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CN109143386B - Metal foreign object detection method for inductive power supply and its power supply module - Google Patents

Metal foreign object detection method for inductive power supply and its power supply module Download PDF

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CN109143386B
CN109143386B CN201810762662.0A CN201810762662A CN109143386B CN 109143386 B CN109143386 B CN 109143386B CN 201810762662 A CN201810762662 A CN 201810762662A CN 109143386 B CN109143386 B CN 109143386B
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蔡明球
詹其哲
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Fu Da Tong Technology Co Ltd
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    • G01V3/101Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices using induction coils by measuring the impedance of the search coil; by measuring features of a resonant circuit comprising the search coil
    • G01V3/102Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices using induction coils by measuring the impedance of the search coil; by measuring features of a resonant circuit comprising the search coil by measuring amplitude

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Abstract

本发明公开了一种金属异物检测方法,用于一感应式电源供应器的一供电模块,该供电模块包括一供电线圈,该金属异物检测方法包括在一测量期间内中断该感应式电源供应器的至少一驱动信号以停止对该供电线圈进行驱动,以产生该供电线圈的一线圈信号;在该线圈信号的连续多个振荡周期内测量该线圈信号的多个波峰,以分别取得多个峰值触发电压;根据该多个峰值触发电压中的一第一峰值触发电压及一第二峰值触发电压,计算一第一衰减参数;以及比较该第一衰减参数与一第一临界值,以判断该感应式电源供应器的一电力发送范围内是否存在金属异物。

Figure 201810762662

The present invention discloses a metal foreign body detection method, which is used for a power supply module of an inductive power supply, and the power supply module includes a power supply coil. The metal foreign body detection method includes interrupting at least one driving signal of the inductive power supply during a measurement period to stop driving the power supply coil to generate a coil signal of the power supply coil; measuring multiple wave peaks of the coil signal during multiple consecutive oscillation cycles of the coil signal to obtain multiple peak trigger voltages respectively; calculating a first attenuation parameter according to a first peak trigger voltage and a second peak trigger voltage among the multiple peak trigger voltages; and comparing the first attenuation parameter with a first critical value to determine whether there is a metal foreign body in a power transmission range of the inductive power supply.

Figure 201810762662

Description

感应式电源供应器的金属异物检测方法及其供电模块Metal foreign object detection method for inductive power supply and its power supply module

技术领域technical field

本发明涉及一种金属异物检测方法,尤其涉及一种可用于感应式电源供应器的金属异物检测方法。The invention relates to a metal foreign body detection method, in particular to a metal foreign body detection method which can be used in an inductive power supply.

背景技术Background technique

在感应式电源供应器中,供电端通过驱动电路推动供电线圈产生谐振,进而发出射频电磁波,再通过受电端的线圈接收电磁波能量后进行电性转换,以产生直流电源提供给受电端装置。供电线圈所发送的电磁能量若施加于金属体上,会对其产生加热效果,累积热量后可能造成金属体高温引起燃烧而发生危害。在现有技术中,感应式电源供应器可在送电过程中周期性地中断驱动以进行金属异物检测,其通过测量斜率的变化来进行判断。然而,供电端线圈所输出的功率会随着供电端与受电端的距离随时调节,例如当线圈距离较远时输出较大功率,当线圈距离较近时输出较小功率。随着输出功率的改变,线圈信号的振幅也发生变化,使得线圈中断驱动时谐振信号衰减的情况也有所不同。因此,当功率发生变化时,供电端需要花费数个侦测周期来调整比较器设定的电压,以追踪信号峰值。若因功率或负载造成线圈电压不稳定的情况下,难以锁定信号峰值以判断衰减斜率。In the inductive power supply, the power supply end drives the power supply coil to resonate through the drive circuit, and then emits radio frequency electromagnetic waves, and then receives the electromagnetic wave energy through the coil of the power receiving end and conducts electrical conversion to generate DC power for the power receiving end device. If the electromagnetic energy sent by the power supply coil is applied to the metal body, it will have a heating effect on it. In the prior art, the inductive power supply can periodically interrupt the driving during the power transmission process for metal foreign object detection, which is determined by measuring the change of the slope. However, the power output by the coil at the power supply end can be adjusted at any time with the distance between the power supply end and the power receiving end. For example, when the coil is far away, the output is larger, and when the coil is closer, the output is smaller. As the output power changes, the amplitude of the coil signal also changes, so that the attenuation of the resonant signal is different when the coil is interrupted to drive. Therefore, when the power changes, the power supply needs to spend several detection cycles to adjust the voltage set by the comparator to track the signal peak value. If the coil voltage is unstable due to power or load, it is difficult to lock the signal peak to determine the attenuation slope.

此外,为了判断衰减斜率,驱动信号需中断一段时间。然而,在无线充电过程中中断驱动信号会降低整体功率输出能力,若中断时间过长,会影响供电效率,且过长的中断时间之后重新接合驱动信号容易产生过大的电磁干扰(Electromagnetic Interference,EMI)。现有技术是通过比较器模块取得多个波峰电压电平来判断线圈信号衰减的多段斜率的变化,因而需要中断较长的时间。以中国专利申请公布号CN 106094041 A为例,其需要7~15个不等的线圈振荡周期来完成四个波峰电压电平的测量以判断衰减斜率的变化。In addition, in order to determine the decay slope, the driving signal needs to be interrupted for a period of time. However, interrupting the driving signal during the wireless charging process will reduce the overall power output capability. If the interruption time is too long, the power supply efficiency will be affected, and reconnecting the driving signal after the long interruption time is likely to cause excessive electromagnetic interference (Electromagnetic Interference, EMI). In the prior art, the comparator module obtains multiple peak voltage levels to determine the change of the multi-segment slope of the coil signal attenuation, so it needs to be interrupted for a long time. Taking Chinese Patent Application Publication No. CN 106094041 A as an example, it takes 7-15 coil oscillation cycles to complete the measurement of four peak voltage levels to determine the change of the attenuation slope.

鉴于此,实有必要提出另一种金属异物检测方法,能够在极短的中断驱动时间内完成检测,同时避免功率或负载变化影响金属异物检测的功效。In view of this, it is necessary to propose another metal foreign object detection method, which can complete the detection in a very short interruption driving time, and at the same time avoid power or load changes to affect the metal foreign object detection efficiency.

发明内容SUMMARY OF THE INVENTION

因此,本发明的主要目的即在于提供一种可在极短的中断驱动时间内完成检测的金属异物检测方法,其最低可在2~3个线圈振荡周期内完成金属异物检测。此外,本发明的金属异物检测方法可通过线圈信号的衰减比例来进行判断,可解决现有技术的衰减斜率判断方式易受到线圈振幅和负载影响的缺点。Therefore, the main purpose of the present invention is to provide a metal foreign object detection method that can complete the detection in an extremely short interruption driving time, and can complete the metal foreign object detection within 2-3 coil oscillation cycles at least. In addition, the metal foreign object detection method of the present invention can be judged by the attenuation ratio of the coil signal, which can solve the disadvantage that the attenuation slope judgment method of the prior art is easily affected by the coil amplitude and load.

本发明公开了一种金属异物检测方法,用于一感应式电源供应器的一供电模块,该供电模块包括一供电线圈,该金属异物检测方法包括在一测量期间内中断该感应式电源供应器的至少一驱动信号以停止对该供电线圈进行驱动,以产生该供电线圈的一线圈信号;在该线圈信号的连续多个振荡周期内测量该线圈信号的多个波峰,以分别取得多个峰值触发电压;根据该多个峰值触发电压中的一第一峰值触发电压及一第二峰值触发电压,计算一第一衰减参数;以及比较该第一衰减参数与一第一临界值,以判断该感应式电源供应器的一电力发送范围内是否存在金属异物。The invention discloses a metal foreign object detection method for a power supply module of an inductive power supply. The power supply module includes a power supply coil, and the metal foreign object detection method includes interrupting the inductive power supply during a measurement period. to stop driving the power supply coil to generate a coil signal of the power supply coil; measure multiple peaks of the coil signal in multiple consecutive oscillation cycles of the coil signal to obtain multiple peaks respectively triggering voltage; calculating a first attenuation parameter according to a first peak triggering voltage and a second peak triggering voltage among the plurality of peak triggering voltages; and comparing the first attenuation parameter and a first threshold to determine the Whether there is a metal foreign object within a power transmission range of the inductive power supply.

本发明还公开了一种用于一感应式电源供应器的供电模块,用来执行一金属异物检测方法,该供电模块包括一供电线圈、一谐振电容、至少一供电驱动单元、一信号接收模块及一处理器。该谐振电容耦接于该供电线圈,用来搭配该供电线圈进行谐振。该至少一供电驱动单元耦接于该供电线圈及该谐振电容,用来发送至少一驱动信号至该供电线圈,以驱动该供电线圈产生能量,并在一测量期间内中断该至少一驱动信号以停止对该供电线圈进行驱动,以产生该供电线圈的一线圈信号。该信号接收模块耦接于该供电线圈,用来接收该供电线圈的该线圈信号。该处理器耦接于该信号接收模块,用来执行以下步骤:在该线圈信号的连续多个振荡周期内测量该线圈信号的多个波峰,以分别取得多个峰值触发电压;根据该多个峰值触发电压中的一第一峰值触发电压及一第二峰值触发电压,计算一第一衰减参数;以及比较该第一衰减参数与一第一临界值,以判断该感应式电源供应器的一电力发送范围内是否存在金属异物。The invention also discloses a power supply module for an inductive power supply, which is used to perform a metal foreign object detection method. The power supply module includes a power supply coil, a resonance capacitor, at least one power supply driving unit, and a signal receiving module. and a processor. The resonant capacitor is coupled to the power supply coil and used for resonating with the power supply coil. The at least one power supply driving unit is coupled to the power supply coil and the resonant capacitor, and is used for sending at least one drive signal to the power supply coil to drive the power supply coil to generate energy, and to interrupt the at least one drive signal during a measurement period to generate energy. Stop driving the power supply coil to generate a coil signal of the power supply coil. The signal receiving module is coupled to the power supply coil for receiving the coil signal of the power supply coil. The processor is coupled to the signal receiving module, and is used for executing the following steps: measuring a plurality of peaks of the coil signal in a plurality of consecutive oscillation periods of the coil signal to obtain a plurality of peak trigger voltages respectively; a first peak trigger voltage and a second peak trigger voltage among the peak trigger voltages to calculate a first attenuation parameter; and compare the first attenuation parameter with a first threshold to determine a Whether there is any metallic foreign object within the power transmission range.

本发明还公开了一种金属异物检测方法,用于一感应式电源供应器的一供电模块,该供电模块包括一供电线圈,该金属异物检测方法包括取得前一测量期间内测量的相对应的一先前峰值触发电压,设定为一参考电压值;在一测量期间内中断该感应式电源供应器的至少一驱动信号以停止对该供电线圈进行驱动,以产生该供电线圈的一线圈信号;在该线圈信号的一振荡周期内测量该线圈信号的一第一波峰,以取得一第一峰值触发电压;比较该第一峰值触发电压与该参考电压值;以及当该第一峰值触发电压等于或接近于该参考电压值时,判断该感应式电源供应器的一电力发送范围内不存在金属异物。The invention also discloses a metal foreign object detection method, which is used for a power supply module of an inductive power supply, the power supply module includes a power supply coil, and the metal foreign object detection method includes obtaining the corresponding measurement in the previous measurement period. A previous peak trigger voltage is set as a reference voltage value; during a measurement period, at least one driving signal of the inductive power supply is interrupted to stop driving the power supply coil, so as to generate a coil signal of the power supply coil; Measure a first peak of the coil signal during an oscillation period of the coil signal to obtain a first peak trigger voltage; compare the first peak trigger voltage with the reference voltage value; and when the first peak trigger voltage is equal to When it is close to the reference voltage value, it is determined that there is no metal foreign object within a power transmission range of the inductive power supply.

附图说明Description of drawings

图1为本发明实施例一感应式电源供应器的示意图。FIG. 1 is a schematic diagram of an inductive power supply according to an embodiment of the present invention.

图2为本发明实施例一金属异物检测流程的示意图。FIG. 2 is a schematic diagram of a metal foreign body detection process according to an embodiment of the present invention.

图3为在一测量期间内停止驱动供电线圈的示意图。FIG. 3 is a schematic diagram of stopping the driving of the power supply coil during a measurement period.

图4~7为本发明实施例在一测量期间内取得峰值触发电压的示意图。4-7 are schematic diagrams of obtaining a peak trigger voltage during a measurement period according to an embodiment of the present invention.

图8为本发明实施例另一金属异物检测流程的示意图。FIG. 8 is a schematic diagram of another metal foreign body detection process according to an embodiment of the present invention.

图9为本发明实施例在一测量期间内通过一峰值触发电压来进行金属异物判别的示意图。FIG. 9 is a schematic diagram of discriminating metal foreign objects by a peak trigger voltage during a measurement period according to an embodiment of the present invention.

