CN109342919A - Fault diagnosis system and method for driving circuit of solenoid valve of vehicle fuel injector - Google Patents
Fault diagnosis system and method for driving circuit of solenoid valve of vehicle fuel injector Download PDFInfo
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- CN109342919A CN109342919A CN201811130121.2A CN201811130121A CN109342919A CN 109342919 A CN109342919 A CN 109342919A CN 201811130121 A CN201811130121 A CN 201811130121A CN 109342919 A CN109342919 A CN 109342919A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2829—Testing of circuits in sensor or actuator systems
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/005—Testing of electric installations on transport means
- G01R31/006—Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks
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Abstract
The invention discloses the fault diagnosis systems and method of a kind of automobile-used Drive Circuit for Injector Solenoid Valve.The fault diagnosis system includes MC33PT2000 chip and microcontroller, and microcontroller is connected by Serial Peripheral Interface (SPI) (SPI) and MC33PT2000 chip communication, MC33PT2000 chip with driving circuit.The microcode programming diagnosis and the analytical judgment of microcontroller that the method for diagnosing faults passes through MC33PT2000 chip, the diagnosis to recurrent ten kinds of failures of driving circuit is realized, and has the characteristics that diagnosis speed is fast, diagnostic accuracy is high and it is few to occupy microcontroller resource.
Description
Technical field
The present invention relates to the fault diagnosis fields of engine electric control fuel oil spraying system, more particularly to a kind of automobile-used oil spout
The fault diagnosis system and method for device driving circuit for electromagnetic valve.
Background technique
To meet increasingly strict emission regulation demands, Design of High Pressure Common Rail Diesel Engine has been widely current, and high-speed switch is electric
Magnet valve and its driving circuit are component parts most crucial in Electrocontrolled high-pressure common rail diesel engine.In the work of more than one hundred million switches of solenoid valve
Make in the service life, reliability, stability are one of electronic controlled diesel important indicators, and the failure of driving circuit necessarily will affect
Electromagnetic valve work, so during the work time, the fault diagnosis of Drive Circuit for Injector Solenoid Valve is also particularly significant.In order to meet
The response characteristic of high-speed electromagnetic valve improves system stability, and driving circuit is standing to be calculated as high lower terminal voltage timesharing driving.Traditional
To oil spout circuit diagnostics frequently with two ways: (1) diagnosis indirectly: detection motor instant revolving speed calculates each cylinder oil spout not
Uniformity, then malfunction is judged by software, this method occupancy amount of CPU resource is big, and response speed is slow, and judgment accuracy is poor；
(2) direct mode: directly detection electromagnetic valve current is reached the time of different reference values by detecting electric current, is patrolled using single-chip microcontroller
Judgement diagnosis solenoid valve failure state is collected, though failure can be quickly detected directly, failure is only limited to solenoid valve short circuit and opens
The case where road.And during the work time, due to controller exist collision, vibration etc. factors, this make high-end BOOST metal-oxide-semiconductor,
High-end BATMOS pipe, low side metal-oxide-semiconductor and solenoid valve have the possibility of open circuit, short circuit, and because solenoid valve is external, electromagnetism
Valve is high-end to be shorted to GND and solenoid valve low side is shorted to VBOOAT or VBAT and can also occur, so fuel injector fault state
Sum shares 10 kinds, but up to the present there are no the algorithms that one kind can diagnose 10 kinds of failures.Such as Chinese patent
CN102486131 discloses a kind of fuel injector driving diagnosis and protection circuit, and the diagnosis and protection circuit include voltage comparator
With two latch circuits.It is the feedback signal for receiving self diagnosis and protection circuit, differentiates be out of order based on the feedback signal
Mode, although this scheme fast response time, control adaptability is good, can only detect 6 kinds of failures of driving circuit, and circuit ten
The reliability for dividing complexity to be more reduction of controller.
Summary of the invention
The object of the present invention is to provide the fault diagnosis system and method for a kind of automobile-used Drive Circuit for Injector Solenoid Valve, energy
Enough ten kinds of failures for fast and accurately detecting driving circuit.
