CN110706733A - DRAM memory row disturbance error solution method - Google Patents
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Abstract
一种DRAM内存行扰动错误解决方法,包括以下的步骤:S1:每个DRAM内存行采用两位的最近访问计时器,追踪其最近的被动激活信息;S2:当某内存行发生读写访问时,按概率N对其相邻行产生主动激活命令;S3:主动激活命令确定产生后,再根据内存行的最近访问计时器信息,决定是否实行主动激活操作;本发明的优点是:在存储代价可忽略的前提下,能准确发送主动激活命令到受害内存行,同时避免不必要的主动激活命令,最小化对性能的不利影响。
A DRAM memory row disturbance error resolution method, comprising the following steps: S1: each DRAM memory row adopts a two-digit recent access timer to track its recent passive activation information; S2: when a certain memory row has read-write access , generate an active activation command to its adjacent row according to probability N; S3: after the active activation command is determined to be generated, then according to the latest access timer information of the memory row, determine whether to implement an active activation operation; the advantage of the present invention is: in the storage cost Under the premise of being negligible, the active activation command can be accurately sent to the victim memory line, while avoiding unnecessary active activation commands and minimizing the adverse impact on performance.
Description
技术领域technical field
本发明针对现有计算机中DRAM内存的行扰动错误问题,提出基于内存行被动激活信息的解决方案。Aiming at the problem of row disturbance error of DRAM memory in existing computers, the present invention proposes a solution based on passive activation information of memory rows.
背景技术Background technique
DRAM存储器被广泛用于计算机的主存。DRAM存储器的每个存储单元包含一个电容,数据主要以电荷的方式存储于电容。大量的存储单元构成二维存储阵列,横向的存储单元构成行,纵向的单元则是列。DRAM存储器读写数据以行为单位,每次读写时,需要激活目标数据所在的行。当DRAM中某个数据行(row)频繁因为读写而被激活时,其上下相邻的数据行的存储单元因为耦合效应,使得阀值电压降低,漏电流增加,存储单元电容中的电荷迅速流失,导致存储的数据丢失。这种内存行数据因为相邻行频繁激活而导致数据丢失的现象称为行扰动错误。DRAM memory is widely used for the main memory of computers. Each memory cell of DRAM memory contains a capacitor, and data is mainly stored in the capacitor in the form of electric charge. A large number of memory cells form a two-dimensional memory array, with horizontal memory cells forming rows and vertical cells forming columns. DRAM memory reads and writes data in row units, and each time the data is read and written, the row where the target data is located needs to be activated. When a data row (row) in the DRAM is frequently activated due to reading and writing, the memory cells of the adjacent data rows above and below it will reduce the threshold voltage due to the coupling effect, the leakage current will increase, and the charge in the memory cell capacitor will rapidly increase. churn, resulting in the loss of stored data. This phenomenon in which memory row data is lost due to frequent activation of adjacent rows is called row perturbation error.
行扰动错误的主要原因是行存储单元的电荷流失加速,所以一种解决方案是及时对行存储单元进行刷新操作,补充电荷,保护数据。DRAM存储器常见的默认数据刷新操作周期是64毫秒。导致其他行因为行扰动而出现数据错误的行称为致害行,而出现行扰动错误的行则称为受害行。如果致害行在默认的刷新周期内,激活的次数超过特定阀值,就会导致受害行的数据出现行扰动错误,还无法及时受到默认刷新操作的保护。所以,一旦致害行的激活次数接近特定阀值,就需要主动的激活操作来保护受害行的数据。The main reason for the row disturbance error is accelerated charge loss of the row memory cells, so a solution is to perform a refresh operation on the row memory cells in time to supplement the charge and protect the data. A common default data refresh operation cycle for DRAM memory is 64 milliseconds. A row that causes other rows to have data errors due to row perturbation is called a victim row, and a row that has row perturbation errors is called a victim row. If the number of activations of the victim row exceeds a certain threshold within the default refresh cycle, it will cause row disturbance errors in the data of the victim row, and it cannot be protected by the default refresh operation in time. Therefore, once the number of activations of the victim row approaches a certain threshold, active activation operations are required to protect the data of the victim row.
