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CN110828486A - Display panel manufacturing method and display panel - Google Patents

Display panel manufacturing method and display panel Download PDF

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CN110828486A
CN110828486A CN201911135610.1A CN201911135610A CN110828486A CN 110828486 A CN110828486 A CN 110828486A CN 201911135610 A CN201911135610 A CN 201911135610A CN 110828486 A CN110828486 A CN 110828486A
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channel
dose
substrate
mask
hydrogen ions
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CN110828486B (en
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万康
冯兵明
顾维杰
葛泳
马应海
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Yungu Guan Technology Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10OLED displays
    • H10K59/12Active-matrix OLED [AMOLED] displays
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/751Insulated-gate field-effect transistors [IGFET] having composition variations in the channel regions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01Manufacture or treatment
    • H10D86/021Manufacture or treatment of multiple TFTs
    • H10D86/0221Manufacture or treatment of multiple TFTs comprising manufacture, treatment or patterning of TFT semiconductor bodies
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/421Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10OLED displays
    • H10K59/12Active-matrix OLED [AMOLED] displays
    • H10K59/1201Manufacture or treatment

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Abstract

本发明公开了一种显示面板的制作方法和显示面板。该包括:提供基板;在基板上形成沟道,沟道包括第一沟道和第二沟道;使所述第一沟道和所述第二沟道包含不同浓度的氢离子;基于沟道形成阵列器件,阵列器件包括基于第一沟道形成的驱动晶体管以及基于第二沟道形成的开关晶体管;在阵列器件远离基板的一侧形成发光器件层。通过使所述第一沟道和所述第二沟道包含不同浓度的氢离子,使第一沟道对应的驱动晶体管和第二沟道对应的开关晶体管的亚阈值摆幅不同,从而可以使驱动晶体管满足对灰阶的控制,同时使开关晶体管可以有较快的开关速度。

Figure 201911135610

The invention discloses a manufacturing method of a display panel and a display panel. The method includes: providing a substrate; forming a channel on the substrate, the channel includes a first channel and a second channel; making the first channel and the second channel contain hydrogen ions with different concentrations; based on the channel An array device is formed, the array device includes a driving transistor formed based on the first channel and a switching transistor formed based on the second channel; a light emitting device layer is formed on the side of the array device away from the substrate. By making the first channel and the second channel contain different concentrations of hydrogen ions, the sub-threshold swings of the driving transistor corresponding to the first channel and the switching transistor corresponding to the second channel are different, so that the The driving transistor satisfies the control of the gray scale, and at the same time enables the switching transistor to have a faster switching speed.

Figure 201911135610

Description

显示面板的制作方法和显示面板Display panel manufacturing method and display panel

技术领域technical field

本发明实施例涉及显示技术领域,尤其涉及一种显示面板的制作方法和显示面板。Embodiments of the present invention relate to the field of display technology, and in particular, to a method for fabricating a display panel and a display panel.

背景技术Background technique

现有技术中,显示面板中的驱动晶体管和开关晶体管的制程相同,导致驱动晶体管和开关晶体管的亚阈值摆幅大小相等,不利于驱动晶体管对灰阶的控制的同时开关晶体管实现快速导通。In the prior art, the driving transistors and the switching transistors in the display panel have the same manufacturing process, resulting in equal subthreshold swings of the driving transistors and the switching transistors, which is not conducive to the grayscale control of the driving transistors and the rapid turn-on of the switching transistors.

发明内容SUMMARY OF THE INVENTION

本发明提供一种显示面板的制作方法和显示面板,以实现开关晶体管和驱动晶体管分别满足不同的亚阈值摆幅要求。The invention provides a manufacturing method of a display panel and a display panel, so as to realize that the switching transistor and the driving transistor respectively meet different sub-threshold swing requirements.

第一方面,本发明实施例提供了一种显示面板的制作方法,包括:In a first aspect, an embodiment of the present invention provides a method for fabricating a display panel, including:

提供基板;provide the substrate;

在所述基板上形成沟道,所述沟道包括第一沟道和第二沟道;forming a channel on the substrate, the channel includes a first channel and a second channel;

使所述第一沟道和所述第二沟道包含不同浓度的氢离子;causing the first channel and the second channel to contain different concentrations of hydrogen ions;

基于所述沟道形成阵列器件,所述阵列器件包括基于所述第一沟道形成的驱动晶体管以及基于所述第二沟道形成的开关晶体管;An array device is formed based on the channel, and the array device includes a driving transistor formed based on the first channel and a switching transistor formed based on the second channel;

在所述阵列器件远离所述基板的一侧形成发光器件层。A light emitting device layer is formed on a side of the array device away from the substrate.

可选地,使所述第一沟道和所述第二沟道包含不同浓度的氢离子,包括:Optionally, the first channel and the second channel contain hydrogen ions of different concentrations, including:

在所述沟道远离所述基板的一侧设置第一掩膜版,所述第一掩膜版的开口区对应所述第一沟道,所述第一掩膜版的非开口区对应所述第二沟道;A first mask is arranged on the side of the channel away from the substrate, the opening area of the first mask corresponds to the first channel, and the non-open area of the first mask corresponds to the the second channel;

采用第一剂量和第一掺杂能量的氢离子注入所述第一沟道;implanting the first channel with hydrogen ions of a first dose and a first doping energy;

去除所述第一掩膜版;在所述沟道远离所述基板的一侧设置第二掩膜版,所述第二掩膜版的开口区对应所述第二沟道,所述第二掩膜版的非开口区对应所述第一沟道;removing the first mask; setting a second mask on the side of the channel away from the substrate, the opening area of the second mask corresponds to the second channel, the second mask The non-open area of the mask corresponds to the first channel;

采用第二剂量和第二掺杂能量的氢离子注入所述第二沟道,以使所述第二沟道的氢离子浓度与所述第一沟道不同。The second channel is implanted with hydrogen ions with a second dose and a second doping energy, so that the hydrogen ion concentration of the second channel is different from that of the first channel.

可选地,所述第一沟道为驱动晶体管的沟道,所述第二沟道为开关晶体管的沟道,所述第一剂量小于所述第二剂量,且所述第一掺杂能量小于所述第二掺杂能量。Optionally, the first channel is a channel of a driving transistor, the second channel is a channel of a switching transistor, the first dose is smaller than the second dose, and the first doping energy less than the second doping energy.

可选地,所述第一剂量的范围小于或等于1E+12ions/cm2,所述第二剂量的范围为3E+12—5E+12ions/cm2,所述第一掺杂能量和所述第二掺杂能量的范围为小于或等于5KV。Optionally, the range of the first dose is less than or equal to 1E+12ions/cm2, the range of the second dose is 3E+12-5E+12ions/cm2, the first doping energy and the second The range of doping energy is less than or equal to 5KV.

可选地,使所述第一沟道和所述第二沟道包含不同浓度的氢离子,还包括:Optionally, causing the first channel and the second channel to contain hydrogen ions with different concentrations, further comprising:

在所述沟道远离所述基板的一侧形成栅极绝缘层;forming a gate insulating layer on a side of the channel away from the substrate;

在所述栅极绝缘层远离所述基板的一侧设置第一掩膜版,所述第一掩膜版的开口区对应所述第一沟道,所述第一掩膜版的非开口区对应所述第二沟道;A first mask is disposed on the side of the gate insulating layer away from the substrate, the opening area of the first mask corresponds to the first channel, and the non-opening area of the first mask corresponding to the second channel;

采用第三剂量和第三掺杂能量的氢离子注入所述第一沟道;implanting the first channel with hydrogen ions at a third dose and a third doping energy;

去除所述第一掩膜版;在所述栅极绝缘层远离所述基板的一侧设置第二掩膜版,所述第二掩膜版的开口区对应所述第二沟道,所述第二掩膜版的非开口区对应所述第一沟道;removing the first mask; setting a second mask on the side of the gate insulating layer away from the substrate, the opening area of the second mask corresponds to the second channel, the The non-open area of the second mask corresponds to the first channel;

采用第四剂量和第四掺杂能量的氢离子注入所述第二沟道。The second channel is implanted with hydrogen ions at a fourth dose and a fourth doping energy.

可选地,所述第一沟道为驱动晶体管的沟道,所述第二沟道为开关晶体管的沟道,所述第三剂量小于所述第四剂量,且所述第三掺杂能量小于所述第四掺杂能量。Optionally, the first channel is a channel of a driving transistor, the second channel is a channel of a switching transistor, the third dose is smaller than the fourth dose, and the third doping energy less than the fourth doping energy.

