CN110737577B - A method and device for storing test defect data - Google Patents

Abstract

The invention discloses a test defect data storage method and device, electronic equipment and a computer storage medium. The method comprises the following steps: receiving a test order for making a test request; establishing a mapping relation between a service level corresponding to the test sheet and a directory level of the defect storage system; acquiring defect data obtained by testing corresponding to the test sheet; and storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation. According to the technical scheme, the mapping relation between the service level corresponding to the test sheet and the directory level of the defect storage system is established, a tester can submit the test sheet according to own requirements, then the defect data obtained through testing are automatically stored in the defect storage system, the defect data can be stored without the directory level of the defect storage system, the storage efficiency is improved, the storage of the defect data is more humanized, and the use experience of a user is enhanced.

Description

Method and device for storing test defect data

technical field

The invention relates to the technical field of computers, in particular to a test defect data storage method, device, electronic equipment and computer storage medium.

Background technique

When a new version of an application is developed or a new function is added, before the new version of the application or the new function is released, a test needs to be carried out so that developers can know the running status of the new version of the application or the new function. During testing, some defect data will be obtained. In order for developers to call or analyze these defect data, the defect data obtained during testing will generally be stored, for example, stored in a dedicated defect storage system. However, the special defect storage system has its own directory level. When storing defects, it needs to be stored according to the directory level of the defect storage system. Once the business level of the defect data does not match, it cannot be stored. For example, the business level corresponding to the defect data It may be three levels, but the directory level of the defect storage system is two levels, which makes the storage of defect data not very friendly and the storage efficiency is low.

Contents of the invention

In view of the above problems, the present invention is proposed to provide a test defect data storage method, device, electronic device and computer storage medium that overcome the above problems or at least partially solve the above problems.

According to one aspect of the present invention, a method for storing test defect data is provided, wherein the method includes:

Receive test submissions for submitting test requests;

Establishing a mapping relationship between the business level corresponding to the testing order and the directory level of the defect storage system;

Obtain the defect data obtained from the test corresponding to the test proposal;

According to the mapping relationship, the acquired defect data is stored in a storage file under a corresponding directory level in the defect storage system.

Optionally, the method further includes:

Create a mapping relationship table;

saving the established mapping relationship between the service level of the test bill and the directory level of the defect storage system in the mapping relationship table;

When receiving the acquisition request of the defect data of the designated test proposal, query the mapping relationship table, and determine the directory level of the defect storage system that has a mapping relationship with the business level of the designated test proposal;

The defect data corresponding to the designated test proposal is acquired from the storage files under the determined directory level of the defect storage system.

Optionally, the method further includes:

Generate a corresponding test report based on the acquired defect data corresponding to the specified test proposal.

Optionally, the establishment of the mapping relationship between the service level corresponding to the test proposal and the directory level of the defect storage system includes:

Obtain the service level corresponding to the test proposal;

According to the obtained business level, a mapping relationship between the business level corresponding to the test proposal and the directory level of the defect storage system is established.

Optionally, the obtaining the service level corresponding to the test proposal includes:

Obtain the corresponding business level directly from the test proposal;

or,

Provide a service level input interface, and receive the service level corresponding to the test proposal through the interface;

or,

When the test proposal is received, the service level corresponding to the test proposal is obtained from a designated database; wherein, the designated database stores the service level corresponding to the test proposal.

Optionally, the directory hierarchy of the defective storage system includes a first hierarchy and a second hierarchy, wherein the first hierarchy includes one or more second hierarchies;

The establishment of the mapping relationship between the business level corresponding to the test proposal and the directory level of the defect storage system includes:

According to the business line information in the business level, establish a mapping relationship between the business line corresponding to the test proposal and the first level of the directory level of the defect storage system;

According to the test identification information in the service level, establish a mapping relationship between the test identification information corresponding to the test proposal and the second level under the first level of the defect storage system.

Optionally, before the establishment of the mapping relationship between the service level corresponding to the test proposal and the directory level of the defect storage system, the method further includes:

Querying the mapping relationship table, and judging whether there is a mapping relationship corresponding to the business level of the test bill in the mapping relationship table; wherein, the mapping relationship table stores the relationship between the business level corresponding to the test bill and the defect storage system Directory-level mapping relationship;

If it does not exist, create a new directory level in the defect storage system, and establish a mapping relationship between the business level corresponding to the test proposal and the created new directory level;

If it exists, according to the mapping relationship, the acquired defect data is directly stored in a storage file under a corresponding directory level in the defect storage system.

Optionally, the defect storage system includes a first level and a second level, wherein the first level includes one or more second levels;

The creating a new directory level in the defect storage system, and establishing the mapping relationship between the service level corresponding to the testing order and the created new directory level include:

Querying whether there is a mapping relationship corresponding to the business line information of the business level corresponding to the testing order in the mapping relationship table;

If it exists, create a new second level under the first level that has a mapping relationship with the business line information, and establish a mapping between the test identification information of the business level corresponding to the test proposal and the created second level. relation;

If it does not exist, create a new first level in the defect storage system, and create a new second level under the created first level; establish the business line information and create The mapping relationship of the first level, and the mapping relationship between the test identification information of the business level corresponding to the test proposal and the created second level is established.

Optionally, the bug storage system refers to bugzilla, a bug tracking system.

According to another aspect of the present invention, a test defect data storage device is provided, wherein the device includes:

A testing order receiving unit adapted to receive a testing order for making a test request;

A mapping relationship establishment unit, adapted to establish a mapping relationship between the business level corresponding to the test bill and the directory level of the defect storage system;

a defect data acquisition unit, adapted to acquire defect data obtained from the test corresponding to the testing order;

The defect data storage unit is adapted to store the obtained defect data in storage files under the corresponding directory level in the defect storage system according to the mapping relationship.

Optionally, the device further includes:

The mapping relationship storage unit is adapted to create a mapping relationship table; and save the established mapping relationship between the business level of the test bill and the directory level of the defect storage system in the mapping relationship table;

The defect data determining unit is adapted to query the mapping relationship table when receiving the defect data acquisition request of the designated test bill, and determine the directory level of the defect storage system that has a mapping relationship with the business level of the designated test bill ; Acquiring the defect data corresponding to the specified testing proposal form from the storage files under the determined directory level of the defect storage system.

Optionally, the device further includes:

The test report generation unit is adapted to generate a corresponding test report according to the obtained defect data corresponding to the specified test proposal.

Optionally,

The mapping relationship establishment unit is adapted to obtain the service level corresponding to the test proposal; according to the acquired business level, establish a mapping relationship between the service level corresponding to the test proposal and the directory level of the defect storage system.

Optionally,

The mapping relationship establishment unit is adapted to directly obtain the corresponding service level from the test proposal; or provide a service level input interface through which the service level corresponding to the test proposal is received; or, upon receiving When the test submission form is received, the service level corresponding to the test submission form is obtained from a designated database; wherein, the service level corresponding to the test submission form is stored in the designated database.

Optionally, the directory hierarchy of the defective storage system includes a first hierarchy and a second hierarchy, wherein the first hierarchy includes one or more second hierarchies;

The mapping relationship establishment unit is adapted to establish a mapping relationship between the business line corresponding to the test proposal and the first level of the directory level of the defect storage system according to the business line information in the business level; according to the The test identification information in the service level establishes a mapping relationship between the test identification information corresponding to the test proposal and the second level under the first level of the defect storage system.

