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CN110040680A - The MEMS microgravity sensor chip with quasi- zero stiffness characteristic is preloaded based on electric heating - Google Patents

The MEMS microgravity sensor chip with quasi- zero stiffness characteristic is preloaded based on electric heating Download PDF

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CN110040680A
CN110040680A CN201910319089.0A CN201910319089A CN110040680A CN 110040680 A CN110040680 A CN 110040680A CN 201910319089 A CN201910319089 A CN 201910319089A CN 110040680 A CN110040680 A CN 110040680A
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CN110040680B (en
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韦学勇
段宇兴
赵明辉
任子明
赵惠英
蒋庄德
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Xian Jiaotong University
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    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81BMICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B7/00Microstructural systems; Auxiliary parts of microstructural devices or systems
    • B81B7/02Microstructural systems; Auxiliary parts of microstructural devices or systems containing distinct electrical or optical devices of particular relevance for their function, e.g. microelectro-mechanical systems [MEMS]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V7/00Measuring gravitational fields or waves; Gravimetric prospecting or detecting
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81BMICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B2201/00Specific applications of microelectromechanical systems
    • B81B2201/02Sensors

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Abstract

基于电热预加载具有准零刚度特性的MEMS微重力传感器芯片,包括单晶硅衬底,单晶硅衬底上生长二氧化硅绝缘层,二氧化硅绝缘层上键合单晶硅结构层,单晶硅结构层中制作MEMS加速度传感器芯片;MEMS加速度传感器芯片包括芯片框架,其四角分别设有1组电极锚点,每组电极锚点之间连接有V型梁组成的电热驱动单元,V型梁连接有中间臂,中间臂通过限位自锁机构、弹簧和质量块连接,限位自锁机构和芯片框架配合;除电极锚点及芯片框架,其余部分下面的单晶硅衬底和二氧化硅绝缘层被腐蚀掉;采用电热效应对弹簧进行轴向位移加载,在不降低弹簧垂向刚度的前提下使质量块在垂向获得一段具有准零刚度的工作区间,可用于微重力加速度检测,具有结构简单等的特点。

A MEMS microgravity sensor chip with quasi-zero stiffness characteristics based on electrothermal preloading, including a single crystal silicon substrate, a silicon dioxide insulating layer grown on the single crystal silicon substrate, and a single crystal silicon structural layer bonded to the silicon dioxide insulating layer, The MEMS acceleration sensor chip is made in the single crystal silicon structure layer; the MEMS acceleration sensor chip includes a chip frame, and a group of electrode anchor points are respectively arranged at its four corners, and an electrothermal drive unit composed of a V-shaped beam is connected between each group of electrode anchor points. The beam is connected with an intermediate arm, the intermediate arm is connected by a limit self-locking mechanism, a spring and a mass block, and the limit self-locking mechanism cooperates with the chip frame; except for the electrode anchor point and the chip frame, the rest of the monocrystalline silicon substrate and The silicon dioxide insulating layer is corroded; the spring is loaded with axial displacement by the electrothermal effect, and the mass block can obtain a working range with quasi-zero stiffness in the vertical direction without reducing the vertical stiffness of the spring, which can be used for microgravity Acceleration detection has the characteristics of simple structure and so on.

Description

基于电热预加载具有准零刚度特性的MEMS微重力传感器芯片MEMS microgravity sensor chip with quasi-zero stiffness characteristics based on electrothermal preloading

技术领域technical field

本发明涉及加速度传感器技术领域,特别涉及一种基于电热预加载具有准零刚度特性的MEMS微重力传感器芯片。The invention relates to the technical field of acceleration sensors, in particular to a MEMS microgravity sensor chip with quasi-zero stiffness characteristics based on electrothermal preloading.

背景技术Background technique

地球重力场蕴含着丰富的物理信息,随着人类生产活动逐步深入地下,重力加速度的测量环境及指标变得更加严苛,人们对于高分辨率、高精度的微重力加速度检测技术的需求愈发急切。随着制造技术的迭代发展,体积小、能耗低、精度高的微机电系统(MEMS)加速度传感器越来越具有取代传统加速度传感器成为主流的趋势。无论是利用光学、电容还是谐振式的测量方式,具有高灵敏度的弹簧质量系统是实现低g值加速度测量的核心结构,对高精度微重力测量领域有重要意义。The earth's gravity field contains rich physical information. With the gradual deepening of human production activities, the measurement environment and indicators of gravitational acceleration become more stringent, and people's demand for high-resolution, high-precision microgravity acceleration detection technology is increasing. eager. With the iterative development of manufacturing technology, micro-electromechanical systems (MEMS) acceleration sensors with small size, low energy consumption and high precision are increasingly becoming the mainstream instead of traditional acceleration sensors. Whether using optical, capacitive or resonant measurement methods, a spring-mass system with high sensitivity is the core structure for realizing low-g acceleration measurement, which is of great significance to the field of high-precision microgravity measurement.

