CN110473587A - A kind of NANDFlash characteristic test method can customize verification method - Google Patents
A kind of NANDFlash characteristic test method can customize verification method Download PDFInfo
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- CN110473587A CN110473587A CN201910717331.XA CN201910717331A CN110473587A CN 110473587 A CN110473587 A CN 110473587A CN 201910717331 A CN201910717331 A CN 201910717331A CN 110473587 A CN110473587 A CN 110473587A
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- nandflash
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- nfc
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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Abstract
The present invention discloses a kind of NANDFlash characteristic test method that can customize verification method, the present invention increases command processing module, command processing module is used to resolve to the operational order sentence in test command that custom command window inputs and NFC interactive command, logical statement in test command that custom command window inputs is resolved into test logical statement, being combined together with NFC interactive command and test logical statement is exactly actual test order packet, then actual test order packet is sent to command execution module, NANDFlash is tested.The present invention both can be to fixed characteristic validation test, can also be according to self-demand, customized testing process.
Description
Technical field
The present invention relates to a kind of NANDFlash test method, specifically a kind of NANDFlash that can customize verification method
Characteristic test method belongs to memory test technical field.
Background technique
NAND flash storage is one kind of flash storage, internal to use non-linear macroelement mode, is solid-state
The realization of large capacity memory provides cheap effective solution scheme.NAND Flash is being taken to be the embedded production of memory
In product conceptual design, only knowing about its characteristic just preferably can use and play its advantage.
It is different according to its production firm, manufacture craft for different NAND Flash, the characteristic of NAND Flash also big phase
It is very unlike.In actual research and development and production process, due to the difference of manufacturer's purchase channel, it may purchase and arrive NAND Flash
Also different, even if producer provides corresponding data specification (datasheet), but actual characteristic would also vary from.
The fixed testing process sequence of legacy test system, the only test of support section fixed characteristic, for there is special test
It needs to increase exploitation new function when demand or new features, or even develops again, compatibility is poor, compatible higher cost.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of characteristic test sides NANDFlash that can customize verification method
Method, both can be to fixed characteristic validation test, can also be according to self-demand, customized testing process.
In order to solve the technical problem, the technical solution adopted by the present invention is that: a kind of verification method of can customize
NANDFlash characteristic test method, it is characterised in that: the following steps are included:
S01), custom command window reception input test command and test parameter, test command include custom command and
Existing fixed test command；
S02), the test command of input is parsed into actual test order packet by command processing module, and the order for being transferred to NFC is held
Row module, command processing module include interface encapsulation library and logical process library, and NANDFlash life is packaged in interface encapsulation library
It enables, the operational order sentence in the test command for inputting custom command window resolves to and NFC interactive command, logic
Handle the basic function that mainstream programming language is supported in library, the logic language in the test command for inputting custom command window
Sentence resolves to test logical statement, and being combined together with NFC interactive command and test logical statement is exactly actual test order packet；
S03), command execution module receives actual test order packet, generates NANDFlash test command, and hold to NANDFlash
The actual test operation of row；
S04), data feedback module gives data feedback in test process or after the completion to host computer data processing module；
S05), received test process content or test result are saved and are arranged by host computer data processing module, are finally in
In present host computer tool；
The NFC of above-mentioned steps indicates NANDFlash controller.
Further, the operational order sentence parsing in the test command that interface encapsulation library inputs custom command window
For the process with NFC interactive command are as follows: when detecting operational order sentence, interface encapsulation library is by encapsulation and operational order phase
The parameter of pass is put into interim buffer and stores, and then passes through writefile order together with other relevant parameters of acquisition
It is sent to NFC, if necessary to obtain data from NFC, then will be led to together with parameter relevant with operational order and other relevant parameters
It crosses readfile order to obtain from NFC, other relevant parameters include Devices to test handle, operation command code, data length.
Further, the logical statement in test command that custom command window inputs is resolved to survey by logical process library
Try the process of logical statement are as follows: when encountering the logical statement in test command, logical process library will be according to its definition, logic
Command statement in statement block is defined corresponding operation.
