CN109737859A - The stickup foreign matter detecting method and its device of flaky medium - Google Patents
The stickup foreign matter detecting method and its device of flaky medium Download PDFInfo
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Abstract
The invention discloses the stickup foreign matter detecting method of flaky medium, step includes: the voltage data that flaky medium to be detected is obtained using Hall element；According to voltage data and voltage thickness conversion formula, the thickness data of flaky medium to be detected is obtained；The thickness average value of the flaky medium to be detected is calculated according to the thickness data；Using flaky medium to be detected in the plane thickness be greater than the point of preset normal thickness threshold value as abnormal point, and calculate the abnormal area area of the flaky medium to be detected according to continuously multiple abnormal points；The error in the abnormal area area between the thickness and the thickness average value of abnormal point is calculated, and according to the abnormal area area, the error calculation foreign matter index；When the foreign matter index is greater than preset outlier threshold, determine that there are foreign matters for the flaky medium.Implement the embodiment of the present invention, can accurately verify whether be stained with foreign matter, and then improves measurement accuracy.
Description
Technical field
The present invention relates to Thickness sensitivity technical fields, more particularly, to a kind of stickup foreign matter detecting method of flaky medium
And its device.
Background technique
With the raising of China's expanding economy and international status, rmb paper currency circulation and domestic and international circulation are continuous
Increase, during fiduciary circulation, inevitably will appear breakage, people can paste the attachments such as adhesive tape on bank note, and this kind of broken
The heavier bank note for having pasted attachment is damaged, requires exit market circulation according to the People's Bank；Currently, sheet valuable document
Generally it is fabricated to using special material, and with certain thickness feature, it is special by the thickness to sheet valuable document
Sign can identify the adhesive tape pasted on banknote and dog-ear etc., to reject underproof banknote.However, existing detection device one
As using ultrasonic sensor detect thickness, the measurement accuracy of this method is low, cannot accurately verify foreign matter.
Summary of the invention
The present invention provides the stickup foreign matter detecting methods and its device of a kind of flaky medium, using Hall element to examine
It surveys the thickness of thin slice and judges that whether extremely thickness, to accurately verify whether be stained with foreign matter, and then improve measurement accuracy.
In order to solve the above-mentioned technical problems, the present invention provides a kind of stickup foreign matter detecting method of flaky medium, steps
Suddenly include:
The voltage data of flaky medium to be detected is obtained using Hall element；Wherein, the voltage data includes institute
State the corresponding voltage value of flaky medium institute to be detected dot thickness each in the plane；
According to the voltage data and voltage thickness conversion formula, the thickness number of the flaky medium to be detected is obtained
According to；Wherein, the thickness data include the flaky medium to be detected every bit in the plane thickness；
The thickness average value of the flaky medium to be detected is calculated according to the thickness data；
Using the flaky medium to be detected in the plane thickness be greater than preset normal thickness threshold value point as
Abnormal point, and calculate according to continuous multiple abnormal points the abnormal area area of the flaky medium to be detected；
The error in the abnormal area area between the thickness and the thickness average value of abnormal point is calculated, and according to institute
State abnormal area area, the error calculation foreign matter index:
Wherein, Tape is foreign matter index, and K is calibration factor, and S is abnormal area area, and H is error；
When the foreign matter index is greater than preset outlier threshold, determine that there are foreign matters for the flaky medium.
Preferably, the voltage data that flaky medium to be detected is obtained using Hall element, specifically:
The voltage data of flaky medium to be detected is obtained using Hall element:
Wherein, Z indicates voltage data, zmnIndicate the flaky medium institute to be detected dot thickness pair each in the plane
The voltage value answered, m indicate line number, and n indicates columns.
Preferably, described according to the voltage data and voltage thickness conversion formula, it obtains described to be detected thin
The thickness data of piece class medium, specifically:
The voltage data is converted into thickness data, the voltage thickness conversion according to the voltage thickness conversion formula
Formula are as follows:
X=A (Z-Z0)
Wherein, X is thickness data, and Z is voltage data, and A is a diagonal matrix, Z0Collected number when for a thickness of zero
According to.
