CN110187177B - All-in-one photoelectronic device frequency response testing device and method - Google Patents
All-in-one photoelectronic device frequency response testing device and method Download PDFInfo
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Abstract
本发明请求保护一种多合一的光电子器件频率响应测试装置及方法。本发明由激光器、移频外差干涉模块、待测光电探测器和频谱分析模块组成，其中，移频外差干涉模块由待测电光调制器与移频器组成，且分别放置于干涉模块的马赫‑曾德上、下臂中，激光器、移频外差干涉模块和待测光电探测器依次光连接，微波信号源与待测电光调制器的输入电极端为电连接，待测光电探测器输出端与频谱分析模块为电连接；设置微波信号源在相同工作频率下的两次不同输出电压驱动的情况下，通过频谱分析模块，获得对应成分的功率比值，通过两次不同驱动下功率比值的比，实现对待测电光调制器的频率响应测试，进而反算出待测光电探测器频率响应，最终实现频率响应自校准测试。
The present invention claims an all-in-one optoelectronic device frequency response testing device and method. The invention consists of a laser, a frequency-shifted heterodyne interference module, a photodetector to be measured and a spectrum analysis module, wherein the frequency-shifted heterodyne interference module is composed of an electro-optical modulator to be measured and a frequency shifter, and is respectively placed in the interference module. In the upper and lower arms of Mach-Zengde, the laser, the frequency-shifted heterodyne interference module and the photodetector to be tested are optically connected in sequence, and the microwave signal source is electrically connected to the input electrode of the electro-optical modulator to be tested. The photodetector to be tested is electrically connected. The output terminal is electrically connected to the spectrum analysis module; when the microwave signal source is set to be driven by two different output voltages at the same operating frequency, the power ratio of the corresponding component is obtained through the spectrum analysis module, and the power ratio of the corresponding components is obtained through the two different drives. The frequency response test of the electro-optical modulator under test is realized, and then the frequency response of the photodetector under test is calculated inversely, and the frequency response self-calibration test is finally realized.
Description
Technical Field
The invention belongs to the technical field of photoelectrons, and particularly relates to a frequency response testing device and method for an all-in-one photoelectronic device.
Background
With the advent of 5G mobile communication, the demand for communication rate and data capacity has increased explosively. At present, the rapid development of an optical fiber communication system is a basic guarantee for the popularization of 5G mobile communication in the future, and as a basic component of the optical fiber communication system, namely an optoelectronic device, characteristic parameters of the optoelectronic device are the key points for determining communication capacity, bandwidth and speed, and meanwhile, the realization of accurate characterization of the characteristic parameters of the optoelectronic device plays a crucial role in research, design, manufacture and optimization of the optoelectronic device, so that the research on the characteristic parameters of the optoelectronic device is particularly important.
The current method for measuring the frequency response of the optoelectronic device is different according to the types of the devices to be measured. Among them, in the optical domain test method, the spectrum analysis method can realize the measurement of the frequency response of the electro-optical modulator, (y.q.shi, l.s.yan, a.e.willner, "High-speed electronic modulator using optical spectrum analysis," Journal of Lightwave Technology,2003,21(10): 2358-; in the electric field measurement method, the frequency sweep method (y.q.heng, m.xue, w.chen, s.l.han, j.q.liu, and s.l.pan, "Large-dynamic frequency feedback measurement for hybrid electro-optical phase modulators," IEEE Photonics Technology Letters,2019,31(4):291-294. d.a.humitreys, "Integrated-optical system for high-speed-spectral photodetector base bandwidth measurements," Electronics Letters,1989,25(23):1555 1557.) makes full use of the optoelectronic fine test characteristics of the vector network analyzer, can achieve high-precision relative frequency response tests, however, requires additional calibration and is complicated; the heterodyne method (s.j.zhang, c.zhang, h.wang, x.h.zuo, y.l.zhang, y.liu, and j.e.bowers, "Self-calibrated microwave communication of high-speed optoelectronic device by terrestrial modulation mapping," Journal of bright wave Technology,35(10),1952-1961.) is a method for achieving a high-precision, Self-calibrated absolute frequency response test of an optoelectronic device by configuring the frequency relationship of two modulation signals, however, this scheme requires an additional auxiliary broadband source and a broadband modulator for eliminating the influence of the frequency response of other devices of the system, and the system overhead is large.