主动的激活操作在电路层面与刷新操作等同。与主动刷新操作相对应的是被动刷新操作,主要发生在内存行读写或者默认的刷新操作时。被动的激活操作与主动的激活操作的保护行数据、对抗扰动错误的效果等同。如果内存行最近发生过被动激活操作,就不需要再发起主动刷新操作来保护数据。以往的解决行扰动错误的方法依赖于主动激活操作,没有考虑被动激活操作的数据保护作用,导致不必要的主动激活操作过多,带来性能上的不利影响。An active activation operation is equivalent to a refresh operation at the circuit level. Corresponding to the active refresh operation is the passive refresh operation, which mainly occurs when the memory row is read and written or the default refresh operation. The passive activation operation and the active activation operation have the same effect of protecting row data and resisting disturbance errors. If the memory row has been passively activated recently, there is no need to initiate an active refresh operation to protect the data. The previous methods for solving row disturbance errors rely on active activation operations, and do not consider the data protection effect of passive activation operations, resulting in too many unnecessary active activation operations and adversely affecting performance.
发明内容SUMMARY OF THE INVENTION
本发明要克服现有技术的上述缺陷,提出结合内存行被动激活信息的DRAM行扰动错误解决方法。本发明的内容和特征包含以下:In order to overcome the above-mentioned defects of the prior art, the present invention proposes a solution method for DRAM row disturbance errors combined with passive activation information of memory rows. The content and features of the present invention include the following:
S1:每个DRAM内存行采用两位的最近访问计时器,追踪其最近的被动激活S1: Each DRAM memory row uses a two-bit last-access timer to track its most recent passive activation
信息;information;
S2:当某内存行发生读写访问时,按概率N对其相邻行产生主动激活命令;S2: When a memory row has read and write access, an active activation command is generated for its adjacent row according to probability N;
S3:主动激活命令确定产生后,再根据内存行的最近访问计时器信息,决定S3: After the active activation command is determined to be generated, it is determined according to the latest access timer information of the memory row.
是否实行主动激活操作;Whether to implement active activation operation;
其中S1步骤具体为:每个内存行配备一两位的最近访问计时器,当内存行发生被动激活操作(因读写、默认刷新等操作)时,其对应的最近访问计时器初始化为11,并且按照11,10,01,00的顺序周期性更新,直至最终变为00;令内存行出现扰动错误的相邻行频繁激活的次数阀值为R,激活R次所需的时间T决定了最近访问计时器更新周期;两位的最近访问计时器的更新周期为T/3,因此从11更新至00需要周期T。The S1 step is as follows: each memory row is equipped with one or two recent access timers. When a passive activation operation occurs on the memory row (due to operations such as read and write, default refresh, etc.), its corresponding recent access timer is initialized to 11, And it is periodically updated in the order of 11, 10, 01, 00 until it finally becomes 00; the threshold for the number of frequent activations of adjacent rows with disturbance errors in the memory row is R, and the time T required to activate R times determines The latest access timer update period; the update period of the two-digit recent access timer is T/3, so it takes a period T to update from 11 to 00.
其中S2步骤具体为:每次发生数据访问时,内存控制器中的随机数生成器产生一[0,n)之间的随机数r,概率N等价于随机数r的值在[0,rN)之间;如果r小于等于nN,说明概率为N的事件发生,即产生对相邻行的主动激活命令;否则,不产生主动激活命令。The S2 step is specifically: each time a data access occurs, the random number generator in the memory controller generates a random number r between [0, n), and the probability N is equivalent to the value of the random number r in [0, n). rN); if r is less than or equal to nN, it means that an event with probability N occurs, that is, an active activation command to adjacent rows is generated; otherwise, no active activation command is generated.
其中S3步骤具体为:主动激活命令产生后,查看将被激活内存行的最近访问计时器值,如果值为00,则发送主动激活命令至DRAM内存;否则,主动激活命令取消。The step S3 is specifically: after the active activation command is generated, check the value of the most recent access timer of the memory row to be activated, if the value is 00, send the active activation command to the DRAM memory; otherwise, cancel the active activation command.
本发明的优点是:在存储代价可忽略的前提下,能准确发送主动激活命令到受害内存行,同时避免不必要的主动激活命令,最小化对性能的不利影响。The advantages of the present invention are: on the premise of negligible storage cost, the active activation command can be accurately sent to the victim memory row, and unnecessary active activation commands are avoided, and the adverse impact on performance is minimized.
附图说明Description of drawings
图1是本发明方法描述的DRAM行扰动错误问题的示意图。FIG. 1 is a schematic diagram of the DRAM row disturbance error problem described by the method of the present invention.
图2是本发明方法的最近访问计时器的更新过程。FIG. 2 is the update process of the most recent access timer of the method of the present invention.
图3是本发明方法的主流程图。Figure 3 is a main flow chart of the method of the present invention.
