CN110286131A - A kind of textile flaw automatic detection analysis prompt system and method - Google Patents
A kind of textile flaw automatic detection analysis prompt system and method Download PDFInfo
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- CN110286131A CN110286131A CN201910616854.5A CN201910616854A CN110286131A CN 110286131 A CN110286131 A CN 110286131A CN 201910616854 A CN201910616854 A CN 201910616854A CN 110286131 A CN110286131 A CN 110286131A
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- 238000001514 detection method Methods 0.000 title claims abstract description 46
- 239000004753 textile Substances 0.000 title claims abstract description 39
- 238000000034 method Methods 0.000 title claims abstract description 11
- 239000004744 fabric Substances 0.000 claims abstract description 33
- 238000005457 optimization Methods 0.000 claims abstract description 32
- 238000003860 storage Methods 0.000 claims abstract description 16
- 238000012360 testing method Methods 0.000 claims abstract description 12
- 238000004519 manufacturing process Methods 0.000 claims abstract description 11
- 238000009941 weaving Methods 0.000 claims abstract description 9
- 230000006870 function Effects 0.000 claims description 4
- 230000005540 biological transmission Effects 0.000 claims description 3
- 150000001875 compounds Chemical class 0.000 claims description 3
- 230000002950 deficient Effects 0.000 claims description 3
- 230000008054 signal transmission Effects 0.000 claims description 3
- 230000005611 electricity Effects 0.000 claims 1
- 238000009987 spinning Methods 0.000 claims 1
- 230000007547 defect Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 4
- 208000028804 PERCHING syndrome Diseases 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 238000007689 inspection Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000004922 lacquer Substances 0.000 description 1
- 230000002045 lasting effect Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000010422 painting Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
- G01N21/8983—Irregularities in textured or patterned surfaces, e.g. textiles, wood for testing textile webs, i.e. woven material
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- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Wood Science & Technology (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The invention discloses a kind of textile flaw automatic detection analysis prompt system and methods, belong to image recognition detection technique field, automatic detection analysis prompt system includes the detection and analysis device being mounted on textile manufacturing line, the detection and analysis device includes flaw acquisition module, image optimization module, kernel control module, power module and interface module, and the detection and analysis device transmits testing result data to host computer by the interface module;The flaw acquisition module includes the camera for acquiring textile images signal, and the camera lens of the camera is against the fabric on textile manufacturing line;Described image optimization module is used to filter out the lines, optimization image and prominent cloth surface flaw of cloth weaving, and described image optimization module includes programmable storage chip PROM corresponding to fpga chip and chip.The degree of fabric flaw is tested and analyzed by the system automation, improves the efficiency that textile flaw is examined, while also saving cost.
Description
Technical field
The present invention relates to image recognition detection technique field, in particular to a kind of textile flaw automatic detection analysis prompt
System and method.
Background technique
The cost control when efficiency of quality of textile products control is for textile production enterprise, the final mass of product,
The critical issue of more advantages, and most heavy and most basic problem can be obtained in market competition.
The main purpose that fabric detects in textile production enterprise is to detect the type and quantity letter of flaw in textile
Breath is embodied as textile marking deciding grade and level, and collects about flaw for information about, and the problems in production point is concluded by intermediary, to mention
High quality of textile products reduces to lose providing data foundation because of quality problems bring.
However for a long time, textile Defect Detection is completed in a manner of artificial perching, and such mode automates pole
Low, artificial perching speed is generally per minute at 20 meters, and can not accomplish objective consistent evaluation with the vision-based detection of worker,
Testing result will receive that worker's physical condition, the state of mind and working experience etc. are subjective or objective many factors influence,
Textile flaw recall rate only about 60%-70%, will lead to erroneous detection and the missing inspection of a large amount of textile flaw, so that weaving
Product have hidden danger of quality when leaving the factory, finally since Defect Detection is efficient lower so that enterprise profit declines.
Summary of the invention
The object of the invention is that in order to solve above-mentioned textile Defect Detection low efficiency by the way of artificial perching
It is lower and a kind of textile flaw automatic detection analysis prompt system and method, tool are provided the problem of be easy to appear erroneous detection and missing inspection
Have the advantages that flaw automatic detection, efficiency and accuracy are high.
