CN109541441A - A kind of micro-wave oven mainboard FCT Auto-Test System - Google Patents
A kind of micro-wave oven mainboard FCT Auto-Test System Download PDFInfo
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- CN109541441A CN109541441A CN201811647987.0A CN201811647987A CN109541441A CN 109541441 A CN109541441 A CN 109541441A CN 201811647987 A CN201811647987 A CN 201811647987A CN 109541441 A CN109541441 A CN 109541441A
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- 238000012360 testing method Methods 0.000 title claims abstract description 57
- 239000011159 matrix material Substances 0.000 claims abstract description 32
- 238000005070 sampling Methods 0.000 claims abstract description 5
- 210000002683 foot Anatomy 0.000 claims description 99
- 239000003990 capacitor Substances 0.000 claims description 14
- 238000001514 detection method Methods 0.000 claims description 9
- 239000003607 modifier Substances 0.000 claims description 8
- 230000005611 electricity Effects 0.000 claims description 7
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- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 5
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- 230000006872 improvement Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
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Abstract
Present invention relates particularly to a kind of micro-wave oven mainboard FCT Auto-Test Systems, comprising: AD sample circuit, for implementing partial pressure and voltage sampling；Matrix press-key control circuit, for that can implement any two short-circuit signal and export；Circuit is tested, tests between circuit and matrix press-key control circuit and is connected by the second integrator IC2 and third integrator IC3, and control the working condition of matrix press-key control circuit, on the voltage parameter input test circuit of AD sample circuit acquisition.The beneficial effects of the present invention are: this structure by test circuit, AD sample circuit and matrix press-key control circuit composition, the performance of micro-wave oven mainboard can be detected, play can be promoted testing efficiency and reduce quality it is offline bad.
Description
Technical field
Present invention relates particularly to a kind of micro-wave oven mainboard FCT Auto-Test Systems.
Background technique
Currently, most of production micro-wave oven master control borads are still using traditional manual testing process, single-board testing, hand operation
Excessive key, human eye observed the portions such as multi output topic in real time, and testing efficiency is low and the offline rate of quality is high.
Wherein single jigsaw test and manually by operation, is easy that there are each test job low efficiencys；In addition, manual test is same
When need to observe voltage and show and load lamp, there are qualitative reliability difference and fool proof are poor.
Summary of the invention
It is an object of the invention to overcome above-mentioned the deficiencies in the prior art, providing a kind of can promote testing efficiency and reduction
The offline undesirable micro-wave oven mainboard FCT Auto-Test System of quality.
A kind of micro-wave oven mainboard FCT Auto-Test System that the present invention describes, including it is as follows.
AD sample circuit, for implementing partial pressure and voltage sampling.
Matrix press-key control circuit, for that can implement any two short-circuit signal and export.
Circuit is tested, tests and passes through the second integrator IC2 and third integrator between circuit and matrix press-key control circuit
IC3 is connected, and controls the working condition of matrix press-key control circuit, the voltage parameter input test of AD sample circuit acquisition
On circuit.
It is specific further, the AD sample circuit include GD interface, first resistor R1, second resistance R2,3rd resistor R3,
4th resistance R4, the 5th resistance R5, the 6th resistance R6, the 7th resistance R7, the 8th resistance R8, the 9th resistance R9, the tenth resistance
R10, eleventh resistor R11 and twelfth resistor R12.
8 foots of GD interface are in series with first resistor R1,7 foots of second resistance R2, GD interface are in series with 3rd resistor
R3 and the 4th resistance R4, the one end second resistance R2 are connected with one end of the 4th resistance R4.
6 foots of GD interface are in series with the 5th resistance R5 and the 6th resistance R6, and 5 foots of GD interface are in series with the 7th resistance
R7 and the 8th resistance R8,4 foots of GD interface are in series with the 9th resistance R9 and the tenth resistance R10, and 3 foots of GD interface are in series with
Eleventh resistor R11 and twelfth resistor R12, the 6th resistance R6, the 8th resistance R8, the tenth resistance R10 and twelfth resistor R12
One end be connected.
Specific further, the matrix press-key control circuit includes relay, and relay is divided into the first relay RELAY-
SPST1, the second relay RELAY-SPST2, third relay RELAY-SPST3, third relay RELAY-SPST3, the 4th
Relay RELAY-SPST4, the 5th relay RELAY-SPST5, the 6th relay RELAY-SPST6, the 7th relay
RELAY-SPST7, the 8th relay RELAY-SPST8, the 9th relay RELAY-DEMO, the tenth relay RELAY-SPST9,
11st relay RELAY-SPST10 and the 12nd relay RELAY-SPST11.
