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CN109975308A - A kind of surface inspecting method based on deep learning - Google Patents

A kind of surface inspecting method based on deep learning Download PDF

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Publication number
CN109975308A
CN109975308A CN201910198350.6A CN201910198350A CN109975308A CN 109975308 A CN109975308 A CN 109975308A CN 201910198350 A CN201910198350 A CN 201910198350A CN 109975308 A CN109975308 A CN 109975308A
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image
obtains
deep learning
rle
method based
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CN109975308B (en
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林瑞滨
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Weiku Xiamen Information Technology Co ltd
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Weiku Xiamen Information Technology Co ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/13Edge detection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30Computing systems specially adapted for manufacturing

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The present invention provides a kind of surface inspecting method based on deep learning, sweeps camera by line and acquires image, does left and right sides edge detection to acquisition image later and border extended obtains first object image;Background subtraction algorithm is carried out to first object image and obtains the second target image;Binaryzation is carried out to the second target image and obtains bianry image;RLE is carried out to bianry image to encode to obtain RLE image;Particle filter is carried out to RLE image and obtains defective particles position;First object image corresponding region progress ROI is found to defective particles position to cut to obtain cutting image, is able to detect close to the flaw and defect in the cylinder material of noise level.

Description

A kind of surface inspecting method based on deep learning
Technical field
The present invention relates to a kind of surface inspecting methods based on deep learning.
Background technique
" cylinder material " is a large amount of and with very high rate quantity-produced flat material.Common cylinder material includes Fabric, metal plate, paper, film, non-woven fabrics and nonwoven plastic etc..It needs to detect web surface in process of production to send out Existing tiny flaw and defect.Existing technology uses common binaryzation technology, is merely able to detect apparent big defect, for small Defect and the relatively low unconspicuous defects detection of contrast do not come out, fail to detect that these flaws and defect may be led It causes the cylinder material of batch to be unable to satisfy customer requirement, causes serious consequence.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of surface inspecting method based on deep learning, meets and use Family uses.
The present invention is implemented as follows: a kind of surface inspecting method based on deep learning, sweeps phase comprising at least one line Machine includes the following steps:
Step 1 sweeps camera acquisition image by line, does left and right sides edge detection and border extended to acquisition image later Obtain first object image;
Step 2 obtains the second target image to first object image progress background subtraction algorithm;
Step 3 obtains bianry image to the second target image progress binaryzation;
Step 4 encodes to obtain RLE image to bianry image progress RLE;
Step 5 obtains defective particles position to RLE image progress particle filter;
Step 6 finds first object image corresponding region to defective particles position and carries out ROI and cut to obtain to cut image.
Further, further include step 7, defect with deep learning carried out to image is cut using faster-rcnn algorithm Particle precise classification.
Further, the step 1 is further specifically: sweeps camera by line and acquires image, uses the edge Canny later Detection algorithm does left and right sides edge detection to acquisition image, then carries out border extended and obtain first object image.
Further, the step 2 is further specifically: is carried on the back using Gabor filtering algorithm to first object image Scape subduction algorithm obtains the second target image.
Further, the step 3 is further specifically: using Niblack Binarization methods to the second target image into Row binaryzation obtains bianry image.
Further, the step 4 is further specifically: using RLE run length encoding compression algorithm to bianry image RLE is carried out to encode to obtain RLE image.
Further, the step 6 is further specifically: finds the to defective particles position using bilinear interpolation algorithm One target image corresponding region carries out ROI and cuts to obtain cutting image.
The present invention has the advantage that the present invention may be connected to the web surface detection system of existing factory's Ethernet System;Accurate classification can be made to defect;It is able to detect close to the flaw and defect in the cylinder material of noise level.
Detailed description of the invention
The present invention is further illustrated in conjunction with the embodiments with reference to the accompanying drawings.
Fig. 1 is the method for the present invention execution flow chart.
Specific embodiment
As shown in Figure 1, the present invention is implemented as follows: a kind of surface inspecting method based on deep learning, includes at least One line sweeps camera, includes the following steps:
Step 1 sweeps camera acquisition image by line, is controlled later using Canny edge detection algorithm to acquisition image Both sides of the edge detection, then carry out border extended and obtain first object image;
Step 2 obtains the second target figure to first object image progress background subtraction algorithm using Gabor filtering algorithm Picture;
Step 3 obtains bianry image to the second target image progress binaryzation using Niblack Binarization methods;
Step 4 encodes to obtain RLE image using RLE run length encoding compression algorithm to bianry image progress RLE;
Step 5 obtains defective particles position to RLE image progress particle filter;
Step 6 finds first object image corresponding region progress ROI to defective particles position using bilinear interpolation algorithm Cutting obtains cutting image.
Step 7 carries out defective particles precise classification with deep learning to cutting image using faster-rcnn algorithm.
A kind of specific embodiment of the present invention:
Cylinder material detection system contains at least one line and sweeps camera, for acquiring the cylinder material with flaw or defect Partial image, each line sweep camera and be connected with an at least PC machine by network interface card, and PC machine is to acquiring image through the invention Surface inspecting method based on deep learning carries out image procossing, analysis obtains each flaw and defect information, including position and Defect type;PC machine sends server by Ethernet for defect information and is shown by server graphical user interface.
For this conventional machines study of the present invention with the embodiment of deep learning method, software-programming languages use C/C++ Language, has the advantages that cross-platform, can adapt to the PC machine of present Intel chip and the embedded device based on ARM.Have Very strong versatility.Detailed step is as follows:
Step 1: left and right sides edge detection being done to acquisition image and border extended obtains target image 1;Step 2: to mesh Logo image 1 carries out background subtraction algorithm and obtains target image 2;Step 3: binaryzation being carried out to target image 2 and obtains bianry image; Step 4: RLE being carried out to bianry image and encodes to obtain RLE image;Step 5: particle filter being carried out to RLE image and obtains defect grain Sub- position;Step 6: 1 corresponding region of target image progress ROI being found to defective particles position and cuts to obtain cutting image;Step 7: carrying out defective particles precise classification with deep learning to image is cut;
Further, step 1, left and right sides edge detection is done to acquisition image and border extended obtains target image 1;Implement Algorithm is Canny edge detection algorithm.
Further, step 2, background detection algorithm is carried out to target image 1 and obtains target image 2, background subtraction algorithm is Gabor filtering algorithm.
Further, step 3, binaryzation is carried out to target image 2 and obtains bianry image, Binarization methods are Niblack bis- Value algorithm.
Further, step 4, it carries out RLE to bianry image to encode to obtain RLE image, RLE algorithm is RLE stroke length volume Code compression algorithm.
Further, step 5, particle filter is carried out to RLE image and obtains defective particles position, particle filter algorithm.
Further, step 6,1 corresponding region of image object progress ROI is found to defective particles position to cut to obtain cutting figure Picture, trimming algorithm are that bilinear interpolation algorithm is cut.
Further, step 7, defective particles precise classification is carried out with deep learning to cutting image, deep learning algorithm is Faster-rcnn algorithm.
Although specific embodiments of the present invention have been described above, those familiar with the art should be managed Solution, we are merely exemplary described specific embodiment, rather than for the restriction to the scope of the present invention, it is familiar with this The technical staff in field should be covered of the invention according to modification and variation equivalent made by spirit of the invention In scope of the claimed protection.

