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CN110459655A - A quantum barrier doped deep ultraviolet LED and its preparation method - Google Patents

A quantum barrier doped deep ultraviolet LED and its preparation method Download PDF

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Publication number
CN110459655A
CN110459655A CN201910774621.8A CN201910774621A CN110459655A CN 110459655 A CN110459655 A CN 110459655A CN 201910774621 A CN201910774621 A CN 201910774621A CN 110459655 A CN110459655 A CN 110459655A
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quantum
layer
ultraviolet led
quantum barrier
deep ultraviolet
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陈谦
张会雪
戴江南
陈长清
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Suzhou Zican Technology Co Ltd
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Suzhou Zican Technology Co Ltd
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Priority to JP2020137664A priority patent/JP7045425B2/en
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/811Bodies having quantum effect structures or superlattices, e.g. tunnel junctions
    • H10H20/812Bodies having quantum effect structures or superlattices, e.g. tunnel junctions within the light-emitting regions, e.g. having quantum confinement structures
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/011Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/013Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
    • H10H20/0133Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials
    • H10H20/01335Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials the light-emitting regions comprising nitride materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/822Materials of the light-emitting regions
    • H10H20/824Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP
    • H10H20/825Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP containing nitrogen, e.g. GaN
    • H10H20/8252Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP containing nitrogen, e.g. GaN characterised by the dopants

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Abstract

The invention discloses deep ultraviolet LED and preparation method that a kind of quantum builds doping, the deep ultraviolet LED that the quantum builds doping includes Sapphire Substrate, N-type AlGaN contact layer, mqw active layer, p-type AlGaN carrier transport and p-type GaN contact layer, N-type AlGaN contact layer is set gradually in the Sapphire Substrate, mqw active layer, p-type AlGaN carrier transport and p-type GaN contact layer;The mqw active layer is stacked gradually by the quantum lamination in 6 periods and is constituted, and the quantum lamination includes quantum barrier layer and quantum well layer, and the quantum barrier layer is the Al of 12nm0.55Ga0.45N quantum is built, and the quantum barrier layer Si doping concentration is 5 × 1018~1 × 1019.The present invention builds the effect that polarization self-shileding is realized in doping using quantum, the carrier Wave function overlap rate inside Quantum Well is improved, to improve the light power of deep ultraviolet LED.

Description

一种量子垒掺杂的深紫外LED及制备方法A quantum barrier doped deep ultraviolet LED and its preparation method

技术领域technical field

本发明涉及光电技术领域,特别是一种量子垒掺杂的深紫外LED及制备方法。The invention relates to the field of optoelectronic technology, in particular to a quantum barrier doped deep ultraviolet LED and a preparation method.

背景技术Background technique

目前,基于AlGaN材料的深紫外LED(即紫外光波长λ<300nm),由于其广泛的潜在应用,如消毒,空气和水净化,生化检测和光通信,引起了许多科学家的关注。然而,深紫外LED低的外量子效率仍然不能满足目前的应用要求,这主要受限于其低的内量子效率和光提取效率。Currently, AlGaN-based deep-UV LEDs (i.e., UV wavelength λ<300nm) have attracted the attention of many scientists due to their wide range of potential applications, such as disinfection, air and water purification, biochemical detection, and optical communication. However, the low external quantum efficiency of deep ultraviolet LEDs still cannot meet the current application requirements, which is mainly limited by its low internal quantum efficiency and light extraction efficiency.

由于AlGaN材料中存在的强的不对称性,导致了其内部有很强的自发极化和压电极化,产生的极化电场使得量子阱中空穴载流子和电子载流子的波函数分离,降低其相互耦合产生光子的概率,因而,严重的影响了LED的内量子效率和出光率。基于常规的深紫外LED芯片外延结构设计,在改善深紫外LED的量子阱波函数覆盖率方面,需要对深紫外LED的结构进行新的设计以解决现有技术中存在的问题。Due to the strong asymmetry in the AlGaN material, there is a strong spontaneous polarization and piezoelectric polarization inside it, and the generated polarization electric field makes the wave function of the hole carriers and electron carriers in the quantum well Separation reduces the probability of photons generated by their mutual coupling, thus seriously affecting the internal quantum efficiency and light extraction rate of the LED. Based on the conventional deep-ultraviolet LED chip epitaxial structure design, in order to improve the coverage of the quantum well wave function of the deep-ultraviolet LED, a new design of the structure of the deep-ultraviolet LED is required to solve the problems existing in the prior art.

