CN110335247B

CN110335247B - BIM (building information modeling) -based defect positioning method, device, equipment and storage medium

Info

Publication number: CN110335247B
Application number: CN201910461159.6A
Authority: CN
Inventors: 王健宇; 高翔; 杨淞博; 杨磊; 马磊
Original assignee: Engineering Construction Headquarters Of Guangdong Airport Management Group Co Ltd
Current assignee: Engineering construction headquarters of Guangdong Airport Management Group Co., Ltd
Priority date: 2019-05-30
Filing date: 2019-05-30
Publication date: 2021-12-10
Anticipated expiration: 2039-05-30
Also published as: CN110335247A

Abstract

The invention relates to a BIM model-based defect positioning method, a BIM model-based defect positioning device, BIM model-based defect positioning equipment and a storage medium, wherein a server sends a BIM model to be marked to a first terminal for displaying, the first terminal sends an internal defect mark obtained by marking an internal defect on a member of the BIM model to the server, the server sends the internal defect mark to a second terminal, and if the server receives an access request of the second terminal to the internal defect mark, the BIM model is sent to the second terminal for displaying, the section of the member where the internal defect is located is highlighted, and the internal defect mark is positioned at the defect position of the section of the member. This scheme can send the BIM model to this second terminal and show, and the component cross-section that internal defect place is highlighted simultaneously to with the defect mark location in the defect position department of this component cross-section, reach the effect of locating the internal defect of BIM model fast and highlighting, improve the efficiency of fixing a position the defect of BIM model.

Description

BIM (building information modeling) -based defect positioning method, device, equipment and storage medium

Technical Field

The invention relates to the technical field of information processing of building information models, in particular to a BIM (building information modeling) -based defect positioning method, a BIM-based defect positioning device, computer equipment and a computer-readable storage medium.

Background

The BIM (Building Information Modeling, BIM for short) is a virtual three-dimensional model of the Building engineering, provides complete Building engineering Information which is consistent with the actual situation by utilizing a digital technology, and can conveniently and accurately describe the related Information of the Building member. Taking airport engineering as an example, the BIM model can be used for building a virtual three-dimensional model of an airport on line, and a BIM application management platform of the airport construction engineering can be built based on the BIM model, so that the whole process of the design and construction project is included, and the airport construction engineering is comprehensively controlled in the aspects of progress, quality safety and the like.

In the process of building the BIM model, because the BIM model usually includes a huge number of model components and has a complicated structure, the BIM model needs to be repeatedly corrected and adjusted for many times so as to be more perfect, wherein defects existing in the components of the BIM model are searched and repaired, which is important for the perfection of the BIM model. However, the conventional technology generally describes the defects of the BIM model in a text content form, the structure of the BIM model is generally large, the complexity is high, and the defects of the BIM model can be located in a long time after the text content describing the defects of the BIM model is obtained, so that the efficiency of locating the defects of the BIM model is low.

Disclosure of Invention

Therefore, it is necessary to provide a defect localization method based on a BIM model, a defect localization apparatus based on the BIM model, a computer device and a computer readable storage medium, for solving the technical problem of low efficiency of localization of defects of the BIM model in the conventional technology.

A defect positioning method based on a BIM model comprises the following steps:

sending the BIM model to be marked to a first terminal for displaying;

receiving an internal defect mark sent by the first terminal; the internal defect mark is used for marking internal defects existing in the member of the BIM by the first terminal;

sending the internal defect mark to a second terminal;

and if an access request of the second terminal to the internal defect mark is received, sending the BIM model to the second terminal for displaying, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component.

A defect positioning method based on a BIM model comprises the following steps:

displaying the BIM model to be marked sent by the server;

receiving marking operation of internal defects existing in the components of the BIM model, and generating internal defect marks according to the marking operation;

and sending the internal defect mark to the server for triggering the server to send the internal defect mark to a second terminal, if the server receives an access request of the second terminal to the internal defect mark, sending the BIM model to the second terminal by the server for displaying, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component.

A BIM model based defect localization apparatus, comprising:

the model sending module is used for sending the BIM to be marked to the first terminal for displaying;

the mark receiving module is used for receiving the internal defect mark sent by the first terminal; the internal defect mark is used for marking internal defects existing in the member of the BIM by the first terminal;

the mark sending module is used for sending the internal defect mark to a second terminal;

and the first positioning module is used for sending the BIM model to the second terminal for displaying if an access request of the second terminal to the internal defect mark is received, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component.

A BIM model based defect localization apparatus, comprising:

the model display module is used for displaying the BIM to be marked sent by the server;

the marking generation module is used for receiving marking operation on internal defects existing in the components of the BIM model and generating internal defect marks according to the marking operation;

and the second positioning module is used for sending the internal defect mark to the server and triggering the server to send the internal defect mark to a second terminal, if the server receives an access request of the second terminal to the internal defect mark, the server sends the BIM model to the second terminal for displaying, highlights the section of the component where the internal defect is located and positions the internal defect mark at the defect position of the section of the component.