可选地,所述第三剂量的范围小于或等于1E+12ions/cm2,所述第四剂量的范围为3E+12—5E+12ions/cm2,所述第三掺杂能量和所述第四掺杂能量的范围为5KV-10KV。Optionally, the range of the third dose is less than or equal to 1E+12ions/cm2, the range of the fourth dose is 3E+12-5E+12ions/cm2, the third doping energy and the fourth The range of doping energy is 5KV-10KV.

可选地,在所述基板上形成沟道之后,还包括:Optionally, after the channel is formed on the substrate, the method further includes:

对所述沟道注入氟离子。Fluoride ions are implanted into the channel.

可选地,对所述沟道注入氟离子时,所述氟离子的注入剂量为1E+12—2E+12ions/cm2,掺杂能量为10KV。Optionally, when fluorine ions are implanted into the channel, the implantation dose of the fluorine ions is 1E+12-2E+12 ions/cm 2 , and the doping energy is 10KV.

第二方面,本发明实施例提供了一种显示面板,采用本发明任意实施例提供的显示面板的制作方法制作。In a second aspect, an embodiment of the present invention provides a display panel, which is manufactured by using the manufacturing method of a display panel provided by any embodiment of the present invention.

本发明实施例的技术方案,通过使所述第一沟道和所述第二沟道包含不同浓度的氢离子,使第一沟道对应的驱动晶体管和第二沟道对应的开关晶体管的亚阈值摆幅不同,从而可以使驱动晶体管满足对灰阶的控制,同时使开关晶体管可以有较快的开关速度。In the technical solution of the embodiment of the present invention, by causing the first channel and the second channel to contain hydrogen ions of different concentrations, the sub-surface of the driving transistor corresponding to the first channel and the switching transistor corresponding to the second channel are The threshold swings are different, so that the driving transistor can satisfy the gray-scale control, and at the same time, the switching transistor can have a faster switching speed.

附图说明Description of drawings

图1为本发明实施例提供的一种显示面板的制作方法;FIG. 1 is a manufacturing method of a display panel provided by an embodiment of the present invention;

图2为本发明实施例提供的显示面板的制作方法的步骤S110对应的显示面板结构示意图;FIG. 2 is a schematic structural diagram of a display panel corresponding to step S110 of the method for manufacturing a display panel according to an embodiment of the present invention;

图3为本发明实施例提供的显示面板的制作方法的步骤S120对应的显示面板结构示意图;FIG. 3 is a schematic structural diagram of a display panel corresponding to step S120 of the method for manufacturing a display panel according to an embodiment of the present invention;

图4为现有的一种像素驱动电路的电路示意图;4 is a schematic circuit diagram of a conventional pixel driving circuit;

图5为本发明实施例提供的显示面板的制作方法的步骤S140对应的显示面板结构示意图;FIG. 5 is a schematic structural diagram of a display panel corresponding to step S140 of the method for fabricating a display panel according to an embodiment of the present invention;

图6为本发明实施例提供的显示面板的制作方法的步骤S150对应的显示面板结构示意图;6 is a schematic structural diagram of a display panel corresponding to step S150 of the method for fabricating a display panel according to an embodiment of the present invention;

图7为本发明实施例提供的另一种显示面板的制作方法;FIG. 7 is another manufacturing method of a display panel provided by an embodiment of the present invention;

图8为本发明实施例提供的显示面板的制作方法的步骤S230对应的制作流程图;FIG. 8 is a manufacturing flowchart corresponding to step S230 of the manufacturing method of the display panel provided by the embodiment of the present invention;

图9为本发明实施例提供的显示面板的制作方法的步骤S250对应的制作流程图;FIG. 9 is a manufacturing flowchart corresponding to step S250 of the manufacturing method of the display panel provided by the embodiment of the present invention;

图10为本发明实施例提供的另一种显示面板的制作方法;FIG. 10 is another manufacturing method of a display panel provided by an embodiment of the present invention;

图11为本发明实施例提供的显示面板的制作方法的步骤S330对应的显示面板结构示意图;11 is a schematic structural diagram of a display panel corresponding to step S330 of the method for fabricating a display panel according to an embodiment of the present invention;

图12为本发明实施例提供的显示面板的制作方法的步骤S340对应的制作流程图;FIG. 12 is a manufacturing flowchart corresponding to step S340 of the manufacturing method of the display panel provided by the embodiment of the present invention;

图13为本发明实施例提供的显示面板的制作方法的步骤S360对应的制作流程图;13 is a manufacturing flowchart corresponding to step S360 of the manufacturing method of the display panel provided by the embodiment of the present invention;

图14为本发明实施例提供的另一种显示面板的制作方法;FIG. 14 is another manufacturing method of a display panel provided by an embodiment of the present invention;

图15为本发明实施例提供的一种显示面板的结构示意图。FIG. 15 is a schematic structural diagram of a display panel according to an embodiment of the present invention.

具体实施方式Detailed ways

下面结合附图和实施例对本发明作进一步的详细说明。可以理解的是,此处所描述的具体实施例仅仅用于解释本发明,而非对本发明的限定。另外还需要说明的是,为了便于描述,附图中仅示出了与本发明相关的部分而非全部结构。The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention. In addition, it should be noted that, for the convenience of description, the drawings only show some but not all structures related to the present invention.

现有技术中,有机发光显示(organic light emitting display,OLED)面板一般分为主动矩阵式有机发光显示(active matrix organic light emitting display,AMOLED)面板和被动矩阵式有机发光显示(passive matrix organic light emittingdisplay,PMOLED)面板。其中,AMOLED面板通常使用低温多晶硅薄膜晶体管(low-temperature polycrystalline silicon thin film transistor,LTPS TFT)形成像素驱动电路驱动AMOLED面板中的有机发光二极管(organic light emitting diode,OLED)发光。在LTPS TFT驱动OLED发光的过程中,LTPS TFT形成的像素驱动电路包括开关晶体管和驱动晶体管。开关晶体管用于开关作用,通常要求开关晶体管具有低亚阈值摆幅(sub-threshold swing,S.S),使得其导通电流随电压的变化比较大,以保证开关晶体管具有快速充放电的目的,使开关晶体管具有很好的开关性能。驱动晶体管用于驱动OLED发光作用,通常要求驱动晶体管具有较高的亚阈值摆幅,使得其导通电流随电压的变化比较小,以保证驱动晶体管输出的导通电流比较稳定,有利于像素驱动电路驱动OLED发光时对灰阶的控制。晶体管的亚阈值摆幅通常与晶体管的迁移率、栅极电容和有源层沟道的长宽比等相关。但是在显示面板中,驱动晶体管和开关晶体管的工艺制程相同,使得驱动晶体管和开关晶体管具有相同的亚阈值摆幅,因此不利于驱动晶体管对灰阶的控制或开关晶体管驱的开关速度。In the prior art, organic light emitting display (organic light emitting display, OLED) panels are generally classified into active matrix organic light emitting display (active matrix organic light emitting display, AMOLED) panels and passive matrix organic light emitting display (passive matrix organic light emitting display) panels. , PMOLED) panel. Among them, the AMOLED panel usually uses a low-temperature polycrystalline silicon thin film transistor (LTPS TFT) to form a pixel driving circuit to drive the organic light emitting diode (OLED) in the AMOLED panel to emit light. In the process of driving the OLED to emit light by the LTPS TFT, the pixel driving circuit formed by the LTPS TFT includes a switching transistor and a driving transistor. The switching transistor is used for switching, and the switching transistor is usually required to have a low sub-threshold swing (S.S), so that its on-current varies greatly with the voltage, so as to ensure that the switching transistor has the purpose of fast charging and discharging, so that the The switching transistor has good switching performance. The driving transistor is used to drive the OLED light-emitting effect. Usually, the driving transistor is required to have a high sub-threshold swing, so that the change of the on-current with the voltage is relatively small, so as to ensure that the on-current output by the driving transistor is relatively stable, which is conducive to pixel driving. The control of the gray scale when the circuit drives the OLED to emit light. The subthreshold swing of a transistor is usually related to the mobility of the transistor, the gate capacitance, and the aspect ratio of the active layer channel. However, in the display panel, the driving transistor and the switching transistor have the same process, so that the driving transistor and the switching transistor have the same sub-threshold swing, which is not conducive to the grayscale control of the driving transistor or the switching speed of the switching transistor.

针对上述技术问题,本发明实施例提供了一种显示面板的制作方法。图1为本发明实施例提供的一种显示面板的制作方法。在本发明的一个实施例中,有源层具体是指晶体管的沟道。如图1所示,该显示面板的制作方法包括:In view of the above technical problems, embodiments of the present invention provide a method for fabricating a display panel. FIG. 1 is a manufacturing method of a display panel provided by an embodiment of the present invention. In one embodiment of the present invention, the active layer specifically refers to a channel of a transistor. As shown in Figure 1, the manufacturing method of the display panel includes:

S110、提供基板。S110, providing a substrate.