First relay RELAY-SPST1, the second relay RELAY-SPST2, third relay RELAY-SPST3,
Three relay RELAY-SPST3, the 4th relay RELAY-SPST4, the 5th relay RELAY-SPST5, the 6th relay
RELAY-SPST6, the 7th relay RELAY-SPST7, the 8th relay RELAY-SPST8, the 9th relay RELAY-DEMO,
Tenth relay RELAY-SPST9, the 11st relay RELAY-SPST10 and the 12nd relay RELAY-SPST11's is defeated
Enter end to be respectively connected with, control terminal and the test circuit 6 of relay are electrically connected.
Specific further includes further modifier key circuit and micro-wave oven door body open detection circuit, and modifier key circuit 3 wraps
The 13rd relay RELAY-SPST12 is included, micro-wave oven door body open detection circuit 4 includes the 14th relay RELAY-
The X foot and Y foot of SPST13 and the second connector CN1, the 14th relay RELAY-SPST13 1 foot with the first connector CN1 respectively
It is connected with 2 feet.
Specific further includes further power circuit 5, and power circuit 5 includes voltage-stablizer IC1, the second connector CN2, the 13rd
Resistance R13, first diode D1, first capacitor C1 and the second capacitor C2, thirteenth resistor R13 and first diode D1 are connected in series
And it is parallel at 2 foots and 3 foots of voltage-stablizer IC1, first capacitor C1 and the second capacitor C2 are in parallel and are parallel to steady
At 2 foots and 3 foots of depressor IC1；First connector CN1 is connected with the second connector CN2.
Specific further, the test circuit 6 is integrated including single-chip microcontroller U1, third connector CN3, the 4th connector CN4, first
4 foots of device IC1 and the second integrator IC2,4 foots of the first integrator IC1 and the second integrator IC2 respectively with single-chip microcontroller U1
37 foots be connected, matrix press-key control circuit 2 is connected respectively by the first integrator IC1 and the second integrator IC2, and third connects
Head CN3 and the 4th connector CN4 is connected with single-chip microcontroller U1 respectively.
It is specific further, the model PIC16F887 of the single-chip microcontroller U1, the model of the first integrator IC1
HEADER8X2, the model HEADER8X2 of the second integrator IC2.
Specific further, 1 foot of the single-chip microcontroller U1 is electrically connected with switch K1 and third capacitor C3, single-chip microcontroller U1's
Be sequentially connected in series between 21 foots and 22 foots the 17th resistance R17, the second light emitting diode D2, third light emitting diode D3 and
16th resistance R16.
It is specific further, the 5th connector JDG5 and the 5th connector JDG6 is additionally provided in the matrix press-key control circuit.
It is specific further, the model 7802 of the voltage-stablizer IC1.
The beneficial effects of the present invention are: the present invention passes through test circuit, AD sample circuit and matrix press-key control circuit group
At, the performance of micro-wave oven mainboard can be detected, play can be promoted testing efficiency and reduce quality it is offline bad.
Detailed description of the invention
Fig. 1 is AD sample circuit figure of the invention.
Fig. 2 is matrix press-key electric operation control circuit figure of the invention.
Fig. 3 is modifier key circuit diagram of the invention.
Fig. 4 is micro-wave oven door body open detection circuit diagram of the invention.
Fig. 5 is power circuit diagram of the invention.
Fig. 6 is test circuit diagram of the invention.
Fig. 7 is the 5th connector schematic diagram of the invention by key control.
Fig. 8 is the 6th connector schematic diagram of the invention by key control.
Description of symbols: AD sample circuit 1；Matrix press-key control circuit 2；Modifier key circuit 3；Micro-wave oven door body is opened
Open detection circuit 4；Power circuit 5；Test circuit 6.
Specific embodiment
The embodiment of the present invention is described below in detail, examples of the embodiments are shown in the accompanying drawings, wherein from beginning to end
Same or similar label indicates same or similar element or element with the same or similar functions.Below with reference to attached
The embodiment of figure description is exemplary, and for explaining only the invention, and is not considered as limiting the invention.
