CN110687324B - Dual-purpose detachable test needle structure - Google Patents
Dual-purpose detachable test needle structure Download PDFInfo
- Publication number
- CN110687324B CN110687324B CN201810732627.4A CN201810732627A CN110687324B CN 110687324 B CN110687324 B CN 110687324B CN 201810732627 A CN201810732627 A CN 201810732627A CN 110687324 B CN110687324 B CN 110687324B
- Authority
- CN
- China
- Prior art keywords
- detection
- detection joint
- dual
- grooves
- rotary clamping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 105
- 238000001514 detection method Methods 0.000 claims abstract description 93
- 239000000523 sample Substances 0.000 claims abstract description 19
- 230000002349 favourable effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 7
- 239000002184 metal Substances 0.000 description 7
- 238000013461 design Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 230000006870 function Effects 0.000 description 4
- 238000012423 maintenance Methods 0.000 description 3
- 238000007790 scraping Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008450 motivation Effects 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000001568 sexual effect Effects 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
Landscapes
- Physics & Mathematics (AREA)
- Geometry (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Description
技术领域technical field
本发明涉及一种电性测试结构,尤其是一种可快速拆卸组装,且利于依据检测需求更换对应测试探头,进而得以提升检测速率与效能的两用可拆式测试针结构。The invention relates to an electrical testing structure, in particular to a dual-purpose detachable testing needle structure that can be quickly disassembled and assembled, and facilitates the replacement of corresponding testing probes according to testing requirements, thereby improving testing speed and efficiency.
背景技术Background technique
为利于得知各类电子产品制成后的电性状态是否符合需求,一般可通过如电性检测针等用品作为检测用具。单一的电性检测针本身即具有检测功能,然实际的电子产品须检测的电性接点数量繁多,是以往往需将大量电性检测针安装于检测机台以提升整体检测速率。In order to know whether the electrical properties of various electronic products meet the requirements after they are manufactured, supplies such as electrical testing needles can generally be used as testing tools. A single electrical detection needle itself has a detection function, but the actual electronic products have to detect a large number of electrical contacts, so it is often necessary to install a large number of electrical detection needles on the detection machine to increase the overall detection speed.
一般来说,电性检测针系指设置于机台,供与待测电子产品接触电性导通的装置,整体是一体成型的结构,一端供与待测产品接触,另一端则通过以导线焊接固定的方式安装在机台上,而可检验待测产品的电流状态等电性参数。供以检测电子产品的机台依据不同的电性检测需求,大多会分为诸多载区,于各载区中即设置有大量的电性检测针,电子产品即可逐一移往各载区进行对应的检测。Generally speaking, the electrical detection needle refers to the device installed on the machine for electrical conduction with the electronic product to be tested. It is installed on the machine in a unique way, and can test the electrical parameters such as the current state of the product to be tested. The machines for testing electronic products are mostly divided into many loading areas according to different electrical testing requirements. A large number of electrical testing needles are installed in each loading area, and electronic products can be moved to each loading area one by one for testing. Corresponding detection.
然,实际检测应用上,基于检测精确度与安全需求,电性检测针于使用一定次数后即须加以更换,由于机台各载区中都装设有数量庞大的电性检测接头,少则数十多则数万,而受限于电性检测接头一体成型的结构,因此于拆卸更换时需将焊接导线剪除或移除,再把电性检测针取下,而后换上新的电性检测针时,需再执行导线焊接接合作业,因此相当地不便,需要耗费大量人工成本与时间成本。另一方面,当检测机台各载区因应不同的待测产品而需更换至对应规格的电性检测针时,同样遭遇需耗费大量成本的窘境。However, in actual testing applications, based on testing accuracy and safety requirements, electrical testing needles must be replaced after a certain number of uses. Since there are a large number of electrical testing connectors installed in each loading area of the machine, there are few Dozens or tens of thousands are limited by the integrated structure of the electrical testing connector. Therefore, when disassembling and replacing, it is necessary to cut off or remove the welding wire, then remove the electrical testing pin, and then replace it with a new electrical testing pin. It is quite inconvenient to perform wire welding and joining operation when testing the needle, and it requires a lot of labor cost and time cost. On the other hand, when each loading area of the inspection machine needs to be replaced with an electrical detection needle of the corresponding specification in response to different products to be tested, it also encounters the dilemma of consuming a lot of cost.
