CN109979883A - A kind of integrated device mould group - Google Patents
A kind of integrated device mould group Download PDFInfo
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- CN109979883A CN109979883A CN201910361662.4A CN201910361662A CN109979883A CN 109979883 A CN109979883 A CN 109979883A CN 201910361662 A CN201910361662 A CN 201910361662A CN 109979883 A CN109979883 A CN 109979883A
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- G—PHYSICS
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- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D11/00—Component parts of measuring arrangements not specially adapted for a specific variable
- G01D11/24—Housings ; Casings for instruments
- G01D11/245—Housings for sensors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/50—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor for integrated circuit devices, e.g. power bus, number of leads
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Abstract
本发明公开了一种集成器件模组,包括基板,设置在基板上的红外探测器,以及保护壳体;其中,基板上还集成设置有一个以上且具有不同功能的功能芯片;红外探测器为基于WLP封装技术封装红外探测芯片获得的器件;红外探测器贴合设置在基板上,且红外探测器的引脚通过金属引线和基板的I/O接口电连接;保护壳体和基板固定连接,且在保护壳体和基板板之间形成容纳红外探测器的空腔;空腔对应红外探测器的窗口上通光区的位置的腔壁具有通孔,且通孔的大小大于通光区的大小。本发明所提供的集成器件模组,对红外探测器进行了物理保护,避免了红外探测器受碰撞或刮划,且基板上集成不同功能的功能芯片,无需用户进行二次开发,降低使用成本和使用难度。
The invention discloses an integrated device module, comprising a substrate, an infrared detector arranged on the substrate, and a protective casing; wherein, the substrate is further integrated with one or more functional chips with different functions; the infrared detector is The device obtained by encapsulating the infrared detection chip based on WLP packaging technology; the infrared detector is attached to the substrate, and the pins of the infrared detector are electrically connected to the I/O interface of the substrate through metal leads; the protective shell and the substrate are fixedly connected, And a cavity for accommodating the infrared detector is formed between the protective casing and the base plate; the cavity wall corresponding to the position of the light-passing area on the window of the infrared detector has a through hole, and the size of the through-hole is larger than that of the light-passing area. size. The integrated device module provided by the present invention physically protects the infrared detector, avoids the infrared detector from being collided or scratched, and integrates functional chips with different functions on the substrate, eliminating the need for users to carry out secondary development and reducing the use cost. and difficulty of use.
Description
技术领域technical field
本发明涉及晶圆级封装技术领域,特别是涉及一种集成器件模组。The present invention relates to the technical field of wafer level packaging, in particular to an integrated device module.
背景技术Background technique
WLP封装(晶圆级封装)的红外探测器因其体积小巧、性能可靠备受市场欢迎。但是基于WLP封装技术获得红外探测器,对环境要求高,在产品运输过程中红外探测器不可避免的会和外界环境产生碰撞或被刮划,使得器件的受到损伤。并且用户在使用WLP器件时,还需要对WLP器件进行二次开发,增加了用户使用WLP器件的困难程度。Infrared detectors in WLP package (wafer level package) are popular in the market due to their small size and reliable performance. However, the infrared detector obtained based on WLP packaging technology has high environmental requirements. During the transportation of the product, the infrared detector will inevitably collide with the external environment or be scratched, causing damage to the device. In addition, when users use WLP devices, they also need to carry out secondary development of WLP devices, which increases the difficulty for users to use WLP devices.
发明内容SUMMARY OF THE INVENTION
本发明的目的是提供一种集成器件模组,解决了WLP器件因碰撞或刮划而受损伤,且二次开发困难的问题。The purpose of the present invention is to provide an integrated device module, which solves the problem that the WLP device is damaged due to collision or scratching, and the secondary development is difficult.