A kind of micro-wave oven mainboard FCT Auto-Test System according to an embodiment of the present invention is described below with reference to Fig. 1 to Fig. 8,
Including as follows.
AD sample circuit 1, for implementing partial pressure and voltage sampling.
Matrix press-key control circuit 2, for that can implement any two short-circuit signal and export.
Circuit 6 is tested, is tested integrated by the second integrator IC2 and third between circuit 6 and matrix press-key control circuit 2
Device IC3 is connected, and controls the working condition of matrix press-key control circuit 2, the voltage parameter input that AD sample circuit 1 acquires
It tests on circuit 6.
The present invention, can be to micro-wave oven mainboard by test circuit, AD sample circuit and matrix press-key control circuit composition
Performance is detected, and testing efficiency can be promoted and to reduce quality offline bad by playing, and effectively solves previous single jigsaw test and hand
It is dynamic by operation, be easy that there are each test job low efficiencys；It is shown in addition, effectively solving manual test and needing to observe voltage simultaneously
And load lamp, there are qualitative reliability difference and fool proof are poor.
AD sample circuit 1 is with own power source voltage 5V, therefore the sample voltage value of AD sample circuit 1 is no more than 5V.
The present invention is for above-mentioned AD sample circuit 1, matrix press-key control circuit 2 and tests the difference of circuit 6 furtherly
It is bright.
As shown in Figure 1, AD sample circuit 1 includes GD interface, first resistor R1, second resistance R2,3rd resistor R3, the 4th
Resistance R4, the 5th resistance R5, the 6th resistance R6, the 7th resistance R7, the 8th resistance R8, the 9th resistance R9, the tenth resistance R10,
11 resistance R11 and twelfth resistor R12.
8 foots of GD interface are in series with first resistor R1,7 foots of second resistance R2, GD interface are in series with 3rd resistor
R3 and the 4th resistance R4, the one end second resistance R2 are connected with one end of the 4th resistance R4.
6 foots of GD interface are in series with the 5th resistance R5 and the 6th resistance R6, and 5 foots of GD interface are in series with the 7th resistance
R7 and the 8th resistance R8,4 foots of GD interface are in series with the 9th resistance R9 and the tenth resistance R10, and 3 foots of GD interface are in series with
Eleventh resistor R11 and twelfth resistor R12, the 6th resistance R6, the 8th resistance R8, the tenth resistance R10 and twelfth resistor R12
One end be connected.
When wherein needing to divide, pass through first resistor R1, second resistance R2,3rd resistor R3, the 4th resistance R4, the 5th electricity
Hinder R5, the 6th resistance R6, the 7th resistance R7, the 8th resistance R8, the 9th resistance R9, the tenth resistance R10, eleventh resistor R11 and
Twelfth resistor R12 implements partial pressure, wherein first resistor R1, second resistance R2,3rd resistor R3, the 4th resistance R4, the 5th electricity
Hinder R5, the 6th resistance R6, the 7th resistance R7, the 8th resistance R8, the 9th resistance R9, the tenth resistance R10, eleventh resistor R11 and
The resistance value of twelfth resistor R12 uses 18K and two kinds of 6.8K.
Such as: the AD value calculating process of 5V lower limit 4.7V:
Remove 5=480.81 in AD=[(4.7 divided by 2) are divided by 1023].
AD sample circuit 1 acquires in the voltage parameter input test circuit 6 of micro-wave oven mainboard, to judge micro-wave oven mainboard
Working voltage it is whether normal.
As shown in Fig. 2, matrix press-key control circuit 2 includes relay, relay is divided into the first relay RELAY-
SPST1, the second relay RELAY-SPST2, third relay RELAY-SPST3, third relay RELAY-SPST3, the 4th
Relay RELAY-SPST4, the 5th relay RELAY-SPST5, the 6th relay RELAY-SPST6, the 7th relay
RELAY-SPST7, the 8th relay RELAY-SPST8, the 9th relay RELAY-DEMO, the tenth relay RELAY-SPST9,
11st relay RELAY-SPST10 and the 12nd relay RELAY-SPST11.
First relay RELAY-SPST1, the second relay RELAY-SPST2, third relay RELAY-SPST3,
Three relay RELAY-SPST3, the 4th relay RELAY-SPST4, the 5th relay RELAY-SPST5, the 6th relay
RELAY-SPST6, the 7th relay RELAY-SPST7, the 8th relay RELAY-SPST8, the 9th relay RELAY-DEMO,
Tenth relay RELAY-SPST9, the 11st relay RELAY-SPST10 and the 12nd relay RELAY-SPST11's is defeated
Enter end to be respectively connected with, control terminal and the test circuit 6 of relay are electrically connected.