发明内容Contents of the invention

本发明的目的在于,提供一种量子垒掺杂的深紫外LED及制备方法,用于解决现有技术中AlGaN材料极化电场对紫外LED的内量子效率造成限制的问题。The purpose of the present invention is to provide a quantum barrier doped deep ultraviolet LED and a preparation method, which are used to solve the problem in the prior art that the polarization electric field of AlGaN material limits the internal quantum efficiency of the ultraviolet LED.

为解决上述技术问题,本发明提供第一解决方案为:一种量子垒掺杂的深紫外LED,包括蓝宝石衬底、N型AlGaN接触层、量子阱有源层、P型AlGaN载流子输运层和P型GaN接触层,蓝宝石衬底上依次设置N型AlGaN接触层,量子阱有源层,P型AlGaN载流子输运层和P型GaN接触层;量子阱有源层由6个周期的量子叠层依次堆叠构成,量子叠层包括量子垒层和量子阱层,量子垒层为12nm的Al0.55Ga0.45N量子垒,且量子垒层Si掺杂浓度为5×1018~1×1019In order to solve the above technical problems, the present invention provides a first solution: a quantum barrier doped deep ultraviolet LED, including a sapphire substrate, an N-type AlGaN contact layer, a quantum well active layer, a P-type AlGaN carrier input The transport layer and the P-type GaN contact layer, the N-type AlGaN contact layer, the quantum well active layer, the P-type AlGaN carrier transport layer and the P-type GaN contact layer are arranged successively on the sapphire substrate; the quantum well active layer consists of 6 A period of quantum stacks are stacked in sequence. The quantum stack includes a quantum barrier layer and a quantum well layer. 1×10 19 .

优选的,量子阱层为3nm的Al0.45Ga0.55N量子阱,且量子阱层无掺杂。Preferably, the quantum well layer is a 3nm Al 0.45 Ga 0.55 N quantum well, and the quantum well layer is not doped.

优选的,N型AlGaN接触层的厚度为2~3μm,且Si掺杂浓度为5×1018~1×1019Preferably, the thickness of the N-type AlGaN contact layer is 2-3 μm, and the Si doping concentration is 5×10 18 to 1×10 19 .

优选的,P型AlGaN载流子输运层厚度为25nm,且Mg掺杂浓度为1×1019~3×1019Preferably, the thickness of the P-type AlGaN carrier transport layer is 25 nm, and the Mg doping concentration is 1×10 19 -3×10 19 .

优选的,P型GaN接触层厚度为300nm,且Mg掺杂浓度为1×1019~5×1019Preferably, the thickness of the P-type GaN contact layer is 300 nm, and the doping concentration of Mg is 1×10 19 -5×10 19 .

为解决上述技术问题,本发明提供第二解决方案为:一种量子垒掺杂的深紫外LED制备方法,具体步骤为采用金属有机化学气相沉积法于蓝宝石衬底上依次沉积N型AlGaN接触层,量子阱有源层,P型AlGaN载流子输运层和P型GaN接触层;量子垒掺杂的深紫外LED制备方法用于制备前述第一解决方案中任一量子垒掺杂的深紫外LED。In order to solve the above technical problems, the present invention provides a second solution: a quantum barrier-doped deep-ultraviolet LED preparation method, the specific steps of which are sequentially depositing an N-type AlGaN contact layer on a sapphire substrate by metal-organic chemical vapor deposition , quantum well active layer, P-type AlGaN carrier transport layer and P-type GaN contact layer; quantum barrier doped deep ultraviolet LED preparation method is used to prepare any quantum barrier doped deep ultraviolet LED in the aforementioned first solution UV LEDs.

优选的,制备量子垒掺杂的深紫外LED时,所采用的Ga源为三甲基镓TMGa,Al源为三甲基镓TMAl,氮源为氨气NH3,载气为氢气H2,N型和P型的掺杂源分别为硅烷SiH4和二茂镁Cp2Mg。Preferably, when preparing quantum barrier-doped deep ultraviolet LEDs, the Ga source used is trimethylgallium TMGa, the Al source is trimethylgallium TMAl, the nitrogen source is ammonia NH 3 , and the carrier gas is hydrogen H 2 , The doping sources of N-type and P-type are silane SiH 4 and magnesiumocene Cp 2 Mg respectively.

