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CN109336597A - The preparation method and test method of the base station 5G ceramic dielectric waveguide filter - Google Patents

The preparation method and test method of the base station 5G ceramic dielectric waveguide filter Download PDF

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Publication number
CN109336597A
CN109336597A CN201811526017.5A CN201811526017A CN109336597A CN 109336597 A CN109336597 A CN 109336597A CN 201811526017 A CN201811526017 A CN 201811526017A CN 109336597 A CN109336597 A CN 109336597A
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base station
dielectric waveguide
ceramic dielectric
test
waveguide filter
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朱琦
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ZHANGJIAGANG BONDED AREA CANQIN TECHNOLOGY Co Ltd
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ZHANGJIAGANG BONDED AREA CANQIN TECHNOLOGY Co Ltd
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    • C04B35/626Preparing or treating the powders individually or as batches ; preparing or treating macroscopic reinforcing agents for ceramic products, e.g. fibres; mechanical aspects section B
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    • C04B41/45Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
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    • C04B41/51Metallising, e.g. infiltration of sintered ceramic preforms with molten metal
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00Auxiliary devices
    • H01P1/20Frequency-selective devices, e.g. filters
    • H01P1/2002Dielectric waveguide filters
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P11/00Apparatus or processes specially adapted for manufacturing waveguides or resonators, lines, or other devices of the waveguide type
    • H01P11/007Manufacturing frequency-selective devices
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    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
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Abstract

This application discloses the preparation method and test method of a kind of base station 5G ceramic dielectric waveguide filter, the preparation method of the base station 5G ceramic dielectric waveguide filter successively includes compounding, mixing, drying, calcining, mist projection granulating, molding, CNC processing, sintering, metallization, assembling, test, forms finished product.The beneficial effects of the present invention are providing a kind of method for preparing the base station 5G ceramic dielectric waveguide filter, and accordingly provide the method for testing its performance indicator.

