CN110333438B - Data processing apparatus, data processing method, and readable storage medium - Google Patents
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Abstract
The invention discloses a data processing method, which comprises the following steps: reading a test file related to the test of the piece to be tested; extracting a first scattering parameter file of the to-be-tested part and a second scattering parameter file of the calibration part from the test file according to a preset file identifier; performing de-embedding processing on the scattering parameters in the first scattering parameter file by using the second scattering parameter file to obtain target scattering parameters; and outputting the target scattering parameters. The invention also discloses a data processing device and a readable storage medium. The invention aims to improve the efficiency and the accuracy of the batch de-embedding processing of scattering parameters of electric devices.
Description
Technical Field
The present invention relates to the field of data processing technologies, and in particular, to a data processing method, a data processing apparatus, and a readable storage medium.
Background
At present, in the test of high-speed digital circuits, many tested pieces do not have coaxial connectors, and the tested pieces can be tested in a coaxial environment only by connecting the tested pieces with coaxial cables through a test fixture. But to obtain the real characteristics of the measured piece, the clamp effect must be accurately removed.
At present, an Automatic Fixture Removal option technology (AFR) is generally adopted to remove Fixture effects in a non-coaxial device measurement environment, but when the AFR technology is used for processing test data of a tested device, a corresponding scattering parameter file and a corresponding calibration parameter file need to be manually selected, and then data processed by the AFR is obtained, the obtained processing data volume is large, only a corresponding map is directly generated and output, and the processed data can be output only through manual operation.
The above is only for the purpose of assisting understanding of the technical aspects of the present invention, and does not represent an admission that the above is prior art.
Disclosure of Invention
The invention mainly aims to provide a data processing method, aiming at improving the efficiency and the accuracy of batch de-embedding processing of scattering parameters of electric devices.
In order to achieve the above object, the present invention provides a data processing method, including the steps of:
reading a test file related to the test of the piece to be tested;
extracting a first scattering parameter file of the to-be-tested part and a second scattering parameter file of the calibration part from the test file according to a preset file identifier;
performing de-embedding processing on the scattering parameters in the first scattering parameter file by using the second scattering parameter file to obtain target scattering parameters;
and outputting the target scattering parameters.
Optionally, the step of performing de-embedding processing on the scattering parameters in the first scattering parameter file by using the second scattering parameter file includes:
extracting a first scattering parameter of an input clamp and a second scattering parameter of an output clamp in the second scattering parameter file to serve as calibration parameters;
and performing de-embedding processing on the scattering parameters in the first scattering parameter file by using the calibration parameters.
Optionally, the calibration piece is a double-pass calibration piece, and the step of extracting the first scattering parameter of the input jig and the second scattering parameter of the output jig from the second scattering parameter file as calibration parameters includes:
extracting a scattering parameter file based on differential two-port network detection in the second scattering parameter file to serve as a calibration file;
and analyzing the calibration file to generate the first scattering parameter and the second scattering parameter as the calibration parameters.
Optionally, before the step of analyzing the calibration file to generate the first scattering parameter and the second scattering parameter as the calibration parameters, the method further includes:
and closing the numerical normalization function of the first scattering parameter and the second scattering parameter, and closing the bandwidth limiting function of the first scattering parameter and the second scattering parameter.
Optionally, the step of performing de-embedding processing on the scattering parameters in the first scattering parameter file by using the calibration parameters includes:
converting the scattering parameters in the first scattering parameter file into frequency domain differential data;
identifying a scattering parameter corresponding to the input clamp in the frequency domain differential data as first data, and identifying a scattering parameter corresponding to the output clamp in the frequency domain differential data as second data;
removing the first scattering parameter from the first data and removing the second scattering parameter from the second data.
Optionally, the step of outputting the target scattering parameter includes:
acquiring a preset frequency point;
extracting scattering parameters corresponding to the preset frequency points from the target scattering parameters to serve as target output data;
and outputting the target output data.
Optionally, the step of outputting the target output data includes:
saving the target output data to a text file;
after the step of saving the target output data to a text file, the method further comprises:
and importing the target output data in the text file into the electronic form by adopting a macro.
Optionally, the step of reading the test file related to the test of the device under test includes:
acquiring a preset storage path corresponding to the piece to be detected;
and accessing the preset storage path and reading the test file.