Disclosure of Invention
The present invention is directed to solving the above problems of the prior art. The frequency response testing device and method for the all-in-one photoelectronic device are capable of achieving high resolution, high precision, low cost and self-calibration electric domain measurement of characteristic parameters of the all-in-one photoelectronic device with multiple devices and multiple parameters. The technical scheme of the invention is as follows:
a frequency response testing device for an all-in-one photoelectronic device comprises a laser, a signal source, a frequency shift heterodyne interference module, a photoelectric detector to be tested and a spectrum analysis module; the frequency shift heterodyne interference module consists of an electro-optical modulator to be tested and a frequency shifter, and is respectively arranged in the Mach-Zehnder upper arm and the Mach-Zehnder lower arm of the frequency shift heterodyne interference module; the signal source is electrically connected with an input electrode end of the electro-optical modulator to be tested; the laser, the frequency shift heterodyne interference module and the photoelectric detector to be detected are sequentially connected in an optical mode; the output end of the photoelectric detector to be tested is electrically connected with the spectrum analysis module, the laser is used for lasing direct current light waves, the signal source is used for generating sine microwave signals, the frequency shift heterodyne interference module is used for realizing heterodyne beat frequency of the light waves, the photoelectric detector to be tested is used for detecting light signals, the spectrum analysis module is used for analyzing spectrum information of signals output by the photoelectric detector, the electro-optical modulator to be tested is used for loading sine microwave signals onto the direct current light waves, the frequency shifter is used for realizing frequency shift of the direct current light waves, the signal source is set to be driven by two different output voltages under the same working frequency, the power ratio of corresponding components is obtained through the spectrum analysis module, frequency response test of the electro-optical modulator to be tested is realized through the ratio of the power ratios under two different driving, and then frequency response of the photoelectric detector to be tested is calculated in a reverse mode.
Further, the electro-optical modulator to be measured is an electro-optical phase modulator or an electro-optical intensity modulator, and is used for modulating the phase or the intensity of the direct current light wave.
Further, when the electro-optical modulator to be tested is an electro-optical phase modulator, the electric field E of the optical signal is modulatedPMExpressed as:
wherein A is1Is the amplitude of the optical carrier in the upper arm, m is the modulation coefficient of the electro-optical modulator to be measured, Jp(. cndot.) is a Bessel function of the first kind at order p, j is a complex number;
relatively fixed low frequency f of detector to be detectedsThe frequency response of (a) is:
wherein, J0(. o) Bessel function of the first order 0, J1(. DEG) is a Bessel function of the first order 1, R (f)s) And R (f)1±fs) Respectively at frequency f for the photodetector to be measuredsAnd f1±fsThe responsivity of the transducer.
Further, when the electro-optical modulator to be tested is an electro-optical intensity modulator, the electric field E of the optical signal is modulatedMZMExpressed as:
in the formula, phi is a phase difference caused by bias voltage;
obtaining the relatively fixed low frequency f of the detector to be detectedsThe frequency response of (a) is:
an optoelectronic device frequency response testing method based on the device comprises the following steps:
(1) the signal source generates a frequency f1And an amplitude of VsThe microwave signal is loaded on the light wave through the electro-optical modulator to be tested, the signal is modulated and the frequency is shifted by the frequency shiftersThe optical carrier wave is combined, the combined optical signal is sent to a photoelectric detector for photoelectric conversion to obtain a mixing signal, and a frequency component f in the mixing signal is recorded by a spectrum analysis modulesAnd f1±fsThe amplitude ratio of (a);
(2) changing the amplitude of the output microwave signal to V without changing the frequency of the microwave signal sources'＝rVsRecording the frequency component f in the mixing signal by using a spectrum analysis modulesAnd f1±fsThe amplitude ratio of (a);
(3) eliminating the frequency response of the photoelectric detector to be measured through the ratio of the amplitude ratios of the two times in the steps (1) and (2), and solving the modulation coefficient m of the photoelectric modulator to be measured as the amplitude ratio r of the modulated signals of the two times is known;
(4) after the modulation coefficient of the electro-optic modulator to be measured is obtained, calculating the responsivity R of the electro-optic detector to be measured reversely through the frequency component amplitude ratio;
(5) varying the frequency f of a microwave signal source1And repeating the above processes to obtain the frequency responses of the electro-optical modulator to be tested and the photoelectric detector to be tested at different frequencies, thereby realizing the self-calibration test of the frequency response of the all-in-one photoelectronic device.