有鉴于此,本发明人系集结多年从事相关行业的经验,构思一种两用可拆式测试针结构,俾能解决目前于电性检测方面仍存有的缺失。In view of this, the inventors gathered years of experience in related industries and conceived a dual-purpose detachable test needle structure to solve the current deficiencies in electrical testing.
发明内容Contents of the invention
本发明的一目的,旨在提供一种两用可拆式测试针结构,以有效减低更换作业所需时间,并可因应检测物件的规格种类快速更替所需的接头,大幅提升适用性。An object of the present invention is to provide a dual-purpose detachable test needle structure, which can effectively reduce the time required for the replacement operation, and can quickly replace the required connectors according to the specifications and types of the test objects, greatly improving the applicability.
为达上述目的,本发明揭示一种两用可拆式测试针结构,供以针对待测物进行电性检测,包含:一本体,其一端具有至少一第一旋卡部,且该本体是中空,以供容置探针;及一检测接头,是中空状,且该检测接头的一端对应该第一旋卡部设有至少一第二旋卡部,以使该本体与该检测接头可以旋转方式相互卡合组接或卸除,该检测接头的另一端具有一电性接触部及一穿孔,该穿孔供探针穿出,该电性接触部则供与待测物接触以形成导通。如此,即可利用该第一旋卡部及该第二旋卡部有效达到快速拆装的目的,大幅缩减更换接头所需工时,并据此使得该两用可拆式测试针结构得以快速地匹配各类待测物规格进行检测。In order to achieve the above purpose, the present invention discloses a dual-purpose detachable test needle structure for electrical testing of the object to be tested, including: a body, one end of which has at least a first screw-lock portion, and the body is Hollow for accommodating probes; and a detection connector, which is hollow, and one end of the detection connector is provided with at least one second rotation part corresponding to the first rotation part, so that the body and the detection connection can be Rotate to engage with each other to assemble or disassemble. The other end of the detection joint has an electrical contact part and a perforation. The perforation is used for the probe to pass through, and the electrical contact part is used for contacting with the object to be tested to form a conduction. . In this way, the purpose of fast disassembly and assembly can be effectively achieved by using the first rotary clamp part and the second rotary clamp part, and the man-hours required for replacing the joint are greatly reduced, and accordingly the dual-purpose detachable test needle structure can be quickly Match the specifications of various DUTs for testing.
于一实施例中,该第一旋卡部为一滑孔,该第二旋卡部为一凸柱,该第一旋卡部具有一卡固端及一连接端,且该卡固端的宽度小于该连接端的宽度,于组装时该第二旋卡部自该连接端穿设于该第一旋卡部内并移动至该卡固端后,即使该本体与该检测接头相互组接固定,如此可快速稳固定组装或拆卸该检测接头。In one embodiment, the first swivel portion is a sliding hole, the second swivel portion is a boss, the first swivel portion has a fastening end and a connecting end, and the width of the fastening end Smaller than the width of the connecting end, when assembling, the second swivel part passes through the first swivel part from the connecting end and moves to the fastening end, even if the body and the detection joint are assembled and fixed, so The detection joint can be quickly and stably assembled or disassembled.
其中,该第二旋卡部的数量为N个时,呈等间隔环状排列,且相邻的该些第二旋卡部的夹设角度是360/N,该第一旋卡部则对应该第二旋卡部设置,如此以于组装或拆卸时更为稳固地施力,且在检测过程中也可更防止轴心偏移的现象发生。Wherein, when the number of the second swivel parts is N, they are arranged in a ring at equal intervals, and the angle between the adjacent second swivel parts is 360/N, and the first swivel part is The second swivel part should be provided so that force can be applied more firmly during assembly or disassembly, and it can also prevent the phenomenon of axis deviation during the detection process.
于一实施例中,该电性接触部是复数导电金属条,该复数导电金属条沿该穿孔周缘呈环状排列设置,如此该两用可拆式测试针结构可通过该复数导电金属条达到分流功能,而可运用至大电流检测范畴。In one embodiment, the electrical contact part is a plurality of conductive metal strips, and the plurality of conductive metal strips are arranged in a ring shape along the periphery of the through hole, so that the dual-purpose detachable test needle structure can be achieved through the plurality of conductive metal strips. The shunt function can be applied to the field of large current detection.