The present invention is achieved through the following technical solutions above-mentioned purpose, a kind of textile flaw automatic detection analysis prompt system
System, including the detection and analysis device being mounted on textile manufacturing line, the detection and analysis device includes flaw acquisition module, image
Optimization module, kernel control module, power module and interface module, the detection and analysis device are upward by the interface module
Position machine transmits testing result data;
The flaw acquisition module includes the camera for acquiring textile images signal, and the camera lens pair of the camera
The fabric on textile manufacturing line;
Described image optimization module is used to filter out the lines, optimization image and the prominent cloth surface flaw of cloth weaving
Defect, described image optimization module include programmable storage chip PROM corresponding to fpga chip and chip;
For the kernel control module for calculating flaw type and size, the kernel control module includes containing controllable figure
As processing module and the picture processing chip of control and memory.
Preferably, the interface module for realizing between modules signal transmission include can provide network, USB and
The multimedia chip of serial ports, erasable storage chip FLASH and EEPROM, serial port driving chip and network-driven chip.
Preferably, the serial port driving chip for driving the data between each serial ports to transmit, use by network-driven chip
The network interconnection between host computer and kernel control module is realized in driving cable network.
Preferably, the power module, which is converted to external 220VAC voltage, tests and analyzes what each chip in device needed
5VDC power supply.
A kind of textile flaw automatic detection analysis reminding method, comprising the following steps:
S1, the type according to fabric, density, by the programmable storage chip of corresponding image optimization algorithm write-in FPGA
In PROM, the lines of cloth weaving is filtered out by algorithm, is optimized image, is haved the function that prominent cloth surface flaw;
S2, the corresponding threshold value of algorithm and algorithm that the type of detection flaw will need in picture processing chip as needed
It is written in erasable storage chip FLASH,
S3, the top that camera used in flaw acquisition module is mounted on to cloth facilitate acquisition image letter against cloth
Breath;
The camera that S4, image optimization module receive step S3 collects image data, by the FPGA core of step S1
Send the picture processing chip of step S2 after piece processing optimization to by interface module, picture processing chip according to setting to image into
Row parsing, and synchronism output is to the multimedia chip of interface module, if final result is more than set threshold value, just by this figure
As being recorded as image defective, and flaw location is marked on the image;
S5, when picture processing chip discovery cloth have flaw when, information is sent to multimedia chip, more matchmakers by serial ports
Body chip can preserve the image of several frames in front and back, and information and image are passed through network transmission to host computer, if indefectible
Step S4 is then repeated, sends information to host computer when until detecting flaw again.
Preferably, picture processing chip uses the chip of model FH2010, has multiple images operation core in the chip,
Each core can handle a kind of video algorithm, by many algorithms compound operation, finally calculate the size and type of flaw.
Compared with prior art, the beneficial effects of the present invention are:
1, the image information of the acquisition cloth lasting on weaving assembly line by flaw acquisition module, the image information are first
By the optimization of image optimization module, then calculate by the picture processing chip inside kernel control module the size and kind of flaw
Class improves Defect Detection efficiency and accuracy, improves the product of enterprise so that automatic detection goes out the effect of textile flaw
Quality.
2, the system not only can be used to detect the flaw of textile surface, can be applied in such as metal sheet surface flaw
Smooth surface Defect Detection as defect detection or vehicle lacquer painting Defect Detection, using flexible is strong, applied widely.
Detailed description of the invention
Fig. 1 is total system mounting structure schematic diagram of the invention.
Fig. 2 is detection and analysis device built-in system structural schematic diagram of the invention.
Fig. 3 is core of the invention control module built-in system structural schematic diagram
Fig. 4 is system detection reminding method flow chart of the invention.
Fig. 5 is the attachment structure schematic diagram tested and analyzed in device between each chip of the invention.