具体地,图2为本发明实施例提供的显示面板的制作方法的步骤S110对应的显示面板结构示意图。如图2所示,基板10可以为柔性基板,也可以为刚性基板。示例性地,柔性基板可以为聚酰亚胺(Polyimide,PI)基板,刚性基板可以为玻璃基板。Specifically, FIG. 2 is a schematic structural diagram of a display panel corresponding to step S110 of the method for manufacturing a display panel according to an embodiment of the present invention. As shown in FIG. 2 , the substrate 10 may be a flexible substrate or a rigid substrate. Exemplarily, the flexible substrate may be a polyimide (PI) substrate, and the rigid substrate may be a glass substrate.

S120、在基板上形成有源层,有源层包括第一有源层和第二有源层。具体地,在基板上形成第一沟道和第二沟道。S120 , forming an active layer on the substrate, where the active layer includes a first active layer and a second active layer. Specifically, the first channel and the second channel are formed on the substrate.

具体地,图3为本发明实施例提供的显示面板的制作方法的步骤S120对应的显示面板结构示意图。如图3所示,在基板10上形成沟道20,沟道20可以采用化学气相沉积(chemical vapor deposition,CVD)工艺形成。在形成沟道20后,沟道20远离基板的一侧形成刻蚀阻挡层,并通过刻蚀等工艺图案化沟道20,使沟道20形成第一沟道201和第二沟道202。第一沟道201和第二沟道202同层设置,且互不接触。第一沟道201和第二沟道202分别对应不同晶体管的沟道。示例性地,第一沟道201可以对应驱动晶体管的沟道,第二沟道202可以对应开关晶体管的沟道。Specifically, FIG. 3 is a schematic structural diagram of a display panel corresponding to step S120 of the method for fabricating a display panel according to an embodiment of the present invention. As shown in FIG. 3 , a channel 20 is formed on the substrate 10 , and the channel 20 may be formed by a chemical vapor deposition (chemical vapor deposition, CVD) process. After the channel 20 is formed, an etching barrier layer is formed on the side of the channel 20 away from the substrate, and the channel 20 is patterned by etching and other processes to form the first channel 201 and the second channel 202 in the channel 20 . The first channel 201 and the second channel 202 are disposed in the same layer and do not contact each other. The first channel 201 and the second channel 202 correspond to channels of different transistors, respectively. Exemplarily, the first channel 201 may correspond to the channel of the driving transistor, and the second channel 202 may correspond to the channel of the switching transistor.

另外,在形成第一沟道201和第二沟道202后,分别对第一沟道201和第二沟道202对应的源极区和漏极区进行开孔,使得后期形成的源漏极层对应的源极和漏极能够与第一沟道201和第二沟道202电连接。In addition, after the first channel 201 and the second channel 202 are formed, the source region and the drain region corresponding to the first channel 201 and the second channel 202 are respectively opened, so that the source and drain regions formed later are formed. The source and drain electrodes corresponding to the layers can be electrically connected to the first channel 201 and the second channel 202 .

需要说明的是,在形成沟道20之前,还可以在基板10上沉积缓冲层。缓冲层用于阻隔水氧等杂质,避免杂质进入到显示面板中影响器件的性能。缓冲层可以为二氧化硅或氮化硅等。It should be noted that, before forming the channel 20 , a buffer layer may also be deposited on the substrate 10 . The buffer layer is used to block impurities such as water and oxygen, so as to prevent impurities from entering the display panel and affecting the performance of the device. The buffer layer can be silicon dioxide, silicon nitride, or the like.

S130、使第一有源层和第二有源层包含不同浓度的氢离子。具体可以是指,使第一沟道和第二沟道包含不同的氢离子。S130. Make the first active layer and the second active layer contain hydrogen ions with different concentrations. Specifically, it may mean that the first channel and the second channel contain different hydrogen ions.

具体地,氢离子带有负电荷,在电场的作用下,氢离子可以实现移动。因此可以通过对沟道20的两侧施加电压,使得沟道20中产生电场,从而实现氢离子的注入。电场的大小影响氢离子移动的速率,氢离子的剂量影响注入至沟道20的氢离子浓度。因此通过调节沟道20两侧施加的电压大小和注入氢离子时氢离子的剂量即可控制氢离子注入至沟道20的深度和浓度。示例性地,继续参考图3,对第一沟道201和第二沟道202注入氢离子后,为了使第一沟道201和第二沟道202中的氢离子浓度不同,可以设置在注入过程中第一沟道201和第二沟道202的氢离子剂量不同,还可以设置在注入过程中第一沟道201和第二沟道202中的掺杂能量不同。Specifically, hydrogen ions have negative charges, and under the action of an electric field, hydrogen ions can move. Therefore, by applying a voltage to both sides of the channel 20, an electric field can be generated in the channel 20, thereby realizing the implantation of hydrogen ions. The magnitude of the electric field affects the rate at which hydrogen ions move, and the dose of hydrogen ions affects the concentration of hydrogen ions implanted into the channel 20 . Therefore, the depth and concentration of hydrogen ions implanted into the channel 20 can be controlled by adjusting the magnitude of the voltage applied on both sides of the channel 20 and the dose of hydrogen ions when implanting hydrogen ions. Exemplarily, continuing to refer to FIG. 3 , after hydrogen ions are implanted into the first channel 201 and the second channel 202 , in order to make the hydrogen ion concentrations in the first channel 201 and the second channel 202 different, the implantation During the process, the hydrogen ion doses of the first channel 201 and the second channel 202 are different, and the doping energy in the first channel 201 and the second channel 202 may also be different during the implantation process.

沟道20中的氢离子浓度影响晶体管的亚阈值摆幅。沟道20包括固定正电荷,氢离子可以与沟道20中的固定正电荷耦合,对沟道20的内部缺陷进行修复,从而可以减小沟道20对应的晶体管的亚阈值摆幅。当沟道20中的氢离子浓度比较大时,氢离可以更好地修复沟道20的内部缺陷,使得沟道20形成的晶体管的亚阈值摆幅比较小,具有很好的开关性能。当沟道20中的氢离子浓度比较小时,氢离子修复沟道20中内部缺陷的程度比较小,使得沟道20形成的晶体管的亚阈值摆幅比较大,驱动OLED发光时具有很好的稳定性。继续参考图3,第一沟道201注入后的氢离子浓度可以与第二沟道202注入后的氢离子浓度不同,使得第一沟道201形成的驱动晶体管与第二沟道202形成的开关晶体管的亚阈值摆幅不同。从而可以使驱动晶体管满足对灰阶的控制,同时使开关晶体管具有较好的开关速度。The concentration of hydrogen ions in the channel 20 affects the subthreshold swing of the transistor. The channel 20 includes fixed positive charges, and hydrogen ions can be coupled with the fixed positive charges in the channel 20 to repair the internal defects of the channel 20 , thereby reducing the subthreshold swing of the transistor corresponding to the channel 20 . When the hydrogen ion concentration in the channel 20 is relatively high, the hydrogen ion can better repair the internal defects of the channel 20, so that the subthreshold swing of the transistor formed by the channel 20 is relatively small, and has good switching performance. When the concentration of hydrogen ions in the channel 20 is relatively small, the degree of hydrogen ions repairing the internal defects in the channel 20 is relatively small, so that the sub-threshold swing of the transistor formed by the channel 20 is relatively large, and the OLED has good stability when driving OLED to emit light. sex. Continuing to refer to FIG. 3 , the hydrogen ion concentration after implantation in the first channel 201 may be different from the hydrogen ion concentration after implantation in the second channel 202 , so that the driving transistor formed by the first channel 201 and the switch formed by the second channel 202 Transistors have different subthreshold swings. Therefore, the driving transistor can satisfy the gray scale control, and at the same time, the switching transistor can have a better switching speed.

需要说明的是,对第一沟道201和第二沟道202注入氢离子时,可以对第一沟道201和第二沟道202整层注入,还可以在第一沟道201和第二沟道202图案化后进行注入,此处不做限定。It should be noted that when hydrogen ions are implanted into the first channel 201 and the second channel 202, the entire layer of the first channel 201 and the second channel 202 can be implanted, or the first channel 201 and the second channel 202 can be implanted in the whole layer. The channel 202 is patterned and then implanted, which is not limited here.

