CN110608675B - 基于光纤光栅传感技术的多点位移测试方法 - Google Patents
基于光纤光栅传感技术的多点位移测试方法 Download PDFInfo
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- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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CN113138013A (zh) * | 2020-01-20 | 2021-07-20 | 中国电建集团华东勘测设计研究院有限公司 | 一种用分布式光纤快速检测地铁隧道道床脱空病害的位置的方法 |
CN112880581A (zh) * | 2021-01-15 | 2021-06-01 | 潍柴动力股份有限公司 | 一种缸套变形量测量方法及装置 |
CN113739705B (zh) * | 2021-08-30 | 2024-02-02 | 武汉地震工程研究院有限公司 | 一种基于分段圆弧拼接算法的构件横向位移监测方法 |
CN114061461A (zh) * | 2021-12-07 | 2022-02-18 | 武汉国电武仪电气股份有限公司 | 基于光纤光栅的高压电缆弧垂与舞动监测系统及方法 |
CN115183679A (zh) * | 2022-06-29 | 2022-10-14 | 中铁武汉电气化局集团第一工程有限公司 | 基于多参量光纤光栅的矿山内部位移测量装置及方法 |
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EP0556960A2 (en) * | 1992-02-20 | 1993-08-25 | Optical Metrology Limited | Measurement apparatus using heterodyne phase conversion techniques |
JP2007212460A (ja) * | 2006-02-06 | 2007-08-23 | Micron Optics Inc | 光ファイバ歪みゲージ |
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JP3337408B2 (ja) * | 1997-11-27 | 2002-10-21 | 日本電信電話株式会社 | チャープ可変反射型光ファイバグレーティングフィルタ |
TW503327B (en) * | 2001-10-15 | 2002-09-21 | Ind Tech Res Inst | Optical signal splitter with high spectrum filtering accuracy |
CN103256894B (zh) * | 2013-03-19 | 2016-02-03 | 西安科技大学 | 一种光纤光栅二维位移监测仪及其监测位移的方法 |
KR101481814B1 (ko) * | 2013-12-30 | 2015-01-21 | 주식회사 지엔큐 | 변위 측정 광섬유 센서 |
CN105157999B (zh) * | 2015-05-26 | 2017-10-03 | 东华大学 | 基于分布式光纤传感技术桩完整性和横向位移的评估方法 |
CN105651186A (zh) * | 2016-03-18 | 2016-06-08 | 沈阳建筑大学 | 一种光纤光栅位移传感器 |
CN106705865B (zh) * | 2017-03-02 | 2018-12-28 | 青岛理工大学 | 一种光纤光栅串接方式下的光纤光栅位移计 |
CN207231407U (zh) * | 2017-09-01 | 2018-04-13 | 浙江华东工程安全技术有限公司 | 深层水平位移测量系统 |
CN107703055B (zh) * | 2017-09-18 | 2024-04-02 | 中国电建集团华东勘测设计研究院有限公司 | 围岩松弛监测装置及其松弛深度判别方法 |
CN108180841B (zh) * | 2018-01-08 | 2019-10-15 | 河北工业大学 | 一种基于光纤光栅的滑坡内部位移监测方法 |
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Patent Citations (2)
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EP0556960A2 (en) * | 1992-02-20 | 1993-08-25 | Optical Metrology Limited | Measurement apparatus using heterodyne phase conversion techniques |
JP2007212460A (ja) * | 2006-02-06 | 2007-08-23 | Micron Optics Inc | 光ファイバ歪みゲージ |
Non-Patent Citations (1)
Title |
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