40 a of the wafer 40 until it reaches the back surface 40 b on the planned division line 42 coincident with the X-axis direction, and the chuck The table 12 performs machining feed in the X-axis direction relative to the cutting unit 6 , and performs cutting machining to form the cutting groove 66 along the planned dividing line 42 . Then, according to the Y-axis direction interval of the dividing line 42, while the cutting unit 6 is indexed and fed relative to the chuck table 12 in the Y-axis direction, the cutting process is repeated, and all the divisions consistent with the X-axis direction are repeated. A cutting groove 66 is formed on the predetermined line 42 . Next, after rotating the chuck table 12 by 90 degrees, the cutting process is repeated while performing index feeding, and cutting is also formed on all the planned dividing lines 42 perpendicular to the planned dividing lines 42 on which the cutting grooves 66 were previously formed. Slot 66. In this way, the wafer 40 is divided into individual device chips for each device 44 .
在本实施方式的切削装置2中,在实施上述切削加工之前,实施如下的测试加工而确定形成切削槽66的适当的方向,从而能够生成崩边少的品质良好的器件芯片。In the cutting device 2 of the present embodiment, before performing the above-mentioned cutting process, the following test process is performed to determine an appropriate direction for forming the cutting groove 66, thereby producing a high-quality device chip with less chipping.
在测试加工中,首先将从第一方向对晶片40进行切削而得的切削槽的第一崩边数据记录在记录单元中。在本实施方式中,将定向平面46定位于图3的下侧,从图3的左侧朝向右侧对晶片40进行切削而形成切削槽66a。接着,利用拍摄单元28对包含形成于晶片40的正面40a的切削槽66a的区域进行拍摄,对拍摄得到的图像进行解析,将切削槽66a的崩边数据(第一崩边数据)如图7所示那样记录在作为记录单元的随机存取存储器36中。在图3的(b)中用标号68a示出形成切削槽66a时所产生的崩边的例子。In the test process, firstly, the first edge chipping data of the cutting groove obtained by cutting the wafer 40 from the first direction is recorded in the recording unit. In this embodiment, the orientation flat 46 is positioned on the lower side in FIG. 3 , and the wafer 40 is cut from the left side toward the right side in FIG. 3 to form the cutting groove 66 a. Next, the area including the cutting groove 66a formed on the front surface 40a of the wafer 40 is photographed by the imaging unit 28, and the captured image is analyzed, and the chipping data (first chipping data) of the chipping groove 66a is shown in FIG. 7 It is recorded as shown in the random access memory 36 as a recording unit. An example of chipping that occurs when forming the cutting groove 66a is shown by reference numeral 68a in FIG. 3(b).
记录在记录单元的崩边数据中包含崩边的大小、数量。当在记录单元中记录崩边数据时,例如可以按照小于5μm、5μm以上且小于10μm、10μm以上等崩边的大小划分而对崩边的数量进行记录。崩边的数量可以对在规定的长度(例如1cm)中所存在的崩边的数量进行测量,或者也可以沿着切削槽的全长对崩边的数量进行测量。另外,也可以作为崩边数据将包含切削槽的区域的图像记录在记录单元中。The chipping data recorded in the recording unit includes the size and quantity of chipping. When recording chipping data in the recording unit, for example, the number of chipping can be recorded according to size of chipping such as less than 5 μm, 5 μm or more, less than 10 μm, or 10 μm or more. The number of chipping may be measured in a predetermined length (for example, 1 cm), or the number of chipping may be measured along the entire length of the cutting flute. In addition, an image of a region including a cutting groove may be recorded in the recording unit as chipping data.
在记录了第一崩边数据之后,将从与第一方向相反的方向对晶片40进行切削而得的切削槽的第二崩边数据记录在记录单元中。在本实施方式中,使晶片40从图3的(a)所示的位置旋转180度,将定向平面46定位于图4的(a)的上侧,从图4的(a)的左侧朝向右侧对晶片40进行切削而形成切削槽66b。接着,利用拍摄单元28对包含形成于晶片40的正面40a的切削槽66b的区域进行拍摄,将所拍摄的切削槽66b的崩边数据(第二崩边数据)如图7所示那样记录在记录单元中。在本实施方式中,如图4的(b)所示,在形成切削槽66b时,未产生崩边。After recording the first chipping data, the second chipping data of the cutting groove obtained by cutting the wafer 40 from the direction opposite to the first direction is recorded in the recording unit. In this embodiment, the wafer 40 is rotated 180 degrees from the position shown in FIG. The wafer 40 is cut toward the right side to form the cutting groove 66b. Next, the area including the cutting groove 66b formed on the front surface 40a of the wafer 40 is photographed by the imaging unit 28, and the edge chipping data (second edge chipping data) of the imaged cutting groove 66b is recorded in the in the recording unit. In this embodiment, as shown in FIG. 4( b ), chipping does not occur when the cutting groove 66 b is formed.
