CN110320423A - Test fixture and test method - Google Patents
Test fixture and test method Download PDFInfo
- Publication number
- CN110320423A CN110320423A CN201910600496.9A CN201910600496A CN110320423A CN 110320423 A CN110320423 A CN 110320423A CN 201910600496 A CN201910600496 A CN 201910600496A CN 110320423 A CN110320423 A CN 110320423A
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- Prior art keywords
- cover board
- test fixture
- frame plate
- deep gouge
- medium frame
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
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Abstract
The present disclosure discloses a kind of test fixture and test methods, the test fixture is used for the performance test of receiving coil, the test fixture includes clamp assembly, the clamp assembly includes: medium frame plate, first cover board and the second cover board, the thickness two sides of the medium frame plate are respectively the first side and second side, first cover board is located at first side of the medium frame plate, and for receiving coil to be folded between the medium frame plate and first cover board, second cover board is located at described second side of the medium frame plate, and for transmitting coil to be folded between the medium frame plate and second cover board.It according to the test fixture of the disclosure, can at least improve influence of some uncertain factors to test result, improve the accuracy of test result, and the structure of test fixture is simple, easy to use.
Description
Technical field
This disclosure relates to wireless charging coil measurement technical field, more particularly, to a kind of test fixture and test side
Method.
Background technique
For some it can be usually built-in with receiving coil, led in wireless charging pedestal for the electronic equipment of wireless charging
It often is built-in with transmitting coil, induced current is generated between transmitting coil and receiving coil, induced current is output to the electricity being electrically charged
In sub- equipment, to charge to electronic equipment.The manufacturer of each receiving coil draw a design perhaps production after or each electricity
Sub- device manufacturer needs to test the performance of receiving coil after buying receiving coil.However, survey in the related technology
Method for testing is mostly that receiving coil is directly placed on the emission base for being built-in with transmitting coil, and test result is frequently subjected to
The influence of uncertain factor, test error is larger, and comparativity is not high.
Disclosure
The disclosure aims to solve at least one of the technical problems existing in the prior art.For this purpose, the disclosure is proposition one
Kind test fixture, the test fixture can improve the accuracy of test result, and the structure letter of test fixture to a certain extent
It is single, easy to use.
The disclosure also proposed a kind of test method, be tested using above-mentioned test fixture.
According to the test fixture of disclosure first aspect embodiment, performance of the test fixture for receiving coil is surveyed
Examination, the test fixture includes clamp assembly, and the clamp assembly includes: medium frame plate, the thickness two sides difference of the medium frame plate
For the first side and second side；First cover board, first cover board are located at first side of the medium frame plate, and for that will receive
Coil is folded between the medium frame plate and first cover board；Second cover board, second cover board are located at the medium frame plate
Described second side, and for transmitting coil to be folded between the medium frame plate and second cover board.
It according to the test fixture of the disclosure, can at least improve influence of some uncertain factors to test result, improve
The accuracy of test result, and the structure of test fixture is simple, easy to use.
According to the test method of disclosure second aspect embodiment, surveyed using the test fixture of above-mentioned first aspect embodiment
Examination, the test method is comprising steps of transmitting coil is placed on second cover board, by the medium frame plate gland described
On transmitting coil, receiving coil is placed on the medium frame plate, by the first cover board gland on the receiving coil.
It is easy to operate, test result is good according to the test method of the disclosure.
The additional aspect and advantage of the disclosure will be set forth in part in the description, and will partially become from the following description
It obtains obviously, or recognized by the practice of the disclosure.
Detailed description of the invention
Fig. 1 is the schematic diagram according to the test fixture of an embodiment of the present disclosure；
Fig. 2 is the explosive view according to the clamp assembly of an embodiment of the present disclosure；
Fig. 3 is the explosive view that clamp assembly shown in Fig. 2 is observed from the negative；
Fig. 4 is the schematic diagram according to the receiving coil of an embodiment of the present disclosure；
Fig. 5 is the schematic diagram according to the transmitting coil of an embodiment of the present disclosure；
Fig. 6 is the schematic diagram according to the test fixture of the disclosure another embodiment.
Appended drawing reference:
Test fixture 1000；
Clamp assembly 100；First side F1；Second side F2；
Medium frame plate 1；First surface 11；First deep gouge 111；Wire casing 112；First escape groove 113；
First protrusion 114；First basic circle 110；
Second surface 12；Third deep gouge 121；Second escape groove 122；Second protrusion 123；
First cover board 2；4th surface 21；First groove 211；4th escape groove 212；
Second cover board 3；Third surface 31；Second deep gouge 311；Locating convex block 312；
Second groove 313；Third escape groove 314；
First location structure 4；Second location structure 5；The warm line 6 of point；
First mat piece 7；First backing plate 71；
Second mat piece 8；Second backing plate 81；
Incubator component 200；Cabinet 201；Temperature-adjusting device 202；Detection device 203；
Receiving coil 2000；
Receiving coil ontology 2000a；Receiving coil carries basement membrane 2000b；
Receiving coil center outlet 2000c1；Receiving coil edge outlet 2000c2；
Transmitting coil 3000；
Transmitting coil ontology 3000a；Transmitting coil bearing substrate 3000b；Location notch hole 3000b1；
Transmitting coil center outlet 3000c1；Transmitting coil edge outlet 3000c2.
Specific embodiment
Embodiment of the disclosure is described below in detail, examples of the embodiments are shown in the accompanying drawings, wherein from beginning to end
Same or similar label indicates same or similar element or element with the same or similar functions.Below with reference to attached
The embodiment of figure description is exemplary, it is intended to for explaining the disclosure, and should not be understood as the limitation to the disclosure.
Following disclosure provides many different embodiments or example is used to realize the different structure of the disclosure.For letter
The disclosure for changing the disclosure, is hereinafter described the component of specific examples and setting.Certainly, they are merely examples, and
Purpose does not lie in the limitation disclosure.In addition, the disclosure can in different examples repeat reference numerals and/or letter.It is this heavy
It is for purposes of simplicity and clarity, itself not indicate the relationship between discussed various embodiments and/or setting again.This
Outside, present disclose provides various specific techniques and material example, but those of ordinary skill in the art may be aware that
The applicable property of other techniques and/or the use of other materials.
For some receiving coil 2000, wireless charging pedestal can be usually built-in with for the electronic equipment of wireless charging
In be usually built-in with transmitting coil 3000, induced current, induced current are generated between transmitting coil 3000 and receiving coil 2000
It is output in the electronic equipment being electrically charged, to charge to electronic equipment.The manufacturer of each receiving coil 2000 is drawing a design
Perhaps after producing or each electronic equipment manufacturer is after buying receiving coil 2000, needs the property to receiving coil 2000
It can be carried out test, however, test method in the related technology, is mostly directly to be placed in receiving coil 2000 to be built-in with transmitting
On the emission base of coil 3000, test result is frequently subjected to the influence of uncertain factor, and test error is larger, and comparativity is not
It is high.