桑迪亚国家实验室提出过一种基于亚微米波长光栅检测技术的面内加速度传感器,该传感器具有nano-g(1nano-g=9.81×10-9m/s2)分辨率;它是使用四组折型弹簧来悬挂质量块,结合纳米尺寸的差分光栅结构得到了高分辨率的信号,但其本身弹簧质量系统谐振频率并不太低,芯片主体结构的灵敏度还具有提升空间。Sandia National Laboratories has proposed an in-plane acceleration sensor based on submicron wavelength grating detection technology. The sensor has nano-g (1 nano-g=9.81×10 -9 m/s 2 ) resolution; it uses Four sets of folded springs are used to suspend the mass, combined with the nano-sized differential grating structure to obtain a high-resolution signal, but the resonance frequency of the spring-mass system itself is not too low, and the sensitivity of the main structure of the chip has room for improvement.

格拉斯哥大学Middlemiss等人将MEMS制造工艺运用到加速度传感器上,利用反弹簧结构来设计加速度传感器的弹簧质量系统,得到了具有超低面内振动谐振频率的系统;不过该反弹簧结构特征尺寸很小,对制造工艺要求很高,而且存在带宽较窄的缺点。Middlemiss and others of the University of Glasgow applied the MEMS manufacturing process to the acceleration sensor, and used the anti-spring structure to design the spring-mass system of the acceleration sensor, and obtained a system with ultra-low in-plane vibration resonance frequency; however, the characteristic size of the anti-spring structure is very small , the manufacturing process is very demanding, and there is a shortcoming of narrow bandwidth.

综上所述,由于弹簧—质量块系统在竖直方向上的灵敏度与它此方向的刚度是成反比,如果为了提高其灵敏度而单纯降低弹簧的竖直刚度,则系统的承载力也随之下降,即连接的质量块质量下降且能承受的加速度也很小,所以现有的面内运动MEMS加速度传感器主体结构的敏感方向刚度还不能做得很低,质量块灵敏度也因此受限,低g值检测的分辨率仍待提升。To sum up, since the sensitivity of the spring-mass system in the vertical direction is inversely proportional to its stiffness in this direction, if the vertical stiffness of the spring is simply reduced in order to improve its sensitivity, the bearing capacity of the system will also decrease. , that is, the mass of the connected mass decreases and the acceleration it can withstand is also very small, so the sensitive direction stiffness of the main structure of the existing in-plane motion MEMS acceleration sensor cannot be made very low, and the sensitivity of the mass is limited, and the low g The resolution of value detection still needs to be improved.

发明内容SUMMARY OF THE INVENTION

为了克服上述现有技术的缺点,本发明的目的是提供一种基于电热预加载具有准零刚度特性的MEMS微重力传感器芯片,采用电热效应来对弹簧进行轴向位移加载,在不直接降低弹簧垂向刚度的前提下使质量块在竖直方向获得一段具有高灵敏度的工作区间,同时不改变系统原有的对质量块质量或较大加速度的承载能力,从而可用于微重力加速度值检测,且具有可批量化、低成本、结构简单的特点。In order to overcome the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide a MEMS microgravity sensor chip with quasi-zero stiffness characteristics based on electrothermal preloading, using electrothermal effect to load the spring with axial displacement, without directly reducing the spring Under the premise of vertical stiffness, the mass block can obtain a working range with high sensitivity in the vertical direction, and at the same time, the original bearing capacity of the system to the mass of the mass block or large acceleration is not changed, so it can be used for the detection of microgravity acceleration value. And it has the characteristics of batch production, low cost and simple structure.