Description

The preparation method and test method of the base station 5G ceramic dielectric waveguide filter
Technical field
This application involves the base station 5G ceramic dielectric waveguide filters, the especially base station 5G ceramic dielectric waveguide filter Preparation method and test method.
Background technique
The dielectric waveguide filter of existing production is not used to the base station 5G, and is unable to test and verifies its performance and refer to Mark.
Summary of the invention
The present invention is for overcome the deficiencies in the prior art, to provide a kind of system of the base station 5G ceramic dielectric waveguide filter Preparation Method and test method.
To achieve the above object, the invention provides the following technical scheme:
The embodiment of the present application discloses a kind of preparation method of the base station 5G ceramic dielectric waveguide filter, successively includes matching Material, drying, calcining, mist projection granulating, molding, CNC processing, sintering, metallization, assembling, test, forms finished product at mixing.
Preferably, in the preparation method in the above-mentioned base station 5G with ceramic dielectric waveguide filter, the ingredient is according to such as Lower molar ratio ingredient: 0.35 strontium carbonate, 0.12 aluminum oxide, 0.32 lanthanum sesquioxide, 0.21 titanium dioxide, 0.50 5 oxidations Two tantalums, 0.23 zinc oxide.
Preferably, in the preparation method in the above-mentioned base station 5G with ceramic dielectric waveguide filter, the calcination temperature is 1500-1600℃。
Preferably, in the preparation method in the above-mentioned base station 5G with ceramic dielectric waveguide filter, the compact density is 3.5±0.10g/cm3
Preferably, in the preparation method in the above-mentioned base station 5G with ceramic dielectric waveguide filter, the metallization is used Spraying process is carried out by silver, silver ink firing.
Correspondingly, also disclosing a kind of test method of the base station 5G ceramic dielectric waveguide filter, testing procedure includes:
A selects suitable start-stop frequency according to filter band limits, carries out dual-port school to vector network analyzer It is quasi-;
Filter is placed in high-low temperature test chamber by b, and radio-frequency cable connects filter input/output port, and radio-frequency cable stretches out The high-low temperature test chamber is simultaneously connected to vector network analyzer;
The start-stop frequency that vector network analyzer is arranged in c is more than filter passband start-stop frequency, and measure the item is set as S21;
D tests pass band width or insertion loss or Out-of-band rejection.
Preferably, in the test method in the above-mentioned base station 5G with ceramic dielectric waveguide filter, when testing pass band width, S21 value at mark center frequency f0 is found the frequency at the right and left decline XdB, is recorded as respectively on the basis of this value F1, f2 calculate the value of f1-f2, this value is the XdB pass band width of filter.
Preferably, in the test method in the above-mentioned base station 5G with ceramic dielectric waveguide filter, when testing insertion loss, The minimum value on S21 curve is read, which is the insertion loss of filter.
Preferably, in the test method in the above-mentioned base station 5G with ceramic dielectric waveguide filter, when testing Out-of-band rejection, The maximum value on S21 curve is read, which is Out-of-band rejection of the filter to the frequency range.
Preferably, in the test method in the above-mentioned base station 5G with ceramic dielectric waveguide filter, in step b, high/low temperature Case high temperature temperature is 90 DEG C, and cryogenic temperature is -40 DEG C, and filters to test is preposition to keep the temperature 2 hours in the high-low temperature chamber.
The beneficial effects of the invention are as follows provide a kind of method for preparing the base station 5G ceramic dielectric waveguide filter, and phase The method for testing its performance indicator should be provided.
Specific embodiment
It will be apparent from the preferred embodiment of the present invention below.
The preparation step of the base station 5G ceramic dielectric waveguide filter includes:
Ingredient, according to following molar ratio ingredient: 0.35 strontium carbonate, 0.12 aluminum oxide, 0.32 lanthanum sesquioxide, 0.21 Titanium dioxide, 0.50 tantalum pentoxide, 0.23 zinc oxide;
Mixing;
It is dry;
Calcining, calcination temperature are 1500-1600 DEG C;
Mist projection granulating;
Molding, compact density are 3.5 ± 0.10g/cm3
CNC processing;
Sintering;
Metallization is carried out using spraying process by silver, silver ink firing;
Assembling;
Test, step include:
A selects suitable start-stop frequency according to filter band limits, carries out dual-port school to vector network analyzer It is quasi-;
Filter is placed in high-low temperature test chamber by b, and high-low temperature chamber high temperature temperature is 90 DEG C, and cryogenic temperature is -40 DEG C, filter The test of wave device is preposition to keep the temperature 2 hours in high-low temperature chamber, and radio-frequency cable connects filter input/output port, and radio-frequency cable stretches out High-low temperature test chamber is simultaneously connected to vector network analyzer;
The start-stop frequency that vector network analyzer is arranged in c is more than filter passband start-stop frequency, and measure the item is set as S21;
When d tests pass band width, the S21 value at mark center frequency f0 finds the right and left decline on the basis of this value Frequency at XdB, is recorded as f1, f2 respectively, calculates the value of f1-f2, this value is the XdB pass band width of filter;Test is inserted When entering to be lost, the minimum value on S21 curve is read, which is the insertion loss of filter;When testing Out-of-band rejection, read Maximum value on S21 curve, the value are Out-of-band rejection of the filter to the frequency range, replace other with outer frequency range and repeat above-mentioned step Suddenly;
Test request index is as follows:
Form finished product.
Above-mentioned test method is to be placed in test in incubator, and filter need to be only placed in room temperature by room temperature test, without setting In high/low temperature incubator, it should also belong to scope of the present application.
Of the invention provides a kind of method for preparing the base station 5G ceramic dielectric waveguide filter, and accordingly provides survey Try the method and the specific performance parameter value of this method of its performance indicator.
This embodiment is just an exemplary description of this patent and does not limit its protection scope, and those skilled in the art are also Local change can be carried out to it, as long as it does not exceed the essence of this patent, all be considered as the equivalent replacement to this patent, all Within the protection scope of this patent.