示例性地,图4为现有的一种像素驱动电路的电路示意图。如图4所示,该像素电路包括驱动晶体管Tdr和开关晶体管T1-T6。在复位阶段,第一扫描信号Scan1控制第四晶体管T4和第五晶体管T5导通,参考信号Vref写入OLED的阳极和驱动晶体管Tdr的栅极,以对OLED的阳极和驱动晶体管Tdr的栅极进行复位,另外,驱动晶体管Tdr处于导通状态。在写入和补偿阶段,第二扫描信号Scan2控制第一晶体管T1和第三晶体管T3导通,数据信号Vdata通过第一晶体管T1写入驱动晶体管Tdr的第一极,并通过第三晶体管T3提高驱动晶体管Tdr的栅极电位,直至驱动晶体管Tdr截止,此时驱动晶体管Tdr的第一极的电位为Vdata,栅极电位为Vdata-Vth(其中,Vth为驱动晶体管Tdr的阈值电压),并通过电容C1保持。在发光阶段,发光信号E1控制第二晶体管T2和第六晶体管T6导通,第一电源电压Vdd通过第二晶体管T2输入至驱动晶体管Tdr的第一极,驱动晶体管Tdr的第一极从Vdata提高到Vdd,驱动晶体管Tdr导通,然后通过第一极和栅极之间的电位差形成驱动电流通过第六晶体管T6输入至OLED的阳极,OLED的阴极与第二电源电压Vss电连接,从而驱动OLED发光。因此,当第一沟道201对应驱动晶体管的沟道,第二沟道202对应开关晶体管的沟道时,第一沟道201可以对应像素驱动电路中驱动晶体管Tdr的沟道,第二沟道202可以对应像素驱动电路中开关晶体管T1-T6的沟道。Exemplarily, FIG. 4 is a schematic circuit diagram of a conventional pixel driving circuit. As shown in FIG. 4 , the pixel circuit includes a driving transistor Tdr and switching transistors T1-T6. In the reset phase, the first scan signal Scan1 controls the fourth transistor T4 and the fifth transistor T5 to be turned on, and the reference signal Vref is written into the anode of the OLED and the gate of the driving transistor Tdr, so as to control the anode of the OLED and the gate of the driving transistor Tdr A reset is performed, and the drive transistor Tdr is turned on. In the writing and compensation stage, the second scan signal Scan2 controls the first transistor T1 and the third transistor T3 to be turned on, the data signal Vdata is written into the first pole of the driving transistor Tdr through the first transistor T1, and is increased through the third transistor T3 The gate potential of the driving transistor Tdr is turned off until the driving transistor Tdr is turned off. At this time, the potential of the first electrode of the driving transistor Tdr is Vdata, and the gate potential is Vdata-Vth (wherein, Vth is the threshold voltage of the driving transistor Tdr), and through the Capacitor C1 remains. In the light-emitting stage, the light-emitting signal E1 controls the second transistor T2 and the sixth transistor T6 to be turned on, the first power supply voltage Vdd is input to the first pole of the driving transistor Tdr through the second transistor T2, and the first pole of the driving transistor Tdr increases from Vdata To Vdd, the driving transistor Tdr is turned on, and then a driving current is formed through the potential difference between the first electrode and the gate electrode to be input to the anode of the OLED through the sixth transistor T6, and the cathode of the OLED is electrically connected to the second power supply voltage Vss, thereby driving OLED glows. Therefore, when the first channel 201 corresponds to the channel of the driving transistor and the second channel 202 corresponds to the channel of the switching transistor, the first channel 201 may correspond to the channel of the driving transistor Tdr in the pixel driving circuit, and the second channel 202 corresponds to the channel of the driving transistor Tdr in the pixel driving circuit. 202 may correspond to the channels of the switching transistors T1-T6 in the pixel driving circuit.

S140、基于有源层形成阵列器件,阵列器件包括基于第一有源层形成的驱动晶体管以及基于第二有源层形成的开关晶体管。S140 , forming an array device based on the active layer, the array device including a driving transistor formed based on the first active layer and a switching transistor formed based on the second active layer.

具体可以为,基于沟道形成阵列器件,列器件包括基于第一沟道形成的驱动晶体管以及基于第二沟道形成的开关晶体管。Specifically, an array device is formed based on a channel, and the column device includes a driving transistor formed based on the first channel and a switching transistor formed based on the second channel.

具体地,在形成阵列器件时,可以包括在沟道远离基板的一侧形成栅极绝缘层、栅极层、层间绝缘层和源漏极层。图5为本发明实施例提供的显示面板的制作方法的步骤S140对应的显示面板结构示意图。Specifically, when forming the array device, it may include forming a gate insulating layer, a gate layer, an interlayer insulating layer and a source and drain layer on the side of the channel away from the substrate. FIG. 5 is a schematic structural diagram of a display panel corresponding to step S140 of the method for fabricating a display panel according to an embodiment of the present invention.

以顶栅晶体管为例,如图5所示,沿沟道20远离基板10的一侧,栅极绝缘层31、栅极层30、层间绝缘层40和源漏极层50依次层叠设置。Taking a top-gate transistor as an example, as shown in FIG. 5 , along the side of the channel 20 away from the substrate 10 , the gate insulating layer 31 , the gate layer 30 , the interlayer insulating layer 40 and the source and drain layers 50 are stacked in sequence.

栅极绝缘层31与沟道20接触,并在栅极绝缘层31和沟道20之间形成界面缺陷,即栅极绝缘层31与沟道20之间形成悬挂键。注入的氢离子还可以与悬挂键耦合,实现对悬挂键的钝化,从而可以改善沟道20和栅极绝缘层31之间的界面缺陷,进而可以减小晶体管的亚阈值摆幅。当沟道20中的氢离子浓度比较大时,氢离子与悬挂键耦合的比较多,使得对应的晶体管的亚阈值摆幅比较小,具有很好的开关性能。当沟道20中的氢离子浓度比较小时,氢离子与悬挂键耦合的比较少,使得对应的晶体管的亚阈值摆幅比较大,驱动OLED发光时具有很好的稳定性。因此,通过对第一沟道201和第二沟道202注入不同剂量的氢离子,使得第一沟道201形成的晶体管与第二沟道202形成的晶体管的亚阈值摆幅不同。The gate insulating layer 31 is in contact with the channel 20 , and an interface defect is formed between the gate insulating layer 31 and the channel 20 , that is, a dangling bond is formed between the gate insulating layer 31 and the channel 20 . The implanted hydrogen ions can also be coupled with the dangling bonds to achieve passivation of the dangling bonds, thereby improving the interface defect between the channel 20 and the gate insulating layer 31, thereby reducing the subthreshold swing of the transistor. When the hydrogen ion concentration in the channel 20 is relatively large, the hydrogen ions are more coupled with the dangling bonds, so that the corresponding transistor has a relatively small sub-threshold swing and good switching performance. When the hydrogen ion concentration in the channel 20 is relatively small, the coupling between the hydrogen ions and the dangling bonds is relatively small, so that the subthreshold swing of the corresponding transistor is relatively large, and the OLED has good stability when driving the OLED to emit light. Therefore, by implanting different doses of hydrogen ions into the first channel 201 and the second channel 202 , the transistors formed by the first channel 201 and the transistors formed by the second channel 202 have different subthreshold swings.

栅极绝缘层31同样可以采用CVD沉积工艺形成。在形成栅极绝缘层31后,可以形成一层金属层作为栅极层30,栅极层30图案化后形成栅极。在形成栅极后,可以采用CVD沉积形成层间绝缘层40。在层间绝缘层40远离基板10的一侧形成源漏极层50。源漏极层50可以为金属层。并通过图案化形成源极51和漏极52。The gate insulating layer 31 can also be formed by a CVD deposition process. After the gate insulating layer 31 is formed, a metal layer may be formed as the gate electrode layer 30, and the gate electrode layer 30 is patterned to form a gate electrode. After the gate is formed, the interlayer insulating layer 40 may be formed using CVD deposition. The source and drain layers 50 are formed on the side of the interlayer insulating layer 40 away from the substrate 10 . The source and drain layers 50 may be metal layers. The source electrode 51 and the drain electrode 52 are formed by patterning.

需要说明的是,源极51和漏极52与沟道20的源极区和漏极区电连接,因此需要在栅极绝缘层31和层间绝缘层40上设置开孔。即在形成栅极绝缘层31后通过刻蚀阻挡层形成一开孔,在形成层间绝缘层40后通过刻蚀阻挡层形成另一开孔,并且源极51和漏极52分别通过栅极绝缘层31和层间绝缘层40上的开孔与沟道20上的源极区和漏极区电连接。It should be noted that the source electrode 51 and the drain electrode 52 are electrically connected to the source region and the drain region of the channel 20 , so it is necessary to provide openings on the gate insulating layer 31 and the interlayer insulating layer 40 . That is, an opening is formed by etching the barrier layer after the gate insulating layer 31 is formed, another opening is formed by etching the barrier layer after the interlayer insulating layer 40 is formed, and the source electrode 51 and the drain electrode 52 pass through the gate electrode respectively. The openings on the insulating layer 31 and the interlayer insulating layer 40 are electrically connected to the source and drain regions on the channel 20 .