For this purpose, the test fixture 1000 is for receiving line the present disclosure proposes a kind of test fixture 1000 easy to use
The performance test of circle 2000, has the characteristics that structure is simple, easy to use, significantly reduces difficulty of test, and pass through
It using the test fixture 1000 of the disclosure, can at least improve influence of some uncertain factors to test result, improve test
As a result accuracy.
In the following, describing the test fixture 1000 according to the embodiment of the present disclosure referring to attached drawing.
As shown in Figure 1, test fixture 1000 includes clamp assembly 100, clamp assembly 100 includes: that medium frame plate 1, first covers
Plate 2 and the second cover board 3, the thickness two sides of medium frame plate 1 are respectively the first side F1 and second side F2, and the first cover board 2 is located at medium frame plate 1
The first side F1, the second cover board 3 is located at second side F2 of medium frame plate 1.That is, the first cover board 2 and the second cover board 3 are set respectively
In the thickness two sides of medium frame plate 1.
As shown in Figure 1, the first cover board 2 is for receiving coil 2000 to be folded between medium frame plate 1 and the first cover board 2.It needs
Although being noted that " receiving coil 2000 is folded between medium frame plate 1 and the first cover board 2 ", but be not restricted to that medium frame plate 1
Receiving coil 2000 is provided only between the first cover board 2, that is to say, that receiving coil 2000 is located at medium frame plate 1 and the first cover board 2
Between and by medium frame plate 1 and the direct or indirect sandwiched of the first cover board 2, such as in the embodiment shown in fig. 1, medium frame plate 1
Do not have other component between the first cover board 2, receiving coil 2000 is by medium frame plate 1 and the direct sandwiched of the first cover board 2；In another example
Later in the other embodiments, it is also provided with several first backing plates 71 between medium frame plate 1 and the first cover board 2, receives
Coil 2000 is between the first backing plate 71 and the first cover board 2, by medium frame plate 1 and the indirect sandwiched of the first cover board 2.In addition, this
Receiving coil 2000 described in text refers to that receiving coil 2000 is compacted, does not move by " sandwiched ".
As shown in Figure 1, the second cover board 3 is for transmitting coil 3000 to be folded between medium frame plate 1 and the second cover board 3.It needs
Although being noted that " transmitting coil 3000 is folded between medium frame plate 1 and the second cover board 3 ", but be not restricted to that medium frame plate 1
Transmitting coil 3000 is provided only between the second cover board 3, that is to say, that transmitting coil 3000 is located at medium frame plate 1 and the second cover board 3
Between and by medium frame plate 1 and the direct or indirect sandwiched of the second cover board 3, such as in the embodiment shown in fig. 1, medium frame plate 1
Do not have other component between the second cover board 3, transmitting coil 3000 is by medium frame plate 1 and the direct sandwiched of the second cover board 3；In another example
Later in the other embodiments, it is also provided with several second backing plates 81 between medium frame plate 1 and the second cover board 3, emits
Coil 3000 is between the second backing plate 81 and the second cover board 3, by medium frame plate 1 and the indirect sandwiched of the second cover board 3.In addition, this
Transmitting coil 3000 described in text refers to that transmitting coil 3000 is compacted, does not move by " sandwiched ".
As a result, when being tested for the property to receiving coil 2000, transmitting coil 3000 can be folded in medium frame plate 1 with
Between second cover board 3, and receiving coil 2000 is folded between medium frame plate 1 and the first cover board 2, so that 3000 He of transmitting coil
The relative position of receiving coil 2000 is stablized, and is improved the stability of electric current efficiency of transmission, is reduced test error, so as to
Simply, conveniently and effectively receiving coil 2000 is tested for the property.Moreover, the structure of test fixture 1000 is simple, is convenient for
Processing, production cost are low.
In the related technology, when being tested for the property to receiving coil 2000, receiving coil 2000 is directly placed in interior
It is equipped on the emission base of transmitting coil 3000, when being influenced by certain uncertain extraneous factors, such as receiving coil 2000
When by external impacts, the placement position of receiving coil 2000 may change, so that electric current efficiency of transmission is affected, make
At test result, there are errors.And according to the test fixture of the embodiment of the present disclosure 1000, it is clamped in due to receiving coil 2000
Between frame plate 1 and the first cover board 2, receiving coil 2000 is reduced by the possibility of external impacts, to reduce receiving coil
The mobile risk of 2000 relative transmission coils 3000, and then the stability of electric current efficiency of transmission is improved, test error is improved,
That is, can at least improve influence of some uncertain factors to test result, the accuracy of test result is improved.
In addition, in the related art, when emission base upper surface has granule foreign etc., possibly can not be by receiving coil
2000 put smooth, and causing test result, there are test errors.And according to the test fixture of the embodiment of the present disclosure 1000, due to connecing
Take-up circle 2000 is clamped between medium frame plate 1 and the first cover board 2, so as to by measuring or observing medium frame plate 1 and first
Clearance height between cover board 2, come judge receiving coil 2000 whether put it is smooth, so as to improve electric current efficiency of transmission
Stability improves test error, it can at least improves influence of some uncertain factors to test result, improves test knot
The accuracy of fruit.
In the related art, before being tested for the property to receiving coil 2000, tester is due to can't see transmitting bottom
Transmitting coil 3000 in seat, thus can not by the central alignment of the center of receiving coil 2000 and transmitting coil 3000, exist
Centre deviation, electric current efficiency of transmission acceptor center deviation effects, causing test result, there are errors, moreover, because to different receptions
Centre deviation when coil 2000 is tested for the property is extremely difficult to unanimously so that the comparativity between each testing result compared with
Difference.
In this regard, medium frame plate 1 and the first cover board 2 all can be saturating according to the test fixture 1000 of some embodiments of the disclosure
Bright part, i.e. medium frame plate 1 and the first cover board 2 can be process using transparent material, at this point it is possible to first by transmitting coil 3000
It is clamped between medium frame plate 1 and the second cover board 3, observes the position of transmitting coil 3000 through medium frame plate 1 convenient for tester at this time
It, can be effectively to 3000 He of transmitting coil when setting, and then receiving coil 2000 being placed in the first side F1 of medium frame plate 1
Receiving coil 2000 carries out central alignment, reduces centre deviation, thus influence of the deviation to electric current efficiency of transmission that lower the center of gravity, drop
Low test error improves the comparability between the test result of different receiving coils 2000.
In addition, it should be noted that, medium frame plate 1, the first cover board 2, the material of the second cover board 3 are unlimited, if for it is non-conductive,
And the material on electromagnetic field without influence, that is to say, that as long as to the electricity between receiving coil 2000 and transmitting coil 3000
Magnetic induction does not generate interference, such as can be acrylic material etc., does not repeat here.