为有效提升该两用可拆式测试针结构的检测效能,于一实施例中该两用可拆式测试针结构更具有一导电弹片,该导电弹片设于该电性接触部,且该电性接触部的表面具有复数凹槽及复数尖锐凸肋,该复数尖锐凸肋布设于未设置该复数凹槽的区域,该复数凹槽以该孔洞为中心呈放射状排列设置;该导电弹片具有复数导脚部,该复数导脚部对应该复数凹槽呈放射状设置,以对应位于该复数凹槽内,且于该电性接触部与待测物接触导通时,该复数导脚部可沿待测物表面向外滑移。如此,通过该导电弹片及该复数尖锐凸肋即可有效消除待测物表面形成有碍于检测的氧化层,提升电性检测的精确性。In order to effectively improve the detection performance of the dual-purpose detachable test needle structure, in one embodiment, the dual-purpose detachable test needle structure further has a conductive shrapnel, the conductive shrapnel is arranged on the electrical contact part, and the electrical contact The surface of the sexual contact part has a plurality of grooves and a plurality of sharp ribs, the plurality of sharp ribs are arranged in the area where the plurality of grooves are not provided, and the plurality of grooves are radially arranged around the hole; the conductive shrapnel has a plurality of The plurality of guide feet are radially arranged corresponding to the plurality of grooves, so as to be correspondingly located in the plurality of grooves, and when the electrical contact portion is in contact with the object to be tested, the plurality of guide feet can be along the The surface of the object under test slides outward. In this way, the conductive elastic piece and the plurality of sharp ribs can effectively eliminate the oxide layer formed on the surface of the object to be tested, which hinders detection, and improve the accuracy of electrical detection.
较佳者,各该导脚部具有两个上区段及一下区段,该下区段连接设于两个该上区段之间且呈凹弧状,进而使该复数导脚部与待测物接触时,该下区段的弧面沿待测物表面滑移,以利用弧面结构有效地刮除氧化层。Preferably, each of the guide feet has two upper sections and a lower section, and the lower section is connected between the two upper sections and is in a concave arc shape, so that the plurality of guide feet and the under-test When the object is in contact, the arc surface of the lower section slides along the surface of the object to be tested, so as to effectively scrape off the oxide layer by using the arc surface structure.
为利于握持旋转该检测接头,于一实施例中揭示该检测接头外表面设有复数沟槽,以利于握持施力。In order to facilitate holding and rotating the detection joint, in one embodiment, it is disclosed that the outer surface of the detection joint is provided with a plurality of grooves, which is convenient for holding and applying force.
较佳者,该检测接头本身也可具有一外壳体及一内基座,该外壳体套设于该内基座外侧并具有复数沟槽,且该内基座具有该第二旋卡部及该电性接触部,如此可降低物件损坏时的更替成本。Preferably, the detection connector itself can also have an outer shell and an inner base, the outer shell is sleeved on the outside of the inner base and has a plurality of grooves, and the inner base has the second screw part and The electrical contact part can reduce the replacement cost when the object is damaged.
此外,为利于快速确认组装状态,该检测接头具有一对位缺口,该本体具有一对位孔,当该检测接头组设至于该本体后,该对位缺口与该对位孔相对应,而可通过一定位件插设固定。In addition, in order to quickly confirm the assembly state, the detection connector has a pair of alignment gaps, and the body has a pair of alignment holes. When the detection connector is assembled to the body, the alignment gap corresponds to the alignment hole, and It can be inserted and fixed by a positioning piece.
其中,较佳者,该本体对应与该检测接头组装的端,在与该检测接头旋转组固后,延伸至该检测接头内部,以增强该本体与该检测接头的组装强度。Wherein, preferably, the body corresponds to the end assembled with the detection joint, and after being rotated and assembled with the detection joint, it extends to the inside of the detection joint, so as to enhance the assembly strength of the body and the detection joint.
综上所述,本发明的该两用可拆式测试针结构系利用可拆组的结构,有效提升更换作业速率,以及依据各种不同的待测物规格,都可快速更换对应的该检测接头至该本体上,而可提升该两用可拆式测试针结构的适用范畴。并且,通过该电性接触部的结构设计,使该两用可拆式测试针结构可确实地应用于大电流检测,更进一步地,针对易形成于待测物表面的氧化层,也可通过该电性接触部及该导电弹片结构来防止氧化层于测试时造成的影响,更提升电性检测的精确性。To sum up, the dual-purpose detachable test needle structure of the present invention utilizes a detachable structure to effectively increase the replacement operation rate, and can quickly replace the corresponding test needle according to various specifications of the test object. The connector is connected to the main body, so that the scope of application of the dual-purpose detachable test needle structure can be improved. Moreover, through the structural design of the electrical contact part, the dual-purpose detachable test needle structure can be reliably applied to high-current detection. Furthermore, for the oxide layer that is easy to form on the surface of the object to be tested, it can also be used through The electrical contact portion and the conductive spring structure prevent the influence of the oxide layer during testing, and further enhance the accuracy of electrical testing.
