CN110441640A - A kind of test device - Google Patents
A kind of test device Download PDFInfo
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- CN110441640A CN110441640A CN201910853607.7A CN201910853607A CN110441640A CN 110441640 A CN110441640 A CN 110441640A CN 201910853607 A CN201910853607 A CN 201910853607A CN 110441640 A CN110441640 A CN 110441640A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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Abstract
本发明涉及一种测试装置,用于对含有射频信号端子的被测装置进行测试,其特征在于:包括主体(1),该主体内嵌设有由导体制成的射频检测体(2),射频检测体内设有射频弹性探针(3),射频弹性探针的外部包裹有绝缘套(4);射频检测体内还设有多根围绕在包裹有绝缘套的射频弹性探针周围的辅助弹性探针(5);射频检测体(2)的上端设有能分别供射频弹性探针(3)和多根辅助弹性探针(5)穿出的穿孔;射频弹性探针(3)的上端能与被测装置的射频信号端子接触,射频弹性探针的下端与射频电缆内部导体导电连接,辅助弹性探针直接与射频检测体导电接触;射频检测体的下端能与射频电缆连接。
The invention relates to a testing device for testing a device under test containing radio frequency signal terminals, which is characterized in that it comprises a main body (1), the main body is embedded with a radio frequency detection body (2) made of conductors, A radio frequency elastic probe (3) is arranged in the radio frequency detection body, and an insulating sleeve (4) is wrapped on the outside of the radio frequency elastic probe; and a plurality of auxiliary elastic probes surrounding the radio frequency elastic probe wrapped with the insulating sleeve are also arranged in the radio frequency detection body. The probe (5); the upper end of the radio frequency detection body (2) is provided with perforations through which the radio frequency elastic probe (3) and a plurality of auxiliary elastic probes (5) can be respectively passed through; the upper end of the radio frequency elastic probe (3) It can be in contact with the radio frequency signal terminal of the device under test, the lower end of the radio frequency elastic probe is conductively connected with the inner conductor of the radio frequency cable, and the auxiliary elastic probe is directly in conductive contact with the radio frequency detection body; the lower end of the radio frequency detection body can be connected with the radio frequency cable.
Description
技术领域technical field
本发明涉及一种测试装置,特别是涉及含有射频微波信号端子的被测装置,如对BGA封装的高速传输芯片和微系统(SIP)产品进行检测。The invention relates to a testing device, in particular to a device under test containing radio frequency microwave signal terminals, such as testing high-speed transmission chips and microsystem (SIP) products in BGA packages.
背景技术Background technique
未来的信息交流,正在朝着无线和移动的方向发展,包括移动通信、无线局域网、卫星通信、无线接入、雷达探测、GPS定位等在内的各类无线移动技术正在蓬勃发展。所有这些系统都需求射频(RF)技术、射频集成电路(RFIC)或射频系统。在这些通信系统中,人们需要开发信号频谱延伸到射频段甚至频率更高的微波毫米波波段,此外,一些超高速集成电路同样具有射频微波信号传输的特点。The future information exchange is developing towards wireless and mobile. Various wireless mobile technologies including mobile communication, wireless local area network, satellite communication, wireless access, radar detection, GPS positioning, etc. are developing vigorously. All of these systems require radio frequency (RF) technology, radio frequency integrated circuits (RFIC) or radio frequency systems. In these communication systems, people need to develop the signal spectrum extending to the radio frequency band or even the microwave and millimeter wave band with higher frequencies. In addition, some ultra-high-speed integrated circuits also have the characteristics of radio frequency microwave signal transmission.
Packeage,常译为封装,通常是指单片IC在从晶圆上切割下来后的保护性外壳及相关附件,主要用于保护硅片。封装的形式一般包括DIP、QFP、QFN、BGA等,随着工艺水平的提高,封装技术发展的很快,主要是封装密度越来越高,规模越来越大,引脚数目快速增长。此外,由于功能集成的要求,单芯片封装已经不能满足系统设计的要求,封装产品也逐渐地由小规模、单芯片封装向大规模、多芯片封装的方向发展。Package, often translated as package, usually refers to the protective casing and related accessories of a single IC after being cut from the wafer, mainly used to protect the silicon wafer. The form of packaging generally includes DIP, QFP, QFN, BGA, etc. With the improvement of the technology level, the packaging technology develops rapidly, mainly because the packaging density is getting higher and higher, the scale is getting bigger and bigger, and the number of pins is increasing rapidly. In addition, due to the requirements of functional integration, single-chip packaging can no longer meet the requirements of system design, and packaging products have gradually developed from small-scale, single-chip packaging to large-scale, multi-chip packaging.