为达到上述目的,本发明所采用的技术方案是:In order to achieve the above object, the technical scheme adopted in the present invention is:

一种基于电热预加载具有准零刚度特性的MEMS微重力传感器芯片,包括单晶硅衬底1,单晶硅衬底1上生长有二氧化硅绝缘层2,二氧化硅绝缘层2上键合有单晶硅结构层3,在单晶硅结构层3的电极锚点3-2上沉积有金属电极层4,在单晶硅结构层3中制作有MEMS加速度传感器芯片;A MEMS microgravity sensor chip with quasi-zero stiffness characteristics based on electrothermal preloading, comprising a single crystal silicon substrate 1, a silicon dioxide insulating layer 2 grown on the single crystal silicon substrate 1, and a bond on the silicon dioxide insulating layer 2 A single crystal silicon structure layer 3 is combined, a metal electrode layer 4 is deposited on the electrode anchor point 3-2 of the single crystal silicon structure layer 3, and a MEMS acceleration sensor chip is fabricated in the single crystal silicon structure layer 3;

所述的MEMS加速度传感器芯片,包括芯片框架3-7,芯片框架3-7的四角分别设有1组电极锚点3-2,每组两个电极锚点3-2之间连接有成阵列结构的V型梁组成一个电热驱动单元3-1,V型梁中间横向连接有一个中间臂3-3,中间臂3-3和限位自锁机构3-4的一端连接,限位自锁机构3-4和芯片框架3-7配合,限位自锁机构3-4的另一端和弹簧3-5的首端连接,弹簧3-5的尾端和质量块3-6连接;电热驱动单元3-1、中间臂3-3、限位自锁机构3-4、弹簧3-5、质量块3-6构成了传感器芯片的主体部分,通过一体化MEMS工艺制造,均为固定连接;除去电极锚点3-2以及芯片框架3-7,其余部分下面的单晶硅衬底1和二氧化硅绝缘层2将被腐蚀掉,使传感器芯片的主体部分成为悬空结构;The MEMS acceleration sensor chip includes a chip frame 3-7, four corners of the chip frame 3-7 are respectively provided with a group of electrode anchor points 3-2, and an array is connected between the two electrode anchor points 3-2 of each group. The V-shaped beam of the structure constitutes an electric heating drive unit 3-1. A middle arm 3-3 is horizontally connected in the middle of the V-shaped beam. The middle arm 3-3 is connected with one end of the limit self-locking mechanism 3-4, and the limit self-locking The mechanism 3-4 cooperates with the chip frame 3-7, the other end of the limit self-locking mechanism 3-4 is connected with the head end of the spring 3-5, and the tail end of the spring 3-5 is connected with the mass block 3-6; electric heating drive The unit 3-1, the middle arm 3-3, the limit self-locking mechanism 3-4, the spring 3-5, and the mass block 3-6 constitute the main part of the sensor chip, which is manufactured by an integrated MEMS process, all of which are fixedly connected; After removing the electrode anchor point 3-2 and the chip frame 3-7, the monocrystalline silicon substrate 1 and the silicon dioxide insulating layer 2 under the remaining part will be etched away, so that the main part of the sensor chip becomes a suspended structure;

电热驱动单元3-1对弹簧3-5进行轴向加载后,能够改变MEMS加速度传感器芯片在其敏感方向的线性刚度,通过改变加载电压与弹簧3-5结构参数,能够实现MEMS加速度传感器芯片准零刚度区间的可调。After the electrothermal drive unit 3-1 axially loads the spring 3-5, the linear stiffness of the MEMS acceleration sensor chip in its sensitive direction can be changed. By changing the loading voltage and the structural parameters of the spring 3-5, the MEMS acceleration sensor chip can be accurately Adjustable in zero stiffness interval.

所述的限位自锁机构3-4采用凸轮压紧自锁结构,其沿着加载力作用下移动,并与芯片框架3-7的圆弧处发生垂向挤压,通过芯片框架3-7的圆弧处压紧形成自锁。The limiting self-locking mechanism 3-4 adopts a cam compression self-locking structure, which moves along the loading force and squeezes vertically with the arc of the chip frame 3-7, and passes through the chip frame 3-7. The arc of 7 is pressed to form self-locking.

所述的电热驱动单元3-1的V型梁单侧梁长度为1000~1200μm,宽为30~40μm,V型梁中间夹角为166~172°,V型梁之间的间距为70~80μm。The length of the single side beam of the V-shaped beam of the electrothermal drive unit 3-1 is 1000-1200 μm, the width is 30-40 μm, the middle angle between the V-shaped beams is 166-172°, and the spacing between the V-shaped beams is 70-70 μm. 80μm.