在记录了第二崩边数据之后,将从与第一方向交叉的第二方向对晶片40进行切削而得的切削槽的第三崩边数据记录在记录单元中。在本实施方式中,使晶片40从图3的(a)所示的位置从纸面上方看逆时针地旋转90度,将定向平面46定位于图5的(a)的右侧,从图5的(a)的左侧朝向右侧对晶片40进行切削而形成切削槽66c。接着,利用拍摄单元28对包含形成于晶片40的正面40a的切削槽66c的区域进行拍摄,将所拍摄的切削槽66c的崩边数据(第三崩边数据)如图7所示那样记录在记录单元中。在图5的(b)中用标号68c示出形成切削槽66c时所生成的崩边的例子。After recording the second chipping data, the third chipping data of the cutting groove obtained by cutting the wafer 40 from the second direction intersecting the first direction is recorded in the recording unit. In this embodiment, the wafer 40 is rotated 90 degrees counterclockwise from the position shown in FIG. 5(a) cuts the wafer 40 from the left side to the right side to form the cutting groove 66c. Next, the area including the cutting groove 66c formed on the front surface 40a of the wafer 40 is photographed by the imaging unit 28, and the edge chipping data (third edge chipping data) of the imaged cutting groove 66c is recorded in the in the recording unit. An example of chipping generated when forming the cutting groove 66c is shown by reference numeral 68c in FIG. 5(b).
在记录了第三崩边数据之后,将从与第二方向相反的方向对晶片40进行切削而得的切削槽的第四崩边数据记录在记录单元中。在本实施方式中,使晶片40从图3的(a)所示的位置从纸面上方看顺时针地旋转90度,将定向平面46定位于图6的(a)的左侧,从图6的(a)的左侧朝向右侧对晶片40进行切削而形成切削槽66d。接着,利用拍摄单元28对包含形成于晶片40的正面40a的切削槽66d的区域进行拍摄,将所拍摄的切削槽66d的崩边数据(第四崩边数据)如图7所示那样记录在记录单元中。在本实施方式中,如图6的(b)所示,在形成切削槽66d时,未产生崩边。After recording the third chipping data, the fourth chipping data of the cutting groove obtained by cutting the wafer 40 from the direction opposite to the second direction is recorded in the recording unit. In this embodiment, the wafer 40 is rotated 90 degrees clockwise from the position shown in FIG. 6(a) cuts the wafer 40 from the left side toward the right side to form the cutting groove 66d. Next, the area including the cutting groove 66d formed on the front surface 40a of the wafer 40 is photographed by the imaging unit 28, and the edge chipping data (fourth edge chipping data) of the imaged cutting groove 66d is recorded in the in the recording unit. In the present embodiment, as shown in FIG. 6( b ), chipping did not occur when the cutting groove 66 d was formed.
在记录了第一~第四崩边数据之后,对记录在记录单元的第一~第四崩边数据进行比较而确定要在切削加工中形成切削槽的方向。切削槽的形成方向的确定在本实施方式中通过切削装置2的判断单元进行,但也可以由操作者进行。操作者将第一~第四崩边数据显示于显示单元38、或者将第一~第四崩边数据以如图7所示的图表的形式利用输出单元输出(印刷等),从而能够确定切削槽的形成方向。After the first to fourth chipping data are recorded, the direction in which cutting grooves are to be formed in the cutting process is determined by comparing the first to fourth chipping data recorded in the recording unit. The determination of the formation direction of the cutting groove is performed by the determination means of the cutting device 2 in this embodiment, but it may be performed by an operator. The operator displays the first to fourth edge chipping data on the display unit 38, or outputs (prints, etc.) the first to fourth edge chipping data in the form of a graph as shown in FIG. The direction in which the groove is formed.
对本实施方式中的切削槽的形成方向的确定进行说明,首先在对从第一方向对晶片40进行切削而得的切削槽66a的第一崩边数据和从与第一方向相反的方向对晶片40进行切削而得的切削槽66b的第二崩边数据进行比较时,在切削槽66a的两侧产生崩边,在切削槽66b的两侧未产生崩边,因此关于与定向平面46平行的方向,将与第一方向相反的方向确定为切削槽的形成方向。Determination of the formation direction of the cutting groove in this embodiment will be described. First, the first edge chipping data of the cutting groove 66a obtained by cutting the wafer 40 from the first direction and the wafer 40 from the direction opposite to the first direction will be described. When comparing the second edge chipping data of the cutting groove 66b obtained by cutting at 40, edge chipping occurs on both sides of the cutting groove 66a, but no edge chipping occurs on both sides of the cutting groove 66b. direction, the direction opposite to the first direction is determined as the formation direction of the cutting groove.