SiP(System in Package)系统级封装,顾名思义,是指在一个封装体中集成一个系统。通常,这个系统需要封装多个芯片并能够独立完成特定的任务,如集成了CPU、DRAM、Flash等多个传统IC芯片的SiP系统级封装,其中也包括了含有射频集成电路单元的SiP封装,其引脚的引出方式常规采用BGA封装扇出方式。SiP (System in Package) system-in-package, as the name suggests, refers to the integration of a system in a package. Usually, this system needs to package multiple chips and be able to complete specific tasks independently, such as SiP system-in-package integrating multiple traditional IC chips such as CPU, DRAM, Flash, etc., which also includes SiP package containing radio frequency integrated circuit units. The lead-out method of its pins conventionally adopts the fan-out method of BGA package.
在对含有射频微波传输或超高速传输需求的IC、RFIC和SIP以及相关的封装基板、高频电路板的测试过程中,其射频微波传输频率或可达到20GHz甚至更高,如何高效、方便地对射频微波通道以及传统的控制通道、电源通道进行测试,是目前急需解决的技术问题。In the process of testing ICs, RFICs and SIPs and related packaging substrates and high-frequency circuit boards that require radio frequency microwave transmission or ultra-high-speed transmission, the radio frequency microwave transmission frequency may reach 20GHz or even higher. How to efficiently and conveniently Testing the RF microwave channel and the traditional control channel and power supply channel is a technical problem that needs to be solved urgently at present.
发明内容SUMMARY OF THE INVENTION
本发明所要解决的技术问题是针对上述现有技术提供一种能方便地对含有较高频率的射频微波通道端口的被测物体进行测试的测试装置。The technical problem to be solved by the present invention is to provide a test device which can conveniently test the object under test containing the radio frequency microwave channel port of higher frequency, aiming at the above-mentioned prior art.
本发明解决上述技术问题所采用的技术方案为:一种测试装置,用于对含有射频微波信号端口的被测装置进行测试,其特征在于:包括主体,该主体内嵌设有由导体制成的射频微波检测体,射频微波检测体内设有射频弹性探针,射频弹性探针的外部包裹有绝缘套;射频微波检测体内还设有多根围绕在包裹有绝缘套的射频弹性探针周围的辅助接地弹性探针;射频微波检测体的上端设有能分别供射频弹性探针和多根辅助接地弹性探针穿出的穿孔;射频弹性探针的上端能与被测装置的射频微波信号端口接触,射频弹性探针的下端与射频电缆内部导体导电连接,辅助接地弹性探针直接与射频检测体导电接触;射频检测体的下端能与射频电缆连接。The technical solution adopted by the present invention to solve the above technical problems is: a test device for testing a device under test containing a radio frequency microwave signal port, characterized in that it includes a main body, and the main body is embedded with a device made of conductors. The radio frequency microwave detection body is equipped with a radio frequency elastic probe in the radio frequency microwave detection body, and the radio frequency elastic probe is wrapped with an insulating sleeve; Auxiliary grounding elastic probe; the upper end of the radio frequency microwave detection body is provided with perforations through which the radio frequency elastic probe and a plurality of auxiliary grounding elastic probes can be respectively passed; the upper end of the radio frequency elastic probe can be connected with the radio frequency microwave signal port of the device under test Contact, the lower end of the radio frequency elastic probe is conductively connected to the inner conductor of the radio frequency cable, and the auxiliary grounding elastic probe is directly in conductive contact with the radio frequency detection body; the lower end of the radio frequency detection body can be connected to the radio frequency cable.
