CN110277383A - A kind of DBC plate layout method reducing GaN HEMT power module package parasitic inductance - Google Patents
A kind of DBC plate layout method reducing GaN HEMT power module package parasitic inductance Download PDFInfo
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Abstract
本发明涉及一种减小GaN HEMT功率模块封装寄生电感的DBC板布局方法,属于半导体封装技术领域,其中在DBC板上贴覆有电路设计布局的元器件,该元器件包括GaN芯片、MOS芯片、门极电阻及功率端子,DBC板上包括源极区、漏极区、门极区,GaN芯片、MOS芯片、门极电阻与DBC板之间通过锡膏回流焊接,GaN芯片、MOS芯片、门极电阻及功率端子之间留有的闲置空间为DBC板上的覆铜,本发明通过对DBC板的合理布局,通过改善DBC板表面覆铜的寄生电感,减小了因为GaN器件高频由于封装形式寄生过大而造成的损耗,实现了高频率GaN功率模块结构封装的方法。
The invention relates to a DBC board layout method for reducing the parasitic inductance of GaN HEMT power module packaging, which belongs to the technical field of semiconductor packaging, wherein the DBC board is pasted with circuit design and layout components, and the components include GaN chips and MOS chips , gate resistor and power terminal, DBC board includes source area, drain area, gate area, GaN chip, MOS chip, gate resistor and DBC board are soldered by solder paste reflow, GaN chip, MOS chip, The idle space left between the gate resistor and the power terminal is the copper clad on the DBC board. The present invention reduces the parasitic inductance of the copper clad on the surface of the DBC board by rationally laying out the DBC board and reducing the high frequency of the GaN device. Due to the loss caused by the excessive parasitic of the packaging form, the method of high-frequency GaN power module structure packaging is realized.
Description
技术领域technical field
本发明属于半导体封装技术领域,尤其是一种减小GaN HEMT功率模块封装寄生电感的DBC板布局方法。The invention belongs to the technical field of semiconductor packaging, in particular to a DBC board layout method for reducing the parasitic inductance of GaN HEMT power module packaging.
背景技术Background technique
GaN HEMT功率模块的DBC板布局主要是将所用到的MOS芯片、GaN芯片、电阻和功率端子合理的分布在DBC板上,在对模块中的DBC进行设计时,要考虑热应力设计、电路结构设计和EMC设计,与此同时还应考虑到设计中可能存在兼容性不够和热应力设计不合理的问题。The DBC board layout of the GaN HEMT power module is mainly to reasonably distribute the used MOS chips, GaN chips, resistors and power terminals on the DBC board. When designing the DBC in the module, thermal stress design and circuit structure should be considered Design and EMC design, at the same time, it should also take into account the possible problems of insufficient compatibility and unreasonable thermal stress design in the design.
GaN HEMT器件目前市场主要以单管为主,应用较为麻烦,需要设置驱动电路,且散热麻烦。The current market of GaN HEMT devices is mainly single-tube, and the application is more troublesome. It needs to set up a driving circuit, and it is troublesome to dissipate heat.
发明内容Contents of the invention
本发明的目的是设计一种减小GaN HEMT功率模块封装寄生电感的DBC板布局方法,使GaN芯片能模块化使用,该方法不仅兼容性高,提高了DBC板的使用率,还有效的降低寄生电感参数。The purpose of the present invention is to design a DBC board layout method that reduces the parasitic inductance of the GaN HEMT power module package, so that the GaN chip can be used in a modular manner. This method not only has high compatibility, improves the utilization rate of the DBC board, but also effectively reduces parasitic inductance parameters.
本发明采用的技术方案是:The technical scheme adopted in the present invention is:
一种减小GaN HEMT功率模块封装寄生电感的DBC板布局方法,其中在DBC板上贴覆有电路设计布局的元器件,该元器件包括GaN芯片、MOS芯片、门极电阻及功率端子,所述的DBC板上包括源极区、漏极区、门极区,关键在于,所述的GaN芯片、MOS芯片、门极电阻与DBC板之间通过锡膏回流焊接,所述的GaN芯片、MOS芯片、门极电阻及功率端子之间留有的闲置空间为DBC板上的覆铜。A DBC board layout method for reducing the parasitic inductance of a GaN HEMT power module package, wherein the DBC board is pasted with circuit design and layout components, the components include a GaN chip, a MOS chip, a gate resistor and a power terminal. The DBC board includes a source region, a drain region, and a gate region. The key point is that the GaN chip, the MOS chip, the gate resistor and the DBC board are soldered by solder paste reflow, and the GaN chip, The idle space left between the MOS chip, the gate resistor and the power terminal is the copper pour on the DBC board.