Wherein 1 foot of the first relay RELAY-SPST1,2 foots of the second relay RELAY-SPST2, third after
3 foots of electric appliance RELAY-SPST3,4 foots of the 4th relay RELAY-SPST4, the 5th relay RELAY-SPST5 5
Foot, 6 foots of the 6th relay RELAY-SPST6, the 7th relay RELAY-SPST7 7 foots, the 8th relay
8 foots of RELAY-SPST8,9 foots of the 9th relay RELAY-DEMO, the tenth relay RELAY-SPST9 10 foots,
11 foots of 11st relay RELAY-SPST10 and 12 foots of the 12nd relay RELAY-SPST11.
First relay RELAY-SPST1, the second relay RELAY-SPST2, third relay RELAY-SPST3,
Three relay RELAY-SPST3, the 4th relay RELAY-SPST4, the 5th relay RELAY-SPST5, the 6th relay
RELAY-SPST6, the 7th relay RELAY-SPST7, the 8th relay RELAY-SPST8, the 9th relay RELAY-
SPST9, the tenth relay RELAY-SPST10, the 11st relay RELAY-SPST11 and the 12nd relay RELAY-
12 foots of SPST11.
It as shown in Figure 3 and Figure 4, further include modifier key circuit 3 and micro-wave oven door body open detection circuit 4, modifier key
Circuit 3 includes the 13rd relay RELAY-SPST12, and spare another key of needs implements control.13rd relay
On the electric signal parameter input test circuit 6 of RELAY-SPST12 output.
Micro-wave oven door body open detection circuit 4 include the 14th relay RELAY-SPST13 and the second connector CN1, the tenth
The X foot and Y foot of four relay RELAY-SPST13 is connected with 1 foot of the first connector CN1 and 2 feet respectively, for detecting microwave
Furnace switchs door state, and micro-wave oven door body open detection circuit 4 can detect micro-wave oven switch state, the electric signal parameter input of unlatching
It tests on circuit 6.
As shown in figure 5, further including power circuit 5, power circuit 5 includes voltage-stablizer IC1, the second connector CN2, the 13rd electricity
Resistance R13, first diode D1, first capacitor C1 and the second capacitor C2, thirteenth resistor R13 and first diode D1 are connected in series simultaneously
And be parallel at 2 foots and 3 foots of voltage-stablizer IC1, first capacitor C1 and the second capacitor C2 are in parallel and are parallel to pressure stabilizing
At 2 foots and 3 foots of device IC1；First connector CN1 is connected with the second connector CN2.Wherein, the model of voltage-stablizer IC1
7802.Voltage-stablizer IC1 is that AD sample circuit 1, matrix press-key control circuit 2 and modifier key circuit 3 provide required power supply.Separately
Outside, stabilization is played.
As shown in fig. 6, test circuit 6 includes single-chip microcontroller U1, third connector CN3, the 4th connector CN4, the first integrator IC1
With the second integrator IC2,4 foots of 4 foots of the first integrator IC1 and the second integrator IC2 respectively with single-chip microcontroller U1 37
Foot is connected, and matrix press-key control circuit 2 is connected respectively by the first integrator IC1 and the second integrator IC2, third connector
CN3 and the 4th connector CN4 are connected with single-chip microcontroller U1 respectively.Wherein 40 foots of single-chip microcontroller U1,39 foots and 37 foots difference
Be connected with 4 foots of third connector CN3,5 foots and 6 foots, 30 foots, 29 foots and 27 foots of single-chip microcontroller U1 respectively with
4 foots, 5 foots, 6 feet and 8 feet of 4th connector CN4 are connected, and 37 foots of single-chip microcontroller U1 are respectively with the first integrator IC1's
4 foots of 4 foots and the second integrator IC2 are connected.
Wherein third connector CN3 and the 4th connector CN4 are connected with micro-wave oven mainboard respectively, for detecting micro-wave oven mainboard
In short circuit, survey inspection is carried out to whole performance.
The voltage parameter input test circuit 6 that AD sample circuit 1 acquires, by the single-chip microcontroller U1's on input test circuit 6
19 foots and 20 foots receive voltage parameter respectively.