A computer device comprising a processor and a memory, the memory storing a computer program that when executed by the processor performs the steps of:

sending the BIM model to be marked to a first terminal for displaying; receiving an internal defect mark sent by the first terminal; the internal defect mark is used for marking internal defects existing in the member of the BIM by the first terminal; sending the internal defect mark to a second terminal; and if an access request of the second terminal to the internal defect mark is received, sending the BIM model to the second terminal for displaying, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component.

displaying the BIM model to be marked sent by the server; receiving marking operation of internal defects existing in the components of the BIM model, and generating internal defect marks according to the marking operation; and sending the internal defect mark to the server for triggering the server to send the internal defect mark to a second terminal, if the server receives an access request of the second terminal to the internal defect mark, sending the BIM model to the second terminal by the server for displaying, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component.

A computer-readable storage medium, on which a computer program is stored which, when executed by a processor, carries out the steps of:

According to the BIM model-based defect positioning method, device, equipment and storage medium, the server sends the BIM model to be marked to the first terminal for displaying, the first terminal sends the internal defect mark to the server, the internal defect mark marks the internal defect existing on the member of the BIM model, the server receives the internal defect mark and sends the internal defect mark to the second terminal, if the server receives an access request of the second terminal to the internal defect mark, the BIM model is sent to the second terminal for displaying, the section of the member where the internal defect is located is highlighted, and the internal defect mark is positioned at the defect position of the section of the member. This scheme can utilize the server to send the internal defect mark that first terminal produced to the second terminal for when this internal defect mark was visited to the second terminal, the server can send the BIM model to this second terminal and show, the component cross-section at this internal defect place of simultaneous highlighting, and with the defect position department of internal defect mark location at this component cross-section, reach the effect of locating the internal defect of BIM model fast and highlighting, improve the efficiency of fixing a position the defect of BIM model.

Drawings

FIG. 1 is a diagram illustrating an exemplary application scenario of a BIM-based defect localization method;

FIG. 2 is a flow chart illustrating a BIM-model-based defect localization method according to an embodiment;

FIG. 3 is a schematic flow chart of a BIM-model-based defect localization method in another embodiment;

FIG. 4 is a block diagram of a BIM model-based defect locating apparatus in one embodiment;

FIG. 5 is a block diagram of a BIM-based defect locator in another embodiment;

FIG. 6 is a diagram illustrating an internal structure of a computer device according to an embodiment;

fig. 7 is an internal structural view of a computer device in another embodiment.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

It should be noted that the term "first \ second" referred to in the embodiments of the present invention only distinguishes similar objects, and does not represent a specific ordering for the objects, and it should be understood that "first \ second" may exchange a specific order or sequence when allowed. It should be understood that "first \ second" distinct objects may be interchanged under appropriate circumstances such that embodiments of the invention described herein may be practiced in sequences other than those illustrated or described herein.

The defect location method based on the BIM model provided by the present invention may be applied to an application scenario as shown in fig. 1, where fig. 1 is an application scenario diagram of the defect location method based on the BIM model in an embodiment, where the application scenario may include a first terminal 110, a second terminal 120, and a server 200, and the first terminal 110 and the second terminal 120 may be connected to the server 200 through a network to access the BIM model stored in the server 200. Wherein, the first terminal 110 can mark the component defect of the BIM model, before the first terminal 110 marks the component defect of the BIM model, the first terminal 110 can send an access request to the internet, the server 200 can send the BIM model to be marked to the first terminal 110 for displaying according to the access request, the first terminal 110 can display the BIM model to be marked on line through a web page, then the first terminal 110 can mark the internal defect existing on the component of the BIM model to obtain a corresponding internal defect mark and send the internal defect mark to the server 200, the server 200 sends the internal defect mark to the second terminal 120 after receiving the internal defect mark, the second terminal 120 can trigger the internal defect mark to generate an access request to the internal defect mark and send the access request to the internal defect mark to the server 200, the server 200 sends the BIM model to the second terminal 120 for displaying, and meanwhile, highlights the cross section of the component where the internal defect is located, and positions the internal defect mark at the defect position of the cross section of the component, so that the effect of quickly positioning and highlighting the internal defect of the BIM model on the second terminal 120 is achieved, and the efficiency of positioning the defect of the BIM model is improved.

The first terminal 110 and the second terminal 120 may be, but not limited to, various personal computers, notebook computers and tablet computers, and the server 200 may be implemented by a stand-alone server or a server cluster composed of a plurality of servers.

In an embodiment, a defect locating method based on a BIM model is provided, referring to fig. 2, fig. 2 is a schematic flowchart of the defect locating method based on the BIM model in an embodiment, and taking an example that the method is applied to the server 200 in fig. 1 as an illustration, the defect locating method based on the BIM model may include the following steps:

and S101, sending the BIM to be marked to a first terminal for displaying.