In addition, in order to achieve the above object, the present application also proposes a data processing apparatus comprising: memory, a processor and a data processing program stored on the memory and executable on the processor, the data processing program, when executed by the processor, implementing the steps of the data processing method as claimed in any one of the above.
In addition, in order to achieve the above object, the present application also proposes a readable storage medium having stored thereon a data processing program which, when executed by a processor, implements the steps of the data processing method as described in any one of the above.
The data processing method provided by the embodiment of the invention extracts the first scattering parameter file of the to-be-detected piece and the second scattering parameter file of the calibration piece based on the preset file identification in the test file related to the to-be-detected piece, does not need a user to manually select the required scattering parameter file, outputs the processed scattering parameters without manual operation after the second scattering parameter file is adopted to perform de-embedding processing on the scattering parameters in the first scattering parameter file, so that the user can perform further data processing.
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FIG. 1 is a diagram of a hardware configuration of an embodiment of a data processing apparatus according to the present invention;
FIG. 2 is a flowchart illustrating a data processing method according to a first embodiment of the present invention;
FIG. 3 is a flowchart illustrating a data processing method according to a second embodiment of the present invention;
FIG. 4 is a flowchart illustrating a data processing method according to a third embodiment of the present invention;
FIG. 5 is a flowchart illustrating a data processing method according to a fourth embodiment of the present invention;
fig. 6 is a flowchart illustrating a fifth embodiment of the data processing method according to the present invention.
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The main solution of the embodiment of the invention is as follows: reading a test file related to the test of the piece to be tested; extracting a first scattering parameter file of the to-be-tested part and a second scattering parameter file of the calibration part from the test file according to a preset file identifier; performing de-embedding processing on the scattering parameters in the first scattering parameter file by using the second scattering parameter file to obtain target scattering parameters; and outputting the target scattering parameters.
Because the scattering parameters are subjected to de-embedding processing by applying the AFR technology in the prior art, errors are easy to occur and the efficiency is low based on manual operation.
The invention provides the solution, and aims to improve the efficiency and accuracy of batch de-embedding processing of scattering parameters.
The invention provides a data processing device which is based on an AFR data processing technology and can be applied to the circuit board signal data processing of communication products such as microwave products and high-frequency telling products and the like and the signal data processing related to the signal integrity.
In an embodiment of the present invention, referring to fig. 1, a data processing apparatus includes: a processor 1001, such as a CPU, memory 1002, or the like. The memory 1002 may be a high-speed RAM memory or a non-volatile memory (e.g., a disk memory). The memory 1002 may alternatively be a storage device separate from the processor 1001.
Those skilled in the art will appreciate that the configuration of the device shown in fig. 1 is not intended to be limiting of the device and may include more or fewer components than those shown, or some components may be combined, or a different arrangement of components.
The processor 1001 is communicatively coupled to the memory 1002. As shown in fig. 1, a data processing program may be included in the memory 1002, which is a readable storage medium. In the apparatus shown in fig. 1, the processor 1001 may be configured to call a data processing program stored in the memory 1002, specifically, may execute the data processing program defined by a programmable instrument standard command by using an external interface function of a Physical Layer Test System (PLTS), and perform the operations of the steps related to the data processing method in the following embodiments.
The invention also provides a data processing method.
Referring to fig. 2, a first embodiment of the data processing method of the present invention is proposed, and in the first embodiment, the data processing method includes:
step S10, reading a test file related to the test of the piece to be tested;
the piece to be tested can specifically comprise a circuit board of a microblog product, a high-frequency high-speed communication product and the like. The test files related to the test of the to-be-tested piece comprise all files generated in the process of testing the to-be-tested piece by adopting the vector network analyzer, parameter files of the calibration piece corresponding to the used test fixture and the like, and generally a plurality of test files are provided.
Before step S10, after the test fixtures (input fixture and output fixture) of the vector network analyzer are respectively connected to the input end and the output end of the to-be-tested object, the to-be-tested object is tested and the test file is generated. The obtained test file can be stored in a preset storage path, the preset storage path is a local control address of the physical layer test system software, can be set by a user, can also be set by default of the system, and can also be automatically generated by the system according to the test time, the test number and the like of the to-be-tested piece.