附图说明Description of drawings
图1为本发明第一实施例两用可拆式测试针结构的分解示意图(一)。FIG. 1 is an exploded schematic view (1) of the structure of a dual-purpose detachable test needle according to the first embodiment of the present invention.
图2为本发明第一实施例两用可拆式测试针结构的分解示意图(二)。FIG. 2 is an exploded schematic diagram (2) of the structure of the dual-purpose detachable test needle according to the first embodiment of the present invention.
图3为本发明第一实施例两用可拆式测试针结构的组装示意图。FIG. 3 is a schematic diagram of the assembly of the dual-purpose detachable test needle structure according to the first embodiment of the present invention.
图4为本发明第一实施例两用可拆式测试针结构中设有探针的组装示意图。FIG. 4 is a schematic diagram of assembly of probes in the structure of the dual-purpose detachable test needle according to the first embodiment of the present invention.
图5为本发明第二实施例两用可拆式测试针结构的组装示意图。FIG. 5 is a schematic diagram of the assembly of the dual-purpose detachable test needle structure according to the second embodiment of the present invention.
图6为本发明第二实施例的两用可拆式测试针结构检测接头部分剖面示意图。FIG. 6 is a schematic cross-sectional view of a part of the dual-purpose detachable test needle structure detection joint according to the second embodiment of the present invention.
附图标记说明:1-两用可拆式测试针结构;10-本体;101-第一旋卡部;1011-卡固端;1012-连接端;102-对位孔;11-检测接头;111-第二旋卡部;112-电性接触部;1121-凹槽;1122-尖锐凸肋;113-孔洞;114-沟槽;115-外壳体;116-内基座;117-对位缺口;12-导电弹片;121-导脚部;1211-上区段;1212-下区段;2-探针;3-定位件。Explanation of reference numerals: 1-dual-purpose detachable test needle structure; 10-body; 101-first swivel part; 1011-fastening end; 1012-connecting end; 102-alignment hole; 11-detection connector; 111-Second spinner part; 112-Electrical contact part; 1121-Groove; 1122-Sharp rib; 113-Hole; 114-Groove; Notch; 12-conductive shrapnel; 121-guide foot; 1211-upper section; 1212-lower section; 2-probe; 3-positioning piece.
具体实施方式Detailed ways
为使能清楚了解本发明的内容,谨以下列说明搭配图式,敬请参阅。In order to enable a clear understanding of the content of the present invention, the following descriptions are combined with the drawings, please refer to them.
请参阅图1、图2、图3及图4,其是本发明第一实施例的两用可拆式测试针结构的分解示意图(一)、分解示意图(二)、组装示意图及设有探针的组装示意图。本发明揭示一种两用可拆式测试针结构1,供以针对待测物如IC、晶圆、电池等元件进行电性检测,包含一本体10及一检测接头11。该本体10的一端具有至少一第一旋卡部101,且该本体10为中空,而可供以容置一探针2。该本体10相对具有该第一旋卡部101的端供以装设于检测机台处,一般常通过螺母及导线焊接接合的方式使该本体10可固设于检测机台上。该检测接头11的一端对应该第一旋卡部101设有至少一第二旋卡部111,以使该本体10与该检测接头11可以旋转方式相互卡合组接或卸除,该检测接头11的另一端具有一电性接触部112及一穿孔113,该穿孔113与该本体10的中空区域连通,以供探针2穿出,该电性接触部112供与待测物接触以形成导通。如此,通过该第一旋卡部101与该第二旋卡部111的结构,即可让该检测接头11相对该本体10快速地拆卸或组装,而利于依据需求定时更换维修,或是依循待测物的不同来替换对应规格的该检测接头11。Please refer to Fig. 1, Fig. 2, Fig. 3 and Fig. 4, which are the exploded view (1), the exploded view (2), the assembled view and the structure of the dual-purpose detachable test needle according to the first embodiment of the present invention. Schematic diagram of the needle assembly. The present invention discloses a dual-purpose detachable