S150、在阵列器件远离基板的一侧形成发光器件层。S150, forming a light emitting device layer on the side of the array device away from the substrate.

具体地,图6为本发明实施例提供的显示面板的制作方法的步骤S150对应的显示面板结构示意图。如图6所示,源漏极层50远离基板10的一侧形成有发光器件层60,用于在晶体管形成的像素驱动电路的驱动下发光。发光器件层60可以包括层叠设置的阳极层61、发光层62和阴极层63,阳极层61设置于源漏极层50和发光层62之间。阳极层61图案化形成的阳极通过像素驱动电路提供驱动信号,使发光器件层60发光。Specifically, FIG. 6 is a schematic structural diagram of a display panel corresponding to step S150 of the method for fabricating a display panel according to an embodiment of the present invention. As shown in FIG. 6 , a light-emitting device layer 60 is formed on the side of the source-drain layer 50 away from the substrate 10 for emitting light under the driving of a pixel driving circuit formed by a transistor. The light emitting device layer 60 may include a stacked anode layer 61 , a light emitting layer 62 and a cathode layer 63 , and the anode layer 61 is disposed between the source and drain layers 50 and the light emitting layer 62 . The anode formed by the patterning of the anode layer 61 provides a driving signal through the pixel driving circuit, so that the light emitting device layer 60 emits light.

本实施例的技术方案,通过使第一沟道和第二沟道包含不同浓度的氢离子,进而使第一沟道对应的驱动晶体管和第二沟道对应的开关晶体管的亚阈值摆幅不同,从而可以使驱动晶体管满足对灰阶的控制,同时使开关晶体管具有较好的开关速度。In the technical solution of this embodiment, the first channel and the second channel contain hydrogen ions of different concentrations, so that the sub-threshold swings of the driving transistor corresponding to the first channel and the switching transistor corresponding to the second channel are different , so that the driving transistor can satisfy the gray scale control, and at the same time, the switching transistor can have a better switching speed.

图7为本发明实施例提供的另一种显示面板的制作方法。在本发明的一个实施例中,有源层可以为晶体管的沟道区域。如图7所示,该显示面板的制作方法包括:FIG. 7 is another method for fabricating a display panel according to an embodiment of the present invention. In one embodiment of the present invention, the active layer may be a channel region of a transistor. As shown in Figure 7, the manufacturing method of the display panel includes:

S210、提供基板。S210, providing a substrate.

S220、在基板上形成有源层,有源层包括第一有源层和第二有源层。S220 , forming an active layer on the substrate, where the active layer includes a first active layer and a second active layer.

具体可以为,在基板上形成沟道,沟道包括第一沟道和第二沟道。Specifically, a channel is formed on the substrate, and the channel includes a first channel and a second channel.

S230、在有源层远离基板的一侧设置第一掩膜版,第一掩膜版的开口区对应第一有源层,第一掩膜版的非开口区对应第二有源层。S230 , setting a first mask on the side of the active layer away from the substrate, the opening area of the first mask corresponds to the first active layer, and the non-open area of the first mask corresponds to the second active layer.

具体可以为,在沟道远离基板的一侧设置第一掩模版,第一掩膜版的开口区对应第一沟道,第一掩膜版的非开口区对应第二沟道。Specifically, a first reticle is disposed on the side of the channel away from the substrate, the opening area of the first reticle corresponds to the first channel, and the non-opening area of the first reticle corresponds to the second channel.

具体地,图8为本发明实施例提供的显示面板的制作方法的步骤S230对应的制作流程图。如图8所示,第一掩膜版70设置于沟道20远离基板10的一侧。第一掩膜版70的开口区对应第一沟道201,使得氢离子注入时氢离子能够通过第一掩膜版70注入至第一沟道201。第一掩膜版70的非开口区对应第二沟道202,使得氢离子注入时可以阻挡氢离子注入至第二沟道202。Specifically, FIG. 8 is a manufacturing flowchart corresponding to step S230 of the manufacturing method of the display panel provided by the embodiment of the present invention. As shown in FIG. 8 , the first mask 70 is disposed on the side of the channel 20 away from the substrate 10 . The opening region of the first mask 70 corresponds to the first channel 201 , so that hydrogen ions can be implanted into the first channel 201 through the first mask 70 during hydrogen ion implantation. The non-open area of the first mask 70 corresponds to the second channel 202 , so that the implantation of hydrogen ions into the second channel 202 can be blocked during hydrogen ion implantation.

S240、采用第一剂量和第一掺杂能量的氢离子注入第一有源层。具体可以为,采用第一剂量和第一掺杂能量的氢离子注入第一沟道。S240 , implanting hydrogen ions with a first dose and a first doping energy into the first active layer. Specifically, the first channel may be implanted with hydrogen ions of a first dose and a first doping energy.

具体地,继续参考图8,通过第一掩膜版70的非开口对第二沟道202阻挡,第一剂量和第一掺杂能量的氢离子注入至第一沟道201中。第二沟道202中没有氢离子注入。Specifically, referring to FIG. 8 , the second channel 202 is blocked by the non-opening of the first mask 70 , and hydrogen ions of the first dose and the first doping energy are implanted into the first channel 201 . There is no hydrogen ion implantation in the second channel 202 .

S250、去除第一掩膜版,在有源层远离基板的一侧设置第二掩膜版,第二掩膜版的开口区对应第二有源层,第二掩膜版的非开口区对应第一有源层。S250, remove the first mask, and set a second mask on the side of the active layer away from the substrate, the opening area of the second mask corresponds to the second active layer, and the non-open area of the second mask corresponds to first active layer.

具体地可以为,去除第一掩膜版,在沟道远离基板的一侧设置第二掩膜版,第二掩膜版的开口区对应第二沟道,第二掩膜版的非开口区对应第一有沟道。Specifically, the first mask is removed, and a second mask is provided on the side of the channel away from the substrate, the opening area of the second mask corresponds to the second channel, and the non-open area of the second mask is Corresponding to the first channel.

图9为本发明实施例提供的显示面板的制作方法的步骤S250对应的制作流程图。如图9所示,在第一沟道201注入氢离子结束后,第一掩膜版70被移走,在沟道20远离基板10的一侧设置第二掩膜版80。第二掩膜版80的开口区对应第二沟道202,使得氢离子注入时氢离子能够通过第二掩膜版80注入至第二沟道202。第二掩膜版80的非开口区对应第一沟道201,使得氢离子注入时可以阻挡氢离子注入至第一沟道201。FIG. 9 is a manufacturing flowchart corresponding to step S250 of the manufacturing method of the display panel provided by the embodiment of the present invention. As shown in FIG. 9 , after the implantation of hydrogen ions into the first channel 201 is completed, the first mask 70 is removed, and a second mask 80 is provided on the side of the channel 20 away from the substrate 10 . The opening region of the second mask 80 corresponds to the second channel 202 , so that hydrogen ions can be implanted into the second channel 202 through the second mask 80 during hydrogen ion implantation. The non-open area of the second mask 80 corresponds to the first channel 201 , so that the implantation of hydrogen ions into the first channel 201 can be blocked during hydrogen ion implantation.

S260、采用第二剂量和第二掺杂能量的氢离子注入第二沟道,以使第二沟道的氢离子浓度与第一沟道不同。S260 , implanting hydrogen ions into the second channel using the second dose and the second doping energy, so that the hydrogen ion concentration of the second channel is different from that of the first channel.

具体地,继续参考图9,通过第二掩膜版80的非开口对第一沟道201阻挡,第二剂量和第二掺杂能量的氢离子注入至第二沟道202中。第一沟道201中没有氢离子注入。Specifically, referring to FIG. 9 , the first channel 201 is blocked by the non-opening of the second mask 80 , and hydrogen ions of the second dose and the second doping energy are implanted into the second channel 202 . There is no hydrogen ion implantation in the first channel 201 .