Further, the step (1) uses a spectrum analysis module to record the frequency component f in the mixed signalsAnd f1±fsThe amplitude ratio of (a) is:
in the formula, H represents the frequency component f in the mixing signalsAnd f1±fsM is a function on M and R is the responsivity of the photodetector to be measured.
Further, in the step (2), the amplitude of the output microwave signal is changed to be V under the condition that the frequency of the microwave signal source is not changeds'＝rVsRecording the frequency component f in the mixing signal by using a spectrum analysis modulesAnd f1±fsThe amplitude ratio of (a) is:
wherein M' is a function of r and M;
further, the amplitude ratio r of the two microwave signal drives is not equal to 1.
The invention has the following advantages and beneficial effects:
(1) the device adopts a frequency shift heterodyne interference structure, avoids the problem that the interference structure is easy to shake caused by the external environment, and realizes a stable frequency response test structure of the optoelectronic device.
(2) Under the condition of not dismantling the test system, the invention utilizes the principle of two times of different microwave signal voltage driving, can eliminate the frequency response of an additional device in the test system through the ratio of the required frequency mixing components, and simultaneously realizes the self-calibration test of the frequency response of the electro-optical modulator and the photoelectric detector.
(3) The frequency responses of different types of optoelectronic devices can be tested only by the same test system, compared with the existing frequency shift heterodyne interference method, the self-calibration test does not need an additional broadband microwave source and a broadband modulator, has the advantages of simple test structure and low cost, and realizes the low-cost and all-in-one self-calibration test.
(4) The invention utilizes the principle of frequency shift heterodyne interference to map the heterodyne beat frequency of the optical wave sideband information to an electric domain with high-precision analysis capability for analysis and detection, and can realize the frequency response test of the optoelectronic device with high resolution by only tuning the sweep frequency interval of the sweep frequency test.
Drawings
Fig. 1 is a connection structure diagram of a frequency response testing device for an all-in-one optoelectronic device according to a preferred embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be described in detail and clearly with reference to the accompanying drawings. The described embodiments are only some of the embodiments of the present invention.
The technical scheme for solving the technical problems is as follows:
as shown in fig. 1, an all-in-one optoelectronic device frequency response testing apparatus includes a laser, a frequency shift heterodyne interference module, a to-be-tested photodetector, and a spectrum analysis module; the frequency shift heterodyne interference module consists of an electro-optical modulator to be tested and a frequency shifter, and is respectively arranged in an upper arm and a lower arm of the interference module; the microwave signal source is electrically connected with the electro-optical modulator to be tested; the laser, the frequency shift heterodyne interference module and the photoelectric detector to be detected are sequentially connected in an optical mode; the photoelectric detector to be detected is electrically connected with the spectrum analysis module; the electro-optical modulator to be tested can be an electro-optical phase modulator or an electro-optical intensity modulator.
The invention relates to a testing principle and a method of frequency response of an all-in-one photoelectronic device, which comprises the following steps:
the laser emitting frequency is f0The optical carrier wave enters into the frequency shift heterodyne interference module, the optical carrier wave on the upper arm of the interference module enters into the electro-optical modulator to be tested, and a sinusoidal signal V (t) V ═ V generated by a microwave signal sourcessin2πf1t is electro-optically modulated.
(1) When the electro-optical modulator to be tested is an electro-optical phase modulator, modulating the electric field E of the optical signalPMExpressed as:
wherein A is1For optical carriers in the upper armAmplitude of (d), m (f)1) At modulation frequency f for the electro-optical modulator to be tested1Modulation factor of (J)p(. cndot.) is a Bessel function of the first kind at the p-th order, and j is a complex number.