Further, the NANDFlash operational order encapsulated in interface encapsulation library includes reading read, writing write and wiping
Erase, parameter relevant to read-write wiping operational order are respectively as follows:
read(channel,ce,lun,block,wl,page,data_length)；
write(channel,ce,lun,block,wl,page,data_length,data_grp_sel);
erase(channel,ce,lun,block,era_cnt);
Channel indicates the channel of the corresponding NANDFlash of operational order, and ce indicates that chip selection signal, lun indicate logic unit
Number, block indicates that block, wl indicate wordline, and page indicates that page, data_length indicate test data length, data_grp_
Sel indicates the test data of selection, and era_cnt indicates erasing range.
Further, the mainstream programming language basic function that logical process library is supported includes assignment, compares, judges, recycles
And logical operation.
Further, custom command window, command processing module, data preparation module are set to host computer, and order is held
Row module, data feedback module are set to NFC.
Beneficial effects of the present invention: this test macro both can to fixed characteristic validation test, can also according to self-demand,
Customized testing process and NAND Flash characteristic dependence test is provided as a result, convenient for algorithm development personnel, hardware designer,
Firmware development personnel and other personnel for wanting test NAND Flash characteristic use.It is special that the method expands Nand Flash
Property test scope, increase the flexibility of Nand Flash test, improve testing efficiency, reduce testing cost.Host computer control
End processed is visualization interface, and parameter is clear, and test item is clear, facilitates operation, reduces the threshold of test.Host computer is remembered in test
All test process are recorded, all test datas are saved, convenient for researching and analysing and repetition measurement；Output analysis after as a result, result
Clear and definite.
Detailed description of the invention
Fig. 1 is the principle of the present invention block diagram.
Specific embodiment
The present invention is further illustrated in the following with reference to the drawings and specific embodiments.
Embodiment 1
The present invention discloses a kind of NANDFlash characteristic test method of customized verification method, this test method is dependent on test
System, as shown in Figure 1, the test macro includes sequentially connected custom command window, command processing module, order execution
Module, data feedback module and data sorting module, custom command window, command processing module, data preparation module exist
In supervisory controller, command execution module and data feedback module are set in measuring and calculation machine, and the carrying of measuring and calculation machine is wanted
The NANDFlash of test, test macro may include windows system and linux system, the compatible windows system of upper computer software
System and linux system.
In the present embodiment, NFC indicates NANDFlash controller.
Test mode described in the present embodiment the following steps are included:
S01), custom command window reception input test command and test parameter, test command include custom command and
Existing fixed test command；
In the present embodiment, custom command window is the visualization interface of software, is matched comprising test command input, test parameter
Set, test process monitoring, test result present etc. functions.Existing fixed test case had both can be used in user, or passed through key
Disk input order imports the customized test of script progress.
S02), the test command of input is parsed into actual test order packet by command processing module, and is transferred to the life of NFC
Execution module is enabled, command processing module includes interface encapsulation library and logical process library, and interface encapsulation is packaged with NANDFlash in library
Order, the operational order sentence in the test command for inputting custom command window resolve to NFC interactive command, patrol
Collect the basic function that mainstream programming language is supported in processing library, the logic in test command for inputting custom command window
Sentence resolves to test logical statement, and being combined together with NFC interactive command and test logical statement is exactly actual test order
Packet.
In the present embodiment, the NANDFlash operational order encapsulated in interface encapsulation library includes reading read, writing write and wiping
Erase, parameter relevant to read-write wiping operational order are respectively as follows:
read(channel,ce,lun,block,wl,page,data_length)；
write(channel,ce,lun,block,wl,page,data_length,data_grp_sel);
erase(channel,ce,lun,block,era_cnt);
Channel indicates the channel of the corresponding NANDFlash of operational order, and ce indicates that chip selection signal, lun indicate logic unit
Number, block indicates that block, wl indicate wordline, and page indicates that page, data_length indicate test data length, data_grp_
Sel indicates the test data of selection, and era_cnt indicates erasing range.
Logical process library support mainstream programming language basic function include assignment, compare, judge, recycling and logic fortune
It calculates.
Such as: '=' is assignment, and ' if ... elif ... else ' is to judge sentence, ' for ', ' while ', ' do ... until ' is
Do statement；Logical operation include with or it is non-etc..
S03), command execution module receives actual test order packet, generates NANDFlash test command, and right
NANDFlash executes actual test operation；
S04), data feedback module gives data feedback in test process or after the completion to host computer data processing module；
S05), received test process content or test result are saved and are arranged by host computer data processing module, are finally in
In present host computer tool.