作为改进,所述主体包括面板和设置在面板下方的底板,所述射频检测体包括嵌设在面板内的上嵌件和嵌设在底板内的下嵌件,上嵌件和下嵌件均由导体制成;所述上嵌件内设有沿上下方向延伸的第一通孔,所述射频弹性探针和包裹在射频弹性探针外的绝缘套沿第一通孔的轴向插设在第一通孔内;所述多根辅助接地弹性探针嵌设在上嵌件内,并围绕在包裹有绝缘套的射频弹性探针周围,同时多根辅助弹性探针的下端与下嵌件导电接触;所述下嵌件内设有沿上下方向延伸的第二通孔,第一通孔和第一通孔同轴设置,第二通孔内设有沿第二通孔的轴向插设的下绝缘套,下绝缘套内设有与射频弹性探针导电接触的射频内导体。As an improvement, the main body includes a panel and a bottom plate disposed below the panel, the radio frequency detection body includes an upper insert embedded in the panel and a lower insert embedded in the bottom plate, the upper and lower inserts are both It is made of conductor; the upper insert is provided with a first through hole extending in the up-down direction, and the RF elastic probe and the insulating sleeve wrapped around the RF elastic probe are inserted along the axial direction of the first through hole In the first through hole; the plurality of auxiliary grounding elastic probes are embedded in the upper insert and surround the radio frequency elastic probes wrapped with insulating sleeves, and the lower ends of the plurality of auxiliary elastic probes are embedded in the lower The lower insert is provided with a second through hole extending in the up-down direction, the first through hole and the first through hole are coaxially arranged, and the second through hole is provided with an axial direction along the second through hole. The inserted lower insulating sleeve is provided with a radio frequency inner conductor in conductive contact with the radio frequency elastic probe.
再改进,所述上嵌件在第一通孔顶端处形成有上补偿台阶;所述内导体中部形成有下补偿台阶;射频弹性探针的下端部呈锥形,且与绝缘套内壁之间形成有间隙。Further improvement, the upper insert is formed with an upper compensation step at the top of the first through hole; a lower compensation step is formed in the middle of the inner conductor; A gap is formed.
再改进,所述射频内导体下端开有供射频电缆中心导体插入的插孔。In a further improvement, the lower end of the radio frequency inner conductor is provided with a jack for inserting the center conductor of the radio frequency cable.
再改进,所述下绝缘套下部设有防止射频内导体与射频电缆外导体短路的绝缘垫片。In a further improvement, the lower part of the lower insulating sleeve is provided with an insulating gasket to prevent the short circuit between the radio frequency inner conductor and the radio frequency cable outer conductor.
再改进,所述射频内导体插孔内壁与射频电缆中心导体采用焊锡焊接;所述下嵌件的第二通孔内壁与射频电缆外导体采用焊锡焊接。In a further improvement, the inner wall of the radio frequency inner conductor jack and the central conductor of the radio frequency cable are welded by solder; the inner wall of the second through hole of the lower insert and the outer conductor of the radio frequency cable are welded by solder.
再改进,所述面板内还嵌设有低频弹性探针,所述底板内对应位置设有能与低频弹性探针导电接触的低频插针。In a further improvement, a low-frequency elastic probe is embedded in the panel, and a low-frequency pin that can be in conductive contact with the low-frequency elastic probe is disposed at a corresponding position in the bottom plate.
再改进,所述面板内还嵌设有接地弹性探针,所述底板内对应位置设有能与接地弹性探针导电接触的接地插针。In a further improvement, a grounding elastic probe is embedded in the panel, and a grounding pin that can be in conductive contact with the grounding elastic probe is provided at a corresponding position in the bottom plate.
再改进,所述主体外设有金属壳体,金属壳体下方设有金属底壳,金属底壳上设有射频检测接口,射频检测体的射频内导体通过射频电缆与射频检测接口导电连接;金属底壳上还设有低频检测接口,低频插针下部带有插孔,可与低频检测接口通过导线导电连接;接地插针与金属壳体导电接触。In a further improvement, the main body is provided with a metal shell outside, a metal bottom shell is provided under the metal shell, a radio frequency detection interface is provided on the metal bottom shell, and the radio frequency inner conductor of the radio frequency detection body is electrically connected to the radio frequency detection interface through a radio frequency cable; The metal bottom case is also provided with a low frequency detection interface, and the lower part of the low frequency pin is provided with a socket, which can be electrically connected with the low frequency detection interface through a wire; the ground pin is in conductive contact with the metal shell.