Optionally, the device further includes:

The mapping relationship query unit is adapted to query the mapping relationship table before establishing the mapping relationship between the business level corresponding to the test proposal and the directory level of the defect storage system, and determine whether there is a mapping relationship in the mapping relationship table that is related to the proposed problem. The mapping relationship corresponding to the business level of the test sheet; wherein, the mapping relationship table stores the mapping relationship between the business level corresponding to the test order and the directory level of the defect storage system; if it does not exist, create a new one in the defect storage system directory level, establishing a mapping relationship between the business level corresponding to the test proposal and the created new directory level; if it exists, according to the mapping relationship, the acquired defect data is directly stored in the corresponding defect storage system In the storage file under the directory hierarchy.

Optionally, the defect storage system includes a first level and a second level, wherein the first level includes one or more second levels;

The mapping relationship query unit is adapted to query whether there is a mapping relationship corresponding to the business line information of the business level corresponding to the survey proposal in the mapping relationship table; if it exists, it has a mapping relationship with the business line information Create a new second level under the first level of the relationship, and establish a mapping relationship between the test identification information of the service level corresponding to the test proposal and the created second level; if it does not exist, then in the defect storage system Create a new first level in the first level, and create a new second level under the created first level; establish the mapping relationship between the business line information of the business level corresponding to the test proposal and the created first level, and establish the The mapping relationship between the test identification information of the service level corresponding to the above-mentioned test proposal and the created second level.

Optionally, the bug storage system refers to bugzilla, a bug tracking system.

According to yet another aspect of the present invention, an electronic device is provided, wherein the electronic device includes:

Processor; and,

A memory arranged to store computer-executable instructions which, when executed, cause the processor to perform the method according to the foregoing.

According to still another aspect of the present invention, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores one or more programs, and when the one or more programs are executed by a processor, the aforementioned Methods.

According to the technical solution of the present invention, receiving a test request form for submitting a test request; establishing a mapping relationship between the business level corresponding to the test order and the directory level of the defect storage system; obtaining the defect data obtained by the test corresponding to the test order; According to the mapping relationship, the acquired defect data is stored in a storage file under a corresponding directory level in the defect storage system. Through this technical solution, the mapping relationship between the business level corresponding to the testing order and the directory level of the defect storage system is established. The tester can submit the test form according to his own needs, and then the defect data obtained by the test is automatically stored in the defect storage system. According to the directory hierarchy of the defect storage system, the storage of defect data can also be realized, which improves the storage efficiency, makes the storage of defect data more humanized, and enhances the user experience.

The above description is only an overview of the technical solution of the present invention. In order to better understand the technical means of the present invention, it can be implemented according to the contents of the description, and in order to make the above and other purposes, features and advantages of the present invention more obvious and understandable , the specific embodiments of the present invention are enumerated below.

Description of drawings

Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiment. The drawings are only for the purpose of illustrating a preferred embodiment and are not to be considered as limiting the invention. Also throughout the drawings, the same reference numerals are used to designate the same components. In the attached picture:

FIG. 1 shows a schematic flow diagram of a method for storing test defect data according to an embodiment of the present invention;

FIG. 2 shows a schematic structural diagram of a test defect data storage device according to an embodiment of the present invention;

FIG. 3 shows a schematic structural diagram of an electronic device according to an embodiment of the present invention;

Fig. 4 shows a schematic structural diagram of a computer-readable storage medium according to an embodiment of the present invention.

Detailed ways

Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

Fig. 1 shows a schematic flowchart of a method for storing test defect data according to an embodiment of the present invention. As shown in Figure 1, the method includes:

Step S110, receiving a test submission form for making a test request.

In this embodiment, the method of providing an interface may be used to receive the test form of the user's test request through the interface. Testers can input the corresponding test submission form according to their own needs or according to their own habits, without considering whether the business level of the test submission form conforms to the directory level of the defect storage system.

Step S120, establishing a mapping relationship between the service level corresponding to the test proposal and the directory level of the defect storage system.

Step S130, acquiring the defect data obtained from the test corresponding to the test proposal.

Step S140, according to the mapping relationship, store the acquired defect data in the storage file under the corresponding directory level in the defect storage system.

After the tester submits the test report, the corresponding test will be carried out according to the test report, and the defect data will be obtained during the test. In order to realize the storage of the defect data, the solution of this embodiment can be used, and the defect data can be directly stored according to the mapping relationship. Store without considering whether the corresponding business level is consistent with the directory level. Through this embodiment, the storage of defect data is realized, the storage efficiency is improved, the storage of defect data is more humanized, and the use experience of users is enhanced.

In addition, the defect data storage system is an independent system. For a test with a certain process, the defect storage system is not related to other test processes. It requires testers to perform specific defect data storage operations to realize defect data storage. .

Through this embodiment, the defect storage system is associated with the entire test process, and the tester only needs to submit the test sheet, and can realize the storage of defect data without performing separate operations, further improving the user experience.

In one embodiment of the present invention, the method shown in FIG. 1 further includes: creating a mapping relationship table; saving the established mapping relationship between the business level of the test bill and the directory level of the defect storage system in the mapping relationship table; When receiving the defect data acquisition request of the specified test proposal, query the mapping relationship table to determine the directory level of the defect storage system that has a mapping relationship with the business level of the specified test proposal; from the directory level of the determined defect storage system Obtain the defect data corresponding to the specified test proposal from the storage file.

Considering the lack of connection between the defect storage system and other testing processes in the prior art, and when reading the defect data, the operator also needs to value the directory level information of the defect system and the information corresponding to the defect data that needs to be read. . Therefore, the proposal of this embodiment is proposed.

Through the solution of this embodiment, on the one hand, the defect storage system can be associated with other testing processes, and the flexible reading of defect data can also be realized, and the corresponding defect can be obtained only according to the information of the test order (such as identification information) data.

Further, the method shown in FIG. 1 further includes: generating a corresponding test report according to the obtained defect data corresponding to the designated test proposal.

Through this embodiment, the test procedures such as test sheet submission, testing, defect data storage, defect data reading, and test report generation in the test process are integrated together, which further facilitates the operation of testers and improves user experience .

In one embodiment of the present invention, in step S120 shown in FIG. 1 , establishing the mapping relationship between the business level corresponding to the test proposal and the directory level of the defect storage system includes: obtaining the business level corresponding to the test proposal; Business level, establish the mapping relationship between the business level corresponding to the test proposal and the directory level of the defect storage system.

In this embodiment, in order to establish a mapping relationship between the service level corresponding to the test proposal and the directory level of the defect storage system, it is first necessary to obtain the service level corresponding to the test proposal.

Preferably, the business level corresponding to the test proposal includes line of business information, project information or test identification information.

Further, the above-mentioned acquisition of the service level corresponding to the test proposal includes: directly obtaining the corresponding business level from the test proposal; or, providing a service level input interface, and receiving the service level corresponding to the test proposal through the interface; or, receiving When the testing order is received, the business level corresponding to the testing order is obtained from the designated database; wherein, the business level corresponding to the testing order is stored in the designated database.