In this step, after receiving the model access request sent by the first terminal 110, the server 200 may obtain the BIM model to be marked according to the model access request and send the BIM model to the first terminal 110, and the first terminal 110 may display the BIM model to be marked on line through a web page. A plurality of BIM models may be stored in advance in the server 200, and the first terminal 110 may access the BIM models and mark defects of the BIM models.

The BIM model stored on the server 200 may be pre-constructed by other terminals (e.g., the second terminal 120) and stored on the server 200, and the form of constructing the BIM model may include multiple forms, one of which is that the terminal is in communication connection with the server 200, and the terminal constructs the BIM model online. Generally, building the BIM model is performed before actual engineering construction, so that the component process of the BIM model is actually designed on line for the corresponding building, and the server 200 may provide a plurality of templates of the BIM model for the building of the BIM model, the building process of the BIM model may be accelerated based on the templates of the BIM model, and the actual building model generally includes various types of building components (such as an outer wall, a pillar, etc. may be used as the building component), so that the server may package the commonly used building components into the components of the BIM model, which is convenient for calling in the building process of the BIM model.

Another way to construct the BIM model may be that the terminal creates the BIM model locally in advance through related software and generates a corresponding model file, and then uploads the model file to the server 200, but considering that the file type of the model file may be various, in order to facilitate storage on the server 200, the server 200 may convert the format of the model file after receiving the model file and convert the model file into a model file suitable for storage and use on the server 200, for example, the server 200 may compress the model file first and then store the model file, and decompress the model file when the BIM model needs to be used, and so on. After the BIM model is uploaded, the server 200 may set an access right for the BIM model, assign the access right to a corresponding terminal, the terminal obtaining the access right may access the corresponding BIM model through the server 200, and then the server 200 sends the BIM model to the terminal obtaining the access right for display.

Step S102, receiving an internal defect mark sent by a first terminal; wherein the internal defect mark is a mark of an internal defect existing in a member of the BIM model by the first terminal.

This step is mainly that the server 200 receives an internal defect flag sent by the first terminal 110, where the internal defect flag is a flag of the first terminal 110 on an internal defect existing on a member of the BIM model. Specifically, after obtaining the BIM model, the first terminal 110 may mark internal defects existing on each member of the BIM model, where the internal defects are defects existing inside the member, such as defects existing on the inner surface of a pipe member, defects existing inside a wall body, and the like, and the internal defects are usually not visually seen on the surface of the member, so when marking the internal defects, it is usually necessary to view the cross section of each member of the BIM model in the form of a member cross-sectional view, so that when there are internal defects at corresponding positions of the member cross section, the internal defects can be marked on the member cross section. The first terminal 110 may obtain a marking operation performed by a user on an internal defect existing on a component of the BIM model, where the marking operation may be an operation of adding a defect label to a defect position on a cross section of a corresponding component, where the defect label may facilitate the user to label the defect position inside the component, and then the first terminal 110 may generate an internal defect mark according to the marking operation, where the internal defect mark may record a position coordinate of the internal defect existing in a certain component of the BIM model, so as to mark a specific position of the internal defect existing on the corresponding component of the BIM model.

Step S103, the internal defect mark is sent to the second terminal.

In this step, the server 200 may send the internal defect flag sent by the first terminal 110 to the second terminal 120 in the form of an access link, and wait for an access request generated by a triggering operation of the internal defect flag by the second terminal 120.

And step S104, if an access request of the second terminal to the internal defect mark is received, sending the BIM model to the second terminal for displaying, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component.

After the second terminal 120 receives the internal defect mark sent by the server 200, the second terminal 120 may trigger the internal defect mark and generate a corresponding access request, where the access request is used for the second terminal 120 to access the internal defect existing on the component of the BIM model, the access request is sent to the server 200 by the second terminal 120, the server 200 may wait for the second terminal 120 to feed back the access request for the internal defect after sending the internal defect mark to the second terminal 120, and if the server 200 receives the access request, the BIM model is sent to the second terminal 120 to be displayed, and meanwhile, the cross section of the component where the internal defect is located is highlighted, and the internal defect mark is located at the defect position of the cross section of the component, where the manner of highlighting the cross section of the component where the internal defect is located may be to enlarge the cross section of the component, and the enlarged member section is displayed on the second terminal 120 by a separate display page, or the member section is filled with a special color, so that the member section is different from other members of the BIM model, and a highlighted effect is achieved, so that the effect of internal defects can be clearly displayed on the basis of quickly positioning the defect position inside the corresponding member on the second terminal 120, and the efficiency of positioning the defects of the BIM model is improved.