优选的,沉积N型AlGaN接触层时的反应温度为1050~1080℃;沉积量子阱有源层时的反应温度为1050~1080℃;沉积P型AlGaN载流子输运层时的反应温度为1050~1080℃;沉积P型GaN接触层时的反应温度为950~1000℃。Preferably, the reaction temperature when depositing the N-type AlGaN contact layer is 1050-1080°C; the reaction temperature when depositing the quantum well active layer is 1050-1080°C; the reaction temperature when depositing the P-type AlGaN carrier transport layer is 1050-1080°C; the reaction temperature when depositing the P-type GaN contact layer is 950-1000°C.

本发明的有益效果是:区别于现有技术的情况,本发明提供了一种量子垒掺杂的深紫外LED及制备方法,利用量子垒掺杂实现极化自屏蔽的效应,提高量子阱内部的载流子波函数重叠率,从而提高深紫外LED的出光功率。The beneficial effects of the present invention are: different from the situation of the prior art, the present invention provides a quantum barrier doped deep ultraviolet LED and a preparation method, utilizes quantum barrier doping to realize the polarization self-shielding effect, and improves the internal density of the quantum well. The carrier wave function overlap rate, thereby improving the light output power of the deep ultraviolet LED.

附图说明Description of drawings

图1是本发明中量子垒掺杂的深紫外LED一实施方式的结构示意图;Fig. 1 is a schematic structural view of an embodiment of a quantum barrier-doped deep ultraviolet LED in the present invention;

图2是本发明中量子垒掺杂的深紫外LED一实施方式中量子阱有源层的结构示意图;Fig. 2 is a schematic structural view of the quantum well active layer in an embodiment of the deep ultraviolet LED doped with quantum barriers in the present invention;

图3是本发明中量子垒掺杂的深紫外LED一实施方式的原理示意图;Fig. 3 is a principle schematic diagram of an embodiment of a deep ultraviolet LED doped with a quantum barrier in the present invention;

图4是本发明中量子垒掺杂的深紫外LED一实施方式中量子垒层掺杂浓度与波函数覆盖率及出光功率之间的曲线关系图;Fig. 4 is a graph showing the relationship between the doping concentration of the quantum barrier layer, the wave function coverage and the light output power in an embodiment of the deep ultraviolet LED doped with quantum barriers in the present invention;

图5是本发明中量子垒掺杂的深紫外LED一实施方式中量子阱层空穴载流子浓度和量子垒层掺杂浓度的曲线关系图;Fig. 5 is a graph showing the relationship between the hole carrier concentration of the quantum well layer and the doping concentration of the quantum barrier layer in an embodiment of the deep ultraviolet LED doped with quantum barriers in the present invention;

图6是本发明中量子垒掺杂的深紫外LED一实施方式中发光功率和量子垒层掺杂浓度的曲线关系图。FIG. 6 is a graph showing the relationship between the luminous power and the doping concentration of the quantum barrier layer in an embodiment of the deep ultraviolet LED doped with quantum barriers in the present invention.

具体实施方式Detailed ways

下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,均属于本发明保护的范围。The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

对于本发明提供的第一解决方案,请参阅图1和图2,图1是本发明中量子垒掺杂的深紫外LED一实施方式的结构示意图,图2是本发明中量子垒掺杂的深紫外LED一实施方式中量子阱有源层的结构示意图。本发明中量子垒掺杂的深紫外LED,包括蓝宝石衬底1、N型AlGaN接触层2、量子阱有源层3、P型AlGaN载流子输运层4和P型GaN接触层5,蓝宝石衬底1上依次设置N型AlGaN接触层,量子阱有源层,P型AlGaN载流子输运层和P型GaN接触层。For the first solution provided by the present invention, please refer to Fig. 1 and Fig. 2, Fig. 1 is a schematic structural diagram of an embodiment of a deep ultraviolet LED doped with a quantum barrier in the present invention, and Fig. 2 is a diagram of a deep ultraviolet LED doped with a quantum barrier in the present invention Schematic diagram of the structure of the quantum well active layer in an embodiment of the deep ultraviolet LED. The deep ultraviolet LED doped with quantum barriers in the present invention comprises a sapphire substrate 1, an N-type AlGaN contact layer 2, a quantum well active layer 3, a P-type AlGaN carrier transport layer 4 and a P-type GaN contact layer 5, An N-type AlGaN contact layer, a quantum well active layer, a P-type AlGaN carrier transport layer and a P-type GaN contact layer are sequentially arranged on the sapphire substrate 1 .