To achieve the above object, the present invention provides following schemes:
A kind of fault diagnosis system of automobile-used Drive Circuit for Injector Solenoid Valve, the system comprises MC33PT2000 chips
And microcontroller, the microcontroller are described by Serial Peripheral Interface (SPI) and the MC33PT2000 chip communication
The grid of the high-end metal-oxide-semiconductor of the G_HSx pin and driving circuit of MC33PT2000 chip is connected, the MC33PT2000 chip
S_HSx pin is connected with the source electrode of the high-end metal-oxide-semiconductor of driving circuit, the D_LSx pin of the MC33PT2000 chip and driving
The drain electrode of the low side metal-oxide-semiconductor of circuit is connected, the G_LSx pin of the MC33PT2000 chip and the low side metal-oxide-semiconductor of driving circuit
Grid be connected, the metal-oxide-semiconductor of the G_LS7/8 pin of the MC33PT2000 chip and driving circuit for driving voltage transformation
Grid is connected.
Optionally, the IRQB pin of the MC33PT2000 chip is connected with the triggering pin of the microcontroller, described
Triggering pin is used to detect the level of the IRQB pin, and when the level drags down, the microcontroller is connect by serial peripheral
Mouth obtains the fault message that the MC33PT2000 chip detects.
Optionally, the ETPU pin of the microcontroller is connected with the START pin of the MC33PT2000 chip.
The present invention also provides a kind of method for diagnosing faults of automobile-used Drive Circuit for Injector Solenoid Valve, the method applications
In the fault diagnosis system of automobile-used Drive Circuit for Injector Solenoid Valve provided by the invention, which comprises
Microcontroller issues the order for starting diagnosis to MC33PT2000 chip；
MC33PT2000 chip closes high-end metal-oxide-semiconductor and low side metal-oxide-semiconductor, bias voltage is opened, the high-end metal-oxide-semiconductor
Including high-end BOOSTMOS pipe and high-end BATMOS pipe；
MC33PT2000 chip judges whether hsx_vds_vbat_fbk comparator exports low level；
If hsx_vds_vbat_fbk comparator exports low level, it is diagnosed as high-end BATMOS tube short circuit；
MC33PT2000 chip judges whether lsx_vds_fbk comparator exports low level；
If lsx_vds_fbk comparator exports low level, it is diagnosed as solenoid valve open circuit；
MC33PT2000 chip judges whether hsx_src_vboost_fbk comparator exports low level；
If hsx_src_vboost_fbk comparator exports low level, flag set is occurred into for Fisrt fault；
MC33PT2000 chip judges whether hsx_vds_vboost_fbk comparator exports low level；
If hsx_vds_vboost_fbk comparator exports low level, flag set is occurred into for the second failure；
MC33PT2000 chip keeps bias voltage to open, and low side metal-oxide-semiconductor is connected；
MC33PT2000 chip judges whether lsx_vds_fbk exports high level；
If lsx_vds_fbk comparator exports high level, it is diagnosed as low side metal-oxide-semiconductor open circuit；
MC33PT2000 chip carries out fault detection, the deposit according to the information stored in register, to driving circuit
The information stored in device is the information configured when initialization；
MC33PT2000 chip records the output state of driving signal and the corresponding each comparator of the driving signal, note
For detection information；
Microcontroller obtains the detection information and failure indicates, and according to the detection information and software event
Barrier occurs to indicate the fault type for determining driving circuit.
Optionally, the MC33PT2000 chip carries out failure inspection to driving circuit according to the information stored in register
It surveys, specifically includes:
When the conducting of high-end BOOSTMOS pipe, the output state of hsx_vds_vboost_fbk comparator is denoted as for detection
One output state；
When low side metal-oxide-semiconductor is closed, the output state of lsx_vds_fbk comparator is denoted as the second output state for detection；
When the conducting of low side metal-oxide-semiconductor, the output state of lsx_vds_fbk comparator is denoted as third output state for detection；
When high-end BOOSTMOS pipe is closed, the output state of hsx_vds_vboost_fbk comparator is denoted as for detection
Four output states；
When the conducting of high-end BATMOS pipe, it is defeated to be denoted as the 5th for the output state of hsx_vds_vbat_fbk comparator for detection
It does well；
The information stored in each output state and the register is compared, when inconsistent, the IRQB dragged down and draws
The level of foot.
