CN109813628A - The density measuring method and density uniformity detection method of one-dimensional nano material film - Google Patents
The density measuring method and density uniformity detection method of one-dimensional nano material film Download PDFInfo
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- CN109813628A CN109813628A CN201711161591.0A CN201711161591A CN109813628A CN 109813628 A CN109813628 A CN 109813628A CN 201711161591 A CN201711161591 A CN 201711161591A CN 109813628 A CN109813628 A CN 109813628A
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Abstract
Provide a kind of density measuring method of one-dimensional nano material film and the density uniformity detection method of one-dimensional nano material film.The density measuring method of the one-dimensional nano material film includes the corresponding contact angle of measurement one-dimensional nano material film；And the density of one-dimensional nano material film is determined based on contact angle.
Description
Technical field
This disclosure relates to monodimension nanometer material, and in particular to the density measuring method and density of one-dimensional nano material film are equal
Even property detection method.
Background technique
Monodimension nanometer material has obtained great development in recent years.In general, density of the monodimension nanometer material in substrate surface
It is the parameter for needing to measure with uniformity, and common measurement means usually require to show using scanning electron microscope, atomic force
The topography scans equipment such as micro mirror.These measuring devices are expensive, characterization speed is slow, are difficult to meet the production requirement of technical grade.
Summary of the invention
According to the disclosure in a first aspect, providing a kind of density measuring method of one-dimensional nano material film comprising:
Measure the corresponding contact angle of one-dimensional nano material film；And
The density of one-dimensional nano material film is determined based on contact angle.
According at least one embodiment of the disclosure, the step of measuring one-dimensional nano material film corresponding contact angle, is wrapped
It includes:
Drop is formed on one-dimensional nano material film；And
Drop is manually measured relative to one-dimensional nano material film by angle measurement unit or height measuring device
Contact angle.
According at least one embodiment of the disclosure, the step of measuring one-dimensional nano material film corresponding contact angle, is wrapped
It includes: measuring the corresponding contact angle of one-dimensional nano material film using contact angle measurement.
According at least one embodiment of the disclosure, the step of measuring the contact angle of drop includes: measure drop more
A contact angle, and calculate the average value of multiple contact angles.
According at least one embodiment of the disclosure, the step of the density of one-dimensional nano material film is determined based on contact angle
It suddenly include: the density that monodimension nanometer material is determined based on average value.
According at least one embodiment of the disclosure, one-dimensional nano material film includes one of following film: carbon nanometer
Pipe film, silicon nanowires film and silver nanowires film.
According at least one embodiment of the disclosure, method further include: establish the close of contact angle and monodimension nanometer material
The corresponding relationship of degree,
The step of density of one-dimensional nano material film is determined based on contact angle further include: according to corresponding relationship, determine
The density of one-dimensional nano material film corresponding with contact angle.
According at least one embodiment of the disclosure, the corresponding relationship of the density of contact angle and monodimension nanometer material is established
The step of further include:
The corresponding contact angle of multiple one-dimensional nano material films is measured, plurality of one-dimensional nano material film has difference
Density；And
Contact angle and multiple and different density based on measurement establish corresponding relationship.
According at least one embodiment of the disclosure, the step of the density of one-dimensional nano material film is determined based on contact angle
It suddenly include: to be determined and contact angle according to the corresponding relationship of the density of predetermined contact angle and one-dimensional nano material film
The density of corresponding one-dimensional nano material film.
According to the second aspect of the disclosure, a kind of density uniformity detection method of one-dimensional nano material film is provided,
Comprising:
The density measure of above-mentioned one-dimensional nano material film is executed at multiple positions on one-dimensional nano material film
Method, to obtain density of the one-dimensional nano material film at multiple positions；And
The even density of one-dimensional nano material film is determined based on density of the one-dimensional nano material film at multiple positions
Property.
Detailed description of the invention
Attached drawing shows the illustrative embodiments of the disclosure, and it is bright together for explaining the principles of this disclosure,
Which includes these attached drawings to provide further understanding of the disclosure, and attached drawing is included in the description and constitutes this
Part of specification.
Fig. 1 diagrammatically illustrates the stream of the density measuring method of the one-dimensional nano material film according to disclosure embodiment
Cheng Tu；
Fig. 2 shows the change curves according to the contact angle of disclosure embodiment relative to the density of carbon nano-tube film
Example；
Fig. 3 illustrates the density for establishing contact angle relative to carbon nano-tube film according to disclosure embodiment
Change curve process flow chart；And
Fig. 4 shows the stream of the density uniformity detection method according to the one-dimensional nano material film of disclosure embodiment
Cheng Tu.