According to the BIM model-based defect positioning method, the server sends the BIM model to be marked to the first terminal for displaying, the first terminal sends the internal defect mark to the server, the internal defect mark marks the internal defect existing on the member of the BIM model, the server receives the internal defect mark and sends the internal defect mark to the second terminal, if the server receives an access request of the second terminal to the internal defect mark, the BIM model is sent to the second terminal for displaying, the section of the member where the internal defect is located is highlighted, and the internal defect mark is positioned at the defect position of the section of the member. This scheme can utilize the server to send the internal defect mark that first terminal produced to the second terminal for when this internal defect mark was visited to the second terminal, the server can send the BIM model to this second terminal and show, the component cross-section at this internal defect place of simultaneous highlighting, and with the defect position department of internal defect mark location at this component cross-section, reach the effect of locating the internal defect of BIM model fast and highlighting, improve the efficiency of fixing a position the defect of BIM model.

While the first terminal 110 marks the internal defect of the BIM model component, the first terminal may also annotate and capture the internal defect, and the server 200 may send the annotation and capture to the second terminal 120, so that the second terminal 120 can obtain more detailed related information of the internal defect, for this reason, in an embodiment, the method for locating the defect based on the BIM model may further include the following steps:

receiving annotation content and a defect screenshot sent by a first terminal; the annotation content is content of annotating internal defects existing on a member of the BIM by the first terminal, and the defect screenshot is an image of the internal defects intercepted by the first terminal; and then, adding the annotation content to the defect screenshot to generate a defect detail graph, and sending the internal defect mark to the second terminal and sending the defect detail graph to the second terminal in a thumbnail mode.

In this embodiment, the first terminal 110 may display the BIM model sent by the server 200, and after generating a corresponding internal defect mark for an internal defect of a component, obtain annotation content annotated by a user for the internal defect, where the annotation content may be text content such as description information and a defect repair suggestion for the internal defect, and the first terminal 110 may also perform screenshot processing for the internal defect, and the screenshot of the internal defect is mainly performed to obtain an image of the internal defect, but if the entire BIM model is screenshot, an image is too large and the internal defect is not sufficiently prominent, so the first terminal 110 may only capture the image of the internal defect to obtain a defect screenshot of the internal defect. Then, the first terminal 110 sends the annotation content and the defect screenshot to the server 200, and after obtaining the annotation content and the defect screenshot, the server 200 adds the annotation content to the defect screenshot to form a defect detail map, so that the defect detail map has both an image of the internal defect and related text content describing the internal defect. Then, the server 200 may transmit the defect detail map to the second terminal 120 while transmitting the internal defect flag to the second terminal 120, so that the second terminal 120 can obtain the text description information and the image of the internal defect through the defect detail map, and in order to reduce the pressure of data transmission, the server 200 may transmit the defect detail map to the second terminal 120 in the form of a thumbnail, which can facilitate the second terminal 120 to subsequently repair the internal defect of the component based on the text description information and the image, and thus, the BIM model can be better perfected.

After the server 200 locates the internal defect mark on the BIM model displayed on the second terminal 120 to the defect position of the cross section of the corresponding component, the second terminal 120 may repair the internal defect of the component, the second terminal 120 may generate a defect repair mark corresponding to the internal defect mark and send the defect repair mark to the first terminal 110 through the server 200, and the first terminal 110 may determine whether to eliminate the internal defect mark generated by the first terminal 110 based on the defect repair mark, thereby being capable of ensuring that a BIM model with better quality is effectively constructed through cooperation of multiple parties on the basis of accurately locating the internal defect. Based on this, in one embodiment, after the steps of sending the BIM model to the second terminal for displaying, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component, the method may further include the following steps:

acquiring a defect repair mark corresponding to the internal defect mark generated by the second terminal; sending the defect repair mark to a first terminal; and if a defect elimination request sent by the first terminal is received, generating a defect elimination instruction, and respectively sending the defect elimination instruction to the first terminal and the second terminal so as to eliminate the internal defect mark by the first terminal and the second terminal.

In this embodiment, the second terminal 120 may repair the internal defect of the corresponding component on the BIM model, and the second terminal 120 may generate a corresponding defect repair mark according to the repair state of the internal defect, for example, different color defect repair marks are used to indicate different repair states, and the defect repair mark corresponds to the internal defect mark sent by the server 200, so that the mark can be used to identify the internal defect repaired by the second terminal 120. The second terminal 120 may then send the bug fix mark to the server 200, and the server 200 may forward the bug fix mark to the first terminal 110. After obtaining the defect repair mark, the first terminal 110 can obtain a repair state of the internal defect according to the defect repair mark, where the repair state may be a state of completing repair, not completing repair, or the like, and may further include a state of progress of repairing the internal defect, or the like. If the first terminal 110 obtains that the repair state is complete, the first terminal 110 generates a defect elimination request for requesting the server 200 to eliminate the corresponding internal defect mark, where the defect elimination request is sent to the server 200 by the first terminal 110, the server 200 generates a defect elimination instruction according to the defect elimination request, and sends the defect elimination instruction to the first terminal 110 and the second terminal 120 at the same time, and the defect elimination instruction can enable the first terminal 110 and the second terminal 120 to synchronously eliminate the corresponding internal defect mark. In this embodiment, only the terminal that generates the internal defect mark can initiate the request for removing the internal defect mark, and the first terminal 110 is used as the generator of the internal defect mark, and when the first terminal 110 determines that the corresponding internal defect has been repaired based on the defect repair mark, the first terminal requests the server 200 to remove the internal defect mark on the first terminal 110 and the second terminal 120, so as to effectively construct the BIM model with better quality on the basis of accurately positioning the internal defect of the component of the BIM model.