The optical carrier wave at the lower arm of the interference module enters a frequency shifter for frequency shift fsThe light carrier light field after is:
the combined optical signal output by the interference arm is detected by a photoelectric detector to be detected, and the output photocurrent is as follows:
mixing of electrical signals by means of a spectral analysis module1±fsAnd fsThe corresponding amplitudes are respectively:
i(f1±fs)＝2A1A2J1[m(f1)]R(f1±fs) (4a)
i(fs)＝2A1A2J0[m(f1)]R(fs) (4b)
the amplitude ratio of the two mixing components is:
adjusting the amplitude of the modulated signal to Vs'＝rVsSimilarly, the amplitude ratio of the two mixing components is obtained as follows:
the ratio of the two amplitude ratios is:
solving the formula (7), obtaining the modulation coefficient m of the phase modulator to be measured, and substituting the value of m into the formula (5) to obtain the relatively fixed low frequency f of the detector to be measuredsThe frequency response of (a) is:
(2) when the electro-optical modulator to be measured is an electro-optical intensity modulator (Mach-Zehnder modulator), an optical signal electric field E is modulatedMZMExpressed as:
in the formula, φ represents a phase difference caused by the bias voltage.
Similarly, through the spectrum analysis module, the amplitude ratios in the two times of different power driving are respectively:
the ratio of the two amplitude ratios is:
when phi is1＝0，φ2When pi is obtained, the modulation coefficient m of the intensity modulator to be measured can be obtained by solving the formula (11), and the value of m is substituted into the formula (10a) to obtain the relatively fixed low frequency f of the detector to be measuredsThe frequency response of (a) is:
therefore, in a fixed test system, the invention can realize self-calibration test of the frequency response of various optoelectronic devices.
Examples
The output power of the laser is 10mW, and the frequency f0193THz (wavelength of about 1550 nm). The microwave signal source generates a frequency f1The optical modulator to be tested is modulated by a sinusoidal signal of 20GHz, the frequency shift amount of an optical carrier in the lower arm of the frequency shift heterodyne interference module is 70MHz, the coupled output signals of the upper arm and the lower arm are detected by the photoelectric detector to be tested, the output photocurrent is analyzed by the frequency spectrum analysis module, the power of two different signal drives is respectively 10dBm and 4dBm, and at the moment, the voltage amplitude ratio of the driving signal is r 0.5. (1) When the phase modulator and the photoelectric detector are tested in frequency response, the amplitude ratio of the mixing signals driven by two different signals is respectively H-16.52 dB and H' -22.65dB, the ratio of the two amplitude ratios is 6.14dB, the formula (7) can be used for obtaining the ratio, the modulation coefficient of the phase modulator to be tested at the frequency of 20GHz is m-0.371, and the formula (8) is substituted for obtaining the relatively fixed low frequency f of the photoelectric detector to be tested at the frequency of 20GHzsThe relative frequency response at 70MHz is-2.04 dB; (2) during the frequency response test of the Mach-Zehnder modulator and the photoelectric detector, when the power of signal driving is 10dBm and the phase difference caused by bias voltage is 0, the amplitude ratio of the mixing signal is H-21.56 dB, when the power of signal driving is 4dBm and the phase difference caused by bias voltage is pi, the amplitude ratio of the mixing signal is H' -17.53 dB, the ratio of the two amplitude ratios is-39.09 dB, the modulation coefficient of the phase modulator to be tested at the frequency of 20GHz is m-0.421, and the photoelectric detector to be tested is relatively fixed at the frequency of 20GHz by substituting the formula (10a) and has the low frequency fsThe relative frequency response at 70MHz is-2.01 dB.
The above examples are to be construed as merely illustrative and not limitative of the remainder of the disclosure. After reading the description of the invention, the skilled person can make various changes or modifications to the invention, and these equivalent changes and modifications also fall into the scope of the invention defined by the claims.