Optionally, the microcontroller obtains the detection information and software fault indicates, and according to the inspection
Measurement information and software fault occur to indicate the fault type for determining driving circuit, specifically include:
Judge Fisrt fault occur mark whether set；
If flag set occurs for Fisrt fault；
Then judge whether first output state is high level；
If first output state is high level, it is diagnosed as that solenoid valve is high-end to be shorted to GND；
If first output state is low level, judge whether second output state is low level；
If second output state is low level, it is diagnosed as low side metal-oxide-semiconductor short circuit；
If Fisrt fault occurs to indicate no set, judge the second failure occur mark whether set；
If flag set occurs for the second failure；
Judge whether the third output state is high level；
If the third output state is high level；
It is then diagnosed as solenoid valve low side and is shorted to VBOOST or VBAT；
If the third output state is low level；
Then judge whether the 4th output state is low level；
If the 4th output state is low level；
Then it is diagnosed as high-end BOOST metal-oxide-semiconductor short circuit；
If the second failure occurs to indicate no set；
Then judge whether the third output state is high level；
If the third output state is high level；
Then it is diagnosed as solenoid valve short circuit；
Judge whether first output state is high level；
If first output state is high level；
Then it is diagnosed as high-end BOOST metal-oxide-semiconductor open circuit；
Judge whether the 5th output state is high level；
If the 5th output state is high level；
Then it is diagnosed as high-end BAT metal-oxide-semiconductor open circuit.
The specific embodiment provided according to the present invention, the invention discloses following technical effects: provided by the invention automobile-used
The fault diagnosis system and method for Drive Circuit for Injector Solenoid Valve are combined using MC33PT2000 chip and microcontroller
Mode diagnoses the failure of driving circuit, passes through the microcode programming diagnosis of MC33PT2000 chip and point of microcontroller
Judgement is analysed, realizes the diagnosis to recurrent ten kinds of failures of driving circuit, and speed is fast, it is with high accuracy to be directed to diagnosing
Feature.
Detailed description of the invention
It in order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, below will be to institute in embodiment
Attached drawing to be used is needed to be briefly described, it should be apparent that, the accompanying drawings in the following description is only some implementations of the invention
Example, for those of ordinary skill in the art, without creative efforts, can also obtain according to these attached drawings
Obtain other attached drawings.
Fig. 1 is the fault diagnosis system structural schematic diagram of the automobile-used Drive Circuit for Injector Solenoid Valve of the embodiment of the present invention；
Fig. 2 is the method for diagnosing faults flow chart of the automobile-used Drive Circuit for Injector Solenoid Valve of the embodiment of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
The object of the present invention is to provide the fault diagnosis system and method for a kind of automobile-used Drive Circuit for Injector Solenoid Valve, energy
Enough ten kinds of failures for fast and accurately detecting driving circuit.
In order to make the foregoing objectives, features and advantages of the present invention clearer and more comprehensible, with reference to the accompanying drawing and specific real
Applying mode, the present invention is described in further detail.
Fig. 1 is the fault diagnosis system structural schematic diagram of the automobile-used Drive Circuit for Injector Solenoid Valve of the embodiment of the present invention, such as
Shown in Fig. 1, the fault diagnosis system of automobile-used Drive Circuit for Injector Solenoid Valve provided by the invention includes MC33PT2000 chip
And microcontroller, microcontroller pass through Serial Peripheral Interface (SPI) (SPI) and MC33PT2000 chip communication, MC33PT2000 chip
G_HSx pin is connected with the grid of the high-end metal-oxide-semiconductor of driving circuit, the S_HSx pin and driving circuit of MC33PT2000 chip
High-end metal-oxide-semiconductor source electrode be connected, the drain electrode phase of the low side metal-oxide-semiconductor of the D_LSx pin and driving circuit of MC33PT2000 chip
Even, the grid of the low side metal-oxide-semiconductor of the G_LSx pin and driving circuit of MC33PT2000 chip is connected, MC33PT2000 chip
Grid of the G_LS7/8 pin with driving circuit for the metal-oxide-semiconductor of driving voltage transformation (DC/DC) is connected, and converts voltage
The maximum value of VBOOST can reach 72V, VSENSEPx and VSENSENx pin and be connected respectively with the both ends of current sense resistor, real
When the electric current that flows through of detection solenoid valve, and feed back to micro process core, peak-hold electric current required for cooperation micro code program is realized
Waveform.