9 foots of first integrator IC1 are connected with matrix press-key control circuit 2 respectively to 16 foots, for example, the 8th after
The H foot of electric appliance RELAY-SPST8 is connected with 9 foots of the first integrator IC1；It is connected as seemingly analogized.
9 foots of second integrator IC2 are connected with matrix press-key control circuit 2 respectively to 16 foots, for example, first after
The A foot of electric appliance RELAY-SPST1 is connected with 16 foots of the second integrator IC2, such as seemingly analogizes and is connected.
First integrator IC1 and the second integrator IC2 respectively control matrix press-key control circuit 2.
The wherein model HEADER8X2 of the model PIC16F887, the first integrator IC1 of single-chip microcontroller U1, second is integrated
The model HEADER8X2 of device IC2.
1 foot of single-chip microcontroller U1 be electrically connected with switch K1 and third capacitor C3, single-chip microcontroller U1 21 foots and 22 foots it
Between be sequentially connected in series the 17th resistance R17, the second light emitting diode D2, third light emitting diode D3 and the 16th resistance R16, open
It closes K1 and implements single-chip microcontroller U1 unlatching.
As shown in Figure 7 and Figure 8, it is additionally provided with the 5th connector JDG5 and the 5th connector JDG6 in matrix press-key control circuit 2, just
It is connected in matrix press-key control circuit 2.
The present invention uses above-mentioned electrical combination, energy implementation improved efficiency:
Efficiency before improving that single-station testing efficiency is promoted=(efficiency-improvement behind efficiency before improving)/
=(10-6.5)/10
=35%
Production capacity=480-360=120 before production capacity-improvement after production capacity promotion=improvement.
Quality improving:
Observation voltage parameter is no longer needed to during employee's test jobs, concern power is more concentrated, indirect improving production efficiency.
Upper is only presently preferred embodiments of the present invention, is not intended to limit the invention, all in spirit and original of the invention
Made any modification, equivalent replacement or improvement etc., should all be included in the protection scope of the present invention within then.
Claims (10)
1. a kind of micro-wave oven mainboard FCT Auto-Test System, it is characterised in that: include:
AD sample circuit (1), for implementing partial pressure and voltage sampling；
Matrix press-key control circuit (2), for that can implement any two short-circuit signal and export；
It tests circuit (6), tests and pass through the second integrator IC2 and third collection between circuit (6) and matrix press-key control circuit (2)
The IC3 that grows up to be a useful person is connected, and controls the working condition of matrix press-key control circuit (2), the voltage ginseng of AD sample circuit (1) acquisition
On number input test circuit (6).
2. a kind of micro-wave oven mainboard FCT Auto-Test System according to claim 1, it is characterised in that: the AD sampling electricity
Road (1) includes GD interface, first resistor R1, second resistance R2,3rd resistor R3, the 4th resistance R4, the 5th resistance R5, the 6th electricity
Hinder R6, the 7th resistance R7, the 8th resistance R8, the 9th resistance R9, the tenth resistance R10, eleventh resistor R11 and twelfth resistor
R12；
8 foots of GD interface are in series with first resistor R1,7 foots of second resistance R2, GD interface be in series with 3rd resistor R3 and
4th resistance R4, the one end second resistance R2 are connected with one end of the 4th resistance R4；
6 foots of GD interface are in series with the 5th resistance R5 and the 6th resistance R6,5 foots of GD interface be in series with the 7th resistance R7 and
4 foots of the 8th resistance R8, GD interface are in series with the 9th resistance R9 and the tenth resistance R10, and 3 foots of GD interface are in series with the tenth
One resistance R11 and twelfth resistor R12, the 6th resistance R6, the 8th resistance R8, the tenth resistance R10 and twelfth resistor R12 one
End is connected.
