CN110306231A - 电解镀敷装置及电解镀敷方法 - Google Patents
电解镀敷装置及电解镀敷方法 Download PDFInfo
- Publication number
- CN110306231A CN110306231A CN201810886865.0A CN201810886865A CN110306231A CN 110306231 A CN110306231 A CN 110306231A CN 201810886865 A CN201810886865 A CN 201810886865A CN 110306231 A CN110306231 A CN 110306231A
- Authority
- CN
- China
- Prior art keywords
- processed
- substrate
- sealing member
- contact member
- electrolytic plating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1619—Apparatus for electroless plating
- C23C18/1628—Specific elements or parts of the apparatus
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1633—Process of electroless plating
- C23C18/1655—Process features
- C23C18/1664—Process features with additional means during the plating process
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/004—Sealing devices
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/005—Contacting devices
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/02—Tanks; Installations therefor
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02021—Edge treatment, chamfering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H01L21/6723—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one plating chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Electrochemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Sustainable Development (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Electroplating Methods And Accessories (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
Description
Claims (16)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018053267A JP6963524B2 (ja) | 2018-03-20 | 2018-03-20 | 電解メッキ装置 |
JP2018-053267 | 2018-03-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN110306231A true CN110306231A (zh) | 2019-10-08 |
CN110306231B CN110306231B (zh) | 2021-07-13 |
Family
ID=67984317
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810886865.0A Active CN110306231B (zh) | 2018-03-20 | 2018-08-06 | 电解镀敷装置及电解镀敷方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US10985006B2 (zh) |
JP (1) | JP6963524B2 (zh) |
CN (1) | CN110306231B (zh) |
TW (1) | TWI699460B (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI670491B (zh) * | 2018-12-10 | 2019-09-01 | 財團法人工業技術研究院 | 電化學製程裝置以及電化學製程裝置的操作方法 |
CA3167974A1 (en) | 2020-02-19 | 2021-08-26 | Michael Joseph Day | Visual signaling system |
Citations (17)
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CN1316023A (zh) * | 1998-07-10 | 2001-10-03 | 塞米用具公司 | 采用无电镀和电镀进行镀铜的方法和装置 |
CN1341166A (zh) * | 1999-12-24 | 2002-03-20 | 株式会社荏原制作所 | 基片的电镀装置和电镀方法以及电解处理方法及其装置 |
EP1193330A2 (en) * | 2000-09-20 | 2002-04-03 | Ebara Corporation | Plating apparatus and plating method for substrate |
CN1517453A (zh) * | 2003-01-21 | 2004-08-04 | ���ձ���Ŀ��������ʽ���� | 电镀装置、电镀杯以及阴极圈 |
CN1633520A (zh) * | 2001-08-10 | 2005-06-29 | 株式会社荏原制作所 | 镀膜装置和方法 |
CN1831209A (zh) * | 2005-02-25 | 2006-09-13 | 株式会社山本镀金试验器 | 电镀装置 |
CN1900358A (zh) * | 2005-07-06 | 2007-01-24 | 应用材料公司 | 用于将金属无电镀沉积到半导体衬底上的装置 |
CN101798698A (zh) * | 2008-12-10 | 2010-08-11 | 诺发系统有限公司 | 基底板、接触环、唇缘密封件与接触环以及电镀设备和电镀方法 |
CN103849919A (zh) * | 2012-11-30 | 2014-06-11 | 应用材料公司 | 具有薄隔膜支撑件的电镀处理器 |
CN104272438A (zh) * | 2012-03-28 | 2015-01-07 | 诺发系统公司 | 用于清洁电镀衬底保持器的方法和装置 |
CN105132979A (zh) * | 2014-06-02 | 2015-12-09 | 朗姆研究公司 | 用于优化电阻性衬底的电镀性能的晶片边缘的金属化 |
CN105624754A (zh) * | 2014-11-26 | 2016-06-01 | 诺发系统公司 | 用于半导体电镀装置的唇状密封件和触头元件 |
CN106337199A (zh) * | 2015-07-09 | 2017-01-18 | 朗姆研究公司 | 用于减少晶片粘着的集成的弹性体唇状密封件和杯底 |
CN107043953A (zh) * | 2015-09-11 | 2017-08-15 | 朗姆研究公司 | 电镀杯组件中的耐用低固化温度疏水涂层 |
TW201730382A (zh) * | 2015-12-04 | 2017-09-01 | 盛美半導體設備(上海)有限公司 | 基板保持装置 |
