CN109612590B - Ultrafast Optical Wavelength Measurement System - Google Patents
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Abstract
本发明公开了一种超快光波长测量系统，该系统包括一窄线宽激光器、第一至第五光耦合器、一锁模激光器、第一至第五光电探测器、一第一模数转换模块、一第二模数转换模块、一数字信号处理模块和一色散补偿光纤。本发明通过处理锁模激光器的输出宽谱光信号与参考光信号及待测光信号的拍频信号来得到测量光信号的波长，测量范围等于锁模激光器的谱宽，为10‑100nm量级。测量速率等于锁模激光器的脉冲重复频率，可达到50MHz。在数字信号处理模块中引入互相关算法来提高测量精度，测量精度反比于光电探测器的带宽乘以色散补偿光纤的色散系数，为10pm量级。因此，利用本发明可以实现大带宽，高速率，高精度的光波长测量。
The invention discloses an ultrafast optical wavelength measurement system, which comprises a narrow linewidth laser, first to fifth optical couplers, a mode-locking laser, first to fifth photodetectors, and a first modulus A conversion module, a second analog-to-digital conversion module, a digital signal processing module and a dispersion compensation fiber. The invention obtains the wavelength of the measured optical signal by processing the output wide-spectrum optical signal of the mode-locked laser, the reference optical signal and the beat frequency signal of the optical signal to be measured, and the measurement range is equal to the spectral width of the mode-locked laser, which is in the order of 10-100 nm . The measurement rate is equal to the pulse repetition frequency of the mode-locked laser, which can reach 50MHz. The cross-correlation algorithm is introduced in the digital signal processing module to improve the measurement accuracy. The measurement accuracy is inversely proportional to the bandwidth of the photodetector multiplied by the dispersion coefficient of the dispersion compensation fiber, which is in the order of 10pm. Therefore, by using the present invention, large bandwidth, high speed and high precision optical wavelength measurement can be realized.
Description
Technical Field
The invention belongs to the technical field of microwave photonics and coherent light signal processing, and particularly relates to an ultrafast optical wavelength measuring system.
Background
With the development of the photoelectric technology, it is necessary to measure the optical wavelength very fast, and especially when a microwave photonics black box subsystem is analyzed, the optical wavelength is often measured by a spectrometer, but the measurement frequency of the spectrometer is very low, and is 1Hz, so that it is difficult to realize the real-time optical wavelength analysis of the optical signal. Many times, the measurement optical signal is processed by coupling it to the same photodetector as a reference signal of known optical wavelength, and the output electrical signal is then digitally processed to analyze the wavelength of the measurement optical signal. Although this method can guarantee real-time measurement, the bandwidth is limited by the bandwidth of the photodetector.
Therefore, the invention provides an ultrafast optical wavelength measurement system based on microwave photonics, wherein the optical part of the system provides a large measurement bandwidth for the system, and the electrical part provides high measurement accuracy for the system.
Disclosure of Invention
Accordingly, the present invention is directed to an ultrafast optical wavelength measurement system, which combines a large measurement bandwidth with a high measurement rate for optical wavelength measurement. In the field of optical wavelength measurement, the measurement bandwidth and the measurement speed are often a pair of contradictory physical quantities. The invention is based on microwave photonics, and realizes ultrafast wavelength measurement of optical signals.
To achieve the above object, the present invention provides an ultrafast optical wavelength measurement system, which includes a narrow linewidth laser 1, first to fifth optical couplers 13-17, a mode-locked laser 2, first to fifth photodetectors 3-7, a first analog-to-digital conversion module 8, a second analog-to-digital conversion module 9, a digital signal processing module 10, and a dispersion compensation fiber 11, wherein: the output optical signal of the mode-locked laser 2 is divided into three paths by the third optical coupler 15 after passing through the dispersion compensation fiber 11, and the reference optical signal and the optical signal to be measured 12 output by the narrow linewidth laser 1 are divided into two paths by the first optical coupler 13 and the fifth optical coupler 17 respectively; one path of the mode-locked laser 2, the narrow linewidth laser 1 and the measuring optical signal 12 is detected by a third photoelectric detector 5, a first photoelectric detector 3 and a fifth photoelectric detector 7 respectively to output incoherent signals; the remaining two paths of optical signals of the mode-locked laser 2 are respectively coupled with the reference optical signal and the measurement optical signal to the second photoelectric detector 4 and the fourth photoelectric detector 6; the output signal of the third photodetector 5 is divided into two paths by the electric coupler 18, one path is coupled with the output signals of the first photodetector 3 and the second photodetector 4 to the first analog-to-digital conversion module 8 to output a digital signal, and the other path is coupled with the output signals of the fourth photodetector 6 and the fifth photodetector 7 to the second analog-to-digital conversion module 9 to output a digital signal; the output digital signals of the first analog-to-digital conversion module 8 and the second analog-to-digital conversion module 9 are coupled to the digital signal processing module 10 to output the final measurement result.