为解决上述技术问题,本发明提供一种集成器件模组,包括:In order to solve the above-mentioned technical problems, the present invention provides an integrated device module, comprising:
基板,设置在所述基板上的红外探测器,以及保护壳体;a substrate, an infrared detector arranged on the substrate, and a protective casing;
其中,所述基板上还集成设置有一个以上且具有不同功能的功能芯片;Wherein, more than one functional chip with different functions is also integrated on the substrate;
所述红外探测器为基于WLP封装技术封装红外探测芯片获得的器件;The infrared detector is a device obtained by packaging an infrared detection chip based on WLP packaging technology;
所述红外探测器贴合设置在所述基板上,且所述红外探测器的引脚通过金属引线和所述基板的I/O接口电连接;The infrared detector is attached and arranged on the substrate, and the pins of the infrared detector are electrically connected to the I/O interface of the substrate through metal leads;
所述保护壳体和所述基板固定连接,且在所述保护壳体和所述基板板之间形成容纳所述红外探测器的空腔;所述空腔对应所述红外探测器的窗口上通光区位置的腔壁具有通孔,且所述通孔的大小大于所述通光区面积的大小。The protective casing and the base plate are fixedly connected, and a cavity for accommodating the infrared detector is formed between the protective casing and the base plate; the cavity corresponds to the window of the infrared detector The cavity wall at the position of the light-passing area has a through hole, and the size of the through-hole is larger than the size of the area of the light-passing area.
其中,所述功能芯片包括图像处理芯片、数据存储芯片、晶振器或FPGA芯片中的任意一种或多种芯片。Wherein, the functional chip includes any one or more chips of image processing chip, data storage chip, crystal oscillator or FPGA chip.
其中,所述功能芯片和所述红外探测器分别设置在所述基板两个不同的表面。Wherein, the functional chip and the infrared detector are respectively arranged on two different surfaces of the substrate.
其中,所述保护壳体和所述红外探测器相连的一端凸出于所述红外探测器。Wherein, one end of the protective casing connected to the infrared detector protrudes out of the infrared detector.
其中,所述保护壳体的表面还设有防静电膜层。Wherein, the surface of the protective shell is also provided with an antistatic film layer.
其中,所述基板为PCB板或陶瓷板。Wherein, the substrate is a PCB board or a ceramic board.
其中,所述I/O接口为JEDEC标准接口。Wherein, the I/O interface is a JEDEC standard interface.
本发明所提供的集成器件模组,将通过WLP封装技术获得的红外探测器和基板相连接,而基板上存在标准的I/O接口,直接可以将红外探测器芯片的信号进行输出和输入。后端用户在使用时无需再对红外探测器的引脚进行键合输出。另外,还在基板上设置保护红外探测器的保护壳体,使得红外探测器的侧边以及引脚、引线等部件均在壳体和基板形成的腔体内,对红外探测器进行了物理保护,避免了红外探测器和外界环境中的物件发生碰撞或刮划使得红外探测器受损的问题。并且,还在基板上集成了具有不同功能的功能芯片,使得WLP器件的功能得以扩展,无需用户进行二次开发,降低用户的使用成本和使用难度。The integrated device module provided by the present invention connects the infrared detector obtained by the WLP packaging technology with the substrate, and there is a standard I/O interface on the substrate, which can directly output and input the signal of the infrared detector chip. Back-end users do not need to bond and output the pins of the infrared detector when using it. In addition, a protective casing for protecting the infrared detector is also set on the substrate, so that the sides of the infrared detector, pins, leads and other components are all in the cavity formed by the casing and the substrate, which physically protects the infrared detector. The problem that the infrared detector is damaged due to collision or scratches between the infrared detector and objects in the external environment is avoided. In addition, functional chips with different functions are integrated on the substrate, so that the functions of the WLP device can be expanded, the user does not need to carry out secondary development, and the user's use cost and use difficulty are reduced.
附图说明Description of drawings
为了更清楚的说明本发明实施例或现有技术的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单的介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to more clearly illustrate the embodiments of the present invention or the technical solutions of the prior art, the following will briefly introduce the accompanying drawings used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only For some embodiments of the present invention, for those of ordinary skill in the art, other drawings can also be obtained according to these drawings without creative efforts.
图1为本发明实施例提供的保护壳体的结构示意图;1 is a schematic structural diagram of a protective casing provided by an embodiment of the present invention;
图2为本发明实施例提供的集成器件模组的部分结构示意图;2 is a partial structural schematic diagram of an integrated device module provided by an embodiment of the present invention;
图3为本发明实施例提供的基板背面结构示意图。FIG. 3 is a schematic diagram of a backside structure of a substrate according to an embodiment of the present invention.