Micro-control unit (MCU) carries out data interaction by Serial Peripheral Interface (SPI) (SPI) and MC33PT2000 chip, both may be used
It again can be with read-write chip internal register to download micro code program into chip.The enhanced time processing unit in 8 tunnels of MCU
(ETPU) pin is connected with chip START pin, and chip interior microcode can control spray by detecting the state of START pin
The on-off of oily device.For MCU by detection IRQB pin state to determine whether faulty generation, default pin state is high level,
The faulty generation when pin state is low level, microcontroller obtain MC33PT2000 core by Serial Peripheral Interface (SPI) (SPI)
The fault message that piece detects, so IRQB pin and MCU should can be realized input capture in order to quickly examine malfunction
The pin of function is connected.
On the basis of the fault diagnosis system of above-mentioned automobile-used Drive Circuit for Injector Solenoid Valve, the present invention provides one kind
The method for diagnosing faults of automobile-used Drive Circuit for Injector Solenoid Valve, Fig. 2 are the automobile-used fuel injector magnetic system driving of the embodiment of the present invention
The method for diagnosing faults flow chart of circuit, as shown in Fig. 2, this method comprises:
Step 201: microcontroller issues the order for starting diagnosis to MC33PT2000 chip；
Step 202:MC33PT2000 chip closes high-end metal-oxide-semiconductor and low side metal-oxide-semiconductor, and bias voltage is opened, high-end
Metal-oxide-semiconductor includes high-end BOOSTMOS pipe and high-end BATMOS pipe；
Step 203:MC33PT2000 chip judges whether hsx_vds_vbat_fbk comparator exports low level；
Step 204: if hsx_vds_vbat_fbk comparator exports low level, it is short to be diagnosed as high-end BAT metal-oxide-semiconductor
Road；
Step 205:MC33PT2000 chip judges whether lsx_vds_fbk comparator exports low level；
Step 206: if lsx_vds_fbk comparator exports low level, solenoid valve open circuit will be diagnosed as；
Step 207:MC33PT2000 chip judges whether hsx_src_vboost_fbk comparator exports low level；
Step 208: if hsx_src_vboost_fbk comparator exports low level, Fisrt fault generation mark being set
Position；
Step 209:MC33PT2000 chip judges whether hsx_vds_vboost_fbk comparator exports low level；
Step 210: if hsx_vds_vboost_fbk comparator exports low level, the second failure generation mark being set
Position；
Step 211:MC33PT2000 chip keeps bias voltage to open, and low side metal-oxide-semiconductor is connected；
Step 212:MC33PT2000 chip judges whether lsx_vds_fbk exports high level；
Step 213: if lsx_vds_fbk comparator exports high level, being diagnosed as low side metal-oxide-semiconductor open circuit；
Step 214:MC33PT2000 chip carries out fault detection according to the information stored in register, to driving circuit,
The information stored in register is the information configured when initialization；
Step 215:MC33PT2000 chip records the output shape of driving signal and the corresponding each comparator of driving signal
State is denoted as detection information；
Step 216: microcontroller obtains detection information and failure indicates, and according to detection information and software event
Barrier occurs to indicate the fault type for determining driving circuit.
Wherein, step 214 specifically includes:
When the conducting of high-end BOOSTMOS pipe, the output state of hsx_vds_vboost_fbk comparator is denoted as for detection
One output state；When low side metal-oxide-semiconductor is closed, the output state of lsx_vds_fbk comparator is denoted as the second output shape for detection
State；When the conducting of low side metal-oxide-semiconductor, the output state of lsx_vds_fbk comparator is denoted as third output state for detection；Detection is worked as
When high-end BOOST metal-oxide-semiconductor is closed, the output state of hsx_vds_vboost_fbk comparator is denoted as the 4th output state；Inspection
It surveys when the conducting of high-end BAT metal-oxide-semiconductor, the output state of hsx_vds_vbat_fbk comparator is denoted as the 5th output state；
The information stored in each output state and register is compared, when inconsistent, drags down the IRQB pin
Level, when preconfigured driving circuit is normal when the information stored in register is initialization, the output state of each comparator.