The ultrafast optical wavelength measuring system provided by the invention obtains the wavelength of the measuring optical signal by processing the output wide-spectrum optical signal of the mode-locked laser, the reference optical signal and the beat frequency signal of the optical signal to be measured, so that the measuring range is equal to the spectrum width of the mode-locked laser and is 10-100nm magnitude. The measurement rate is equal to the pulse repetition frequency of the mode-locked laser, and can reach 50 MHz. The system introduces a cross-correlation algorithm in a digital signal processing module to improve the measurement accuracy, wherein the measurement accuracy is inversely proportional to the bandwidth of a photoelectric detector multiplied by the dispersion coefficient of a dispersion compensation optical fiber and is in the magnitude of 10 pm. Therefore, the ultrafast optical wavelength measuring system provided by the invention can realize the optical wavelength measurement with large bandwidth, high speed and high precision.
Drawings
For a better understanding of the objects and technical solutions of the present invention, reference will now be made to the following further description taken in conjunction with the accompanying drawings, in which:
FIG. 1 is a schematic diagram of an ultrafast optical wavelength measurement system according to an embodiment of the present invention.
Fig. 2 is a measurement result of 10 single-wavelength optical signals to be measured using a spectrometer as a comparative example.
Fig. 3 shows the measurement results of the 10 single-wavelength optical signals to be measured shown in fig. 2 according to an embodiment of the present invention.
FIG. 4 is a time-frequency diagram of a microwave signal, with MZI modulation of a single wavelength optical signal, with first-order sidebands preserved by the filter.
Fig. 5 is a measurement result of an optical signal modulated by the microwave signal shown in fig. 4 according to an embodiment of the present invention.
FIG. 6 is a measurement of the output optical signal of a fast swept laser with a sweep rate of 0.0866nm/s, in accordance with embodiments of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to specific embodiments and the accompanying drawings.
Referring to fig. 1, fig. 1 is a schematic structural diagram of an ultrafast optical wavelength measurement system according to an embodiment of the present invention, the system includes a narrow-linewidth laser 1, first to fifth optical couplers 13-17, a mode-locked laser 2, first to fifth photodetectors 3-7, a first analog-to-digital conversion module 8, a second analog-to-digital conversion module 9, a digital signal processing module 10, and a dispersion compensation fiber 11, wherein an output optical signal of the mode-locked laser 2 is divided into three paths by the third optical coupler 15 after passing through the dispersion compensation fiber 11, and a reference optical signal and an optical signal 12 to be measured output by the narrow-linewidth laser 1 are divided into two paths by the first optical coupler 13 and the fifth optical coupler 17, respectively. One of the paths of the mode-locked laser 2, the narrow linewidth laser 1 and the measuring optical signal 12 is detected by a third photoelectric detector 5, a first photoelectric detector 3 and a fifth photoelectric detector 7 respectively to output incoherent signals. The remaining two optical signals of the mode-locked laser 2 are coupled to the second photodetector 4 and the fourth photodetector 6 respectively with the reference optical signal and the measurement optical signal. The output signal of the third photodetector 5 is divided into two paths by the electric coupler 18, one path is coupled with the output signals of the first photodetector 3 and the second photodetector 4 to the first analog-to-digital conversion module 8 to output a digital signal; the other path of the output signals of the fourth photoelectric detector 6 and the fifth photoelectric detector 7 are coupled to a second analog-to-digital conversion module 9 to output digital signals. The output digital signals of the first analog-to-digital conversion module 8 and the second analog-to-digital conversion module 9 are coupled to the digital signal processing module 10 to output the final measurement result.