所述的闲置空间通过现安装于DBC板上的元器件数量小于该DBC板原设计布局元器件数量而获得;The idle space obtained by the number of components installed on the DBC board is less than the original design layout of the DBC board;
或者是,所述闲置空间通过改变DBC板上原设计布局的元器件安装位置而获得。Alternatively, the free space is obtained by changing the installation positions of components on the original design layout on the DBC board.
所述的门极区位于DBC板的边侧区域,门极区分布有门极电阻,GaN芯片、MOS芯片通过门极电阻与门极区连接,并通过导线引出。The gate area is located in the side area of the DBC board, and the gate area is distributed with gate resistors. The GaN chip and the MOS chip are connected to the gate area through the gate resistors and lead out through wires.
所述的漏极区位于DBC板的上部区域,源极区位于DBC板的下部区域,所述的GaN芯片与漏极区借助引线连接,所述的MOS芯片的源极借助引线与源极区连接,源极区、漏极区借助功率端子引出。The drain region is located in the upper region of the DBC plate, and the source region is located in the lower region of the DBC plate. The GaN chip and the drain region are connected by wires, and the source of the MOS chip is connected to the source region by wires. Connection, the source region and the drain region are drawn out by means of power terminals.
本发明的有益效果是:所述闲置空间覆铜主要是为了后续封装大功率模块时增加多颗芯片留有空间,使模块DBC板兼容性更强,减少设计成本;该布局方法实现了GaN芯片在功率模块方向的应用,布局电路走向距离短,回路小,最大限度的减少了元器件空间,减小寄生电感,继而减小因器件使用时带来的损耗和芯片性能下降的问题;驱动回路和电源回路分开设置,避免互相干扰,且DBC板布局适应多种电流的能力,使模块具有更大的电流密度,同时模块中的电流回路段使内部芯片在工作过程中减小不必要的能量损耗。The beneficial effect of the present invention is: the copper covering in the idle space is mainly to leave space for adding multiple chips when the high-power module is subsequently packaged, so that the compatibility of the module DBC board is stronger and the design cost is reduced; the layout method realizes the GaN chip In the application of the power module direction, the layout circuit has a short distance and a small loop, which minimizes the component space and reduces the parasitic inductance, thereby reducing the loss caused by the use of the device and the problem of chip performance degradation; the drive circuit It is set separately from the power circuit to avoid mutual interference, and the DBC board layout can adapt to a variety of currents, so that the module has a greater current density, and the current circuit section in the module reduces unnecessary energy during the working process of the internal chip loss.
附图说明Description of drawings
图1是本发明的结构示意图。Fig. 1 is a structural schematic diagram of the present invention.
图2是本发明中DBC板未设置芯片的布局图。Fig. 2 is a layout diagram of a DBC board without chips in the present invention.
图3是本发明的电路原理图。Fig. 3 is a schematic circuit diagram of the present invention.
附图中,1、DBC板,2、GaN芯片,3、MOS芯片,4、漏极区,5、源极区,6、门极区,7、门极电阻,8、负极输入,9、输出端,10、正极输入,11、上管门极,12、下管门极,13、功率端子,14、输出区域。In the accompanying drawings, 1. DBC board, 2. GaN chip, 3. MOS chip, 4. Drain region, 5. Source region, 6. Gate region, 7. Gate resistor, 8. Negative input, 9. Output terminal, 10, positive input, 11, upper tube gate, 12, lower tube gate, 13, power terminal, 14, output area.