具体地,对上述量子垒掺杂的深紫外LED的各层结构及组分分别进行详述。本实施方式中,量子阱有源层3由6个周期的量子叠层31依次堆叠构成,量子叠层31包括量子垒层311和量子阱层312,量子垒层311为12nm的Al0.55Ga0.45N量子垒,且量子垒层311的Si掺杂浓度为5×1018~1×1019;量子阱层为3nm的Al0.45Ga0.55N量子阱,且量子阱层无掺杂。此外,优选的,N型AlGaN接触层的厚度为2~3μm,且Si掺杂浓度为5×1018~1×1019;P型AlGaN载流子输运层厚度为25nm,且Mg掺杂浓度为1×1019~3×1019;P型GaN接触层厚度为300nm,且Mg掺杂浓度为1×1019~5×1019Specifically, the structure and components of each layer of the quantum barrier-doped deep ultraviolet LED are described in detail respectively. In this embodiment, the quantum well active layer 3 is composed of six periods of quantum stacks 31 stacked in sequence. The quantum stack 31 includes a quantum barrier layer 311 and a quantum well layer 312. The quantum barrier layer 311 is 12nm Al 0.55 Ga 0.45 N quantum barrier, and the Si doping concentration of the quantum barrier layer 311 is 5×10 18 -1×10 19 ; the quantum well layer is a 3nm Al 0.45 Ga 0.55 N quantum well, and the quantum well layer is not doped. In addition, preferably, the thickness of the N-type AlGaN contact layer is 2-3 μm, and the Si doping concentration is 5×10 18 to 1×10 19 ; the thickness of the P-type AlGaN carrier transport layer is 25 nm, and the Mg-doped The concentration is 1×10 19 to 3×10 19 ; the thickness of the P-type GaN contact layer is 300 nm, and the Mg doping concentration is 1×10 19 to 5×10 19 .

请参阅图3,图3是本发明中量子垒掺杂的深紫外LED一实施方式的原理示意图,结合图3对上述量子垒掺杂的深紫外LED的原理进行详细阐述。图3中a为量子垒层不掺杂的情况,由于晶格失配产生的压电极化和AlGaN材料本身的自发极化,使得在界面出产生极强的极化电场,并使量子阱的能带弯曲,进而导致量子阱中的电子和空穴载流子的波函数分离,降低了其辐射复合的概率,故最终导致了在不掺杂情况下内量子效率较低的状况;图3中b为量子垒层掺杂适量Si的情况,当量子垒蹭中掺杂适量的硅杂质后,硅杂质激活产生的反向电场能有效的屏蔽量子垒本身的极化电场,从而减轻量子阱有源区中的能带倾斜程度,提高量子阱内部载流子的波函数重叠率,因此提高了辐射复合的概率,实现了深紫外LED内量子效率的提高。Please refer to FIG. 3 . FIG. 3 is a schematic diagram of the principle of an embodiment of the quantum barrier-doped deep ultraviolet LED in the present invention. The principle of the quantum barrier-doped deep ultraviolet LED is described in detail in conjunction with FIG. 3 . In Figure 3, a is the case where the quantum barrier layer is not doped. Due to the piezoelectric polarization generated by the lattice mismatch and the spontaneous polarization of the AlGaN material itself, a very strong polarization electric field is generated at the interface, and the quantum well The energy band bending of the quantum well leads to the separation of the wave functions of the electrons and hole carriers in the quantum well, which reduces the probability of their radiative recombination, which eventually leads to a low internal quantum efficiency in the case of no doping; Fig. b in 3 is the case where the quantum barrier layer is doped with an appropriate amount of Si. When the quantum barrier layer is doped with an appropriate amount of silicon impurities, the reverse electric field generated by the activation of the silicon impurities can effectively shield the polarization electric field of the quantum barrier itself, thereby reducing the quantum barrier. The inclination of the energy band in the active region of the well increases the wave function overlap rate of carriers inside the quantum well, thereby increasing the probability of radiative recombination and realizing the improvement of the quantum efficiency in the deep ultraviolet LED.