It is preferably, described that by the flaky medium institute to be detected, thickness is greater than preset normal thickness in the plane
The point of threshold value is spent as abnormal point, and calculates the different of the flaky medium to be detected according to continuous multiple abnormal points
Normal region area, specifically:
The voltage value for being greater than preset normal thickness threshold value to every row in the thickness data is averaged, and obtains every row
Thickness series of mean:
Wherein, XavgFor the thickness series of mean of every row；
According to row sequence ascending order arrange, and by the element in the thickness series of mean one by one with normal thickness threshold value comparison,
It is greater than the thickness mean value of normal thickness threshold value as thin slice initial row for first；
According to row sequence descending arrange, and by the element in the thickness series of mean one by one with normal thickness threshold value comparison,
It is greater than the thickness mean value of normal thickness threshold value as thin slice termination row for first；
Set function:
Wherein, XijThe element being expressed as in the matrix of the thickness data X, i indicate line number, and j indicates that columns, thresh are
The normal thickness threshold value；
Calculating of progressively increasing is carried out to i according to the function, the j value of first condition for meeting the function is the i-th tunnel
Initial position；And calculating of successively decreasing is carried out to i, the j value of first condition for meeting the function is the final position on the i-th tunnel；
Wherein, i is more than or equal to 2；
Initial position and the termination of initial row are obtained according to the final position of the initial position on i-th tunnel, i-th tunnel
The initial position and final position of position and termination row；
According to the initial position of initial row and final position, the initial position of termination row and final position calculate it is described to
The abnormal area area of the flaky medium of detection.
Preferably, the diagonal matrix A specifically:
A=diag (a1,a2…am)
Wherein, a1、a2…amFor the element of diagonal matrix A.
Preferably, the element of the diagonal matrix A obtains by the following method:
The data with a thickness of zero are acquired, are obtained:
Wherein, Z0Collected data when for a thickness of zero；
The data with a thickness of 100 microns are acquired, are obtained:
Wherein, Z100Collected data when for a thickness of 100 microns；
To Z0And Z100The element of every a line average, obtain:
Wherein, Z0 avgCollected average value when for a thickness of zero；Z100 avgIt is collected flat when for a thickness of 100 microns
Mean value；
The element of matrix A is obtained by following equation:
Wherein, aiFor the element of matrix A.
The present invention also provides a kind of stickup detection device for foreign matter of flaky medium characterized by comprising
Voltage data acquisition module, for obtaining the voltage data of flaky medium to be detected using Hall element；Its
In, the voltage data includes the corresponding voltage value of the flaky medium institute to be detected dot thickness each in the plane；
Data conversion module, for obtaining described to be detected according to the voltage data and voltage thickness conversion formula
The thickness data of flaky medium；Wherein, the thickness data includes that the flaky medium institute to be detected is every in the plane
The thickness of a bit；
First computing module, the thickness for calculating the flaky medium to be detected according to the thickness data are average
Value；
Second computing module, for thickness to be normal greater than preset in the plane by the flaky medium institute to be detected
The point of thickness threshold value calculates the flaky medium to be detected as abnormal point, and according to continuous multiple abnormal points
Abnormal area area；
Third computing module, for calculate in the abnormal area area thickness of abnormal point and the thickness average value it
Between error, and according to the abnormal area area, the error calculation foreign matter index:
Wherein, Tape is foreign matter index, and K is calibration factor, and S is abnormal area area, and H is error；
Foreign matter determination module, for determining that the sheet is situated between when the foreign matter index is greater than preset outlier threshold
There are foreign matters for matter.
Preferably, described device further include:
Matrix data acquisition module, for obtaining the voltage data of flaky medium to be detected using Hall element:
Wherein, Z indicates voltage data, zmnIndicate the flaky medium institute to be detected dot thickness pair each in the plane
The voltage value answered, m indicate line number, and n indicates columns.
Preferably, described device further include:
Matrix data conversion module, for the voltage data to be converted to thickness according to the voltage thickness conversion formula
Data, the voltage thickness conversion formula are as follows:
X=A (Z-Z0)
Wherein, X is thickness data, and Z is voltage data, and A is a diagonal matrix, Z0Collected number when for a thickness of zero
According to.
Compared with the prior art, the invention has the following beneficial effects:
Using the thickness information of Hall element acquisition flaky medium, it is calculated by the conversion of collected thickness information
Thickness data, and thickness data is calculated, to detect the thickness of thin slice, not only measuring and calculating process is more rigorous in this way,
And calculated result is more accurate.