In figure: 1, testing and analyzing device.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
It please refers to shown in Fig. 1-2, a kind of textile flaw automatic detection analysis prompt system, including is mounted on textile manufacturing
Detection and analysis device 1 on line, test and analyze device 1 include flaw acquisition module, image optimization module, kernel control module,
Power module and interface module test and analyze device 1 by interface module and transmit testing result data to host computer;Flaw acquisition
Module includes the camera for acquiring textile images signal, and the camera lens of the camera is against the base on textile manufacturing line
Cloth;Image optimization module is used to filter out the lines, optimization image and prominent cloth surface flaw of cloth weaving, image optimization
Module includes programmable storage chip PROM corresponding to fpga chip and chip;Kernel control module is for calculating flaw type
And size, kernel control module include the picture processing chip containing controllable image processing module and control and memory, interface mould
Block includes the multimedia chip that can provide network, USB and serial ports for realizing the signal transmission between modules, erasable to deposit
Chip FLASH and EEPROM are stored up, serial port driving chip and network-driven chip, driving chip play the work of driving interface module
With, so that different functions may be implemented in interface module, serial port driving chip is used to that the data between each serial ports to be driven to transmit,
The network interconnection that network-driven chip is used to that cable network to be driven to realize between host computer and kernel control module, power module will
External 220VAC voltage is converted to the 5VDC power supply for testing and analyzing that each chip needs in device 1, and power module is detection prompt dress
1 offer electric energy is provided.
As shown in Figure 3-4, a kind of textile flaw automatic detection analysis reminding method, comprising the following steps:
S1, the type according to fabric, density, by the programmable storage chip of corresponding image optimization algorithm write-in FPGA
In PROM, the lines of cloth weaving is filtered out by algorithm, is optimized image, is haved the function that prominent cloth surface flaw;
S2, the corresponding threshold value of algorithm and algorithm that the type of detection flaw will need in picture processing chip as needed
It is written in erasable storage chip FLASH,
S3, the top that camera used in flaw acquisition module is mounted on to cloth facilitate acquisition image letter against cloth
Breath;
The camera that S4, image optimization module receive step S3 collects image data, by the FPGA core of step S1
Send the picture processing chip of step S2 after piece processing optimization to by interface module, picture processing chip according to setting to image into
Row parsing, and synchronism output is to the multimedia chip of interface module, if final result is more than set threshold value, just by this figure
As being recorded as image defective, and flaw location is marked on the image;
S5, when picture processing chip discovery cloth have flaw when, information is sent to multimedia chip, more matchmakers by serial ports
Body chip can preserve the image of several frames in front and back, and information and image are passed through network transmission to host computer, if indefectible
Step S4 is then repeated, sends information to host computer when until detecting flaw again.
Picture processing chip uses the chip of model FH2010, has multiple images operation core, Mei Gehe in the chip
It can handle a kind of video algorithm, by many algorithms compound operation, finally calculate the size and type of flaw, it can be with needle
Different types of flaw can be optimized with corresponding algorithm, improve flaw recall rate, above-mentioned image optimization module
It is the prior art with algorithm used in kernel control module.
Connection type between each chip of entire automatic detection analysis prompt as shown in figure 4, interface module more matchmakers
Body chip model is SN98660, the model of the model AT24C04, EEPROM of erasable storage chip FLASH
MX25L128, the model MAX3485 of serial port driving chip and the signal of network-driven chip are IP101GR, image optimization
Programmable storage chip PROM model corresponding to the model XC3S1400AFT256C and chip of fpga chip used in module
For XCF32P, camera model OV7725 used in flaw acquisition module.Wherein, image optimization module input passes through CIF
Interface is connected with camera, and image optimization module output end is connected by CIF interface with interface module, picture processing chip
Connect by I2C interface with erasable storage chip EEPROM and interface section, picture processing chip by SPI interface with it is erasable
Except storage chip FLASH connection and interface section are connected, picture processing chip video input output end passes through CIF interface and connects
Oral area point connection, and input terminal CIF interface is connect with image optimization part, output end CIF interface and interface section include more
Media chip connection.
It is obvious to a person skilled in the art that invention is not limited to the details of the above exemplary embodiments, Er Qie
In the case where without departing substantially from spirit or essential attributes of the invention, the present invention can be realized in other specific forms.Therefore, no matter
From the point of view of which point, the present embodiments are to be considered as illustrative and not restrictive, and the scope of the present invention is by appended power
Benefit requires rather than above description limits, it is intended that all by what is fallen within the meaning and scope of the equivalent elements of the claims
Variation is included within the present invention.Any reference signs in the claims should not be construed as limiting the involved claims.
In addition, it should be understood that although this specification is described in terms of embodiments, but not each embodiment is only wrapped
Containing an independent technical solution, this description of the specification is merely for the sake of clarity, and those skilled in the art should
It considers the specification as a whole, the technical solutions in the various embodiments may also be suitably combined, forms those skilled in the art
The other embodiments being understood that.