Currently, the manufacturer of receiving coil 2000 is more on the market, the 2000 specification type of receiving coil of each producer's production
Number also very more, each producer respectively carries out 2000 performance of receiving coil respectively and surveys after drawing a design or producing receiving coil 2000
It tries, there is no unified test specification between each producer, test result is affected by factors, test error etc., and is obtained
Test data do not have good comparativity, cause client lack when selecting receiving coil 2000 calibration reference.Namely
It says, for the purchase client of receiving coil 2000, the method and environment tested due to each producer to receiving coil 2000 are all
Not identical, therefore, it is difficult to the test report provided according to each manufacturer within first time from numerous 2000 samples of receiving coil
The product properly bought is filtered out in product.
In order to enable client is bought when comparing 2000 sample of receiving coil of different manufacturers, it can be according to each manufacturer
The test report of offer filters out the product properly bought from numerous 2000 samples of receiving coil within first time, can
So that the test fixture 1000 that each manufacturer is all made of the embodiment of the present disclosure is tested, or purchase quotient is adopted
It is tested with the different receiving coil 2000 of 1000 pairs of test fixture according to the embodiment of the present disclosure, it is hereby achieved that having
The test data of comparativity, and then can effectively filter out suitable receiving coil 2000.
In some embodiments of the present disclosure, in conjunction with Fig. 2 and Fig. 3, the thickness both side surface of medium frame plate 1 is respectively the first table
Face 11 and second surface 12, wherein medium frame plate 1 is first surface 11 on the surface of the first side F1, that is to say, that first surface 11
It is arranged in face of the first cover board 2, is formed with the first deep gouge 111 on first surface 11, the first deep gouge 111 is from from the first side F1 to second
The recessed formation in the direction of side F2.Receiving coil 2000 is adapted for engagement in the first deep gouge 111, that is to say, that along the thickness of medium frame plate 1
When direction projection, the orthographic projection of receiving coil 2000 is entirely located in the first deep gouge 111, however, it is desirable to which explanation, receives line
Chamfered shape, size, height etc. and chamfered shape, size, the height of the first deep gouge 111 of circle 2000 etc. can it is identical, can also
With difference.
As a result, by the way that the first deep gouge 111 that can cooperate with receiving coil 2000 is arranged on first surface 11, so as to
Simply and effectively to improve the assembly efficiency of receiving coil 2000, and transmitting coil 3000 is improved to a certain extent and is received
The central alignment effect of coil 2000, reduce receiving coil 2000 during the test relative transmission coil 3000 it is mobile can
Can, test error is thereby reduced, the result comparison for the test of different receiving coils 2000 is improved.
In addition, it should be noted that, as shown in figure 4, receiving coil 2000 may include receiving coil ontology 2000a and connect
Coil carrying basement membrane 2000b is received, receiving coil ontology 2000a, at receiving coil ontology 2000a, is received by metal wire helically coiling
Coil body 2000a is carried on receiving coil carrying basement membrane 2000b, and the planform of the first deep gouge 111 can be with reception line
The planform of circle carrying basement membrane 2000b matches.In general, in the receiving coil 2000 that each production firm provides,
Receiving coil carrying basement membrane 2000b is mostly square or rectangular shape, the center of receiving coil ontology 2000a and reception line
The center of circle carrying basement membrane 2000b is overlapped.
Therefore, in some embodiments of the present disclosure, as shown in Fig. 2, the first deep gouge 111 can be rectangular channel, so as to
With by judge the first deep gouge 111 it is each while receiving coil carry basement membrane 2000b it is each while between parallel degree and spacing, it is simple
Central alignment situation that is single and effectively judging receiving coil carrying basement membrane 2000b and the first deep gouge 111, thereby reduces test
Error improves the result comparison for the test of different receiving coils 2000.However, it is desirable to explanation, when the first deep gouge
111 be rectangular channel when, can be used for accommodate receiving coil carrying basement membrane 2000b be non-rectangle receiving coil 2000, also
It is to say, for some receiving coils carrying basement membrane 2000b is non-rectangle receiving coil 2000, first can also be matched with
Deep gouge 111 is tested for the property with using according to the test fixture 1000 of the embodiment of the present disclosure.
In some embodiments of the present disclosure, as shown in Fig. 2, there is 110 (the first base of the first basic circle in the first deep gouge 111
Circle 110 can be imaginary circles, it is not required that show visual), there is on the bottom wall of the first deep gouge 111 wire casing 112, wire casing 112 by
The recessed formation of bottom wall of first deep gouge 111, wire casing 112 can be multiple and along the first basic circle 110 circumferentially spaced distributions, survey
Examination jig 1000 includes being embedded at the point temperature line 6 of wire casing 112, that is to say, that one or more can be accommodated in each wire casing 112
A point temperature line 6, but it is not required for being all provided with a little warm line 6 in each wire casing 112, in other words, if can be equipped in main slot 112
The warm line 6 of point, if a warm line 6 can also be not provided in main slot 112, it is of course also possible to be designed with a warm line in each wire casing 112
6.Such as in a specific example of the disclosure, a point temperature line 6 is respectively equipped in each wire casing 112, it is hereby achieved that
More test data, and it is easy for installation.
As a result, by the way that the point temperature line 6 for accommodating wire casing 112 is arranged on the bottom wall of the first deep gouge 111, so as to keep away
Exempt from the problem of wire casing 112 is placed on the jack-up of receiving coil 2000 of the first deep gouge 111, and then improves putting for receiving coil 2000
Flatness, when testing different receiving coils 2000, each receiving coil 2000 can not the influence pendulum of receptor site temperature line 6
It is laid flat whole, ensure that efficiency of transmission, reduce test error, improve comparable for the result of different receiving coils 2000 test
Property.Moreover, because circumferentially spaced distribution of multiple wire casings 112 along the first basic circle 110, so as to increase receiving coil 2000
Temperature-measuring range more fully reflect the performance of receiving coil 2000 to obtain the test data of different temperature measuring points.
In some embodiments of the present disclosure, as shown in Fig. 2, the center of circle of the first basic circle 110 is in the first deep gouge 111
The heart, each wire casing 112 radially extending along the first basic circle 110, multiple wire casings 112 along the first basic circle 110 circumferential direction equably
It is spaced apart distribution.Thus, it is possible to obtain the test data of different temperature measuring points, more fully reflect the performance of receiving coil 2000.
In addition, observation receiving coil carrying can also be passed through when carrying out central alignment to receiving coil 2000 and transmitting coil 3000
Whether portion size of the basement membrane 2000b between each adjacent two wire casing 112 unanimously judges that whether 2000 center of receiving coil
With 111 central alignment of the first deep gouge, to improve receiving coil 2000 and 3000 central alignment effect of transmitting coil.