Step 216 specifically includes:
Judge Fisrt fault occur mark whether set；
If flag set occurs for Fisrt fault；
Then judge whether the first output state is high level；
If the first output state is high level, it is diagnosed as that solenoid valve is high-end to be shorted to GND；
If the first output state is low level, judge whether the second output state is low level；
If the second output state is low level, it is diagnosed as low side metal-oxide-semiconductor short circuit；
If Fisrt fault occurs to indicate no set, judge the second failure occur mark whether set；
If flag set occurs for the second failure；
Judge whether third output state is high level；
If third output state is high level；
It is then diagnosed as solenoid valve low side and is shorted to VBOOST or VBAT；
If third output state is low level；
Then judge whether the 4th output state is low level；
If the 4th output state is low level；
Then it is diagnosed as high-end BOOSTMOS tube short circuit；
If the second failure occurs to indicate no set；
Then judge whether third output state is high level；
If third output state is high level；
Then it is diagnosed as solenoid valve short circuit；
Judge whether the first output state is high level；
If the first output state is high level；
Then it is diagnosed as high-end BOOSTMOS pipe open circuit；
Judge whether the 5th output state is high level；
If the 5th output state is high level；
Then it is diagnosed as high-end BATMOS pipe open circuit.
The microcode programming that all diagnosis processes pass through MC33PT2000 chip is realized, step 201 to step 210 is defined
For software diagnosis, step 211 to step 213 is defined as additional diagnostics, it is automatic that step 214 to step 216 is defined as hardware
Diagnosis.When MC33PT2000 chip is connected to the oil spout trigger signal of MCU, software diagnosis process will make three metal-oxide-semiconductors (high-end
BOOST metal-oxide-semiconductor, high-end BATMOS pipe and low side metal-oxide-semiconductor) it is in closed state, 3.8V bias voltage is opened (due at this time
Electric current very little, solenoid valve will not act), and the output state of all comparators in MC33PT2000 chip is detected, 10 kinds of failures
Corresponding each comparator state as shown in table 1 (" 1 " represents comparator output high level, and " x " is indicated as normal condition,
It cannot be distinguished).From table 1 it follows that hsx_vds_bat_fbk comparator exports low level when high-end BAT metal-oxide-semiconductor short circuit,
Remaining comparator exports high level；The open circuit of high-end BATMOS pipe, the open circuit of high-end BOOSTMOS pipe, the open circuit of low side metal-oxide-semiconductor and
Load short circuit cannot distinguish between all as normal condition；High-end BOOST metal-oxide-semiconductor short circuit and solenoid valve low side are shorted to VBOOST
Malfunction is the same, i.e., hsx_vds_boost_fbk comparator exports low level, remaining comparator exports high level；LS short circuit
It is consistent with the high-end GND malfunction that is shorted to of solenoid valve, comparator hsx_src_boost_fbk, hsx_src_bat_fbk,
Lsx_vds_fbk exports low level, remaining comparator exports high level；Only have lsx_vds_fbk comparator defeated when Load open circuit
Low level out, remaining comparator export high level.As can be seen that high-end BAT metal-oxide-semiconductor short circuit and Load are disconnected from the above analysis
Road malfunction is unique, can directly detected in software diagnosis；Since high-end BOOST metal-oxide-semiconductor short circuit and solenoid valve are low
Terminal shortcircuit is consistent to VBOOST malfunction, and the short circuit of low side metal-oxide-semiconductor is consistent with the high-end GND malfunction that is shorted to of solenoid valve, this 4
Kind failure can cause software diagnosis, but be unable to which kind of failure Accurate Diagnosis has happens is that.
Comparator state corresponding to 10 kinds of failures in 1 software diagnosis of table
Additional diagnostics are after software diagnosis, and also when for loop power supply, low side metal-oxide-semiconductor is opened for bias voltage,
In additional diagnostics, under normal circumstances, comparator lsx_vds_fbk should export low level, but the open circuit of low side metal-oxide-semiconductor occurs
Afterwards, comparator lsx_vds_fbk will export high level, so low side metal-oxide-semiconductor open circuit fault can detect in additional diagnostics
Come.