Specific embodiment
The disclosure is described in further detail with reference to the accompanying drawings and examples.It is understood that this place is retouched
The specific embodiment stated is only used for explaining related content, rather than the restriction to the disclosure.It also should be noted that in order to just
Part relevant to the disclosure is illustrated only in description, attached drawing.
It should be noted that in the absence of conflict, the feature in embodiment and embodiment in the disclosure can phase
Mutually combination.The disclosure is described in detail below with reference to the accompanying drawings and in conjunction with the embodiments.
The contact angle mentioned in the disclosure refers at the contact point of drop and the surface of solids on the surface of solids, drop wheel
Angle between wide tangent line and the surface of solids.The value range of contact angle is between 0 ° to 180 °.
The density for the carbon nano-tube film mentioned in the disclosure refers to the number of carbon nanotube in unit distance, such as can
With every micron of the carbon nanotube number of finger.
Fig. 1 diagrammatically illustrates the stream of the density measuring method of the one-dimensional nano material film according to disclosure embodiment
Cheng Tu.As shown in Figure 1, according to the density measuring method of the one-dimensional nano material film of disclosure embodiment can include:
S1, the corresponding contact angle of measurement one-dimensional nano material film；And
S2 determines the density of one-dimensional nano material film based on contact angle.
The method of the measurement contact angle used in step S1 may include but be not limited to goniometry and amount supreme people's court etc..
Using goniometry, above-mentioned step S1 can include: drop is formed on one-dimensional nano material film；
The contact angle of the drop on one-dimensional nano material film is measured by angle measurement unit.For example, can be by being equipped in microscope
Protractor measure contact angle, or then protractor can be used in the image projection to screen of drop or the image of shooting drop
Measurement.
Using supreme people's court is measured, above-mentioned step S1 can include: drop is formed on one-dimensional nano material film,
Drop amount is continuously increased until when the height of drop no longer increases, maximum height h is measured by height measuring device, and according to
Following formula (1) determines contact angle θ:
Cos θ=1- ρ * g*h2/2σ (1)
Wherein ρ indicates the density of drop, and σ indicates the surface tension of drop, and g indicates acceleration of gravity.
In addition to the method for manual measurement contact angle, it is thin to automatically derive monodimension nanometer material that contact angle measurement also can be used
The contact angle of drop on film.
In addition, can measure multiple contacts of the drop when measuring the contact angle of the drop on one-dimensional nano material film
Angle, and use the average value of multiple contact angle as the contact angle of the drop on the one-dimensional nano material film.
When measuring the contact angle of the drop on one-dimensional nano material film, the drop of any appropriate liquid can be used for example
For water droplet as medium, the disclosure is not restricted to this.
Above-mentioned determines that the step S2 of the density of one-dimensional nano material film may include according to predetermined based on contact angle
Contact angle and one-dimensional nano material film density corresponding relationship, determine that monodimension nanometer material corresponding with contact angle is thin
The density of film.For example, can be in change curve of the predetermined contact angle relative to the density of the one-dimensional nano material film
Density corresponding with the contact angle is found out according to the contact angle measured.Fig. 2 shows connecing according to disclosure embodiment
Example of the feeler relative to the change curve of the density of carbon nano-tube film.However it is it will be understood by those skilled in the art that above-mentioned
Contact angle is only to indicate contact angle and one-dimensional nano material film relative to the change curve of the density of one-dimensional nano material film
Density corresponding relationship a kind of exemplary forms, be also possible to contact angle it is corresponding with the density of one-dimensional nano material film close
It is any other appropriate form such as table.
It may also include that according to the density measuring method of the one-dimensional nano material film of disclosure embodiment and establish contact angle
With the corresponding relationship of the density of one-dimensional nano material film.For example, contact angle and 1-dimention nano can be established by following steps
The corresponding relationship of the density of material film: measuring the corresponding contact angle of multiple one-dimensional nano material films with different densities,
And above-mentioned corresponding relationship is established from multiple different density based on the contact angle of measurement.Establishing contact angle and a wiener
In the case where the corresponding relationship of the density of rice material film, it can be determined based on the contact angle of measurement corresponding with the contact angle
The density of one-dimensional nano material film.As an example, being hereinafter described, to establish contact angle thin relative to monodimension nanometer material
The process of the change curve of the density of film.