3. a kind of micro-wave oven mainboard FCT Auto-Test System according to claim 1, it is characterised in that: the matrix press-key
Control circuit (2) includes relay, relay be divided into the first relay RELAY-SPST1, the second relay RELAY-SPST2,
Third relay RELAY-SPST3, third relay RELAY-SPST3, the 4th relay RELAY-SPST4, the 5th relay
RELAY-SPST5, the 6th relay RELAY-SPST6, the 7th relay RELAY-SPST7, the 8th relay RELAY-
SPST8, the 9th relay RELAY-DEMO, the tenth relay RELAY-SPST9, the 11st relay RELAY-SPST10 and
12 relay RELAY-SPST11；
First relay RELAY-SPST1, the second relay RELAY-SPST2, third relay RELAY-SPST3, third after
Electric appliance RELAY-SPST3, the 4th relay RELAY-SPST4, the 5th relay RELAY-SPST5, the 6th relay RELAY-
SPST6, the 7th relay RELAY-SPST7, the 8th relay RELAY-SPST8, the 9th relay RELAY-DEMO, the tenth after
The input terminal of electric appliance RELAY-SPST9, the 11st relay RELAY-SPST10 and the 12nd relay RELAY-SPST11 point
It is not connected, control terminal and test circuit (6) of relay are electrically connected.
4. a kind of micro-wave oven mainboard FCT Auto-Test System according to claim 1, it is characterised in that: further include auxiliary by
Key circuit (3) and micro-wave oven door body open detection circuit (4), modifier key circuit (3) include the 13rd relay RELAY-
SPST12, micro-wave oven door body open detection circuit (4) they include the 14th relay RELAY-SPST13 and the second connector CN1, the
The X foot and Y foot of 14 relay RELAY-SPST13 is connected with 1 foot of the first connector CN1 and 2 feet respectively.
5. a kind of micro-wave oven mainboard FCT Auto-Test System according to claim 2, it is characterised in that: further include power supply electricity
Road (5), power circuit (5) include voltage-stablizer IC1, the second connector CN2, thirteenth resistor R13, first diode D1, the first electricity
Hold C1 and the second capacitor C2, thirteenth resistor R13 and first diode D1 is connected in series and is parallel to 2 foots of voltage-stablizer IC1
At 3 foots, first capacitor C1 and the second capacitor C2 are in parallel and are parallel at 2 foots and 3 foots of voltage-stablizer IC1；The
One connector CN1 is connected with the second connector CN2.
6. a kind of micro-wave oven mainboard FCT Auto-Test System according to claim 2, it is characterised in that: the test circuit
It (6) include single-chip microcontroller U1, third connector CN3, the 4th connector CN4, the first integrator IC1 and the second integrator IC2, first is integrated
4 foots of 4 foots of device IC1 and the second integrator IC2 are connected with 37 foots of single-chip microcontroller U1 respectively, the first integrator IC1
Be connected with the second integrator IC2 difference matrix press-key control circuit (2), third connector CN3 and the 4th connector CN4 respectively with list
Piece machine U1 is connected.
7. a kind of micro-wave oven mainboard FCT Auto-Test System according to claim 6, it is characterised in that: the single-chip microcontroller U1
Model PIC16F887, the first integrator IC1 model HEADER8X2, the model of the second integrator IC2
HEADER8X2。
8. a kind of micro-wave oven mainboard FCT Auto-Test System according to claim 1, it is characterised in that: the single-chip microcontroller U1
1 foot be electrically connected between switch K1 and 21 foots and 22 foots of third capacitor C3, single-chip microcontroller U1 and be sequentially connected in series the tenth
Seven resistance R17, the second light emitting diode D2, third light emitting diode D3 and the 16th resistance R16.
9. a kind of micro-wave oven mainboard FCT Auto-Test System according to claim 1, it is characterised in that: the matrix press-key
Control circuit is additionally provided with the 5th connector JDG5 and the 5th connector JDG6 on (2).
10. a kind of micro-wave oven mainboard FCT Auto-Test System according to claim 5, it is characterised in that: the voltage-stablizer
The model 7802 of IC1.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201811647987.0A CN109541441A (en) | 2018-12-30 | 2018-12-30 | A kind of micro-wave oven mainboard FCT Auto-Test System |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811647987.0A CN109541441A (en) | 2018-12-30 | 2018-12-30 | A kind of micro-wave oven mainboard FCT Auto-Test System |
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ID=65831666
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111044882A (en) * | 2019-12-28 | 2020-04-21 | 广东盈科电子有限公司 | Fool-proof automatic testing device for 220V load and voltage |
| CN111044825A (en) * | 2019-12-28 | 2020-04-21 | 广东盈科电子有限公司 | Tester for testing 220V load and direct-current voltage |
| CN113985260A (en) * | 2021-12-06 | 2022-01-28 | 苏州奥特美自动化技术有限公司 | FCT multifunctional matrix test board card |
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