Wherein, judge whether thickness is abnormal, can efficiently reduce human error according to the abnormal index being calculated, from
And accurately verify whether be stained with foreign matter, and then improve measurement accuracy.
Further, since preset normal thickness threshold value can carry out adaptability adjusting according to the actual situation, can be improved different
The flexibility of analyte detection；Simultaneously according to the anomaly area being calculated, can not only judge whether to be stained with foreign matter, and can determine that different
The size of object.
Detailed description of the invention
Fig. 1 is the step flow chart of the stickup foreign matter detecting method of the flaky medium in the embodiment of the present invention；
Fig. 2 is the schematic diagram of the stickup foreign matter detecting method of the flaky medium in the embodiment of the present invention；
Fig. 3 is the original of the data processing of the stickup foreign matter detecting method of the flaky medium in the embodiment of the present invention
Reason figure；
Fig. 4 is the anomaly area signal of the stickup foreign matter detecting method of the flaky medium in the embodiment of the present invention
Figure.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
Referring to Figure 1 and Fig. 2, the embodiment of the invention provides a kind of stickup foreign matter detecting method of flaky medium, steps
Suddenly include:
The voltage data of flaky medium to be detected is obtained using Hall element；Wherein, the voltage data includes institute
State the corresponding voltage value of flaky medium institute to be detected dot thickness each in the plane；
In the present embodiment, the voltage data of flaky medium to be detected is obtained using Hall element:
Wherein, Z indicates voltage data, zmnIt is corresponding for the flaky medium institute dot thickness each in the plane to be detected
Voltage value, m indicate line number, n indicate columns.
Fig. 4 is referred to, in the present embodiment, paper is from Hall element by generating volume of data, Hall element acquisition
The data arrived are arranged in a rule channel shape, and the row in channel and matrix here can be of equal value.Data on one channel indicate
It is exactly the data of a line in matrix at matrix form, a line of matrix Z is the data in one of channel, such as the 1st row
[z11,z12…z1n] be channel 1 data.Thickness image can be combined into the thickness information of a complete scraps of paper.
According to the voltage data and voltage thickness conversion formula, the thickness number of the flaky medium to be detected is obtained
According to；Wherein, the thickness data include the flaky medium to be detected every bit in the plane thickness；
In the present embodiment, the voltage data is converted to by thickness data according to the voltage thickness conversion formula, institute
State voltage thickness conversion formula are as follows:
X=A (Z-Z0)
Wherein, X is thickness data, and Z is voltage data, and A is a diagonal matrix, Z0Collected number when for a thickness of zero
According to.
In the present embodiment, the diagonal matrix A specifically:
A=diag (a1,a2...am)
Wherein, a1、a2…amFor the element of diagonal matrix A.
In the present embodiment, the element of the diagonal matrix A obtains by the following method:
The data with a thickness of zero are acquired, are obtained:
Wherein, Z0Collected data when for a thickness of zero；
The data with a thickness of 100 microns are acquired, are obtained:
Wherein, Z100Collected data when for a thickness of 100 microns；
To Z0And Z100The element of every a line average, obtain:
Wherein, Z0 avgCollected average value when for a thickness of zero；Z100 avgIt is collected flat when for a thickness of 100 microns
Mean value；
The element of matrix A is obtained by following equation:
Wherein, aiFor the element of matrix A.
The thickness average value of the flaky medium to be detected is calculated according to the thickness data；
Using the flaky medium to be detected in the plane thickness be greater than preset normal thickness threshold value point as
Abnormal point, and calculate according to continuous multiple abnormal points the abnormal area area of the flaky medium to be detected；
In the present embodiment, the voltage value for being greater than preset normal thickness threshold value to every row in the thickness data asks flat
Mean value obtains the thickness series of mean of every row:
Wherein, XavgFor the thickness series of mean of every row；
According to row sequence ascending order arrange, and by the element in the thickness series of mean one by one with normal thickness threshold value comparison,
It is greater than the thickness mean value of normal thickness threshold value as thin slice initial row for first；
According to row sequence descending arrange, and by the element in the thickness series of mean one by one with normal thickness threshold value comparison,
It is greater than the thickness mean value of normal thickness threshold value as thin slice termination row for first；
Set function:
Wherein, XijThe element being expressed as in the matrix of the thickness data X, i indicate line number, and j indicates that columns, thresh are
The normal thickness threshold value；
Calculating of progressively increasing is carried out to i according to the function, the j value of first condition for meeting the function is the i-th tunnel
Initial position；And calculating of successively decreasing is carried out to i, the j value of first condition for meeting the function is the final position on the i-th tunnel；
Wherein, i is more than or equal to 2；
Initial position and the termination of initial row are obtained according to the final position of the initial position on i-th tunnel, i-th tunnel
The initial position and final position of position and termination row；
According to the initial position of initial row and final position, the initial position of termination row and final position calculate it is described to
The abnormal area area of the flaky medium of detection.