再改进,所述金属壳体的上部还设有上盖,上盖与金属壳体通过卡扣活动连接。In a further improvement, the upper part of the metal shell is also provided with an upper cover, and the upper cover and the metal shell are movably connected by snaps.
再改进,所述上盖上与被测对象对应的部位开有通孔观察窗,该通孔观察窗内设有能压紧被测装置的活动垫片。In a further improvement, a through-hole observation window is opened on the upper cover at a portion corresponding to the measured object, and a movable gasket capable of pressing the measured device is arranged in the through-hole observation window.
与现有技术相比,本发明的优点在于:Compared with the prior art, the advantages of the present invention are:
1、采用弹性探针与被测对象的焊盘或BGA球作有效接触,可以灵活、方便的更换被测对象,免焊接设计对被测对象无损伤。1. The elastic probe is used for effective contact with the pad or BGA ball of the tested object, which can flexibly and conveniently replace the tested object, and the welding-free design does not damage the tested object.
2、射频检测体作为射频微波信号主要传输通道,同时在与被测物体接触部位也构置了同轴结构的传输通道,可通过设置补偿结构以较好的达到阻抗匹配效果以减少射频微波信号的反射。2. The RF detector is used as the main transmission channel for RF microwave signals. At the same time, a transmission channel of coaxial structure is also constructed at the contact part with the measured object. By setting up a compensation structure, the impedance matching effect can be better achieved and the RF microwave signal can be reduced. reflection.
3、在改进方案中,采用一体式集成设计,可对被测对象所有的射频、控制、电源端口作对应的检测端口引出,体积较小,可以满足进线测试的需求。3. In the improved scheme, an integrated integrated design is adopted, which can lead out all the radio frequency, control and power ports of the tested object as corresponding detection ports. The volume is small and can meet the needs of incoming line testing.
4、在改进方案中,上盖区域设有开放结构,可以方便的对一些SIP产品进行在线开窗检测,进一步对封装内的特定芯片单元执行定点调试分析操作。4. In the improved scheme, the upper cover area is provided with an open structure, which can conveniently conduct online window detection for some SIP products, and further perform fixed-point debugging and analysis operations on specific chip units in the package.
附图说明Description of drawings
图1为本发明实施例中测试装置的立体结构示意图;1 is a schematic three-dimensional structure diagram of a testing device in an embodiment of the present invention;
图2为本发明实施例中测试装置另一视角的立体结构示意图;FIG. 2 is a schematic three-dimensional structural diagram of a test device from another perspective in an embodiment of the present invention;
图3为本发明实施例中测试装置的立体分解图;3 is an exploded perspective view of a testing device in an embodiment of the present invention;
图4为本发明实施例中测试装置的剖视图;4 is a cross-sectional view of a testing device in an embodiment of the present invention;
图5为本发明实施例中主体和射频检测体的结构示意图;5 is a schematic structural diagram of a main body and a radio frequency detection body in an embodiment of the present invention;
图6为本发明实施例中上嵌件及内部组件的结构示意图;6 is a schematic structural diagram of an upper insert and internal components in an embodiment of the present invention;
图7为本发明实施例中下嵌件及内部组件的结构示意图。FIG. 7 is a schematic structural diagram of a lower insert and internal components in an embodiment of the present invention.
具体实施方式Detailed ways
以下结合附图实施例对本发明作进一步详细描述。The present invention will be further described in detail below with reference to the embodiments of the accompanying drawings.