Referring to fig. 1 again, the narrow-linewidth laser 1 outputs a narrow-linewidth single-wavelength laser as a reference light, the narrow-linewidth single-wavelength laser enters the first optical coupler 13 from an input end of the first optical coupler 13, the narrow-linewidth single-wavelength laser is divided into two paths in the first optical coupler 13, wherein the first path of narrow-linewidth single-wavelength laser enters the first photodetector 3 and is converted into a photocurrent, and the photocurrent is output to the first analog-to-digital converter 8, and the second path of narrow-linewidth single-wavelength laser enters the second optical coupler 14.
The mode-locked laser 2 outputs periodic pulse laser, the periodic pulse laser enters the dispersion compensation fiber 11 from the input end of the dispersion compensation fiber 11, is subjected to dispersion stretching in the dispersion compensation fiber 11 to realize wavelength-time mapping, and then enters the third optical coupler 15 from the input end of the third optical coupler 15; in the third optical coupler 15, the dispersion-stretched periodic pulse laser light is divided into three paths, in which:
the first path of pulse laser enters the second optical coupler 14 from the first output port 151 of the third optical coupler 15, the first path of pulse laser and the second path of narrow linewidth single-wavelength laser output by the first optical coupler 13 are coupled and superposed in the second optical coupler 14 to form reference coherent superposed light, and the reference coherent superposed light enters the second photoelectric detector 4, is converted into photocurrent by the second photoelectric detector 4, and is output to the first analog-to-digital conversion module 8.
The second path of pulsed laser enters the third photodetector 5 from the second output port 152 of the third optical coupler 15, and is converted into photocurrent by the third photodetector 5 and output to the electrical coupler 18.
The third path of pulsed laser light enters the fourth optical coupler 16 from the third output port 153 of the third optical coupler 15.
The input end of the fifth optical coupler 17 is a test end, the laser 12 to be tested is coupled into the fifth optical coupler 17 from the input end of the fifth optical coupler 17, and is divided into two paths by the fifth optical coupler 17, wherein the first path of laser to be tested enters the fourth optical coupler 16, and the second path of laser to be tested enters the fifth photoelectric detector 7.
In the fourth optical coupler 16, the third path of pulse laser and the first path of laser to be measured are coupled and superposed to form measurement coherent superposition light, and the measurement coherent superposition light enters the fourth photoelectric detector 6, is converted into photocurrent by the fourth photoelectric detector 6, and is output to the second analog-to-digital conversion module 9.
After entering the fifth photodetector 7, the second path of laser light to be detected is converted into photocurrent by the fifth photodetector 7 and output to the second analog-to-digital conversion module 9.
In the electric coupler 18, the photocurrent output by the third photodetector 5 is divided into two paths, wherein the first path of photocurrent enters the first analog-to-digital conversion module 8 through the third input port 83 of the first analog-to-digital conversion module 8, and the second path of photocurrent enters the second analog-to-digital conversion module 9 through the first input port 91 of the second analog-to-digital conversion module 9.
The first photoelectric detector 3 converts a photoelectric current converted by a first narrow-line-width single-wavelength laser into a first analog-to-digital conversion module 8 through a first input port 81 of the first analog-to-digital conversion module 8, the second photoelectric detector 4 converts a photoelectric current converted by a reference coherent superposition light into a first analog-to-digital conversion module 8 through a second input port 82 of the first analog-to-digital conversion module 8, the electric coupler 18 converts the first photoelectric current into the first analog-to-digital conversion module 8 through a third input port 83 of the first analog-to-digital conversion module 8, and in the first analog-to-digital conversion module 8, three photoelectric currents are sampled and stored as digital signals and output to the digital signal processing module 10.