As shown in Fig. 2 of the disclosure, the density of contact angle and one-dimensional nano material film is corresponded, and contact angle with
The density direct proportionality of one-dimensional nano material film.That is, can determine that one and the contact angle by each contact angle
The density of corresponding one-dimensional nano material film, and contact angle is bigger, with the contact angle relative to monodimension nanometer material it is thin
The density of film is bigger.
In addition, may also include that use according to the density measuring method of the one-dimensional nano material film of disclosure embodiment
One-dimensional nano material film is formed on the substrate in monodimension nanometer material solution.For example, can be used by modes such as dip-coating or spin coatings
One-dimensional nano material film is formed on the substrate in monodimension nanometer material solution.Monodimension nanometer material solution can be a nano material
Dispersion liquid, wherein the monodimension nanometer material dispersion liquid is formed and monodimension nanometer material is dispersed in water or organic solvent
's.Substrate can be such as silica substrate (such as silica wafer), sapphire substrates, quartz substrate or plastic-substrates
Deng.
It will be understood by those skilled in the art that thin according to the monodimension nanometer material mentioned in the disclosure of disclosure embodiment
The density measuring method of film is applicable to any one-dimensional nano material film.For example, above-mentioned one-dimensional nano material film can
Including but not limited to carbon nano-tube film, silicon nanowires film and silver nanowires film.
By the density measuring method according to the one-dimensional nano material film of disclosure embodiment, can quickly and easily survey
The density of one-dimensional nano material film is measured, to save the time, is reduced costs.
Fig. 3 illustrates the density for establishing contact angle relative to carbon nano-tube film according to disclosure embodiment
Change curve process flow chart.
In step S31, the carbon nano-tube film sample of multiple and different density is formed in substrate surface by dip-coating.Ability
Field technique personnel, which should be understood that, also such as spin coating can form carbon nano-tube film by other means, and the disclosure do not limit this
System.
In step s 32, the density of the carbon nano-tube film of each sample surfaces is checked by scanning electron microscope.Though
The density for so checking carbon nano-tube film using scanning electron microscope in the present embodiment, however, those skilled in the art
Member by atomic force microscope it should be understood that can also check that the density of carbon nano-tube film, the disclosure is not restricted to this.
In step S33, the corresponding contact angle of each sample is tested by contact angle measurement.Those skilled in the art answer
Understanding can also manually measure the corresponding contact angle of sample by other methods such as goniometry or amount supreme people's court.
In step S34, contact angle is established relative to carbon using mutual corresponding carbon nano-tube film density and contact angle
The change curve of the density of nano-tube film.For example, in the present embodiment, using the density of carbon nano-tube film as ordinate,
Coordinate system is established by abscissa of contact angle, marks mutual corresponding carbon obtained in step S32 and S33 in the coordinate system
The density and contact angle of nano-tube film, so that change curve of the contact angle relative to the density of carbon nano-tube film is established,
As shown in Figure 2.However, it will be understood by those skilled in the art that can also be contact angle ordinate, with the density of carbon nano-tube film
Coordinate system is established for abscissa.
It is established although above-mentioned combination attached drawing 3 is described through the density of scanning electron microscopy measurement carbon nano-tube film
Change curve of the contact angle relative to the density of carbon nano-tube film, however it will be understood by those skilled in the art that can also pass through other
Suitable mode establishes the change curve, such as can to measure multiple carbon nanotubes known to density by contact angle measurement thin
The corresponding contact angle of membrane sample, thus according to the close of contact angle corresponding to each other, measuring and known carbon nano-tube film
For degree to establish change curve, the disclosure is not restricted to this.
Exemplarily only show 6 points in Fig. 2, however it will be understood by those skilled in the art that the pairs of carbon nanometer obtained
The density and contact angle of pipe film are more, and the change curve of foundation is then more accurate.In addition it is also possible in the feelings for meeting actual requirement
Under condition, by carrying out curve fitting to limited point, the operations such as interpolation obtain change curve.
