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CN110676187A - Device and method for accurately measuring center of photosensitive surface of photoelectric detector - Google Patents

Device and method for accurately measuring center of photosensitive surface of photoelectric detector Download PDF

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CN110676187A
CN110676187A CN201910848986.0A CN201910848986A CN110676187A CN 110676187 A CN110676187 A CN 110676187A CN 201910848986 A CN201910848986 A CN 201910848986A CN 110676187 A CN110676187 A CN 110676187A
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vertical shaft
center
photoelectric detector
face
lower vertical
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CN110676187B (en
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张勇
王斌
马军伟
李群
王文仲
赵宗哲
韩文进
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Xi'an North Electro-Optic Technology Defense Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • H01L22/24Optical enhancement of defects or not directly visible states, e.g. selective electrolytic deposition, bubbles in liquids, light emission, colour change
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

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Abstract

本发明提供了一种光电探测器光敏面中心精确测量装置及方法,包括显微镜,还包括与显微镜配合使用的双竖轴组合检测装置,所述双竖轴组合检测装置包括从上至下依次连接的上竖轴盖、竖轴套和下竖轴座,所述上竖轴盖、竖轴套和下竖轴座均同轴。本发明主要针对双四象限光电探测器光敏面中心相对装配基准轴偏离量大和同轴度测量难题,可实现自动确定中心和准确定位。本发明提供的光电探测器光敏中心精确检测方法,通过修切消除带环光电探测器部件原方案装配过程产生的基准转换误差,剔除了器件制造基准与光敏面中心测量的基准轴之间偏离误差,既能满足超差器件的装配要求,又能消除原装配过程的基准转换误差。

The invention provides a device and method for accurately measuring the center of the photosensitive surface of a photodetector, including a microscope, and a double-vertical-axis combined detection device used in cooperation with the microscope. The upper vertical shaft cover, the vertical shaft sleeve and the lower vertical shaft seat are all coaxial. The invention mainly aims at the problem of large deviation of the center of the photosensitive surface of the double four-quadrant photodetector relative to the assembly reference axis and the problem of coaxiality measurement, and can realize automatic center determination and accurate positioning. The method for accurately detecting the photosensitive center of the photodetector provided by the present invention eliminates the reference conversion error generated during the assembly process of the original plan of the ring photodetector component by trimming, and eliminates the deviation error between the device manufacturing reference and the reference axis measured by the center of the photosensitive surface , which can not only meet the assembly requirements of out-of-tolerance devices, but also eliminate the reference conversion error in the original assembly process.

Description

一种光电探测器光敏面中心精确测量装置及方法A device and method for accurately measuring the center of the photosensitive surface of a photodetector

技术领域technical field

本发明具体涉及一种光电探测器光敏面中心精确测量装置及方法,用于不能直接接触测量的器件和类似结构零件的检测。The invention specifically relates to a device and method for accurately measuring the center of a photosensitive surface of a photoelectric detector, which are used for the detection of devices and similar structural parts that cannot be directly contacted for measurement.

背景技术Background technique

双四象限光电探测器是激光导引头捕获目标的核心器件,分外四象限和内四象限8个区,内四象限的十字分划线的中心(又称光敏面中心),即光敏面上F轴、G轴交叉点,要求其相对器件检测基准的偏离量不大于0.1mm,这对导引头光学零位与电零位重合调整起决定作用。如果光敏面中心相对器件的检测基准的同轴度超差或偏离量过大,将影响导引头物镜部件弥散圆曲线调试,会使导引头光学零位与电零位不重合,导引头输出的陀螺修正信号不能真实的反映跟踪角速度,直接影响导引头瞄准及捕获目标的精度,易导致脱靶,因而双四象限光电探测器也称为激光导引头的眼睛。The dual four-quadrant photodetector is the core device of the laser seeker to capture the target. There are 8 areas in the outer quadrant and the inner quadrant. The center of the cross reticle in the inner quadrant (also known as the center of the photosensitive surface) is the photosensitive surface. The intersection of the upper F-axis and G-axis is required to have a deviation of no more than 0.1mm from the device detection reference, which plays a decisive role in the adjustment of the optical zero position and the electrical zero position of the seeker. If the coaxiality of the center of the photosensitive surface relative to the detection datum of the device is out of tolerance or the deviation is too large, it will affect the debugging of the dispersive circle curve of the objective lens part of the seeker, and the optical zero position of the seeker will not coincide with the electrical zero position. The gyro correction signal output by the head can not truly reflect the tracking angular velocity, which directly affects the accuracy of the seeker aiming and capturing the target, which may easily lead to off-target. Therefore, the dual four-quadrant photodetector is also called the eye of the laser seeker.

双四象限光电探测器在器件制造、带环光电探测部件以及激光导引头光学系统装调时,光敏面中心的测量基准需要转换迭代,产生迭代误差,其也不能直接接触测量。光敏面中心测量基准转换修切到带环光电探测部件短锥面部位后,仍用双四象限光电探测器中的器件制造基准为测量基准,产生基准不重合误差,造成误判。若器件制造基准与器件光敏面中心的检测基准不同轴或偏差量较大时,器件制造基准不能用做光敏面中心偏差的检测,也不能用做带环光电探测器部件的基准锥面修切加工的基准,亟待解决此问题。When the dual four-quadrant photodetector is used for device manufacturing, photoelectric detection components with rings, and optical system adjustment of the laser seeker, the measurement reference of the center of the photosensitive surface needs to be converted and iterated, resulting in iteration errors, and it cannot be directly contacted for measurement. After the measurement reference of the center of the photosensitive surface is converted and trimmed to the short cone surface of the photodetector with a ring, the device manufacturing reference in the dual four-quadrant photodetector is still used as the measurement reference, resulting in a reference misalignment error, resulting in misjudgment. If the device manufacturing benchmark and the detection benchmark of the center of the photosensitive surface of the device are not on the same axis or the deviation is large, the device manufacturing benchmark cannot be used for the detection of the center deviation of the photosensitive surface, nor can it be used for the reference cone repair of the ring-shaped photodetector component. The benchmark for cutting processing needs to solve this problem urgently.

发明内容SUMMARY OF THE INVENTION

本发明的目的在于提供一种光电探测器光敏面中心精确测量装置,主要针对双四象限光电探测器光敏面中心相对装配基准轴偏离量大和同轴度测量难题,可实现自动确定中心和准确定位。The purpose of the present invention is to provide an accurate measuring device for the center of the photosensitive surface of the photodetector, mainly aiming at the large deviation of the center of the photosensitive surface of the double four-quadrant photodetector relative to the assembly reference axis and the problem of coaxiality measurement, which can realize automatic center determination and accurate positioning .

本发明的另一个目的在于提供一种光电探测器光敏面中心精确测量方法,实现批量化测量。Another object of the present invention is to provide a method for accurately measuring the center of the photosensitive surface of a photodetector to realize batch measurement.

为此,本发明提供的技术方案如下:For this reason, the technical scheme provided by the invention is as follows:

一种光电探测器光敏中心精确检测装置,包括显微镜,还包括与显微镜配合使用的双竖轴组合检测装置,所述双竖轴组合检测装置包括从上至下依次连接的上竖轴盖、竖轴套和下竖轴座,所述上竖轴盖、竖轴套和下竖轴座均同轴。An accurate detection device for a photosensitive center of a photodetector, comprising a microscope, and a double vertical axis combined detection device used in cooperation with the microscope, the double vertical axis combined detection device comprising an upper vertical axis cover, a vertical axis cover and a vertical axis connected in sequence from top to bottom. The shaft sleeve and the lower vertical shaft seat, the upper vertical shaft cover, the vertical shaft sleeve and the lower vertical shaft seat are all coaxial.