其中,视检测需求而定,该本体10若无放置探针2,则可应用于如大电流范畴的电性检测,利用该电性接触部112与待测物的接触,而使该两用可拆式测试针结构1整体与待测物形成电导通状态,连接于该本体10的检测机台即可据此了解待测物的电性状态。而当该本体10及该检测探头11的中空区域放置探针2后,则可在大电流检测同时一并进行感知检测,以知悉待测物的其他电性状态,例如待测物为电池时,除了可利用该本体10及该检测接头11达到电流状态检测的功效外,该探针2穿出的部分也会与待测物接触,于此即可该探针2确认电池状态,进而可具有两用检测的功效,如图4所示。并该两用可拆式测试针结构1装设该探针2时,为免短路现象,可于该探针2及该两用可拆式测试针结构1之间放置绝缘件(图中未示)。Among them, depending on the detection requirements, if the
特别一提的是,各类电性测试结构,都为对应待测物的规格、类型而设计制成,并各测试结构供与待测物的电接点接触,因此实际上尺寸相当地微小,过往于制造时,都朝向直接一体成型制成为主。又待测物在进行电性检测时,系经由检测机台上各载区来进行测试,而检测机台上各载区都须安装大量的测试结构,各载区中的测试结构至少有数十数百只以上。在目前的应用状态前提下,一体成型的测试结构除了在更换上有极大不便,也不符经济成本考量。例如当测试结构针对少见的特定待测物规格制造并使用后,若后续不再需要该种规格的测试结构,则该些测试结构即无再使用的可能,进而造成大量的成本浪费。而本发明的该两用可拆式测试针结构1则可有效地解决该些缺失与不便,通过该第一旋卡部101与该第二旋卡部111达到快速旋转组装与拆卸的功效,在更换新的检测接头11或是因应待测物规格更换对应的检测接头11时,甚可使检测机台的更换工时可有效减缩至一半以下,且即使部分的该检测接头11仅针对少见的特定规格开发制造,也相对过往可大幅降低成本浪费。并且,通过该第一旋卡部101与该第二旋卡部111结构,可兼顾该两用可拆式测试针结构1的刚性且使让该检测接头11组设于该本体10后可准直地针对待测物进行检测,降低轴心偏移现象发生,而相较于现有技术具有无法预期的功效。并因该两用可拆式测试针结构1的微小尺寸限制,以及应用范畴的特殊性,在设计时需考量在该检测接头11及该本体10组装并检测时,需准直下压而不允许偏移的条件,是以于此揭示的旋转组接与拆卸的结构以及整体设计动机,都有别于单纯寻求旋转组接与拆卸的结构设计,非得以据此认定本发明利用旋接方式达到快速组装与拆卸的技术特征系得以自其他领域轻易思及。In particular, all kinds of electrical test structures are designed to correspond to the specifications and types of the test object, and each test structure is used to contact the electrical contacts of the test object, so the actual size is quite small. When manufacturing, they are mainly made towards direct one-piece molding. In addition, when the object under test is tested for electrical properties, it is tested through each loading area on the testing machine, and a large number of test structures must be installed in each loading area on the testing machine, and there are at least several test structures in each loading area. More than ten hundreds. Under the premise of the current application state, the one-piece test structure is not only inconvenient to replace, but also does not meet the economic cost considerations. For example, after the test structure is manufactured and used for a rare specific DUT specification, if the test structure of this specification is no longer needed, the test structure will not be reused, resulting in a lot of cost waste. However, the dual-purpose detachable