具体实施方式Detailed ways
下面结合附图和实施例,进一步说明本发明方法的技术方案。The technical solutions of the method of the present invention will be further described below in conjunction with the accompanying drawings and embodiments.
图1是DRAM行扰动错误问题的描述,DRAM中的存储单元构成二维阵列,其中的致害行(aggressor row)因为频繁地访问,对其上下相邻的两受害行(victim row)造成扰动,导致受害行出现行扰动错误。R表示受害行发生行扰动错误时,致害行因数据访问被激活次数的下限。周期T是致害行激活R次所耗费的时间。因为不同应用程序的不同致害行,同样的激活次数耗费的时间不同,所以最终的周期T可以选择当前所采集到的周期T中的最小值。周期T必须小于默认的数据刷新周期,否则,默认的数据刷新操作就能对抗行扰动错误,保护数据。如果时间段小于周期T,则受害行不会出现行扰动错误;而时间段大于周期T时,受害行可能会受到出现行扰动错误,需要必要的保护。Figure 1 is a description of the DRAM row disturbance error problem. The memory cells in the DRAM form a two-dimensional array, and the aggressor row is frequently accessed, causing disturbance to the two adjacent victim rows above and below it. , resulting in a row perturbation error for the victim row. R represents the lower limit of the number of times the victim row is activated due to data access when row disturbance errors occur in the victim row. Period T is the time it takes for the harmful line to activate R times. Because the same activation times take different time for different harmful lines of different applications, the final period T can be selected from the minimum value of the currently collected period T. The period T must be less than the default data refresh period, otherwise, the default data refresh operation can resist row disturbance errors and protect data. If the time period is less than the period T, the victim row will not have row disturbance errors; and when the time period is greater than the period T, the victim row may be subject to row disturbance errors, which requires necessary protection.
每个内存行有一两位的最近访问计时器,用于显示当前内存行最近是否有被动激活操作。图2是两位的最近访问计时器的更新过程,时刻t1时,内存行发生被动激活(因为读写、默认刷新等操作)的同时,其对应的最近计时器置为11,以后每隔T/3计时器的值降序递减,直到00。根据计时器的值,可以判断最近T时段,内存行是否有过被激活操作。如果计时器的值为00,表示内存行最近T时段没有激活操作;反之,则有。Each memory line has a two-digit recent access timer, which is used to display whether the current memory line has a passive activation operation recently. Figure 2 shows the update process of the two-digit recent access timer. At time t1 , when the memory row is passively activated (because of operations such as read and write, default refresh, etc.), the corresponding recent timer is set to 11, and thereafter every The value of the T/3 timer decrements in descending order until 00. According to the value of the timer, it can be judged whether the memory row has been activated in the most recent T period. If the value of the timer is 00, it means that the memory row has not been activated for the last T period; otherwise, there is.
如果最近访问计时器的值还在递减过程中(未到00),但内存行发生被动激活操作,则最近计时器的值重置为11,然后再按原先默认的T/3间隔递减。此时,计时器的值不能表征过去的时段T内存行没有出现激活操作,只能说明过去(2/3T,T)时段,内存行没有出现激活操作。因为被动激活发生的时机不可提前预知,一旦出现在计时器降序递减的过程中,将导致计时器最终的00值提前出现。图2中,时刻t2出现被动激活操作,计时器重置为11,时刻t4计时器置为00。如果时刻t2计时器被置为11且没有出现被动激活操作,计时器直到时刻t5才置为00。时刻t4与时刻t5之间的差值就是被动激活操作引入的表征错误(error)。表征错误的最大值为T/3。If the value of the most recent access timer is still in the process of decrementing (not to 00), but the memory row is passively activated, the value of the most recent timer is reset to 11, and then decremented at the original default T/3 interval. At this time, the value of the timer cannot indicate that the memory row did not have an activation operation in the past period T, but only indicated that the memory row did not have an activation operation in the past (2/3T, T) period. Because the timing of passive activation cannot be predicted in advance, once it occurs in the process of decreasing the timer in descending order, it will cause the final 00 value of the timer to appear in advance. In Figure 2, a passive activation operation occurs at time t2 , the timer is reset to 11 , and the timer is set to 00 at time t4. If the timer is set to 11 at time t2 and no passive activation occurs, the timer is not set to 00 until time t5. The difference between time t4 and time t5 is the characterization error introduced by the passive activation operation. The maximum value that characterizes the error is T/3.