所述上竖轴盖为圆体结构,两端均开口,中心从上至下依次为自找正承力端面和上竖轴孔。The upper vertical shaft cover is a circular body structure, both ends are open, and the center is a self-aligning force bearing end face and an upper vertical shaft hole in sequence from top to bottom.

所述竖轴套中心从上至下依次为上竖轴外圆、自定心锥面、容纳腔、下竖轴孔和下竖轴承力端面一。The center of the vertical shaft sleeve is, from top to bottom, the outer circle of the upper vertical shaft, the self-centering conical surface, the accommodating cavity, the lower vertical shaft hole and the force end face of the lower vertical bearing.

所述下竖轴座包括从上至下依次设置的圆柱体、下竖轴承力端面二和照准部端面,所述圆柱体的横截面为下竖轴外圆。The lower vertical shaft seat comprises a cylindrical body, a second lower vertical bearing force end face and an end face of the sighting portion arranged in sequence from top to bottom, and the cross section of the cylindrical body is the outer circle of the lower vertical shaft.

所述上竖轴孔与自找正承力端面二的垂直度不大于0.002mm,上竖轴孔的圆柱度不大于0.003mm,且表面粗糙度Ra0.1。The verticality between the upper vertical shaft hole and the self-aligning bearing end face 2 is not more than 0.002mm, the cylindricity of the upper vertical shaft hole is not more than 0.003mm, and the surface roughness is Ra0.1.

所述下竖轴孔与下竖轴承力端面一的垂直度小于0.002mm,所述下竖轴孔圆柱度小于0.003mm,所述上竖轴外圆和自定心锥面均以下竖轴孔和下竖轴承力端面一为基准,且相对基准的同轴度小于0.001mm,所述上竖轴外圆圆柱度小于0.003mm、间隙控制在0.002mm以内,各功能面表面粗糙度Ra0.1。The verticality between the lower vertical shaft hole and the force end face of the lower vertical bearing is less than 0.002mm, the cylindricity of the lower vertical shaft hole is less than 0.003mm, the outer circle of the upper vertical shaft and the self-centering cone surface are both the lower vertical shaft hole and the lower vertical bearing force end face 1 as the reference, and the coaxiality relative to the reference is less than 0.001mm, the outer cylindricity of the upper vertical shaft is less than 0.003mm, the gap is controlled within 0.002mm, and the surface roughness of each functional surface is Ra0.1 .

所述照准部端面二平面度小于0.002mm,所述下竖轴外圆与下竖轴承力端面二均以照准部端面为基准加工,下竖轴承力端面二与照准部端面二的平行度小于0.001mm,下竖轴外圆与照准部端面二的垂直度小于0.001mm,各功能面表面粗糙度Ra0.1。The flatness of the second end face of the sighting portion is less than 0.002mm, the outer circle of the lower vertical shaft and the second force end face of the lower vertical bearing are processed based on the end face of the sighting portion, and the second force end face of the lower vertical bearing and the second end face of the sighting portion are processed. The parallelism is less than 0.001mm, the perpendicularity between the outer circle of the lower vertical axis and the second end face of the sighting part is less than 0.001mm, and the surface roughness of each functional surface is Ra0.1.

一种光电探测器光敏面中心精确测量方法,使用光电探测器光敏中心精确测量装置,包括以下步骤:A method for accurately measuring the center of a photosensitive surface of a photodetector, using a device for accurately measuring the photosensitive center of a photodetector, comprising the following steps:

步骤1)将待检测带环光电探测器部件进行修切,将光敏中心进行迭代转换,形成光学系统装调新的基准;Step 1) Trim the ring photodetector component to be detected, and iteratively convert the photosensitive center to form a new reference for the optical system adjustment;

步骤2)将双竖轴组合检测装置中的下竖轴座置于显微镜的圆盘上直接压紧固定,再调整工具显微镜目镜系统,将目镜十字分划线调整下竖轴座的横截面中心上,调整好后,将修切后的待检测带环光电探测器部件装在竖轴套上,旋压上竖轴盖,实现自动确定中心和准确定位,形成固定式稳定竖轴;Step 2) Place the lower vertical axis seat in the double-vertical axis combined detection device on the disc of the microscope and directly press and fix it, then adjust the eyepiece system of the tool microscope, and adjust the cross section center of the lower vertical axis seat by the cross reticle of the eyepiece After adjustment, install the trimmed photodetector component with ring to be detected on the vertical shaft sleeve, and spin the upper vertical shaft cover to achieve automatic center determination and accurate positioning, forming a fixed and stable vertical shaft;

步骤3)将竖轴套装到下竖轴座上,形成可旋转标准圆柱形竖轴,测量时旋转竖轴套,通过显微镜目镜找到带环光电探测器部件的光敏面中心。Step 3) Set the vertical shaft to the lower vertical shaft seat to form a rotatable standard cylindrical vertical shaft. When measuring, rotate the vertical shaft sleeve and find the center of the photosensitive surface of the ring photodetector part through the microscope eyepiece.

步骤1)的具体过程如下:The specific process of step 1) is as follows:

在零件环的粘结容胶孔中涂聚硫密封胶,后将零件环装配到光电探测器部件的检测基准上,待聚硫密封胶固化后,得到带环光电探测器部件;Apply polysulfide sealant to the adhesive hole of the part ring, then assemble the part ring to the detection benchmark of the photodetector part, and after the polysulfide sealant is cured, the ring photodetector part is obtained;

以带环光电探测器部件的制造基准为基准,将带环光电探测器用夹具装在精密车床上进行修切,在相应部位加工出外圆尺寸、基准锥面、锥面角度及端面,使光敏面中心测量的检测基准迭代转换基准锥面上,形成光学系统装调新的基准。Based on the manufacturing benchmark of the ring photodetector components, the ring photodetector fixture is mounted on a precision lathe for trimming, and the outer circle size, reference cone surface, cone angle and end surface are processed at the corresponding parts, so that the photosensitive surface The detection datum measured by the center is iteratively converted on the datum cone to form a new datum for the adjustment of the optical system.

修切时,夹具装到设备主轴上,以带环光电探测器部件制造基准为装夹部位,带环光电探测器部件的基准端面为修切辅助基准,再将夹具的校正外圆调整到设备主轴回转中心,使跳动小于0.003mm进行修切加工。When trimming, the fixture is mounted on the main shaft of the equipment, and the manufacturing reference of the photodetector part with the ring is used as the clamping part, and the reference end face of the photodetector part with the ring is the auxiliary reference for trimming, and then the calibration outer circle of the fixture is adjusted to the equipment. Spindle rotation center, so that the runout is less than 0.003mm for trimming.

本发明的有益效果是:The beneficial effects of the present invention are:

本发明提供的这种光电探测器光敏中心精确检测装置,采用半运动式圆柱形竖轴结构实现器件光敏面中心自动确定,圆柱形竖轴实现快速校准,形成双竖轴组合专用检测装置,对器件进行直接测量,不用再次校准,实现批量化测量。The accurate detection device of the photosensitive center of the photoelectric detector provided by the present invention adopts the semi-moving cylindrical vertical axis structure to realize the automatic determination of the center of the photosensitive surface of the device, and realizes the rapid calibration of the cylindrical vertical axis. The device is directly measured without recalibration, enabling batch measurement.