In an embodiment, a defect locating method based on a BIM model is further provided, referring to fig. 3, fig. 3 is a schematic flowchart of a defect locating method based on a BIM model in another embodiment, and the method may be applied to the first terminal 110 shown in fig. 1, and the defect locating method based on a BIM model may include the following steps:

and step S401, displaying the BIM to be marked sent by the server.

In this step, the first terminal 110 may display the BIM model to be marked sent by the server 200. After receiving the model access request sent by the first terminal 110, the server 200 may obtain the BIM model to be marked according to the model access request and send the BIM model to the first terminal 110, and the first terminal 110 may display the BIM model to be marked on line through a webpage. A plurality of BIM models may be stored in advance in the server 200, and the first terminal 110 may access the BIM models and mark defects of the BIM models.

Step S402, receiving a marking operation for the internal defect existing in the member of the BIM model, and generating an internal defect mark according to the marking operation.

The step is mainly that the first terminal 110 can mark internal defects existing on each component of the BIM model after obtaining the BIM model. The internal defects refer to defects existing inside the member, such as defects existing on the inner surface of a pipeline member, defects existing inside a wall body and the like, and the internal defects cannot be visually seen on the surface of the member, so that when the internal defects are marked, the cross sections of all members of the BIM model are generally required to be viewed in the form of a member cross section, so that when the internal defects exist on the corresponding positions of the member cross sections, the internal defects can be marked on the member cross sections. The first terminal 110 may obtain a marking operation performed by a user on an internal defect existing on a component of the BIM model, where the marking operation may be an operation of adding a defect label to a defect position on a cross section of a corresponding component, where the defect label may facilitate the user to label the defect position inside the component, and then the first terminal 110 may generate an internal defect mark according to the marking operation, where the internal defect mark may record a position coordinate of the internal defect existing in a certain component of the BIM model, so as to mark a specific position of the internal defect existing on the corresponding component of the BIM model.

And S403, sending the internal defect mark to a server for triggering the server to send the internal defect mark to a second terminal, and if the server receives an access request of the second terminal to the internal defect mark, sending the BIM model to the second terminal by the server for displaying, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component.

In this step, the first terminal 110 sends the internal defect flag to the server 200, and after receiving the internal defect flag, the server 200 may send the internal defect flag sent by the first terminal 110 to the second terminal 120 in the form of an access link and wait for an access request generated by a trigger operation of the second terminal 120 on the internal defect flag.

After the second terminal 120 receives the internal defect mark sent by the server 200, the second terminal 120 may trigger the internal defect mark and generate a corresponding access request, where the access request is used for the second terminal 120 to access the internal defect existing on the component of the BIM model, and the access request is sent to the server 200 by the second terminal 120, and when the server 200 receives the access request, the BIM model may be sent to the second terminal 120 to be displayed, and the component section where the internal defect is located is highlighted, and the internal defect mark is located at the defect position of the component section, where the manner of highlighting the component section where the internal defect is located may be to enlarge the component section and display the enlarged component section on the second terminal 120 in a separate display page, or to fill the component section with a special color, so that the cross section of the member is different from other members of the BIM model, the effect of highlighting is achieved, the effect of internal defects can be clearly displayed on the basis of quickly positioning the defect positions inside the corresponding members on the second terminal 120, and the efficiency of positioning the defects of the BIM model is improved.

According to the BIM model-based defect positioning method, the server can be used for sending the internal defect mark generated by the first terminal to the second terminal, so that when the second terminal accesses the internal defect mark, the server can send the BIM model to the second terminal to display, meanwhile, the cross section of the component where the internal defect is located is highlighted, the internal defect mark is positioned at the defect position of the cross section of the component, the effects of quickly positioning and highlighting the internal defect of the BIM model are achieved, and the efficiency of positioning the defect of the BIM model is improved.

In one embodiment, after the step of presenting the BIM model to be tagged sent by the server, the method may further include:

the method comprises the steps that a first terminal obtains annotation content; the annotation content is the content for annotating the internal defects existing on the member of the BIM model; a first terminal acquires a defect screenshot; the defect screenshot is an image obtained by image capture of an internal defect; and when the internal defect mark is sent to the server, the first terminal sends the annotation content and the defect screenshot to the server for triggering the server to add the annotation content to the defect screenshot to generate a defect detail drawing, and when the internal defect mark is sent to the second terminal, the defect detail drawing is sent to the second terminal in a thumbnail mode.