其中,附图标记说明如下:Among them, the reference numerals are described as follows:

100 感应式电源供应器100 Inductive Power Supply

1 供电模块1 Power supply module

10 电源供应器10 Power Supply

111 处理器111 processors

112 时钟产生器112 Clock Generator

113 电压产生装置113 Voltage generating devices

114 比较器114 Comparator

120 信号接收模块120 signal receiving module

121、122 供电驱动单元121, 122 Power supply drive unit

130 分压电路130 Voltage divider circuit

131、132 分压电阻131, 132 divider resistor

141、142 谐振电容141, 142 Resonant capacitor

16 供电线圈16 Power supply coil

161、261 磁导体161, 261 Magnetic conductors

D1、D2 驱动信号D1, D2 drive signal

C1 线圈信号C1 coil signal

2 受电模块2 Power receiving module

21 负载单元21 Load cell

22 电容22 Capacitor

230 整流电路230 Rectifier circuit

241、242 谐振电容241, 242 Resonant capacitor

26 受电线圈26 Power receiving coil

3 金属异物3 Metal foreign bodies

20、80 金属异物检测流程20, 80 Metal foreign body detection process

200~222、800~818 步骤200~222, 800~818 steps

CP1 比较结果CP1 Comparison Results

A、B、C、D、E、F 波峰A, B, C, D, E, F peaks

VB、VC、VD、VE、VF 峰值触发电压VB, VC, VD, VE, VF Peak trigger voltage

V0_B、V0_C、V0_D、V0_E、V0_F 触发起始电位V0_B, V0_C, V0_D, V0_E, V0_F Trigger start potential

PAR1 第一衰减参数PAR1 first decay parameter

PAR2 第二衰减参数PAR2 Second attenuation parameter

PAR3 第三衰减参数PAR3 third attenuation parameter

PAR4 第四衰减参数PAR4 Fourth attenuation parameter

TH1 第一临界值TH1 first threshold

TH2 第二临界值TH2 second threshold

TH3 第三临界值TH3 third threshold

THO 基础临界值THO base threshold

具体实施方式Detailed ways

请参考图1,图1为本发明实施例一感应式电源供应器100的示意图。如图1所示,感应式电源供应器100包括一供电模块1及一受电模块2。供电模块1可接收来自于一电源供应器10的电源,并输出无线电力至受电模块2。供电模块1包括一供电线圈16及谐振电容141、142,以C-L-C的结构设置。其中,供电线圈16可用来发送电磁能量至受电模块2以进行供电,谐振电容141及142分别耦接于供电线圈16两端,在供电时可用来搭配供电线圈16进行谐振。此外,在供电模块1中,可选择性地采用磁性材料所构成的一磁导体161,用来提升供电线圈16的电磁感应能力,同时避免电磁能量影响线圈非感应面方向的物体。Please refer to FIG. 1 , which is a schematic diagram of an inductive power supply 100 according to an embodiment of the present invention. As shown in FIG. 1 , the inductive power supply 100 includes a power supply module 1 and a power receiving module 2 . The power supply module 1 can receive power from a power supply 10 and output wireless power to the power receiving module 2 . The power supply module 1 includes a power supply coil 16 and resonant capacitors 141 and 142, which are arranged in a C-L-C structure. The power supply coil 16 can be used to transmit electromagnetic energy to the power receiving module 2 for power supply, and the resonant capacitors 141 and 142 are respectively coupled to both ends of the power supply coil 16 and can be used to resonate with the power supply coil 16 during power supply. In addition, in the power supply module 1 , a magnetic conductor 161 made of magnetic material can be selectively used to improve the electromagnetic induction capability of the power supply coil 16 and prevent electromagnetic energy from affecting objects in the direction of the non-inductive surface of the coil.

为控制供电线圈16及谐振电容141、142的运作,供电模块1还包括一处理器111、一时钟产生器112、供电驱动单元121及122、一信号接收模块120及一分压电路130。供电驱动单元121及122耦接于供电线圈16及谐振电容141及142,可分别发送驱动信号D1及D2至供电线圈16,其可接收处理器111的控制,用以驱动供电线圈16产生并发送能量。供电驱动单元121及122两者同时运作时,可进行全桥驱动。在部分实施例中,也可仅开启供电驱动单元121及122其中一者,或是仅布置一个供电驱动单元121或122,以进行半桥驱动。时钟产生器112耦接于供电驱动单元121及122,可用来控制供电驱动单元121及122发送驱动信号D1及D2。时钟产生器112可以是一脉冲宽度调变产生器(Pulse Width Modulation generator,PWM generator)或其它类型的时钟产生器,用来输出一时钟信号至供电驱动单元121及122。处理器111可接收供电线圈16上的线圈信号C1(即供电线圈16及谐振电容142之间的电压信号)的相关信息,如线圈信号C1的谐振频率或衰减幅度等,并据此判别金属异物是否存在。处理器111可以是一中央处理器(Central Processing Unit,CPU)、一微处理器(microprocessor)、一单片机(Micro Controller Unit,MCU)、或其它类型的处理装置或运算装置。信号接收模块120可用来追踪线圈信号C1的谐振频率及峰值大小,并将谐振频率及峰值的相关信息提供给处理器111以进行后续判读。分压电路130包括分压电阻131及132,其可对供电线圈16上的线圈信号C1进行衰减之后,将其输出至处理器111及信号接收模块120。在部分实施例中,若处理器111及信号接收模块120等电路具有足够的耐压,也可不采用分压电路130,直接由处理器111接收供电线圈16上的线圈信号C1。至于其他可能的组成组件或模块,如供电单元、显示单元等,可视系统需求而增加或减少,故在不影响本实施例的说明下,略而未示。In order to control the operation of the power supply coil 16 and the resonant capacitors 141 and 142 , the power supply module 1 further includes a processor 111 , a clock generator 112 , power supply driving units 121 and 122 , a signal receiving module 120 and a voltage dividing circuit 130 . The power supply driving units 121 and 122 are coupled to the power supply coil 16 and the resonant capacitors 141 and 142, and can respectively send drive signals D1 and D2 to the power supply coil 16, which can receive the control of the processor 111 to drive the power supply coil 16 to generate and transmit energy. When both the power supply driving units 121 and 122 operate at the same time, full-bridge driving can be performed. In some embodiments, only one of the power supply driving units 121 and 122 may be turned on, or only one power supply driving unit 121 or 122 may be arranged to perform half-bridge driving. The clock generator 112 is coupled to the power supply driving units 121 and 122, and can be used to control the power supply driving units 121 and 122 to send the driving signals D1 and D2. The clock generator 112 may be a pulse width modulation generator (PWM generator) or other types of clock generators, and is used for outputting a clock signal to the power supply driving units 121 and 122 . The processor 111 can receive the relevant information of the coil signal C1 on the power supply coil 16 (that is, the voltage signal between the power supply coil 16 and the resonant capacitor 142 ), such as the resonant frequency or attenuation amplitude of the coil signal C1, and determine the metal foreign body accordingly. does it exist. The processor 111 may be a central processing unit (Central Processing Unit, CPU), a microprocessor (microprocessor), a microcontroller unit (Micro Controller Unit, MCU), or other types of processing devices or computing devices. The signal receiving module 120 can be used to track the resonance frequency and the peak value of the coil signal C1, and provide the relevant information of the resonance frequency and the peak value to the processor 111 for subsequent interpretation. The voltage dividing circuit 130 includes voltage dividing resistors 131 and 132 , which can attenuate the coil signal C1 on the power supply coil 16 and then output it to the processor 111 and the signal receiving module 120 . In some embodiments, if circuits such as the processor 111 and the signal receiving module 120 have sufficient withstand voltage, the voltage divider circuit 130 may not be used, and the processor 111 directly receives the coil signal C1 on the power supply coil 16 . As for other possible components or modules, such as a power supply unit, a display unit, etc., which may be increased or decreased depending on the system requirements, they are omitted and not shown without affecting the description of this embodiment.

在一实施例中,信号接收模块120包括一电压产生装置113及一比较器114,如图1所示。电压产生装置113可以是一数字模拟转换器(Digital to Analog Converter,DAC),其可接收来自于处理器111的一参考电压信息,将其转换为模拟电压并加以输出。比较器114的一输入端可接收参考电压,另一输入端则接收来自于供电线圈16的线圈信号C1,其可比较线圈信号C1与参考电压,处理器111再根据上述比较的结果进行后续判断及信号处理。需注意的是,信号接收模块120也可整合在处理器111内部,而不限于此。In one embodiment, the signal receiving module 120 includes a voltage generating device 113 and a comparator 114 , as shown in FIG. 1 . The voltage generating device 113 can be a digital to analog converter (DAC), which can receive a reference voltage information from the processor 111, convert it into an analog voltage and output it. One input end of the comparator 114 can receive the reference voltage, and the other input end can receive the coil signal C1 from the power supply coil 16 , which can compare the coil signal C1 with the reference voltage, and the processor 111 makes subsequent judgments according to the result of the above comparison and signal processing. It should be noted that, the signal receiving module 120 can also be integrated inside the processor 111, but is not limited to this.

请继续参考图1。受电模块2包括一负载单元21、一电容22、一整流电路230、一受电线圈26及谐振电容241、242。在受电模块2中,也可选择性地采用磁性材料所构成的一磁导体261,以提升受电线圈26的电磁感应能力,同时避免电磁能量影响线圈非感应面方向的物体。受电线圈26可用来接收供电线圈16的供电,并将接收到的电力传送至整流电路230以进行整流,完成整流之后再传送至后端的电容22及负载单元21。电容22可以是用来进行滤波的滤波电容或用于稳定输出电压的稳压电容,且不应以此为限。在受电模块2中,其他可能的组成组件或模块,如信号反馈电路、受电微处理器等,可视系统需求而增加或减少,故在不影响本实施例的说明下,略而未示。Please continue to refer to Figure 1. The power receiving module 2 includes a load unit 21 , a capacitor 22 , a rectifier circuit 230 , a power receiving coil 26 and resonance capacitors 241 and 242 . In the power receiving module 2, a magnetic conductor 261 made of magnetic material can also be selectively used to improve the electromagnetic induction capability of the power receiving coil 26, and at the same time prevent electromagnetic energy from affecting objects in the direction of the non-inductive surface of the coil. The power receiving coil 26 can be used to receive power from the power supply coil 16 and transmit the received power to the rectifier circuit 230 for rectification. The capacitor 22 can be a filter capacitor for filtering or a voltage-stabilizing capacitor for stabilizing the output voltage, and should not be limited thereto. In the power receiving module 2, other possible components or modules, such as a signal feedback circuit, a power receiving microprocessor, etc., can be increased or decreased depending on the system requirements, so they are omitted and omitted without affecting the description of this embodiment. Show.

此外,一金属异物3未包含在感应式电源供应器100内,但示于图1中的供电模块1及受电模块2之间以方便说明。当金属异物3位于感应式电源供应器100的电力发送范围内时,可能会接收到供电模块1发送的电磁能量而发热。本发明的金属异物检测方法即可用来判断感应式电源供应器100的电力发送范围内是否存在金属异物3,并在判断金属异物3存在时停止送电。In addition, a metal foreign object 3 is not included in the inductive power supply 100, but is shown between the power supply module 1 and the power reception module 2 in FIG. 1 for convenience of description. When the metal foreign object 3 is located within the power transmission range of the inductive power supply 100 , it may receive the electromagnetic energy sent by the power supply module 1 and generate heat. The metal foreign object detection method of the present invention can be used to determine whether there is a metal foreign object 3 within the power transmission range of the inductive power supply 100 , and stop power transmission when it is determined that the metal foreign object 3 exists.

不同于现有技术中供电模块通过测量线圈衰减斜率的变化来判断金属异物,本发明通过测量线圈信号的电压衰减比例来进行金属异物的判断。请参考图2,图2为本发明实施例的一金属异物检测流程20的示意图。如图2所示,金属异物检测流程20可用于一感应式电源供应器的供电端(如图1的感应式电源供应器100的供电模块1),其包括以下步骤:Different from the prior art, the power supply module judges the metal foreign body by measuring the change of the coil attenuation slope, the present invention judges the metal foreign body by measuring the voltage attenuation ratio of the coil signal. Please refer to FIG. 2 . FIG. 2 is a schematic diagram of a metal foreign object detection process 20 according to an embodiment of the present invention. As shown in FIG. 2 , the metal foreign object detection process 20 can be used for the power supply end of an inductive power supply (such as the power supply module 1 of the inductive power supply 100 in FIG. 1 ), which includes the following steps:

步骤200:开始。Step 200: Start.

步骤202:在一测量期间内中断感应式电源供应器100的驱动信号D1及D2以停止对供电线圈16进行驱动,以产生供电线圈16的一线圈信号C1。Step 202 : Interrupt the driving signals D1 and D2 of the inductive power supply 100 during a measurement period to stop driving the power supply coil 16 to generate a coil signal C1 of the power supply coil 16 .

步骤204:在线圈信号C1的连续两个振荡周期内测量线圈信号C1的两个波峰,以分别取得两个峰值触发电压。Step 204 : Measure two peaks of the coil signal C1 in two consecutive oscillation periods of the coil signal C1 to obtain two peak trigger voltages respectively.

步骤206:根据两个峰值触发电压,计算一衰减参数。Step 206: Calculate an attenuation parameter according to the two peak trigger voltages.

步骤208:比较衰减参数与其对应的一临界值,并判断衰减参数是否大于临界值。若是,则执行步骤216;若否,则执行步骤210。Step 208 : Compare the attenuation parameter with a corresponding threshold value, and determine whether the attenuation parameter is greater than the threshold value. If yes, go to step 216; if not, go to step 210.

步骤210:判断所测量的振荡周期数量是否到达预定数量。若是,则执行步骤216;若否,则执行步骤212。Step 210: Determine whether the measured number of oscillation cycles reaches a predetermined number. If yes, go to step 216; if not, go to step 212.

步骤212:在线圈信号C1的下一振荡周期内测量线圈信号C1波峰,以取得一峰值触发电压。Step 212 : Measure the peak value of the coil signal C1 in the next oscillation period of the coil signal C1 to obtain a peak trigger voltage.

步骤214:根据该峰值触发电压与前一振荡周期内取得的峰值触发电压,计算一衰减参数。Step 214: Calculate an attenuation parameter according to the peak trigger voltage and the peak trigger voltage obtained in the previous oscillation period.

步骤216:对所取得的衰减参数进行平均而产生一平均结果,并比较平均结果与一基础临界值,以判断平均结果是否大于基础临界值。若是,则执行步骤218;若否,则执行步骤220。Step 216 : Averaging the obtained attenuation parameters to generate an average result, and comparing the average result with a basic threshold to determine whether the average result is greater than the basic threshold. If yes, go to step 218; if not, go to step 220.