如图1~4所述的测试装置,用于对含有射频信号端子71的被测装置7进行测试,其包括主体1,该主体内嵌设有由导体制成的射频检测体2,射频检测体内设有射频弹性探针3,射频弹性探针的外部包裹有绝缘套4;射频检测体内还设有多根围绕在包裹有绝缘套的射频弹性探针周围的辅助弹性探针5;射频检测体的上端设有能分别供射频弹性探针和多根辅助弹性探针穿出的穿孔;射频弹性探针3的上端能与被测装置7的射频信号端子71接触,射频弹性探针的下端与射频电缆6内部导体61导电连接,辅助弹性探针5直接与射频检测体2导电接触;射频检测体2的下端能与射频电6缆连接。The test device as shown in FIGS. 1 to 4 is used to test the device under test 7 containing the radio frequency signal terminal 71 , and it includes a main body 1, and the main body is embedded with a radio frequency detection body 2 made of conductors. A radio frequency elastic probe 3 is arranged in the body, and an insulating sleeve 4 is wrapped on the outside of the radio frequency elastic probe; a plurality of auxiliary elastic probes 5 surrounding the radio frequency elastic probe wrapped with an insulating sleeve are also arranged in the radio frequency detection body; The upper end of the body is provided with perforations through which the RF elastic probe and multiple auxiliary elastic probes can be respectively passed; the upper end of the RF elastic probe 3 can be in contact with the RF signal terminal 71 of the device under test 7, and the lower end of the RF elastic probe It is conductively connected to the inner conductor 61 of the radio frequency cable 6, and the auxiliary elastic probe 5 is in direct conductive contact with the radio frequency detection body 2; the lower end of the radio frequency detection body 2 can be connected to the radio frequency electric cable 6.
本实施例中,主体1整体采用绝缘材质制成,其包括面板11和设置在面板下方的底板12;所述射频检测体2包括嵌设在绝缘面板11内的上嵌件21和嵌设在底板12内的下嵌件22,参见图5所示,上嵌件21和下嵌件22均由导体制成;所述上嵌件21内设有沿上下方向延伸的第一通孔,所述射频弹性探针3和包裹在射频弹性探针外的绝缘套4沿第一通孔的轴向插设在第一通孔内;所述多根辅助弹性探针5嵌设在上嵌件21内,并围绕在包裹有绝缘套4的射频弹性探针31周围,同时多根辅助弹性探针5的下端与下嵌件22导电接触;上嵌件21的上端设有能分别供射频弹性探针3和多根辅助弹性探针5穿出的穿孔,参见图6所示;所述下嵌件22内设有沿上下方向延伸的第二通孔,第一通孔和第一通孔同轴设置,第二通孔内设有沿第二通孔的轴向插设的下绝缘套8,下绝缘套8内设有与射频弹性探针3的下端导电接触的射频内导体9,参见图7所示。In this embodiment, the main body 1 is made of insulating material as a whole, and includes a panel 11 and a bottom plate 12 disposed below the panel; the radio frequency detection body 2 includes an upper insert 21 embedded in the insulating panel 11 and an upper insert 21 embedded in the insulating panel 11 . The lower insert 22 in the bottom plate 12, as shown in FIG. 5, both the upper insert 21 and the lower insert 22 are made of conductors; the upper insert 21 is provided with a first through hole extending in the up-down direction, so The RF elastic probe 3 and the insulating sleeve 4 wrapped around the RF elastic probe are inserted into the first through hole along the axial direction of the first through hole; the plurality of auxiliary elastic probes 5 are embedded in the upper insert 21, and surrounds the RF elastic probe 31 wrapped with the insulating sleeve 4, while the lower ends of the plurality of auxiliary elastic probes 5 are in conductive contact with the lower insert 22; The through holes through which the probes 3 and the plurality of auxiliary elastic probes 5 pass are shown in FIG. 6 ; the lower insert 22 is provided with a second through hole extending in the up-down direction, a first through hole and a first through hole Coaxially arranged, the second through hole is provided with a lower insulating sleeve 8 inserted along the axial direction of the second through hole, and the lower insulating sleeve 8 is provided with a radio frequency inner conductor 9 in conductive contact with the lower end of the radio frequency elastic probe 3, See Figure 7.
在本例中,下嵌件22的外形采用了上宽下窄的台阶设计,在实际设计中还可以采用上窄下宽或两端窄中间宽的台阶设计。此部分的结构变动,应该都在权利保护范围之内。In this example, the outer shape of the lower insert 22 adopts a step design with an upper width and a lower width. In actual design, a step design with a narrow upper portion and a lower width or a narrow width at both ends and a middle width may also be adopted. The structural changes of this part should all be within the scope of protection of rights.