对于本发明提供的第二解决方案,具体为一种量子垒掺杂的深紫外LED制备方法,该方法主要采用金属有机化学气相沉积法,于蓝宝石衬底上依次沉积N型AlGaN接触层,量子阱有源层,P型AlGaN载流子输运层和P型GaN接触层。本实施方式中,在制备量子垒掺杂的深紫外LED时,所采用的Ga源为三甲基镓TMGa,Al源为三甲基镓TMAl,氮源为氨气NH3,载气为氢气H2,N型和P型的掺杂源分别为硅烷SiH4和二茂镁Cp2Mg;沉积各层结构时优选的温度条件如下:沉积N型AlGaN接触层时的反应温度为1050~1080℃,沉积量子阱有源层时的反应温度为1050~1080℃,沉积P型AlGaN载流子输运层时的反应温度为1050~1080℃,沉积P型GaN接触层时的反应温度为950~1000℃。The second solution provided by the present invention is specifically a method for preparing a quantum barrier-doped deep-ultraviolet LED. This method mainly uses metal-organic chemical vapor deposition to sequentially deposit an N-type AlGaN contact layer on a sapphire substrate. Well active layer, P-type AlGaN carrier transport layer and P-type GaN contact layer. In this embodiment, when preparing quantum barrier-doped deep ultraviolet LEDs, the Ga source used is trimethylgalliumTMGa, the Al source is trimethylgalliumTMAl, the nitrogen source is ammonia NH3 , and the carrier gas is hydrogen The dopant sources of H 2 , N-type and P-type are silane SiH 4 and dimagnesium Cp 2 Mg respectively; the preferred temperature conditions for depositing each layer structure are as follows: the reaction temperature for depositing N-type AlGaN contact layer is 1050-1080 °C, the reaction temperature for depositing the quantum well active layer is 1050-1080 °C, the reaction temperature for depositing the P-type AlGaN carrier transport layer is 1050-1080 °C, and the reaction temperature for depositing the P-type GaN contact layer is 950 °C ~1000°C.

由于第二解决方案中量子垒掺杂的深紫外LED制备方法用于制备前述第一解决方案中量子垒掺杂的深紫外LED,故两个解决方案中量子垒掺杂的深紫外LED的结构和功能应保持一致。Since the quantum barrier-doped deep ultraviolet LED preparation method in the second solution is used to prepare the quantum barrier-doped deep ultraviolet LED in the aforementioned first solution, the structure of the quantum barrier-doped deep ultraviolet LED in the two solutions and functions should be consistent.