因此,在上述过程中,第一剂量和第一掺杂能量的氢离子注入至第一沟道201中,第二剂量和第二掺杂能量的氢离子注入至第二沟道202中。通过设置第一剂量与第二剂量不同,使得第一沟道201中的氢离子浓度和第二沟道202中的氢离子浓度不同,从而使得第一沟道201形成的驱动晶体管与第二沟道202形成的开关晶体管的亚阈值摆幅不同,从而可以使驱动晶体管满足对灰阶的控制,同时使开关晶体管具有较好的开关速度。Therefore, in the above process, hydrogen ions of the first dose and the first doping energy are implanted into the first channel 201 , and hydrogen ions of the second dose and the second doping energy are implanted into the second channel 202 . By setting the first dose and the second dose to be different, the hydrogen ion concentration in the first channel 201 and the hydrogen ion concentration in the second channel 202 are different, so that the driving transistor formed by the first channel 201 is different from the second channel. The sub-threshold swings of the switching transistors formed by the channel 202 are different, so that the driving transistor can satisfy the control of the gray scale, and at the same time, the switching transistor has a better switching speed.

示例性地,表1为现有技术提供的一种驱动晶体管和开关晶体管的电性水平。表2为本技术方案提供的另一种驱动晶体管和开关晶体管的电性水平。其中,驱动晶体管的电性参数为DTFT对应的电性参数,开关晶体管的电性参数为STFT对应的电性参数。另外,SS为亚阈值摆幅。由表1和表2可知,在经过对沟道氢离子注入后,且第一沟道201的氢离子浓度小于第二沟道202的氢离子浓度,驱动晶体管的亚阈值摆幅大于开关晶体管的亚阈值摆幅,从而可以使驱动晶体管满足对灰阶的控制,同时使开关晶体管具有较好的开关速度。Exemplarily, Table 1 shows the electrical properties of a driving transistor and a switching transistor provided in the prior art. Table 2 provides the electrical properties of another driving transistor and switching transistor provided by the technical solution. The electrical parameters of the driving transistor are the electrical parameters corresponding to the DTFT, and the electrical parameters of the switching transistor are the electrical parameters corresponding to the STFT. In addition, SS is the subthreshold swing. It can be seen from Table 1 and Table 2 that after the hydrogen ion implantation into the channel, and the hydrogen ion concentration of the first channel 201 is smaller than that of the second channel 202, the sub-threshold swing of the driving transistor is greater than that of the switching transistor. Sub-threshold swing, so that the driving transistor can meet the control of gray scale, and at the same time, the switching transistor has a better switching speed.

表1Table 1

表2Table 2

Figure BDA0002279511840000132
Figure BDA0002279511840000132

S270、基于沟道形成阵列器件,阵列器件包括基于第一沟道形成的驱动晶体管以及基于第二沟道形成的开关晶体管。S270 , an array device is formed based on the channel, and the array device includes a drive transistor formed based on the first channel and a switch transistor formed based on the second channel.

S280、在阵列器件远离基板的一侧形成发光器件层。S280, forming a light emitting device layer on the side of the array device away from the substrate.

在上述技术方案的基础上,当第一沟道201为驱动晶体管的沟道,第二沟道202为开关晶体管的沟道,第一剂量小于第二剂量,且第一掺杂能量小于第二掺杂能量。On the basis of the above technical solution, when the first channel 201 is the channel of the driving transistor and the second channel 202 is the channel of the switching transistor, the first dose is less than the second dose, and the first doping energy is less than the second dose doping energy.

具体地,在制作晶体管的工艺中,驱动晶体管的工艺与开关晶体管的工艺相同。当第一沟道201为驱动晶体管的沟道,第二沟道202为开关晶体管的沟道时,通过设置第一剂量小于第二剂量,且第一掺杂能量小于第二掺杂能量,使第一沟道201中的氢离子浓度小于第二沟道202中的氢离子浓度,进一步使第一沟道201对应的驱动晶体管的亚阈值摆幅大于第二沟道202对应的开关晶体管的亚阈值摆幅,从而可以使开关晶体管满足对灰阶的控制,同时使驱动晶体管可以驱动OLED发光时保证稳定性。Specifically, in the process of fabricating the transistor, the process of the driving transistor is the same as that of the switching transistor. When the first channel 201 is the channel of the driving transistor and the second channel 202 is the channel of the switching transistor, by setting the first dose to be less than the second dose and the first doping energy to be less than the second doping energy, the The hydrogen ion concentration in the first channel 201 is smaller than the hydrogen ion concentration in the second channel 202 , so that the sub-threshold swing of the driving transistor corresponding to the first channel 201 is greater than the sub-threshold swing of the switching transistor corresponding to the second channel 202 . Threshold swing, so that the switching transistor can meet the control of gray scale, and at the same time, the driving transistor can ensure stability when driving the OLED to emit light.

示例性地,第一剂量的范围小于或等于1E+12ions/cm2,第二剂量的范围为3E+12—5E+12ions/cm2,第一掺杂能量和第二掺杂能量的范围为小于或等于5KV。即通过设置第一剂量小于第二剂量,可以实现第一沟道201对应的驱动晶体管的亚阈值摆幅大于第二沟道202对应的开关晶体管的亚阈值摆幅。Exemplarily, the range of the first dose is less than or equal to 1E+12ions/cm2, the range of the second dose is 3E+12-5E+12ions/cm2, the ranges of the first doping energy and the second doping energy are less than or Equal to 5KV. That is, by setting the first dose to be smaller than the second dose, the sub-threshold swing of the driving transistor corresponding to the first channel 201 can be greater than the sub-threshold swing of the switching transistor corresponding to the second channel 202 .

需要说明的是,在上述过程中,在第一剂量小于第二剂量的基础上,第一掺杂能量和第二掺杂能量可以相等。It should be noted that, in the above process, on the basis that the first dose is smaller than the second dose, the first doping energy and the second doping energy may be equal.

图10为本发明实施例提供的另一种显示面板的制作方法。如图10所示,该显示面板的制作方法包括:FIG. 10 is another method for fabricating a display panel according to an embodiment of the present invention. As shown in Figure 10, the manufacturing method of the display panel includes:

S310、提供基板。S310, providing a substrate.

S320、在基板上形成沟道,沟道包括第一沟道和第二沟道。S320 , forming a channel on the substrate, where the channel includes a first channel and a second channel.

S330、在沟道远离基板的一侧形成栅极绝缘层。S330 , forming a gate insulating layer on the side of the channel away from the substrate.

具体地,图11为本发明实施例提供的显示面板的制作方法的步骤S330对应的显示面板结构示意图。如图11所示,沟道20远离基板10的一侧形成有栅极绝缘层31,栅极绝缘层31与沟道20接触。栅极绝缘层31与沟道20接触的界面具有悬挂键,增加晶体管的亚阈值摆幅。Specifically, FIG. 11 is a schematic structural diagram of a display panel corresponding to step S330 of the method for fabricating a display panel according to an embodiment of the present invention. As shown in FIG. 11 , a gate insulating layer 31 is formed on the side of the channel 20 away from the substrate 10 , and the gate insulating layer 31 is in contact with the channel 20 . The interface between the gate insulating layer 31 and the channel 20 has a dangling bond, which increases the subthreshold swing of the transistor.

S340、在栅极绝缘层远离基板的一侧设置第一掩膜版,第一掩膜版的开口区对应第一沟道,第一掩膜版的非开口区对应第二沟道。S340 , setting a first mask on the side of the gate insulating layer away from the substrate, the opening area of the first mask corresponds to the first channel, and the non-open area of the first mask corresponds to the second channel.

具体地,图12为本发明实施例提供的显示面板的制作方法的步骤S340对应的制作流程图。如图12所示,第一掩膜版70设置于栅极绝缘层31远离基板10的一侧。第一掩膜版70的开口区对应第一沟道201对应的栅极绝缘层31,使得氢离子注入时氢离子能够通过第一掩膜版70和栅极绝缘层31注入至第一沟道201。第一掩膜版70的非开口区对应第二沟道202对应的栅极绝缘层31,使得氢离子注入时可以阻挡氢离子注入至第二沟道202和第二沟道202对应的栅极绝缘层31。Specifically, FIG. 12 is a manufacturing flowchart corresponding to step S340 of the manufacturing method of the display panel provided by the embodiment of the present invention. As shown in FIG. 12 , the first mask 70 is disposed on the side of the gate insulating layer 31 away from the substrate 10 . The opening area of the first mask 70 corresponds to the gate insulating layer 31 corresponding to the first channel 201 , so that hydrogen ions can be implanted into the first channel through the first mask 70 and the gate insulating layer 31 during hydrogen ion implantation 201. The non-open area of the first mask 70 corresponds to the gate insulating layer 31 corresponding to the second channel 202 , so that the implantation of hydrogen ions into the second channel 202 and the gate corresponding to the second channel 202 can be blocked during hydrogen ion implantation insulating layer 31 .