In addition, it should be noted that, before the performance to receiving coil 2000 is tested, it can be first by the second cover board
3, medium frame plate 1, transmitting coil 3000 assemble, thus facilitate the subsequent test for different receiving coils 2000, in other words,
After completing test to a receiving coil 2000, the second cover board 3 and medium frame plate 1 can not be dismantled, is not necessarily to transmitting coil 3000
It takes out, directly the first cover board 2 is opened, which is removed, puts another receiving coil 2000, cover the
One cover board 2 continues test next time.As a result, when by the first deep gouge 111 on 3000 center of transmitting coil and medium frame plate 1
Central alignment after, as long as guarantee receiving coil 2000 center and the first deep gouge 111 central alignment, it can guarantee transmitting
The center of coil 3000 and the central alignment of receiving coil 2000.
In a specific example of the disclosure, as shown in Fig. 2, the first deep gouge 111 be depth be 0.3mm, side length is
The square groove of 60mm, wire casing 112 is eight and the width and depth of each wire casing 112 are 0.5mm.First deep gouge as a result,
111 structure size is suitable for cooperating with most of receiving coils 2000 on the market, and is contained in first in receiving coil 2000 and sinks
After slot 111, the top of receiving coil 2000 can flush in or slightly exceed the top surface of the first deep gouge 111, to guarantee to receive line
Circle 2000 can be covered by the first cover board 2 and be flattened, and reduce test error.
Certainly, the present disclosure is not limited thereto, when the specification of receiving coil 2000 changes, in the property of may also adapt to modification
State design size.In addition, it should be noted that, point temperature line 6 at present on the market can be accommodated by the size of wire casing 112,
That is, point temperature line 6 on the market can be fully accommodated in wire casing 112 at present, in other words, the width and height of warm line 6 are put
Degree is no more than the width and depth of wire casing 112 respectively.
In some embodiments of the present disclosure, as shown in Fig. 2, the first escape groove can also be formed on first surface 11
113, the first escape groove 113 is connected with the first deep gouge 111, that is to say, that the one side edge and the first deep gouge of the first escape groove 113
111 one side edge linking is connected to, and the depth of the first escape groove 113 is greater than the depth of the first deep gouge 111, that is to say, that when
When the first escape groove 113 and the first deep gouge 111 recessed by the direction of first surface 11 towards second surface 12, the first escape groove
113 recessed depth is greater than the recessed depth of the first deep gouge 111, in other words, the bottom wall and first surface 11 of the first escape groove 113
Between difference in height be greater than the first deep gouge 111 bottom wall and first surface 11 between difference in height.
Thus, it is possible to by the first escape groove 113 by the outlet of receiving coil 2000 (it is understood that receiving coil
2000 outlet includes receiving coil center outlet 2000c1 and receiving coil edge outlet 2000c2) it draws, improve and receives line
First cover board 2 is jacked up, the first cover board 2 is caused receiving coil 2000 can not to be covered the problem of flattening by the outlet of circle 2000.This
Outside, in some embodiments of the present disclosure, the size of the first escape groove 113 can be by receiving coil 2000 goes out on the market at present
Line is accommodated, that is to say, that the outlet of receiving coil 2000 on the market can be fully accommodated in the first escape groove 113 at present
Interior, in other words, the width and height of the outlet of receiving coil 2000 are no more than the width and depth of the first escape groove 113 respectively.
In some embodiments of the present disclosure, as shown in Figures 2 and 3, medium frame plate 1 and the first cover board 2 pass through the first positioning
4 location fit of structure, the first location structure 4 are located at outside the first deep gouge 111 and surround and (can be continuity to surround, be also possible to
Discontinuity surrounds) distribution of the first deep gouge 111.The function that the first location structure 4 has no effect on the first deep gouge 111 as a result, is normally sent out
It waves, moreover, the first location structure 4 can also improve the assembly efficiency and connection reliability of medium frame plate 1 and the first cover board 2, improves
By the first cover board 2 to the operating efficiency of 1 upper press cover of medium frame plate, the stability after the first cover board 2 lid is pressed is improved, test is facilitated, and
Test error is small.
Such as in Fig. 2 and example shown in Fig. 3, the first location structure 4 includes set on multiple the first of first surface 11
Protrusion 114 and set on the first cover board 2 multiple first grooves 211, it is multiple first protrusion 114 with multiple first grooves 211 distinguish
Corresponding location fit, multiple first protrusions 114 are spaced apart distribution along the contour edge of first surface 11.Facilitate as a result, processing and
Assembly.In addition, it should be noted that, the side surface towards medium frame plate 1 of the first cover board 2 can be the 4th surface 21, the 4th
Surface 21 can be plane, and the first groove 211 can be recessed by the 4th surface 21 and be formed, to facilitate processing and can simply have
Effect ground is smooth by 2000 gland of receiving coil.
Certainly, the present disclosure is not limited thereto, and the position of several first protrusions 114 and several first grooves 211 can also exchange,
As long as meeting positioning requirements.Further it will be understood that in the first cover board 2 and medium frame plate 1 by 2000 sandwiched of receiving coil
When, may exist fit clearance between the roof of the first protrusion 114 and the bottom wall of the first groove 211, that is to say, that the first protrusion
114 roof and not in contact with the bottom wall of the first groove 211, to guarantee that the first cover board 2 and medium frame plate 1 can be by receiving coils
2000 sandwicheds.
In some embodiments of the present disclosure, as shown in Figures 2 and 3, the thickness both side surface of medium frame plate 1 is respectively first
Surface 11 and second surface 12, medium frame plate 1 are second surface 12 on the surface of second side F2, that is to say, that 12 face of second surface
Second cover board 3 is arranged, the side surface in face of medium frame plate 1 of the second cover board 3 is third surface 31, that is to say, that the second table
Face 12 and third surface 31 are oppositely arranged, and the second deep gouge is formed at least one of second surface 12 and third surface 31
311, that is to say, that the second deep gouge 311 can all by second surface 12 recess be formed, the second deep gouge 311 can also all by
The recess of third surface 31 is formed, and the second deep gouge 311 can also include recessed by second surface 12 to two parts of spelling, a portion
Fall into formation, another part is formed by the recess of third surface 31.
Wherein, transmitting coil 3000 is adapted for engagement in the second deep gouge 311, that is to say, that the thickness direction along medium frame plate 1 is thrown
When shadow, the orthographic projection of transmitting coil 3000 is entirely located in the second deep gouge 311, however, it is desirable to explanation, transmitting coil 3000
Chamfered shape, size, height etc. and chamfered shape, size, the height of the second deep gouge 311 etc. can it is identical, can also be different.
The second deep gouge 311 that can be cooperated as a result, with transmitting coil 3000 by setting, so as to simply and effectively improve emission lines
The assembly efficiency of circle 3000, and the central alignment effect of transmitting coil 3000 and transmitting coil 3000 is improved to a certain extent
Fruit reduces the mobile possibility of relative transmission coil 3000 during the test of transmitting coil 3000, thereby reduces test error,
Improve the result comparison for the test of different transmitting coils 3000.