进一步地,为研究上述量子垒掺杂的深紫外LED的量子垒层掺杂浓度同波函数覆盖率、量子阱层载流子浓度以及发光功率之间关系,分别进行测试,具体数据请参阅图4~6。其中,图4是本发明中量子垒掺杂的深紫外LED一实施方式中量子垒层掺杂浓度与波函数覆盖率及出光功率之间的曲线关系图,从图4中可看出,随着量子垒层Si掺杂浓度的提高,波函数重叠率和发光功率均呈现出逐渐上升趋势,但最终发光功率会存在一个最大值而不能一直上升;图5是本发明中量子垒掺杂的深紫外LED一实施方式中量子阱层空穴载流子浓度和量子垒层掺杂浓度的曲线关系图,从图5中可看出,随着量子垒层Si掺杂浓度的提高,量子阱层中空穴载流子的浓度呈现下降的趋势,说明Si掺杂浓度的逐渐提高有助于逐渐减轻量子阱层中能带倾斜程度;图6是本发明中量子垒掺杂的深紫外LED一实施方式中发光功率和量子垒层掺杂浓度的曲线关系图,从图6中可看出,随着量子垒层Si掺杂浓度的提高,深紫外LED的发光功率呈现出先升后降的趋势,起初发光功率随Si掺杂浓度的提高而逐渐上升,当超过最优掺杂浓度后,空穴载流子的过度下降对深紫外LED的发光功率逐渐产生抑制作用。综合图4~6中的数据表征可知,若需要将深紫外LED的发光性能维持在最佳状态,则需要精确控制Si掺杂浓度;而本发明中量子垒层的最佳Si掺杂浓度为5×1018~1×1019,且这种Si二维面掺杂方式所制备的深紫外LED效果最佳。Further, in order to study the relationship between the doping concentration of the quantum barrier layer and the coverage of the wave function, the carrier concentration of the quantum well layer, and the luminous power of the above-mentioned quantum barrier-doped deep ultraviolet LED, tests were carried out. For specific data, please refer to Fig. 4~6. Wherein, Fig. 4 is a graph of the relationship between the doping concentration of the quantum barrier layer and the wave function coverage and the light output power in an embodiment of the deep ultraviolet LED doped with quantum barriers in the present invention. It can be seen from Fig. 4 that with With the increase of the Si doping concentration of the quantum barrier layer, both the wave function overlap rate and the luminous power show a gradual upward trend, but the final luminous power will have a maximum value and cannot be continuously increased; Fig. 5 is the quantum barrier doped in the present invention. The curve relationship between the hole carrier concentration of the quantum well layer and the doping concentration of the quantum barrier layer in an embodiment of the deep ultraviolet LED can be seen from Fig. 5, as the Si doping concentration of the quantum barrier layer increases, the quantum well The concentration of hole carriers in the layer shows a downward trend, indicating that the gradual increase in Si doping concentration helps to gradually reduce the energy band gradient in the quantum well layer; Fig. 6 is a deep ultraviolet LED doped with quantum barriers in the present invention. The curve relationship between the luminous power and the doping concentration of the quantum barrier layer in the embodiment, as can be seen from Figure 6, with the increase of the Si doping concentration of the quantum barrier layer, the luminous power of the deep ultraviolet LED shows a trend of rising first and then falling , the initial luminous power gradually increases with the increase of Si doping concentration, when the optimal doping concentration is exceeded, the excessive decline of hole carriers gradually inhibits the luminous power of deep ultraviolet LEDs. Based on the data representations in Figures 4 to 6, it can be seen that if the luminous performance of the deep ultraviolet LED needs to be maintained at the best state, it is necessary to accurately control the Si doping concentration; and the optimal Si doping concentration of the quantum barrier layer in the present invention is 5×10 18 ~1×10 19 , and the deep ultraviolet LED prepared by this Si two-dimensional surface doping method has the best effect.

区别于现有技术的情况,本发明提供了一种量子垒掺杂的深紫外LED及制备方法,利用量子垒掺杂实现极化自屏蔽的效应,提高量子阱内部的载流子波函数重叠率,从而提高深紫外LED的出光功率。Different from the situation in the prior art, the present invention provides a deep ultraviolet LED doped with quantum barriers and a preparation method, which uses quantum barrier doping to realize the polarization self-shielding effect, and improves the carrier wave function overlap inside the quantum well. efficiency, thereby increasing the light output power of the deep ultraviolet LED.

以上所述实施例仅表达了本发明的实施方式,其描述较为具体和详细,但并不能因此而理解为对发明专利范围的限制。应当指出的是,对于本领域的普通技术人员来说,在不脱离本发明构思的前提下,还可以做出若干变形和改进,这些都属于本发明的保护范围。因此,本发明专利的保护范围应以所附权利要求为准。The above-mentioned embodiments only express the implementation manner of the present invention, and the description thereof is relatively specific and detailed, but should not be construed as limiting the patent scope of the invention. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of the present invention, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent for the present invention should be based on the appended claims.

Claims (8)