步骤218:判断感应式电源供应器100的电力发送范围内不存在金属异物3。Step 218 : Determine that there is no metal foreign object 3 within the power transmission range of the inductive power supply 100 .

步骤220:判断感应式电源供应器100的电力发送范围内存在金属异物3。Step 220 : It is determined that there is a metal foreign object 3 within the power transmission range of the inductive power supply 100 .

步骤222:结束。Step 222: End.

根据金属异物检测流程20,在感应式电源供应器100的供电模块1中,驱动信号D1及D2在驱动过程中会中断一段时间,此时,供电驱动单元121及122会停止对供电线圈16进行驱动。当供电线圈16停止驱动时,因供电线圈16与谐振电容141及142之间仍存在能量,线圈信号C1会继续振荡并逐渐衰减。如图3所示,当停止驱动时,驱动信号D1及D2分别停留在高电位及低电位一段时间,此时线圈信号C1呈现振荡并逐渐衰减的波形,随后供电驱动单元121及122重新接合,以输出方波驱动信号D1及D2并再次驱动供电线圈16输出电力。在其它实施例中,也可控制驱动信号D1及D2同时停留在高电位或同时停留在低电位以停止驱动,而不限于此。上述驱动信号D1及D2中断的期间是用来测量线圈信号C1谐振以进行金属异物3检测,下文称之为测量期间以方便说明。According to the metal foreign object detection process 20 , in the power supply module 1 of the inductive power supply 100 , the driving signals D1 and D2 will be interrupted for a period of time during the driving process. At this time, the power supply driving units 121 and 122 will stop the power supply coil 16 drive. When the power supply coil 16 stops driving, since there is still energy between the power supply coil 16 and the resonance capacitors 141 and 142 , the coil signal C1 will continue to oscillate and gradually attenuate. As shown in FIG. 3 , when the driving is stopped, the driving signals D1 and D2 stay at a high potential and a low potential for a period of time, respectively. At this time, the coil signal C1 exhibits an oscillating and gradually attenuating waveform, and then the power supply and driving units 121 and 122 are reconnected. The power supply coil 16 is driven again to output electric power by outputting the square wave driving signals D1 and D2. In other embodiments, the driving signals D1 and D2 can also be controlled to stay at a high level or at a low level at the same time to stop driving, but not limited to this. The above-mentioned interruption period of the driving signals D1 and D2 is used to measure the resonance of the coil signal C1 to detect the metal foreign object 3 , which is hereinafter referred to as the measurement period for convenience of description.

在测量期间内,线圈信号C1上存在连续多个振荡周期,处理器111可在多个振荡周期内测量线圈信号C1的波峰,以分别取得多个峰值触发电压。请参考图4,图4为本发明实施例在一测量期间内取得峰值触发电压VB及VC的示意图。如图4所示,测量期间内线圈信号C1包括三个波峰A、B及C。由于第一个波峰A发生在驱动信号D1及D2刚停止驱动的时间,波峰A的信号振荡仍可能受到驱动信号D1及D2的影响而非供电线圈16本身的自然振荡,因此,波峰A的峰值高度可能尚未到达自然振荡的高度。在此情形下,为避免金属异物3的判断受驱动信号D1及D2影响而失真,可舍弃波峰A的峰值触发电压测量,仅测量波峰B及C的峰值触发电压VB及VC。During the measurement period, there are multiple consecutive oscillation periods on the coil signal C1, and the processor 111 can measure the peaks of the coil signal C1 in the multiple oscillation periods to obtain multiple peak trigger voltages respectively. Please refer to FIG. 4 . FIG. 4 is a schematic diagram of obtaining peak trigger voltages VB and VC during a measurement period according to an embodiment of the present invention. As shown in FIG. 4 , the coil signal C1 includes three peaks A, B and C during the measurement period. Since the first peak A occurs when the driving signals D1 and D2 just stop driving, the signal oscillation of the peak A may still be affected by the driving signals D1 and D2 rather than the natural oscillation of the power supply coil 16 itself. Therefore, the peak value of the peak A is The height may not have reached the height of natural oscillation. In this case, in order to avoid the distortion of the determination of the metal foreign object 3 due to the influence of the driving signals D1 and D2, the peak trigger voltage measurement of the peak A can be discarded, and only the peak trigger voltages VB and VC of the peaks B and C can be measured.

在欲测量波峰的振荡周期中,处理器111可设定一参考电压(以虚线示于图4中),并通过电压产生装置113输出参考电压至比较器114,由比较器114比较参考电压与线圈信号C1而产生一比较结果CP1。详细来说,在进入波峰B对应的振荡周期之前,处理器111可先将参考电压设定于一触发起始电位V0_B。接着,当线圈信号C1的电平上升至超过参考电压,使比较器114的输出端出现一触发信号(即比较结果CP1出现高电位)之后,处理器111可控制参考电压逐渐上升。当参考电压上升至超过线圈信号C1的电平时,可判断触发信号结束(即比较结果CP1回到低电位),此时,处理器111可取得参考电压的电平作为对应于波峰B的峰值触发电压VB。同样地,在波峰C对应的振荡周期中,处理器111可先将参考电压设定于一触发起始电位V0_C,进而依照相同方式取得对应于波峰C的峰值触发电压VC。During the oscillation period in which the wave peak is to be measured, the processor 111 can set a reference voltage (shown in dotted lines in FIG. 4 ), and output the reference voltage to the comparator 114 through the voltage generating device 113 , and the comparator 114 compares the reference voltage with the reference voltage. The coil signal C1 generates a comparison result CP1. Specifically, before entering the oscillation period corresponding to the peak B, the processor 111 may first set the reference voltage to a trigger start potential V0_B. Then, when the level of the coil signal C1 rises to exceed the reference voltage and a trigger signal appears at the output of the comparator 114 (ie, the comparison result CP1 shows a high level), the processor 111 can control the reference voltage to gradually increase. When the reference voltage rises to exceed the level of the coil signal C1, it can be determined that the trigger signal ends (that is, the comparison result CP1 returns to a low level). At this time, the processor 111 can obtain the level of the reference voltage as the peak trigger corresponding to the peak B voltage VB. Similarly, in the oscillation period corresponding to the peak C, the processor 111 may first set the reference voltage to a trigger start potential V0_C, and then obtain the peak trigger voltage VC corresponding to the peak C in the same manner.

接着,处理器111可根据峰值触发电压VB及峰值触发电压VC,计算一第一衰减参数PAR1。详细来说,第一衰减参数PAR1可以是峰值触发电压VB及峰值触发电压VC的平均值相对于峰值触发电压VB及峰值触发电压VC的差值的比例。在一实施例中,可计算峰值触发电压VB与峰值触发电压VC相加的结果除以峰值触发电压VB与峰值触发电压VC相减的结果而得到第一衰减参数PAR1,其详细计算方式如下:Next, the processor 111 can calculate a first attenuation parameter PAR1 according to the peak trigger voltage VB and the peak trigger voltage VC. In detail, the first attenuation parameter PAR1 may be a ratio of the average value of the peak trigger voltage VB and the peak trigger voltage VC to the difference between the peak trigger voltage VB and the peak trigger voltage VC. In one embodiment, the first attenuation parameter PAR1 can be obtained by dividing the result of the addition of the peak trigger voltage VB and the peak trigger voltage VC by the result of the subtraction of the peak trigger voltage VB and the peak trigger voltage VC. The detailed calculation method is as follows:

Figure BDA0001728187680000091
Figure BDA0001728187680000091

值得注意的是,中国专利申请公布号CN 106094041 A是通过衰减斜率的变化来判断金属异物,即衰减量的变化。然而,在无金属异物存在的情形下,当输出功率较高(即线圈信号C1振幅较大)时,线圈中断驱动后的衰减量较大;当输出功率较低(即线圈信号C1振幅较小)时,线圈中断驱动后的衰减量较小。即,衰减量与输出功率的比例会大致相同。举例来说,在无金属异物存在的情形下,若峰值触发电压VB为100单位电压时,峰值触发电压VC约为90单位电压;若峰值触发电压VB为50单位电压时,峰值触发电压VC约为45单位电压,两者具有不同的峰值衰减量。因此,本发明采用峰值触发电压的平均值或总和相对于峰值触发电压的差值(即衰减量)的比例来计算衰减参数,可排除不同输出功率对线圈信号衰减的影响,进而达到更有效的金属异物判断。在此例中,衰减参数愈大代表信号衰减速度愈慢,即金属异物存在的可能性愈低;衰减参数愈小代表信号衰减速度愈快,即金属异物存在的可能性愈高。It is worth noting that the Chinese Patent Application Publication No. CN 106094041 A uses the change of the attenuation slope to determine the metal foreign matter, that is, the change of the attenuation amount. However, in the absence of metal foreign matter, when the output power is high (that is, the coil signal C1 has a large amplitude), the attenuation after the coil is interrupted and driven is large; when the output power is low (that is, the coil signal C1 has a small amplitude) ), the attenuation after the coil is interrupted and driven is small. That is, the ratio of attenuation to output power will be approximately the same. For example, in the absence of metal foreign matter, if the peak trigger voltage VB is 100 units, the peak trigger voltage VC is about 90 units; if the peak trigger voltage VB is 50 units, the peak trigger voltage VC is about 50 units. is 45 units of voltage, the two have different amounts of peak attenuation. Therefore, the present invention uses the ratio of the average value or sum of the peak trigger voltage to the difference (that is, the attenuation) of the peak trigger voltage to calculate the attenuation parameter, which can exclude the influence of different output powers on the attenuation of the coil signal, thereby achieving a more effective Metal foreign body judgment. In this example, the larger the attenuation parameter is, the slower the signal attenuation speed is, that is, the lower the possibility of the existence of metal foreign objects; the smaller the attenuation parameter, the faster the signal attenuation speed is, that is, the higher the possibility of the existence of metal foreign objects.

另外需注意的是,上述峰值触发电压往往不等于相对应波峰的峰值电压,实际上,峰值触发电压略低于相对应波峰的峰值电压。由图4可知,峰值触发电压VB接近并略低于波峰B的峰值电压,峰值触发电压VC接近并略低于波峰C的峰值电压。由于触发起始电位V0_B及V0_C可分别设定于略低于波峰B及波峰C的电压电平,因此,上升后的参考电压和线圈信号C1在波峰右侧交叉,使得根据参考电压所取得的峰值触发电压VB及VC也略低于并接近其相对应的峰值电压。此外,由上述衰减参数的计算方式可知,衰减参数的大小主要受到衰减比例的影响,因此,采用数值略低于峰值电压的峰值触发电压作为计算基准,所取得的金属异物判断结果仍大致相同于依据峰值电压取得的判断结果。只要衰减参数能够反映衰减量或衰减比例,即可用来进行金属异物的判别。In addition, it should be noted that the above-mentioned peak trigger voltage is often not equal to the peak voltage of the corresponding peak. In fact, the peak trigger voltage is slightly lower than the peak voltage of the corresponding peak. It can be seen from FIG. 4 that the peak trigger voltage VB is close to and slightly lower than the peak voltage of peak B, and the peak trigger voltage VC is close to and slightly lower than the peak voltage of peak C. Since the trigger start potentials V0_B and V0_C can be set at a voltage level slightly lower than that of the peak B and the peak C, respectively, the rising reference voltage and the coil signal C1 cross on the right side of the peak, so that the obtained value according to the reference voltage The peak trigger voltages VB and VC are also slightly lower than and close to their corresponding peak voltages. In addition, it can be seen from the above calculation method of the attenuation parameter that the size of the attenuation parameter is mainly affected by the attenuation ratio. Therefore, using the peak trigger voltage with a value slightly lower than the peak voltage as the calculation reference, the obtained metal foreign matter judgment results are still roughly the same as Judgment result based on peak voltage. As long as the attenuation parameter can reflect the attenuation amount or attenuation ratio, it can be used to discriminate metal foreign objects.

如上所述,第一衰减参数PAR1等于峰值触发电压VB与峰值触发电压VC相加的结果除以峰值触发电压VB与峰值触发电压VC相减的结果。在取得第一衰减参数PAR1之后,处理器111可设定一第一临界值TH1,并比较第一衰减参数PAR1与第一临界值TH1以判断感应式电源供应器100的一电力发送范围内是否存在金属异物3。在一实施例中,当第一衰减参数PAR1大于第一临界值TH1时,可判断感应式电源供应器100的电力发送范围内不存在金属异物3;当第一衰减参数PAR1小于第一临界值TH1时,则进一步进行后续判别。在感应式电源供应系统中,电源或负载端往往存在大量噪声,容易干扰线圈信号的分析和检测,因此,为准确判别金属异物,需要连续取得多次判断为金属异物的数据或结果,以避免噪声干扰造成金属异物误判,使得电源输出错误地被关闭。As mentioned above, the first attenuation parameter PAR1 is equal to the result of adding the peak trigger voltage VB and the peak trigger voltage VC divided by the result of the subtraction of the peak trigger voltage VB and the peak trigger voltage VC. After obtaining the first attenuation parameter PAR1, the processor 111 may set a first threshold value TH1, and compare the first attenuation parameter PAR1 with the first threshold value TH1 to determine whether the inductive power supply 100 is within a power transmission range Metal foreign body 3 is present. In one embodiment, when the first attenuation parameter PAR1 is greater than the first threshold value TH1, it can be determined that there is no metal foreign object 3 within the power transmission range of the inductive power supply 100; when the first attenuation parameter PAR1 is less than the first threshold value When TH1, further follow-up judgment is performed. In an inductive power supply system, there is often a lot of noise at the power supply or load end, which is easy to interfere with the analysis and detection of the coil signal. Therefore, in order to accurately identify metal foreign objects, it is necessary to continuously obtain data or results that are judged as metal foreign objects for many times to avoid Noise interference causes misjudgment of metal foreign objects, so that the power output is erroneously turned off.