In addition, it should be noted that, as shown in figure 5, transmitting coil 3000 may include transmitting coil ontology 3000a and hair
Ray circle bearing substrate 3000b, transmitting coil ontology 3000a are by metal wire helically coiling at transmitting coil ontology 3000a, transmitting
Coil body 3000a is carried on transmitting coil bearing substrate 3000b, and the planform of the second deep gouge 311 can be with emission lines
The planform of circle bearing substrate 3000b matches.In general, in the transmitting coil 3000 that each production firm provides,
Transmitting coil bearing substrate 3000b is mostly circular shape, the center of transmitting coil ontology 3000a and transmitting coil bearing substrate
The center of 3000b is overlapped.
Therefore, in some embodiments of the present disclosure, as shown in figure 3, the second deep gouge 311 can be circular trough, so as to
Simply and efficiently to sentence by judging the spacing between 311 edge of the second deep gouge and the edge transmitting coil bearing substrate 3000b
The central alignment situation of disconnected transmitting coil bearing substrate 3000b and the second deep gouge 311, thereby reduce test error, improve
For the result comparison of different transmitting coils 3000 test, moreover, the size and transmitting coil when the second deep gouge 311 carry base
When the size of plate 3000b matches, the second deep gouge 311 can also play position-limiting action to transmitting coil 3000, thus will be into one
Step improves test error.However, it is desirable to which explanation can be used for accommodating emission lines when the second deep gouge 311 is circular trough
Circle bearing substrate 3000b is non-circular transmitting coil 3000, that is to say, that for some transmitting coil bearing substrate 3000b
For non-circular transmitting coil 3000, it can also be matched with the second deep gouge 311, using the survey according to the embodiment of the present disclosure
Examination jig 1000 is tested for the property.
In addition, it should be noted that, before the performance to receiving coil 2000 is tested, it can be first by the second cover board
3, medium frame plate 1, transmitting coil 3000 assemble, thus facilitate the subsequent test for different receiving coils 2000, in other words,
After completing test to a receiving coil 2000, the second cover board 3 and medium frame plate 1 can not be dismantled, is not necessarily to transmitting coil 3000
It takes out, directly the first cover board 2 is opened, which is removed, puts another receiving coil 2000, cover the
One cover board 2 continues test next time.As a result, by limit of second deep gouge 311 to transmitting coil 3000, can reduce
Transmitting coil 3000 improves between different test results with respect to the possibility of 1 shift in position of medium frame plate to reduce test error
Comparativity.
In some embodiments of the present disclosure, the center of the center of the second deep gouge 311 and the first deep gouge 111 is located at same perpendicular
On straight line, that is to say, that the center of the second deep gouge 311 and the center of the first deep gouge 111 are up and down to just, as a result, when by emission lines
Enclose the central alignment at 3000 centers Yu the second deep gouge 311, and by the center pair at the center of receiving coil 2000 and the first deep gouge 111
After just, it can the central alignment at the center and receiving coil 2000 that guarantee transmitting coil 3000 mentions to reduce test error
Comparativity between high difference test result.
In some embodiments of the present disclosure, as shown in Figures 2 and 3, the second deep gouge 311 is formed on third surface 31,
The second escape groove 122 is formed on second surface 12, the second escape groove 122 is connected to the second deep gouge 311, the second escape groove 122
Inner end it is opposite with the center of the second deep gouge 311, the outer end of the second escape groove 122 extends and runs through the contour edge of medium frame plate 1.
Thus, it is possible to by the second escape groove 122 by the outlet of transmitting coil 3000 (it is understood that transmitting coil 3000 goes out
Line includes transmitting coil center outlet 3000c1 and transmitting coil edge outlet 3000c2) it draws, improve transmitting coil 3000
Outlet cause the second cover board 3 can not by 3000 sandwiched of transmitting coil, flatten the problem of.In addition, in some implementations of the disclosure
In example, the size of the second escape groove 122 can be by the outlet of transmitting coil 3000 is accommodated on the market at present, that is to say, that
The outlet of transmitting coil 3000 on the market can be fully accommodated in the second escape groove 122 at present, in other words, transmitting coil
The width and height of 3000 outlet are no more than the width and depth of the second escape groove 122 respectively.
In addition, when being formed with above-mentioned first escape groove 113 on first surface 11, the second escape groove 122 and the first evacuation
Slot 113 is oppositely arranged along the thickness direction of medium frame plate 1.The outlet of the outlet of receiving coil 2000 and transmitting coil 3000 as a result,
Can be drawn from same direction, thus facilitate it is subsequent outlet is electrically connected with detection device, facilitate operation.
In addition, being oppositely arranged and with the second deep gouge 311 to spelling as shown in figure 3, could be formed with simultaneously on second surface 12
Third deep gouge 121, could be formed on third surface 31 simultaneously and be oppositely arranged with the second escape groove 122 and the third of spelling is kept away
Slot 314 is allowed, so as to for 3000 sandwiched of transmitting coil and outlet to different height.
In addition, as shown in Figures 2 and 3, could be formed on the 4th surface 21 and be oppositely arranged with the first escape groove 113 simultaneously
And to the 4th escape groove 212 of spelling, so as to for 2000 sandwiched of receiving coil and outlet to different height.In addition, being
Facilitate processing and appearance, the 4th escape groove 212 can run through first cover board 2 along the thickness direction of the first cover board 2.
In some embodiments of the present disclosure, as shown in Fig. 2, can have locating convex block 312 in the second deep gouge 311, it is fixed
Position convex block 312 is located at the contour edge position of the second deep gouge 311.That is, locating convex block 312 is located in the second deep gouge 311
And it is arranged close to the contour edge of the second deep gouge 311.At this point, can be formed on transmitting coil bearing substrate 3000b in conjunction with Fig. 5
There is the location notch hole 3000b1 with 312 location fit of locating convex block, thus, it is possible to further increase the assembly of transmitting coil 3000
Efficiency guarantees that the installation site of transmitting coil 3000 meets design requirement, such as guarantees that the outlet of transmitting coil 3000 can be right
Quasi- second escape groove 122.
In some embodiments of the present disclosure, as shown in Figures 2 and 3, medium frame plate 1 and the second cover board 3 pass through the second positioning
5 location fit of structure, the second location structure 5 are located at outside the second deep gouge 311 and surround and (can be continuity to surround, be also possible to
Discontinuity surrounds) distribution of the second deep gouge 311.The function that the second location structure 5 has no effect on the second deep gouge 311 as a result, is normally sent out
It waves, moreover, the second location structure 5 can also improve the assembly efficiency and connection reliability of medium frame plate 1 and the second cover board 3, improves
By the second cover board 3 to the operating efficiency of 1 upper press cover of medium frame plate, the stability after the second cover board 3 lid is pressed is improved, test is facilitated, and
Test error is small.