Claims (7)

1. a kind of surface inspecting method based on deep learning, it is characterised in that: sweep camera comprising at least one line, including as follows Step:
Step 1 sweeps camera acquisition image by line, does left and right sides edge detection to acquisition image later and border extended obtains First object image;
Step 2 obtains the second target image to first object image progress background subtraction algorithm;
Step 3 obtains bianry image to the second target image progress binaryzation;
Step 4 encodes to obtain RLE image to bianry image progress RLE;
Step 5 obtains defective particles position to RLE image progress particle filter;
Step 6 finds first object image corresponding region to defective particles position and carries out ROI and cut to obtain to cut image.
2. a kind of surface inspecting method based on deep learning according to claim 1, it is characterised in that: further include step 7, defective particles precise classification is carried out with deep learning to cutting image using faster-rcnn algorithm.
3. a kind of surface inspecting method based on deep learning according to claim 1, it is characterised in that: the step 1 Further specifically: camera is swept by line and acquires image, left and right two is done to acquisition image using Canny edge detection algorithm later Side edge detection, then carry out border extended and obtain first object image.
4. a kind of surface inspecting method based on deep learning according to claim 1, it is characterised in that: the step 2 Further specifically: background subtraction algorithm is carried out to first object image using Gabor filtering algorithm and obtains the second target image.
5. a kind of surface inspecting method based on deep learning according to claim 1, it is characterised in that: the step 3 Further specifically: binaryzation is carried out to the second target image using Niblack Binarization methods and obtains bianry image.
6. a kind of surface inspecting method based on deep learning according to claim 1, it is characterised in that: the step 4 Further specifically: RLE is carried out to bianry image using RLE run length encoding compression algorithm and encodes to obtain RLE image.
7. a kind of surface inspecting method based on deep learning according to claim 1, it is characterised in that: the step 6 Further specifically: first object image corresponding region is found to defective particles position using bilinear interpolation algorithm and carries out ROI Cutting obtains cutting image.
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US12536131B2 (en) 2017-07-24 2026-01-27 Tesla, Inc. Vector computational unit
US12216610B2 (en) 2017-07-24 2025-02-04 Tesla, Inc. Computational array microprocessor system using non-consecutive data formatting
US11403069B2 (en) 2017-07-24 2022-08-02 Tesla, Inc. Accelerated mathematical engine
US11681649B2 (en) 2017-07-24 2023-06-20 Tesla, Inc. Computational array microprocessor system using non-consecutive data formatting
US11893393B2 (en) 2017-07-24 2024-02-06 Tesla, Inc. Computational array microprocessor system with hardware arbiter managing memory requests
US12307350B2 (en) 2018-01-04 2025-05-20 Tesla, Inc. Systems and methods for hardware-based pooling
US11561791B2 (en) 2018-02-01 2023-01-24 Tesla, Inc. Vector computational unit receiving data elements in parallel from a last row of a computational array
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US11665108B2 (en) 2018-10-25 2023-05-30 Tesla, Inc. QoS manager for system on a chip communications
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US12014553B2 (en) 2019-02-01 2024-06-18 Tesla, Inc. Predicting three-dimensional features for autonomous driving
US11748620B2 (en) 2019-02-01 2023-09-05 Tesla, Inc. Generating ground truth for machine learning from time series elements
US12164310B2 (en) 2019-02-11 2024-12-10 Tesla, Inc. Autonomous and user controlled vehicle summon to a target
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CN112651920A (en) * 2020-07-24 2021-04-13 深圳市唯特视科技有限公司 PCB bare board line flaw detection method and device and electronic equipment
US12462575B2 (en) 2021-08-19 2025-11-04 Tesla, Inc. Vision-based machine learning model for autonomous driving with adjustable virtual camera
US12522243B2 (en) 2021-08-19 2026-01-13 Tesla, Inc. Vision-based system training with simulated content

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