Fig. 3 is referred to, in the present embodiment, calculates the average value in each channel by the following method, each channel has
Imitate information initial position and end position；
Thick calculated thickness mean value Xavg, it is averaged for the element by the every a line of X greater than threshold value thresh as the row
Thickness mean value；
According to xavg1、xavg2…xavgmSequentially, first is greater than compared with threshold value thresh one by one the thickness of threshold value thresh
Mean value is spent as thin slice initial row rbegin；According to xavgm…xavg2、xavg1Sequentially, one by one compared with threshold value thresh by first
Thickness mean value greater than threshold value thresh is as thin slice termination row rend。
To rbeginWith rendBetween the data of every a line progressively increase by i (i >=2), determine per start position information all the way, the
One j value for meeting condition is the initial position c on the i-th tunnelbegin；
To rbeginWith rendBetween the data of every a line successively decrease by i (i >=2), determine per final position information all the way, the
One j value for meeting condition is the initial position c on the i-th tunnelend；
The error in the abnormal area area between the thickness and the thickness average value of abnormal point is calculated, and according to institute
State abnormal area area, the error calculation foreign matter index:
Wherein, Tape is foreign matter index, and K is calibration factor, and S is abnormal area area, and H is error；
When the foreign matter index is greater than preset outlier threshold, determine that there are foreign matters for the flaky medium.
As a preferred embodiment, the present invention also provides a kind of stickup detection device for foreign matter of flaky medium, comprising:
Voltage data acquisition module, for obtaining the voltage data of flaky medium to be detected using Hall element；Its
In, the voltage data includes the corresponding voltage value of the flaky medium institute to be detected dot thickness each in the plane；
Data conversion module, for obtaining described to be detected according to the voltage data and voltage thickness conversion formula
The thickness data of flaky medium；Wherein, the thickness data includes that the flaky medium institute to be detected is every in the plane
The thickness of a bit；
First computing module, the thickness for calculating the flaky medium to be detected according to the thickness data are average
Value；
Second computing module, for thickness to be normal greater than preset in the plane by the flaky medium institute to be detected
The point of thickness threshold value calculates the flaky medium to be detected as abnormal point, and according to continuous multiple abnormal points
Abnormal area area；
Third computing module, for calculate in the abnormal area area thickness of abnormal point and the thickness average value it
Between error, and according to the abnormal area area, the error calculation foreign matter index:
Wherein, Tape is foreign matter index, and K is calibration factor, and S is abnormal area area, and H is error；
Foreign matter determination module, for determining that the sheet is situated between when the foreign matter index is greater than preset outlier threshold
There are foreign matters for matter.
As a preferred embodiment, described device further include:
Matrix data acquisition module, for obtaining the voltage data of flaky medium to be detected using Hall element:
Wherein, Z indicates voltage data, zmnIt is corresponding for the flaky medium institute dot thickness each in the plane to be detected
Voltage value, m indicate line number, n indicate columns.
As a preferred embodiment, described device further include:
Matrix data conversion module, for the voltage data to be converted to thickness according to the voltage thickness conversion formula
Data, the voltage thickness conversion formula are as follows:
X=A (Z-Z0)
Wherein, X is thickness data, and Z is voltage data, and A is a diagonal matrix, Z0Collected number when for a thickness of zero
According to.