所述的弹簧3-5采用欧拉屈曲梁结构,其梁宽为30~34μm,两端跨距为3000~3100μm,中心偏转距为55~60μm。The springs 3-5 adopt an Euler buckling beam structure, the beam width is 30-34 μm, the span at both ends is 3000-3100 μm, and the center deflection distance is 55-60 μm.

所述的二氧化硅绝缘层2的生长厚度为2~3μm。The growth thickness of the silicon dioxide insulating layer 2 is 2-3 μm.

所述的单晶硅结构层3的厚度为40μm,平面尺寸为13mm×16mm。The thickness of the single crystal silicon structure layer 3 is 40 μm, and the plane size is 13 mm×16 mm.

与现有技术相比,本发明的有益效果为:Compared with the prior art, the beneficial effects of the present invention are:

在对称布置的弹簧悬挂质量块的布局基础上,为每根弹簧配备电热驱动单元,电热驱动单元的输入端为低压直流电源,元件构成简单。在完成芯片整体制造后,采用电热效应对弹簧进行轴向位移加载,使四组弹簧在初始平衡位置处于受压的预紧力状态。通过合理设计电热驱动单元、弹簧尺寸、预压量等参数,能在不直接降低弹簧垂向刚度的前提下使质量块在初始平衡位置附近的力-位移曲线被调制成非线性,即在一定范围内沿着面内振动方向具有准零刚度特性同时不降低系统原有的对质量块质量或较大加速度的承载能力,通过改变加载电压与弹簧结构参数,准零刚度区间长度也能实现可调,即根据需要改变工作区间范围。由此,在质量块重量一定的情况下,质量块在平衡位置附近的振动被放大,灵敏度被尽可能地提高。On the basis of the layout of the symmetrically arranged spring suspension mass blocks, each spring is equipped with an electrothermal drive unit. The input end of the electrothermal drive unit is a low-voltage DC power supply, and the component structure is simple. After the chip is fabricated as a whole, the electrothermal effect is used to load the spring with axial displacement, so that the four groups of springs are in a compressed preload state at the initial equilibrium position. By rationally designing parameters such as electrothermal drive unit, spring size, preload, etc., the force-displacement curve of the mass block near the initial equilibrium position can be modulated to be nonlinear without directly reducing the vertical stiffness of the spring. It has quasi-zero stiffness characteristics along the in-plane vibration direction within the range without reducing the original bearing capacity of the system to the mass of the mass block or large acceleration. By changing the loading voltage and spring structure parameters, the length of the quasi-zero stiffness interval can also be achieved. Adjustment, that is, changing the working range as needed. Therefore, when the weight of the mass is constant, the vibration of the mass in the vicinity of the equilibrium position is amplified, and the sensitivity is improved as much as possible.

本发明芯片结构简单,采用成熟的微纳工艺方法能较为容易地进行生产制造。后续可以与光强差分、光栅等高分辨率的位移检测技术结合来进行微重力加速度的测量,且能方便地集成为体积小、精度高、分辨率高的微重力加速度传感器产品,适合于低频信号的检测,能很好地满足应用及市场需求。The chip of the invention has a simple structure, and can be easily produced by adopting a mature micro-nano process method. In the future, it can be combined with high-resolution displacement detection technologies such as light intensity difference and grating to measure microgravity acceleration, and can be easily integrated into microgravity acceleration sensor products with small size, high precision and high resolution, suitable for low frequency Signal detection can well meet application and market demands.

附图说明Description of drawings

图1是本发明的三维结构轴侧图。FIG. 1 is an isometric view of a three-dimensional structure of the present invention.

图2是本发明的单晶硅结构层3的主视图。FIG. 2 is a front view of the single crystal silicon structure layer 3 of the present invention.

图3是本发明的单晶硅结构层3通电加载自锁状态主视图。FIG. 3 is a front view of the single-crystal silicon structure layer 3 of the present invention in a state of being loaded and self-locked by electricity.

图4是本发明的电热驱动单元3-1和限位自锁机构3-4加载状态示意图。FIG. 4 is a schematic diagram of the loading state of the electrothermal driving unit 3-1 and the limiting self-locking mechanism 3-4 of the present invention.

图5是本发明的弹簧-质量块加载后受力示意图。FIG. 5 is a schematic diagram of the force after the spring-mass block of the present invention is loaded.