In this embodiment, the service level corresponding to the test order can be obtained through three ways. If there is a corresponding business level in the received test proposal, the corresponding business level can be obtained directly from the test proposal; an interface for inputting the business level can also be provided, through which the user can input the corresponding business level of the test proposal. That is, the business level corresponding to the test proposal is obtained through this interface; if the tester stores the relevant information of the test proposal in the designated database, the corresponding business level is obtained from the designated database when the test proposal is received, for example , the designated database correspondingly stores the identification information and business level of the testing order, then the corresponding business level can be obtained from the designated database through the identification information of the testing order.

In an embodiment of the present invention, the directory hierarchy of the defective storage system in the method shown in FIG. 1 includes a first hierarchy and a second hierarchy, wherein the first hierarchy includes one or more second hierarchies.

Then, in step S120 of the method shown in FIG. 1 , the establishment of the mapping relationship between the business level corresponding to the testing order and the directory level of the defect storage system includes: according to the business line information in the business level, establishing the business line corresponding to the testing order and The mapping relationship of the first level of the directory level of the defect storage system; according to the test identification information in the business level, establish the mapping relationship between the test identification information corresponding to the test order and the second level under the first level of the defect storage system.

In the present invention, the directory hierarchy of the defect storage system includes two levels, so the business line information and test identification information of the test submission form are respectively mapped to two levels of the defect storage system. The test identification information here may be a unique identification code or a test name defined by the tester.

For example, the directory level of the defect storage system includes the product level and the component level, and the relationship between the business line information of the test order and the product level is established, and the test identification information of the test order is established with the component level.

In a specific example, a defect storage system has a product level and a component level. The business level of test submission 1 is business line information 1, test ID 1; the business level of test submission 2 is business line information 2, test ID 2; the business level of test submission 3 is business line information 1, test ID 3 . When establishing the mapping relationship, establish a mapping relationship between the business line information 1 of the test proposal 1 and the product level 1 of the defect storage system, and establish a mapping relationship between the test identification information 1 of the test proposal 1 and the component level 1 of the defect storage system; Establish a mapping relationship between the business line information 2 of the testing order 2 and the product level 2 of the defect storage system, and establish a mapping relationship between the test identification information 2 of the testing order 2 and the component level 2 of the defect storage system; The line information 1 establishes a mapping relationship with the product level 1 of the defect storage system, and establishes a mapping relationship between the test identification information 3 of the testing order 3 and the component level 3 of the defect storage system.

Then, when defect data is stored, the defect data 1 corresponding to the testing order 1 is stored in the storage file under the component level 1 under the product level 1; the defect data 2 corresponding to the testing order 2 is stored in the storage file under the product level 2 In the storage file under the component level 2; store the defect data 3 corresponding to the testing order 3 in the storage file under the component level 3 under the product level 1.

The above-mentioned embodiment is an explanation for the case where the defective storage system has two levels. If the defective storage system has more than two levels, it can also be realized through this technical solution.

In one embodiment of the present invention, the directory level of the defect storage system has three levels, then establishing the mapping relationship between the business level corresponding to the testing order and the directory level of the defect storage system includes: according to the business line information in the business level, establish The mapping relationship between the business line corresponding to the test proposal and the first level of the directory hierarchy of the defect storage system; according to the project information in the business level, the project information corresponding to the test proposal and the second level under the first level of the defect storage system are established. Hierarchical mapping relationship: according to the test identification information in the service level, establish a mapping relationship between the test identification information corresponding to the test proposal and the third level of the second level under the first level of the defect storage system.

In a specific example, the defect storage system has a product level, a version level, and a component level. The business level of test proposal 1 is business line information 1, project information 1, and test identification 1; the business level of test proposal 2 is business Line information 2, project information 2, test identification 2; the business level of test submission form 3 is business line information 1, project information 1, and test identification 3. When establishing the mapping relationship, establish a mapping relationship between the business line information 1 of the test proposal 1 and the product level 1 of the defect storage system, establish a mapping relationship between the project information 1 of the test proposal 1 and the version level 1 of the defect storage system, and provide Establish a mapping relationship between the test identification information 1 of the test order 1 and the component level 1 of the defect storage system; establish a mapping relationship between the business line information 2 of the test order 2 and the product level 2 of the defect storage system, and the project information of the test order 2 2 Establish a mapping relationship with the version level 2 of the defect storage system, and establish a mapping relationship between the test identification information 2 of the test proposal 2 and the component level 2 of the defect storage system; the business line information 1 of the test proposal 3 and the defect storage system Establish a mapping relationship at product level 1, establish a mapping relationship between project information 1 of test proposal 3 and version level 1 of the defect storage system, and establish a mapping relationship between test identification information 3 of test proposal 3 and component level 3 of the defect storage system.

Then, when defect data is stored, the defect data 1 corresponding to the testing order 1 is stored in the storage file under the component level 1 of the version level 1 of the product level 1; the defect data 2 corresponding to the testing order 2 is stored in the product level In the storage file under the component level 2 of the version level 2 of version 2; store the defect data 3 corresponding to the test proposal 3 in the storage file under the component level 3 of the version level 1 of the product level 1.

That is to say, this technical solution does not limit the number of layers of the directory hierarchy of the defect storage system when establishing a mapping relationship, as long as it is realized based on the idea of establishing a mapping relationship in this technical solution, it is included in this technical solution.

In one embodiment of the present invention, before establishing the mapping relationship between the business level corresponding to the testing order and the directory level of the defect storage system in step S120 of the method shown in FIG. 1 , the method further includes: querying the mapping relationship table , to determine whether there is a mapping relationship corresponding to the business level of the bill of lading in the mapping relationship table; wherein, the mapping relationship table stores the mapping relationship between the business level of the bill of lading and the directory level of the defect storage system; if not, Create a new directory level in the defect storage system, and establish a mapping relationship between the business level corresponding to the test proposal and the created new directory level; if it exists, the acquired defect data will be directly stored in the defect storage system according to the mapping relationship Store files under the corresponding directory hierarchy.

Considering that testers may make the same test request for the same test content, that is, the same test order, the corresponding defect data should be stored in the same storage file. In this embodiment, a mapping relationship table is created, and the established mapping relationship between the service level of the test bill and the directory level of the defect storage system is saved in the mapping relationship table. When accepting the test proposal again, first check whether the mapping relationship corresponding to the business level of the test proposal already exists in the mapping relationship table. If it exists, there is no need to re-establish the mapping relationship, but directly according to the existing mapping relationship Defect data storage is carried out, and the defect data obtained from the test of the same testing order is stored in the same storage file. If it does not exist, in order to establish a mapping relationship, a new directory level needs to be created, so that the business level of the test bill and the new directory level can be mapped.

For example, in the mapping relationship table, the mapping relationship between the business line information 1 of the test proposal 1 and the product level 1, and the mapping relationship between the test identification information 1 of the test proposal 1 and the component level 1 of the product level 1 are stored. The defect data obtained by the test of the test sheet 1 is stored in the storage file under the component level 1 of the product level 1. If not, it means that there is no component level 1 and/or product level 1 that has a mapping relationship with the business level of test proposal 1, and a new directory level needs to be created, and the business level corresponding to the test proposal and the new directory level created mapping relationship.