具体实施方式Detailed ways
为了使本技术领域的人员更好地理解本发明方案,下面结合附图和具体实施方式对本发明作进一步的详细说明。显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。In order to make those skilled in the art better understand the solution of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. Obviously, the described embodiments are only some, but not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
如图1和图2所示,图1为本发明实施例提供的保护壳体的结构示意图,图2为本发明实施例提供的集成器件模组的部分结构示意图,具体可以包括:As shown in FIGS. 1 and 2 , FIG. 1 is a schematic structural diagram of a protective casing provided by an embodiment of the present invention, and FIG. 2 is a partial structural schematic diagram of an integrated device module provided by an embodiment of the present invention, which may specifically include:
基板2,设置在基板2上的红外探测器1,以及保护壳体3;a substrate 2, an infrared detector 1 arranged on the substrate 2, and a protective casing 3;
具体地,该基板2可以是PCB板、陶瓷板或者是其他材质的基板,对此,本发明中不做具体的限定。Specifically, the substrate 2 may be a PCB board, a ceramic board or a substrate made of other materials, which is not specifically limited in the present invention.
其中,基板2上还集成设置有一个以上且具有不同功能的功能芯片;Wherein, the substrate 2 is further integrated with one or more functional chips with different functions;
红外探测器1为基于WLP封装技术封装红外探测芯片获得的器件;Infrared detector 1 is a device obtained by packaging an infrared detection chip based on WLP packaging technology;
红外探测器1贴合设置在基板2上,且红外探测器1的引脚通过金属引线和基板2的I/O接口电连接;The infrared detector 1 is attached and arranged on the substrate 2, and the pins of the infrared detector 1 are electrically connected to the I/O interface of the substrate 2 through metal leads;
保护壳体3和基板2固定连接,如图1和图2所示,实际组装后的模组中,图1中的保护壳体3是扣合在图2中的结构部件上,并和图2中基板2的边缘位置固定连接,进而在保护壳体3和基板2之间形成容纳芯片的空腔;空腔对应所述红外探测器1的窗口上通光区位置的腔壁具有通孔4,该通孔4的作用主要用于使窗口上的通光区能够接收外部光信号,因此,且通孔4的大小大于通光区面积的大小,避免对通光区产生遮挡。The protective shell 3 and the base plate 2 are fixedly connected, as shown in Figures 1 and 2. In the actual assembled module, the protective shell 3 in Figure 1 is fastened to the structural component in Figure 2, and is consistent with Figure 2. In 2, the edge positions of the substrate 2 are fixedly connected, and then a cavity for accommodating the chip is formed between the protective shell 3 and the substrate 2; the cavity wall corresponding to the position of the light-passing area on the window of the infrared detector 1 has a through hole 4. The function of the through hole 4 is mainly to enable the light-passing area on the window to receive external light signals. Therefore, the size of the through-hole 4 is larger than the area of the light-passing area to avoid blocking the light-passing area.
需要说明的是,本发明中所提供的集成器件模组,是针对WLP封装技术获得的红外探测器1经过进一步地开发而获得的产品。It should be noted that the integrated device module provided in the present invention is a product obtained by further developing the infrared detector 1 obtained by the WLP packaging technology.
晶圆级封装(WLP)是以晶圆为封装处理对象,而非传统的封装系以单一芯片为加工对象。在进行芯片切割前已在晶圆上完成所有的封装测试动作,故几乎所有制作过程均在晶圆厂完成,而排除封装厂的传统制程。当一片晶圆从代工厂出来后,就直接在整片芯片上进行封装制程,最后切割下来时,一是一颗颗封装好的IC成品,在时间及成本上都很经济;本申请中基于晶圆级封装技术封装芯片所获得的红外探测器,通过该封装技术封装芯片,在很大程度上提高了芯片的集成度,结构更小,布局更紧凑。但即便是通过晶圆级封装后形成的红外探测器的IC成品,后端用户在使用时也需要进行二次开发,而部分用户并不具备二次开发的能力和条件。并且IC成品的芯片在运输过程中,也会在一定程度上受到外界环境的影响。Wafer-level packaging (WLP) uses wafers as the packaging processing object, rather than the traditional packaging system which uses a single chip as the processing object. All packaging and testing operations have been completed on the wafer before chip dicing, so almost all manufacturing processes are completed in the wafer factory, excluding the traditional process of the packaging factory. When a wafer comes out of the foundry, the packaging process is directly carried out on the whole chip, and when it is finally cut, one is the packaged IC products, which is economical in terms of time and cost; this application is based on The infrared detector obtained by packaging the chip with the wafer-level packaging technology, through which the chip is packaged, the integration degree of the chip is improved to a great extent, the structure is smaller, and the layout is more compact. However, even the IC products of infrared detectors formed by wafer-level packaging require secondary development by back-end users, and some users do not have the ability and conditions for secondary development. And the chip of the IC product will be affected by the external environment to a certain extent during the transportation process.