Claims (6)
1. a kind of textile flaw automatic detection analysis prompt system, it is characterised in that: including being mounted on textile manufacturing line
It tests and analyzes device (1), the detection and analysis device (1) includes flaw acquisition module, image optimization module, core control mould
Block, power module and interface module, the detection and analysis device (1) transmit testing result to host computer by the interface module
Data;
The flaw acquisition module includes the camera for acquiring textile images signal, and the camera lens of the camera is against spinning
Knit the fabric on production line;
Described image optimization module is used to filter out the lines, optimization image and prominent cloth surface flaw of cloth weaving, institute
Stating image optimization module includes programmable storage chip PROM corresponding to fpga chip and chip;
For the kernel control module for calculating flaw type and size, the kernel control module includes containing at controllable image
Manage the picture processing chip of module and control and memory.
2. a kind of textile flaw automatic detection analysis prompt system according to claim 1, it is characterised in that: described to connect
Mouth mold block includes the multimedia chip that can provide network, USB and serial ports for realizing the signal transmission between modules, erasable
Except storage chip FLASH and EEPROM, serial port driving chip and network-driven chip.
3. a kind of textile flaw automatic detection analysis prompt system according to claim 2, it is characterised in that: the string
For row mouth driving chip for driving the data between each serial ports to transmit, network-driven chip is upper for driving cable network to realize
Network interconnection between machine and kernel control module.
4. a kind of textile flaw automatic detection analysis prompt system according to claim 1, it is characterised in that: the electricity
External 220VAC voltage is converted to and tests and analyzes the 5VDC power supply that each chip needs in device (1) by source module.
5. a kind of textile flaw automatic detection analysis reminding method, it is characterised in that: the following steps are included:
S1, the type according to fabric, density, by the programmable storage chip PROM of corresponding image optimization algorithm write-in FPGA
It is interior, the lines of cloth weaving is filtered out by algorithm, is optimized image, is haved the function that prominent cloth surface flaw;
The corresponding threshold value of the algorithm and algorithm that need in picture processing chip is written the type of S2, as needed detection flaw
In erasable storage chip FLASH,
S3, the top that camera used in flaw acquisition module is mounted on to cloth facilitate acquisition image information against cloth;
The camera that S4, image optimization module receive step S3 collects image data, at the fpga chip by step S1
Send the picture processing chip of step S2 after reason optimization to by interface module, picture processing chip solves image according to setting
Analysis, and synchronism output just remembers this image if final result is more than set threshold value to the multimedia chip of interface module
Record is image defective, and marks flaw location on the image;
S5, when picture processing chip discovery cloth have flaw when, information is sent to multimedia chip, multimedia core by serial ports
Sector-meeting preserves the image of several frames in front and back, and information and image are passed through network transmission to host computer, weighs if indefectible
Multiple step S4 sends information to host computer when until detecting flaw again.
6. a kind of textile flaw automatic detection analysis reminding method according to claim 5, it is characterised in that: at image
The chip that chip uses model FH2010 is managed, has multiple images operation core in the chip, each core can handle a kind of view
Frequency algorithm finally calculates the size and type of flaw by many algorithms compound operation.