在一实施例中,处理器111可设定一基础临界值THO。在感应式电源供应器的产品测试过程中,不同产品和不同环境可能存在衰减参数的变异性,可依据不存在金属异物之下测量到的最低衰减参数来设定基础临界值THO。优选地,基础临界值THO可设定为较低的数值,其具有较宽松的判别基准,以避免噪声干扰被误判为金属异物存在。接着,处理器111可将基础临界值THO分别加上不同数值而得到多个临界值,如第一临界值TH1、第二临界值TH2、第三临界值TH3等。处理器111可将一测量期间内取得的第一衰减参数PAR1、第二衰减参数PAR2、第三衰减参数PAR3及第四衰减参数PAR4分别和第一临界值TH1、第二临界值TH2、第三临界值TH3及基础临界值THO进行比较,以进行金属异物3的判别。举例来说,处理器可设定基础临界值THO为150,并将第一临界值TH1设定为基础临界值TH0=150加上30,即180;第二临界值TH2设定为基础临界值THO=150加上20,即170;第三临界值TH3设定为基础临界值TH0=150加上10,即160。其中,第一临界值TH1大于第二临界值TH2,且第二临界值TH2大于第三临界值TH3。In one embodiment, the processor 111 may set a basic threshold THO. During the product testing process of the inductive power supply, there may be variability in attenuation parameters between different products and different environments. The basic threshold THO can be set according to the lowest attenuation parameter measured without metal foreign matter. Preferably, the basic threshold value THO can be set to a relatively low value, which has a relatively loose judgment criterion, so as to avoid noise interference from being misjudged as the presence of metal foreign objects. Next, the processor 111 may add different values to the basic threshold value THO to obtain a plurality of threshold values, such as the first threshold value TH1 , the second threshold value TH2 , and the third threshold value TH3 . The processor 111 can compare the first attenuation parameter PAR1, the second attenuation parameter PAR2, the third attenuation parameter PAR3 and the fourth attenuation parameter PAR4 obtained in a measurement period with the first threshold TH1, the second threshold TH2, the third threshold The threshold value TH3 and the basic threshold value THO are compared to determine the metal foreign matter 3 . For example, the processor can set the basic threshold value THO to 150, and set the first threshold value TH1 to the basic threshold value TH0 = 150 plus 30, that is, 180; and set the second threshold value TH2 to the basic threshold value THO=150 plus 20, that is, 170; the third threshold TH3 is set as the basic threshold TH0=150 plus 10, that is, 160. The first threshold TH1 is greater than the second threshold TH2, and the second threshold TH2 is greater than the third threshold TH3.

首先,处理器111比较第一衰减参数PAR1与第一临界值TH1。在一实施例中(如表一所示),处理器111可取得峰值触发电压VB为1000单位电压以及峰值触发电压VC为990单位电压,经计算后得到第一衰减参数PAR1为199。由于第一衰减参数PAR1=199大于第一临界值TH1=180,代表其远大于基础临界值THO,因此,处理器111直接判定金属异物3不存在。First, the processor 111 compares the first attenuation parameter PAR1 with the first threshold TH1. In an embodiment (as shown in Table 1), the processor 111 can obtain that the peak trigger voltage VB is 1000 unit voltage and the peak trigger voltage VC is 990 unit voltage, and the first attenuation parameter PAR1 is 199 after calculation. Since the first attenuation parameter PAR1=199 is greater than the first threshold value TH1=180, which means that it is much larger than the basic threshold value THO, the processor 111 directly determines that the foreign metal object 3 does not exist.

波峰/振荡周期crest/oscillation period BB CC ×× ×× ×× 峰值触发电压Peak trigger voltage 10001000 990990 ×× ×× ×× 衰减参数Attenuation parameter 199199 ×× ×× ×× 临界值critical value 180180 170170 160160 150150

表一Table I

在此例中,第一衰减参数PAR1大于第一临界值TH1且远大于基础临界值THO,表示金属异物3存在的机率极低,属于非常安全的状态,因而系统直接判定为金属异物3不存在。在此情形下,处理器111只需要测量2个振荡周期即可完成金属异物3的判别。换言之,在驱动信号D1及D2中断的测量期间内只需包括3个振荡周期,其中,对应于波峰A的振荡周期不进行测量,在对应于波峰B及C的振荡周期内完成测量并取得第一衰减参数PAR1之后,即可完成金属异物3的判别。In this example, the first attenuation parameter PAR1 is greater than the first threshold value TH1 and much greater than the basic threshold value THO, indicating that the probability of the existence of the metal foreign body 3 is extremely low, which is a very safe state, so the system directly determines that the metal foreign body 3 does not exist. . In this case, the processor 111 only needs to measure two oscillation periods to complete the identification of the metal foreign object 3 . In other words, the measurement period in which the driving signals D1 and D2 are interrupted only needs to include 3 oscillation periods, wherein the oscillation period corresponding to the peak A is not measured, and the measurement is completed within the oscillation period corresponding to the peaks B and C, and the first oscillation period is obtained. After the attenuation parameter PAR1, the identification of the metal foreign object 3 can be completed.

在一实施例中,第一衰减参数PAR1小于第一临界值TH1,此时处理器111进一步执行后续金属异物3的判别,如表二所示。In one embodiment, the first attenuation parameter PAR1 is smaller than the first threshold value TH1 , and at this time, the processor 111 further performs the subsequent determination of the metal foreign object 3 , as shown in Table 2.

波峰/振荡周期crest/oscillation period BB CC DD ×× ×× 峰值触发电压Peak trigger voltage 10001000 988988 977977 ×× ×× 衰减参数Attenuation parameter 166166 179179 ×× ×× 临界值critical value 180180 170170 160160 150150

表二Table II

详细来说,处理器111先比较第一衰减参数PAR1与第一临界值TH1。当判断第一衰减参数PAR1=166小于第一临界值TH1=180之后,处理器111可测量线圈信号C1的下一振荡周期(对应于波峰D的振荡周期)。如图5所示,在波峰D的振荡周期中,处理器111可先将参考电压设定于一触发起始电位V0_D,并依照上述方式取得对应于波峰D的峰值触发电压VD。接着,处理器111可根据峰值触发电压VC及峰值触发电压VD,计算一第二衰减参数PAR2。详细来说,处理器111可计算峰值触发电压VC与峰值触发电压VD相加的结果除以峰值触发电压VC与峰值触发电压VD相减的结果而得到第二衰减参数PAR2,其详细计算方式如下:Specifically, the processor 111 first compares the first attenuation parameter PAR1 with the first threshold TH1. After determining that the first attenuation parameter PAR1=166 is smaller than the first threshold value TH1=180, the processor 111 may measure the next oscillation period of the coil signal C1 (corresponding to the oscillation period of the peak D). As shown in FIG. 5 , in the oscillation period of the peak D, the processor 111 may first set the reference voltage to a trigger start potential V0_D, and obtain the peak trigger voltage VD corresponding to the peak D according to the above method. Next, the processor 111 can calculate a second attenuation parameter PAR2 according to the peak trigger voltage VC and the peak trigger voltage VD. In detail, the processor 111 can calculate the result of adding the peak trigger voltage VC and the peak trigger voltage VD divided by the result of subtracting the peak trigger voltage VC and the peak trigger voltage VD to obtain the second attenuation parameter PAR2. The detailed calculation method is as follows. :

Figure BDA0001728187680000121
Figure BDA0001728187680000121

在此例中,峰值触发电压VC为988单位电压且峰值触发电压VD为977单位电压,经计算后得到第二衰减参数PAR2为179(小数点后四舍五入)。接着,处理器111将第二衰减参数PAR2和第二临界值TH2进行比较,并判断第二衰减参数PAR2=179大于第二临界值TH2=170。在此情形下,处理器111在此测量期间内停止测量后续振荡周期,同时对所取得的第一衰减参数PAR1及第二衰减参数PAR2进行平均,并将上述平均结果与基础临界值THO进行比较,以进行金属异物3的判别。在此例中,第一衰减参数PAR1及第二衰减参数PAR2的平均值大于基础临界值THO,因此处理器111判断感应式电源供应器100的电力发送范围内不存在金属异物3。In this example, the peak trigger voltage VC is 988 unit voltages and the peak trigger voltage VD is 977 unit voltages. After calculation, the second attenuation parameter PAR2 is 179 (rounded off after the decimal point). Next, the processor 111 compares the second attenuation parameter PAR2 with the second threshold value TH2, and determines that the second attenuation parameter PAR2=179 is greater than the second threshold value TH2=170. In this case, the processor 111 stops measuring the subsequent oscillation period during the measurement period, and at the same time averages the obtained first attenuation parameter PAR1 and the second attenuation parameter PAR2, and compares the above-mentioned average result with the basic threshold THO , in order to discriminate metal foreign objects 3. In this example, the average value of the first attenuation parameter PAR1 and the second attenuation parameter PAR2 is greater than the basic threshold THO, so the processor 111 determines that there is no metal foreign object 3 within the power transmission range of the inductive power supply 100 .

在另一实施例中,第二衰减参数PAR2也可能小于第二临界值TH2,此时处理器111进一步执行后续金属异物3的判别,如表三所示。In another embodiment, the second attenuation parameter PAR2 may also be smaller than the second threshold value TH2. At this time, the processor 111 further performs the subsequent determination of the metal foreign object 3, as shown in Table 3.

波峰/振荡周期crest/oscillation period BB CC DD EE ×× 峰值触发电压Peak trigger voltage 10001000 986986 974974 962962 ×× 衰减参数Attenuation parameter 142142 163163 161161 ×× 临界值critical value 180180 170170 160160 150150

表三Table 3

详细来说,处理器111先比较第一衰减参数PAR1与第一临界值TH1。当判断第一衰减参数PAR1=142小于第一临界值TH1=180之后,处理器111可测量线圈信号C1的下一振荡周期(对应于波峰D的振荡周期)以取得第二衰减参数PAR2,并比较第二衰减参数PAR2与第二临界值TH2。接着,当判断第二衰减参数PAR2=163小于第二临界值TH2=170之后,处理器111可测量线圈信号C1的下一振荡周期(对应于波峰E的振荡周期)。如图6所示,在波峰E的振荡周期中,处理器111可先将参考电压设定于一触发起始电位V0_E,并依照上述方式取得对应于波峰E的峰值触发电压VE。接着,处理器111可根据峰值触发电压VD及峰值触发电压VE,计算一第三衰减参数PAR3。详细来说,处理器111可计算峰值触发电压VD与峰值触发电压VE相加的结果除以峰值触发电压VD与峰值触发电压VE相减的结果而得到第三衰减参数PAR3,其详细计算方式如下:Specifically, the processor 111 first compares the first attenuation parameter PAR1 with the first threshold TH1. After judging that the first attenuation parameter PAR1=142 is smaller than the first threshold TH1=180, the processor 111 can measure the next oscillation period of the coil signal C1 (corresponding to the oscillation period of the peak D) to obtain the second attenuation parameter PAR2, and Compare the second attenuation parameter PAR2 with the second threshold TH2. Next, after judging that the second attenuation parameter PAR2=163 is smaller than the second threshold value TH2=170, the processor 111 can measure the next oscillation period of the coil signal C1 (corresponding to the oscillation period of the peak E). As shown in FIG. 6 , in the oscillation period of the peak E, the processor 111 may first set the reference voltage to a trigger start potential V0_E, and obtain the peak trigger voltage VE corresponding to the peak E according to the above method. Next, the processor 111 can calculate a third attenuation parameter PAR3 according to the peak trigger voltage VD and the peak trigger voltage VE. Specifically, the processor 111 can calculate the result of adding the peak trigger voltage VD and the peak trigger voltage VE divided by the result of the subtraction of the peak trigger voltage VD and the peak trigger voltage VE to obtain the third attenuation parameter PAR3. The detailed calculation method is as follows: :

Figure BDA0001728187680000141
Figure BDA0001728187680000141

在此例中,峰值触发电压VD为974单位电压且峰值触发电压VE为962单位电压,经计算后得到第三衰减参数PAR3为161(小数点后四舍五入)。接着,处理器111将第三衰减参数PAR3和第三临界值TH3进行比较,并判断第三衰减参数PAR3=161大于第三临界值TH2=160。在此情形下,处理器111在此测量期间内停止测量后续振荡周期,同时对所取得的第一衰减参数PAR1、第二衰减参数PAR2及第三衰减参数PAR3进行平均,并将上述平均结果与基础临界值THO进行比较,以进行金属异物3的判别。在此例中,第一衰减参数PAR1、第二衰减参数PAR2及第三衰减参数PAR3的平均值大于基础临界值THO,因此处理器111判断感应式电源供应器100的电力发送范围内不存在金属异物3。In this example, the peak trigger voltage VD is 974 units of voltage and the peak trigger voltage VE is 962 units of voltage. After calculation, the third attenuation parameter PAR3 is 161 (rounded off after the decimal point). Next, the processor 111 compares the third attenuation parameter PAR3 with the third threshold value TH3, and determines that the third attenuation parameter PAR3=161 is greater than the third threshold value TH2=160. In this case, the processor 111 stops measuring the subsequent oscillation period during the measurement period, and at the same time averages the obtained first attenuation parameter PAR1, second attenuation parameter PAR2 and third attenuation parameter PAR3, and compares the above average result with The basic threshold value THO is compared for the determination of metal foreign matter 3 . In this example, the average value of the first attenuation parameter PAR1 , the second attenuation parameter PAR2 and the third attenuation parameter PAR3 is greater than the basic threshold THO, so the processor 111 determines that there is no metal in the power transmission range of the inductive power supply 100 Foreign body 3.