Such as in Fig. 2 and example shown in Fig. 3, the second location structure 5 may include set on the multiple of second surface 12
Second protrusion 123 and multiple second grooves 313 set on third surface 31, multiple second protrusions 123 and multiple second grooves 313
Location fit is respectively corresponded, multiple second protrusions 123 are spaced apart distribution along the contour edge of second surface 12.Facilitate as a result, and adds
Work and assembly.Certainly, the present disclosure is not limited thereto, and the position of several second protrusions 123 and several second grooves 313 can also be mutual
It changes, as long as meeting positioning requirements.Further it will be understood that in the second cover board 3 and medium frame plate 1 by receiving coil 2000
When sandwiched, may exist fit clearance between the roof of the second protrusion 123 and the bottom wall of the second groove 313, that is to say, that second
The roof of protrusion 123 and not in contact with the bottom wall of the second groove 313, to guarantee that the second cover board 3 and medium frame plate 1 can will receive line
Enclose 2000 sandwicheds.
In some embodiments of the present disclosure, as shown in Figure 1, test fixture 1000 can also include: incubator component 200,
Incubator component 200 includes cabinet 201, temperature-adjusting device 202 and detection device 203, and wherein temperature-adjusting device 202 is for adjusting
Temperature in cabinet 201 is saved, detection device 203 is located in cabinet 201 for temperature in detection box 201, clamp assembly 100.By
This, it is ensured that the consistency of initial temperature is tested, to reduce test error, is improved comparable between different test results
Property.
In the related art, different manufacturers is after respectively having produced Wireless charging coil sample, it is difficult to accomplish more
The test condition of aspect is unified, and the Wireless charging coil sample room for causing different manufacturers to produce, which is difficult to measure mutually, to be compared, such as
Some producers place and are tested indoors, and room temperature from morning to night can get higher or be lower in practice as one day time, because
The temperature value of this coil measured in different time sections will receive the influence of variation of ambient temperature, and test result does not have comparable
Property.And according to the test fixture of the embodiment of the present disclosure 1000, test fixture can be set in cabinet 201, pass through temperature tune
Regulating device 202 and detection device 203 will test temperature in fact and be adjusted to preset value, such as 25 DEG C, then start to carry out reception line
2000 performance tests are enclosed, the temperature rise situation of each test point on receiving coil 2000 is detected.
In some embodiments, as shown in fig. 6, test fixture 1000 can also include: the first mat piece 7, medium frame plate 1 and
The first mat piece 7 is equipped between one cover board 2, receiving coil 2000 is between the first mat piece 7 and the first cover board 2.Thus, it is possible to logical
The first mat piece 7 of setting is crossed to adjust the distance between receiving coil 2000 and medium frame plate 1, so as to adjust receiving coil 2000
The distance between transmitting coil 3000, to meet different test requests.Specifically, the first mat piece 7 can be height
Adjustable member, such as in the example depicted in fig. 6, the first mat piece 7 can include multiple first backing plates 71, so as to pass through change
Pad is located at the quantity of the first backing plate 71 between medium frame plate 1 and the first cover board 2, to adjust receiving coil 2000 and transmitting coil
The distance between 3000, to meet different test requests.
Wherein, a side surface (each first pad as shown in Figure 6 in face of the first cover board 2 of each first backing plate 71
The upper surface of plate 71) structure with medium frame plate 1 in face of the first cover board 2 a side surface (as shown in Figure 6 it is each first pad
The upper surface of plate 71) structure it is identical, such as the side surface in face of the first cover board 2 of each first backing plate 71 has been respectively formed on
First deep gouge 111, wire casing 112, the first escape groove 113, first protrusion 114 etc..Certainly, the present disclosure is not limited thereto, such as at this
In disclosed other embodiments, the side surface in face of the first cover board 2 of each first backing plate 71 is (each as shown in Figure 6
The upper surface of first backing plate 71) structure and medium frame plate 1 in face of a side surface of the first cover board 2 (as shown in Figure 6 each the
The upper surface of one backing plate 71) structure can be same with Local Phase, for example, for example each first backing plate 71 face the first cover board 2
A side surface area it is smaller, and be each formed with the first deep gouge 111, wire casing 112, the first escape groove 113, and be formed without
One protrusion 114.
In some embodiments, as shown in fig. 6, test fixture 1000 can also include: the second mat piece 8, medium frame plate 1 and
The second mat piece 8 is equipped between two cover boards 3, receiving coil 2000 is between the second mat piece 8 and the second cover board 3.Thus, it is possible to logical
The second mat piece 8 of setting is crossed to adjust the distance between receiving coil 2000 and medium frame plate 1, so as to adjust receiving coil 2000
The distance between transmitting coil 3000, to meet different test requests.Specifically, the second mat piece 8 can be height
Adjustable member, such as in the example depicted in fig. 6, the second mat piece 8 can include multiple second backing plates 81, so as to pass through change
Pad is located at the quantity of the second backing plate 81 between medium frame plate 1 and the second cover board 3, to adjust receiving coil 2000 and transmitting coil
The distance between 3000, to meet different test requests.
Wherein, a side surface (each second pad as shown in Figure 6 in face of the second cover board 3 of each second backing plate 81
The lower surface of plate 81) structure with medium frame plate 1 in face of the second cover board 3 a side surface (as shown in Figure 6 it is each second pad
The lower surface of plate 81) structure it is identical, such as the side surface in face of the second cover board 3 of each second backing plate 81 has been respectively formed on
Third deep gouge 121, the second escape groove 122, second protrusion 123 etc..Certainly, the present disclosure is not limited thereto, for example, the disclosure its
In his embodiment, a side surface (each second backing plate as shown in Figure 6 in face of the second cover board 3 of each second backing plate 81
81 lower surface) structure and medium frame plate 1 in face of the second cover board 3 a side surface (each second backing plate 81 as shown in Figure 6
Lower surface) structure can be same with Local Phase, for example, the side table in face of the second cover board 3 of for example each second backing plate 81
The area in face is smaller, and is each formed with third deep gouge 121, the second escape groove 122, and is formed without the second protrusion 123.
In the following, describing the test fixture 1000 according to one specific embodiment of the disclosure referring to attached drawing 1- Fig. 5.