图6是本发明的弹簧-质量块加载后的力—位移曲线图。FIG. 6 is a force-displacement curve diagram of the spring-mass mass of the present invention after loading.

具体实施方式Detailed ways

下面结合附图及实施例对本发明作详细说明。The present invention will be described in detail below with reference to the accompanying drawings and embodiments.

参照图1,一种基于电热预加载具有准零刚度特性的MEMS微重力传感器芯片,包括单晶硅衬底1,单晶硅衬底1上生长有二氧化硅绝缘层2,生长厚度为2~3μm,二氧化硅绝缘层2上键合有单晶硅结构层3,在单晶硅结构层3的电极锚点3-2上沉积有金属电极层4,在单晶硅结构层3中制作有MEMS加速度传感器芯片;所述的单晶硅结构层3的厚度为40μm,平面尺寸为13mm×16mm。Referring to FIG. 1, a MEMS microgravity sensor chip with quasi-zero stiffness characteristics based on electrothermal preloading includes a single crystal silicon substrate 1, and a silicon dioxide insulating layer 2 is grown on the single crystal silicon substrate 1, and the growth thickness is 2 ~3 μm, a single crystal silicon structural layer 3 is bonded on the silicon dioxide insulating layer 2 , a metal electrode layer 4 is deposited on the electrode anchor point 3-2 of the single crystal silicon structural layer 3 , and in the single crystal silicon structural layer 3 A MEMS acceleration sensor chip is fabricated; the thickness of the single crystal silicon structure layer 3 is 40 μm, and the plane size is 13 mm×16 mm.

参照图2和图3,所述的MEMS加速度传感器芯片,包括芯片框架3-7,芯片框架3-7的四角分别设有1组电极锚点3-2,每组两个电极锚点3-2之间连接有成阵列结构的3组V型梁组成一个电热驱动单元3-1,3组V型梁中间横向连接有一个中间臂3-3,中间臂3-3和限位自锁机构3-4的一端连接,限位自锁机构3-4和芯片框架3-7配合,限位自锁机构3-4的另一端和弹簧3-5的首端连接,弹簧3-5的尾端和质量块3-6连接;电热驱动单元3-1、中间臂3-3、限位自锁机构3-4、弹簧3-5、质量块3-6构成了传感器芯片的主体部分,通过一体化MEMS工艺制造,均为固定连接;除去电极锚点3-2以及芯片框架3-7,其余部分下面的单晶硅衬底1和二氧化硅绝缘层2将被腐蚀掉,使传感器芯片的主体部分成为悬空结构;由于弹簧3-5首尾端连接的限位自锁机构3-4、质量块3-6比弹簧3-5具有更大的结构尺寸,即可视为刚体而不发生形变,因而传递过来的变形只使得弹簧3-5发生屈曲;电热驱动单元3-1受热膨胀后推动弹簧3-5轴向移动,与之连接的限位自锁机构3-4随之移动直到被芯片框架3-7限位锁住,弹簧3-5端部在一位置固定下来,即弹簧3-5内部产生了一定的压缩量,从而使质量块3-6在四组受压弹簧3-5支撑下实现在芯片平面内的单个运动自由度。2 and 3, the MEMS acceleration sensor chip includes a chip frame 3-7, the four corners of the chip frame 3-7 are respectively provided with a group of electrode anchor points 3-2, each group of two electrode anchor points 3- 3 groups of V-shaped beams in an array structure are connected between 2 to form an electric heating drive unit 3-1, and a middle arm 3-3 is horizontally connected between the 3 groups of V-shaped beams, the middle arm 3-3 and the limit self-locking mechanism One end of 3-4 is connected, the limit self-locking mechanism 3-4 is matched with the chip frame 3-7, the other end of the limit self-locking mechanism 3-4 is connected with the head end of spring 3-5, the tail of spring 3-5 is connected The end is connected with the mass block 3-6; the electrothermal drive unit 3-1, the middle arm 3-3, the limit self-locking mechanism 3-4, the spring 3-5, and the mass block 3-6 constitute the main part of the sensor chip, Manufactured by an integrated MEMS process, all of which are fixed connections; except for the electrode anchor point 3-2 and the chip frame 3-7, the monocrystalline silicon substrate 1 and the silicon dioxide insulating layer 2 below the rest will be etched away, making the sensor chip The main part of the spring 3-5 becomes a suspended structure; because the limit self-locking mechanism 3-4 and the mass block 3-6 connected with the head and tail ends of the spring 3-5 have a larger structural size than the spring 3-5, it can be regarded as a rigid body and does not occur. Deformation, so the transmitted deformation only makes the spring 3-5 buckling; the electric heating drive unit 3-1 pushes the spring 3-5 to move axially after being heated and expands, and the limit self-locking mechanism 3-4 connected with it moves with it until It is limited and locked by the chip frame 3-7, and the end of the spring 3-5 is fixed at one position, that is, a certain amount of compression is generated inside the spring 3-5, so that the mass 3-6 is compressed in the four groups of springs 3-6. -5 degrees of freedom of movement in the plane of the chip is achieved under the support.