在另一实施例中,第三衰减参数PAR3也可能小于第三临界值TH3,此时处理器111进一步执行后续金属异物3的判别,如表四所示。In another embodiment, the third attenuation parameter PAR3 may also be smaller than the third threshold value TH3. At this time, the processor 111 further performs the subsequent determination of the metal foreign object 3, as shown in Table 4.

波峰/振荡周期crest/oscillation period BB CC DD EE FF 峰值触发电压Peak trigger voltage 10001000 984984 968968 952952 936936 衰减参数Attenuation parameter 124124 122122 120120 118118 临界值critical value 180180 170170 160160 150150

表四Table 4

详细来说,处理器111先比较第一衰减参数PAR1与第一临界值TH1。当判断第一衰减参数PAR1=124小于第一临界值TH1=180之后,处理器111可测量线圈信号C1的下一振荡周期(对应于波峰D的振荡周期)以取得第二衰减参数PAR2,并比较第二衰减参数PAR2与第二临界值TH2。接着,当判断第二衰减参数PAR2=122小于第二临界值TH2=170之后,处理器111可测量线圈信号C1的下一振荡周期(对应于波峰E的振荡周期)以取得第三衰减参数PAR3,并比较第三衰减参数PAR3与第三临界值TH3。接着,当判断第三衰减参数PAR3=120小于第三临界值TH3=160之后,处理器111可测量线圈信号C1的下一振荡周期(对应于波峰F的振荡周期)。如图7所示,在波峰F的振荡周期中,处理器111可先将参考电压设定于一触发起始电位V0_F,并依照上述方式取得对应于波峰F的峰值触发电压VF。接着,处理器111可根据峰值触发电压VE及峰值触发电压VF,计算一第四衰减参数PAR4。详细来说,处理器111可计算峰值触发电压VE与峰值触发电压VF相加的结果除以峰值触发电压VE与峰值触发电压VF相减的结果而得到第四衰减参数PAR4,其详细计算方式如下:Specifically, the processor 111 first compares the first attenuation parameter PAR1 with the first threshold TH1. After judging that the first attenuation parameter PAR1=124 is smaller than the first threshold TH1=180, the processor 111 can measure the next oscillation period of the coil signal C1 (corresponding to the oscillation period of the peak D) to obtain the second attenuation parameter PAR2, and Compare the second attenuation parameter PAR2 with the second threshold TH2. Next, after judging that the second attenuation parameter PAR2=122 is smaller than the second threshold value TH2=170, the processor 111 can measure the next oscillation period of the coil signal C1 (corresponding to the oscillation period of the peak E) to obtain the third attenuation parameter PAR3 , and compare the third attenuation parameter PAR3 with the third threshold TH3. Next, after judging that the third attenuation parameter PAR3=120 is smaller than the third threshold value TH3=160, the processor 111 can measure the next oscillation period of the coil signal C1 (corresponding to the oscillation period of the peak F). As shown in FIG. 7 , in the oscillation period of the peak F, the processor 111 may first set the reference voltage to a trigger start potential V0_F, and obtain the peak trigger voltage VF corresponding to the peak F according to the above method. Next, the processor 111 can calculate a fourth attenuation parameter PAR4 according to the peak trigger voltage VE and the peak trigger voltage VF. Specifically, the processor 111 can calculate the result of adding the peak trigger voltage VE and the peak trigger voltage VF by dividing the result of the subtraction of the peak trigger voltage VE and the peak trigger voltage VF to obtain the fourth attenuation parameter PAR4. The detailed calculation method is as follows: :

Figure BDA0001728187680000151
Figure BDA0001728187680000151

在此例中,峰值触发电压VE为952单位电压且峰值触发电压VF为936单位电压,经计算后得到第四衰减参数PAR4为118。由于处理器111在此测量期间内测量的振荡周期数量已到达预定数量,因此,处理器111可对所取得的第一衰减参数PAR1、第二衰减参数PAR2、第三衰减参数PAR3及第四衰减参数PAR4进行平均,并将上述平均结果与基础临界值THO进行比较,以进行金属异物3的判别。在此例中,第一衰减参数PAR1、第二衰减参数PAR2、第三衰减参数PAR3及第四衰减参数PAR4的平均值小于基础临界值THO,因此处理器111判断感应式电源供应器100的电力发送范围内存在金属异物3。In this example, the peak trigger voltage VE is 952 units of voltage and the peak trigger voltage VF is 936 units of voltage, and the fourth attenuation parameter PAR4 is 118 after calculation. Since the number of oscillation periods measured by the processor 111 during this measurement period has reached a predetermined number, the processor 111 can perform the first attenuation parameter PAR1, the second attenuation parameter PAR2, the third attenuation parameter PAR3 and the fourth attenuation The parameter PAR4 is averaged, and the above averaged result is compared with the basic threshold value THO for the determination of metal foreign body 3 . In this example, the average value of the first attenuation parameter PAR1, the second attenuation parameter PAR2, the third attenuation parameter PAR3 and the fourth attenuation parameter PAR4 is less than the basic threshold THO, so the processor 111 determines the power of the inductive power supply 100 A metallic foreign object 3 is present within the transmission range.

在上述实施例中,在驱动信号D1及D2中断的测量期间内只需包括3~6个不等的振荡周期,即可完成金属异物3的判别。相较于中国专利申请公布号CN 106094041 A需要7~15个不等的线圈振荡周期来完成四个波峰电压电平的测量以判断衰减斜率变化,本发明的金属异物检测方法可在更少的时间内完成,进而缩短驱动信号D1及D2中断的时间。一般来说,在金属异物3不存在且线圈信号C1的判断未受到噪声干扰的情况下,所取得的第一衰减参数PAR1往往远大于基础临界值THO,此时只需要测量两个振荡周期即可完成金属异物3的判别,且判别完成后供电驱动单元121及122可立即接合线路以启动驱动信号D1及D2,如图3所示。另一方面,当金属靠近或噪声干扰使得衰减参数下降时,才需要测量更多振荡周期。换言之,衰减参数的数值愈小,代表金属异物存在的可能性愈高,此时测量的振荡周期数量也同步增加。最终无论测量多少个振荡周期或取得多少个衰减参数,处理器111对所取得的衰减参数进行平均,并将平均结果和基础临界值THO进行比较,以判断金属异物3是否存在。一般来说,当线圈停止驱动时其信号为自然谐振的状态,若无金属异物存在,线圈信号的衰减斜率相对于信号振幅的数值的变化量极小。由于每一衰减参数都是根据相邻振荡周期的峰值触发电压并依照相同方式计算,因此衰减参数的数值相当稳定。在感应式电源供应系统中,信号的判断必然受到电源或电路噪声的影响,但多数电源/电路噪声反映在衰减参数上只会出现小幅度的数值跳动,此时衰减参数往往远大于前述临界值而不影响判别结果。反之,当金属异物出现时,峰值触发电压会快速衰减,通过上述相加结果除以相减结果的计算方式,衰减参数会快速下降,能够有效进行金属异物检测和判别。In the above-mentioned embodiment, only 3 to 6 oscillation periods need to be included in the measurement period when the driving signals D1 and D2 are interrupted, and the identification of the metal foreign object 3 can be completed. Compared with the Chinese Patent Application Publication No. CN 106094041 A, which requires 7-15 coil oscillation cycles to complete the measurement of the four peak voltage levels to determine the change of the attenuation slope, the metal foreign body detection method of the present invention can be used in less It is completed within the time limit, thereby shortening the interruption time of the driving signals D1 and D2. Generally speaking, when the metal foreign body 3 does not exist and the determination of the coil signal C1 is not disturbed by noise, the obtained first attenuation parameter PAR1 is often much larger than the basic threshold THO. At this time, only two oscillation periods need to be measured, namely The identification of the metal foreign object 3 can be completed, and after the identification is completed, the power supply driving units 121 and 122 can immediately join the lines to activate the driving signals D1 and D2 , as shown in FIG. 3 . On the other hand, more oscillation periods need to be measured only when metal proximity or noise interference reduces the attenuation parameter. In other words, the smaller the value of the attenuation parameter, the higher the possibility of the presence of metal foreign matter, and the number of measured oscillation periods also increases simultaneously. Finally, no matter how many oscillation periods are measured or how many attenuation parameters are obtained, the processor 111 averages the obtained attenuation parameters, and compares the averaged result with the basic threshold THO to determine whether the foreign metal object 3 exists. Generally speaking, when the coil stops driving, its signal is in a state of natural resonance. If there is no metal foreign matter, the change in the attenuation slope of the coil signal relative to the value of the signal amplitude is extremely small. Since each damping parameter is calculated in the same way based on the peak trigger voltage of the adjacent oscillation period, the numerical value of the damping parameter is quite stable. In an inductive power supply system, the judgment of the signal must be affected by the power supply or circuit noise, but most power supply/circuit noise will only show a small value jump in the attenuation parameter. At this time, the attenuation parameter is often much larger than the aforementioned critical value. without affecting the judgment result. On the contrary, when metal foreign matter appears, the peak trigger voltage will decay rapidly. Through the calculation method of dividing the above addition result by the subtraction result, the attenuation parameter will drop rapidly, which can effectively detect and discriminate metal foreign matter.

在每一测量期间内,都可根据衰减参数与对应临界值的比较结果来决定测量的振荡周期数量,并取得所有衰减参数的平均值以进行金属异物的判别。一般来说,当第一、第二及第三衰减参数PAR1~PAR3当中任一者大于相对应临界值时,即不进行最后第四衰减参数PAR4的计算。由于第一、第二及第三临界值TH1~TH3都大于基础临界值THO,因此,在未计算第四衰减参数PAR4的情形下,前三个衰减参数PAR1~PAR3的平均值通常大于基础临界值THO而得出金属异物3不存在的判别结果。在此情形下,处理器111也可判断所取得的衰减参数数量或所测量的振荡周期数量,只有在取得的衰减参数数量到达预设值时(例如四个衰减参数),才计算衰减参数的平均值以进行金属异物3的判别;若取得的衰减参数数量未达到预设值,则处理器111直接判定金属异物3不存在。In each measurement period, the number of oscillation cycles to be measured can be determined according to the comparison result between the attenuation parameter and the corresponding critical value, and the average value of all the attenuation parameters can be obtained to discriminate metal foreign objects. Generally speaking, when any one of the first, second and third attenuation parameters PAR1 to PAR3 is greater than the corresponding threshold, the calculation of the last fourth attenuation parameter PAR4 is not performed. Since the first, second and third thresholds TH1-TH3 are all greater than the basic threshold THO, the average value of the first three attenuation parameters PAR1-PAR3 is usually greater than the basic threshold without calculating the fourth attenuation parameter PAR4 The value of THO is used to obtain the determination result that the metallic foreign matter 3 does not exist. In this case, the processor 111 can also determine the number of acquired attenuation parameters or the number of measured oscillation periods, and only when the number of acquired attenuation parameters reaches a preset value (for example, four attenuation parameters), calculates the number of attenuation parameters. The average value is used to determine the metal foreign object 3 ; if the acquired number of attenuation parameters does not reach the preset value, the processor 111 directly determines that the metal foreign object 3 does not exist.

此外,为提高判别准确度同时避免错误判别造成电源输出被关闭,处理器111可设定一金属异物计数器。若一测量期间内取得的衰减参数平均值小于基础临界值时,可将金属异物计数器加一。当金属异物计数器在一段预定期间内到达特定数值时,即判断为金属异物3存在。或者,也可在连续数个测量期间内得到衰减参数平均值小于基础临界值时判断金属异物3存在。In addition, in order to improve the determination accuracy and avoid the power output being turned off due to wrong determination, the processor 111 may set a metal foreign object counter. If the average value of attenuation parameters obtained during a measurement period is less than the basic threshold value, the metal foreign matter counter can be increased by one. When the metal foreign object counter reaches a certain value within a predetermined period, it is determined that the metal foreign object 3 exists. Alternatively, it can also be determined that the metal foreign body 3 exists when the average value of the attenuation parameter obtained in several consecutive measurement periods is less than the basic threshold value.

值得注意的是,在上述实施例中,处理器111先将一参考电压设定于一触发起始电位,并在比较器114的输出端发生触发时控制参考电压上升,接着在触发结束时取得参考电压的电平作为峰值触发电压。为使峰值触发电压有效反映相对应波峰的电压电平,触发起始电位应设定为接近并略低于峰值电压的位置,以成功发生触发同时使峰值触发电压接近波峰电压电平。若触发起始电位设定得过高,可能发生触发起始电位高于波峰电压而无法成功触发的情况;若触发起始电位设定得过低,虽可成功触发但峰值触发电压可能过低而无法反映真实的波峰电压大小。It should be noted that, in the above embodiment, the processor 111 first sets a reference voltage at a trigger start potential, and controls the reference voltage to rise when the output terminal of the comparator 114 is triggered, and then obtains the reference voltage when the trigger ends. The level of the reference voltage is used as the peak trigger voltage. In order for the peak trigger voltage to effectively reflect the voltage level of the corresponding peak, the trigger start potential should be set close to and slightly lower than the peak voltage for successful triggering and at the same time the peak trigger voltage is close to the peak voltage level. If the trigger start potential is set too high, the trigger start potential may be higher than the peak voltage and the trigger cannot be successfully triggered; if the trigger start potential is set too low, the trigger may be successfully triggered but the peak trigger voltage may be too low It cannot reflect the actual peak voltage.