Further, the above defect storage system includes a first level and a second level, wherein the first level includes one or more second levels.

Then the above-mentioned creation of a new directory level in the defect storage system, and the establishment of the mapping relationship between the business level corresponding to the test proposal and the created new directory level include: querying whether there is a business level corresponding to the test proposal in the mapping relationship table The mapping relationship corresponding to the business line information; if it exists, create a new second level under the first level that has a mapping relationship with the business line information, and establish the test identification information of the business level corresponding to the test proposal and the created second level The mapping relationship between them; if it does not exist, create a new first level in the defect storage system, and create a new second level under the created first level; establish the business line information of the business level corresponding to the testing order The mapping relationship with the created first level, and the mapping relationship between the test identification information of the business level corresponding to the establishment of the test proposal and the created second level.

Considering that the testing needs of testers are for testing different content under the same business line, it is necessary to store the defect data of the test in the same directory level of the defect storage system corresponding to the information of the business line.

Based on the above embodiments, when creating a new directory level, it is also necessary to determine whether to create a new first level or a new second level. Specifically, query whether there is a mapping relationship corresponding to the business line information of the business level of the bill of lading in the mapping relationship table. If it exists, it means that the first level corresponding to the business line information already exists, and only the second level needs to be established. , if it does not exist, it means that both a new second level and a new first level need to be created.

For example, after receiving the test proposal 1, obtain the business line information 1 and test identification information 1 of the business level of the test proposal 1, query the mapping relationship table, if the business line information 1 and the product level of the test proposal 1 are stored 1, but there is no mapping relationship between the test identification information 1 of the test proposal 1 and the component level 1 of the product level 1, then create a new component x under the product level 1, and establish the business level of the test proposal 1 The mapping relationship between line of business information 1 and product level 1, and the mapping relationship between test identification information 1 and component x are established, and the defect data obtained by the test of test order 1 is stored in the storage file under component x of product level 1. If there is neither a mapping relationship corresponding to the business line information 1 of the test proposal 1 nor a mapping relationship corresponding to the test identification information 1 of the test proposal 1, create a new product x and create a new component under product x y, establish the mapping relationship between the business line information 1 of the business level of the testing order 1 and the product x, and establish the mapping relationship between the test identification information 1 and the component y, and store the defect data obtained from the testing of the testing order 1 in the product x in the store file under component y.

In one embodiment of the present invention, the defect storage system in the method described in FIG. 1 refers to the defect tracking system bugzilla.

Bugzilla is an independent system. Applying the technical solution of the present invention to the scene where bugzilla is used to store defect data can realize the association between the bugzilla system and other testing processes. Specifically, the directory hierarchy of the bugzilla system includes a product level and a component level (version level), so the mapping relationship between the business line information of the test order and the product level is established, and the test identification information and the component (version level) of the test order are established. ) level mapping relationship.

Fig. 2 shows a schematic structural diagram of a test defect data storage device according to an embodiment of the present invention. As shown in Figure 2, the test defect data storage device 200 includes:

The test bill receiving unit 210 is adapted to receive a test bill for making a test request.

In this embodiment, the method of providing an interface may be used to receive the test form of the user's test request through the interface. Testers can input the corresponding test submission form according to their own needs or according to their own habits, without considering whether the business level of the test submission form conforms to the directory level of the defect storage system.

The mapping relationship establishment unit 220 is adapted to establish a mapping relationship between the business level corresponding to the test proposal and the directory level of the defect storage system.

The defect data acquiring unit 230 is adapted to acquire the defect data obtained by the test corresponding to the test proposal.

The defect data storage unit 240 is adapted to store the obtained defect data into storage files under the corresponding directory level in the defect storage system according to the mapping relationship.

After the tester submits the test proposal, the corresponding test will be carried out according to the test proposal, and the defect data will be obtained during the test. In order to realize the storage of the defect data, the solution of this embodiment can be adopted, and the defect data can be directly stored according to the mapping relationship. Store without considering whether the corresponding business level is consistent with the directory level. Through this embodiment, the storage of defect data is realized, the storage efficiency is improved, the storage of defect data is more humanized, and user experience is enhanced.

In addition, the defect data storage system is an independent system. For a test with a certain process, the defect storage system is not related to other test processes. It requires testers to perform specific defect data storage operations to realize defect data storage. .

Through this embodiment, the defect storage system is associated with the entire test process, and the tester only needs to submit the test sheet, and can realize the storage of defect data without performing separate operations, further improving the user experience.

In one embodiment of the present invention, the device shown in Figure 2 further includes:

The mapping relationship storage unit is suitable for creating a mapping relationship table; and saving the established mapping relationship between the business level of the bill of lading and the directory level of the defect storage system in the mapping relationship table.

The defect data determination unit is adapted to query the mapping relationship table when receiving the defect data acquisition request of the designated test bill, and determine the directory level of the defect storage system that has a mapping relationship with the business level of the designated test bill; from the determined Obtain the defect data corresponding to the specified test proposal from the storage file under the directory level of the defect storage system.

Considering the lack of connection between the defect storage system and other testing processes in the prior art, and when reading the defect data, the operator also needs to value the directory level information of the defect system and the information corresponding to the defect data that needs to be read. . Therefore, the proposal of this embodiment is proposed.

Through the solution of this embodiment, on the one hand, the defect storage system can be associated with other testing processes, and the flexible reading of defect data can also be realized, and the corresponding defect can be obtained only according to the information of the test order (such as identification information) data.

In one embodiment of the present invention, the device shown in Figure 2 further includes:

The test report generation unit is adapted to generate a corresponding test report according to the obtained defect data corresponding to the specified test proposal.

Through this embodiment, the test procedures such as test sheet submission, testing, defect data storage, defect data reading, and test report generation in the test process are integrated together, which further facilitates the operation of testers and improves user experience .

In one embodiment of the present invention, the mapping relationship establishing unit 220 shown in FIG. 2 is adapted to obtain the service level corresponding to the testing order; The mapping relationship of directory hierarchy.

In this embodiment, in order to establish a mapping relationship between the service level corresponding to the test proposal and the directory level of the defect storage system, it is first necessary to obtain the service level corresponding to the test proposal.

Preferably, the business level corresponding to the test proposal includes line of business information, project information or test identification information.

Further, the above-mentioned mapping relationship establishment unit 220 is adapted to obtain the corresponding service level directly from the test proposal; or, provide a service level input interface, and receive the service level corresponding to the test proposal through the interface; or, after receiving the test proposal When ordering, obtain the business level corresponding to the testing order from the designated database; wherein, the business level corresponding to the testing order is stored in the designated database.

In this embodiment, the service level corresponding to the test order can be obtained through three ways. If there is a corresponding business level in the received test proposal, the corresponding business level can be obtained directly from the test proposal; an interface for inputting the business level can also be provided, through which the user can input the corresponding business level of the test proposal. That is, the business level corresponding to the test proposal is obtained through this interface; if the tester stores the relevant information of the test proposal in the designated database, the corresponding business level is obtained from the designated database when the test proposal is received, for example , the designated database correspondingly stores the identification information and business level of the testing order, then the corresponding business level can be obtained from the designated database through the identification information of the testing order.

In an embodiment of the present invention, the directory hierarchy of the defect storage system includes a first hierarchy and a second hierarchy, wherein the first hierarchy includes one or more second hierarchies.