As a preferred embodiment, described device further include:
Anomaly area computing module, for being greater than the electricity of preset normal thickness threshold value to every row in the thickness data
Pressure value is averaged, and obtains the thickness series of mean of every row:
Wherein, XavgFor the thickness series of mean of every row；
According to row sequence ascending order arrange, and by the element in the thickness series of mean one by one with normal thickness threshold value comparison,
It is greater than the thickness mean value of normal thickness threshold value as thin slice initial row for first；
According to row sequence descending arrange, and by the element in the thickness series of mean one by one with normal thickness threshold value comparison,
It is greater than the thickness mean value of normal thickness threshold value as thin slice termination row for first；
Set function:
Wherein, XijThe element being expressed as in the matrix of the thickness data X, i indicate line number, and j indicates that columns, thresh are
The normal thickness threshold value；
Calculating of progressively increasing is carried out to i according to the function, the j value of first condition for meeting the function is the i-th tunnel
Initial position；And calculating of successively decreasing is carried out to i, the j value of first condition for meeting the function is the final position on the i-th tunnel；
Wherein, i is more than or equal to 2；
Initial position and the termination of initial row are obtained according to the final position of the initial position on i-th tunnel, i-th tunnel
The initial position and final position of position and termination row；
According to the initial position of initial row and final position, the initial position of termination row and final position calculate it is described to
The abnormal area area of the flaky medium of detection.
The embodiment of the present invention has the advantages that
Using the thickness information of Hall element acquisition flaky medium, it is calculated by the conversion of collected thickness information
Thickness data, and thickness data is calculated, to detect the thickness of thin slice, not only measuring and calculating process is more rigorous in this way,
And calculated result is more accurate.
Wherein, judge whether thickness is abnormal, can efficiently reduce human error according to the abnormal index being calculated, from
And accurately verify whether be stained with foreign matter, and then improve measurement accuracy.
Further, since preset normal thickness threshold value can carry out adaptability adjusting according to the actual situation, can be improved different
The flexibility of analyte detection；Simultaneously according to the anomaly area being calculated, can not only judge whether to be stained with foreign matter, and can determine that different
The size of object.
The above is a preferred embodiment of the present invention, it is noted that for those skilled in the art
For, various improvements and modifications may be made without departing from the principle of the present invention, these improvements and modifications are also considered as
Protection scope of the present invention.
Claims (9)
1. a kind of stickup foreign matter detecting method of flaky medium, which is characterized in that step includes:
The voltage data of flaky medium to be detected is obtained using Hall element；Wherein, the voltage data include it is described to
The corresponding voltage value of flaky medium institute dot thickness each in the plane of detection；
According to the voltage data and voltage thickness conversion formula, the thickness data of the flaky medium to be detected is obtained；
Wherein, the thickness data include the flaky medium to be detected every bit in the plane thickness；
The thickness average value of the flaky medium to be detected is calculated according to the thickness data；
Using the flaky medium to be detected in the plane thickness be greater than preset normal thickness threshold value point as extremely
Point, and calculate according to continuous multiple abnormal points the abnormal area area of the flaky medium to be detected；
The error in the abnormal area area between the thickness and the thickness average value of abnormal point is calculated, and according to described different
Normal region area, the error calculation foreign matter index:
Wherein, Tape is foreign matter index, and K is calibration factor, and S is abnormal area area, and H is error；
When the foreign matter index is greater than preset outlier threshold, determine that there are foreign matters for the flaky medium.
2. the stickup foreign matter detecting method of flaky medium as described in claim 1, which is characterized in that described to utilize Hall member
Part obtains the voltage data of flaky medium to be detected, specifically:
The voltage data of flaky medium to be detected is obtained using Hall element:
Wherein, Z indicates voltage data, zmnIndicate that the flaky medium institute to be detected dot thickness each in the plane is corresponding
Voltage value, m indicate line number, and n indicates columns.
3. the stickup foreign matter detecting method of flaky medium as claimed in claim 2, which is characterized in that described according to the electricity
Data and voltage thickness conversion formula are pressed, the thickness data of the flaky medium to be detected is obtained, specifically:
The voltage data is converted into thickness data, the voltage thickness conversion formula according to the voltage thickness conversion formula
Are as follows:
X=A (Z-Z0)
Wherein, X is thickness data, and Z is voltage data, and A is a diagonal matrix, Z0Collected data when for a thickness of zero.