在一实施例中,处理器111可根据前一测量期间内取得的相对应的一先前峰值触发电压来计算本次测量期间采用的触发起始电位,例如将先前峰值触发电压减去一预设电压值而得的数值设定为触发起始电位。举例来说,对波峰B的振荡周期而言,若前一测量期间取得的峰值触发电压VB为1000单位电压,本次测量期间的触发起始电位V0_B可设定为900单位电压(即1000减去预设电压值100);对波峰C的振荡周期而言,若前一测量期间取得的峰值触发电压VC为980单位电压,本次测量期间的触发起始电位V0_C可设定为880单位电压(即980减去预设电压值100)。根据前一测量期间的峰值触发电压,处理器111可得知波峰电压可能的电平,以将触发起始电位设定于略低的电平。设定较低电平的触发起始电位可提高发生触发的机率,除非峰值电压快速下降,多数情况下都能够成功发生触发并取得金属异物判断结果。In one embodiment, the processor 111 may calculate the trigger start potential used in this measurement period according to a corresponding previous peak trigger voltage obtained in the previous measurement period, for example, subtract a predetermined value from the previous peak trigger voltage. The value obtained from the voltage value is set as the trigger start potential. For example, for the oscillation period of the peak B, if the peak trigger voltage VB obtained in the previous measurement period is 1000 units of voltage, the trigger start potential V0_B of this measurement period can be set to 900 units of voltage (that is, 1000 minus For the oscillation period of the peak C, if the peak trigger voltage VC obtained in the previous measurement period is 980 units of voltage, the trigger start potential V0_C during this measurement period can be set to 880 units of voltage (ie 980 minus the preset voltage value of 100). According to the peak trigger voltage in the previous measurement period, the processor 111 can know the possible level of the peak voltage, so as to set the trigger start potential at a slightly lower level. Setting a lower trigger start potential can increase the probability of triggering. Unless the peak voltage drops rapidly, triggering can be successful in most cases and the metal foreign object judgment result can be obtained.

中国专利申请公布号CN 106094041 A的波峰电压电平的判断方式为,根据前一测量期间内有无触发的结果来判断需提高或降低参考电压,并在数个测量期间内出现时而有触发时而无触发的情况下判断参考电压已锁定在波峰电压电平。因此,当负载及输出功率未发生变化的情形下,需要多个测量期间才能够将参考电压锁定至波峰电压电平。相较之下,根据本发明取得峰值触发电压的方式,将触发起始电位设定于较低电位能够提高发生触发的机率,只要发生触发即可立刻计算衰减参数以进行金属异物的判别,因此,本发明无须花费多个测量期间锁定至波峰电压电平,即可迅速完成判别。此外,判别过程中仍可持续调整触发起始电位至较佳电平,例如,本次测量期间内触发起始电位V0_B设定为900单位电压且在参考电压上升至910单位电压时触发结束,代表波峰下降使得峰值触发电压VB降至910单位电压,在此情形下,可在下一测量期间将触发起始电位V0_B设定于810单位电压(即910减去预设电压值100),以达到较佳的触发效果同时提高成功触发的机率。The way of judging the peak voltage level of Chinese Patent Application Publication No. CN 106094041 A is to judge whether the reference voltage needs to be increased or decreased according to the result of whether there is a trigger in the previous measurement period, and the reference voltage needs to be increased or decreased in several measurement periods. It is judged that the reference voltage has been locked at the peak voltage level without triggering. Therefore, when the load and output power do not change, multiple measurement periods are required to lock the reference voltage to the peak voltage level. In contrast, according to the method of obtaining the peak trigger voltage of the present invention, setting the trigger start potential at a lower potential can improve the probability of triggering, and as long as triggering occurs, the attenuation parameter can be calculated immediately to determine the metal foreign matter. Therefore, , the present invention can quickly complete the discrimination without spending multiple measurement periods to lock to the peak voltage level. In addition, during the determination process, the trigger start potential can still be adjusted to a better level. For example, during this measurement period, the trigger start potential V0_B is set to 900 units of voltage, and the trigger ends when the reference voltage rises to 910 units of voltage, It represents that the peak value of the trigger voltage VB drops to 910 units of voltage. In this case, the trigger start potential V0_B can be set to 810 units of voltage (ie, 910 minus the preset voltage value of 100) in the next measurement period to achieve A better trigger effect also increases the chance of a successful trigger.

值得注意的是,部分情况下处理器111无法取得前一测量期间内相对应的峰值触发电压。举例来说,在前一测量期间内,处理器111根据峰值触发电压VB及峰值触发电压VC计算出第一衰减参数PAR1,并判断第一衰减参数PAR1大于第一临界值TH1,因而无须测量后续振荡周期以及计算其它衰减参数。然而,在本次测量期间内,处理器111判断第一衰减参数PAR1小于第一临界值TH1而需要测量后续振荡周期。换言之,本次测量期间内需取得对应于波峰D的触发起始电位V0_D,但前一测量期间未测量波峰D的振荡周期,因而不存在峰值触发电压VD作为估算本次触发起始电位V0_D的依据。在此情形下,处理器111可采用本次测量期间内前一振荡周期的另一先前峰值触发电压(即对应于波峰C的峰值触发电压VC)作为依据,并预估对应于波峰D的峰值触发电压VD可能低于峰值触发电压VC的幅度,进而计算触发起始电位V0_D。举例来说,若峰值触发电压VC为900单位电压,可据此预估波峰D的峰值触发电压VD为870单位电压,并将触发起始电位V0_D设定于770单位电压(即870减去预设电压值100)。在另一实施例中,也可根据相同测量期间内的峰值触发电压VB及VC来预估波峰D的峰值触发电压VD。例如,若峰值触发电压VB为100单位电压且峰值触发电压VC为90单位电压时,可据此预估波峰D的峰值触发电压VD约位于80单位电压,进而将触发起始电位V0_D设定为70单位电压以侦测实际的峰值触发电压VD。It should be noted that, in some cases, the processor 111 cannot obtain the corresponding peak trigger voltage in the previous measurement period. For example, in the previous measurement period, the processor 111 calculates the first attenuation parameter PAR1 according to the peak trigger voltage VB and the peak trigger voltage VC, and determines that the first attenuation parameter PAR1 is greater than the first threshold value TH1, so subsequent measurement is not required. Oscillation period and calculate other decay parameters. However, during this measurement period, the processor 111 determines that the first attenuation parameter PAR1 is smaller than the first threshold value TH1 and the subsequent oscillation period needs to be measured. In other words, the trigger start potential V0_D corresponding to the peak D needs to be obtained during this measurement period, but the oscillation period of the peak D was not measured during the previous measurement period, so there is no peak trigger voltage VD as the basis for estimating the trigger start potential V0_D this time. . In this case, the processor 111 can use another previous peak trigger voltage (ie, the peak trigger voltage VC corresponding to the peak C) of the previous oscillation period in the current measurement period as a basis, and estimate the peak value corresponding to the peak D The trigger voltage VD may be lower than the amplitude of the peak trigger voltage VC, and then the trigger start potential V0_D is calculated. For example, if the peak trigger voltage VC is 900 units, the peak trigger voltage VD of the peak D can be estimated to be 870 units accordingly, and the trigger start potential V0_D is set at 770 units (that is, 870 minus the predetermined value). Set the voltage value to 100). In another embodiment, the peak trigger voltage VD of the peak D can also be estimated according to the peak trigger voltages VB and VC in the same measurement period. For example, if the peak trigger voltage VB is 100 units and the peak trigger voltage VC is 90 units, it can be estimated that the peak trigger voltage VD of the peak D is about 80 units, and then the trigger start potential V0_D is set as 70 units of voltage to detect the actual peak trigger voltage VD.

一般来说,若前一测量期间内未测量对应于波峰D的振荡周期,代表对应于波峰D的先前峰值触发电压的记录可能来自于一段较长时间之前的测量结果。然而,感应式电源供应器100的供电过程中可能发生负载及/或功率输出的变化,使得线圈信号C1上的峰值电压发生大幅度变化,此变化可能高达数十或数百倍。在此情形下,较长时间之前的峰值触发电压记录往往不具有参考价值,因此,采用相同测量期间内前一振荡周期的峰值触发电压作为依据,可取得较适合的触发起始电位,进而提高成功发生触发并取得衰减参数及金属异物判断结果的机率。Generally speaking, if the oscillation period corresponding to the peak D is not measured in the previous measurement period, the record representing the previous peak trigger voltage corresponding to the peak D may come from the measurement results of a longer period of time ago. However, changes in load and/or power output may occur during the power supply of the inductive power supply 100, resulting in a large change in the peak voltage on the coil signal C1, which may be as high as tens or hundreds of times. In this case, the peak trigger voltage record before a long period of time is often of no reference value. Therefore, using the peak trigger voltage of the previous oscillation period within the same measurement period as the basis, a more suitable trigger start potential can be obtained, thereby improving the The probability of successful triggering and obtaining attenuation parameters and metal foreign object judgment results.

值得注意的是,前述方法并非每一测量期间内都能够成功触发并取得衰减参数。若其中一振荡周期内未发生触发而无法取得相对应的峰值触发电压时,则处理器111舍弃该测量期间内的计算及判断结果,同时降低触发起始电位以提高下一测量期间内成功触发的机率。此外,为有效取得峰值触发电压,处理器111可先测量线圈谐振频率,并取得每一谐振周期当中波峰可能发生的位置区间。若此区间内没有发生触发,代表触发起始电位过高,因此处理器111在下一测量期间降低触发起始电位,并再次尝试进行触发以取得相对应的峰值触发电压。It is worth noting that the aforementioned methods cannot successfully trigger and obtain attenuation parameters in every measurement period. If no triggering occurs in one oscillation period and the corresponding peak trigger voltage cannot be obtained, the processor 111 discards the calculation and judgment results in the measurement period, and at the same time lowers the trigger start potential to increase the successful triggering in the next measurement period probability. In addition, in order to effectively obtain the peak trigger voltage, the processor 111 can first measure the coil resonance frequency, and obtain the position interval where the peak may occur in each resonance cycle. If no trigger occurs within this interval, it means that the trigger start potential is too high, so the processor 111 reduces the trigger start potential in the next measurement period, and tries to trigger again to obtain the corresponding peak trigger voltage.

由上述可知,本发明可在驱动信号中断的测量期间内,测量线圈信号以取得对应于多个峰值的峰值触发电压,并根据两相邻峰值触发电压的平均值相对于其差值的比例来计算衰减参数,进而比较衰减参数与对应临界值来决定是否需取得更多波峰的峰值触发电压以执行后续判断,同时进行金属异物的判别。其中,处理器可将参考电压设定于一触发起始电位,并在发生触发时控制参考电压逐渐上升,进而取得峰值触发电压。本领域技术人员当可据此进行修饰或变化,而不限于此。举例来说,在上述实施例中,一测量期间内最多测量5个振荡周期以取得5个峰值触发电压以计算4个衰减参数。在其它实施例中,上述测量振荡周期的最大次数以及取得衰减参数的最大数量可根据系统需求而进行调整,而不限于此。此外,在上述实施例中,关于峰值触发电压及触发起始电位的数值仅为范例,本领域技术人员可依系统需求设定并取得合适的电压数值。举例来说,电压产生装置113可由一数字模拟转换器来实现,而上述单位电压可以是处理器111所设定的数字值,其通过数字模拟转换器转换为对应的模拟电压之后加以输出,根据不同规格的数字模拟转换器,峰值触发电压及触发起始电位可能具有不同的数值。例如,若电压产生装置113为12位的数字模拟转换器时,其可接收0~4095的数字值并依据线圈信号C1(通过分压电路130之后)的可能电压范围来对应产生输出电压。另外,峰值触发电压是参考电压由触发起始电位上升至触发结束时的电平,而处理器111可调整参考电压上升的速度,例如,处理器111可控制参考电压依固定的速度上升,并将上升速度调整至较佳数值,使其在触发结束时的电平能够有效反映波峰电压的电平。It can be seen from the above that the present invention can measure the coil signal during the measurement period when the driving signal is interrupted to obtain the peak trigger voltage corresponding to a plurality of peaks, and obtain the peak trigger voltage according to the ratio of the average value of the two adjacent peak trigger voltages to the difference thereof. Calculate the attenuation parameter, and then compare the attenuation parameter with the corresponding threshold value to determine whether more peak trigger voltages of the peaks need to be obtained to perform subsequent judgments, and at the same time, the judgment of metal foreign objects is performed. The processor may set the reference voltage at a trigger start potential, and control the reference voltage to gradually increase when a trigger occurs, thereby obtaining a peak trigger voltage. Those skilled in the art can make modifications or changes accordingly, but are not limited to this. For example, in the above-mentioned embodiment, a maximum of 5 oscillation periods are measured in a measurement period to obtain 5 peak trigger voltages to calculate 4 attenuation parameters. In other embodiments, the maximum number of times of measuring the oscillation period and the maximum number of obtained attenuation parameters can be adjusted according to system requirements, but not limited to this. In addition, in the above embodiments, the values of the peak trigger voltage and the trigger start potential are only examples, and those skilled in the art can set and obtain appropriate voltage values according to system requirements. For example, the voltage generating device 113 can be realized by a digital-to-analog converter, and the above-mentioned unit voltage can be a digital value set by the processor 111, which is converted into a corresponding analog voltage by the digital-to-analog converter and then output, according to Different specifications of digital-to-analog converters may have different values for the peak trigger voltage and trigger start potential. For example, if the voltage generating device 113 is a 12-bit digital-to-analog converter, it can receive digital values from 0 to 4095 and generate the output voltage according to the possible voltage range of the coil signal C1 (after passing through the voltage divider circuit 130 ). In addition, the peak trigger voltage is the level at which the reference voltage rises from the trigger start potential to the trigger end, and the processor 111 can adjust the speed of the reference voltage rise. For example, the processor 111 can control the reference voltage to rise at a fixed speed, and Adjust the rising speed to an optimal value so that the level at the end of the trigger can effectively reflect the level of the peak voltage.