具体实施方式Detailed ways
本发明涉及一种减小GaN HEMT功率模块封装寄生电感的DBC板布局方法,其中在DBC板1上贴覆有电路设计布局的元器件,该元器件包括GaN芯片2、MOS芯片3、门极电阻7及功率端子13,所述的DBC板1上包括源极区5、漏极区4、门极区6,关键在于,所述的GaN芯片2、MOS芯片3、门极电阻7与DBC板1之间通过锡膏回流焊接,所述的GaN芯片2、MOS芯片3、门极电阻7及功率端子13之间留有的闲置空间为DBC板1上的覆铜。The invention relates to a DBC board layout method for reducing the parasitic inductance of GaN HEMT power module packaging, wherein the DBC board 1 is pasted with circuit design and layout components, and the components include a GaN chip 2, a MOS chip 3, a gate Resistor 7 and power terminal 13, said DBC board 1 includes source region 5, drain region 4, gate region 6, the key is that said GaN chip 2, MOS chip 3, gate resistor 7 and DBC The boards 1 are soldered by solder paste reflow, and the idle space left between the GaN chip 2 , the MOS chip 3 , the gate resistor 7 and the power terminal 13 is the copper clad on the DBC board 1 .
下面结合附图及具体实施例对本发明作进一步说明。The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.
具体实施例,如图1-3所示,所述的门极区6位于DBC板1的边侧区域,门极区6分布有门极电阻7,GaN芯片2、MOS芯片3通过门极电阻7与门极区6连接,并通过导线引出。漏极区4位于DBC板1的上部区域,源极区5位于DBC板1的下部区域,GaN芯片2与漏极区4借助引线连接,MOS芯片3的源极借助引线与源极区5连接,DBC板1的源极区5的正极输入10、漏极区4的负极输入均由功率端子13引出,DBC板上还包括输出区域14,输出区域14的输出端9同样借助功率端子13引出,输出区域14连接整个模块中上桥臂的漏极和下桥臂的源极,同时承载了整个模块的输出,上桥臂指的是模块电气连接的源极区5到输出区域14,而下桥臂是指模块电气连接输出区域14到漏极区4。In a specific embodiment, as shown in Figures 1-3, the gate region 6 is located in the side area of the DBC board 1, and the gate region 6 is distributed with a gate resistor 7, and the GaN chip 2 and the MOS chip 3 pass through the gate resistor 7 is connected with the gate region 6 and is drawn out through wires. The drain region 4 is located in the upper region of the DBC board 1, the source region 5 is located in the lower region of the DBC board 1, the GaN chip 2 is connected to the drain region 4 by wires, and the source of the MOS chip 3 is connected to the source region 5 by wires , the positive input 10 of the source area 5 of the DBC board 1, and the negative input of the drain area 4 are all drawn out by the power terminal 13, and the DBC board also includes an output area 14, and the output end 9 of the output area 14 is also drawn out by means of the power terminal 13 , the output area 14 connects the drain of the upper bridge arm and the source of the lower bridge arm in the entire module, and carries the output of the entire module at the same time. The upper bridge arm refers to the source area 5 electrically connected to the output area 14 of the module, and The lower bridge arm means that the module electrically connects the output area 14 to the drain area 4 .
门极电阻7在多芯片并联的功率模块内部每颗芯片栅极之前的位置,目的是保护栅极,可以通过增加栅极电阻减小栅极回路在驱动脉冲激励下产生的振荡,也可以降低驱动器内部损耗,调节功率开关器件的通断速度,并且平衡每颗芯片的栅极控制回路和功率回路的分布电感,从而达到在模块开通时,每颗芯片承担的电流基本平衡,而模块在关断时,每颗芯片承担的电压也基本平衡。The gate resistor 7 is located before the gate of each chip in the multi-chip parallel power module. The purpose is to protect the gate. By increasing the gate resistance, the oscillation generated by the gate loop under the excitation of the driving pulse can also be reduced. The internal loss of the driver adjusts the on-off speed of the power switching device, and balances the distributed inductance of the gate control loop and the power loop of each chip, so that when the module is turned on, the current borne by each chip is basically balanced, and the module is turned off. When off, the voltage borne by each chip is basically balanced.
门极区6包括上管门极11和下管门极12,DBC板1的布局结构根据电路结构设计而成。The gate area 6 includes an upper tube gate 11 and a lower tube gate 12, and the layout structure of the DBC board 1 is designed according to the circuit structure.