The electric coupler 18 makes the second path of photoelectric current enter the second analog-to-digital conversion module 9 through the first input port 91 of the second analog-to-digital conversion module 9, the fourth photoelectric detector 6 makes the photoelectric current converted by the measurement coherent superposition light enter the second analog-to-digital conversion module 9 through the second input port 92 of the second analog-to-digital conversion module 9, the fifth photoelectric detector 7 makes the photoelectric current converted by the second path of laser light to be detected enter the second analog-to-digital conversion module 9 through the third input port 93 of the second analog-to-digital conversion module 9, and in the second analog-to-digital conversion module 9, the three paths of photoelectric current are sampled and stored as digital signals and output to the digital signal processing module 10.
In the digital signal processing module 10, the digital signal input from the first analog-to-digital conversion module 8 is subjected to digital signal processing to obtain the coherent information of the reference coherent superimposed light in the second optical coupler 14; the digital signal input from the second analog-to-digital conversion module 9 is subjected to digital signal processing to obtain the coherent information of the coherent superimposed light measured in the fourth optical coupler 16; subsequently, the digital signal processing module 10 further performs digital signal processing on the coherent information of the reference coherent superimposed light and the coherent information of the measurement coherent superimposed light to obtain a final measurement result, so as to further improve the accuracy of the measurement system.
In the embodiment of the present invention, the ultrafast wavelength measurement system needs to be implemented to satisfy the following three conditions: 1) the sampling rate of the analog-to-digital conversion module to the electric signal output by the photoelectric detector should meet the sampling theorem, namely more than twice of the bandwidth of the photoelectric detector; 2) the relative time delay between the reference optical path and the measurement optical path should be as small as possible; 3) the wavelength of the output optical signal of the narrow-linewidth single-wavelength laser 1 is within the output spectral range of the mode-locked laser 2.
When the reference signal is a stable wavelength optical signal, the extracted coherent optical signal is a periodic chirp signal, the bandwidth is the bandwidth of the photodetector, the chirp frequency is the derivative of the dispersion coefficient of the dispersion compensation fiber, and the period is the period of the mode-locked laser. The measuring signal is also a frequency-modulated signal with a bandwidth of the photodetector, and the time position of its coherent signal in each mode-locked laser period varies with the wavelength of the measuring optical signal. And the reference coherent signal and the measurement coherent signal of each mode-locked laser period are compressed into a pulse signal after cross-correlation processing, and the wavelength of the measurement optical signal corresponding to the period moment of the mode-locked laser can be obtained by wavelength-time mapping of the pulse signal at the time position of each mode-locked laser period.
Fig. 2 is a measurement result of 10 single-wavelength optical signals to be measured using a spectrometer as a comparative example. In this comparative example, the spectrometer used was a commercial spectrometer (ADVANTEST Q8384), and the results were compared with those of the inventive example. The light wavelength measurement results of the 10 single-wavelength light signals are 1540.05nm, 1540.995nm, 1542nm, 1542.99nm, 1543.995nm, 1545nm, 1549.99nm, 1546.995nm, 1548nm and 1549.005nm respectively.
Fig. 3 is a measurement result of the 10 single-wavelength optical signals to be measured shown in fig. 2 according to the embodiment of the present invention, and the measurement results of the 10 single-wavelength optical signals to be measured shown in fig. 2 are 1540.007nm, 1540.999nm, 1541.991nm, 1542.985nm, 1543.975nm, 1545nm, 1545.99nm, 1546.994nm, and 1548.016nm, respectively, by using the ultrafast optical wavelength measurement system provided in the embodiment of the present invention.
As can be seen from a comparison between fig. 2 and fig. 3, the average error between the measurement result obtained by using the ultrafast optical wavelength measurement system according to the embodiment of the present invention and the measurement result obtained by using the spectrometer according to the comparative example is 0.013nm, and thus it can be seen that the ultrafast optical wavelength measurement system according to the embodiment of the present invention has a high accuracy in measuring the ultrafast optical wavelength.
FIG. 4 is a time-frequency diagram of a microwave signal. The microwave signal is used as a driving signal of the MZI modulator, and the aim is to generate a single-wavelength laser signal with the wavelength rapidly changing along with time by means of the MZI modulation. The specific method is to perform MZI modulation on a single-wavelength optical signal with a wavelength of 1550nm, and keep a positive first-order sideband through an optical filter, wherein the MZI modulation signal is a microwave signal with a time-frequency relationship shown in FIG. 4. Thus, a continuous laser signal with a theoretical wavelength ranging from 1550.047nm to 1550.091nm and a period of 8 microseconds is generated.