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114280060A (en) * | 2021-12-28 | 2022-04-05 | 杭州信畅信息科技有限公司 | Intelligent textile cloth inspecting system based on machine vision |
CN114356249A (en) * | 2022-01-10 | 2022-04-15 | 苏州久道信息科技有限公司 | A processing system and processing method for automatically detecting and optimizing image quality |
CN114782794A (en) * | 2022-05-06 | 2022-07-22 | 浙江皓擎人工智能有限公司 | A leather surface texture recognition system based on image recognition and its operation method |
CN115908422A (en) * | 2023-01-10 | 2023-04-04 | 吉林省信息技术研究所 | Equipment quality detection device and method based on image recognition |
CN116979701A (en) * | 2023-09-22 | 2023-10-31 | 江苏德顺纺织有限公司 | Distribution method, system and storage medium of large textile equipment |
Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5990468A (en) * | 1994-11-02 | 1999-11-23 | Cornuejols; Georges | Device for the automatic detection and inspection of defects on a running web, such as a textile fabric |
CN201081763Y (en) * | 2007-01-30 | 2008-07-02 | 蹇木伟 | Textile defect detector |
CN102879401A (en) * | 2012-09-07 | 2013-01-16 | 西安工程大学 | Method for automatically detecting and classifying textile flaws based on pattern recognition and image processing |
JP2013072866A (en) * | 2011-09-29 | 2013-04-22 | Asahi Kasei Engineering Kk | Defect detection method |
CN103234980A (en) * | 2012-08-20 | 2013-08-07 | 苏州大学 | Online fabric flaw detection and alarm system based on machine vision |
CN103954632A (en) * | 2014-03-14 | 2014-07-30 | 东华大学 | Contact image sensor based gray fabric defect detection system |
JP2014167456A (en) * | 2013-01-30 | 2014-09-11 | Toyama Prefecture | Fabric defect inspection method and apparatus |
CN105203547A (en) * | 2015-08-26 | 2015-12-30 | 李云栋 | Cloth flaw detection method and device based on intelligent visual sensor |
CN107064160A (en) * | 2017-04-01 | 2017-08-18 | 佛山市南海天富科技有限公司 | The textile surface flaw detection method and system detected based on conspicuousness |
CN208155889U (en) * | 2018-05-28 | 2018-11-27 | 中兵国铁(广东)科技有限公司 | Textile defect detection device based on machine vision |
CN109342450A (en) * | 2018-10-30 | 2019-02-15 | 深圳灵图慧视科技有限公司 | Intelligent cloth examination device |
-
2019
- 2019-07-09 CN CN201910616854.5A patent/CN110286131A/en active Pending
Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5990468A (en) * | 1994-11-02 | 1999-11-23 | Cornuejols; Georges | Device for the automatic detection and inspection of defects on a running web, such as a textile fabric |
CN201081763Y (en) * | 2007-01-30 | 2008-07-02 | 蹇木伟 | Textile defect detector |
JP2013072866A (en) * | 2011-09-29 | 2013-04-22 | Asahi Kasei Engineering Kk | Defect detection method |
CN103234980A (en) * | 2012-08-20 | 2013-08-07 | 苏州大学 | Online fabric flaw detection and alarm system based on machine vision |
CN102879401A (en) * | 2012-09-07 | 2013-01-16 | 西安工程大学 | Method for automatically detecting and classifying textile flaws based on pattern recognition and image processing |
JP2014167456A (en) * | 2013-01-30 | 2014-09-11 | Toyama Prefecture | Fabric defect inspection method and apparatus |
CN103954632A (en) * | 2014-03-14 | 2014-07-30 | 东华大学 | Contact image sensor based gray fabric defect detection system |
CN105203547A (en) * | 2015-08-26 | 2015-12-30 | 李云栋 | Cloth flaw detection method and device based on intelligent visual sensor |
CN107064160A (en) * | 2017-04-01 | 2017-08-18 | 佛山市南海天富科技有限公司 | The textile surface flaw detection method and system detected based on conspicuousness |
CN208155889U (en) * | 2018-05-28 | 2018-11-27 | 中兵国铁(广东)科技有限公司 | Textile defect detection device based on machine vision |
CN109342450A (en) * | 2018-10-30 | 2019-02-15 | 深圳灵图慧视科技有限公司 | Intelligent cloth examination device |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114280060A (en) * | 2021-12-28 | 2022-04-05 | 杭州信畅信息科技有限公司 | Intelligent textile cloth inspecting system based on machine vision |
CN114356249A (en) * | 2022-01-10 | 2022-04-15 | 苏州久道信息科技有限公司 | A processing system and processing method for automatically detecting and optimizing image quality |
CN114782794A (en) * | 2022-05-06 | 2022-07-22 | 浙江皓擎人工智能有限公司 | A leather surface texture recognition system based on image recognition and its operation method |
CN115908422A (en) * | 2023-01-10 | 2023-04-04 | 吉林省信息技术研究所 | Equipment quality detection device and method based on image recognition |
CN115908422B (en) * | 2023-01-10 | 2023-12-29 | 吉林省信息技术研究所 | Equipment quality detection device and method based on image recognition |
CN116979701A (en) * | 2023-09-22 | 2023-10-31 | 江苏德顺纺织有限公司 | Distribution method, system and storage medium of large textile equipment |
CN116979701B (en) * | 2023-09-22 | 2023-12-05 | 江苏德顺纺织有限公司 | Distribution method, system and storage medium of large textile equipment |
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