It is the error listing register that MC33PT2000 chip is configured by table 2-6 that hardware diagnoses automatically, when an error occurs,
It will appear driving output and respective feedback check inconsistent situation, and MC33PT2000 chip will record each moment driving letter
Output state number with each comparator, hardware can drag down IRQB pin automatically, then analyzed and determined by MCU happens is which kind of therefore
Barrier.The low side MOS that high-end BATMOS tube short circuit, Load open circuit and the additional diagnostics having been detected by addition to software diagnosis detect
Pipe open circuit is outer, and remaining 7 kinds of failures need to be distinguished in automatic diagnosis.The fault signature of this 7 kinds of failures is as shown in table 7
(" 1 ", which represents, meets this condition).As can be seen from Table 7, in the short circuit of software diagnosis middle and high end BOOST metal-oxide-semiconductor and solenoid valve
It is identical that low side is shorted to VBOOST malfunction, the short circuit of low side metal-oxide-semiconductor with solenoid valve is high-end is shorted to as GND malfunction,
But this 4 kinds of failures available good differentiation in automatic diagnosis；And diagnosis middle and high end BATMOS pipe is breaking, high-end automatically
The fault signature of the open circuit of BOOSTMOS pipe and Load short circuit is also uniquely, to be distinguished.
2 low side metal-oxide-semiconductor Vds error listing of table
The high-end BAT metal-oxide-semiconductor Vds error listing of table 3
The high-end BAT metal-oxide-semiconductor Vsrc error listing of table 4
The high-end BOOST metal-oxide-semiconductor Vds error listing of table 5
The high-end BOOST metal-oxide-semiconductor Vsrc error listing of table 6
7 hardware of table diagnose automatically in 7 kinds of failures feature
The fault diagnosis system and method for automobile-used Drive Circuit for Injector Solenoid Valve provided by the invention, quickly and accurately
Differentiate the recurrent 10 kinds of faults of timesharing driving circuit of solenoid valve, and make full use of software and hardware advantage, has and occupy
The advantage that cpu resource is few, functional reliability is strong.
Each embodiment in this specification is described in a progressive manner, the highlights of each of the examples are with other
The difference of embodiment, the same or similar parts in each embodiment may refer to each other.
Used herein a specific example illustrates the principle and implementation of the invention, and above embodiments are said
It is bright to be merely used to help understand method and its core concept of the invention；At the same time, for those skilled in the art, foundation
Thought of the invention, there will be changes in the specific implementation manner and application range.In conclusion the content of the present specification is not
It is interpreted as limitation of the present invention.
Claims (6)
1. a kind of fault diagnosis system of automobile-used Drive Circuit for Injector Solenoid Valve, which is characterized in that the system comprises
MC33PT2000 chip and microcontroller, the microcontroller are logical by Serial Peripheral Interface (SPI) and the MC33PT2000 chip
Letter, the grid of the high-end metal-oxide-semiconductor of the G_HSx pin and driving circuit of the MC33PT2000 chip is connected, described
The source electrode of the high-end metal-oxide-semiconductor of the S_HSx pin and driving circuit of MC33PT2000 chip is connected, the MC33PT2000 chip
D_LSx pin is connected with the drain electrode of the low side metal-oxide-semiconductor of driving circuit, the G_LSx pin of the MC33PT2000 chip and driving
The grid of the low side metal-oxide-semiconductor of circuit is connected, and the G_LS7/8 pin and driving circuit of the MC33PT2000 chip are for driving electricity
The grid for the metal-oxide-semiconductor that buckling is changed is connected.
2. the fault diagnosis system of automobile-used Drive Circuit for Injector Solenoid Valve according to claim 1, which is characterized in that institute
The IRQB pin for stating MC33PT2000 chip is connected with the triggering pin of the microcontroller, and the triggering pin is for detecting institute
The level for stating IRQB pin, when the level drags down, the microcontroller passes through described in Serial Peripheral Interface (SPI) acquisition
The fault message that MC33PT2000 chip detects.
3. the fault diagnosis system of automobile-used Drive Circuit for Injector Solenoid Valve according to claim 1, which is characterized in that institute
The ETPU pin for stating microcontroller is connected with the START pin of the MC33PT2000 chip.