本发明提供的这种光电探测器光敏中心精确检测方法,通过修切消除带环光电探测器部件原方案装配过程产生的基准转换误差,剔除了器件制造基准与光敏面中心测量的基准轴之间偏离误差,既能满足超差器件的装配要求,又能消除原装配过程的基准转换误差。The method for accurately detecting the photosensitive center of the photodetector provided by the present invention eliminates the reference conversion error generated during the assembly process of the original plan of the photodetector component with a ring by trimming, and eliminates the difference between the device manufacturing reference and the reference axis measured by the center of the photosensitive surface. The deviation error can not only meet the assembly requirements of the out-of-tolerance device, but also eliminate the reference conversion error in the original assembly process.

为让本发明的上述内容能更明显易懂,下文特举优选实施例,并结合附图,作详细说明如下。In order to make the above-mentioned content of the present invention more obvious and easy to understand, preferred embodiments are hereinafter described in detail with reference to the accompanying drawings.

附图说明Description of drawings

图1是本发明实施例中光电探测器的结构示意图;1 is a schematic structural diagram of a photodetector in an embodiment of the present invention;

图2是光敏面中心示意图;Fig. 2 is a schematic diagram of the center of the photosensitive surface;

图3是零件环的结构示意图;Fig. 3 is the structural representation of the part ring;

图4是带环光电探测器部件结构示意图;Fig. 4 is a schematic diagram of the structure of a photodetector with a ring;

图5是精密仪器常用竖轴结构原理图,图(a)为标准圆柱形竖轴,图(b)半运动式圆柱形竖轴;Figure 5 is the schematic diagram of the vertical shaft structure commonly used in precision instruments. Figure (a) is a standard cylindrical vertical shaft, and Figure (b) is a semi-moving cylindrical vertical shaft;

图6是本发明双竖轴组合检测装置的一种实施方式结构示意图;6 is a schematic structural diagram of an embodiment of the dual vertical axis combined detection device of the present invention;

图7是实施例中上竖轴盖的简图;Fig. 7 is the schematic diagram of the upper vertical shaft cover in the embodiment;

图8是实施例中竖轴套的简图;Figure 8 is a schematic diagram of a vertical shaft sleeve in an embodiment;

图9是实施例中下竖轴座的简图;Fig. 9 is the schematic diagram of the lower vertical shaft seat in the embodiment;

图10是实施例中带环光电探测器部件锥面修切用夹具。Fig. 10 is a jig for tapering the ring-shaped photodetector part in the embodiment.

附图标记说明:Description of reference numbers:

1、制造基准;2、检测基准;3、基准端面一;4、锥面修切部位;5、基准孔;6、粘结容胶孔;7、基准端面二;8、锥面修切基准;9、外圆尺寸;10、基准锥面;11、锥面角度;12、端面;13、配合尺寸;14、配合间隙;15、照准部承力端面一;16、照准部端面一;17、自找正承力端面一;18、滚珠;19、锥面;20、下竖轴座;21、竖轴套;22、上竖轴盖;23、带环光电探测器部件;24、上竖轴孔;25、自找正承力端面二;26、上竖轴外圆;27、自定心锥面角度;28、下竖轴承力端面一;29、下竖轴孔;30、自定心锥面;31、下竖轴外圆;32、下竖轴承力端面二;33、照准部端面二;34、校正外圆;35、连接机床主轴。1. Manufacturing benchmark; 2. Testing benchmark; 3. Benchmark end face 1; 4. Taper trimming part; 5. Benchmark hole; 6. Bonding glue hole; 7. Benchmark end face 2; 8. Beam trimming benchmark ;9, outer circle size; 10, reference cone surface; 11, cone surface angle; 12, end face; 13, matching size; 14, matching clearance; 15, sighting part bearing end face one; 16, sighting part end face one ;17. Self-aligning bearing end face 1; 18. Ball; 19. Conical surface; 20. Lower vertical shaft seat; 21. Vertical shaft sleeve; 22. Upper vertical shaft cover; , upper vertical shaft hole; 25, self-aligning bearing end face 2; 26, outer circle of upper vertical shaft; 27, self-centering cone angle; 28, lower vertical bearing force end face 1; 29, lower vertical shaft hole; 30 3. Self-centering cone; 31. Outer circle of lower vertical shaft; 32. Force end face of lower vertical bearing; 33. End face of sighting part; 34. Correct outer circle;

具体实施方式Detailed ways

以下由特定的具体实施例说明本发明的实施方式,本领域技术人员可由本说明书所揭示的内容轻易地了解本发明的其他优点及功效。The embodiments of the present invention are described below by specific embodiments, and those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification.

需说明的是,在本发明中,图中的上、下、左、右即视为本说明书中所述的光电探测器光敏中心精确检测装置的上、下、左、右。It should be noted that, in the present invention, the upper, lower, left and right in the figure are regarded as the upper, lower, left and right of the photosensitive center precise detection device of the photodetector described in this specification.

现参考附图介绍本发明的示例性实施方式,然而,本发明可以用许多不同的形式来实施,并且不局限于此处描述的实施例,提供这些实施例是为了详尽地且完全地公开本发明,并且向所属技术领域的技术人员充分传达本发明的范围。对于表示在附图中的示例性实施方式中的术语并不是对本发明的限定。在附图中,相同的单元/元件使用相同的附图标记。Exemplary embodiments of the present invention will now be described with reference to the accompanying drawings, however, the present invention may be embodied in many different forms and is not limited to the embodiments described herein, which are provided for the purpose of thorough and complete disclosure of the present invention invention, and fully convey the scope of the invention to those skilled in the art. The terms used in the exemplary embodiments shown in the drawings are not intended to limit the invention. In the drawings, the same elements/elements are given the same reference numerals.

除非另有说明,此处使用的术语(包括科技术语)对所属技术领域的技术人员具有通常的理解含义。另外,可以理解的是,以通常使用的词典限定的术语,应当被理解为与其相关领域的语境具有一致的含义,而不应该被理解为理想化的或过于正式的意义。Unless otherwise defined, terms (including scientific and technical terms) used herein have the commonly understood meanings to those skilled in the art. In addition, it is to be understood that terms defined in commonly used dictionaries should be construed as having meanings consistent with the context in the related art, and should not be construed as idealized or overly formal meanings.

实施例1:Example 1:

本实施例提供了一种光电探测器光敏中心精确检测装置,包括显微镜,还包括与显微镜配合使用的双竖轴组合检测装置,所述双竖轴组合检测装置包括从上至下依次连接的上竖轴盖22、竖轴套21和下竖轴座20,所述上竖轴盖22、竖轴套21和下竖轴座20均同轴。This embodiment provides an accurate detection device for the photosensitive center of a photodetector, including a microscope, and a dual-vertical-axis combined detection device used in cooperation with the microscope. The dual-vertical-axis combined detection device includes an upper The vertical shaft cover 22 , the vertical shaft sleeve 21 and the lower vertical shaft seat 20 , the upper vertical shaft cover 22 , the vertical shaft sleeve 21 and the lower vertical shaft seat 20 are coaxial.