Fig. 5 is a wavelength measurement of an optical signal according to the present invention that remains positive first-order sideband modulated by the microwave signal MZI shown in fig. 4. The measurement result shows that the measurement light changes from 1550.056 nm to 1550.096nm, the change period is 8.06 microns, and the change period accords with a theoretical wavelength value, and the result verifies that the ultrafast optical wavelength measurement system provided by the invention has high-speed characteristics when measuring ultrafast optical wavelength.
FIG. 6 is a measurement of the output optical signal of a fast swept laser with a sweep rate of 0.0866nm/s, in accordance with embodiments of the present invention. Where circles are experimental data and dotted lines are fitted curves. The experimental result shows that the measuring light changes from 1540.87nm to 1548.62nm within 89.5ns time range, the change rate is 0.092nm/ns, and the change rate is consistent with the parameters of the rapid frequency sweeping laser source. The experimental result verifies the high-speed characteristic (about 20ns is measured once) and the large-bandwidth (about 10nm) characteristic of the ultrafast optical wavelength measuring system provided by the invention when the ultrafast optical wavelength is measured.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are only exemplary embodiments of the present invention, and are not intended to limit the present invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. An ultrafast optical wavelength measuring system, comprising a narrow linewidth laser (1), first to fifth optical couplers (13-17), a mode-locked laser (2), first to fifth photodetectors (3-7), a first analog-to-digital conversion module (8), a second analog-to-digital conversion module (9), a digital signal processing module (10), and a dispersion compensating fiber (11), wherein:
an output optical signal of the mode-locked laser (2) passes through a dispersion compensation optical fiber (11) and then is divided into three paths by a third optical coupler (15), and a reference optical signal and an optical signal to be measured (12) output by the narrow-linewidth laser (1) are divided into two paths by a first optical coupler (13) and a fifth optical coupler (17) respectively;
one path of the mode-locked laser (2), the narrow linewidth laser (1) and the optical signal (12) to be measured is detected by a third photoelectric detector (5), a first photoelectric detector (3) and a fifth photoelectric detector (7) respectively to output incoherent signals;
the remaining two paths of optical signals of the mode-locked laser (2) are respectively coupled with the reference optical signal and the measurement optical signal to a second photoelectric detector (4) and a fourth photoelectric detector (6);
the output signal of the third photoelectric detector (5) is divided into two paths by an electric coupler (18), one path is coupled with the output signals of the first photoelectric detector (3) and the second photoelectric detector (4) to the first analog-to-digital conversion module (8) to output a digital signal, and the other path is coupled with the output signals of the fourth photoelectric detector (6) and the fifth photoelectric detector (7) to the second analog-to-digital conversion module (9) to output a digital signal;
the output digital signals of the first analog-to-digital conversion module (8) and the second analog-to-digital conversion module (9) are coupled to the digital signal processing module (10) to output final measurement results;
the sampling rate of the first analog-to-digital conversion module (8) and the second analog-to-digital conversion module (9) to the electric signals output by the first to fifth photoelectric detectors (3-7) meets the sampling theorem, namely the sampling rate is more than twice of the bandwidth of the photoelectric detectors; the relative time delay between the reference optical path and the measurement optical path should be as small as possible; the wavelength of an output optical signal of the narrow linewidth laser (1) is positioned in the output spectral range of the mode-locked laser (2).
2. The ultrafast optical wavelength measurement system according to claim 1, wherein the narrow-linewidth laser (1) outputs a narrow-linewidth single-wavelength laser as a reference light, the narrow-linewidth single-wavelength laser enters the first optical coupler (13) from an input end of the first optical coupler (13), the narrow-linewidth single-wavelength laser is divided into two paths in the first optical coupler (13), the first path of narrow-linewidth single-wavelength laser enters the first photodetector (3) to be converted into a photocurrent and output to the first analog-to-digital conversion module (8), and the second path of narrow-linewidth single-wavelength laser enters the second optical coupler (14).