After establishing change curve of the contact angle relative to the density of carbon nano-tube film, then carbon nanotube is being measured
When the corresponding contact angle of film, it may be determined that go out the value of corresponding abscissa when ordinate is the contact angle on the change curve, it should
The value of corresponding abscissa is the density of corresponding carbon nano-tube film.For example, Fig. 2 contact angle relative to carbon nanotube
It, can be from change in the case where measuring the corresponding contact angle of carbon nano-tube film is 100 ° in the change curve of the density of film
The density that carbon nano-tube film is obtained in change curve is 40/μm；It is 93 ° measuring the corresponding contact angle of carbon nano-tube film
In the case where, the density that carbon nano-tube film can be obtained from change curve is 29/μm.
Fig. 4 shows the stream of the density uniformity detection method according to the one-dimensional nano material film of disclosure embodiment
Cheng Tu.
In step 41, the root that above-mentioned combination Fig. 1 is described can be executed at multiple positions on one-dimensional nano material film
According to the density measuring method of the one-dimensional nano material film of disclosure embodiment, to obtain on the one-dimensional nano material film
Density at multiple positions.
It in step 42, can be based on the density at multiple positions on the one-dimensional nano material film obtained in step 41 come really
Determine the density uniformity of one-dimensional nano material film.For example, the density at multiple positions obtained is all the same or variance
Less than preset value (for example, 0.1) when, then can determine the one-dimensional nano material film have uniform Density Distribution.
It, can be simply fast by the density uniformity detection method according to the one-dimensional nano material film of disclosure embodiment
Reflect that the even density implementations at one-dimensional nano material film different location are reduced into save the time fastly
This.
It will be understood by those of skill in the art that above embodiment is used for the purpose of clearly demonstrating the disclosure, and simultaneously
Non- be defined to the scope of the present disclosure.For those skilled in the art, may be used also on the basis of disclosed above
To make other variations or modification, and these variations or modification are still in the scope of the present disclosure.
Claims (10)
1. the density measuring method of one-dimensional nano material film, comprising:
Measure the corresponding contact angle of the one-dimensional nano material film；And
The density of the one-dimensional nano material film is determined based on the contact angle.
2. being connect the method according to claim 1, wherein the measurement one-dimensional nano material film is corresponding
The step of feeler includes:
Drop is formed on the one-dimensional nano material film；And
It is thin relative to the monodimension nanometer material that the drop is manually measured by angle measurement unit or height measuring device
The contact angle of film.
3. being connect the method according to claim 1, wherein the measurement one-dimensional nano material film is corresponding
The step of feeler includes: that the corresponding contact angle of the one-dimensional nano material film is measured using contact angle measurement.
4. according to the method described in claim 2, it is characterized in that, the step of contact angle of the measurement drop include:
Multiple contact angles of the drop are measured, and calculate the average value of the multiple contact angle.
5. according to the method described in claim 4, it is characterized in that, described determine the 1-dimention nano material based on the contact angle
The step of expecting the density of film includes: the density that the monodimension nanometer material is determined based on the average value.
6. the method according to claim 1, wherein the one-dimensional nano material film include following film it
One: carbon nano-tube film, silicon nanowires film and silver nanowires film.
7. the method according to claim 1, wherein
The method also includes: the corresponding relationship of the density of contact angle and monodimension nanometer material is established,
The step of density that the one-dimensional nano material film is determined based on the contact angle further include: according to the correspondence
Relationship determines the density of one-dimensional nano material film corresponding with the contact angle.
8. the method according to the description of claim 7 is characterized in that the density for establishing contact angle and monodimension nanometer material
The step of corresponding relationship further include:
The corresponding contact angle of multiple one-dimensional nano material films is measured, wherein the multiple one-dimensional nano material film has difference
Density；And
Contact angle and the plurality of different density based on measurement establish the corresponding relationship.
9. the method according to claim 1, wherein described determine the 1-dimention nano material based on the contact angle
The step of expecting the density of film includes: to close according to predetermined contact angle is corresponding with the density of one-dimensional nano material film
System, determines the density of the one-dimensional nano material film corresponding with the contact angle.
10. the density uniformity detection method of one-dimensional nano material film, which is characterized in that the described method includes:
1-dimention nano as claimed in any one of claims 1-9 wherein is executed at multiple positions on one-dimensional nano material film
The density measuring method of material film, to obtain density of the one-dimensional nano material film at the multiple position；And
The one-dimensional nano material film is determined based on density of the one-dimensional nano material film at the multiple position
Density uniformity.
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| CN110346239A (en) * | 2019-07-10 | 2019-10-18 | 国家纳米科学中心 | A kind of detection method of nano material density |
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