本发明实施过程:The implementation process of the present invention:

将双竖轴组合检测装置中的下竖轴座20置于显微镜的圆盘上直接压紧固定,再调整工具显微镜目镜系统,将目镜十字分划线调整下竖轴座20的横截面中心上,调整好后,将修切后的待检测带环光电探测器部件23装在竖轴套21上,旋压上竖轴盖22,实现自动确定中心和准确定位,形成固定式稳定竖轴;Place the lower vertical axis seat 20 in the double vertical axis combined detection device on the disc of the microscope and directly press and fix it, then adjust the eyepiece system of the tool microscope, and adjust the eyepiece cross reticle to the center of the cross section of the lower vertical axis seat 20. After adjustment, the trimmed band ring photodetector component 23 to be detected is mounted on the vertical shaft sleeve 21, and the upper vertical shaft cover 22 is spun to realize automatic center determination and accurate positioning, forming a fixed and stable vertical shaft;

将竖轴套21装到下竖轴座20上,形成可旋转标准圆柱形竖轴,测量时旋转竖轴套21,通过显微镜目镜找到带环光电探测器部件23的光敏面中心。如图6所示,显微镜在图中未画出。如图2所示,F轴、G轴交点中心为光敏面中心。Install the vertical shaft sleeve 21 on the lower vertical shaft seat 20 to form a rotatable standard cylindrical vertical shaft, rotate the vertical shaft sleeve 21 during measurement, and find the center of the photosensitive surface of the ring-shaped photodetector component 23 through the microscope eyepiece. As shown in Figure 6, the microscope is not shown in the figure. As shown in Figure 2, the center of the intersection of the F axis and the G axis is the center of the photosensitive surface.

本发明解决了双四象限光电探测器制造基准1与检测基准2偏差量过大和同轴度测量难题,能在通用光学仪器上便于器件装卸,快速且可避免反复校准。The invention solves the problems of excessive deviation between the manufacturing benchmark 1 and the detection benchmark 2 of the double four-quadrant photodetector and the measurement of coaxiality.

实施例2:Example 2:

在实施例1的基础上,本实施例提供了一种光电探测器光敏中心精确检测装置,所述上竖轴盖22为圆体结构,两端均开口,中心从上至下依次为自找正承力端面12和上竖轴孔24。如图7所示。On the basis of Embodiment 1, this embodiment provides an accurate detection device for the photosensitive center of a photodetector. The upper vertical shaft cover 22 is a circular structure with openings at both ends, and the center is self-finding from top to bottom. The positive bearing end face 12 and the upper vertical shaft hole 24 . As shown in Figure 7.

所述竖轴套21中心从上至下依次为上竖轴外圆26、自定心锥面30、容纳腔、下竖轴孔29和下竖轴承力端面一28。如图8所示。The center of the vertical shaft sleeve 21 is, from top to bottom, the upper vertical shaft outer circle 26 , the self-centering conical surface 30 , the accommodating cavity, the lower vertical shaft hole 29 and the lower vertical bearing force end face 1 28 . As shown in Figure 8.

所述下竖轴座20包括从上至下依次设置的圆柱体、下竖轴承力端面二32和照准部端面12,所述圆柱体的横截面为下竖轴外圆31。如图9所示。The lower vertical shaft seat 20 includes a cylindrical body, a lower vertical bearing force end face 2 32 and an end face 12 of the sighting portion arranged in sequence from top to bottom. The cross section of the cylindrical body is the outer circle 31 of the lower vertical shaft. As shown in Figure 9.

本发明原理:Principle of the present invention:

该光电探测器光敏中心精确检测装置可以自动确定中心,因此可直接测量带环光电探测器部件23光敏面中心。本发明采用竖轴的结构原理,利用半运动式圆柱形竖轴结构实现器件光敏面中心自动确定,以及标准圆柱形竖轴实现快速校准,设计形成双竖轴组合检测装置,对带环光电探测器部件23进行直接测量。The accurate detection device for the photosensitive center of the photodetector can automatically determine the center, so it can directly measure the center of the photosensitive surface of the ring-shaped photodetector component 23 . The invention adopts the structural principle of the vertical axis, uses the semi-moving cylindrical vertical axis structure to realize the automatic determination of the center of the photosensitive surface of the device, and realizes the rapid calibration of the standard cylindrical vertical axis. The device part 23 makes direct measurements.

如图5所示,图5(a)是典型的标准圆柱形竖轴结构,其配合尺寸13、配合间隙14及照准部承力端面一15精度设计合理即可实现快速精确定心;图5(b)是定心精度更高半运动式圆柱形竖轴结构,是对图5(a)结构进行改进,在轴套上端增加锥面19后与滚珠18、自找正承力端面一17构成运动式轴承,实现自动确定中心。As shown in Figure 5, Figure 5(a) is a typical standard cylindrical vertical shaft structure, and its matching size 13, matching gap 14 and the bearing end face of the sighting part-15 are properly designed to achieve rapid and accurate centering; Figure 5 5(b) is a semi-moving cylindrical vertical shaft structure with higher centering accuracy, which is an improvement on the structure of Fig. 5(a), after adding a tapered surface 19 to the upper end of the shaft sleeve, it is in line with the ball 18 and the self-aligning positive bearing end surface. 17 constitutes a kinematic bearing to achieve automatic center determination.

如图6所示,双竖轴组合检测装置由下竖轴座20、竖轴套21、上竖轴盖22组成,将带环光电探测器部件23置于该检测装置上,带环光电探测器部件23如图4所示。As shown in Figure 6, the double vertical shaft combined detection device is composed of a lower vertical shaft seat 20, a vertical shaft sleeve 21, and an upper vertical shaft cover 22. The ring photodetector component 23 is placed on the detection device, and the ring photoelectric detection The device part 23 is shown in FIG. 4 .

该检测装置具有以下特点:(1) 利用带环光电探测器部件23中的基准锥面10,定位存在悬浮、摆动特点,通过调整锥面19公差将带环光电探测器部件23等同图5(b)中滚珠18使用;(2)图7上竖轴盖22在旋压过程中,图7中自找正承力端面二25与带环光电探测器部件23中的端面12相切并沿图7中上竖轴孔24与图8中上竖轴外圆26配合轴线移动,图4中的基准锥面10与图8自定心锥面30通过悬浮、摆动,实现自动确定中心和准确定位,将半运动式圆柱形竖轴结构改变成固定式紧固竖轴结构;(3)图8中下竖轴孔29与图9中下竖轴外圆31配合,图8中下竖轴承力端面一28与图9下竖轴承力端面二32紧密相切,形成标准圆柱形竖轴;(4)将图9中照准部端面二33放置于工具显微镜测量圆盘上,校准图9中下竖轴外圆31中心并固定图9下竖轴座20,形成固定的、可复现并能重复传递的测量基准。The detection device has the following characteristics: (1) Using the reference cone surface 10 in the photodetector part 23 with a ring, the positioning has the characteristics of floating and swinging, and by adjusting the tolerance of the cone surface 19, the photodetector part 23 with a ring is equivalent to FIG. 5 ( b) The middle ball 18 is used; (2) During the spinning process of the vertical shaft cover 22 in FIG. 7 , the self-aligning force bearing end face 25 in FIG. The upper vertical shaft hole 24 in FIG. 7 and the upper vertical shaft outer circle 26 in FIG. 8 move in coordination with the axis, and the reference cone surface 10 in FIG. 4 and the self-centering cone surface 30 in FIG. Positioning, changing the semi-moving cylindrical vertical shaft structure into a fixed fastening vertical shaft structure; (3) The lower vertical shaft hole 29 in Figure 8 is matched with the outer circle 31 of the lower vertical shaft in Figure 9, and the lower vertical bearing in Figure 8 The force end face 1 28 is closely tangent to the force end face 2 32 of the lower vertical bearing in Fig. 9 to form a standard cylindrical vertical axis; (4) Place the end face 2 33 of the sighting portion in Fig. 9 on the measuring disc of the tool microscope, and calibrate Fig. 9 The center of the outer circle 31 of the middle and lower vertical shafts is fixed to the lower vertical shaft seat 20 of FIG. 9 to form a fixed, reproducible and repeatable measurement reference.