3. The ultrafast optical wavelength measurement system according to claim 1, wherein the mode-locked laser (2) outputs a periodic pulsed laser, which enters the dispersion compensation fiber (11) from an input end of the dispersion compensation fiber (11), is dispersion-stretched in the dispersion compensation fiber (11), implements wavelength-time mapping, and then enters the third optical coupler (15) from an input end of the third optical coupler (15); in a third optical coupler (15), the dispersion-stretched periodic pulsed laser light is divided into three paths, wherein:
a first path of pulse laser enters a second optical coupler (14) from a first output port (151) of a third optical coupler (15), the first path of pulse laser and a second path of narrow-linewidth single-wavelength laser output by the first optical coupler (13) are coupled and superposed in the second optical coupler (14) to form reference coherent superposed light, the reference coherent superposed light enters a second photoelectric detector (4), and is converted into photocurrent by the second photoelectric detector (4) and output to a first analog-to-digital conversion module (8);
the second path of pulse laser enters a third photoelectric detector (5) from a second output port (152) of the third optical coupler (15), is converted into photocurrent by the third photoelectric detector (5) and is output to the electric coupler (18);
and the third path of pulse laser enters the fourth optical coupler (16) from the third output port (153) of the third optical coupler (15).
4. The ultrafast optical wavelength measurement system according to claim 3, wherein in the electrical coupler (18), the photocurrent output from the third photodetector (5) is split into two paths, wherein a first path of photocurrent enters the first analog-to-digital conversion module (8) through the third input port (83) of the first analog-to-digital conversion module (8), and a second path of photocurrent enters the second analog-to-digital conversion module (9) through the first input port (91) of the second analog-to-digital conversion module (9).
5. The ultrafast optical wavelength measurement system according to claim 3, wherein the input end of the fifth optical coupler (17) is a test end, the optical signal (12) to be measured is coupled into the fifth optical coupler (17) from the input end of the fifth optical coupler (17), and is divided into two paths by the fifth optical coupler (17), wherein the first path of laser light to be measured enters the fourth optical coupler (16), and the second path of laser light to be measured enters the fifth photodetector (7).
6. The ultrafast optical wavelength measuring system according to claim 5, wherein the second path of laser light to be measured enters the fifth photodetector (7), and is converted into photocurrent by the fifth photodetector (7) and output to the second analog-to-digital conversion module (9).
7. The ultrafast optical wavelength measurement system according to claim 5, wherein in the fourth optical coupler (16), the third path of pulse laser is coupled and superimposed with the first path of laser to be measured to form a measurement coherent superimposed light, and the measurement coherent superimposed light enters the fourth photodetector (6), is converted into a photocurrent by the fourth photodetector (6), and is output to the second analog-to-digital conversion module (9).
8. The ultrafast optical wavelength measurement system according to claim 7, wherein the first photo-detector (3) converts the photo-current converted from the first narrow linewidth single wavelength laser into a first analog-to-digital conversion module (8) through a first input port (81) of the first analog-to-digital conversion module (8), the second photo-detector (4) converts the photo-current converted from the reference coherent superposition light into a first analog-to-digital conversion module (8) through a second input port (82) of the first analog-to-digital conversion module (8), the electric coupler (18) converts the first photo-current into the first analog-to-digital conversion module (8) through a third input port (83) of the first analog-to-digital conversion module (8), in the first analog-to-digital conversion module (8), the three paths of photocurrents are sampled and stored as digital signals and output to the digital signal processing module (10).
9. The ultrafast optical wavelength measurement system according to claim 7, wherein the electric coupler (18) passes a second optical current through a first input port (91) of the second analog-to-digital conversion module (9) to enter the second analog-to-digital conversion module (9), the fourth photo detector (6) passes an optical current obtained by converting measurement coherent superposition light through a second input port (92) of the second analog-to-digital conversion module (9) to enter the second analog-to-digital conversion module (9), the fifth photo detector (7) passes an optical current obtained by converting a second laser to be measured through a third input port (93) of the second analog-to-digital conversion module (9) to enter the second analog-to-digital conversion module (9), and three optical currents are sampled and stored as digital signals in the second analog-to-digital conversion module (9) and output to the digital signal processing module (10).