1.一种量子垒掺杂的深紫外LED,其特征在于,包括蓝宝石衬底、N型AlGaN接触层、量子阱有源层、P型AlGaN载流子输运层和P型GaN接触层,所述蓝宝石衬底上依次设置N型AlGaN接触层,量子阱有源层,P型AlGaN载流子输运层和P型GaN接触层;1. A quantum barrier doped deep ultraviolet LED, characterized in that, comprises a sapphire substrate, an N-type AlGaN contact layer, a quantum well active layer, a P-type AlGaN carrier transport layer and a P-type GaN contact layer, An N-type AlGaN contact layer, a quantum well active layer, a P-type AlGaN carrier transport layer and a P-type GaN contact layer are sequentially arranged on the sapphire substrate; 所述量子阱有源层由6个周期的量子叠层依次堆叠构成,所述量子叠层包括量子垒层和量子阱层,所述量子垒层为12nm的Al0.55Ga0.45N量子垒,且所述量子垒层Si掺杂浓度为5×1018~1×1019The quantum well active layer is composed of 6 periods of quantum stacks stacked sequentially, the quantum stacks include a quantum barrier layer and a quantum well layer, and the quantum barrier layer is a 12nm Al 0.55 Ga 0.45 N quantum barrier, and The Si doping concentration of the quantum barrier layer is 5×10 18 -1×10 19 . 2.根据权利要求1中所述的量子垒掺杂的深紫外LED,其特征在于,所述量子阱层为3nm的Al0.45Ga0.55N量子阱,且所述量子阱层无掺杂。2 . The quantum barrier doped deep ultraviolet LED according to claim 1 , wherein the quantum well layer is a 3nm Al 0.45 Ga 0.55 N quantum well, and the quantum well layer is not doped. 3.根据权利要求1中所述的量子垒掺杂的深紫外LED,其特征在于,所述N型AlGaN接触层的厚度为2~3μm,且Si掺杂浓度为5×1018~1×10193. The quantum barrier-doped deep ultraviolet LED according to claim 1, characterized in that, the thickness of the N-type AlGaN contact layer is 2-3 μm, and the Si doping concentration is 5×10 18 to 1× 10 19 . 4.根据权利要求1中所述的量子垒掺杂的深紫外LED,其特征在于,所述P型AlGaN载流子输运层厚度为25nm,且Mg掺杂浓度为1×1019~3×10194. The quantum barrier doped deep ultraviolet LED according to claim 1, characterized in that, the thickness of the P-type AlGaN carrier transport layer is 25 nm, and the Mg doping concentration is 1×10 19 ~3 ×10 19 . 5.根据权利要求1中所述的量子垒掺杂的深紫外LED,其特征在于,所述P型GaN接触层厚度为300nm,且Mg掺杂浓度为1×1019~5×10195 . The quantum barrier doped deep ultraviolet LED according to claim 1 , wherein the thickness of the P-type GaN contact layer is 300 nm, and the Mg doping concentration is 1×10 19 -5×10 19 . 6.一种量子垒掺杂的深紫外LED制备方法,其特征在于,具体步骤为采用金属有机化学气相沉积法于蓝宝石衬底上依次沉积N型AlGaN接触层,量子阱有源层,P型AlGaN载流子输运层和P型GaN接触层;6. A quantum barrier doped deep-ultraviolet LED preparation method, characterized in that the specific steps are to sequentially deposit an N-type AlGaN contact layer, a quantum well active layer, and a P-type AlGaN contact layer on a sapphire substrate by metal-organic chemical vapor deposition. AlGaN carrier transport layer and P-type GaN contact layer; 所述量子垒掺杂的深紫外LED制备方法用于制备权利要求1~5中任一所述量子垒掺杂的深紫外LED。The quantum barrier doped deep ultraviolet LED preparation method is used for preparing the quantum barrier doped deep ultraviolet LED in any one of claims 1-5. 7.根据权利要求6中所述的量子垒掺杂的深紫外LED制备方法,其特征在于,制备所述量子垒掺杂的深紫外LED时,所采用的Ga源为三甲基镓TMGa,Al源为三甲基镓TMAl,氮源为氨气NH3,载气为氢气H2,N型和P型的掺杂源分别为硅烷SiH4和二茂镁Cp2Mg。7. according to the quantum barrier-doped deep-ultraviolet LED preparation method described in claim 6, it is characterized in that, when preparing the quantum barrier-doped deep-ultraviolet LED, the Ga source that adopts is trimethyl gallium TMGa, The Al source is trimethylgallium TMAl, the nitrogen source is ammonia NH 3 , the carrier gas is hydrogen H 2 , and the N-type and P-type doping sources are silane SiH 4 and dimagnesocene Cp 2 Mg respectively. 8.根据权利要求6中所述的量子垒掺杂的深紫外LED制备方法,其特征在于,沉积所述N型AlGaN接触层时的反应温度为1050~1080℃;8. The quantum barrier-doped deep ultraviolet LED preparation method according to claim 6, characterized in that the reaction temperature when depositing the N-type AlGaN contact layer is 1050-1080°C; 沉积所述量子阱有源层时的反应温度为1050~1080℃;The reaction temperature when depositing the quantum well active layer is 1050-1080°C; 沉积所述P型AlGaN载流子输运层时的反应温度为1050~1080℃;The reaction temperature when depositing the P-type AlGaN carrier transport layer is 1050-1080°C; 沉积所述P型GaN接触层时的反应温度为950~1000℃。The reaction temperature when depositing the P-type GaN contact layer is 950-1000°C.
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Application publication date: 20191115