实施例3:Example 3:

在实施例2的基础上,本实施例提供了一种光电探测器光敏中心精确检测装置,所述上竖轴盖22的设计技术要求:上竖轴孔24与自找正承力端面二25的垂直度不大于0.002mm,上竖轴孔24的圆柱度不大于0.003mm,一次磨削、压研而成,表面粗糙度Ra0.1。On the basis of Embodiment 2, this embodiment provides a photodetector photosensitive center accurate detection device. The design technical requirements of the upper vertical shaft cover 22 are: the upper vertical shaft hole 24 and the self-aligning bearing end face 2 25 The verticality is not more than 0.002mm, the cylindricity of the upper vertical shaft hole 24 is not more than 0.003mm, it is made by one-time grinding and pressing, and the surface roughness is Ra0.1.

实施例4:Example 4:

在实施例2的基础上,本实施例提供了一种光电探测器光敏中心精确检测装置,所述竖轴套21的设计及制造技术要求:下竖轴孔29与下竖轴承力端面一28垂直度小于0.002mm,下竖轴孔29经研磨圆柱度小于0.003mm;自定心锥面305与自定心锥面角度27以下竖轴孔29和下竖轴承力端面一28为基准,且相对基准的同轴度小于0.001mm,自定心锥面角度27的30°斜面加工成30″的正向公差;上竖轴外圆26以下竖轴孔29和自定心锥面角度27为基准,并根据上竖轴孔24的尺寸配对研磨,研磨后圆柱度小于0.003mm、间隙控制在0.002mm以内,并相对基准的同轴度小于0.001mm,旋转时轻松平滑,不会产生紧箍、涩滞或跳动现象;各功能面表面粗糙度Ra0.1。On the basis of Embodiment 2, this embodiment provides a photodetector photosensitive center accurate detection device, the design and manufacturing technical requirements of the vertical shaft sleeve 21: the lower vertical shaft hole 29 and the lower vertical bearing force end face 28 The verticality is less than 0.002mm, and the cylindricity of the lower vertical shaft hole 29 is less than 0.003mm after grinding; the angle between the self-centering cone surface 305 and the self-centering cone surface is 27, the vertical shaft hole 29 and the lower vertical bearing force end face-28 are the benchmarks, and The coaxiality relative to the reference is less than 0.001mm, and the 30° inclined plane of the self-centering cone angle 27 is processed to a positive tolerance of 30"; the vertical shaft hole 29 and the self-centering cone angle 27 below the outer circle 26 of the upper vertical shaft are After grinding, the cylindricity is less than 0.003mm, the gap is controlled within 0.002mm, and the coaxiality relative to the benchmark is less than 0.001mm, and the rotation is easy and smooth, and there is no tight hoop , stagnation or beating phenomenon; the surface roughness of each functional surface Ra0.1.

实施例5:Example 5:

在实施例2的基础上,本实施例提供了一种光电探测器光敏中心精确检测装置,所述下竖轴座20的设计技术要求:照准部端面二33精研后平面度要求小于0.002mm;下竖轴外圆31与下竖轴承力端面二32以照准部端面二33为基准进行加工,下竖轴承力端面二32与照准部端面二33的平行度小于0.001mm,下竖轴外圆31与照准部端面二33的垂直度小于0.001mm,并根据图8下竖轴孔29的尺寸配对研磨,间隙控制在0.002mm以内,旋转时轻松平滑,不会产生紧箍、涩滞或跳动现象;各功能面表面粗糙度Ra0.1。On the basis of Embodiment 2, this embodiment provides an accurate detection device for the photosensitive center of a photodetector. The technical requirements for the design of the lower vertical shaft seat 20 are that the flatness of the end face 233 of the sighting portion after finishing grinding is less than 0.002 mm; the outer circle 31 of the lower vertical shaft and the end face 2 32 of the lower vertical bearing are processed on the basis of the end face 2 33 of the sighting part. The verticality between the outer circle 31 of the vertical shaft and the end face 2 33 of the sighting part is less than 0.001mm, and they are matched and ground according to the size of the vertical shaft hole 29 in Figure 8. The gap is controlled within 0.002mm, and the rotation is easy and smooth, and there will be no tight hoop. , stagnation or beating phenomenon; the surface roughness of each functional surface Ra0.1.

双竖轴组合检测装置装配方法是:先将图7上竖轴盖22中的上竖轴孔24与图8竖轴套21中的上竖轴外圆26相配合,并通过螺纹连接向内平滑旋压,不产生紧箍、涩滞现象;再将上述组合部件通过图8竖轴套21中的下竖轴孔29与图9下竖轴座20中的下竖轴外圆31相配合,可紧贴图9下竖轴承力端面二32上轻松平滑旋转、不产生紧箍、涩滞,即完成组装。The assembly method of the double vertical shaft combination detection device is as follows: first, the upper vertical shaft hole 24 in the upper vertical shaft cover 22 in FIG. 7 is matched with the upper vertical shaft outer circle 26 in the vertical shaft sleeve 21 in FIG. Smooth spinning, no tight hoop, stagnation phenomenon; then the above-mentioned combined components are matched with the lower vertical shaft outer circle 31 in the lower vertical shaft seat 20 of FIG. 9 through the lower vertical shaft hole 29 in the vertical shaft sleeve 21 in FIG. 8 , it can be easily and smoothly rotated against the force end face 2 32 of the lower vertical bearing as shown in Figure 9, and the assembly is completed without producing tight hoop or stagnation.

实施例6:Example 6:

本实施例提供了一种光电探测器光敏面中心精确测量方法,使用光电探测器光敏中心精确测量装置,包括以下步骤:This embodiment provides a method for accurately measuring the center of the photosensitive surface of a photodetector, using a device for accurately measuring the photosensitive center of a photodetector, including the following steps:

步骤1)将待检测带环光电探测器部件23进行修切,将光敏中心进行迭代转换,形成光学系统装调新的基准;Step 1) Trim and cut the ring photodetector component 23 to be detected, and iteratively convert the photosensitive center to form a new reference for the adjustment of the optical system;

步骤2)将双竖轴组合检测装置中的下竖轴座20置于显微镜的圆盘上直接压紧固定,再调整工具显微镜目镜系统,将目镜十字分划线调整下竖轴座20的横截面中心上,调整好后,将修切后的待检测带环光电探测器部件23装在竖轴套21上,旋压上竖轴盖22,实现自动确定中心和准确定位,形成固定式稳定竖轴;Step 2) Place the lower vertical axis seat 20 in the double-vertical axis combined detection device on the disk of the microscope and directly press and fix it, then adjust the eyepiece system of the tool microscope, and adjust the horizontal direction of the lower vertical axis seat 20 by the cross reticle of the eyepiece. On the center of the section, after adjustment, the trimmed band ring photodetector component 23 to be detected is mounted on the vertical shaft sleeve 21, and the vertical shaft cover 22 is spun to achieve automatic center determination and accurate positioning, forming a fixed stable vertical axis;

步骤3)将竖轴套21装到下竖轴座20上,形成可旋转标准圆柱形竖轴,测量时旋转竖轴套21,通过显微镜目镜找到带环光电探测器部件23的光敏面中心。Step 3) Install the vertical shaft sleeve 21 on the lower vertical shaft seat 20 to form a rotatable standard cylindrical vertical shaft, rotate the vertical shaft sleeve 21 during measurement, and find the center of the photosensitive surface of the ring photodetector component 23 through the microscope eyepiece.