表征错误的存在使得最近访问计时器表征的值T要比真实的短,即认为致害行在短于时段T情况下,出现R次激活操作,提前发起主动激活操作。所以,表征错误引发对受害行的过度保护,可以将最终的周期T适当延长,来抵消表征错误的影响。The existence of characterization errors makes the value T represented by the recent access timer shorter than the real value, that is, when the harmful line is considered to be shorter than the time period T, R activation operations occur, and active activation operations are initiated in advance. Therefore, characterization errors lead to overprotection of victim rows, and the final period T can be appropriately extended to offset the effects of characterization errors.
图3是本发明的主流程图,首先以概率N产生主动激活命令。当内存行row[i]发生读写访问时,产生0~n之间的随机数r并且比较r与nN的值。如果r小于nN,则说明概率为N的事件发生,满足对受害行row[i-1]和row[i+1]发起主动激活命令的第一个条件。第二个条件是检查受害行row[i+1]和row[i-1]的最近访问计时器(RAC)的值,如果值为00,则发送主动激活命令到内存;如果值非00,则说明受害行仍处在周期T内,受到最近一次被动激活操作的保护,所以不需要发送主动激活命令。Fig. 3 is the main flow chart of the present invention, first generating an active activation command with probability N. When the memory row row[i] has read and write access, a random number r between 0 and n is generated and the values of r and nN are compared. If r is less than nN, it means that an event with probability N occurs, which satisfies the first condition of initiating an active activation command for the victim rows row[i-1] and row[i+1]. The second condition is to check the value of the most recent access timer (RAC) of the victim row row[i+1] and row[i-1], if the value is 00, send an active activation command to the memory; if the value is not 00, It means that the victim row is still in the period T and is protected by the latest passive activation operation, so it is not necessary to send an active activation command.
以概率方式产生主动刷新命令,可以避免记录每个内存行访问次数的存储代价,缺点是可能出现漏诊率,即应该产生主动激活命令实际却没有产生。合理地选择概率值N,可以控制漏诊率。概率N与漏诊率P之间的关系:P=1-(1-eN*R)k。其中k表示内存行在正常工作年限内的访问次数,按正常的10年工作时间,k的值取250亿,R=32000次,只要将概率N的值设定为0.2%,就可以将漏诊率控制在4.0×10-18的可忽略程度。Generating active refresh commands in a probabilistic manner can avoid the storage cost of recording the access times of each memory row. The disadvantage is that there may be a missed diagnosis rate, that is, an active activation command should be generated but not actually generated. Reasonable selection of the probability value N can control the missed diagnosis rate. The relationship between probability N and missed diagnosis rate P: P=1-(1-e N*R ) k . Among them, k represents the number of visits to the memory row in the normal working years. According to the normal working time of 10 years, the value of k is 25 billion, and R=32000 times. As long as the value of the probability N is set to 0.2%, the missed diagnosis can be eliminated. The rate was controlled to a negligible level of 4.0×10 -18 .
每个内存行的最近访问计时器,只需要两位的存储空间。考虑8Gb的DRAM内存和8Kb的内存行,所有的最近访问计时器只占据2M的存储空间,并且按组的方式构建,每组的大小为512位。因为内存行的最近访问计时器要频繁访问,为加快访问速度,所以将计时器设置于内存控制器。同时,扩展内存控制器,添加随机数生成器,使得每次有数据访问时产生[0,n)之间的随机数,并且访问最近计时器组,确定是否发送主动激活命令到DRAM存储器。The most recent access timer for each memory row requires only two bits of storage space. Considering 8Gb of DRAM memory and 8Kb of memory rows, all recent access timers occupy only 2M of storage space and are constructed in groups of 512 bits in size. Because the most recent access timer of the memory row needs to be accessed frequently, in order to speed up the access speed, the timer is set in the memory controller. At the same time, expand the memory controller, add a random number generator, so that a random number between [0, n) is generated every time there is data access, and access the latest timer group to determine whether to send an active activation command to the DRAM memory.
本说明书实施例所述的内容仅仅是对发明构思的实现形式的列举,本发明的保护范围不应当被视为仅限于实施例所陈述的具体形式,本发明的保护范围也及于本领域技术人员根据本发明构思所能够想到的等同技术手段。The content described in the embodiments of the present specification is only an enumeration of the realization forms of the inventive concept, and the protection scope of the present invention should not be regarded as limited to the specific forms stated in the embodiments, and the protection scope of the present invention also extends to those skilled in the art. Equivalent technical means that can be conceived by a person based on the inventive concept.
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