Claims (5)
1. The frequency response testing device of the all-in-one photoelectronic device is characterized by comprising a laser, a signal source, a frequency shift heterodyne interference module, a photoelectric detector to be tested and a spectrum analysis module; the frequency shift heterodyne interference module consists of an electro-optical modulator to be tested and a frequency shifter, and is respectively arranged in the Mach-Zehnder upper arm and the Mach-Zehnder lower arm of the frequency shift heterodyne interference module; the signal source is electrically connected with an input electrode end of the electro-optical modulator to be tested; the laser, the frequency shift heterodyne interference module and the photoelectric detector to be detected are sequentially connected in an optical mode; the output end of the photoelectric detector to be tested is electrically connected with the spectrum analysis module, the laser is used for generating direct current light waves, the signal source is used for generating sine microwave signals, the frequency shift heterodyne interference module is used for realizing heterodyne beat frequency of the light waves, the photoelectric detector to be tested is used for detecting light signals, the spectrum analysis module is used for analyzing spectrum information of the output signals of the photoelectric detector, the photoelectric modulator to be tested is used for loading the sine microwave signals onto the direct current light waves, the frequency shifter is used for realizing frequency shift of the direct current light waves, the signal source is set to be driven by two different output voltages under the same working frequency, the power ratio of corresponding components is obtained through the spectrum analysis module, the frequency response test of the photoelectric modulator to be tested is realized through the ratio of the power ratios under two different drives, and then the frequency response of the photoelectric detector to be tested is back calculated;
the electro-optical modulator to be tested is an electro-optical phase modulator or an electro-optical intensity modulator and is used for modulating the phase or the intensity of the direct current light wave;
when the electro-optical modulator to be tested is an electro-optical phase modulator, modulating the electric field E of the optical signalPMExpressed as:
wherein A is1Amplitude of optical carrier in upper arm, m (f)1) At modulation frequency f for the electro-optical modulator to be tested1Modulation factor of (J)p(. cndot.) is a Bessel function of the first kind at order p, j is a complex number;
relatively fixed low frequency f of detector to be detectedsThe frequency response of (a) is:
wherein, J0(. o) Bessel function of the first order 0, J1(. DEG) is a Bessel function of the first order 1, R (f)s) And R (f)1±fs) Respectively at frequency f for the photodetector to be measuredsAnd f1±fsThe responsivity of the site; when the electro-optical modulator to be tested is an electro-optical intensity modulator, modulating the electric field E of the optical signalMZMExpressed as:
in the formula, phi is a phase difference caused by bias voltage;
obtaining the relatively fixed low frequency f of the detector to be detectedsThe frequency response of (a) is:
2. an optoelectronic device frequency response testing method based on the device of claim 1, which is characterized by comprising the following steps:
(1) the signal source generates a frequency f1And an amplitude of VsThe microwave signal is loaded on the light wave through the electro-optical modulator to be tested, the signal is modulated and the frequency is shifted by the frequency shiftersThe optical carrier wave is combined, the combined optical signal is sent to a photoelectric detector for photoelectric conversion to obtain a mixing signal, and a spectrum analysis module is used for recording the mixing signalFrequency component fsAnd f1±fsThe amplitude ratio of (a);
(2) changing the amplitude of the output microwave signal to V without changing the frequency of the microwave signal sources'＝rVsRecording the frequency component f in the mixing signal by using a spectrum analysis modulesAnd f1±fsThe amplitude ratio of (a);
(3) eliminating the frequency response of the photoelectric detector to be measured through the ratio of the amplitude ratios of the two times in the steps (1) and (2), and solving the modulation coefficient m of the photoelectric modulator to be measured as the amplitude ratio r of the modulated signals of the two times is known;
(4) after the modulation coefficient of the electro-optic modulator to be measured is obtained, calculating the responsivity R of the electro-optic detector to be measured reversely through the frequency component amplitude ratio;
(5) varying the frequency f of a microwave signal source1And repeating the above processes to obtain the frequency responses of the electro-optical modulator to be tested and the photoelectric detector to be tested at different frequencies, thereby realizing the self-calibration test of the frequency response of the all-in-one photoelectronic device.
3. The optoelectronic device frequency response testing method of claim 2,
the step (1) records the frequency component f in the mixing signal by using a spectrum analysis modulesAnd f1±fsThe amplitude ratio of (a) is:
in the formula, H represents the frequency component f in the mixing signalsAnd f1±fsM is a function on M and R is the responsivity of the photodetector to be measured.
4. The method for testing the frequency response of the optoelectronic device according to claim 2, wherein the step (2) changes the amplitude of the output microwave signal to V without changing the frequency of the microwave signal sources'＝rVsUsing frequency spectrumThe analysis module records the frequency component f in the mixing signalsAnd f1±fsThe amplitude ratio of (a) is:
where M' is a function of r and M.
5. The optoelectronic device frequency response testing method according to one of claims 2 to 4, wherein the amplitude ratio r ≠ 1 of the two microwave signal drives.
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