详细言,该第一旋卡部101是一滑孔,该第二旋卡部111为一凸柱,该第一旋卡部101具有一卡固端1011及一连接端1012,且该卡固端1011的宽度小于该连接端1012的宽度,于组装时该第二旋卡部111自该连接端1012穿设于该第一旋卡部101内并移动至该卡固端1011后,即使该本体10与该检测接头11相互组接固定。当然,也可使该第一旋卡部101为凸柱,该第二旋卡部111对应为滑孔的结构来实施,同样可使该检测接头11与该本体10紧密且稳固地组接。并为利于该第一旋卡部101与该第二旋卡部111的组配,该第二旋卡部111顶端可呈球状,该卡固端1011及该连接端1012则对应该第二旋卡部111顶端结构而形成直径不等的圆形状态,也即较佳者,该卡固端1011的直径系小于该第二旋卡部111顶端的直径,且该第二旋卡部111顶端的直径系小于该连接端1012的直径,以更利于组设及固定。于组装时,仅需将该第二旋卡部111穿入该连接端1012并移动至该卡固端1011后即可使的固定。其中,该本体10对应与该检测接头11组装的端,在与该检测接头11旋转组固后,延伸至该检测接头11内部,以加强两者的固接强度。Specifically, the
较佳者,当该第二旋卡部111的数量为N个时,呈等间隔环状排列,且相邻的该些第二旋卡部111的夹设角度是360/N,该第一旋卡部101则对应该第二旋卡部111设置。如此,通过等间隔设置的该些第二旋卡部111及该些第一旋卡部101,可使该检测接头11及该本体10于组装或拆卸时更为稳固,防止组装强度不足致使该检测接头11与该本体10脱离,或是不利于旋转拆卸等问题。于本实施例中,以设有三个该第二旋卡部111及三个该第一旋卡部101为例,并该些第二旋卡部111的夹设角度是120度。Preferably, when the number of the
此外,为利于与待测物接触,该电性接触部112是复数导电金属条,该复数导电金属条沿该穿孔113周缘呈环状排列设置,如此,通过该复数导电金属条即可与待测物紧密电性连接以执行所需的电性测试,并且,各该导电金属条可达到分流的功效,而使该两用可拆式测试针结构1可应用于大电流范畴的测试。各该导电金属条可略呈S型,而使其一端凸出于该检测接头11,另一端则组设于该检测接头11内。In addition, in order to facilitate contact with the object to be tested, the
另一方面,为利于拆卸替换该检测接头11,该检测接头11的外表面可设有复数沟槽114,以利于握持施力。通过该些沟槽114可提升工具或手部相对该检测接头11的摩擦力,而更易于握持并旋转施力,以将该检测接头11组设于该本体10或自该本体10卸除。On the other hand, in order to facilitate disassembly and replacement of the
此外,该检测接头11整体可为一体成形结构,或鉴于更替上的便利性,该检测接头11可具有一外壳体115及一内基座116,该外壳体115套设于该内基座116外侧并具有复数沟槽114,且该内基座116具有该第二旋卡部111及该电性接触部112,该外壳体115及该电性接触部112并可以紧配方式结合,如此若当该检测接头11部分有所损坏时,仅需更换该外壳体115,或是更换该内基座116,而可更进一步降低元件维修成本。In addition, the detection joint 11 can be formed as a whole, or in view of the convenience of replacement, the detection joint 11 can have an
进一步地,该检测接头11具有一对位缺口117,该本体10具有一对位孔102,当该检测接头11组设至该本体10后,该对位缺口117与该对位孔102相对应,而可通过一定位件3插设固定。如此,当该检测接头11固定于该本体10后,可利用该对位缺口117及该对位孔102达到确认组设完毕的功效,且该定位件3插设至该对位缺口117及该对位孔102后,该定位件3可卡抵于该对位缺口117,而避免该检测接头11位移。Further, the
请续参阅图5及图6,其是本发明第二实施例的两用可拆式测试针结构的组装示意图及检测接头部分剖面示意图。承第一实施例内容,相同的细部技术特征于此即不再重述,并相同的元件以相同标号示意的。于本实施例中,更具有一导电弹片12,该导电弹片12设于该电性接触部112,且该电性接触部112的表面具有复数凹槽1121及复数尖锐凸肋1122,该复数尖锐凸肋1122布设于未设置该复数凹槽1121的区域,该复数凹槽1121以该孔洞113为中心呈放射状排列设置,该导电弹片12具有复数导脚部121,该复数导脚部121对应该复数凹槽1121设置,以对应位于该复数凹槽1121内,并于该电性接触部112与待测物接触导通时,该复数导脚部121可沿待测物表面向外滑移。换言之,该复数导脚部121供与待测物接触的区域呈非平面状态,以利用其结构达到滑移的形变作动。为使该两用可拆式测试针结构1具有更佳的检测效能,该电性接触部112表面设有该复数尖锐凸肋1122以及该导电弹片12,而有助于刺穿并刮除形成于待测物表面的氧化层,以使该电性接触部112与待测物确实地形成电性导通状态。更具体地说,当该两用可拆式测试针结构1压抵接触于待测物时,该复数尖锐凸肋1122可将氧化层刺穿,该导电弹片12系通过该复数导脚部121于该电性接触部112压抵于待测物表面时所接收的压力,结合该复数导脚部121本身的弹性而达到沿待测物表面向外滑移的作动,此举即可在测试时,有效地消除待测物表面氧化层对于电性导通上的影响,提升检测上的精准度。该复数尖锐凸肋1122可呈密集接续地排列布设,以使该电性接触部112表面形成近似粗糙面的结构,以利达到刮除氧化层的功效。