本实施例中提供的集成器件模组中,将红外探测器1是经过晶圆级封装后获得的IC成品中的一种,封装在基板2上,使得该基板2上具有引脚以及和引脚电连接的I/O接口,具体的可以是采用LCC封装、BGA封装或者其他封装技术进行封装,对此本实施例中不做限定。将红外探测器1的引脚和基板2的引脚通过金属引线相连接,那么,红外探测器1的信号即可通过基板2的I/O接口输入和输出,具体地,该I/O接口可以是JEDEC标准接口或者其他具有类似功能的接口,对此本实施例中不做限定。后端用户在使用时,无需再对红外探测器1的引脚进行加工,为用户的使用提供便利。In the integrated device module provided in this embodiment, the infrared detector 1 is one of IC products obtained after wafer-level packaging, and is packaged on the substrate 2, so that the substrate 2 has pins and leads. The I/O interface electrically connected to the pins may specifically be packaged using LCC packaging, BGA packaging or other packaging technologies, which is not limited in this embodiment. Connect the pins of the infrared detector 1 to the pins of the substrate 2 through metal leads, then the signals of the infrared detector 1 can be input and output through the I/O interface of the substrate 2. Specifically, the I/O interface It may be a JEDEC standard interface or another interface with similar functions, which is not limited in this embodiment. When the back-end user uses it, there is no need to process the pins of the infrared detector 1, which provides convenience for the user.
其次,还设置有保护壳体3,使得红外探测器1、引脚以及金属引线等均设置在保护壳体3和基板2形成的空腔之中,形成对红外探测器1的物理保护避免红外探测器1及其引脚等部件在运输过程中受外部环境的碰撞或刮划。并且在红外探测器1的窗口位置还设有通孔4,便于光信号通过该通孔4入射至窗口。Secondly, a protective casing 3 is also provided, so that the infrared detector 1, pins and metal leads are all arranged in the cavity formed by the protective casing 3 and the substrate 2, so as to form a physical protection for the infrared detector 1 to avoid infrared The detector 1 and its pins and other components are bumped or scratched by the external environment during transportation. In addition, a through hole 4 is also provided at the window position of the infrared detector 1 , so that the light signal can be incident to the window through the through hole 4 .
另外,在基板2上除了封装有红外探测器1之外,还集成设置有多个具有不同功能的芯片。因为在实际应用过程中红外探测器的功能的实现往往还需要和其他功能芯片配合使用,才能够实现完整的红外探测器的功能。如果模组中仅仅只存在红外探测器1,后端用户在投入应用时,还需要对该模组进行二次开发,使得红外探测器的使用更为繁琐。而本申请中直接将红外探测器和其他功能的芯片集成设置于同一基板上,用户即可获得一个具有完整红外探测器功能的产品,无需用户进行二次开发,为用户的使用提供便利。In addition, in addition to the infrared detector 1 packaged on the substrate 2, a plurality of chips with different functions are also integrated. Because in the actual application process, the realization of the function of the infrared detector often needs to be used in conjunction with other functional chips, so that the complete function of the infrared detector can be realized. If only the infrared detector 1 exists in the module, the back-end user needs to carry out secondary development of the module when putting it into application, which makes the use of the infrared detector more cumbersome. In this application, the infrared detector and other functional chips are directly integrated on the same substrate, so that the user can obtain a product with complete infrared detector functions, which does not require the user to carry out secondary development, and provides convenience for the user.
综上所述,本发明所提供的集成器件模组,能够很好的保护红外探测器1不受外界环境的影响,并集成有多种功能的芯片,使得用户能够获得具有完成功能的模组产品,便于用户的使用。To sum up, the integrated device module provided by the present invention can well protect the infrared detector 1 from the influence of the external environment, and integrates chips with various functions, so that the user can obtain a module with complete functions product, which is convenient for users to use.
可选地,在本发明的另一具体实施例中,还可以进一步地包括:Optionally, in another specific embodiment of the present invention, it may further include:
功能芯片包括图像处理芯片、数据存储芯片、晶振器或FPGA芯片中的任意一种或多种芯片。The functional chips include any one or more of image processing chips, data storage chips, crystal oscillators or FPGA chips.