参照图4,所述的限位自锁机构3-4采用凸轮压紧自锁结构,其沿着加载力作用下移动,并与芯片框架3-7的圆弧处发生垂向挤压,当限位自锁机构3-4左端与芯片框架3-7的侧边接触时,V型梁电热驱动单元3-1膨胀行程即达到设计上限,同时被芯片框架3-7的圆弧处压紧形成自锁。Referring to FIG. 4 , the limiting self-locking mechanism 3-4 adopts a cam compression self-locking structure, which moves along the loading force and squeezes vertically with the arc of the chip frame 3-7. When the left end of the limit self-locking mechanism 3-4 is in contact with the side of the chip frame 3-7, the expansion stroke of the V-beam electric heating drive unit 3-1 reaches the design upper limit, and at the same time is pressed by the arc of the chip frame 3-7 form self-locking.

所述的电热驱动单元3-1的V型梁单侧梁长度为1000~1200μm,宽为30~40μm,V型梁中间夹角为166~172°,V型梁之间的间距为70~80μm;所述的弹簧3-5采用欧拉屈曲梁结构,其梁宽为30~34μm,两端跨距为3000~3100μm,中心偏转距为55~60μm。The length of the single side beam of the V-shaped beam of the electrothermal drive unit 3-1 is 1000-1200 μm, the width is 30-40 μm, the middle angle between the V-shaped beams is 166-172°, and the spacing between the V-shaped beams is 70-70 μm. 80 μm; the spring 3-5 adopts Euler buckling beam structure, the beam width is 30-34 μm, the span at both ends is 3000-3100 μm, and the center deflection distance is 55-60 μm.

本发明的工作原理为:The working principle of the present invention is:

利用了硅材料的电热效应与热膨胀效应。当在金属电极层4上施加直流电压后,单晶硅材料的电热驱动单元3-1会有电流通过,由于单晶硅存在电阻所以会产生相应的热量,在热传导、热对流以及热辐射的共同作用下,产生的热量与耗散的热量最终会达到平衡,电热驱动单元3-1上的温度也会处于高于环境温度的稳定状态,硅材料内部在温度场下发生膨胀,由于其边界与电极锚点3-2连接,电热驱动单元3-1的竖直移动被限制,最终只能沿着其对称轴线产生形变运动;由于弹簧3-5首尾端连接的限位自锁机构3-4、质量块3-6比弹簧3-5具有更大的结构尺寸,即可视为刚体而不发生形变,因而传递过来的变形只使得欧拉梁发生屈曲;电热驱动单元3-1受热膨胀后推动弹簧3-5轴向移动,与之连接的限位自锁机构3-4随之移动直到被芯片框架3-7限位锁住;弹簧3-5端部也在一位置固定下来,即弹簧3-5内部产生了一定的压缩量,质量块3-6在四组受压弹簧3-5支撑下可沿着敏感方向进行单自由度运动。对于两端固定的欧拉梁结构,其轴向载荷P与轴向位移y关系可写为:The electrocaloric effect and thermal expansion effect of silicon material are utilized. When a DC voltage is applied on the metal electrode layer 4, the electrothermal driving unit 3-1 of the single crystal silicon material will have a current passing through it. Due to the resistance of the single crystal silicon, corresponding heat will be generated. Under the combined action, the generated heat and the dissipated heat will eventually reach a balance, and the temperature on the electrothermal drive unit 3-1 will also be in a stable state higher than the ambient temperature, and the interior of the silicon material will expand under the temperature field. Connected to the electrode anchor point 3-2, the vertical movement of the electrothermal drive unit 3-1 is restricted, and finally the deformation movement can only be generated along its symmetry axis; due to the limit self-locking mechanism 3- 4. The mass block 3-6 has a larger structural size than the spring 3-5, which can be regarded as a rigid body without deformation, so the transmitted deformation only causes the Euler beam to buckle; the electrothermal drive unit 3-1 expands when heated Then push the spring 3-5 to move axially, and the limit self-locking mechanism 3-4 connected with it moves along with it until it is locked by the chip frame 3-7; the end of the spring 3-5 is also fixed at a position, That is, a certain amount of compression is generated inside the spring 3-5, and the mass block 3-6 can move in a single degree of freedom along the sensitive direction under the support of the four groups of compressed springs 3-5. For the Euler beam structure with fixed ends, the relationship between the axial load P and the axial displacement y can be written as:

L为弹簧两端原始跨距,q0为梁的中心偏转距,Pe=π2EI/L2为欧拉梁发生屈曲的临界载荷,E为单晶硅的弹性模量,I为欧拉梁横截面的惯性矩。L is the original span at both ends of the spring, q 0 is the center deflection distance of the beam, P e2 EI/L 2 is the critical load for Euler beam buckling, E is the elastic modulus of single crystal silicon, I is the Euler beam The moment of inertia of the cross-section of the tension beam.

参照图5,两侧欧拉屈曲梁具有轴向刚度K,由于欧拉屈曲梁首端的边界条件为固定,因此其支撑质量块3-6的简化模型可等效为弹簧首端铰支加上一个刚度为常数K的垂直弹簧;左图为芯片处于初始平衡位置时的受力模型,由于上下对称故可简化为一个质量块3-6被一组受压弹簧3-5支撑;当质量块3-6发生向下偏移并在新位置平衡后,受力模型如右图所示;考虑质量块3-6从平衡位置向下偏移的情况,则质量块3-6所受的无量纲垂向力与平衡位置无量纲偏移量的关系可写为:Referring to Figure 5, the Euler buckling beams on both sides have the axial stiffness K axis . Since the boundary conditions at the head end of the Euler buckling beam are fixed, the simplified model of the supporting masses 3-6 can be equivalent to the hinge support at the head end of the spring. The last vertical spring with a constant stiffness K; the left picture shows the force model when the chip is in the initial equilibrium position. Due to the upper and lower symmetry, it can be simplified as a mass 3-6 supported by a set of compression springs 3-5; when After the mass 3-6 is shifted downward and balanced at the new position, the force model is as shown in the figure on the right; considering the case where the mass 3-6 is shifted downward from the equilibrium position, the mass 3-6 is subjected to The dimensionless vertical force of Dimensionless offset from equilibrium position The relationship can be written as:

F为质量块3-6所受垂向力,刚度比K为弹簧-质量块的垂向刚度,压缩比a为欧拉梁受压后两端的跨距, 为坐标系原点无量纲偏移量, 为弹簧两端无量纲跨距。 F is the vertical force on the mass block 3-6, the stiffness ratio K is the vertical stiffness of the spring-mass block, the compression ratio a is the span at both ends of the Euler beam after compression, is the dimensionless offset of the origin of the coordinate system, is the dimensionless span at both ends of the spring.

求导,得到系统的垂向运动刚度时,令得到满足准零刚度区间的λ0Will right Derivative to get the vertical kinematic stiffness of the system exist season Obtain λ 0 satisfying the quasi-zero stiffness interval:

参照图6,当加载电压、弹簧3-5结构参数满足λ0所需条件,则芯片在初始平衡位置附近的力—位移曲线便呈现具有准零刚度的非线性特性,通过改变加载电压与弹簧3-5结构参数,准零刚度区间长度也能实现可调。Referring to Figure 6, when the loading voltage and the structural parameters of springs 3-5 meet the required conditions of λ 0 , the force-displacement curve of the chip near the initial equilibrium position presents a nonlinear characteristic with quasi-zero stiffness. By changing the loading voltage and the spring 3-5 structural parameters, the length of the quasi-zero stiffness interval can also be adjusted.