本发明原理:Principle of the present invention:

由于器件的制造基准1与光敏面中心测量的检测基准2之间的偏离量大于0.2mm,因此现有的带环光电探测器部件23的装配和其基准锥面10的修切加工方法、激光导引头光学系统预调检测方法都不适用,因此需要新的修切方法。Since the deviation between the manufacturing reference 1 of the device and the detection reference 2 measured by the center of the photosensitive surface is greater than 0.2 mm, the assembly of the existing ring-shaped photodetector component 23 and the trimming processing method of the reference tapered surface 10 thereof, the laser None of the pre-adjustment detection methods of the seeker optical system are applicable, so a new trimming method is required.

从装配过程分析,存在以下三方面转换迭代误差:一是图1中的器件制造基准1与光敏面中心测量的检测基准2之间本身有制造误差,有偏离量;二是修切加工图4带环光电探测器部件23的基准锥面10、端面12时,没有以图1中的检测基准2为基准,而以图1中的器件制造基准11为装夹定位基准,基准发生转换,引入基准不重合误差;三是图4的光敏面中心测量时,没以图4中的基准锥面10、端面12为测量基准,仍以图1中的器件制造基准1为测量基准,发生基准转换迭代,引入不重合误差。这些因素都会造成结果误判,也是装配工艺可改进的关键环节。From the analysis of the assembly process, there are the following three aspects of conversion iteration errors: First, there is a manufacturing error and deviation between the device manufacturing benchmark 1 in Figure 1 and the detection benchmark 2 measured by the center of the photosensitive surface; the second is the trimming process Figure 4 When the reference tapered surface 10 and the end face 12 of the ring photodetector component 23 are not based on the detection reference 2 in FIG. 1, but the device manufacturing reference 11 in FIG. 1 is used as the clamping and positioning reference, the reference is converted and introduced. The reference misalignment error; the third is that when the center of the photosensitive surface in Figure 4 is measured, the reference cone 10 and end face 12 in Figure 4 are not used as the measurement benchmark, but the device manufacturing benchmark 1 in Figure 1 is still used as the measurement benchmark, and benchmark conversion occurs. Iteratively, misalignment errors are introduced. These factors can lead to misjudgment of results, and are also the key link in the assembly process that can be improved.

本发明带环光电探测器部件23光敏面中心直接测量关键点分析。图4带环光电探测器部件23装配修切好后,图4中的基准锥面10、端面12是带环光电探测器测量和激光导引头光学系统装调的基准。测量时,首要问题是准确模拟图4中的基准锥面10、端面12构成的基准体系,也是测量方法设计的关键技术。图4带环光电探测器部件23的光敏面中心不能接触测量,只能借助通用光学仪器,测量时要满足批量测量要求,既能快速校准,又不需要反复校准,测量效率要高,这也是测量方法设计中着重考虑的问题。从带环光电探测器部件23结构特点分析,图4中的基准锥面10的长度仅2.2mm、斜面角度30°,锥面19过短,定位时存在摆动、悬浮问题,直接定位定心不稳定;而图4中的端面12与基准锥面10一次修切加工,可提高相互间的位置精度,用做定位定心辅助基准。因此,通过准确模拟图4中的基准锥面10和端面12构成的基准体系,并采用光电探测器光敏中心精确测量装置自动确定中心实现稳定定位定心,可实现精确测量。The key point analysis of the direct measurement of the center of the photosensitive surface of the ring-shaped photodetector component 23 of the present invention. After the assembly and trimming of the ring photodetector component 23 in FIG. 4 , the reference cone surface 10 and the end surface 12 in FIG. 4 are the reference for the measurement of the ring photodetector and the adjustment of the optical system of the laser seeker. During the measurement, the primary problem is to accurately simulate the reference system formed by the reference cone surface 10 and the end surface 12 in FIG. 4 , which is also the key technology in the design of the measurement method. The center of the photosensitive surface of the photodetector part 23 with ring in Fig. 4 cannot be contacted for measurement, and can only be measured by a general-purpose optical instrument. The measurement needs to meet the requirements of batch measurement, which can be quickly calibrated without repeated calibration, and the measurement efficiency is high, which is also Important considerations in the design of measurement methods. From the analysis of the structural characteristics of the photodetector component 23 with the ring, the length of the reference cone 10 in Fig. 4 is only 2.2mm and the slope angle is 30°. Stable; while the end face 12 and the reference taper face 10 in FIG. 4 are trimmed and processed at one time, which can improve the mutual positional accuracy and serve as an auxiliary reference for positioning and centering. Therefore, accurate measurement can be achieved by accurately simulating the reference system formed by the reference cone surface 10 and the end surface 12 in FIG.

其中,图4带环光电探测器部件23由图1光电探测器上粘结装配图3的零件环后,修切加工而成。The ring-shaped photodetector component 23 in FIG. 4 is formed by adhering and assembling the part ring shown in FIG. 3 on the photodetector in FIG. 1 , and then trimming and processing.

实施例7:Example 7:

在实施例6的基础上,本发明提供了一种光电探测器光敏面中心精确测量方法,步骤1)的具体过程如下:On the basis of Embodiment 6, the present invention provides a method for accurately measuring the center of the photosensitive surface of a photodetector. The specific process of step 1) is as follows:

在零件环的粘结容胶孔6中涂聚硫密封胶,后将零件环装配到光电探测器部件的检测基准2上,待聚硫密封胶固化后,得到带环光电探测器部件23;Apply polysulfide sealant to the adhesive-receiving hole 6 of the part ring, then assemble the part ring to the detection benchmark 2 of the photodetector part, and after the polysulfide sealant is cured, the ringed photodetector part 23 is obtained;

以带环光电探测器部件23的制造基准1为基准,将带环光电探测器用夹具装在精密车床上进行修切,在相应部位加工出外圆尺寸9、基准锥面10、锥面角度11及端面12,使光敏面中心测量的检测基准2迭代转换基准锥面10上,形成光学系统装调新的基准。Based on the manufacturing standard 1 of the ring photodetector component 23, the ring photodetector jig is mounted on a precision lathe for trimming, and the outer circle size 9, the reference cone surface 10, the cone surface angle 11 and the corresponding parts are processed. On the end face 12, the detection reference 2 measured by the center of the photosensitive surface is iteratively converted to the reference cone surface 10 to form a new reference for the optical system adjustment.

装配时,先在图3零件环的粘结容胶孔6中涂适量聚硫密封胶,后将图3零件环装配到图1光电探测器的检测基准2上,图3零件环上的配合孔2与图1光电探测器的检测基准2相配合,并能轻松平滑旋转、无卡滞,且图3中基准端面二7与图1中基准端面一3紧密相贴;待聚硫密封胶固化后,再以图1中的光电探测器件制造基准1为基准,将带环光电探测器用夹具装在精密车床上,按图4技术要求修切图3中的锥面修切部位4,加工出图4中的外圆尺寸9、基准锥面10、锥面角度11及端面12,使器件图1的光敏面中心检测基准2迭代转换到图4中的基准锥面10上,形成光学系统装调新的基准。When assembling, first apply an appropriate amount of polysulfide sealant in the adhesive container hole 6 of the part ring in Fig. 3, and then assemble the part ring in Fig. 3 on the detection benchmark 2 of the photodetector in Fig. 1. The hole 2 is matched with the detection reference 2 of the photodetector in Fig. 1, and can rotate smoothly and easily without jamming, and the reference end face 2 7 in Fig. 3 is closely attached to the reference end face 1 3 in Fig. 1; After curing, take the photodetector device manufacturing benchmark 1 in Figure 1 as the benchmark, install the ring photodetector fixture on a precision lathe, trim the tapered surface trimming part 4 in Figure 3 according to the technical requirements of Figure 4, and process it. The outer circle size 9, the reference cone surface 10, the cone surface angle 11 and the end face 12 in FIG. 4 are obtained, so that the photosensitive surface center detection reference 2 of the device in FIG. 1 is iteratively converted to the reference cone surface 10 in FIG. 4 to form an optical system. Set up new benchmarks.