Claims (10)

1. a kind of preparation method of the base station 5G ceramic dielectric waveguide filter, which is characterized in that successively include compounding, mixing, Drying, mist projection granulating, molding, CNC processing, sintering, metallization, assembling, test, forms finished product at calcining.
2. the preparation method of the base station 5G ceramic dielectric waveguide filter according to claim 1, which is characterized in that described Ingredient is according to following molar ratio ingredient: 0.35 strontium carbonate, 0.12 aluminum oxide, 0.32 lanthanum sesquioxide, 0.21 titanium dioxide, 0.50 tantalum pentoxide, 0.23 zinc oxide.
3. the preparation method of the base station 5G ceramic dielectric waveguide filter according to claim 1, which is characterized in that described Calcination temperature is 1500-1600 DEG C.
4. the preparation method of the base station 5G ceramic dielectric waveguide filter according to claim 1, which is characterized in that described Compact density is 3.5 ± 0.10g/cm3
5. the preparation method of the base station 5G ceramic dielectric waveguide filter according to claim 1, which is characterized in that described Metallization is carried out using spraying process by silver, silver ink firing.
6. the test method of the base station 5G ceramic dielectric waveguide filter as described in claim 1, which is characterized in that test step Suddenly include:
A selects suitable start-stop frequency according to filter band limits, carries out dual-port calibration to vector network analyzer;
Filter is placed in high-low temperature test chamber by b, and radio-frequency cable connects filter input/output port, described in radio-frequency cable stretches out High-low temperature test chamber is simultaneously connected to vector network analyzer;
The start-stop frequency that vector network analyzer is arranged in c is more than filter passband start-stop frequency, and measure the item is set as S21;
D tests pass band width or insertion loss or Out-of-band rejection.
7. the test method of the base station 5G ceramic dielectric waveguide filter according to claim 6, which is characterized in that test When pass band width, the S21 value at mark center frequency f0 finds the frequency at the right and left decline XdB on the basis of this value, It is recorded as f1, f2 respectively, calculates the value of f1-f2, this value is the XdB pass band width of filter.
8. the test method of the base station 5G ceramic dielectric waveguide filter according to claim 6, which is characterized in that test When insertion loss, the minimum value on S21 curve is read, which is the insertion loss of filter.
9. the test method of the base station 5G ceramic dielectric waveguide filter according to claim 6, which is characterized in that test When Out-of-band rejection, the maximum value on S21 curve is read, which is Out-of-band rejection of the filter to the frequency range.
10. the test method of the base station 5G ceramic dielectric waveguide filter according to claim 6, which is characterized in that step In rapid b, high-low temperature chamber high temperature temperature is 90 DEG C, and cryogenic temperature is -40 DEG C, and filters to test is preposition in the high-low temperature chamber Heat preservation 2 hours.
CN201811526017.5A 2018-12-13 2018-12-13 The preparation method and test method of the base station 5G ceramic dielectric waveguide filter Pending CN109336597A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109904581A (en) * 2019-03-22 2019-06-18 泉州佰桀智能制鞋设备研究院有限公司 A kind of base station automation 5G ceramic filter production line
CN110429367A (en) * 2019-08-28 2019-11-08 胡银松 A kind of base station 5G ceramic filter production method
CN110967590A (en) * 2019-12-31 2020-04-07 深圳市麦捷微电子科技股份有限公司 Test method and system for evaluating power tolerance of surface acoustic wave filter
CN113125885A (en) * 2021-04-16 2021-07-16 成都泰格微波技术股份有限公司 Electrical performance testing method for annular filter assembly

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109904581A (en) * 2019-03-22 2019-06-18 泉州佰桀智能制鞋设备研究院有限公司 A kind of base station automation 5G ceramic filter production line
CN110429367A (en) * 2019-08-28 2019-11-08 胡银松 A kind of base station 5G ceramic filter production method
CN110429367B (en) * 2019-08-28 2021-05-14 南京华脉科技股份有限公司 Production method of 5G base station ceramic filter
CN110967590A (en) * 2019-12-31 2020-04-07 深圳市麦捷微电子科技股份有限公司 Test method and system for evaluating power tolerance of surface acoustic wave filter
CN113125885A (en) * 2021-04-16 2021-07-16 成都泰格微波技术股份有限公司 Electrical performance testing method for annular filter assembly

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