本发明的金属异物检测方法可有效降低驱动信号中断的时间,以减低中断驱动对电力供应的影响。因此,判断金属异物的过程须尽可能在最短时间内完成。在上述实施例中,最低只需要测量2个振荡周期即可完成金属异物的判别,连同舍弃的第一个波峰的振荡周期,驱动信号最低只需要中断三个振荡周期的时间。在另一实施例中,仍可进一步降低驱动信号中断的时间。The metal foreign object detection method of the present invention can effectively reduce the interruption time of the driving signal, so as to reduce the influence of interruption of driving on the power supply. Therefore, the process of judging metal foreign objects must be completed in the shortest time possible. In the above embodiment, it only needs to measure 2 oscillation periods at least to complete the identification of metal foreign objects, and together with the oscillation period of the first wave peak discarded, the driving signal only needs to be interrupted for at least three oscillation periods. In another embodiment, the interruption time of the driving signal can be further reduced.

请参考图8,图8为本发明实施例另一金属异物检测流程80的示意图。如图8所示,金属异物检测流程80可用于一感应式电源供应器的供电端(如图1的感应式电源供应器100的供电模块1),其包括以下步骤:Please refer to FIG. 8 , which is a schematic diagram of another metal foreign object detection process 80 according to an embodiment of the present invention. As shown in FIG. 8 , the metal foreign object detection process 80 can be used for the power supply end of an inductive power supply (such as the power supply module 1 of the inductive power supply 100 in FIG. 1 ), which includes the following steps:

步骤800:开始。Step 800: Start.

步骤802:取得前一测量期间内测量的相对应的一先前峰值触发电压,设定为一参考电压值。Step 802 : Obtain a corresponding previous peak trigger voltage measured in the previous measurement period, and set it as a reference voltage value.

步骤804:在一测量期间内中断感应式电源供应器100的驱动信号D1及D2以停止对供电线圈16进行驱动,以产生供电线圈16的一线圈信号C1。Step 804 : Interrupt the driving signals D1 and D2 of the inductive power supply 100 during a measurement period to stop driving the power supply coil 16 to generate a coil signal C1 of the power supply coil 16 .

步骤806:在线圈信号C1的一振荡周期内测量线圈信号C1的一第一波峰,以取得一第一峰值触发电压。Step 806: Measure a first peak of the coil signal C1 within an oscillation period of the coil signal C1 to obtain a first peak trigger voltage.

步骤808:比较第一峰值触发电压与参考电压值,并判断第一峰值触发电压是否等于或接近于参考电压值。若是,则执行步骤810;若否,则执行步骤812。Step 808 : Compare the first peak trigger voltage with the reference voltage value, and determine whether the first peak trigger voltage is equal to or close to the reference voltage value. If yes, go to step 810; if not, go to step 812.

步骤810:判断感应式电源供应器100的一电力发送范围内不存在金属异物3,接着执行步骤818。Step 810 : It is determined that there is no metal foreign object 3 within a power transmission range of the inductive power supply 100 , and then step 818 is executed.

步骤812:在线圈信号C1的下一振荡周期内测量线圈信号C1的一第二波峰,以取得一第二峰值触发电压。Step 812 : Measure a second peak of the coil signal C1 in the next oscillation period of the coil signal C1 to obtain a second peak trigger voltage.

步骤814:根据第一峰值触发电压及第二峰值触发电压,计算一衰减参数。Step 814: Calculate an attenuation parameter according to the first peak trigger voltage and the second peak trigger voltage.

步骤816:比较衰减参数与一临界值,以判断感应式电源供应器100的电力发送范围内是否存在金属异物3。Step 816 : Compare the attenuation parameter with a threshold value to determine whether there is a metal foreign object 3 within the power transmission range of the inductive power supply 100 .

步骤818:结束。Step 818: End.

金属异物检测流程80与金属异物检测流程20的差异在于,在金属异物检测流程80中,处理器111在驱动信号D1及D2中断的测量期间内最少只需要测量线圈信号C1的一波峰并取得一峰值触发电压,即可完成金属异物3的判别。The difference between the metal foreign object detection process 80 and the metal foreign object detection process 20 is that in the metal foreign object detection process 80, the processor 111 only needs to measure at least one peak of the coil signal C1 and obtain a peak during the measurement period when the driving signals D1 and D2 are interrupted. The peak trigger voltage can complete the identification of metal foreign objects 3 .

举例来说,请参考图9,图9为本发明实施例在一测量期间内通过一峰值触发电压VB来进行金属异物判别的示意图。如图9所示,测量期间内线圈信号C1仅包括两个波峰A及B。同样地,为避免金属异物3的判断受驱动信号D1及D2影响而失真,可舍弃波峰A的峰值触发电压测量。接着,在波峰B对应的振荡周期中,处理器111可将参考电压设定于一触发起始电位V0_B,并依照上述方式取得对应于波峰B的峰值触发电压VB。For example, please refer to FIG. 9 . FIG. 9 is a schematic diagram of discriminating metal foreign objects by a peak trigger voltage VB during a measurement period according to an embodiment of the present invention. As shown in FIG. 9 , the coil signal C1 includes only two peaks A and B during the measurement period. Similarly, in order to avoid distortion of the determination of the metal foreign object 3 due to the influence of the driving signals D1 and D2 , the peak trigger voltage measurement of the peak A can be discarded. Next, in the oscillation period corresponding to the peak B, the processor 111 may set the reference voltage to a trigger start potential V0_B, and obtain the peak trigger voltage VB corresponding to the peak B according to the above method.

值得注意的是,在前一测量期间内,处理器111可先测量相对应的一先前峰值触发电压,即前一测量期间内的波峰B所对应的峰值触发电压VB,并记录峰值触发电压VB作为一参考电压值,例如处理器111可将参考电压值存储在一存储器。同时,前一测量期间内仅取得峰值触发电压VB且判断结果指示无金属异物3存在;或者,前一测量期间内仅取得峰值触发电压VB及VC,计算而得的第一衰减参数PAR1大于第一临界值TH1以指示无金属异物3存在。接着,在本次测量期间,处理器111只需要取得对应于波峰B的峰值触发电压VB,即可完成金属异物3的判别。详细来说,处理器111可比较峰值触发电压VB与参考电压值,当峰值触发电压VB等于或接近于参考电压值时,即可判断感应式电源供应器100的电力发送范围内不存在金属异物3。在此情形下,当峰值触发电压VB测量完毕之后,供电驱动单元121及122即可重新接合,以通过驱动信号D1及D2再次驱动供电线圈16输出电力。It is worth noting that, in the previous measurement period, the processor 111 can first measure a corresponding previous peak trigger voltage, that is, the peak trigger voltage VB corresponding to the peak B in the previous measurement period, and record the peak trigger voltage VB. As a reference voltage value, for example, the processor 111 may store the reference voltage value in a memory. At the same time, only the peak trigger voltage VB was obtained in the previous measurement period and the judgment result indicated that no metal foreign matter 3 existed; or, only the peak trigger voltage VB and VC were obtained in the previous measurement period, and the calculated first attenuation parameter PAR1 was greater than the A threshold value TH1 indicates that there is no metal foreign matter 3 present. Next, during the current measurement period, the processor 111 only needs to obtain the peak trigger voltage VB corresponding to the peak B to complete the identification of the metal foreign object 3 . Specifically, the processor 111 can compare the peak trigger voltage VB with the reference voltage value, and when the peak trigger voltage VB is equal to or close to the reference voltage value, it can determine that there is no metal foreign matter within the power transmission range of the inductive power supply 100 3. In this case, after the peak trigger voltage VB is measured, the power supply driving units 121 and 122 can be reconnected to drive the power supply coil 16 to output power again through the driving signals D1 and D2.

一般来说,当金属异物不存在且线圈输出功率与负载状态都不变的情形下,对应于波峰B的峰值触发电压VB也大致不变。相反地,当一金属异物3进入感应式电源供应器100的电力发送范围内时,若其它条件(如线圈输出功率和负载)不变,峰值触发电压VB会受金属异物3影响而大幅下降。在此情形下,处理器111只需要测量峰值触发电压VB即可完成金属异物3的判别。如此一来,在驱动信号D1及D2中断的测量期间内最低只需包括2个振荡周期,其中,对应于波峰A的振荡周期不进行测量,在对应于波峰B的振荡周期内完成测量并取得峰值触发电压VB之后,即可通过比较峰值触发电压VB与先前取得的参考电压值来完成金属异物3的判别。Generally speaking, when there is no metal foreign matter and the output power of the coil and the load state are unchanged, the peak trigger voltage VB corresponding to the peak B is also roughly unchanged. Conversely, when a metal foreign object 3 enters the power transmission range of the inductive power supply 100 , if other conditions (such as coil output power and load) remain unchanged, the peak trigger voltage VB will be greatly reduced by the metal foreign object 3 . In this case, the processor 111 only needs to measure the peak trigger voltage VB to complete the identification of the metal foreign object 3 . In this way, the measurement period in which the driving signals D1 and D2 are interrupted only needs to include at least 2 oscillation periods, wherein the oscillation period corresponding to the peak A is not measured, and the measurement is completed and obtained in the oscillation period corresponding to the peak B. After the peak trigger voltage VB is obtained, the identification of the metal foreign object 3 can be completed by comparing the peak trigger voltage VB with the previously obtained reference voltage value.

在一实施例中,当峰值触发电压VB被判断为等于或接近于参考电压值时,代表感应式电源供应器100的电力发送范围内不存在金属异物。此时处理器111可更新存储的参考电压值并将其设定为目前的峰值触发电压VB,以供下一测量期间的判别。In one embodiment, when the peak trigger voltage VB is determined to be equal to or close to the reference voltage value, it means that there is no metal foreign matter within the power transmission range of the inductive power supply 100 . At this time, the processor 111 can update the stored reference voltage value and set it as the current peak trigger voltage VB for the determination of the next measurement period.

需注意的是,上述等于或接近于的判定可依任意方式进行。举例来说,若峰值触发电压VB位于参考电压值上下一特定数值范围内即可判断为两者相等或接近,例如可设定参考电压值向上和向下各50单位电压的区间内视为接近参考电压值,且前一测量期间取得的参考电压值为1000单位电压。在此情形下,若峰值触发电压VB位于950~1050单位电压的范围内时,处理器111即可判断峰值触发电压VB等于或接近于参考电压值,进而判断金属异物3不存在。在另一实施例中,可设定参考电压值上下一特定比例之内的数值范围为等于或接近于,例如可设定参考电压值向上和向下各百分的五的区间内视为接近参考电压值,且前一测量期间取得的参考电压值为500单位电压。在此情形下,若峰值触发电压VB位于475~525单位电压的范围内时,处理器111即可判断峰值触发电压VB等于或接近于参考电压值,进而判断金属异物3不存在。It should be noted that the above determination of being equal to or close to can be performed in any manner. For example, if the peak trigger voltage VB is within a specific value range above and below the reference voltage value, it can be determined that the two are equal or close. The reference voltage value, and the reference voltage value obtained during the previous measurement period is 1000 units of voltage. In this case, if the peak trigger voltage VB is in the range of 950-1050 unit voltage, the processor 111 can determine that the peak trigger voltage VB is equal to or close to the reference voltage value, and further determine that the metal foreign object 3 does not exist. In another embodiment, the range of values within a specific ratio above and below the reference voltage value can be set to be equal to or close to, for example, the range of five percents of the reference voltage value up and down can be set as close to The reference voltage value, and the reference voltage value obtained during the previous measurement period is 500 units of voltage. In this case, if the peak trigger voltage VB is in the range of 475-525 unit voltage, the processor 111 can determine that the peak trigger voltage VB is equal to or close to the reference voltage value, and further determine that the metal foreign object 3 does not exist.

此外,若本次测量期间内峰值触发电压VB被判断为未等于或接近于参考电压值时,代表可能存在金属异物3或者系统的输出功率及/或负载发生变化。此时处理器111需进一步测量线圈信号C1的下一振荡周期并取得相对应的峰值触发电压。接着,处理器111根据两相邻振荡周期测得的峰值触发电压来计算一衰减参数,并比较该衰减参数与相对应的临界值,以进行金属异物3的判别。换言之,在金属异物检测流程80中,若一第一峰值触发电压(如VB)被判断为未等于或接近于参考电压值时,需继续测量下一振荡周期以取得一第二峰值触发电压(如图4的VC),以进一步进行金属异物3的判别,上述判别可通过前述如图2所示的金属异物检测方法20来实现。In addition, if the peak trigger voltage VB is determined to be not equal to or close to the reference voltage value during the current measurement period, it means that there may be metal foreign objects 3 or the output power and/or load of the system have changed. At this time, the processor 111 needs to further measure the next oscillation period of the coil signal C1 and obtain the corresponding peak trigger voltage. Next, the processor 111 calculates a damping parameter according to the peak trigger voltages measured in two adjacent oscillation periods, and compares the damping parameter with the corresponding threshold value to determine the metallic foreign object 3 . In other words, in the metal foreign object detection process 80, if a first peak trigger voltage (eg VB) is determined not to be equal to or close to the reference voltage value, it is necessary to continue to measure the next oscillation period to obtain a second peak trigger voltage ( VC) in FIG. 4 , to further discriminate the metallic foreign body 3 , the above-mentioned discrimination can be realized by the aforementioned metal foreign body detection method 20 shown in FIG. 2 .