实施例8:Example 8:

本实施例采用本发明方法解决一批进口光电探测器存在的问题。This embodiment adopts the method of the present invention to solve the problems existing in a batch of imported photodetectors.

进口光电探测器入厂验收时,发现图1器件制造基准11与图1光敏面中心测量的检测基准2之间的偏离量大于0.2mm以上,超差器件约2500个,该器件成本高,单个器件万元以上,若不使用,将产生巨大经济损失。鉴于光电探测器货源紧缺,需使用该批器件,但原有的带环光电探测器部件23的装配和其基准锥面10的修切加工方法、激光导引头光学系统预调检测方法都不适用。需重点对该批进口器件光敏面中心偏离问题进行分类研究,制定对应装配方案,采取对应技术措施,设计新的装配、测量方法,既满足该批偏心进口器件的装配,又符合激光导引头光学系统性能要求。When the imported photodetector was accepted into the factory, it was found that the deviation between the manufacturing benchmark 11 of the device in Figure 1 and the detection benchmark 2 measured at the center of the photosensitive surface in Figure 1 was greater than 0.2 mm, and there were about 2,500 out-of-tolerance devices. Devices costing more than 10,000 yuan will cause huge economic losses if they are not used. In view of the shortage of photoelectric detectors, this batch of devices needs to be used, but the assembly of the original ring-shaped photodetector component 23, the trimming and processing method of its reference cone surface 10, and the pre-adjustment and detection method of the optical system of the laser seeker are not available. Be applicable. It is necessary to focus on the classification and research on the center deviation of the photosensitive surface of this batch of imported devices, formulate corresponding assembly plans, take corresponding technical measures, and design new assembly and measurement methods, which not only meet the assembly of this batch of eccentric imported devices, but also conform to the laser seeker. Optical system performance requirements.

通过以下步骤解决上述实际问题:Solve the above practical problem with the following steps:

步骤1)对带环光电探测器部件23锥面19进行Step 1) Carry out the operation on the tapered surface 19 of the ring photodetector component 23

为了消除带环光电探测器部件23原方案装配过程产生的基准转换误差,带环光电探测器部件23用夹具进行装夹,夹具如图10所示,夹具上增设辅助基准面和浮动且可校中心功能。修切时,把夹具通过连接机床主轴35可靠装到设备主轴上,图1中的器件制造基准1为装夹部位,但增加图1的基准端面一修切辅助基准,再将图10中的校正外圆34调整到设备主轴回转中心,使跳动小于0.003mm,以锥面修切基准8为基准进行修切加工;按改进要求将图4中的基准锥面10的30°斜面修切成40″的负向公差。In order to eliminate the reference conversion error caused by the original assembly process of the ring-shaped photodetector component 23, the ring-shaped photodetector component 23 is clamped with a fixture. central function. When trimming, the fixture is securely mounted on the main shaft of the equipment by connecting the machine tool spindle 35. The device manufacturing benchmark 1 in Figure 1 is the clamping part, but the reference end face in Figure 1 is added. A trimming auxiliary benchmark, and then the Correct the outer circle 34 and adjust it to the center of rotation of the main shaft of the equipment, so that the runout is less than 0.003mm, and carry out trimming processing on the basis of the taper trimming benchmark 8; according to the improvement requirements, trim the 30° inclined plane of the benchmark taper surface 10 in Figure 4 into 40″ negative tolerance.

步骤2)探测器部件光敏面中心测量方法Step 2) Method for measuring the center of the photosensitive surface of the detector component

先将图6双竖轴组合检测装置中的下竖轴座20的照准部位二置于工具显微镜的圆盘上直接压紧固定,不需校正到圆盘回转中心位置;再调整工具显微镜目镜系统,将目镜十字分划线调整到图9下竖轴外圆31中心上。调整好后,将待检测带环光电探测器部件23装在图6中的带环光电探测器部件23的位置,旋压图6中的上竖轴盖22,借助图4中的基准锥面10与图8轴套上端自定心锥面30间存在的悬浮量、摆动量,实现自动确定中心和准确定位,形成固定式稳定竖轴;再将图8中下竖轴孔29装到校准到位的图9下竖轴外圆31上,形成可旋转标准圆柱形竖轴;测量时旋转图6中竖轴套21的滚花部位,通过工具显微镜目镜观察带环光电探测器部件23光敏面中心的偏离量。按上述方法更换器件并进行测量,不用再次校准,实现批量化测量。First, place the second sighting part of the lower vertical axis seat 20 in the double vertical axis combined detection device in Fig. 6 on the disk of the tool microscope and directly press and fix it without correcting to the center of rotation of the disk; then adjust the eyepiece of the tool microscope system, adjust the cross reticle of the eyepiece to the center of the outer circle 31 of the lower vertical axis in FIG. 9 . After adjustment, install the ring photodetector component 23 to be detected at the position of the ring photodetector component 23 in FIG. 6, spin the upper vertical shaft cover 22 in FIG. 6, and use the reference cone in FIG. 10 and the amount of suspension and swing between the self-centering cone surface 30 at the upper end of the shaft sleeve in Figure 8, realize automatic centering and accurate positioning, and form a fixed and stable vertical shaft; then install the lower vertical shaft hole 29 in Figure 8 to the calibration On the outer circle 31 of the lower vertical shaft in place in Figure 9, a rotatable standard cylindrical vertical shaft is formed; when measuring, rotate the knurled part of the vertical shaft sleeve 21 in Figure 6, and observe the photosensitive surface of the ring photodetector part 23 through the eyepiece of the tool microscope offset from the center. Replace the device and perform measurement according to the above method, without re-calibration, to achieve batch measurement.

该修切方法能剔除图1器件制造基准1与图1光敏面中心测量的检测基准2轴之间偏离误差,既能满足超差器件的装配要求,又能消除原装配过程的基准转换误差。The trimming method can eliminate the deviation error between the manufacturing benchmark 1 of the device in Figure 1 and the detection benchmark 2 axis measured by the center of the photosensitive surface in Figure 1, which can not only meet the assembly requirements of the out-of-tolerance device, but also eliminate the benchmark conversion error in the original assembly process.

修切完成后,用显微镜和双竖轴组合检测装置配合对带环光电探测器部件23光敏面中心进行测量。本发明可以直接观察测量光敏中心。After the trimming is completed, the center of the photosensitive surface of the ring-shaped photodetector component 23 is measured with a microscope and a dual-vertical-axis combined detection device. The present invention can directly observe and measure the photosensitive center.