Operational order sentence solution in the present embodiment, in the test command that interface encapsulation library inputs custom command window
Analysis is process with NFC interactive command are as follows: when detecting operational order sentence, interface encapsulation library by encapsulation and operational order
Relevant parameter is put into interim buffer and stores, and is then ordered together with other relevant parameters of acquisition by writefile
Order is sent to NFC, then will be together with parameter relevant with operational order and other relevant parameters if necessary to obtain data from NFC
It is obtained from NFC by readfile order, other relevant parameters include Devices to test handle, operation command code, data length.
Logical statement in test command that custom command window inputs is resolved to test logic language by logical process library
The process of sentence are as follows: when encountering the logical statement in test command, logical process library will be according to its definition, in logical statement block
Command statement be defined corresponding operation.
In the present embodiment, it if the customized test process of step S01 is first to wipe target, then write, finally reads, so
Retest 2 times.Then need input code as follows:
for i in range(0,2):
erase(0,0,0,0,1)
write(0,0,0,0,0,0,512,1)
read(0,0,0,0,0,0,512)
For above-mentioned test code, the process of actual test order packet is parsed into step SO2 are as follows:
S21), first order encapsulation library by aforesaid operations command analysis be with NFC interactive command, user's operation is easily understood
Order, be converted to many and diverse parameter with NFC interactive command:
Such as detect erase/write/read operational order, order encapsulation library by function channel, ce, lun,
The parameters such as block are put into interim buffer and store；Then long according to Devices to test handle, operation command code, data are obtained
Other relevant parameters such as degree together, pass throughwritefileOrder is sent to NFC；If necessary to obtain data from NFC, then by this
A little parameters pass throughreadfileOrder and relevant parameter are obtained from NFC.
As the parsing of erase/read/write operational order is as follows in previous step:
for i in range(0,2):
cmdbuf(…0,0,0,0,1…)
writefile(dev, cmdbuf(…0,0,0,0,1…),bufsize,…)
cmdbuf(…0,0,0,0,0,0,512…)
writefile(dev, cmdbuf(…0,0,0,0,0,0,512…),bufsize,…)
cmdbuf(…0,0,0,0,0,0,512…)
writefile(dev, cmdbuf(…0,0,0,0,0,0,512…),bufsize,…)
readfile(dev, cmdbuf(…0,0,0,0,0,0,512…),bufsize,…)
S22), logical order is resolved to by test logic by logical process library again:
When encountering for ... when the logical statements such as/if..else/while, logical process library will be according to its definition, logical statement
Command statement in block carries out the operation such as logic sequence, and the order in its logical block is carried out circulation behaviour as for/while is recycled
Make；The command statement etc. that if sentence is then executed according to judging result selection in next step.
As for logical order parsing in previous step is as follows:
# carries out first time circulation
cmdbuf(…0,0,0,0,1…)
writefile(dev, cmdbuf(…0,0,0,0,1…),bufsize,…)
cmdbuf(…0,0,0,0,0,0,512…)
writefile(dev, cmdbuf(…0,0,0,0,0,0,512…),bufsize,…)
cmdbuf(…0,0,0,0,0,0,512…)
writefile(dev, cmdbuf(…0,0,0,0,0,0,512…),bufsize,…)
readfile(dev, cmdbuf(…0,0,0,0,0,0,512…),bufsize,…)
# carries out second and recycles
cmdbuf(…0,0,0,0,1…)
writefile(dev, cmdbuf(…0,0,0,0,1…),bufsize,…)
cmdbuf(…0,0,0,0,0,0,512…)
writefile(dev, cmdbuf(…0,0,0,0,0,0,512…),bufsize,…)
cmdbuf(…0,0,0,0,0,0,512…)
writefile(dev, cmdbuf(…0,0,0,0,0,0,512…),bufsize,…)
readfile(dev, cmdbuf(…0,0,0,0,0,0,512…),bufsize,…)
Actual test order packet after above-mentioned parsing is transferred to command execution module, generates NandFlash test command, and right
Nand Flash, which executes actual test operation, can be completed test process.