In one embodiment, after the step of sending the internal defect flag to the server, the following steps may be further included:

the first terminal receives a defect repair mark sent by the server; the defect repair mark is a defect repair mark generated by the second terminal and corresponding to the internal defect mark; the first terminal determines the repair state of the internal defect according to the defect repair mark; if the repair state is finished, the first terminal generates a defect elimination request and sends the server to enable the server to generate a defect elimination instruction; the first terminal receives a defect elimination instruction sent by the server and eliminates an internal defect mark according to the defect elimination instruction; and the server is also used for sending a defect elimination instruction to the second terminal so as to enable the second terminal to eliminate the internal defect mark.

In an embodiment, a defect locator based on a BIM model is provided, and referring to fig. 4, fig. 4 is a block diagram illustrating a structure of the defect locator based on the BIM model in an embodiment, the defect locator based on the BIM model may include:

the model sending module 101 is used for sending the BIM model to be marked to a first terminal for displaying;

a mark receiving module 102, configured to receive an internal defect mark sent by a first terminal; marking internal defects by the first terminal on internal defects existing in the member of the BIM model;

a mark sending module 103, configured to send the internal defect mark to the second terminal;

and the first positioning module 104 is configured to, if an access request of the second terminal to the internal defect mark is received, send the BIM model to the second terminal for displaying, highlight the cross section of the component where the internal defect is located, and position the internal defect mark at a defect position of the cross section of the component.

In one embodiment, the method may further include:

the first defect detail sending module is used for receiving the annotation content and the defect screenshot sent by the first terminal; the annotation content is the content of the first terminal annotating the internal defects on the member of the BIM model; the defect screenshot is an image of an internal defect captured by the first terminal; adding the annotation content to the defect screenshot to generate a defect detail graph; and simultaneously sending the internal defect mark to the second terminal, sending the defect detail map to the second terminal in a thumbnail form.

In one embodiment, the method may further include:

the first defect mark eliminating module is used for acquiring a defect repairing mark which is generated by the second terminal and corresponds to the internal defect mark; sending the defect repair mark to a first terminal; and if a defect elimination request sent by the first terminal is received, generating a defect elimination instruction, and respectively sending the defect elimination instruction to the first terminal and the second terminal so as to eliminate the internal defect mark by the first terminal and the second terminal.

In an embodiment, a defect locator based on a BIM model is further provided, referring to fig. 5, fig. 5 is a block diagram of a structure of a defect locator based on a BIM model in another embodiment, and the defect locator based on a BIM model may include:

the model display module 401 is used for displaying the BIM model to be marked sent by the server;

a marking generation module 402, configured to receive a marking operation performed on an internal defect existing in a component of the BIM model, and generate an internal defect mark according to the marking operation;

and a second positioning module 403, configured to send the internal defect mark to the server, configured to trigger the server to send the internal defect mark to the second terminal, and if the server receives an access request from the second terminal to the internal defect mark, the server sends the BIM model to the second terminal for displaying, and highlights a cross section of the component where the internal defect is located, and positions the internal defect mark at a defect position of the cross section of the component.

In one embodiment, the method may further include:

the second defect detail sending module is used for acquiring annotation content; the annotation content is the content for annotating the internal defects existing on the component of the BIM model; acquiring a defect screenshot; the defect screenshot is an image obtained by image capture of the internal defect; and sending the internal defect mark to the server, sending the annotation content and the defect screenshot to the server for triggering the server to add the annotation content to the defect screenshot to generate a defect detail drawing, and sending the internal defect mark to the second terminal and sending the defect detail drawing to the second terminal in a thumbnail mode.

In one embodiment, the method may further include:

the second defect mark eliminating module is used for acquiring annotation content; the annotation content is the content for annotating the internal defects existing on the component of the BIM model; acquiring a defect screenshot; the defect screenshot is an image obtained by image capture of the internal defect; and sending the internal defect mark to the server, sending the annotation content and the defect screenshot to the server, triggering the server to add the annotation content to the defect screenshot, generating a defect detail drawing, and sending the internal defect mark to the second terminal and sending the defect detail drawing to the second terminal in a thumbnail mode.

The defect locating device based on the BIM model of the present invention corresponds to the defect locating method based on the BIM model of the present invention one to one, and for the specific limitation of the defect locating device based on the BIM model, reference may be made to the above limitation of the defect locating method based on the BIM model, and the technical features and the advantages thereof described in the above embodiment of the defect locating method based on the BIM model are all applicable to the embodiment of the defect locating device based on the BIM model, and are not described herein again. The modules in the defect locating device based on the BIM model can be wholly or partially realized by software, hardware and a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.