Test fixture 1000 may include clamp assembly 100 and incubator component 200, and incubator component 200 may include cabinet
201, temperature-adjusting device 202 and detection device 203, temperature-adjusting device 202, detection device 203 and clamp assembly 100 are all provided with
In in cabinet 201, clamp assembly 100 may include the first cover board 2, medium frame plate 1 and the second cover board successively arranged from top to bottom
3.Wherein, medium frame plate 1, the first cover board 2 and the second cover board 3 can control precision machinery by acrylic material computer digital
It is process, acrylic material is non-conductive, the clamp assembly on electromagnetic field without influence, suitable for the manufacture embodiment of the present disclosure
100。
Fixed reception coil 2000 is used between first cover board 2 and medium frame plate 1.Receiving coil 2000 on current market is thick
Degree is mostly 0.2mm to 0.3mm.There is the first deep gouge 111 in the center of top of medium frame plate 1, it is 60mm that the first deep gouge 111, which is side length,
Square indentations, the depth of the first deep gouge 111 is 0.3mm, after the first deep gouge 111 puts tested receiving coil 2000,
Receiving coil 2000 just can flatten no protrusion by the first cover board 2.The top of medium frame plate 1 also has eight width and depth
It is all the wire casing 112 of 0.5mm, the point temperature line 6 of the thermocouple for putting measurement 2000 temperature rise of receiving coil, by eight point temperature lines
After 6 are embedded to eight wire casings 112 respectively, putting warm line 6 can be non-bulging in wire casing 112, to ensure that tested receiving coil
2000 put planarization.Herein, it should be noted that the quantity for putting warm line 6 is not limited to eight, such as can be four or more
In four, in addition, putting the detection position of warm line 6 can be arranged according to actual requirement, such as receiving coil center can be located at and gone out
One end that line 2000c1 is connected with receiving coil ontology 2000a, in another example can be located at receiving coil edge outlet 2000c2 with
Receiving coil ontology 2000a connected one end, in another example the radius central location etc. of receiving coil ontology 2000a can be located at
Deng being not construed as limiting here.
Fixed transmission coil 3000 is used between second cover board 3 and medium frame plate 1.There is the second deep gouge on second cover board 3
311, the bottom surface of medium frame plate 1 has the second escape groove 122, and the second escape groove 122 is for rectangular recess and by the second deep gouge 311
The heart is extended centrally out along the second deep gouge 311, to be placed in the second deep gouge on the second cover board 3 in transmitting coil 3000
When in 311, the second escape groove 122 is convenient for the center line outlet of transmitting coil 3000, guarantees that the second cover board 3 and medium frame plate 1 can
Sandwiched transmitting coil 3000.
In addition, the difference in height between the top surface and transmitting coil 3000 of medium frame plate 1 can be 3mm, emit when needing to adjust
When spacing between coil 3000 and receiving coil 2000, it can be padded between medium frame plate 1 and the second cover board 3 and set several second pads
Plate 81, such as the acrylic gasket of 1mm, all the second backing plate 81 is respectively positioned on the top surface of transmitting coil 3000 and the bottom of medium frame plate 1
Between face, so that the spacing between transmitting coil 3000 and receiving coil 2000 is adjusted in 3mm between 8mm；Or it can be with
Pad sets several first backing plates 71, such as the acrylic gasket of 1mm between medium frame plate 1 and the first cover board 2, all the first backing plate 71
Be respectively positioned between the bottom surface of receiving coil 2000 and the top surface of medium frame plate 1 so that transmitting coil 3000 and receiving coil 2000 it
Between spacing adjusted in 3mm between 8mm.
As a result, according to the test fixture of the present embodiment 1000, when the top that receiving coil 2000 is placed in medium frame plate 1
When, and can refer to the wire casing 112 at eight direction centers, the center placement position for receiving coil 2000 of making uniform, then by the first cover board 2
Flattening (hereafter can be connected and fixed using fastener by the first cover board 2 and medium frame plate 1, fastener connection can not also be used solid
Determine medium frame plate 1 and the first cover board 2, i.e., directly the first cover board 2 lid be located on receiving coil 2000, so that it may start to test), by
This, can standardize out position of the receiving coil 2000 in test, smooth degree, put the point position that warm line 6 is tested and remain unchanged
Deng.In addition, the distance between the top surface of medium frame plate 1 and the second cover board 3 are stablized, and after clamp assembly 100 is installed, emission lines
The distance between top surface to bottom surface of receiving coil 2000 of circle 3000 is fixed, can be to avoid due to transmitting coil 3000 and reception
Distance is not fixed caused test error between coil 2000.In addition, by setting incubator component 200, it can specification reception line
Physical environmental condition of the circle 2000 in test, so that the receiving coil 2000 of different batches different manufacturers production is gathered around in test
There are referential and comparability.
In conclusion according to the test fixture 1000 of the embodiment of the present disclosure, it can be with normative testing environment, so that receiving coil
2000 and transmitting coil 3000 be easy to central alignment, and the test spacing of receiving coil 2000 and transmitting coil 3000 is fixed, temperature
Degree test point fixes (i.e. design position of the position of each point temperature line 6 dependent on wire casing 112, when the design position of wire casing 112
After determination, the placement position for putting warm line 6 is determined), improve the comparability that different batches receiving coil 2000 is tested.Root as a result,
According to the test fixture 1000 of the embodiment of the present disclosure, it can be used for the Universal test clamping apparatus of producer's production receiving coil 2000, so that
The first-hand test report that producer provides can help client to select suitable receiving coil 2000 intuitively as reference.Letter
Yan Zhi can be such that receiving coil 2000 keeps during performance test according to the test fixture 1000 of the embodiment of the present disclosure
Ambient stable improves measuring accuracy, and user is enabled to have general testing standard when sample is enclosed in the reception for comparing different manufacturers.
Further, it is to be appreciated that the test parameter of the performance test of receiving coil 2000, for those skilled in the art
For be known, therefore only briefly introduce.Such as it can be from the electric attribute of Wireless charging coil, mechanical dimension and work
Three aspects of performance carry out the performance of comprehensive consideration receiving coil 2000.Wherein, electric attribute may include receiving coil 2000
Inductance, DC impedance Rdc (or dcR), AC impedance Rac (or acR) can specifically be measured by high-precision electric bridge
Inductance value, DC impedance and AC impedance.Wherein, mechanical dimension may include the thickness of receiving coil 2000 (for example including connecing
Receive the overall thickness of coil body 2000a and shielding patch, receiving coil 2000 is lifted one's head the height etc. of pad), receiving coil 2000
Outer diameter, receiving coil 2000 internal diameter, specifically, mechanical dimension can be measured by vernier caliper equidimension measuring instrument.
Wherein, working performance may include in actual use, identical for same set of transmission circuit, unified standard ambient stable, work
Time after the temperature rise value that reaches and efficiency of transmission etc., specifically, working performance can use temperature measuring device such as thermocouple, heat
The capture such as imager test, efficiency can be by calculating again after the reading of DC voltage and current table.
In the following, briefly describing the test method of the test fixture 1000 according to the embodiment of the present disclosure, test method includes step
It is rapid: transmitting coil 3000 to be placed on the second cover board 3, by 1 gland of medium frame plate on transmitting coil 3000, by receiving coil
2000 are placed on medium frame plate 1, by 2 gland of the first cover board on receiving coil 2000.It is easy to operate as a result, test result is good.
In some embodiments of the present disclosure, test method can be comprising steps of the first cover board 2 be removed, by receiving coil 2000
It removes, another receiving coil 2000 to be tested is placed on medium frame plate 1 and utilizes the reception to be tested of 2 gland of the first cover board
Coil 2000.Thus, it is possible to simply and easily realize the test for different receiving coils 2000.