Step S10 may specifically include acquiring a preset storage path corresponding to the to-be-detected piece; and accessing the preset storage path and reading the test file.
Step S20, extracting a first scattering parameter file of the piece to be tested and a second scattering parameter file of the calibration piece from the test file according to a preset file identifier;
the type of the preset file identifier specifically includes a file name, file generation time, file attributes, and/or the like. The preset file identifier may specifically include a first file identifier and a second file identifier, and the first scattering parameter file is extracted according to the first file identifier, and the second scattering parameter file is extracted according to the second file identifier. The preset file identification can be determined by acquiring a file naming rule in the vector network analyzer.
The first scattering parameter file is generated by measuring scattering parameters of the piece to be tested at different frequency points by using a network analyzer, wherein the network analyzer is connected with the piece to be tested by using a test fixture; and the second scattering parameter file is a file generated by directly connecting the test fixture to form a calibration piece and measuring the scattering parameters of the calibration piece at different frequency points by using a network analyzer.
For example, if the first file is identified as the file name "D _ DUT" and the second file is identified as the file name "T _ Fix", file name identification may be performed on all the detection files, and a file with the file name "D _ DUT" in the detection files is used as the first scattering parameter file, and a file with the file name "T _ Fix" in the detection files is used as the second scattering parameter file.
Step S30, the second scattering parameter file is adopted to carry out de-embedding processing on the scattering parameters in the first scattering parameter file to obtain target scattering parameters;
and extracting the scattering parameters of the direct connection calibration piece in the second scattering parameter file as calibration parameters, performing de-embedding processing on the scattering parameters in the first scattering parameter file by using the calibration parameters, and taking the processed scattering parameters as target scattering parameters.
The de-embedding process is a data processing process for removing errors brought by the measuring clamp in the test parameters of the to-be-tested piece.
Specifically, step S20 may include: step S21, extracting a first scattering parameter of the input fixture and a second scattering parameter of the output fixture in the second scattering parameter file as calibration parameters; and step S22, performing de-embedding processing on the scattering parameters in the first scattering parameter file by using the calibration parameters. The second scattering parameter file comprises a first scattering parameter corresponding to an input clamp in the calibration piece in the through detection and a second scattering parameter corresponding to an output clamp in the calibration piece in the through detection, and the second scattering parameter file is split to obtain the first scattering parameter of the input clamp and the second scattering parameter of the output clamp. And performing de-embedding processing on the scattering parameters in the first scattering parameter file according to the calibration parameters, and filtering the scattering parameters corresponding to the input clamp and the output clamp in the scattering parameters of the first scattering parameter file.
And step S40, outputting the target scattering parameters.
Specifically, the processed scattering parameters may be output in a text format. For example, all or selected portions of the scattering parameters after de-embedding may be saved to a text file, such as a TXT file.
The data processing method provided by the embodiment of the invention extracts the first scattering parameter file of the to-be-detected piece and the second scattering parameter file of the calibration piece based on the preset file identification in the test file related to the to-be-detected piece, does not need a user to manually select the required scattering parameter file, outputs the processed scattering parameters without manual operation after the second scattering parameter file is adopted to perform de-embedding processing on the scattering parameters in the first scattering parameter file, so that the user can perform further data processing.
Further, based on the first embodiment, a second embodiment of the data processing method is provided. In a second embodiment, the alignment member may be a double straight alignment member, which is a straight structure twice the length of the single-sided clamp. Based on the double pass calibration piece, referring to fig. 3, the step S21 includes:
step S211, extracting a scattering parameter file based on the differential two-port network detection in the second scattering parameter file as a calibration file;
in the process of detecting the to-be-detected part and the calibration part, the vector network analyzer can adopt a single-port network, a dual-port network or a multi-port network and the like to detect the to-be-detected part and the calibration part so as to obtain data of different port types. In the detection process, a differential mode with four ports can be adopted to detect the to-be-detected part and the calibration part, a differential port network is formed by the differential mode with the four ports, two ports form a differential port 1, the other two ports form a differential port 2, the input clamp and the output clamp respectively correspond to one differential port, and each differential port can have 4 signals. In the process of measuring the to-be-measured part and the calibration part based on the differential two-port network, a corresponding scattering matrix can be generated according to signals of all ports in different frequency points and stored in a corresponding scattering parameter file.