4. a kind of method for diagnosing faults of automobile-used Drive Circuit for Injector Solenoid Valve, which is characterized in that the method is applied to such as
The fault diagnosis system of the described in any item automobile-used Drive Circuit for Injector Solenoid Valve of claim 1-3, which comprises
Microcontroller issues the order for starting diagnosis to MC33PT2000 chip；
MC33PT2000 chip closes high-end metal-oxide-semiconductor and low side metal-oxide-semiconductor, bias voltage is opened, the high-end metal-oxide-semiconductor includes
High-end BOOSTMOS pipe and high-end BATMOS pipe；
MC33PT2000 chip judges whether hsx_vds_vbat_fbk comparator exports low level；
If hsx_vds_vbat_fbk comparator exports low level, it is diagnosed as high-end BATMOS tube short circuit；
MC33PT2000 chip judges whether lsx_vds_fbk comparator exports low level；
If lsx_vds_fbk comparator exports low level, it is diagnosed as solenoid valve open circuit；
MC33PT2000 chip judges whether hsx_src_vboost_fbk comparator exports low level；
If hsx_src_vboost_fbk comparator exports low level, flag set is occurred into for Fisrt fault；
MC33PT2000 chip judges whether hsx_vds_vboost_fbk comparator exports low level；
If hsx_vds_vboost_fbk comparator exports low level, flag set is occurred into for the second failure；
MC33PT2000 chip keeps bias voltage to open, and low side metal-oxide-semiconductor is connected；
MC33PT2000 chip judges whether lsx_vds_fbk exports high level；
If lsx_vds_fbk comparator exports high level, it is diagnosed as low side metal-oxide-semiconductor open circuit；
MC33PT2000 chip carries out fault detection according to the information stored in register, to driving circuit, in the register
The information of storage is the information configured when initialization；
MC33PT2000 chip records the output state of driving signal and the corresponding each comparator of the driving signal, is denoted as inspection
Measurement information；
Microcontroller obtains the detection information and failure indicates, and is sent out according to the detection information and software fault
It is raw to indicate the fault type for determining driving circuit.
5. the method for diagnosing faults of automobile-used Drive Circuit for Injector Solenoid Valve according to claim 4, which is characterized in that institute
MC33PT2000 chip is stated according to the information stored in register, fault detection is carried out to driving circuit, is specifically included:
When the conducting of high-end BOOSTMOS pipe, it is defeated to be denoted as first for the output state of hsx_vds_vboost_fbk comparator for detection
It does well；
When low side metal-oxide-semiconductor is closed, the output state of lsx_vds_fbk comparator is denoted as the second output state for detection；
When the conducting of low side metal-oxide-semiconductor, the output state of lsx_vds_fbk comparator is denoted as third output state for detection；
When high-end BOOSTMOS pipe is closed, it is defeated to be denoted as the 4th for the output state of hsx_vds_vboost_fbk comparator for detection
It does well；
Detection is when the conducting of high-end BATMOS pipe, the output state of hsx_vds_vbat_fbk comparator, is denoted as the 5th output shape
State；
The information stored in each output state and the register is compared, when inconsistent, drags down the IRQB pin
Level.
6. the method for diagnosing faults of automobile-used Drive Circuit for Injector Solenoid Valve according to claim 5, which is characterized in that institute
It states the microcontroller acquisition detection information and software fault indicates, and according to the detection information and software fault
Occur to indicate the fault type for determining driving circuit, specifically include:
Judge Fisrt fault occur mark whether set；
If flag set occurs for Fisrt fault；
Then judge whether first output state is high level；
If first output state is high level, it is diagnosed as that solenoid valve is high-end to be shorted to GND；
If first output state is low level, judge whether second output state is low level；
If second output state is low level, it is diagnosed as low side metal-oxide-semiconductor short circuit；
If Fisrt fault occurs to indicate no set, judge the second failure occur mark whether set；
If flag set occurs for the second failure；
Judge whether the third output state is high level；
If the third output state is high level；
It is then diagnosed as solenoid valve low side and is shorted to VBOOST or VBAT；
If the third output state is low level；
Then judge whether the 4th output state is low level；
If the 4th output state is low level；
Then it is diagnosed as high-end BOOST metal-oxide-semiconductor short circuit；
If the second failure occurs to indicate no set；
Then judge whether the third output state is high level；
If the third output state is high level；
Then it is diagnosed as solenoid valve short circuit；
Judge whether first output state is high level；
If first output state is high level；
Then it is diagnosed as high-end BOOST metal-oxide-semiconductor open circuit；
Judge whether the 5th output state is high level；
If the 5th output state is high level；
Then it is diagnosed as high-end BAT metal-oxide-semiconductor open circuit.
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