Then the mapping relationship establishment unit 220 shown in FIG. 2 is suitable for establishing the mapping relationship between the business line corresponding to the test bill and the first level of the directory hierarchy of the defect storage system according to the business line information in the business hierarchy; Establish a mapping relationship between the test identification information corresponding to the testing order and the second level under the first level of the defect storage system.

In the present invention, the directory hierarchy of the defect storage system includes two levels, so the business line information and test identification information of the test submission form are mapped to the two levels of the defect storage system respectively. The test identification information here may be a unique identification code or a test name defined by the tester.

For example, the directory level of the defect storage system includes the product level and the component level, and the relationship between the business line information of the test order and the product level is established, and the test identification information of the test order is established with the component level.

In a specific example, a defect storage system has a product level and a component level. The business level of test submission 1 is business line information 1, test ID 1; the business level of test submission 2 is business line information 2, test ID 2; the business level of test submission 3 is business line information 1, test ID 3 . When establishing the mapping relationship, establish a mapping relationship between the business line information 1 of the test proposal 1 and the product level 1 of the defect storage system, and establish a mapping relationship between the test identification information 1 of the test proposal 1 and the component level 1 of the defect storage system; Establish a mapping relationship between the business line information 2 of the testing order 2 and the product level 2 of the defect storage system, and establish a mapping relationship between the test identification information 2 of the testing order 2 and the component level 2 of the defect storage system; The line information 1 establishes a mapping relationship with the product level 1 of the defect storage system, and establishes a mapping relationship between the test identification information 3 of the testing order 3 and the component level 3 of the defect storage system.

Then, when defect data is stored, the defect data 1 corresponding to the testing order 1 is stored in the storage file under the component level 1 under the product level 1; the defect data 2 corresponding to the testing order 2 is stored in the storage file under the product level 2 In the storage file under the component level 2; store the defect data 3 corresponding to the testing order 3 in the storage file under the component level 3 under the product level 1.

The above-mentioned embodiment is an explanation for the case where the defective storage system has two levels. If the defective storage system has more than two levels, it can also be realized through this technical solution.

In one embodiment of the present invention, the directory hierarchy of the defect storage system has three levels, and the mapping relationship establishment unit 220 is adapted to establish the business line corresponding to the test proposal and the defect storage system according to the business line information in the business level. The mapping relationship of the first level of the catalog level; according to the project information in the business level, establish the mapping relationship between the project information corresponding to the test proposal and the second level under the first level of the defect storage system; according to the test identification in the business level information, and establish a mapping relationship between the test identification information corresponding to the test proposal and the third level of the second level under the first level of the defect storage system.

In a specific example, the defect storage system has a product level, a version level, and a component level. The business level of test proposal 1 is business line information 1, project information 1, and test identification 1; the business level of test proposal 2 is business Line information 2, project information 2, test identification 2; the business level of test submission form 3 is business line information 1, project information 1, and test identification 3. When establishing the mapping relationship, establish a mapping relationship between the business line information 1 of the test proposal 1 and the product level 1 of the defect storage system, establish a mapping relationship between the project information 1 of the test proposal 1 and the version level 1 of the defect storage system, and provide Establish a mapping relationship between the test identification information 1 of the test order 1 and the component level 1 of the defect storage system; establish a mapping relationship between the business line information 2 of the test order 2 and the product level 2 of the defect storage system, and the project information of the test order 2 2 Establish a mapping relationship with the version level 2 of the defect storage system, and establish a mapping relationship between the test identification information 2 of the test proposal 2 and the component level 2 of the defect storage system; the business line information 1 of the test proposal 3 and the defect storage system Establish a mapping relationship at product level 1, establish a mapping relationship between project information 1 of test proposal 3 and version level 1 of the defect storage system, and establish a mapping relationship between test identification information 3 of test proposal 3 and component level 3 of the defect storage system.

Then, when defect data is stored, the defect data 1 corresponding to the testing order 1 is stored in the storage file under the component level 1 of the version level 1 of the product level 1; the defect data 2 corresponding to the testing order 2 is stored in the product level In the storage file under the component level 2 of the version level 2 of version 2; store the defect data 3 corresponding to the test proposal 3 in the storage file under the component level 3 of the version level 1 of the product level 1.

That is to say, this technical solution does not limit the number of layers of the directory hierarchy of the defect storage system when establishing a mapping relationship, as long as it is realized based on the idea of establishing a mapping relationship in this technical solution, it is included in this technical solution.

In one embodiment of the present invention, the device shown in Figure 2 further includes:

The mapping relationship query unit is suitable for querying the mapping relationship table before establishing the mapping relationship between the business level corresponding to the testing order and the directory level of the defect storage system, and judging whether there is a mapping corresponding to the business level of the testing order in the mapping relationship table relationship; among them, the mapping relationship table stores the mapping relationship between the business level corresponding to the test proposal and the directory level of the defect storage system; if it does not exist, create a new directory level in the defect storage system, and establish the business corresponding to the test proposal The mapping relationship between the level and the created new directory level; if it exists, then according to the mapping relationship, the acquired defect data is directly stored in the storage file under the corresponding directory level in the defect storage system.

Considering that testers may make the same test request for the same test content, that is, the same test order, the corresponding defect data should be stored in the same storage file. In this embodiment, a mapping relationship table is created, and the established mapping relationship between the service level of the test bill and the directory level of the defect storage system is saved in the mapping relationship table. When accepting the test proposal again, first check whether the mapping relationship corresponding to the business level of the test proposal already exists in the mapping relationship table. If it exists, there is no need to re-establish the mapping relationship, but directly according to the existing mapping relationship Defect data storage is carried out, and the defect data obtained from the test of the same testing order is stored in the same storage file. If it does not exist, in order to establish a mapping relationship, a new directory level needs to be created, so that the business level of the test bill and the new directory level can be mapped.

For example, in the mapping relationship table, the mapping relationship between the business line information 1 of the test proposal 1 and the product level 1 is stored, and the mapping relationship between the test identification information 1 of the test proposal 1 and the component level 1 of the product level 1 is stored. The defect data obtained by the test of the test sheet 1 is stored in the storage file under the component level 1 of the product level 1. If not, it means that there is no component level 1 and/or product level 1 that has a mapping relationship with the business level of test proposal 1, and a new directory level needs to be created, and the business level corresponding to the test proposal and the new created directory level need to be created mapping relationship.

Further, the above defect storage system includes a first level and a second level, wherein the first level includes one or more second levels;

Then the above-mentioned mapping relationship query unit is suitable for querying whether there is a mapping relationship corresponding to the business line information of the business level corresponding to the test bill in the mapping relationship table; Next, create a new second level, and establish the mapping relationship between the test identification information of the business level corresponding to the test proposal and the created second level; if it does not exist, create a new first level in the defect storage system, and Create a new second level under the created first level; establish the mapping relationship between the business line information of the business level corresponding to the test proposal and the created first level, and establish the test identification information and the business level corresponding to the test proposal The created second-level mapping relationship.

Considering that the testing needs of testers are for testing different content under the same business line, it is necessary to store the defect data of the test in the same directory level of the defect storage system corresponding to the information of the business line.