The file suffix name of the scattering parameter file generated based on the differential two-port network may be specifically ". s4p '", and the file with the suffix name of ". s4 p'" may be used as the calibration file by identifying the file suffix names of all files in the second scattering parameter file.
Step S212, analyzing the calibration file, and generating the first scattering parameter and the second scattering parameter as the calibration parameter.
And splitting the calibration file to form an input fixture parameter file in which the first scattering parameters are stored, and to form an output fixture parameter file in which the second scattering parameters are stored.
In this embodiment, the two-time direct connection calibration component and the differential two-port network are combined to process the scattering parameters of the to-be-detected component, and the data detected by the differential two-port network is more comprehensive and accurate than the data detected by a general two-port network, so that the scattering parameters can more comprehensively and intuitively reflect the performance of the to-be-detected component.
Further, in the second embodiment, step S212 may be preceded by: and closing the numerical normalization function of the first scattering parameter and the second scattering parameter, and closing the bandwidth limiting function of the first scattering parameter and the second scattering parameter.
At present, in the process of performing AFR processing on scattering parameters of a to-be-measured object, in order to reduce errors, a data normalization function and a bandwidth limitation function are generally adopted, the data normalization function is to correct a first scattering parameter and a second scattering parameter to be the same value, and the bandwidth limitation function is to extract only the scattering parameters within a set bandwidth as calibration parameters to embody coaxiality.
Further, a third embodiment of the data processing method of the present application is proposed based on the first embodiment or the second embodiment. In the third embodiment, referring to fig. 4, the step S22 includes:
step S221, converting scattering parameters in the first scattering parameter file into frequency domain differential data;
and converting the scattering parameters in the first scattering parameter file into a coding format corresponding to the frequency domain differential detection mode to form frequency domain differential data.
Step S222, identifying a scattering parameter corresponding to the input clamp in the frequency domain differential data as first data, and identifying a scattering parameter corresponding to the output clamp in the frequency domain differential data as second data;
the frequency domain differential data comprises scattering parameters of the to-be-detected piece, scattering parameters of the input clamp and side scattering parameters of the output clamp. First data and second data in the frequency domain differential data are identified.
Step S223, removing the first scattering parameter from the first data, and removing the second scattering parameter from the second data.
And correspondingly removing the first scattering parameters corresponding to the input clamp in the measurement of the calibration piece from the frequency domain differential data, and correspondingly removing the first scattering parameters corresponding to the output clamp in the measurement of the calibration piece from the frequency domain differential data. The frequency domain differential data without the first scattering parameter and the second scattering parameter can be directly output or output after further extraction.
In this embodiment, the de-embedding processing is performed on the scattering parameters in the first scattering file based on the frequency domain differential data, which is beneficial to more accurately extracting the scattering parameters corresponding to the input fixture and the scattering parameters corresponding to the output fixture.
Further, based on any of the above embodiments, a fourth embodiment of the data processing method of the present application is provided. In the fourth embodiment, referring to fig. 5, the step S42 includes:
step S421, acquiring a preset frequency point;
the frequency range of interest to the technician is also relatively fixed during the circuit board testing process. Therefore, a plurality of preset frequency points can be set according to the common requirements of technicians.
Step S422, extracting scattering parameters corresponding to the preset frequency points from the target scattering parameters as target output data;
different frequency points correspond to different scattering parameters. Therefore, the scattering parameters corresponding to the multiple preset frequency points can be extracted from the processed scattering parameters to be used as target output data.
Step S423, outputting the target output data.
For example, if the preset frequency points are 20 frequency points in 1MHz to 20MHz, the scattering parameters corresponding to the 20 points are output as target output data.
At present, because scattering parameter files of processed pieces to be detected are generally more, a user needs to manually mark corresponding frequencies when needing scattering parameters corresponding to certain frequencies and then output the scattering parameters, when detecting the scattering parameters of the batched pieces to be detected, the frequency range concerned by the user is relatively fixed, if the user needs to manually mark the scattering parameters at each time, the same repeated work can take a lot of time and cost, therefore, the embodiment extracts the scattering parameters corresponding to the frequencies required by the user according to the preset frequency points by setting the preset frequency points, user operation can be omitted, and the scattering parameters required by the user can be quickly output.