CN107208299A (zh) * | 2015-01-27 | 2017-09-26 | 应用材料公司 | 具有适用于凹槽的接触环密封件及窃流电极的电镀设备 |
CN107254702A (zh) * | 2011-08-15 | 2017-10-17 | 诺发系统有限公司 | 用于半导体电镀设备的唇形密封件和接触元件 |
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US6248222B1 (en) | 1998-09-08 | 2001-06-19 | Acm Research, Inc. | Methods and apparatus for holding and positioning semiconductor workpieces during electropolishing and/or electroplating of the workpieces |
JP2002249896A (ja) | 2001-02-26 | 2002-09-06 | Tokyo Electron Ltd | 液処理装置、液処理方法 |
JP2002309398A (ja) | 2001-04-16 | 2002-10-23 | Tokyo Electron Ltd | メッキ処理装置、メッキ処理方法 |
US20030188974A1 (en) * | 2002-04-03 | 2003-10-09 | Applied Materials, Inc. | Homogeneous copper-tin alloy plating for enhancement of electro-migration resistance in interconnects |
US7087144B2 (en) * | 2003-01-31 | 2006-08-08 | Applied Materials, Inc. | Contact ring with embedded flexible contacts |
US20070256937A1 (en) * | 2006-05-04 | 2007-11-08 | International Business Machines Corporation | Apparatus and method for electrochemical processing of thin films on resistive substrates |
JP5469178B2 (ja) | 2008-11-14 | 2014-04-09 | レプリサウルス グループ エスエーエス | 導電性基板をめっきするためのシステム、およびそのめっきの間に導電性基板を保持するための基板ホルダー |
JP5643239B2 (ja) | 2012-01-30 | 2014-12-17 | 株式会社荏原製作所 | 基板ホルダ及びめっき装置 |
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2018
- 2018-03-20 JP JP2018053267A patent/JP6963524B2/ja active Active
- 2018-08-06 CN CN201810886865.0A patent/CN110306231B/zh active Active
- 2018-08-06 TW TW107127305A patent/TWI699460B/zh active
- 2018-08-27 US US16/113,960 patent/US10985006B2/en active Active
Patent Citations (17)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1316023A (zh) * | 1998-07-10 | 2001-10-03 | 塞米用具公司 | 采用无电镀和电镀进行镀铜的方法和装置 |
CN1341166A (zh) * | 1999-12-24 | 2002-03-20 | 株式会社荏原制作所 | 基片的电镀装置和电镀方法以及电解处理方法及其装置 |
EP1193330A2 (en) * | 2000-09-20 | 2002-04-03 | Ebara Corporation | Plating apparatus and plating method for substrate |
CN1633520A (zh) * | 2001-08-10 | 2005-06-29 | 株式会社荏原制作所 | 镀膜装置和方法 |
CN1517453A (zh) * | 2003-01-21 | 2004-08-04 | ���ձ���Ŀ��������ʽ���� | 电镀装置、电镀杯以及阴极圈 |
CN1831209A (zh) * | 2005-02-25 | 2006-09-13 | 株式会社山本镀金试验器 | 电镀装置 |
CN1900358A (zh) * | 2005-07-06 | 2007-01-24 | 应用材料公司 | 用于将金属无电镀沉积到半导体衬底上的装置 |
CN101798698A (zh) * | 2008-12-10 | 2010-08-11 | 诺发系统有限公司 | 基底板、接触环、唇缘密封件与接触环以及电镀设备和电镀方法 |
CN107254702A (zh) * | 2011-08-15 | 2017-10-17 | 诺发系统有限公司 | 用于半导体电镀设备的唇形密封件和接触元件 |
CN104272438A (zh) * | 2012-03-28 | 2015-01-07 | 诺发系统公司 | 用于清洁电镀衬底保持器的方法和装置 |
CN103849919A (zh) * | 2012-11-30 | 2014-06-11 | 应用材料公司 | 具有薄隔膜支撑件的电镀处理器 |
CN105132979A (zh) * | 2014-06-02 | 2015-12-09 | 朗姆研究公司 | 用于优化电阻性衬底的电镀性能的晶片边缘的金属化 |
CN105624754A (zh) * | 2014-11-26 | 2016-06-01 | 诺发系统公司 | 用于半导体电镀装置的唇状密封件和触头元件 |
CN107208299A (zh) * | 2015-01-27 | 2017-09-26 | 应用材料公司 | 具有适用于凹槽的接触环密封件及窃流电极的电镀设备 |
CN106337199A (zh) * | 2015-07-09 | 2017-01-18 | 朗姆研究公司 | 用于减少晶片粘着的集成的弹性体唇状密封件和杯底 |
CN107043953A (zh) * | 2015-09-11 | 2017-08-15 | 朗姆研究公司 | 电镀杯组件中的耐用低固化温度疏水涂层 |
TW201730382A (zh) * | 2015-12-04 | 2017-09-01 | 盛美半導體設備(上海)有限公司 | 基板保持装置 |
Also Published As
Publication number | Publication date |
---|---|
TWI699460B (zh) | 2020-07-21 |
CN110306231B (zh) | 2021-07-13 |
JP6963524B2 (ja) | 2021-11-10 |
US10985006B2 (en) | 2021-04-20 |
JP2019163529A (ja) | 2019-09-26 |
TW201940749A (zh) | 2019-10-16 |
US20190295836A1 (en) | 2019-09-26 |
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Address after: Tokyo Patentee after: Kaixia Co.,Ltd. Address before: Tokyo Patentee before: TOSHIBA MEMORY Corp. Address after: Tokyo Patentee after: TOSHIBA MEMORY Corp. Address before: Tokyo Patentee before: Pangea Co.,Ltd. |
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