Based on the above embodiments, when creating a new directory level, it is also necessary to determine whether to create a new first level or a new second level. Specifically, query whether there is a mapping relationship corresponding to the business line information of the business level of the bill of lading in the mapping relationship table. If it exists, it means that the first level corresponding to the business line information already exists, and only the second level needs to be established. , if it does not exist, it means that both a new second level and a new first level need to be created.

For example, after receiving the test proposal 1, obtain the business line information 1 and test identification information 1 of the business level of the test proposal 1, query the mapping relationship table, if the business line information 1 and the product level of the test proposal 1 are stored 1, but there is no mapping relationship between the test identification information 1 of the test proposal 1 and the component level 1 of the product level 1, then create a new component x under the product level 1, and establish the business level of the test proposal 1 The mapping relationship between line of business information 1 and product level 1, and the mapping relationship between test identification information 1 and component x are established, and the defect data obtained by the test of test order 1 is stored in the storage file under component x of product level 1. If there is neither a mapping relationship corresponding to the business line information 1 of the test proposal 1 nor a mapping relationship corresponding to the test identification information 1 of the test proposal 1, create a new product x and create a new component under product x y, establish the mapping relationship between the business line information 1 of the business level of the testing order 1 and the product x, and establish the mapping relationship between the test identification information 1 and the component y, and store the defect data obtained from the testing of the testing order 1 in the product x in the store file under component y.

In an embodiment of the present invention, the above-mentioned defect storage system refers to the defect tracking system bugzilla.

Bugzilla is an independent system. Applying the technical solution of the present invention to the scene where bugzilla is used to store defect data can realize the association between the bugzilla system and other testing processes. Specifically, the directory hierarchy of the bugzilla system includes a product level and a component level (version level), so the mapping relationship between the business line information of the test order and the product level is established, and the test identification information and the component (version level) of the test order are established. ) level mapping relationship.

To sum up, according to the technical solution of the present invention, the test request form for submitting a test request is received; the mapping relationship between the service level corresponding to the test form and the directory level of the defect storage system is established; and the test form corresponding to the test form is obtained. The obtained defect data; according to the mapping relationship, the obtained defect data is stored in the storage file under the corresponding directory level in the defect storage system. Through this technical solution, the mapping relationship between the business level corresponding to the testing order and the directory level of the defect storage system is established. The tester can submit the test form according to his own needs, and then the defect data obtained by the test is automatically stored in the defect storage system. According to the directory hierarchy of the defect storage system, the storage of defect data can also be realized, which improves the storage efficiency, makes the storage of defect data more humanized, and enhances the user experience.

It should be noted:

The algorithms and displays presented herein are not inherently related to any particular computer, virtual appliance, or other device. Various general purpose devices can also be used with the teachings based on this. The structure required to construct such an apparatus will be apparent from the foregoing description. Furthermore, the present invention is not specific to any particular programming language. It should be understood that various programming languages can be used to implement the contents of the present invention described herein, and the above description of specific languages is for disclosing the best mode of the present invention.

In the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure the understanding of this description.

Similarly, it should be appreciated that in the foregoing description of exemplary embodiments of the invention, in order to streamline this disclosure and to facilitate an understanding of one or more of the various inventive aspects, various features of the invention are sometimes grouped together in a single embodiment, figure, or its description. This method of disclosure, however, is not to be interpreted as reflecting an intention that the claimed invention requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single foregoing disclosed embodiment. Thus, the claims following the Detailed Description are hereby expressly incorporated into this Detailed Description, with each claim standing on its own as a separate embodiment of this invention.

Those skilled in the art can understand that the modules in the device in the embodiment can be adaptively changed and arranged in one or more devices different from the embodiment. Modules or units or components in the embodiments may be combined into one module or unit or component, and furthermore may be divided into a plurality of sub-modules or sub-units or sub-assemblies. All features disclosed in this specification (including accompanying claims, abstract and drawings) and any method or method so disclosed may be used in any combination, except that at least some of such features and/or processes or units are mutually exclusive. All processes or units of equipment are combined. Each feature disclosed in this specification (including accompanying claims, abstract and drawings) may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise.

Furthermore, those skilled in the art will understand that although some embodiments described herein include some features included in other embodiments but not others, combinations of features from different embodiments are meant to be within the scope of the invention. and form different embodiments. For example, in the following claims, any of the claimed embodiments may be used in any combination.

The various component embodiments of the present invention may be implemented in hardware, or in software modules running on one or more processors, or in a combination thereof. Those skilled in the art should understand that a microprocessor or a digital signal processor (DSP) can be used in practice to implement some or all of the components in the test defect data storage device, electronic equipment, and computer storage medium according to the embodiments of the present invention. some or all of the features. The present invention can also be implemented as an apparatus or an apparatus program (for example, a computer program and a computer program product) for performing a part or all of the methods described herein. Such a program for realizing the present invention may be stored on a computer-readable medium, or may be in the form of one or more signals. Such a signal may be downloaded from an Internet site, or provided on a carrier signal, or provided in any other form.

For example, FIG. 3 shows a schematic structural diagram of an electronic device according to an embodiment of the present invention. The electronic device 300 conventionally comprises a processor 310 and a memory 320 arranged to store computer-executable instructions (program code). Memory 320 may be electronic memory such as flash memory, EEPROM (Electrically Erasable Programmable Read Only Memory), EPROM, hard disk, or ROM. The memory 320 has a storage space 330 for storing program code 340 for executing any method steps shown in FIG. 1 and in various embodiments. For example, the storage space 330 for program codes may include respective program codes 340 for respectively implementing various steps in the above methods. These program codes can be read from or written into one or more computer program products. These computer program products comprise program code carriers such as hard disks, compact disks (CDs), memory cards or floppy disks. Such a computer program product is typically, for example, the computer-readable storage medium 400 as described in FIG. 4 . The computer-readable storage medium 400 may have storage segments, storage spaces, etc. arranged similarly to the memory 320 in the electronic device of FIG. 3 . The program code can eg be compressed in a suitable form. Typically, the memory unit stores program code 410 for performing the steps of the method according to the invention, i.e. program code readable by a processor such as 310, which when executed by the electronic device causes the electronic device to perform steps in the method described above.

It should be noted that the above-mentioned embodiments illustrate rather than limit the invention, and that those skilled in the art will be able to design alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The invention can be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In a unit claim enumerating several means, several of these means can be embodied by one and the same item of hardware. The use of the words first, second, and third, etc. does not indicate any order. These words can be interpreted as names.

The invention discloses A1. A method for storing test defect data, wherein the method includes:

Receive test submissions for submitting test requests;

Establishing a mapping relationship between the business level corresponding to the testing order and the directory level of the defect storage system;

Obtain the defect data obtained from the test corresponding to the test proposal;

According to the mapping relationship, the acquired defect data is stored in a storage file under a corresponding directory level in the defect storage system.

A2. The method as described in A1, wherein the method further comprises:

Create a mapping relationship table;

saving the established mapping relationship between the service level of the test bill and the directory level of the defect storage system in the mapping relationship table;

When receiving the acquisition request of the defect data of the designated test proposal, query the mapping relationship table, and determine the directory level of the defect storage system that has a mapping relationship with the business level of the designated test proposal;

The defect data corresponding to the designated test proposal is acquired from the storage files under the determined directory level of the defect storage system.

