CN110099348A - Has the microphone element test holder structure of more acoustical generators - Google Patents

Abstract

The invention relates to a kind of microphone elements for having more acoustical generators to test holder structure, include a Test bench, one first acoustical generator, one second acoustical generator, a reference microphone and a tested microphone.There is a TCH test channel, which includes multiple communication ports, and first acoustical generator provides the source of sound of a high sound pressure, sounding mouth connecting test channel inside Test bench；Second acoustical generator provides a source of sound pressed in a low voice, sounding mouth connecting test channel.Wherein, the source of sound of the first acoustical generator and the second acoustical generator can be sent out respectively, or can be sent out simultaneously to be superimposed to a specific acoustic pressure, be provided to tested microphone and tested.Whereby, the present invention can detect simultaneously the acoustical range pressed in a low voice with high sound pressure by single test holder structure, and in the range of low total harmonic distortion, suitable for testing the high sound pressure demand of tested microphone, effectively reduce testing time and testing process.

Description

Microphone Component Test Stand Structure with Multiple Sounders

technical field

The invention relates to a structure of a microphone element test seat with multiple sounders, in particular to a structure of a microphone element test seat with multiple sounders which is suitable for testing a microphone under test.

Background technique

Please refer to FIG. 6 , which is a schematic diagram of the structure of the existing microphone component test socket. As shown in the figure, when the pressure sensing device 907 of the existing microphone element test seat structure is to be tested, if there are more than two sound generators, generally due to the relationship between the configuration structure and the frequency response of the sound wave, two sound generators are usually used. The devices are arranged separately, such as the microphone element test seat structure disclosed in US Patent No. 20140076052. In the figure, a first sound generator 901 is located at one end of a chamber 903, and transmits the test sound wave to the chamber 903 along a sound path. A pressure input port 904 inside, and a second sound generator 917 is arranged outside the shell of a pressure sensing device 907, which can transmit sound to the pressure input port 904 of the chamber 903 along a gap 906, forming another The transmission path of the sound source.

However, the above-mentioned second sounder 917 is to test the influence of the frequency response subdivision of the sound applied from the outside under the interference of the outer shell, so the sound wave supplied by the second sounder 917 cannot be completely transmitted to the pressure input. In port 904, in addition, if the second sound generator is set at different positions that are far apart, it is often necessary to transport the tested microphone to different work sites through the conveyor belt to obtain sound sources with different sound pressures, but also therefore The delivery time and testing process are additionally increased, and the process of testing multiple microphones under test at multiple test terminals at a single test site cannot be provided in batches, so there is still much room for integration in the existing technology.

In view of this, the inventor, based on the spirit of active invention, desperately thought of a multi-sounder microphone element test seat structure that can solve the above-mentioned problems, and finally completed the present invention after several researches and experiments.

Contents of the invention

The main purpose of the present invention is to provide a microphone element test seat structure with multiple sound generators, which is used to provide a specific high sound pressure or low sound pressure to the microphone under test, so as to facilitate the detection of multiple test terminals, and the microphone under test can be exempted from the Due to different sound pressure testing requirements, it is transported to more than two test sites, and the test can be completed at a single test site, effectively reducing the test time and test process.

In order to achieve the above purpose, the structure of the microphone element testing base with multiple sounders of the present invention includes a test base, a first sounder, a second sounder, a reference microphone and a tested microphone. There is a test channel inside the test base, and the test channel includes a plurality of communication ports for transmitting the test sound source to the reference microphone and the tested microphone through the shortest path. The first sound generator provides a high sound pressure source, and its sound outlet is connected to the test channel; the second sound generator provides a low sound pressure sound source, and its sound outlet is connected to the test channel. The receiver of the reference microphone is connected to the test channel, and the receiver of the microphone under test is connected to the test channel.

Wherein, the sound sources of the first sound generator and the second sound generator can be sent out separately, or can be sent out at the same time to be superimposed to a certain sound pressure, and provided to the microphone under test for testing. Through the above design, the present invention can simultaneously detect the sound wave range of low sound pressure and high sound pressure through a single test seat structure, and in the range of low total harmonic distortion, it is suitable for testing the high sound pressure requirements of the microphone under test, effectively reducing the Test time and test process.