另外,关于与定向平面46垂直的方向,在对从第二方向对晶片40进行切削而得的切削槽66c的第三崩边数据和从与第二方向相反的方向对晶片40进行切削而得的切削槽66d的第四崩边数据进行比较时,在切削槽66c的两侧产生崩边,在切削槽66d的两侧未产生崩边,因此将与第二方向相反的方向确定为切削槽的形成方向。In addition, regarding the direction perpendicular to the orientation plane 46, the third edge chipping data obtained by cutting the wafer 40 from the second direction and the third chipping data obtained by cutting the wafer 40 from the direction opposite to the second direction When comparing the fourth edge chipping data of the cutting groove 66d, edge chipping occurs on both sides of the cutting groove 66c, and edge chipping does not occur on both sides of the cutting groove 66d, so the direction opposite to the second direction is determined as the cutting groove direction of formation.
在对崩边数据进行比较时,基本上将崩边的数量较少的方向确定为切削槽的形成方向,但从给器件芯片的抗弯强度等带来的影响的观点出发,在崩边的数量较多的情况下,将形成有尺寸较小的崩边的方向确定为切削槽的形成方向。例如,当在第一方向上形成5个小于5μm的崩边而在与第一方向相反的方向上形成3个10μm以上的崩边的情况下,将第一方向确定为切削槽的形成方向。When comparing edge chipping data, the direction in which the number of chipping is small is basically determined as the direction in which the cutting groove is formed. However, from the viewpoint of the impact on the bending strength of the device chip, etc. When the number is large, the direction in which chipping with a small size is formed is determined as the direction in which the cutting groove is formed. For example, when five chippings of less than 5 μm are formed in the first direction and three chippings of 10 μm or more are formed in the direction opposite to the first direction, the first direction is determined as the formation direction of the cutting groove.
如上所述,在本实施方式的切削装置2中,对第一~第四崩边数据进行比较而能够确定形成切削槽的方向,因此能够从适当的方向对晶片40进行切削而生成崩边少的品质良好的器件芯片。As described above, in the cutting device 2 of the present embodiment, the direction in which the cutting grooves are formed can be specified by comparing the first to fourth chipping data, so the wafer 40 can be cut from an appropriate direction with less chipping. Good quality device chips.
另外,在本实施方式中,利用拍摄单元28对包含形成于晶片40的正面40a的切削槽66a~66d的各区域进行拍摄而将第一~第四崩边数据记录在记录单元中,但除了这样的正面40a侧的崩边数据以外,也可以将晶片40的背面40b侧的背面崩边数据记录在记录单元中。In addition, in this embodiment, the first to fourth edge chipping data are recorded in the recording unit by imaging each area including the cutting grooves 66a to 66d formed on the front surface 40a of the wafer 40 by the imaging unit 28. In addition to such edge chipping data on the front side 40 a side, back side chipping data on the back side 40 b side of the wafer 40 may be recorded in the recording unit.
具体而言,也可以是,使拍摄单元28的焦点对齐在朝向下方的晶片40的背面40b,通过透过晶片40的波长的光(例如红外线)而利用拍摄单元28对晶片40的背面40b的切削槽66a~66d的各区域进行拍摄,将切削槽66a的背面40b侧的第一背面崩边数据、切削槽66b的背面40b侧的第二背面崩边数据、切削槽66c的背面40b侧的第三背面崩边数据以及切削槽66d的背面40b侧的第四背面崩边数据记录在记录单元中。并且,除了晶片40的正面40a侧的第一~第四崩边数据以外,还可以对晶片40的背面40b侧的第一~第四背面崩边数据进行比较而确定形成切削槽的方向。Specifically, it is also possible to align the focus of the imaging unit 28 on the back surface 40b of the wafer 40 facing downward, and use the imaging unit 28 to focus on the back surface 40b of the wafer 40 by light of a wavelength that passes through the wafer 40 (for example, infrared rays). Each region of the cutting grooves 66a to 66d is photographed, and the first backside chipping data on the backside 40b side of the cutting groove 66a, the second backside chipping data on the backside 40b side of the cutting groove 66b, and the data on the backside 40b side of the cutting groove 66c are captured. The third back chipping data and the fourth back chipping data on the back side 40b side of the cutting groove 66d are recorded in the recording unit. Furthermore, in addition to the first to fourth chipping data on the front side 40a side of the wafer 40, the first to fourth chipping data on the back side 40b side of the wafer 40 may be compared to determine the direction in which the cutting groove is formed.
另外,优选将拍摄单元28兼用作在对准单元中使用的拍摄单元,该对准单元在对晶片40进行切削之前对要切削的区域进行检测。In addition, it is preferable that the imaging unit 28 is also used as an imaging unit used in an alignment unit that detects a region to be cut before cutting the wafer 40 .
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