A3, the method as described in A2, wherein, the method further comprises:

Generate a corresponding test report based on the acquired defect data corresponding to the specified test proposal.

A4. The method as described in A1, wherein the establishment of the mapping relationship between the business level corresponding to the test proposal and the directory level of the defect storage system includes:

Obtain the service level corresponding to the test proposal;

According to the obtained business level, a mapping relationship between the business level corresponding to the test proposal and the directory level of the defect storage system is established.

A5. The method as described in A4, wherein said obtaining the service level corresponding to the test proposal includes:

Obtain the corresponding business level directly from the test proposal;

or,

Provide a service level input interface, and receive the service level corresponding to the test proposal through the interface;

or,

When the test proposal is received, the service level corresponding to the test proposal is obtained from a designated database; wherein, the designated database stores the service level corresponding to the test proposal.

A6. The method according to A1, wherein the directory hierarchy of the defective storage system includes a first hierarchy and a second hierarchy, wherein the first hierarchy includes one or more second hierarchies;

The establishment of the mapping relationship between the business level corresponding to the test proposal and the directory level of the defect storage system includes:

According to the business line information in the business level, establish a mapping relationship between the business line corresponding to the test proposal and the first level of the directory level of the defect storage system;

According to the test identification information in the service level, establish a mapping relationship between the test identification information corresponding to the test proposal and the second level under the first level of the defect storage system.

A7. The method as described in A1, wherein, before establishing the mapping relationship between the business level corresponding to the testing order and the directory level of the defect storage system, the method further includes:

Querying the mapping relationship table, and judging whether there is a mapping relationship corresponding to the business level of the test bill in the mapping relationship table; wherein, the mapping relationship table stores the relationship between the business level corresponding to the test bill and the defect storage system Directory-level mapping relationship;

If it does not exist, create a new directory level in the defect storage system, and establish a mapping relationship between the business level corresponding to the test proposal and the created new directory level;

If it exists, according to the mapping relationship, the acquired defect data is directly stored in a storage file under a corresponding directory level in the defect storage system.

A8. The method according to A7, wherein the defective storage system includes a first level and a second level, wherein the first level includes one or more second levels;

The creating a new directory level in the defect storage system, and establishing the mapping relationship between the service level corresponding to the testing order and the created new directory level include:

Querying whether there is a mapping relationship corresponding to the business line information of the business level corresponding to the testing order in the mapping relationship table;

If it exists, create a new second level under the first level that has a mapping relationship with the business line information, and establish a mapping between the test identification information of the business level corresponding to the test proposal and the created second level. relation;

If it does not exist, create a new first level in the defect storage system, and create a new second level under the created first level; establish the business line information and create The mapping relationship of the first level, and the mapping relationship between the test identification information of the business level corresponding to the test proposal and the created second level is established.

A9. The method according to any one of A1-A8, wherein the defect storage system refers to a defect tracking system bugzilla.

The present invention also discloses B10, a test defect data storage device, wherein the device includes:

A testing order receiving unit adapted to receive a testing order for making a test request;

A mapping relationship establishment unit, adapted to establish a mapping relationship between the business level corresponding to the test bill and the directory level of the defect storage system;

a defect data acquisition unit, adapted to acquire defect data obtained from the test corresponding to the testing order;

The defect data storage unit is adapted to store the obtained defect data in storage files under the corresponding directory level in the defect storage system according to the mapping relationship.

B11. The device as described in B10, wherein the device further comprises:

The mapping relationship storage unit is adapted to create a mapping relationship table; and save the established mapping relationship between the business level of the test bill and the directory level of the defect storage system in the mapping relationship table;

The defect data determining unit is adapted to query the mapping relationship table when receiving the defect data acquisition request of the designated test bill, and determine the directory level of the defect storage system that has a mapping relationship with the business level of the designated test bill ; Acquiring the defect data corresponding to the specified testing proposal form from the storage files under the determined directory level of the defect storage system.

B12. The device as described in B11, wherein the device further comprises:

The test report generation unit is adapted to generate a corresponding test report according to the acquired defect data corresponding to the designated test proposal.

B13. The device of B10, wherein,

The mapping relationship establishment unit is adapted to obtain the service level corresponding to the test proposal; according to the acquired business level, establish a mapping relationship between the service level corresponding to the test proposal and the directory level of the defect storage system.

B14. The device of B13, wherein,

The mapping relationship establishment unit is adapted to directly obtain the corresponding service level from the test proposal; or provide a service level input interface through which the service level corresponding to the test proposal is received; or, upon receiving When the test submission form is received, the service level corresponding to the test submission form is obtained from a designated database; wherein, the service level corresponding to the test submission form is stored in the designated database.

B15. The device according to B10, wherein the directory hierarchy of the defective storage system includes a first hierarchy and a second hierarchy, wherein the first hierarchy includes one or more second hierarchies;

The mapping relationship establishment unit is adapted to establish a mapping relationship between the business line corresponding to the test proposal and the first level of the directory level of the defect storage system according to the business line information in the business level; according to the The test identification information in the service level establishes a mapping relationship between the test identification information corresponding to the test proposal and the second level under the first level of the defect storage system.

B16. The device as described in B10, wherein the device further comprises:

The mapping relationship query unit is adapted to query the mapping relationship table before establishing the mapping relationship between the business level corresponding to the test proposal and the directory level of the defect storage system, and determine whether there is a mapping relationship in the mapping relationship table that is related to the proposed problem. The mapping relationship corresponding to the business level of the test sheet; wherein, the mapping relationship table stores the mapping relationship between the business level corresponding to the test order and the directory level of the defect storage system; if it does not exist, create a new one in the defect storage system directory level, establishing a mapping relationship between the business level corresponding to the test proposal and the created new directory level; if it exists, according to the mapping relationship, the acquired defect data is directly stored in the corresponding defect storage system In the storage file under the directory hierarchy.

B17. The apparatus according to B16, wherein the defect storage system includes a first level and a second level, wherein the first level includes one or more second levels;

The mapping relationship query unit is adapted to query whether there is a mapping relationship corresponding to the business line information of the business level corresponding to the survey proposal in the mapping relationship table; if it exists, it has a mapping relationship with the business line information Create a new second level under the first level of the relationship, and establish a mapping relationship between the test identification information of the service level corresponding to the test proposal and the created second level; if it does not exist, then in the defect storage system Create a new first level in the first level, and create a new second level under the created first level; establish the mapping relationship between the business line information of the business level corresponding to the test proposal and the created first level, and establish the The mapping relationship between the test identification information of the service level corresponding to the above-mentioned test proposal and the created second level.

B18. The device according to any one of B10-B17, wherein the defect storage system refers to a defect tracking system bugzilla.

The present invention also discloses C19, an electronic device, wherein the electronic device includes:

Processor; and,

A memory arranged to store computer-executable instructions which, when executed, cause the processor to perform the method according to any one of A1 to A9.

The present invention also discloses D20, a computer-readable storage medium, wherein, the computer-readable storage medium stores one or more programs, and when the one or more programs are executed by the processor, the steps in A1-A9 are realized. any one of the methods described.