4. the stickup foreign matter detecting method of flaky medium as claimed in claim 3, which is characterized in that it is described will be described to be detected
Flaky medium in the plane thickness be greater than preset normal thickness threshold value point as abnormal point, and according to continuously it is more
A abnormal point calculates the abnormal area area of the flaky medium to be detected, specifically:
The voltage value for being greater than preset normal thickness threshold value to every row in the thickness data is averaged, and obtains the thickness of every row
Spend series of mean:
Wherein, XavgFor the thickness series of mean of every row；
Arranged according to row sequence ascending order, and by the element in the thickness series of mean one by one with normal thickness threshold value comparison, by the
One is greater than the thickness mean value of normal thickness threshold value as thin slice initial row；
Arranged according to row sequence descending, and by the element in the thickness series of mean one by one with normal thickness threshold value comparison, by the
One is greater than the thickness mean value of normal thickness threshold value as thin slice termination row；
Set function:
Wherein, XijThe element being expressed as in the matrix of the thickness data X, i indicate line number, and j indicates columns, and thresh is described
Normal thickness threshold value；
Calculating of progressively increasing is carried out to i according to the function, the j value of first condition for meeting the function is the starting on the i-th tunnel
Position；And calculating of successively decreasing is carried out to i, the j value of first condition for meeting the function is the final position on the i-th tunnel；Wherein,
I is more than or equal to 2；
Initial position and the stop bit of initial row are obtained according to the final position of the initial position on i-th tunnel, i-th tunnel
It sets and the initial position of termination row and final position；
It is calculated according to the initial position of initial row and final position, the initial position of termination row and final position described to be detected
Flaky medium abnormal area area.
5. the stickup foreign matter detecting method of flaky medium as claimed in claim 3, which is characterized in that the diagonal matrix A
Specifically:
A=diag (a1,a2…am)
Wherein, a1、a2…amFor the element of diagonal matrix A.
6. the stickup foreign matter detecting method of flaky medium as claimed in claim 5, which is characterized in that the diagonal matrix A
Element obtain by the following method:
The data with a thickness of zero are acquired, are obtained:
Wherein, Z0Collected data when for a thickness of zero；
The data with a thickness of 100 microns are acquired, are obtained:
Wherein, Z100Collected data when for a thickness of 100 microns；
To Z0And Z100The element of every a line average, obtain:
Wherein, Z0 avgCollected average value, Z when for a thickness of zero100 avgCollected average value when for a thickness of 100 microns；
The element of matrix A is obtained by following equation:
Wherein, aiFor the element of matrix A.
7. a kind of stickup detection device for foreign matter of flaky medium characterized by comprising
Voltage data acquisition module, for obtaining the voltage data of flaky medium to be detected using Hall element；Wherein, institute
Stating voltage data includes the corresponding voltage value of the flaky medium institute to be detected dot thickness each in the plane；
Data conversion module, for obtaining the thin slice to be detected according to the voltage data and voltage thickness conversion formula
The thickness data of class medium；Wherein, the thickness data includes the flaky medium institute to be detected every bit in the plane
Thickness；
First computing module, for calculating the thickness average value of the flaky medium to be detected according to the thickness data；
Second computing module, for thickness to be greater than preset normal thickness in the plane by the flaky medium institute to be detected
The point of threshold value calculates according to continuous multiple abnormal points the exception of the flaky medium to be detected as abnormal point
Region area；
Third computing module, for calculating in the abnormal area area between the thickness and the thickness average value of abnormal point
Error, and according to the abnormal area area, the error calculation foreign matter index:
Wherein, Tape is foreign matter index, and K is calibration factor, and S is abnormal area area, and H is error；
Foreign matter determination module, for determining that the flaky medium is deposited when the foreign matter index is greater than preset outlier threshold
In foreign matter.
8. the stickup detection device for foreign matter of flaky medium as claimed in claim 4, which is characterized in that further include:
Matrix data acquisition module, for obtaining the voltage data of flaky medium to be detected using Hall element:
Wherein, Z indicates voltage data, zmnIndicate that the flaky medium institute to be detected dot thickness each in the plane is corresponding
Voltage value, m indicate line number, and n indicates columns.
9. the stickup detection device for foreign matter of flaky medium as claimed in claim 4, which is characterized in that further include:
Matrix data conversion module, for the voltage data to be converted to thickness number according to the voltage thickness conversion formula
According to the voltage thickness conversion formula are as follows:
X=A (Z-Z0)
Wherein, X is thickness data, and Z is voltage data, and A is a diagonal matrix, Z0Collected data when for a thickness of zero.
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| CN201811617212.9A CN109737859B (en) | 2018-12-26 | 2018-12-26 | Method and device for detecting sticking foreign matter on sheet medium |
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| CN201811617212.9A CN109737859B (en) | 2018-12-26 | 2018-12-26 | Method and device for detecting sticking foreign matter on sheet medium |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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