在本实施例中,整个射频传输线基于50Ω的特性阻抗设计,但在一些过渡段采用错位补偿或高抗补偿以减少射频微波反射,提升传输性能。如为了形成补偿,上嵌件21在第一通孔顶端处形成有上补偿台阶21a,可以用于调节与芯片焊盘接触处的阻抗匹配;所述内导体9中部形成有下补偿台阶9a,形成高抗补偿;射频弹性探针3的下端部呈锥形,且与绝缘套4内壁之间形成有间隙4a,形成高抗补偿。射频内导体9下端开有供射频电缆6内部导体61插入的插槽91。下绝缘套8下部设有防止射频内导体与射频电缆外导电壳体短路的绝缘垫片10。In this embodiment, the entire RF transmission line is designed based on a characteristic impedance of 50Ω, but dislocation compensation or high impedance compensation is used in some transition sections to reduce RF microwave reflection and improve transmission performance. For example, in order to form compensation, the upper insert 21 is formed with an upper compensation step 21a at the top of the first through hole, which can be used to adjust the impedance matching at the contact point with the chip pad; a lower compensation step 9a is formed in the middle of the inner conductor 9, High resistance compensation is formed; the lower end of the radio frequency elastic probe 3 is tapered, and a gap 4a is formed between the radio frequency elastic probe 3 and the inner wall of the insulating sleeve 4 to form high resistance compensation. The lower end of the radio frequency inner conductor 9 is provided with a slot 91 into which the inner conductor 61 of the radio frequency cable 6 is inserted. The lower part of the lower insulating sleeve 8 is provided with an insulating gasket 10 for preventing the short circuit between the radio frequency inner conductor and the outer conductive shell of the radio frequency cable.
在本实施例中,所述的绝缘套4和下绝缘套8的外形采用了单独绝缘材质设计,实际设计还可采用部分空气介质或混合介质的方式达到绝缘和支撑的目的。此部分的结构变动,应该都在权利保护范围之内。In this embodiment, the outer shapes of the insulating sleeve 4 and the lower insulating sleeve 8 are designed with separate insulating materials, and the actual design can also use part of air medium or mixed medium to achieve the purpose of insulation and support. The structural changes of this part should all be within the scope of protection of rights.
面板11内还嵌设有低频弹性探针13,所述底板12内对应位置设有能与低频弹性探针导电接触的低频插针23。面板11内还嵌设有接地弹性探针14,所述底板12内对应位置设有能与接地弹性探针导电接触的接地插针24。A low-frequency elastic probe 13 is also embedded in the panel 11 , and a low-frequency pin 23 that can be in conductive contact with the low-frequency elastic probe is provided at a corresponding position in the bottom plate 12 . A grounding elastic probe 14 is also embedded in the panel 11 , and a grounding pin 24 capable of conducting conductive contact with the grounding elastic probe is provided at a corresponding position in the bottom plate 12 .
在本实施例中,所述的射频弹性探针31、辅助弹性探针5、低频弹性探针13以及接地弹性探针14采用了双动弹性探针作为达到可靠接触的传输介质,在实际应用中还可采用毛纽扣、导电胶垫、异形弹性针等多种带弹性接触的垂直互联方式。此部分的结构变动,应该都在权利保护范围之内。In this embodiment, the RF elastic probe 31 , the auxiliary elastic probe 5 , the low-frequency elastic probe 13 and the grounding elastic probe 14 use double-acting elastic probes as the transmission medium to achieve reliable contact. In practical applications Various vertical interconnection methods with elastic contact, such as wool buttons, conductive rubber pads, and special-shaped elastic needles, can also be used. The structural changes of this part should all be within the scope of protection of rights.
本图例中,只采用了一处射频检测体做为示例描述,实际上可以采用多个射频检测体分布。此外,射频检测体、低频针以及接地针的位置、间距布局也只作为示意给出,并不能作为实际布局限定。In this illustration, only one radio frequency detection body is used as an example for description, in fact, multiple radio frequency detection bodies can be distributed. In addition, the positions and spacing layouts of the RF detector, the low-frequency pins, and the ground pins are only given for illustration, and cannot be limited to the actual layout.