In the description of this specification, reference term " one embodiment ", " some embodiments ", " example ", " specifically show
The description of example " or " some examples " etc. means specific features, structure, material or spy described in conjunction with this embodiment or example
Point is contained at least one embodiment or example of the disclosure.In the present specification, schematic expression of the above terms are not
It must be directed to identical embodiment or example.Moreover, particular features, structures, materials, or characteristics described can be in office
It can be combined in any suitable manner in one or more embodiment or examples.In addition, without conflicting with each other, the skill of this field
Art personnel can tie the feature of different embodiments or examples described in this specification and different embodiments or examples
It closes and combines.
While there has been shown and described that embodiment of the disclosure, it will be understood by those skilled in the art that: not
A variety of change, modification, replacement and modification can be carried out to these embodiments in the case where being detached from the principle and objective of the disclosure, this
Scope of disclosure is defined by the claims and their equivalents.
Claims (27)
1. a kind of test fixture, which is characterized in that the test fixture is used for the performance test of receiving coil, the test fixture
Including clamp assembly, the clamp assembly includes:
Medium frame plate, the thickness two sides of the medium frame plate are respectively the first side and second side；
First cover board, first cover board are located at first side of the medium frame plate, and for receiving coil to be folded in institute
It states between medium frame plate and first cover board；
Second cover board, second cover board are located at described second side of the medium frame plate, and for transmitting coil to be folded in institute
It states between medium frame plate and second cover board.
2. test fixture according to claim 1, which is characterized in that the thickness both side surface of the medium frame plate is respectively
One surface and second surface, the first surface are arranged in face of first cover board, and it is heavy that first is formed on the first surface
Slot, the receiving coil are adapted for engagement in first deep gouge.
3. test fixture according to claim 2, which is characterized in that first deep gouge is rectangular channel.
4. test fixture according to claim 2, which is characterized in that there is the first basic circle in first deep gouge, it is described
There are multiple wire casings of the circumferentially spaced distribution along first basic circle, the test fixture includes on the bottom wall of first deep gouge
It is embedded at the point temperature line of the wire casing.
5. test fixture according to claim 4, which is characterized in that the center of circle of first basic circle is first deep gouge
Center, each wire casing radially extending along first basic circle, week of multiple wire casings along first basic circle
It is distributed to being evenly spaced apart.
6. test fixture according to claim 5, which is characterized in that first deep gouge be depth be 0.3mm, side length is
The square groove of 60mm, the wire casing is eight and the width and depth of each wire casing are 0.5mm.
7. test fixture according to claim 2, which is characterized in that the first escape groove is formed on the first surface,
First escape groove is connected with first deep gouge, and the depth of first escape groove is greater than the depth of first deep gouge
Degree.
8. test fixture according to claim 2, which is characterized in that the medium frame plate and first cover board pass through first
Location structure location fit, first location structure are located at outside first deep gouge and are distributed around first deep gouge.
9. test fixture according to claim 8, which is characterized in that first location structure includes being set to described first
Surface it is multiple first protrusion and set on first cover board multiple first grooves, it is multiple it is described first protrusion with it is multiple described
First groove respectively corresponds location fit, and multiple first protrusions are spaced apart distribution along the contour edge of the first surface.
10. the test fixture according to any one of claim 2-9, which is characterized in that the second surface is in face of described
The setting of second cover board, the side surface in face of the medium frame plate of second cover board are third surface, the second surface with
The second deep gouge is formed at least one of described third surface, the transmitting coil is adapted for engagement in second deep gouge.
11. test fixture according to claim 10, which is characterized in that the center of second deep gouge is heavy with described first
The center of slot is located on same vertical line.
12. test fixture according to claim 10, which is characterized in that second deep gouge is circular trough.
13. test fixture according to claim 10, which is characterized in that have locating convex block, institute in second deep gouge
State the contour edge position that locating convex block is located at second deep gouge.
14. test fixture according to claim 10, which is characterized in that second deep gouge is formed in the third surface
On, the second escape groove is formed on the second surface, second escape groove is connected to second deep gouge, and described second keeps away
Make the inner end of slot opposite with the center of second deep gouge, the outer end of second escape groove extends and through the medium frame plate
Contour edge.
15. test fixture according to claim 14, which is characterized in that be formed with the first evacuation on the first surface
Slot, first escape groove are connected with first deep gouge, and the depth of first escape groove is greater than first deep gouge
Depth, second escape groove and first escape groove are oppositely arranged along the thickness direction of the medium frame plate.
16. test fixture according to claim 10, which is characterized in that the medium frame plate and second cover board pass through the
Two location structure location fits, second location structure are located at outside second deep gouge and are distributed around second deep gouge.
17. test fixture according to claim 16, which is characterized in that second location structure includes being set to described the
Multiple second protrusions on two surfaces and multiple second grooves set on the third surface, multiple second protrusions and multiple institutes
It states the second groove and respectively corresponds location fit, multiple second protrusions are spaced apart along the contour edge of the second surface divides
Cloth.
18. test fixture according to claim 1, which is characterized in that the medium frame plate and first cover board are
Bright part.
19. test fixture according to claim 1, which is characterized in that the test fixture further include:
Incubator component, the incubator component include cabinet, the temperature-adjusting device for adjusting the case body temperature and are used for
The detection device of the case body temperature is detected, the clamp assembly is located in the cabinet.
20. test fixture according to claim 1, which is characterized in that the test fixture further include:
First mat piece, is equipped with first mat piece between the medium frame plate and first cover board, the receiving coil is located at institute
It states between the first mat piece and first cover board.
21. test fixture according to claim 20, which is characterized in that first mat piece includes multiple first backing plates.
22. test fixture according to claim 21, which is characterized in that each first backing plate faces described first
The structure of one side surface of cover board is identical in face of the structure of a side surface of first cover board as the medium frame plate.
23. test fixture according to claim 1, which is characterized in that the test fixture further include:
Second mat piece, is equipped with second mat piece between the medium frame plate and second cover board, the transmitting coil is located at institute
It states between the second mat piece and second cover board.
24. test fixture according to claim 23, which is characterized in that second mat piece includes multiple second backing plates.
25. test fixture according to claim 24, which is characterized in that each second backing plate faces described second
The structure of one side surface of cover board is identical in face of the structure of a side surface of second cover board as the medium frame plate.
26. a kind of test method, which is characterized in that surveyed using test fixture described in any one of -25 according to claim 1
Examination, the test method comprising steps of
Transmitting coil is placed on second cover board, by the medium frame plate gland on the transmitting coil, line will be received
Circle is placed on the medium frame plate, by the first cover board gland on the receiving coil.
27. test method according to claim 26, which is characterized in that the test method further comprises the steps of: will be described
First cover board is removed, and the receiving coil is removed, another receiving coil to be tested is placed on the medium frame plate simultaneously benefit
With the first cover board gland.
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| CN117943307A (en) * | 2024-03-26 | 2024-04-30 | 四川省医学科学院·四川省人民医院 | Intelligent sorting platform for hospital textile management and sorting method thereof |
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