Claims (18)

1. A method of testing defective data storage, wherein the method comprises:

receiving a test request for making a test order;

inquiring a mapping relation table, and judging whether a mapping relation corresponding to the service level of the test order exists in the mapping relation table; the mapping relation table stores the mapping relation between the service level corresponding to the test sheet and the directory level of the defect storage system;

if the directory hierarchy does not exist, a new directory hierarchy is created in the defect storage system, and a mapping relation between the business hierarchy corresponding to the test sheet and the created new directory hierarchy is established;

acquiring defect data obtained by testing corresponding to the test sheet;

storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation;

and if so, directly storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation.

2. The method of claim 1, wherein the method further comprises:

creating a mapping relation table;

storing the established mapping relation between the service level of the test sheet and the directory level of the defect storage system into the mapping relation table;

when an acquisition request of the defect data of a specified test order is received, inquiring the mapping relation table, and determining a directory hierarchy of the defect storage system having a mapping relation with the service hierarchy of the specified test order;

and acquiring the defect data corresponding to the specified test list from the storage file under the determined directory hierarchy of the defect storage system.

3. The method of claim 2, wherein the method further comprises:

and generating a corresponding test report according to the acquired defect data corresponding to the specified test sheet.

4. The method of claim 1, wherein the establishing a mapping relationship between a service level corresponding to the test ticket and a directory level of a defective memory system comprises:

acquiring a service level corresponding to the sampling list;

and establishing a mapping relation between the service level corresponding to the test list and the directory level of the defect storage system according to the acquired service level.

5. The method of claim 4, wherein the obtaining the service level corresponding to the test ticket comprises:

directly acquiring a corresponding service level from the test list;

or,

providing a business level input interface, and receiving the business level corresponding to the test order through the interface;

or,

when the test order is received, acquiring a service level corresponding to the test order from a specified database; and the specified database stores the service level corresponding to the test sheet.

6. The method of claim 1, wherein the directory hierarchy of the defective memory system includes a first hierarchy and a second hierarchy, wherein the first hierarchy includes one or more of the second hierarchy;

the establishing of the mapping relationship between the service level corresponding to the test order and the directory level of the defect storage system comprises:

establishing a mapping relation between the service line corresponding to the sampling list and a first level of a directory level of the defect storage system according to the service line information in the service level;

and establishing a mapping relation between the test identification information corresponding to the test bill and a second level of the defect storage system under the first level according to the test identification information in the service level.

7. The method of claim 6, wherein the defective memory system includes a first hierarchy and a second hierarchy, wherein the first hierarchy includes one or more of the second hierarchy;

the creating of a new directory hierarchy in the defect storage system, and the establishing of the mapping relationship between the service hierarchy corresponding to the test sheet and the created new directory hierarchy includes:

inquiring whether a mapping relation corresponding to the service line information of the service level corresponding to the extraction list exists in the mapping relation table;

if the business line information exists, a new second level is established under the first level which has a mapping relation with the business line information, and a mapping relation between the test identification information of the business level corresponding to the test bill and the established second level is established;

if not, creating a new first level in the defective memory system, and creating a new second level below the created first level; and establishing a mapping relation between the service line information of the service level corresponding to the test order and the created first level, and establishing a mapping relation between the test identification information of the service level corresponding to the test order and the created second level.

8. The method of any one of claims 1-7, wherein the defective memory system is referred to as a defect tracking system bugzilla.

9. A method of testing a defective data storage device, wherein the device comprises:

the test order receiving unit is suitable for receiving a test order for making a test request;

the mapping relation query unit is suitable for querying a mapping relation table and judging whether a mapping relation corresponding to the service level of the test list exists in the mapping relation table or not; the mapping relation table stores the mapping relation between the service level corresponding to the test order and the directory level of the defect storage system; if the directory hierarchy does not exist, a new directory hierarchy is created in the defect storage system, and a mapping relation between the service hierarchy corresponding to the test sheet and the created new directory hierarchy is established;

the defect data acquisition unit is suitable for acquiring the defect data obtained by the test corresponding to the test sheet;

the defect data storage unit is suitable for storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation;

and the mapping relation query unit is also suitable for directly storing the acquired defect data into a storage file under a corresponding directory hierarchy in the defect storage system according to the mapping relation if the mapping relation exists after querying the mapping relation table and judging whether the mapping relation corresponding to the service hierarchy of the test order exists in the mapping relation table.

10. The apparatus of claim 9, wherein the apparatus further comprises:

the mapping relation storage unit is suitable for creating a mapping relation table; storing the established mapping relation between the service level of the test sheet and the directory level of the defect storage system into the mapping relation table;

the defect data determining unit is suitable for inquiring the mapping relation table and determining a directory hierarchy of the defect storage system which has a mapping relation with the service hierarchy of the specified test order when an acquisition request of the defect data of the specified test order is received; and acquiring the defect data corresponding to the specified test bill from the storage file under the determined directory hierarchy of the defect storage system.

11. The apparatus of claim 10, wherein the apparatus further comprises:

and the test report generating unit is suitable for generating a corresponding test report according to the acquired defect data corresponding to the specified test sheet.

12. The apparatus of claim 9, wherein,

the mapping relation establishing unit is suitable for acquiring a service level corresponding to the test sheet; and establishing a mapping relation between the service level corresponding to the test list and the directory level of the defect storage system according to the acquired service level.

13. The apparatus of claim 12, wherein,

the mapping relation establishing unit is suitable for directly acquiring a corresponding service level from the extracting and testing list; or, providing a business level input interface, and receiving the business level corresponding to the test order through the interface; or when the test order is received, acquiring a service level corresponding to the test order from a specified database; and the specified database stores the service level corresponding to the test sheet.

14. The apparatus of claim 9, wherein the directory hierarchy of the defective memory system includes a first hierarchy and a second hierarchy, wherein the first hierarchy includes one or more of the second hierarchy;

the mapping relation establishing unit is suitable for establishing the mapping relation between the service line corresponding to the sampling list and the first level of the directory level of the defect storage system according to the service line information in the service level; and establishing a mapping relation between the test identification information corresponding to the test bill and a second level of the defect storage system under the first level according to the test identification information in the service level.

15. The apparatus of claim 14, wherein the defective memory system comprises a first hierarchy and a second hierarchy, wherein the first hierarchy comprises one or more of the second hierarchy;

the mapping relation query unit is suitable for querying whether a mapping relation corresponding to the service line information of the service level corresponding to the extraction list exists in the mapping relation table; if the business line information exists, a new second level is established under the first level which has a mapping relation with the business line information, and a mapping relation between the test identification information of the business level corresponding to the test list and the established second level is established; if not, creating a new first level in the defective memory system, and creating a new second level below the created first level; and establishing a mapping relation between the service line information of the service level corresponding to the test order and the created first level, and establishing a mapping relation between the test identification information of the service level corresponding to the test order and the created second level.

16. The apparatus of any one of claims 9-15, wherein the defective memory system is referred to as a defect tracking system bugzilla.

17. An electronic device, wherein the electronic device comprises:

a processor; and the number of the first and second groups,

a memory arranged to store computer executable instructions that, when executed, cause the processor to perform the method of any one of claims 1 to 8.

18. A computer readable storage medium, wherein the computer readable storage medium stores one or more programs which, when executed by a processor, implement the method of any of claims 1-8.

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