并且,该电性接触部112可相对该检测接头11为可拆式结构,换言之,该电性接触部112可为外组于该检测接头11的一座体,并于其上再组设该导电弹片12。如此于维修或该电性接触部112有所耗损的时,可仅更换该电性接触部112进而降低元件设置成本。Please continue to refer to FIG. 5 and FIG. 6 , which are an assembly diagram of a dual-purpose detachable test needle structure and a partial cross-sectional diagram of a detection joint according to a second embodiment of the present invention. Inheriting the content of the first embodiment, the same detailed technical features will not be repeated here, and the same components are indicated by the same symbols. In this embodiment, there is a conductive
较佳者,各该导脚部121具有两个上区段1211及一下区段1212,该下区段1212连接设于两个该上区段1211之间且呈凹弧状,进而使该复数导脚部121与待测物接触时,该下区段1212的弧面沿待测物表面滑移。如图6所示,各该导脚部121的该些上区段1211可略呈水平设置,而该下区段1212的两端则分别与该上区段1211连接,并呈现近似U型的凹弧,如此,当该复数导脚部121与待测物接触时,该下区段1212系最先接触待测物,而后该下区段1212系受力而形变滑移,达到刮除氧化层的功效。其中,该导电弹片12可通过如垫圈等物件以与该电性接触部112相互组设,以加强该导电弹片12的组装强度避免偏移。另为利于凸显该导电弹片12及该电性接触部112的特征,故于图6中仅绘制该检测接头11的部分,而未示意该探针2。Preferably, each of the
综上所述,本发明的该两用可拆式测试针结构系利用可拆组的结构,有效提升更换作业速率,以及依据各种不同的待测物规格,都可快速更换对应的该检测接头至该本体上,而可提升该两用可拆式测试针结构的适用范畴。并且,通过该电性接触部的结构设计,使该两用可拆式测试针结构可确实地应用于大电流检测,更进一步地,针对易形成于待测物表面的氧化层,也可通过该电性接触部及该导电弹片结构来防止氧化层于测试时造成的影响,更提升电性检测的精确性。To sum up, the dual-purpose detachable test needle structure of the present invention utilizes a detachable structure to effectively increase the replacement operation rate, and can quickly replace the corresponding test needle according to various specifications of the test object. The connector is connected to the main body, so that the scope of application of the dual-purpose detachable test needle structure can be improved. Moreover, through the structural design of the electrical contact part, the dual-purpose detachable test needle structure can be reliably applied to high-current detection. Furthermore, for the oxide layer that is easy to form on the surface of the object to be tested, it can also be used through The electrical contact portion and the conductive spring structure prevent the influence of the oxide layer during testing, and further enhance the accuracy of electrical testing.
以上说明对本发明而言只是说明性的,而非限制性的,本领域普通技术人员理解,在不脱离权利要求所限定的精神和范围的情况下,可作出许多修改、变化或等效,但都将落入本发明的保护范围之内。The above description is only illustrative of the present invention, rather than restrictive. Those of ordinary skill in the art understand that many modifications, changes or equivalents can be made without departing from the spirit and scope defined in the claims, but All will fall within the protection scope of the present invention.