S350、采用第三剂量和第三掺杂能量的氢离子注入第一沟道。S350 , implanting hydrogen ions with a third dose and a third doping energy into the first channel.

具体地,继续参考图12,通过第一掩膜版70的非开口对第二沟道202和第二沟道202对应的栅极绝缘层31阻挡,第三剂量和第三掺杂能量的氢离子注入至第一沟道201中。第二沟道202中没有氢离子注入。Specifically, continuing to refer to FIG. 12 , the second channel 202 and the gate insulating layer 31 corresponding to the second channel 202 are blocked by the non-opening of the first mask 70 , the third dose and the third doping energy of hydrogen Ions are implanted into the first channel 201 . There is no hydrogen ion implantation in the second channel 202 .

S360、去除第一掩膜版,在栅极绝缘层远离基板的一侧设置第二掩膜版,第二掩膜版的开口区对应第二沟道,第二掩膜版的非开口区对应第一沟道。S360, remove the first mask, and set a second mask on the side of the gate insulating layer away from the substrate, the opening area of the second mask corresponds to the second channel, and the non-open area of the second mask corresponds to first channel.

具体地,图13为本发明实施例提供的显示面板的制作方法的步骤S360对应的制作流程图。如图13所示,在第一沟道201注入氢离子结束后,第一掩膜版70被移走,在栅极绝缘层31远离基板10的一侧设置第二掩膜版80。第二掩膜版80的开口区对应第二沟道202的栅极绝缘层31,使得氢离子注入时氢离子能够通过第二掩膜版80和栅极绝缘层31注入至第二沟道202。第二掩膜版80的非开口区对应第一沟道201对应的栅极绝缘层31,使得氢离子注入时可以阻挡氢离子注入至第一沟道201和栅极绝缘层31。Specifically, FIG. 13 is a manufacturing flowchart corresponding to step S360 of the manufacturing method of the display panel provided by the embodiment of the present invention. As shown in FIG. 13 , after the implantation of hydrogen ions into the first channel 201 is completed, the first mask 70 is removed, and a second mask 80 is provided on the side of the gate insulating layer 31 away from the substrate 10 . The opening area of the second mask 80 corresponds to the gate insulating layer 31 of the second channel 202 , so that hydrogen ions can be implanted into the second channel 202 through the second mask 80 and the gate insulating layer 31 during hydrogen ion implantation . The non-open area of the second mask 80 corresponds to the gate insulating layer 31 corresponding to the first channel 201 , so that the implantation of hydrogen ions into the first channel 201 and the gate insulating layer 31 can be blocked during hydrogen ion implantation.

S370、采用第四剂量和第四掺杂能量的氢离子注入第二沟道。S370 , implanting hydrogen ions with a fourth dose and a fourth doping energy into the second channel.

具体地,继续参考图13,通过第二掩膜版80的非开口区对第一沟道201和第一沟道201对应的栅极绝缘层31阻挡,第四剂量和第四掺杂能量的氢离子注入至第二沟道202中。第一沟道201中没有氢离子注入。Specifically, continuing to refer to FIG. 13 , the first channel 201 and the gate insulating layer 31 corresponding to the first channel 201 are blocked by the non-open region of the second mask 80 , the fourth dose and the fourth doping energy Hydrogen ions are implanted into the second channel 202 . There is no hydrogen ion implantation in the first channel 201 .

因此,在上述过程中,第三剂量和第三掺杂能量的氢离子注入至第一沟道201中,第四剂量和第四掺杂能量的氢离子注入至第二沟道202中。通过设置第三剂量与第四剂量不同,且第三掺杂能量与第四掺杂能量不同,使得第一沟道201中的氢离子浓度和第二沟道202中的氢离子浓度不同,从而使得第一沟道201形成的驱动晶体管与第二沟道202形成的开关晶体管的亚阈值摆幅不同,从而可以使驱动晶体管满足对灰阶的控制,同时使开关晶体管具有较好的开关速度。Therefore, in the above process, the hydrogen ions of the third dose and the third doping energy are implanted into the first channel 201 , and the hydrogen ions of the fourth dose and the fourth doping energy are implanted into the second channel 202 . By setting the third dose is different from the fourth dose, and the third doping energy is different from the fourth doping energy, the hydrogen ion concentration in the first channel 201 and the hydrogen ion concentration in the second channel 202 are different, so that The sub-threshold swings of the driving transistor formed by the first channel 201 and the switching transistor formed by the second channel 202 are different, so that the driving transistor can satisfy the gray scale control, and at the same time, the switching transistor has a better switching speed.

示例性地,表3为本技术方案提供的另一种驱动晶体管和开关晶体管的电性水平。由表1和表3可知,驱动晶体管对应的第一沟道的氢离子浓度小于开关晶体管对应的第二沟道的氢离子浓度,使得驱动晶体管的亚阈值摆幅大于开关晶体管的亚阈值摆幅,从而可以使驱动晶体管满足对灰阶的控制,同时使开关晶体管具有较好的开关速度。Exemplarily, Table 3 shows the electrical property levels of another driving transistor and switching transistor provided by the technical solution. It can be seen from Table 1 and Table 3 that the hydrogen ion concentration of the first channel corresponding to the driving transistor is smaller than the hydrogen ion concentration of the second channel corresponding to the switching transistor, so that the sub-threshold swing of the driving transistor is greater than that of the switching transistor. , so that the driving transistor can satisfy the gray scale control, and at the same time, the switching transistor can have a better switching speed.

另外,由表2和表3可知,对沟道直接进行氢离子注入时,驱动晶体管的沟道的氢离子浓度和开关晶体管的沟道的氢离子浓度的差值小于通过栅极绝缘层对沟道进行氢离子注入时驱动晶体管的沟道的氢离子浓度和开关晶体管的沟道的氢离子浓度的差值。而且,通过对沟道注入氢离子浓度,晶体管的阈值电压Vth相对正偏,后期可减小沟道掺杂剂量,减轻粒子注入设备负担。晶体管的沟道与源漏极层的接触阻抗RC1和沟道等效电容C1整体减小,使得晶体管的接触性能增加。In addition, as can be seen from Tables 2 and 3, when hydrogen ion implantation is performed directly into the channel, the difference between the hydrogen ion concentration in the channel of the driving transistor and the hydrogen ion concentration in the channel of the switching transistor is smaller than that of the channel through the gate insulating layer. The difference between the hydrogen ion concentration in the channel of the driving transistor and the hydrogen ion concentration in the channel of the switching transistor when the channel is implanted with hydrogen ions. Furthermore, by implanting the hydrogen ion concentration into the channel, the threshold voltage Vth of the transistor is relatively positively biased, and the channel dopant dose can be reduced in the later stage, thereby reducing the burden on the particle implantation equipment. The contact resistance RC1 between the channel of the transistor and the source-drain layer and the channel equivalent capacitance C1 are reduced as a whole, so that the contact performance of the transistor is increased.

表3table 3

Figure BDA0002279511840000161
Figure BDA0002279511840000161

S380、基于沟道形成阵列器件,阵列器件包括基于第一沟道形成的驱动晶体管以及基于第二沟道形成的开关晶体管。S380, an array device is formed based on the channel, and the array device includes a drive transistor formed based on the first channel and a switch transistor formed based on the second channel.

S390、在阵列器件远离基板的一侧形成发光器件层。S390 , forming a light-emitting device layer on the side of the array device away from the substrate.

在上述技术方案的基础上,当第一沟道为驱动晶体管的沟道,第二沟道为开关晶体管的沟道,第三剂量小于第四剂量,且第三掺杂能量小于第四掺杂能量。同理,通过设置第三剂量小于第四剂量,且第三掺杂能量小于第四掺杂能量,使第一沟道201中的氢离子浓度小于第二沟道202中的氢离子浓度,进一步使第一沟道201对应的驱动晶体管的亚阈值摆幅大于第二沟道202对应的开关晶体管的亚阈值摆幅,从而可以使驱动晶体管满足对灰阶的控制,同时使开关晶体管具有较好的开关速度。示例性地,第三剂量的范围小于或等于1E+12ions/cm2,第四剂量的范围为3E+12—5E+12ions/cm2,第三掺杂能量和第四掺杂能量的范围为5KV-10KV。On the basis of the above technical solution, when the first channel is the channel of the driving transistor and the second channel is the channel of the switching transistor, the third dose is smaller than the fourth dose, and the third doping energy is smaller than the fourth doping energy energy. Similarly, by setting the third dose to be less than the fourth dose and the third doping energy to be less than the fourth doping energy, the hydrogen ion concentration in the first channel 201 is smaller than the hydrogen ion concentration in the second channel 202, and further The sub-threshold swing of the driving transistor corresponding to the first channel 201 is greater than the sub-threshold swing of the switching transistor corresponding to the second channel 202, so that the driving transistor can satisfy the control of gray scale, and at the same time, the switching transistor has better performance. switching speed. Exemplarily, the range of the third dose is less than or equal to 1E+12ions/cm2, the range of the fourth dose is 3E+12-5E+12ions/cm2, the range of the third doping energy and the fourth doping energy is 5KV- 10KV.