Further, a fifth embodiment of the data processing method of the present application is proposed based on the fourth embodiment. In a fifth embodiment, referring to fig. 6, the step of outputting the target output data includes:
step S423a, saving the target output data to a text file;
specifically, the target output data can be saved to a TXT file for use by the user.
In order to facilitate the user to process the target output data, after the step of saving the target output data to the text file, the method further includes:
step S50, importing the target output data in the text file into a spreadsheet using a macro.
Specifically, the VBA program macro file can be placed in a folder where the TXT file is located, the VBA program macro file is run, the TXT to Excel conversion is achieved through the macro, an Excel file in a standard format is generated, and a user can process data in the Excel file according to different specific requirements.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or system. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or system that comprises the element.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
Through the above description of the embodiments, those skilled in the art will clearly understand that the method of the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but in many cases, the former is a better implementation manner. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium (e.g., ROM/RAM, magnetic disk, optical disk) as described above and includes instructions for enabling a terminal device (e.g., a mobile phone, a computer, a server, an air conditioner, or a network device) to execute the method according to the embodiments of the present invention.
The above description is only a preferred embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes, which are made by using the contents of the present specification and the accompanying drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (7)
1. A data processing method is characterized in that based on a vector network analyzer, the data processing method comprises the following steps:
reading a test file related to the test of the piece to be tested;
extracting a first scattering parameter file of the to-be-tested part and a second scattering parameter file of the calibration part from the test file according to a preset file identifier; the calibration piece is a double straight-through calibration piece;
extracting a scattering parameter file based on differential two-port network detection in the second scattering parameter file to serve as a calibration file;
analyzing the calibration file to generate a first scattering parameter of an input fixture and a second scattering parameter of an output fixture as calibration parameters;
performing de-embedding processing on the scattering parameters in the first scattering parameter file by using the calibration parameters to obtain target scattering parameters;
outputting the target scattering parameters;
wherein, before the step of analyzing the calibration file to generate a first scattering parameter of the input fixture and a second scattering parameter of the output fixture as the calibration parameters, the method further comprises:
and closing the numerical normalization function of the first scattering parameter and the second scattering parameter, and closing the bandwidth limiting function of the first scattering parameter and the second scattering parameter.
2. The data processing method of claim 1, wherein the step of de-embedding the scattering parameters in the first scattering parameter file using the calibration parameters comprises:
converting the scattering parameters in the first scattering parameter file into frequency domain differential data;
identifying a scattering parameter corresponding to the input clamp in the frequency domain differential data as first data, and identifying a scattering parameter corresponding to the output clamp in the frequency domain differential data as second data;
removing the first scattering parameter from the first data and removing the second scattering parameter from the second data.
3. A data processing method as claimed in claim 1 or 2, wherein the step of outputting the target scattering parameter comprises:
acquiring a preset frequency point;
extracting scattering parameters corresponding to the preset frequency points from the target scattering parameters to serve as target output data;
and outputting the target output data.
4. The data processing method of claim 3, wherein the step of outputting the target output data comprises:
saving the target output data to a text file;
after the step of saving the target output data to a text file, the method further comprises:
and importing the target output data in the text file into the electronic form by adopting a macro.
5. The data processing method according to claim 1 or 2, wherein the step of reading a test file related to the test of the device under test comprises:
acquiring a preset storage path corresponding to the piece to be detected;
and accessing the preset storage path and reading the test file.
6. A data processing apparatus, characterized in that the data processing apparatus comprises: memory, a processor and a data processing program stored on the memory and executable on the processor, the data processing program, when executed by the processor, implementing the steps of the data processing method according to any one of claims 1 to 5.
7. A readable storage medium, characterized in that the readable storage medium has stored thereon a data processing program which, when executed by a processor, implements the steps of the data processing method according to any one of claims 1 to 5.
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| "微波电路测试时嵌入和去嵌入技术研究";王静祎;《中国优秀硕士学位论文全文数据库•信息科技辑》;20131215(第S2期);第I138-425页 * |
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| CN110333438A (en) | 2019-10-15 |
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