For the ease of the record of initial data and arrangement and research and analyse and repetition measurement, in test process or after the completion, NFC
The data feedback module at end gives data feedback to host computer data processing module.Host computer data processing module is by received test
Process content or test result are saved and are arranged, and finally are presented to user.
The test process that mode described in the present embodiment can customize expands the test scope of Nand Flash characteristic, increases
The flexibility for adding Nand Flash to test improves testing efficiency, reduces testing cost.Control terminal is visualization interface, parameter
Clear, test item is clear, facilitates operation, reduces the threshold of test.Control terminal records all test process in test, saves
All test datas, convenient for researching and analysing and repetition measurement；Output analysis after as a result, result clear and definite.
Described above is only basic principle and preferred embodiment of the invention, and those skilled in the art do according to the present invention
Improvement and replacement out, belong to the scope of protection of the present invention.
Claims (6)
1. a kind of NANDFlash characteristic test method that can customize verification method, it is characterised in that: the following steps are included:
S01), the test command and test parameter of custom command window reception input, test command include customized test life
It enables and existing fixed test command；
S02), the test command of input is parsed into actual test order packet by command processing module, and the order for being transferred to NFC is held
Row module, command processing module include interface encapsulation library and logical process library, and NANDFlash life is packaged in interface encapsulation library
It enables, the operational order sentence in the test command for inputting custom command window resolves to and NFC interactive command, logic
Handle the basic function that mainstream programming language is supported in library, the logic language in the test command for inputting custom command window
Sentence resolves to test logical statement, and being combined together with NFC interactive command and test logical statement is exactly actual test order packet；
S03), command execution module receives actual test order packet, generates NANDFlash test command, and hold to NANDFlash
The actual test operation of row；
S04), data feedback module gives data feedback in test process or after the completion to host computer data processing module；
S05), received test process content or test result are saved and are arranged by host computer data processing module, are finally in
In present host computer tool；
The NFC of above-mentioned steps indicates NANDFlash controller.
2. the NANDFlash characteristic test method according to claim 1 that can customize verification method, it is characterised in that:
Interface encapsulation library resolves to the operational order sentence in test command that custom command window inputs and NFC interactive command
Process are as follows: when detecting operational order sentence, the parameter relevant to operational order of encapsulation is put into temporarily by interface encapsulation library
Buffer in store, NFC is then sent to by writefile order together with other relevant parameters of acquisition, if need
To obtain data from NFC, then will together with parameter relevant with operational order and other relevant parameters by readfile order from
It is obtained in NFC, other relevant parameters include Devices to test handle, operation command code, data length.
3. the NANDFlash characteristic test method according to claim 1 that can customize verification method, it is characterised in that:
Logical statement in test command that custom command window inputs is resolved to the process of test logical statement by logical process library
Are as follows: when encountering the logical statement in test command, logical process library will be according to its definition, the order language in logical statement block
Sentence is defined corresponding operation.
4. the NANDFlash characteristic test method according to claim 1 or 2 that can customize verification method, feature exist
In: the NANDFlash operational order encapsulated in interface encapsulation library includes reading read, write write and wiping erase, with operational order
Relevant parameter is respectively as follows: read (channel, ce, lun, block, wl, page, data_length)；
write(channel,ce,lun,block,wl,page,data_length,data_grp_sel);
erase(channel,ce,lun,block,era_cnt);
Channel indicates the channel of the corresponding NANDFlash of operational order, and ce indicates that chip selection signal, lun indicate logic unit
Number, block indicates that block, wl indicate wordline, and page indicates that page, data_length indicate test data length, data_grp_
Sel indicates the test data of selection, and era_cnt indicates erasing range.
5. the NANDFlash characteristic test method according to claim 1 or 3 that can customize verification method, feature exist
Include assignment, compare, judge, recycle and logical operation in the mainstream programming language basic function that: logical process library is supported.
6. the NANDFlash characteristic test method according to claim 1 that can customize verification method, it is characterised in that:
Custom command window, command processing module, data preparation module are set to host computer, command execution module, data feedback mould
Block is set to NFC.
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Cited By (1)
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| CN114220472A (en) * | 2021-12-15 | 2022-03-22 | 华进半导体封装先导技术研发中心有限公司 | A Nand Flash Test Method Based on SOC Universal Test Platform |
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