The above plurality of communication ports may include a first communication port and a second communication port, and the sound emitting ports of the first sound generator and the second sound generator are connected to the first communication port or to the second communication port at the same time. Thereby, the sound source of the first sound generator and the second sound generator will be sent out through a single communication port, which is beneficial to the integration and concentration of sound waves.

The plurality of communication ports may include a first communication port and a second communication port, and the sound emitting ports of the first sound generator and the second sound generator are respectively connected to the first communication port and the second communication port. In this way, the sound sources of the first sound generator and the second sound generator are sent out from different communication ports, so as to increase the sound field and sound pressure in the test channel.

The above-mentioned microphone element test seat structure with multiple sound generators may further include a third sound generator to provide a sound source of medium sound pressure, and its sound outlet is connected to the test channel, wherein the sound source of the third sound generator can be sent out individually, or It can be sent simultaneously with the first sounder and the second sounder to superimpose to a specific sound pressure, and provided to the microphone under test for testing, so as to provide a uniform sound field and sound pressure in the test channel.

The above-mentioned first sounder, second sounder and third sounder can be connected to the test channel with a sound channel respectively, so as to avoid the interference of each sound source at the beginning of sound generation, and ensure that the sound of each sound source is transmitted to the test channel. Begin to integrate evenly.

An airtight member can be provided at each of the communication ports to prevent the sound sources of the first sound generator, the second sound generator and the third sound generator from radiating to the outside.

The microphone under test may be a semiconductor chip. Thereby, the present invention is applicable to the framework of chip inspection, and the semiconductor chips can be inspected in batches at multiple test terminals, thereby improving the inspection efficiency per unit time.

The above-mentioned high sound pressure can mean that the maximum sound pressure can reach 135dBSPL; relatively, the above-mentioned low sound pressure can mean that the minimum sound pressure can reach 94dBSPL. Thereby, the microphone under test of the present invention can carry out a large-scale detection in a single test site or test structure within the above-mentioned sound pressure range, replacing the dilemma that the high sound pressure part needs to be sent to other test sites for detection in the traditional test, Improve overall testing efficiency.

Both the above summary and the following detailed description are exemplary in order to further illustrate the protection scope of the claims of the present invention. Other purposes and advantages of the present invention will be described in the subsequent description and accompanying drawings.

Description of drawings

FIG. 1 is a perspective view of the structure of a microphone element test seat with multiple sound generators according to the first embodiment of the present invention.

FIG. 2 is a cross-sectional view of the structure of the microphone element test seat with multiple sound generators according to the first embodiment of the present invention.

FIG. 3 is a schematic diagram of the structure of the microphone element test seat with multiple sound generators according to the first embodiment of the present invention.

FIG. 4 is a schematic diagram of the structure of the microphone element test seat with multiple sound generators according to the second embodiment of the present invention.

FIG. 5 is a schematic diagram of the structure of a microphone element test seat with multiple sound generators according to a third embodiment of the present invention.

Fig. 6 is a schematic diagram of the structure of a conventional microphone element test seat.

【Symbol Description】

1, 10, 100 Microphone element test set structure 2 Test base

20 Accommodating space 21, 21a, 21b test channel

211, 211a, 211b First communication port 212, 212a, 212b Second communication port

213, 213a, 213b third communication port 214a, 214b fourth communication port

215b Fifth communication port 3 First sounder

30, 40, 50 sound channel 31 sound port

4 Second sounder 41 Sound outlet

5 Third sounder 6 Microphone under test

61 Placement space 7 Airtight component

8 Reference microphone 901 First sounder

903 Chamber 904 Pressure input port

906 Notch 907 Pressure Sensing Device

917 Second sounder

Detailed ways

Please refer to FIG. 1 to FIG. 3 , which are respectively a perspective view, a cross-sectional view and a schematic diagram of the structure of a microphone element test stand with multiple sound generators according to a first embodiment of the present invention. The figure shows a microphone component test seat structure 1 with multiple sounders, including a test base 2 , a first sounder 3 , a second sounder 4 , a reference microphone 8 and a test microphone 6 .

The test base 2 has a test channel 21 inside, and the test channel 21 includes a first communication port 211, a second communication port 212 and a third communication port 213. In this embodiment, the test channel 21 is a The inverted T-shaped connecting channel, that is, the inside of the test base 2 is connected with a transverse channel and a longitudinal channel, so that the sound waves emitted by the first sounder 3 and the second sounder 4 can be carried out along the test channel 21 transmission, but the present invention is not limited thereto, and the angle, direction, shape, size and connection position of the test channel 21 are not limited, and some changes can be provided according to actual needs.