10. The ultrafast optical wavelength measurement system according to claim 7, wherein in the digital signal processing module (10), the digital signal input from the first analog-to-digital conversion module (8) is subjected to digital signal processing to obtain the coherence information of the reference coherent superimposed light in the second optical coupler (14); digital signals input from the second analog-to-digital conversion module (9) are subjected to digital signal processing to obtain coherent information of the coherent superposition light measured in the fourth optical coupler (16); subsequently, the digital signal processing module (10) further performs digital signal processing on the coherent information of the reference coherent superposition light and the coherent information of the measurement coherent superposition light to obtain a final measurement result.
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101764646A (en) * | 2008-12-24 | 2010-06-30 | 中国科学院半导体研究所 | Wavelength-encoding optical time domain reflection test device and measurement method thereof |
| CN102243106A (en) * | 2011-04-06 | 2011-11-16 | 中国航空工业集团公司北京长城计量测试技术研究所 | Frequency-beating device for laser frequency measurement |
| CN102576971A (en) * | 2009-10-02 | 2012-07-11 | Imra美国公司 | Optical signal processing with modelocked lasers |
| CN104697634A (en) * | 2015-03-11 | 2015-06-10 | 华中科技大学 | Very high resolution spectral measurement device and method |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003090792A (en) * | 2001-09-20 | 2003-03-28 | Fuji Photo Film Co Ltd | Optical tomographic imaging apparatus |
| US6963442B2 (en) * | 2002-04-17 | 2005-11-08 | Hrl Laboratories, Llc | Low-noise, switchable RF-lightwave synthesizer |
| DE60220507T2 (en) * | 2002-12-05 | 2007-09-27 | Agilent Technologies Inc., Santa Clara | Control an optical source using a beat frequency |
| WO2005093385A1 (en) * | 2004-03-26 | 2005-10-06 | Advantest Corporation | Optical frequency measuring apparatus and optical frequency measuring method |
| TWI300471B (en) * | 2006-10-25 | 2008-09-01 | Ind Tech Res Inst | Method of optical frequency measurement |
| TWI336771B (en) * | 2007-10-16 | 2011-02-01 | Ind Tech Res Inst | Optical frequency measurement method and apparatus |
| CN101762330B (en) * | 2009-12-30 | 2011-06-22 | 中国科学院半导体研究所 | Device and method for precise measurement of optical wavelength of single-mode laser |
| CN102607720B (en) * | 2012-03-02 | 2014-07-16 | 北京航空航天大学 | Method and system for measuring optical distance |
| CN103794980B (en) * | 2014-01-27 | 2016-08-17 | 华东师范大学 | Method and the device thereof of light frequency is measured with high-power fiber optical frequency com |
| AU2017372901B2 (en) * | 2016-12-07 | 2021-11-18 | UNIVERSITé LAVAL | Methods for performing dual-comb interferometry |
| CN109506788A (en) * | 2018-11-01 | 2019-03-22 | 中国科学院半导体研究所 | Optical wavelength measurement system based on Fourier's mode-locked laser |
-
2018
- 2018-12-27 CN CN201811618907.9A patent/CN109612590B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101764646A (en) * | 2008-12-24 | 2010-06-30 | 中国科学院半导体研究所 | Wavelength-encoding optical time domain reflection test device and measurement method thereof |
| CN102576971A (en) * | 2009-10-02 | 2012-07-11 | Imra美国公司 | Optical signal processing with modelocked lasers |
| CN102243106A (en) * | 2011-04-06 | 2011-11-16 | 中国航空工业集团公司北京长城计量测试技术研究所 | Frequency-beating device for laser frequency measurement |
| CN104697634A (en) * | 2015-03-11 | 2015-06-10 | 华中科技大学 | Very high resolution spectral measurement device and method |
Non-Patent Citations (2)
| Title |
|---|
| Polarization division multiplexed photonic radio-frequency channelizer using an optical comb;Li Xian Wang等;《Optics Communications》;20121207;第286卷;第282-287页 * |
| Widely Tunable Single-Passband Microwave Photonic Filter Based on DFB-SOA-Assisted Optical Carrier Recovery;Ye Deng等;《IEEE Photonics Journal》;20150916;第7卷(第5（2015）期);第5501108页 * |
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