需要说明的是,在第三剂量小于第四剂量的基础上,第三掺杂能量和第四掺杂能量可以相等。另外,掺杂能量可以控制氢离子沿基板垂直方向的运动深度,通过控制掺杂能量的大小,可以控制沟道20内氢离子的浓度。在其他实施例中,可以设置第三掺杂能量小于第四掺杂能量,使第一沟道201对应的氢离子浓度更多的存储在第一沟道201对应的栅极绝缘层31中,从而可以进一步地使第一沟道201中氢离子浓度减小,第一沟道201对应的驱动晶体管的亚阈值摆幅更大。It should be noted that, on the basis that the third dose is smaller than the fourth dose, the third doping energy and the fourth doping energy may be equal. In addition, the doping energy can control the movement depth of hydrogen ions along the vertical direction of the substrate, and by controlling the doping energy, the concentration of hydrogen ions in the channel 20 can be controlled. In other embodiments, the third doping energy may be set lower than the fourth doping energy, so that the hydrogen ion concentration corresponding to the first channel 201 is more stored in the gate insulating layer 31 corresponding to the first channel 201 , Therefore, the hydrogen ion concentration in the first channel 201 can be further reduced, and the sub-threshold swing of the driving transistor corresponding to the first channel 201 is larger.

图14为本发明实施例提供的另一种显示面板的制作方法。如图14所示,该显示面板的制作方法包括:FIG. 14 is another method for fabricating a display panel according to an embodiment of the present invention. As shown in Figure 14, the manufacturing method of the display panel includes:

S410、提供基板。S410, providing a substrate.

S420、在基板上形成沟道,沟道包括第一沟道和第二沟道。S420, forming a channel on the substrate, where the channel includes a first channel and a second channel.

S430、对沟道注入氟离子。S430, implanting fluorine ions into the channel.

具体地,沟道包括固定正电荷,通过注入氟离子,氟离子可以与沟道中的固定正电荷耦合,对沟道内部的缺陷进行修复,从而可以减小沟道对应的晶体管的亚阈值摆幅。Specifically, the channel includes fixed positive charges. By injecting fluorine ions, the fluorine ions can be coupled with the fixed positive charges in the channel to repair defects inside the channel, thereby reducing the subthreshold swing of the transistor corresponding to the channel. .

示例性地,对沟道注入氟离子时,氟离子的注入剂量为1E+12—2E+12ions/cm2,掺杂能量为10KV。Exemplarily, when fluorine ions are implanted into the channel, the implantation dose of fluorine ions is 1E+12-2E+12 ions/cm 2 , and the doping energy is 10KV.

S440、使第一沟道和第二沟道包含不同浓度的氢离子。S440. Make the first channel and the second channel contain hydrogen ions of different concentrations.

S450、基于沟道形成阵列器件,阵列器件包括基于第一沟道形成的驱动晶体管以及基于第二沟道形成的开关晶体管。S450 , an array device is formed based on the channel, and the array device includes a drive transistor formed based on the first channel and a switch transistor formed based on the second channel.

S460、在阵列器件远离基板的一侧形成发光器件层。S460, forming a light emitting device layer on the side of the array device away from the substrate.

在上述各技术方案的基础上,在基板上形成沟道,包括:On the basis of the above technical solutions, a channel is formed on the substrate, including:

在基板上形成非晶硅层。An amorphous silicon layer is formed on the substrate.

对非晶硅进行去氢晶化形成多晶硅层。The amorphous silicon is dehydrogenated to form a polysilicon layer.

具体地,在非晶硅转化为多晶硅时,还包括退火工艺,用于实现重结晶。Specifically, when the amorphous silicon is converted into polycrystalline silicon, an annealing process is also included for realizing recrystallization.

对多晶硅层图案化,形成沟道。The polysilicon layer is patterned to form channels.

本发明实施例还提供一种显示面板。图15为本发明实施例提供的一种显示面板的结构示意图。该显示面板100采用本发明任意实施例提供的显示面板的制作方法制作。Embodiments of the present invention also provide a display panel. FIG. 15 is a schematic structural diagram of a display panel according to an embodiment of the present invention. The display panel 100 is manufactured by using the manufacturing method of the display panel provided by any embodiment of the present invention.

注意,上述仅为本发明的较佳实施例及所运用技术原理。本领域技术人员会理解,本发明不限于这里所述的特定实施例,对本领域技术人员来说能够进行各种明显的变化、重新调整和替代而不会脱离本发明的保护范围。因此,虽然通过以上实施例对本发明进行了较为详细的说明,但是本发明不仅仅限于以上实施例,在不脱离本发明构思的情况下,还可以包括更多其他等效实施例,而本发明的范围由所附的权利要求范围决定。Note that the above are only preferred embodiments of the present invention and applied technical principles. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, readjustments and substitutions can be made by those skilled in the art without departing from the protection scope of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments, and can also include more other equivalent embodiments without departing from the concept of the present invention. The scope is determined by the scope of the appended claims.

Claims (10)

1. A method for manufacturing a display panel is characterized by comprising the following steps:
providing a substrate;
forming a channel on the substrate, the channel including a first channel and a second channel;
performing hydrogen ion doping on the first channel and the second channel, and enabling the first channel and the second channel to contain hydrogen ions with different concentrations;
forming an array device based on the channel, the array device including a driving transistor formed based on the first channel and a switching transistor formed based on the second channel;
and forming a light-emitting device layer on one side of the array device far away from the substrate.
2. The method of claim 1, wherein doping the first channel and the second channel with hydrogen ions and allowing the first channel and the second channel to contain different concentrations of hydrogen ions comprises:
arranging a first mask on one side of the channel far away from the substrate, wherein an opening area of the first mask corresponds to the first channel, and a non-opening area of the first mask corresponds to the second channel;
implanting hydrogen ions into the first channel with a first dose and a first doping energy;
removing the first mask; arranging a second mask on one side of the channel far away from the substrate, wherein an opening area of the second mask corresponds to the second channel, and a non-opening area of the second mask corresponds to the first channel;
and implanting hydrogen ions into the second channel by using a second dosage and a second doping energy so that the concentration of the hydrogen ions in the second channel is different from that in the first channel.
3. The method of claim 2, wherein the first channel is a channel of a driving transistor, the second channel is a channel of a switching transistor, the first dose is less than the second dose, and the first doping energy is less than the second doping energy.
4. The method of claim 2, wherein the first dose is in a range of less than or equal to 1E +12ions/cm2, the second dose is in a range of 3E +12 to 5E +12ions/cm2, and the first doping energy and the second doping energy are in a range of less than or equal to 5 KV.
5. The method of claim 1, wherein the first channel and the second channel are made to contain different concentrations of hydrogen ions, further comprising:
forming a gate insulating layer on one side of the channel far away from the substrate;
arranging a first mask on one side, far away from the substrate, of the gate insulating layer, wherein an opening area of the first mask corresponds to the first channel, and a non-opening area of the first mask corresponds to the second channel;
implanting hydrogen ions into the first channel with a third dose and a third doping energy;
removing the first mask; arranging a second mask on one side of the gate insulating layer, which is far away from the substrate, wherein an opening area of the second mask corresponds to the second channel, and a non-opening area of the second mask corresponds to the first channel;
implanting hydrogen ions into the second channel with a fourth dose and a fourth doping energy.
6. The method of claim 5, wherein the first channel is a channel of a driving transistor, the second channel is a channel of a switching transistor, the third dose is less than the fourth dose, and the third doping energy is less than the fourth doping energy.
7. The method of claim 5, wherein the third dose is in a range of 1E +12ions/cm2 or less, the fourth dose is in a range of 3E + 12-5E +12ions/cm2, and the third doping energy and the fourth doping energy are in a range of 5KV-10 KV.
8. The method of manufacturing according to claim 1, further comprising, after forming the trench on the substrate:
and implanting fluorine ions into the channel.
9. The method of claim 8, wherein the fluorine ion implantation dose is 1E + 12-2E +12ions/cm2 and the doping energy is 10 KV.
10. A display panel produced by the method for producing a display panel according to any one of claims 1 to 9.
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