In addition, the test base 2 has an accommodating space 20 for accommodating the first sound generator 3 and the second sound generator 4, wherein the sound outlet 31 of the first sound generator 3 is connected to the first communication port 211, It is provided with a drive unit with stronger output power to provide a sound source with high sound pressure; and the sound outlet 41 of the second sound generator 4 is connected to the first communication port 211, and has a drive unit with weaker output power in it for use To provide a sound source with low sound pressure, that is, the sound outlets of the first sound generator 3 and the second sound generator 4 are connected to the first communication port 211 at the same time. Thereby, the sound source of the first sound generator 3 and the second sound generator 4 will be sent out from a single communication port, which is beneficial to the integration and concentration of sound waves. In the present embodiment, the high sound pressure refers to a maximum sound pressure of up to 135dBSPL, and the low sound pressure refers to a minimum sound pressure of up to 94dBSPL, which can be respectively sent by the first sound generator 3 and the sound output by the second sound generator 3 respectively. 4, or can be simultaneously sent by the first sounder 3 and the second sounder 4 to be superimposed to a specific sound pressure within the above range, and transmitted to the microphone 6 under test for testing.

The second communication port 212 is provided with a reference microphone 8, which is electrically connected with a reference microphone testing device (not shown) to analyze the received acoustic signal as a reference standard value for the tester to compare and analyze. The third communication port 213 is provided with a tested microphone 6. In this embodiment, the tested microphone 6 is a semiconductor chip and is accommodated in a placement space 61. Thus, the present invention is applicable to semiconductor chips. The structure of the chip inspection can also batch inspect the semiconductor chips at multiple test terminals, so as to improve the inspection efficiency per unit time.

In addition, the present invention is provided with an airtight member 7 at the first communication port 211 and an airtight member 7 at the second communication port 212. The airtight member 7 has high compression characteristics and is made of rubber material. As a result, it can ensure that the first communication port 211 and the second communication port 212 of the test channel 21 have no gap leakage with the outside world, so as to prevent the sound sources of the first sound generator 3 and the second sound generator 4 from radiating to the outside world and reduce the test quality. At the same time, it improves the distortion caused by the influence of airflow during detection.

Through the above design, the present invention provides a microphone element test seat structure 1 with multiple sound generators, which is used to provide a specific high sound pressure or low sound pressure to the tested microphone 6, so as to facilitate the detection of multiple test terminals. 6 It can eliminate the need to carry to more than two test sites due to different sound pressure testing requirements, and can complete the testing work at a single test site, effectively reducing the test time and test process.

In addition, please refer to FIG. 4 , which is a schematic diagram of the structure of the microphone component test seat with multiple sound generators according to the second embodiment of the present invention. As shown in the figure, the basic structure of the microphone element test seat structure 10 of this embodiment is the same as that of the first embodiment, except that the test channel 21a includes a first communication port 211a, a second communication port 212a, A third communication port 213a and a fourth communication port 214a, the sounding port of the first sound generator 3 is connected to the first communication port 211a, and a drive unit with a strong output power is provided in it to provide a high sound pressure sound source; The sound outlet of the second sound generator 4 is connected to the second communication port 212a, which has a drive unit with a weaker output power to provide a sound source with a low sound pressure, that is, the first sound generator 3 and the second sound generator 4. The sound outlets of the second sound generator 4 are connected to the first communication port 211a and the second communication port 212a respectively. In addition, the third communicating port 213a is provided with a microphone 6 under test, which is a semiconductor chip and is accommodated in a placement space 61 . The fourth communication port 214a is provided with a reference microphone 8, which is electrically connected with a reference microphone testing device (not shown) to analyze the received acoustic signal, as a reference standard value for the tester to compare and analyze. Thereby, the sound sources of the first sound generator 3 and the second sound generator 4 in this embodiment are sent out from different communication ports, so as to increase the sound field and sound pressure in the test channel.