In one embodiment, a computer device is provided, the computer device may be a server, the internal structure of which may be as shown in fig. 6, fig. 6 is an internal structure of the computer device in one embodiment. The computer device includes a processor, a memory, a network interface, and a database connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The database of the computer device may be used to store data such as the BIM model. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement a BIM model-based defect localization method.

In one embodiment, a computer device is provided, the computer device may be a terminal, the internal structure of which may be as shown in fig. 7, and fig. 7 is an internal structure of the computer device in another embodiment. The computer device includes a processor, a memory, a network interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement a BIM model-based defect localization method. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on the shell of the computer equipment, an external keyboard, a touch pad or a mouse and the like.

It will be appreciated by those skilled in the art that the configurations shown in fig. 6 and 7 are only block diagrams of some of the configurations relevant to the inventive arrangements, and do not constitute a limitation on the computing devices to which the inventive arrangements may be applied, and that a particular computing device may include more or less components than those shown, or some of the components may be combined, or have a different arrangement of components.

In one embodiment, a computer device is provided, which includes a processor and a memory, where the memory stores a computer program, and the processor implements the method for locating defects based on a BIM model as described in any one of the above embodiments when executing the computer program.

In one embodiment, there is provided a computer device comprising a processor and a memory, the memory storing a computer program which when executed by the processor performs the steps of:

sending the BIM model to be marked to a first terminal for displaying; receiving an internal defect mark sent by a first terminal; marking internal defects by the first terminal on internal defects existing in the member of the BIM model; sending the internal defect mark to a second terminal; and if an access request of the second terminal to the internal defect mark is received, sending the BIM model to the second terminal for displaying, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component.

In one embodiment, the processor, when executing the computer program, further performs the steps of:

receiving annotation content and a defect screenshot sent by a first terminal; the annotation content is the content of the first terminal annotating the internal defects on the member of the BIM model; the defect screenshot is an image of an internal defect captured by the first terminal; adding the annotation content to the defect screenshot to generate a defect detail graph; and simultaneously sending the internal defect mark to the second terminal, sending the defect detail map to the second terminal in a thumbnail form.

displaying the BIM model to be marked sent by the server; receiving marking operation of internal defects existing in the member of the BIM model, and generating an internal defect mark according to the marking operation; and sending the internal defect mark to a server for triggering the server to send the internal defect mark to a second terminal, if the server receives an access request of the second terminal to the internal defect mark, sending the BIM model to the second terminal by the server for displaying, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component.

acquiring annotation content; the annotation content is the content for annotating the internal defects existing on the component of the BIM model; acquiring a defect screenshot; the defect screenshot is an image obtained by image capture of the internal defect; and sending the internal defect mark to the server, sending the annotation content and the defect screenshot to the server for triggering the server to add the annotation content to the defect screenshot to generate a defect detail drawing, and sending the internal defect mark to the second terminal and sending the defect detail drawing to the second terminal in a thumbnail mode.

receiving a defect repair mark sent by a server; the defect repair mark is a defect repair mark generated by the second terminal and corresponding to the internal defect mark; determining the repair state of the internal defect according to the defect repair mark; if the repair state is finished, generating a defect elimination request and sending the server to enable the server to generate a defect elimination instruction; receiving a defect elimination instruction sent by a server, and eliminating an internal defect mark according to the defect elimination instruction; the server is also used for sending a defect elimination instruction to the second terminal so that the second terminal eliminates the internal defect mark.

Above-mentioned computer equipment, through the computer program that runs on the treater, can utilize the server to send the internal defect mark that first terminal produced to the second terminal for when this internal defect mark was visited to the second terminal, the server can send this second terminal with the BIM model and show, the member cross-section that this internal defect place is highlighted simultaneously, and with internal defect mark location in the defect position department of this member cross-section, reach the effect of locating the internal defect of BIM model fast and highlighting, improve the efficiency of fixing a position the defect of BIM model.

It will be understood by those skilled in the art that all or part of the processes of implementing the BIM model-based defect localization method according to any of the above embodiments may be implemented by a computer program, which can be stored in a non-volatile computer-readable storage medium, to instruct related hardware, and when executed, the computer program may include the processes of the above embodiments of the methods. Any reference to memory, storage, databases, or other media used in embodiments provided herein may include non-volatile and/or volatile memory. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

Accordingly, in an embodiment, a computer-readable storage medium is also provided, on which a computer program is stored, wherein the program, when executed by a processor, implements the method for defect localization based on BIM model as described in any one of the above embodiments.

In one embodiment, a computer-readable storage medium is provided, having a computer program stored thereon, which when executed by a processor, performs the steps of:

In one embodiment, the computer program when executed by the processor further performs the steps of:

According to the computer readable storage medium, the internal defect mark generated by the first terminal can be sent to the second terminal by the server through the stored computer program, so that when the second terminal accesses the internal defect mark, the server can send the BIM model to the second terminal to display, meanwhile, the cross section of the component where the internal defect is located is highlighted, the internal defect mark is positioned at the defect position of the cross section of the component, the effects of quickly positioning and highlighting the internal defect of the BIM model are achieved, and the efficiency of positioning the defect of the BIM model is improved.