本发明通过对DBC板的合理布局,DBC板采用较小的电路回路长度,使GaN HEMT功率模块的输入和输出之间的电流回路尽可能减小,继而能减小模块的寄生电感,减小了因为GaN器件高频由于封装形式寄生过大而造成的损耗,实现了高频率GaN功率模块结构封装的方法,使模块能够种类多样化,同一结构能够生产不同型号的产品,适应各种应用领域。;在此基础上DBC板上的各个工作区域都尽可能的达到最小,目的是使每一个区域都能充分利用,且在多种功率系列中都能采用同种DBC板类型,提升了DBC板的兼容性。本发明设计的DBC板的布局,寄生电感是通过Q3D软件进行仿真调整的,目的在于尽量减少GaN芯片与漏极区域和源极区域之间的走线,减小其寄生电感,从而减少器件使用过程中的热量产生。In the present invention, through the reasonable layout of the DBC board, the DBC board adopts a smaller circuit loop length, so that the current loop between the input and output of the GaN HEMT power module is reduced as much as possible, and then the parasitic inductance of the module can be reduced, and the It eliminates the loss caused by high-frequency GaN devices due to excessive parasitic packaging, and realizes the high-frequency GaN power module structure packaging method, so that the types of modules can be diversified, and the same structure can produce different types of products, adapting to various application fields . ; On this basis, each working area on the DBC board is minimized as much as possible. compatibility. The layout of the DBC board designed by the present invention, the parasitic inductance is simulated and adjusted by Q3D software, the purpose is to minimize the wiring between the GaN chip and the drain region and the source region, reduce its parasitic inductance, thereby reducing the use of devices heat generated in the process.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111755391A (en) * | 2020-07-10 | 2020-10-09 | 同辉电子科技股份有限公司 | A low parasitic inductance SiC module and welding method of a silicon carbide full bridge module |
| CN113067472A (en) * | 2021-03-16 | 2021-07-02 | 苏州悉智科技有限公司 | Power semiconductor packaging structure |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201508835U (en) * | 2009-04-02 | 2010-06-16 | 嘉兴斯达微电子有限公司 | Novel Insulated Gate Bipolar Transistor Module with Direct Copper Substrate Layout |
| CN104124213A (en) * | 2013-04-28 | 2014-10-29 | 无锡华润安盛科技有限公司 | Method for balancing stress on DBC (Direct Bonding Copper) board and DBC board package structure |
| CN105191131A (en) * | 2013-03-25 | 2015-12-23 | 株式会社安川电机 | power conversion device |
| CN107275316A (en) * | 2016-04-04 | 2017-10-20 | 英飞凌科技股份有限公司 | With source electrode is in the transistor dies of lower configuration and drains in the semiconductor packages of the transistor dies of lower configuration |
| CN107667422A (en) * | 2015-05-15 | 2018-02-06 | 夏普株式会社 | Composite semiconductor device |
| CN108736755A (en) * | 2017-04-25 | 2018-11-02 | 三菱电机株式会社 | Power semiconductor device and electric semiconductor drive system |
-
2019
- 2019-05-30 CN CN201910461457.5A patent/CN110277383A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201508835U (en) * | 2009-04-02 | 2010-06-16 | 嘉兴斯达微电子有限公司 | Novel Insulated Gate Bipolar Transistor Module with Direct Copper Substrate Layout |
| CN105191131A (en) * | 2013-03-25 | 2015-12-23 | 株式会社安川电机 | power conversion device |
| CN104124213A (en) * | 2013-04-28 | 2014-10-29 | 无锡华润安盛科技有限公司 | Method for balancing stress on DBC (Direct Bonding Copper) board and DBC board package structure |
| CN107667422A (en) * | 2015-05-15 | 2018-02-06 | 夏普株式会社 | Composite semiconductor device |
| CN107275316A (en) * | 2016-04-04 | 2017-10-20 | 英飞凌科技股份有限公司 | With source electrode is in the transistor dies of lower configuration and drains in the semiconductor packages of the transistor dies of lower configuration |
| CN108736755A (en) * | 2017-04-25 | 2018-11-02 | 三菱电机株式会社 | Power semiconductor device and electric semiconductor drive system |
Non-Patent Citations (1)
| Title |
|---|
| FANG LUO等: "Advanced Power Module Packaging and Integration Structures for High Frequency Power Conversion:From Silicon to GaN ", 《电力电子技术》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111755391A (en) * | 2020-07-10 | 2020-10-09 | 同辉电子科技股份有限公司 | A low parasitic inductance SiC module and welding method of a silicon carbide full bridge module |
| CN113067472A (en) * | 2021-03-16 | 2021-07-02 | 苏州悉智科技有限公司 | Power semiconductor packaging structure |
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