本发明与现有技术相比,具有以下特点:Compared with the prior art, the present invention has the following characteristics:

1)、结合器件制造基准1与检测基准22偏差量过大和带环光电探测器部件23原装配方案存在基准转换误差的问题分析,对部件装配锥面19进行修切;1) In combination with the problem that the deviation of the device manufacturing benchmark 1 and the detection benchmark 22 is too large and the original assembly scheme of the ring photodetector component 23 has a benchmark conversion error, trim and cut the component assembly cone 19;

2)、对带环光电探测器部件23光敏面中心直接测量的关键技术难点进行分析,确定测量原理并设计出精确测量的新方法和独创性很强的双竖轴组合检测装置;2), analyze the key technical difficulties of the direct measurement of the center of the photosensitive surface of the ring photodetector component 23, determine the measurement principle, and design a new method for accurate measurement and a highly original dual-vertical-axis combined detection device;

3)、对带环光电探测器部件23中的基准锥面10制造的角度公差调整改进,并反向给定竖轴套21上端的自定心锥面30的角度公差,形成环线接触,使锥面19定位定心时的悬浮量、摆动量更大,能起到等同半运动式圆柱形竖轴的滚珠18的使用功能;3) Adjust and improve the angle tolerance of the reference cone surface 10 in the photodetector component 23 with ring, and reverse the angle tolerance of the self-centering cone surface 30 at the upper end of the vertical shaft sleeve 21 to form a ring line contact, so that the When the cone surface 19 is positioned and centered, the suspension amount and the swing amount are larger, which can play the same function as the ball 18 of the semi-moving cylindrical vertical shaft;

4)、自动确定中心后,通过螺纹压紧将半运动式圆柱形竖轴结构改变成固定式紧固竖轴结构,使定位定心更准确、更稳定。4) After the center is automatically determined, the semi-moving cylindrical vertical shaft structure is changed into a fixed fastening vertical shaft structure by thread pressing, so that the positioning and centering is more accurate and stable.

本领域的普通技术人员可以理解,上述各实施方式是实现本发明的具体实施例,而在实际应用中,可以在形式上和细节上对其作各种改变,而不偏离本发明的精神和范围。Those skilled in the art can understand that the above-mentioned embodiments are specific examples for realizing the present invention, and in practical applications, various changes in form and details can be made without departing from the spirit and the spirit of the present invention. scope.

Claims (10)

1. The utility model provides a photosensitive center accurate detection device of photoelectric detector, includes the microscope, its characterized in that: the microscope is characterized by further comprising a double-vertical-shaft combined detection device matched with the microscope, wherein the double-vertical-shaft combined detection device comprises an upper vertical shaft cover (22), a vertical shaft sleeve (21) and a lower vertical shaft seat (20) which are sequentially connected from top to bottom, and the upper vertical shaft cover (22), the vertical shaft sleeve (21) and the lower vertical shaft seat (20) are all coaxial.
2. The device for accurately measuring the center of the light-sensitive surface of the photoelectric detector according to claim 1, wherein: the upper vertical shaft cover (22) is of a round structure, two ends of the upper vertical shaft cover are both open, and the center of the upper vertical shaft cover is provided with a self-aligning bearing end face (12) and an upper vertical shaft hole (24) from top to bottom in sequence.
3. The device for accurately measuring the center of the light-sensitive surface of the photoelectric detector according to claim 1, wherein: the center of the vertical shaft sleeve (21) is sequentially provided with an upper vertical shaft excircle (26), a self-centering conical surface (30), a containing cavity, a lower vertical shaft hole (29) and a lower vertical shaft force bearing end face I (28) from top to bottom.
4. The device for accurately measuring the center of the light-sensitive surface of the photoelectric detector according to claim 1, wherein: the lower vertical shaft seat (20) comprises a cylinder, a second lower vertical shaft bearing end face (32) and an aligning part end face (12) which are sequentially arranged from top to bottom, and the cross section of the cylinder is a lower vertical shaft excircle (31).
5. The device for accurately measuring the center of the light-sensitive surface of the photoelectric detector according to claim 2, wherein: the perpendicularity of the upper vertical shaft hole (24) and the self-aligning bearing end face II (25) is not more than 0.002mm, the cylindricity of the upper vertical shaft hole (24) is not more than 0.003mm, and the surface roughness Ra0.1 is achieved.
6. The device for accurately measuring the center of the light-sensitive surface of the photoelectric detector according to claim 3, wherein: the straightness that hangs down of vertical axis hole (29) and lower vertical axis load terminal surface (28) is less than 0.002mm, vertical axis hole (29) cylindricity is less than 0.003mm down, go up vertical axis excircle (26) and all following vertical axis hole (29) and lower vertical axis load terminal surface (28) as the benchmark from centering conical surface (30), and the axiality of relative benchmark is less than 0.001mm, go up vertical axis excircle (26) cylindricity and be less than 0.003mm, clearance control is within 0.002mm, each surface roughness Ra0.1.
7. The device for accurately measuring the center of the light-sensitive surface of the photoelectric detector according to claim 4, wherein: the flatness of the second collimation part end face (33) is less than 0.002mm, the lower vertical shaft outer circle (31) and the second lower vertical shaft bearing end face (32) are machined by taking the collimation part end face (12) as a reference, the parallelism of the second lower vertical shaft bearing end face (32) and the second collimation part end face (33) is less than 0.001mm, the verticality of the outer lower vertical shaft circle (31) and the second collimation part end face (33) is less than 0.001mm, and the surface roughness of each surface is Ra0.1.
8. A method for accurately measuring the center of a photosensitive surface of a photodetector, using the apparatus for accurately measuring the center of a photosensitive surface of a photodetector according to claim 1, characterized in that: the method comprises the following steps:
step 1) trimming a to-be-detected band-ring photoelectric detector part (23), and performing iterative conversion on a photosensitive center to form a new reference for assembling and adjusting an optical system;
step 2) a lower vertical shaft seat (20) in the double-vertical shaft combined detection device is placed on a disc of a microscope to be directly compressed and fixed, an eyepiece system of the microscope is adjusted, an eyepiece cross division line is adjusted on the center of the cross section of the lower vertical shaft seat (20), after the adjustment is finished, a trimmed photoelectric detector part (23) with a ring to be detected is installed on a vertical shaft sleeve (21), a vertical shaft cover (22) is spun, automatic center determination and accurate positioning are achieved, and a fixed stable vertical shaft is formed;
and 3) mounting the vertical shaft sleeve (21) on the lower vertical shaft seat (20) to form a rotatable standard cylindrical vertical shaft, rotating the vertical shaft sleeve (21) during measurement, and finding the center of the photosensitive surface with the photoelectric detector component (23) through the microscope ocular.
9. The method for accurately measuring the center of the light-sensitive surface of the photoelectric detector according to claim 8, wherein the specific process of the step 1) is as follows:
coating polysulfide sealant in a bonding sealant accommodating hole (6) of the part ring, assembling the part ring on a detection reference (2) of a photoelectric detector part, and obtaining a photoelectric detector part (23) with a ring after the polysulfide sealant is cured;
the manufacturing standard (1) of a part (23) with the photoelectric detector is used as a standard, the photoelectric detector with the ring is arranged on a precision lathe by a clamp for trimming, the excircle size (9), the standard conical surface (10), the conical surface angle (11) and the end surface (12) are processed at corresponding positions, the detection standard (2) measured by the center of the photosensitive surface is iteratively converted on the standard conical surface (10), and a new standard for assembling and adjusting the optical system is formed.
10. The method for accurately measuring the center of the light-sensitive surface of the photoelectric detector according to claim 8, wherein: when in trimming, the clamp is arranged on a main shaft of the equipment, the manufacturing reference (1) of the ring belt photoelectric detector component (23) is taken as a clamping part, the reference end surface (12) of the ring belt photoelectric detector component (23) is taken as a trimming auxiliary reference, and then the correcting excircle (34) of the clamp is adjusted to the rotation center of the main shaft of the equipment, so that the runout is less than 0.003mm for trimming.
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