在红外探测器的实际应用过程中,图像处理芯片、数据存储芯片、晶振器、FPGA芯片为红外探测器中普遍使用的几种功能芯片。将这几种芯片中的一个或多个与红外探测器1共同集成于同一模组中,便于用户使用。In the practical application of infrared detectors, image processing chips, data storage chips, crystal oscillators, and FPGA chips are several functional chips commonly used in infrared detectors. One or more of these kinds of chips and the infrared detector 1 are integrated into the same module, which is convenient for users to use.
可选地,在本发明的另一具体实施例中,还可以包括:Optionally, in another specific embodiment of the present invention, it may also include:
各个功能芯片和红外探测器分别设置在基板两个不同的表面。Each functional chip and infrared detector are respectively arranged on two different surfaces of the substrate.
具体地,如图3所示,图3为本发明实施例提供的基板背面结构示意图,在基板背面同时集成设置有多个功能芯片5。将各个功能芯片5和红外探测器1分别设置在基板2两个不同的表面,充分利用基板2两个不同表面的空间面积,减小基板2尺寸,使得模组结构更趋向于小型化。Specifically, as shown in FIG. 3 , FIG. 3 is a schematic diagram of a backside structure of a substrate provided by an embodiment of the present invention, and a plurality of functional chips 5 are integrated and disposed on the backside of the substrate at the same time. The functional chips 5 and the infrared detectors 1 are respectively arranged on two different surfaces of the substrate 2, making full use of the space area of the two different surfaces of the substrate 2, reducing the size of the substrate 2, and making the module structure tend to be more miniaturized.
当然,如果本发明提供的集成器件模组在使用过程中,设置容纳集成器件模组的空间体积足够大,该集成器件模组中的各个功能芯片和红外探测器也可以均设置在基板的同一表面上,对此本发明中不做限定。Of course, if the integrated device module provided by the present invention has a large enough space for accommodating the integrated device module during use, each functional chip and infrared detector in the integrated device module can also be arranged on the same side of the substrate. On the surface, this is not limited in the present invention.
可选地,在本发明的另一具体实施例中,还可以包括:Optionally, in another specific embodiment of the present invention, it may also include:
保护壳体3为塑料壳体;The protective shell 3 is a plastic shell;
保护壳体3的和红外探测器1相连的一端凸出于红外探测器。1The end of the protective casing 3 connected to the infrared detector 1 protrudes out of the infrared detector. 1
具体地,保护壳体3和红外探测器1的窗口边缘位置贴合连接,并凸出于窗口表面,也即是通孔4的边缘凸出于窗口的表面,有利于保护保护壳体3内部的红外探测器1及其相关部件。Specifically, the protective casing 3 and the edge of the window of the infrared detector 1 are attached to each other and protrude from the surface of the window, that is, the edge of the through hole 4 protrudes from the surface of the window, which is beneficial to protect the interior of the protective casing 3 The infrared detector 1 and its related components.
可选地,在本发明的另一具体实施例中,还可以进一步地包括:Optionally, in another specific embodiment of the present invention, it may further include:
保护壳体3的表面还设有防静电膜层。The surface of the protective casing 3 is also provided with an antistatic film layer.
对于基于WLP技术获得的红外探测器1而言,静电能够严重破环芯片的电路结构,并破坏芯片的性能,而在模组运输和组装过程中,不可避免的会产生静电,为了避免静电对红外探测器1以及其他功能芯片4的性能产生影响,可以在保护壳体3表面设置防静电膜层,具体地可以设置可导电的膜层,便于将静电消除。For the infrared detector 1 obtained based on WLP technology, static electricity can seriously damage the circuit structure of the chip and damage the performance of the chip. During the transportation and assembly of the module, static electricity will inevitably be generated. The performance of the infrared detector 1 and other functional chips 4 is affected, and an antistatic film layer, specifically a conductive film layer, can be provided on the surface of the protective casing 3 to facilitate the elimination of static electricity.
本说明书中各个实施例采用递进的方式描述,每个实施例重点说明的都是与其它实施例的不同之处,各个实施例之间相同或相似部分互相参见即可。对于实施例公开的装置而言,由于其与实施例公开的方法相对应,所以描述的比较简单,相关之处参见方法部分说明即可。The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments, and the same or similar parts between the various embodiments may be referred to each other. As for the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant part can be referred to the description of the method.
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