在低频的微重力加速度测量中,质量块所受到的加速度A与平衡位置偏移量u的关系可写为:In the low-frequency microgravity acceleration measurement, the relationship between the acceleration A received by the mass block and the offset u of the equilibrium position can be written as:

A=ω0 2·u,A=ω 0 2 ·u,

为系统无阻尼固有角频率,k、m分别为系统某方向上的刚度及质量。通过光学、电容等手段来检测位移量u,即可得到质量块所受加速度。在本发明中,由于芯片在准零刚度区间内工作,其刚度可以趋近于0,因此在所受加速度A一定的情况下,质量块产生的位移量u能变得很大,即灵敏度被大大提高,从而非常适用于低g值的低频信号检测。 is the undamped natural angular frequency of the system, and k and m are the stiffness and mass of the system in a certain direction, respectively. By detecting the displacement u by means of optics, capacitance, etc., the acceleration of the mass block can be obtained. In the present invention, since the chip works in the quasi-zero stiffness range, its stiffness can approach 0, so when the acceleration A is constant, the displacement u generated by the mass block can become very large, that is, the sensitivity is greatly improved, which makes it very suitable for low-frequency signal detection with low g value.

Claims (6)

1. a kind of preload the MEMS microgravity sensor chip with quasi- zero stiffness characteristic, including monocrystalline substrate based on electric heating (1), it is characterised in that: there is silicon dioxide insulating layer (2) growth in monocrystalline substrate (1), silicon dioxide insulating layer is bonded on (2) There are monocrystal silicon structure layer (3), metal electrode layer (4) is deposited on the electrode anchor point (3-2) of monocrystal silicon structure layer (3), in list Production has MEMS acceleration sensor chip in crystal silicon structure sheaf (3);
The MEMS acceleration sensor chip, including chi frame (3-7), the quadrangle of chi frame (3-7) are respectively equipped with 1 It organizes electrode anchor point (3-2), the V-type beam that array structure is connected between every group of two electrode anchor points (3-2) forms an electric heating Driving unit (3-1), V-type beam intermediate lateral are connected with an intermediate arm (3-3), intermediate arm (3-3) and limit self mechanism (3- 4) one end connection, limit self mechanism (3-4) and chi frame (3-7) cooperate, the other end of limit self mechanism (3-4) with The head end of spring (3-5) connects, tail end and mass block (3-6) connection of spring (3-5);Electrothermal drive unit (3-1), intermediate arm (3-3), limit self mechanism (3-4), spring (3-5), mass block (3-6) constitute the main part of sensor chip, pass through Integrated MEMS technology manufacture, is to be fixedly connected;Electrode anchor point (3-2) and chi frame (3-7) are removed, under rest part The monocrystalline substrate (1) and silicon dioxide insulating layer (2) in face will be corroded, and the main part of sensor chip is made to become hanging Structure;
After electrothermal drive unit (3-1) is axially loaded to spring (3-5) progress, MEMS acceleration sensor chip can be changed and existed The linear rigidity of its sensitive direction can be realized MEMS acceleration biography by changing on-load voltage and spring (3-5) structural parameters The quasi- zero stiffness section of sensor chip it is adjustable.
2. a kind of MEMS microgravity sensor preloaded based on electric heating with quasi- zero stiffness characteristic according to claim 1 Chip, it is characterised in that: the limit self mechanism (3-4) uses cam pressing self-locking structure, acts on along loading force Lower movement, and vertical extruding occurs with the circular arc of chi frame (3-7), shape is compressed by the circular arc of chi frame (3-7) At self-locking.
3. a kind of MEMS microgravity sensor preloaded based on electric heating with quasi- zero stiffness characteristic according to claim 1 Chip, it is characterised in that: the V-type beam unilateral side beam length of the electrothermal drive unit (3-1) is 1000~1200 μm, width 30 ~40 μm, V-type beam centre angle is 166~172 °, and the spacing between V-type beam is 70~80 μm.
4. a kind of MEMS microgravity sensor preloaded based on electric heating with quasi- zero stiffness characteristic according to claim 1 Chip, it is characterised in that: the spring (3-5) uses Euler's buckling girder construction, and deck-siding is 30~34 μm, and both ends span is 3000~3100 μm, center deflection is away from being 55~60 μm.
5. a kind of MEMS microgravity sensor preloaded based on electric heating with quasi- zero stiffness characteristic according to claim 1 Chip, it is characterised in that: the growth thickness of the silicon dioxide insulating layer (2) is 2~3 μm.
6. a kind of MEMS microgravity sensor preloaded based on electric heating with quasi- zero stiffness characteristic according to claim 1 Chip, it is characterised in that: the monocrystal silicon structure layer (3) with a thickness of 40 μm, planar dimension is 13mm × 16mm.
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