针对特殊的芯片布局,如更密集的间距,面板11可以和上嵌件21制成一体件,采用工程塑料材质,并使用较短、较细的弹性探针及采用数量更多的射频接地以减少射频传输损耗。另外,针对一些低频集中分布的芯片布局,面板11和上嵌件21也可以采用整块金属制成,但是低频弹性探针部位的外围材料需要变成绝缘材质,并形成新的独立嵌件。此部分可针对芯片的实际布局而进行优化排列组合,应该都在权利保护范围之内。For special chip layouts, such as denser pitches, the panel 11 can be made into one piece with the upper insert 21, which is made of engineering plastics, and uses shorter and thinner elastic probes and a larger number of RF grounds to Reduce RF transmission losses. In addition, for some chip layouts with concentrated low-frequency distribution, the panel 11 and the upper insert 21 can also be made of a single piece of metal, but the peripheral material of the low-frequency elastic probe part needs to be made of insulating material, and a new independent insert is formed. This part can be optimized for the actual layout of the chip, which should be within the scope of protection.
主体1外设有金属壳体15,金属壳体15下方设有金属底壳16,金属底壳16上设有射频检测接口17,射频检测体的射频内导体通过射频电缆与射频检测接口电连接;金属底壳上还设有低频检测接口18,低频插针23与低频检测接口18通过导线导电连接;接地插针24与金属壳体导电接触。金属底壳16内部挖空形成空腔,用于容纳射频电缆及低频导线等部件,底部开口使用底盖161覆盖。The main body 1 is provided with a metal shell 15 outside, a metal bottom shell 16 is provided under the metal shell 15, a radio frequency detection interface 17 is provided on the metal bottom shell 16, and the radio frequency inner conductor of the radio frequency detection body is electrically connected with the radio frequency detection interface through a radio frequency cable. ; The metal bottom case is also provided with a low frequency detection interface 18, the low frequency pin 23 and the low frequency detection interface 18 are conductively connected by wires; the ground pin 24 is in conductive contact with the metal shell. The inside of the metal bottom case 16 is hollowed out to form a cavity for accommodating components such as radio frequency cables and low frequency wires, and the bottom opening is covered with a bottom cover 161 .
在本实施例中,所述的低频检测接口18采用了J30J微矩形电连接器,实际可使用J63、D型等其它类型的电连接器。扩展的,可进一步的在金属底壳16与底盖161形成的空腔内安放控制电路板,用于优化低频电源的稳定性和控制信号的波形。此部分的结构变动,应该都在权利保护范围之内。In this embodiment, the low-frequency detection interface 18 uses a J30J micro-rectangular electrical connector, but other types of electrical connectors such as J63 and D-type can be used in practice. By extension, a control circuit board can be further placed in the cavity formed by the metal bottom case 16 and the bottom cover 161 to optimize the stability of the low-frequency power supply and the waveform of the control signal. The structural changes of this part should all be within the scope of protection of rights.
金属壳体15的上部还设有上盖19,上盖19与金属壳体16通过卡扣20活动连接。上盖19上与射频弹性探针对应的部位开有通孔观察窗19a,该通孔观察窗内设有能弹性压紧被测装置的活动垫片25。The upper part of the metal shell 15 is further provided with an upper cover 19 , and the upper cover 19 is movably connected with the metal shell 16 through the buckle 20 . A through-hole observation window 19a is formed on the upper cover 19 corresponding to the RF elastic probe, and a movable gasket 25 capable of elastically pressing the device under test is arranged in the through-hole observation window.
在本实施例中,上盖19与金属壳体16通过双卡扣活动连接,可扩展的使用一侧轴固定,另一侧卡扣活动连接的翻盖结构。此部分的结构变动,应该都在权利保护范围之内。In this embodiment, the upper cover 19 and the metal shell 16 are movably connected by double snaps, and can be expanded using a flip structure in which one side is fixed by the shaft and the other side is movably connected by snaps. The structural changes of this part should all be within the scope of protection of rights.
显然,上述实施例仅仅是为清楚地说明所作的举例,而并非对实施方式的限定。对于所属领域的普通技术人员来说,在上述说明的基础上还可以做出其它不同形式的变化或变动。这里无需也无法对所有的实施方式予以穷举。而由此所引伸出的显而易见的变化或变动仍处于本发明创造的保护范围之中。Obviously, the above-mentioned embodiments are only examples for clear description, and are not intended to limit the implementation manner. For those of ordinary skill in the art, changes or modifications in other different forms can also be made on the basis of the above description. There is no need and cannot be exhaustive of all implementations here. And the obvious changes or changes derived from this are still within the protection scope of the present invention.
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