Furthermore, please refer to FIG. 5 , which is a schematic diagram of the structure of a microphone component test seat with multiple sound generators according to a third embodiment of the present invention. As shown in the figure, the basic structure of the microphone element test seat structure 100 of this embodiment is the same as that of the first embodiment, except that the test channel 21b includes a first communication port 211b, a second communication port 212b, A third communication port 213b, a fourth communication port 214a and a fifth communication port 215b. The sound outlet of the first sound generator 3 is connected to the first communication port 211a, which has a drive unit with a stronger output power to provide a high sound pressure sound source; and the sound outlet of the second sound generator 4 is connected to the second communication port 211a. The port 212a has a drive unit with a weaker output power in it to provide a sound source with a low sound pressure. The sound outlet of the third sound generator 5 is connected to the third communication port 213b, and a drive unit with a medium output power is provided in it. To provide a sound source of medium sound pressure; wherein, the sound sources of the above three sound generators 3, 4, 5 can be sent individually or simultaneously to be superimposed to a specific sound pressure, and provided to the microphone under test for testing, in order to provide a test channel Uniform sound field and sound pressure. In addition, the fourth communicating port 214b is provided with a microphone 6 under test, which is a semiconductor chip and accommodated in a placement space 61 . The fifth communication port 215b is provided with a reference microphone 8, which is electrically connected to a reference microphone testing device (not shown) to analyze the received sound wave signal as a reference standard value for the tester to compare and analyze.

In addition, in the third embodiment, the sound outlets of the first sound generator 3, the second sound generator 4, and the third sound generator 5 are respectively connected to the test channel 21b with a sound output channel 30, 40, 50, so that each The sound outlet is a certain distance away from the test channel 21b, so as to avoid the interference of each sound source at the beginning of sound generation, and to ensure that the sound of each sound source is transmitted into the test channel before being evenly integrated.

The above-mentioned embodiments are only examples for convenience of description, and the protection scope of the claims claimed in the present invention should be determined by the claims, rather than limited to the above-mentioned embodiments.

Claims (10)

1. A microphone element test seat structure with multiple sound generators, comprising: A test base, which has a test channel, the test channel includes a plurality of communication ports; A first sound generator, which provides a high sound pressure sound source, and its sound outlet is connected to the test channel; A second sound generator, which provides a sound source with low sound pressure, and its sound outlet is connected to the test channel; a reference microphone, the receiving end of which is connected to the test channel; and A microphone under test, the receiving end of which is connected to the test channel; Wherein, the sound sources of the first sound generator and the second sound generator can be sent out separately, or can be sent out at the same time to be superimposed to a specific sound pressure, and provided to the microphone under test for testing. 2. The microphone element test seat structure with multiple sound generators as claimed in claim 1, wherein the plurality of communication ports comprise a first communication port and a second communication port, the first sound generator and the second sound generator The sound outlet is connected to the first communication port or to the second communication port at the same time. 3. The microphone element test seat structure with multiple sound generators as claimed in claim 1, wherein the plurality of communication ports comprise a first communication port and a second communication port, the first sound generator and the second sound generator The sound outlets are respectively connected to the first communication port and the second communication port. 4. The microphone element test seat structure with multiple sound generators as claimed in claim 1, further comprising a third sound generator, which provides a sound source of sound pressure, and whose sound outlet is connected to the test channel, wherein the third sound generator The sound source can be sent out individually, or can be sent out simultaneously with the first sound generator and the second sound generator to be superimposed to a specific sound pressure, and provided to the microphone under test for testing. 5. The microphone element test seat structure with multiple sound generators as claimed in claim 4, wherein the first sound generator, the second sound generator and the third sound generator communicate with the test channel with a sound channel respectively, avoiding each The sound originates from interference at the beginning of the sound. 6. The microphone element test seat structure with multiple sound generators as claimed in claim 1, wherein each communication port is provided with an airtight member to prevent the sound sources of the first sound generator and the second sound generator from radiating to the outside world . 7. The microphone element test seat structure with multiple sound generators as claimed in claim 4, wherein each communication port is provided with an airtight member to prevent the first sound generator, the second sound generator and the third sound generator from The sound source of the device is emitted to the outside world. 8. The test socket structure for a microphone element with multiple sounders as claimed in claim 1, wherein the microphone under test is a semiconductor chip. 9. The structure of the microphone component test seat with multiple sound generators as claimed in claim 1, wherein the high sound pressure means that the maximum sound pressure can reach 135 dBSPL. 10. The test seat structure for a microphone element with multiple sound generators as claimed in claim 1, wherein the low sound pressure means that the minimum sound pressure can reach 94dBSPL.