值得注意的是,在特定情形下,可能发生金属异物3接近的同时因线圈移动或负载变化造成峰值触发电压VB仍等于或接近于参考电压值的情况。为避免上述情况下无法有效判别金属异物3,处理器111可设定峰值触发电压VB被判断为等于或接近于参考电压值的一连续次数或一连续时间的上限,并在到达上限时执行测量下一振荡周期以取得一第二峰值触发电压(如图4的VC)以及计算衰减参数等步骤,即,通过前述如图2所示的金属异物检测方法20来进行金属异物3的判别。在一实施例中,处理器111可包括一计数器,用来计算峰值触发电压VB被判断为等于或接近于参考电压值因而仅测量一峰值触发电压VB的连续次数,当计数器到达上限时改为执行如图2所示的金属异物检测方法20,此时处理器111并重置计数器以重新计算连续次数。或者,处理器111也可包括一定时器,用来判断峰值触发电压VB被判断为等于或接近于参考电压值的连续时间,当计时期满时改为执行如图2所示的金属异物检测方法20,此时处理器111并重置定时器以重新计算连续时间。又或者,定时器的运作也可不考虑峰值触发电压VB的判别结果,举例来说,定时器可周期性地依照固定的计时期间运作,平时可采用如图8所示的金属异物检测方法80,当计时期满时强制执行如图2所示的金属异物检测方法20。It is worth noting that, under certain circumstances, it may happen that the peak trigger voltage VB is still equal to or close to the reference voltage value due to the movement of the coil or the change of the load while the metal foreign object 3 is approaching. In order to avoid the inability to effectively discriminate the metal foreign object 3 in the above situation, the processor 111 can set the peak trigger voltage VB to be judged to be equal to or close to the reference voltage value for a continuous number of times or an upper limit of a continuous time, and perform measurement when the upper limit is reached. In the next oscillation cycle, the steps of obtaining a second peak trigger voltage (VC in FIG. 4 ) and calculating the attenuation parameter, that is, the metal foreign object detection method 20 shown in FIG. 2 is used to determine the metal foreign object 3 . In one embodiment, the processor 111 may include a counter for counting the consecutive times when the peak trigger voltage VB is judged to be equal to or close to the reference voltage value and thus only a peak trigger voltage VB is measured. The metal foreign object detection method 20 shown in FIG. 2 is executed, at this time, the processor 111 resets the counter to re-count the consecutive times. Alternatively, the processor 111 may also include a timer for judging the continuous time during which the peak trigger voltage VB is judged to be equal to or close to the reference voltage value, and when the timer expires, the metal foreign object detection as shown in FIG. 2 is performed instead. Method 20, where the processor 111 resets the timer to recalculate the continuous time. Alternatively, the operation of the timer may not consider the determination result of the peak trigger voltage VB. For example, the timer may operate periodically according to a fixed timing period. Usually, the metal foreign object detection method 80 shown in FIG. 8 may be used. When the timer expires, the metal foreign object detection method 20 as shown in FIG. 2 is enforced.

综上所述,本发明提供了一种金属异物检测方法,其可在驱动信号中断的测量期间内,测量线圈信号以取得一或多个峰值触发电压,可比较峰值触发电压与先前取得的一参考电压值来进行金属异物的判别,或根据两相邻峰值触发电压的平均值相对于其差值的比例来计算衰减参数,进而比较衰减参数与对应临界值来决定是否需取得更多波峰的峰值触发电压以执行后续判断,以实现金属异物的判别。处理器可将参考电压设定于较低电平的一触发起始电位,并在发生触发时控制参考电压逐渐上升,进而取得峰值触发电压。将触发起始电位设定于较低电平可提高成功触发并取得峰值触发电压的机率。此外,当金属异物不存在时,本发明的金属异物检测方法最低只需要测量一或两个线圈振荡周期并对应取得一或两个峰值触发电压即可完成金属异物的判别。即使加上不进行测量的第一个波峰,驱动信号中断的测量期间最少只包括2~3个线圈振荡周期,可大幅降低驱动信号中断对电力输出的影响。此外,本发明的金属异物检测方法可通过线圈信号的衰减比例来进行判断,以取代过去采用衰减量或衰减斜率进行判断的方式,可解决依衰减斜率判断易受到线圈振幅和负载影响的缺点。In summary, the present invention provides a metal foreign object detection method, which can measure the coil signal to obtain one or more peak trigger voltages during the measurement period when the driving signal is interrupted, and can compare the peak trigger voltage with a previously obtained one. Refer to the voltage value to discriminate metal foreign objects, or calculate the attenuation parameter according to the ratio of the average value of the two adjacent peak trigger voltages to the difference, and then compare the attenuation parameter with the corresponding critical value to determine whether to obtain more peaks. The peak trigger voltage is used to perform subsequent judgments to realize the judgment of metal foreign objects. The processor can set the reference voltage to a trigger start potential of a lower level, and control the reference voltage to gradually increase when a trigger occurs, thereby obtaining a peak trigger voltage. Setting the trigger start potential at a lower level increases the chance of a successful trigger and peak trigger voltage. In addition, when the metal foreign body does not exist, the metal foreign body detection method of the present invention only needs to measure one or two coil oscillation cycles and obtain one or two peak trigger voltages to complete the identification of the metal foreign body. Even if the first wave peak that is not measured is added, the measurement period when the driving signal is interrupted only includes at least 2 to 3 coil oscillation cycles, which can greatly reduce the impact of the driving signal interruption on the power output. In addition, the metal foreign object detection method of the present invention can be judged by the attenuation ratio of the coil signal, instead of the past judgment by the attenuation amount or the attenuation slope, and can solve the disadvantage of being easily affected by the coil amplitude and the load according to the attenuation slope.

以上所述仅为本发明的优选实施例而已,并不用于限制本发明,对于本领域的技术人员来说,本发明可以有各种更改和变化。凡在本发明的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

Claims (18)

1. A metal foreign object detection method is used for a power supply module of an induction type power supply, the power supply module comprises a power supply coil, and the metal foreign object detection method comprises the following steps:
interrupting at least one driving signal of the inductive power supply in a measuring period to stop driving the power supply coil so as to generate a coil signal of the power supply coil;
measuring a plurality of wave peaks of the coil signal in a plurality of continuous oscillation periods of the coil signal to respectively obtain a plurality of peak trigger voltages;
calculating a first attenuation parameter according to a first peak trigger voltage and a second peak trigger voltage in the plurality of peak trigger voltages; and
comparing the first attenuation parameter with a first critical value to judge whether metal foreign matters exist in a power transmission range of the induction type power supply;
wherein the step of calculating the first decay parameter according to the first peak trigger voltage and the second peak trigger voltage of the plurality of peak trigger voltages comprises:
and calculating the first attenuation parameter according to the ratio of the average value of the first peak trigger voltage and the second peak trigger voltage to the difference value of the first peak trigger voltage and the second peak trigger voltage.
2. The method of claim 1, wherein the first attenuation parameter is equal to a result of adding the first peak trigger voltage and the second peak trigger voltage divided by a result of subtracting the first peak trigger voltage and the second peak trigger voltage.
3. The method of claim 1, wherein the first peak trigger voltage is close to and lower than a peak voltage of a corresponding first peak of the plurality of peaks, and the second peak trigger voltage is close to and lower than a peak voltage of a corresponding second peak of the plurality of peaks.
4. The method of claim 1, wherein the step of measuring the plurality of peaks of the coil signal during the consecutive oscillation cycles of the coil signal to obtain the plurality of peak trigger voltages comprises:
performing the following steps within one of the plurality of oscillation periods:
setting a reference voltage at a trigger starting potential;
after a trigger signal appears, controlling the reference voltage to gradually rise; and
the level of the reference voltage at the end of the trigger signal is obtained as a peak trigger voltage of the plurality of peak trigger voltages.
5. The method of claim 4, wherein the step of measuring the plurality of peaks of the coil signal during the consecutive oscillation cycles of the coil signal to obtain the plurality of peak trigger voltages respectively further comprises:
obtaining a first previous peak trigger voltage measured in a previous measurement period, and setting a value obtained by subtracting a preset voltage value from the first previous peak trigger voltage as the trigger starting potential; or
When the first previous peak trigger voltage is not obtained in the previous measurement period, executing the following steps:
obtaining a second previous peak trigger voltage in a previous oscillation period of the oscillation periods;
calculating an estimated peak trigger voltage according to the second previous peak trigger voltage; and
and setting the value obtained by subtracting the preset voltage value from the estimated peak trigger voltage as the trigger initial potential.
6. The method as claimed in claim 1, wherein the step of comparing the first attenuation parameter with the first threshold value to determine whether there is a metal foreign object in the power transmission range of the inductive power supply comprises:
when the first attenuation parameter is larger than the first critical value, judging that no metal foreign matter exists in the power transmission range of the induction type power supply; and
when the first attenuation parameter is smaller than the first critical value, the following steps are also executed:
obtaining a third peak trigger voltage of the plurality of peak trigger voltages;
calculating a second attenuation parameter according to the second peak trigger voltage and the third peak trigger voltage; and
the second attenuation parameter is compared with a second threshold value.
7. The method of claim 6, wherein the first threshold is obtained by adding a first value to a predetermined basic threshold, and the second threshold is obtained by adding a second value to the basic threshold, wherein the second value is smaller than the first value.
8. The metallic foreign matter detection method according to claim 1, further comprising:
calculating a plurality of attenuation parameters according to the plurality of peak trigger voltages; and
averaging the attenuation parameters to determine whether there is a metal foreign object in the power transmission range of the inductive power supply.
9. The method of claim 8, wherein the step of averaging the attenuation parameters to determine whether there is a metal foreign object in the power transmission range of the inductive power supply comprises:
obtaining an average result generated by averaging the attenuation parameters;
comparing the average result with a basic critical value;
when the average result is larger than the basic critical value, judging that no metal foreign matter exists in the power transmission range of the induction type power supply; and
and when the average result is smaller than the basic critical value, judging that metal foreign matters exist in the power transmission range of the induction type power supply.
10. A power supply module for an inductive power supply for performing a metal foreign object detection method, the power supply module comprising:
a power supply coil;
a resonance capacitor coupled to the power supply coil for resonating with the power supply coil;
at least one power supply driving unit, coupled to the power supply coil and the resonant capacitor, for sending at least one driving signal to the power supply coil to drive the power supply coil to generate energy, and interrupting the at least one driving signal during a measurement period to stop driving the power supply coil to generate a coil signal of the power supply coil;
a signal receiving module, coupled to the power supply coil, for receiving the coil signal of the power supply coil; and
a processor, coupled to the signal receiving module, for performing the following steps:
measuring a plurality of wave peaks of the coil signal in a plurality of continuous oscillation periods of the coil signal to respectively obtain a plurality of peak trigger voltages;
calculating a first attenuation parameter according to a first peak trigger voltage and a second peak trigger voltage in the plurality of peak trigger voltages; and
comparing the first attenuation parameter with a first critical value to judge whether metal foreign matters exist in a power transmission range of the induction type power supply;
the processor calculates the first attenuation parameter according to a ratio of an average value of the first peak trigger voltage and the second peak trigger voltage to a difference value of the first peak trigger voltage and the second peak trigger voltage.
11. The power supply module of claim 10 wherein the first attenuation parameter is equal to the result of the addition of the first peak trigger voltage and the second peak trigger voltage divided by the result of the subtraction of the first peak trigger voltage and the second peak trigger voltage.
12. The power supply module of claim 10 wherein the first peak trigger voltage is close to and lower than a peak voltage of a corresponding first one of the plurality of peaks, and the second peak trigger voltage is close to and lower than a peak voltage of a corresponding second one of the plurality of peaks.
13. The power supply module of claim 10 wherein the processor performs the following steps to measure the peaks of the coil signal in the consecutive oscillation cycles of the coil signal to obtain the peak trigger voltages respectively:
performing the following steps within one of the plurality of oscillation periods:
setting a reference voltage at a trigger starting potential;
after a trigger signal appears, controlling the reference voltage to gradually rise; and
the level of the reference voltage at the end of the trigger signal is obtained as a peak trigger voltage of the plurality of peak trigger voltages.
14. The power supply module of claim 13 wherein the processor further performs the following steps to measure the peaks of the coil signal in the consecutive oscillation cycles of the coil signal to obtain the peak trigger voltages respectively:
obtaining a first previous peak trigger voltage measured in a previous measurement period, and setting a value obtained by subtracting a preset voltage value from the first previous peak trigger voltage as the trigger starting potential; or
When the first previous peak trigger voltage is not obtained in the previous measurement period, the processor executes the following steps:
obtaining a second previous peak trigger voltage in a previous oscillation period of the oscillation periods;
calculating an estimated peak trigger voltage according to the second previous peak trigger voltage; and
and setting the value obtained by subtracting the preset voltage value from the estimated peak trigger voltage as the trigger initial potential.
15. The power supply module of claim 10, wherein the processor performs the following steps to compare the first attenuation parameter with the first threshold value to determine whether a metal foreign object exists in the power transmission range of the inductive power supply:
when the first attenuation parameter is larger than the first critical value, judging that no metal foreign matter exists in the power transmission range of the induction type power supply; and
when the first attenuation parameter is smaller than the first threshold value, the processor further performs the following steps:
obtaining a third peak trigger voltage of the plurality of peak trigger voltages;
calculating a second attenuation parameter according to the second peak trigger voltage and the third peak trigger voltage; and
the second attenuation parameter is compared with a second threshold value.
16. The power supply module of claim 15 wherein the first threshold is determined by adding a first value to a predetermined base threshold, and the second threshold is determined by adding a second value to the base threshold, wherein the second value is less than the first value.
17. The power module of claim 10, wherein the processor further performs the steps of: calculating a plurality of attenuation parameters according to the plurality of peak trigger voltages; and
averaging the attenuation parameters to determine whether there is a metal foreign object in the power transmission range of the inductive power supply.
18. The power supply module of claim 17 wherein the processor performs the following steps to average the attenuation parameters to determine whether metallic foreign objects are present within the power transmission range of the inductive power supply:
obtaining an average result generated by averaging the attenuation parameters;
comparing the average result with a basic critical value;
when the average result is larger than the basic critical value, judging that no metal foreign matter exists in the power transmission range of the induction type power supply; and
and when the average result is smaller than the basic critical value, judging that metal foreign matters exist in the power transmission range of the induction type power supply.
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