The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims

1. A BIM model-based defect positioning method is characterized by comprising the following steps:

sending the BIM model to be marked to a first terminal for displaying;

receiving an internal defect mark sent by the first terminal; the internal defect mark is used for marking internal defects existing in the member of the BIM by the first terminal; the internal defects are model defects existing inside the members of the BIM model;

sending the internal defect mark to a second terminal;

if an access request of the second terminal to the internal defect mark is received, sending the BIM model to the second terminal for displaying, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component; and the second terminal is used for repairing the internal defects of the BIM.

2. The BIM model-based defect localization method according to claim 1, further comprising the steps of:

receiving annotation content and a defect screenshot sent by the first terminal; the annotation content is the content of annotating the internal defects existing on the member of the BIM by the first terminal; the defect screenshot is an image of the internal defect captured by the first terminal;

adding the annotation content to the defect screenshot to generate a defect detail graph;

and sending the internal defect mark to the second terminal, and sending the defect detail map to the second terminal in a thumbnail mode.

3. The BIM-model-based defect positioning method according to claim 1, wherein after the steps of sending the BIM model to the second terminal for displaying, highlighting the cross section of the member where the internal defect is located, and positioning the internal defect mark at the defect position of the cross section of the member, the method further comprises:

acquiring a defect repair mark corresponding to the internal defect mark generated by the second terminal;

sending the defect repair mark to the first terminal;

and if a defect elimination request sent by the first terminal is received, generating a defect elimination instruction, and respectively sending the defect elimination instruction to the first terminal and the second terminal so as to eliminate the internal defect mark by the first terminal and the second terminal.

4. A BIM model-based defect positioning method is characterized by comprising the following steps:

displaying the BIM model to be marked sent by the server;

receiving marking operation of internal defects existing in the components of the BIM model, and generating internal defect marks according to the marking operation; the internal defects are model defects existing inside the members of the BIM model;

sending the internal defect mark to the server for triggering the server to send the internal defect mark to a second terminal, if the server receives an access request of the second terminal to the internal defect mark, sending the BIM model to the second terminal by the server for displaying, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component; and the second terminal is used for repairing the internal defects of the BIM.

5. The BIM-model-based defect positioning method according to claim 4, further comprising, after the step of presenting the BIM model to be marked sent by the server:

acquiring annotation content; the annotation content is the content for annotating the internal defects existing on the member of the BIM model;

acquiring a defect screenshot; the defect screenshot is an image obtained by image capture of the internal defect;

and sending the annotation content and the defect screenshot to the server while sending the internal defect mark to the server, and triggering the server to add the annotation content to the defect screenshot to generate a defect detail drawing, and sending the defect detail drawing to the second terminal in a thumbnail form while sending the internal defect mark to the second terminal.

6. The BIM model-based defect localization method according to claim 4, further comprising, after the step of sending the internal defect label to the server:

receiving a defect repair mark sent by the server; the defect repair mark is a defect repair mark generated by the second terminal and corresponding to the internal defect mark;

determining the repair state of the internal defect according to the defect repair mark;

if the repair state is finished, generating a defect elimination request and sending the server to enable the server to generate a defect elimination instruction;

receiving a defect eliminating instruction sent by the server, and eliminating the internal defect mark according to the defect eliminating instruction; the server is further used for sending the defect eliminating instruction to the second terminal so that the second terminal can eliminate the internal defect mark.

7. A BIM model-based defect localization apparatus, comprising:

the mark receiving module is used for receiving the internal defect mark sent by the first terminal; the internal defect mark is used for marking internal defects existing in the member of the BIM by the first terminal; the internal defects are model defects existing inside the members of the BIM model;

the first positioning module is used for sending the BIM model to the second terminal for displaying if an access request of the second terminal to the internal defect mark is received, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component; and the second terminal is used for repairing the internal defects of the BIM.

8. A BIM model-based defect localization apparatus, comprising:

the marking generation module is used for receiving marking operation on internal defects existing in the components of the BIM model and generating internal defect marks according to the marking operation; the internal defects are model defects existing inside the members of the BIM model;

the second positioning module is used for sending the internal defect mark to the server, triggering the server to send the internal defect mark to a second terminal, and if the server receives an access request of the second terminal to the internal defect mark, sending the BIM model to the second terminal by the server for displaying, highlighting the section of the component where the internal defect is located, and positioning the internal defect mark at the defect position of the section of the component; and the second terminal is used for repairing the internal defects of the BIM.

9. A computer device comprising a processor and a memory, said memory storing a computer program, characterized in that said processor, when executing said computer program, implements the steps of the method according to any of claims 1 to 6.

10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 6.