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810732627.4A CN110687324B (en) | 2018-07-05 | 2018-07-05 | Dual-purpose detachable test needle structure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810732627.4A CN110687324B (en) | 2018-07-05 | 2018-07-05 | Dual-purpose detachable test needle structure |
Publications (2)
Publication Number | Publication Date |
---|---|
CN110687324A CN110687324A (en) | 2020-01-14 |
CN110687324B true CN110687324B (en) | 2023-01-31 |
Family
ID=69106664
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810732627.4A Active CN110687324B (en) | 2018-07-05 | 2018-07-05 | Dual-purpose detachable test needle structure |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN110687324B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113533803B (en) * | 2020-04-13 | 2024-12-13 | 台湾中国探针股份有限公司 | Replaceable modular electrical test head and its test pins |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1641527A (en) * | 2004-01-09 | 2005-07-20 | 顺德市顺达电脑厂有限公司 | Circuit board fastening unit |
CN201115131Y (en) * | 2007-08-22 | 2008-09-10 | 英业达股份有限公司 | Clamping component |
JP2009042090A (en) * | 2007-08-09 | 2009-02-26 | Sankei Engineering:Kk | Electrically conductive contact pin |
CN102929354A (en) * | 2011-08-08 | 2013-02-13 | 鸿富锦精密工业(深圳)有限公司 | Hard disk fixing device |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3163263B2 (en) * | 1997-02-05 | 2001-05-08 | 有限会社清田製作所 | Coaxial probe |
JP2011137791A (en) * | 2010-01-04 | 2011-07-14 | Nippon Konekuto Kogyo Kk | Probe pin for large current |
JP6373009B2 (en) * | 2014-01-30 | 2018-08-15 | オルガン針株式会社 | High current probe |
CN105044406B (en) * | 2015-08-28 | 2018-04-10 | 东莞市天元通金属科技有限公司 | Current probe |
CN205037182U (en) * | 2015-10-26 | 2016-02-17 | 惠州市西顿工业发展有限公司 | Track lamp |
TWI598593B (en) * | 2016-06-22 | 2017-09-11 | 致茂電子股份有限公司 | Electrical probe and jig for changing the electrical probe |
CN206158962U (en) * | 2016-10-09 | 2017-05-10 | 宁波市艾柯特工具科技发展有限公司 | Air cock conversion receiving mechanism of inflater |
CN208459454U (en) * | 2018-07-05 | 2019-02-01 | 中国探针股份有限公司 | Dual-purpose detachable test pin structure |
-
2018
- 2018-07-05 CN CN201810732627.4A patent/CN110687324B/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1641527A (en) * | 2004-01-09 | 2005-07-20 | 顺德市顺达电脑厂有限公司 | Circuit board fastening unit |
JP2009042090A (en) * | 2007-08-09 | 2009-02-26 | Sankei Engineering:Kk | Electrically conductive contact pin |
CN201115131Y (en) * | 2007-08-22 | 2008-09-10 | 英业达股份有限公司 | Clamping component |
CN102929354A (en) * | 2011-08-08 | 2013-02-13 | 鸿富锦精密工业(深圳)有限公司 | Hard disk fixing device |
Also Published As
Publication number | Publication date |
---|---|
CN110687324A (en) | 2020-01-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN102042796B (en) | Verticality detection device | |
JP2020504302A (en) | Inspection probe and socket | |
CN110687324B (en) | Dual-purpose detachable test needle structure | |
TW201740115A (en) | Electrical probe | |
JP6373009B2 (en) | High current probe | |
TWI666453B (en) | Dual-purpose detachable test pin structure | |
KR20080105419A (en) | Tensile force test jig device for large diameter wiring | |
CN208459454U (en) | Dual-purpose detachable test pin structure | |
TWM565798U (en) | Dual-use detachable test pin structure | |
CN108195252B (en) | Tool for detecting interchangeability of circular electric connector aluminum alloy plug shell for high-speed motor train | |
US20170370965A1 (en) | Electrical probe and jig for the same | |
KR101949841B1 (en) | A multi probe-pin for testing electrical connector | |
CN219915821U (en) | Insulation withstand voltage test fixture | |
CN107218867A (en) | A kind of method of quick detection multi-hole position product | |
CN211601833U (en) | Detection tool for rapidly detecting angle qualification rate of magnetic shoe of motor stator component | |
KR100849207B1 (en) | Cylindrical probe pins and test sockets containing them | |
CN106645817B (en) | Special fixture for detecting light measurement board card of direct-current transmission control system | |
TWI742604B (en) | Replaceable modular electrical testing head and test needle with replaceable modular electrical testing head | |
KR101766196B1 (en) | Rim changer of tire uniformity machine | |
CN218445656U (en) | Electric measuring mechanism for detecting terminal | |
CN215639169U (en) | A examine utensil for inspection of electric wire outer perimeter | |
CN214666746U (en) | Novel measuring pin for measuring coaxiality of deep hole | |
CN217005576U (en) | Automobile brake pedal checking fixture | |
CN114137312B (en) | Loop resistance test assembly | |
CN220271389U (en) | Portable motor protector circuit interfacing apparatus |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |