CN109115808A - A kind of dual-energy imaging method and system - Google Patents
A kind of dual-energy imaging method and system Download PDFInfo
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- CN109115808A CN109115808A CN201810985232.5A CN201810985232A CN109115808A CN 109115808 A CN109115808 A CN 109115808A CN 201810985232 A CN201810985232 A CN 201810985232A CN 109115808 A CN109115808 A CN 109115808A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
- G01N9/24—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity by observing the transmission of wave or particle radiation through the material
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Abstract
The invention discloses a kind of dual-energy imaging method and system.This method comprises: the picosecond laser is loaded on metal fibril, the sigmatron of Microfocus X-ray, high brightness is generated；According to the power spectrum of the sigmatron, filter disc and image forming medium combination are selected；The filter disc and image forming medium combination include two filter discs and two image forming mediums；The filter disc and the image forming medium cross arrangement；The sigmatron is irradiated on metal object, through filter and image forming medium combined imaging, obtains the dual intensity physical image of metal object.Dual-energy imaging of the invention has many advantages, such as time imaging of high time-space resolution, single-shot, and filter disc and image forming medium is only needed to combine and can be imaged, easy to operate succinct without being designed like system.
Description
Technical field
The present invention relates to dual-energy imaging fields, more particularly to a kind of dual-energy imaging method and system.
Background technique
X-ray imaging is widely used in inertial confinement fusion and high-energy density physical study field, while being also impact
The major way for loading lower substance diagnosis, is applied to research shock motion, surface dynamic fragmentation process and interfacial instability more
Property and mixing etc. processes.The physical process of low Z or middle Z material under existing extensive research Impulsive load, is mainly swashed using nanosecond
The X-ray that light generates, can point < 10keV.As that studies low Z materials gos deep into, high power picosecond laser generates sigmatron
It is necessary for carrying out such research.In these researchs, it is main diagnostic mode that X-ray list, which can be imaged, but Dan Nengdian
The dynamic range of imaging is limited, is not suitable for the wider physical process research of Density Distribution or the material containing multiple element as closed
The physical processes research such as gold, needs to develop dual-energy imaging technology.
Laser generate X-ray dual-energy imaging be generally difficult to realize, main reason is that its power spectrum be line spectrum, select energy
Mode, which is mainly reflected by multilayer film, to be realized.So dual-energy imaging technology is complicated, and more difficult development Physical Experiment is studied.
Summary of the invention
The object of the present invention is to provide a kind of dual-energy imaging method and system, with high time-space resolution, single-shot time imaging
The advantages that, and filter disc and image forming medium is only needed to combine and can be imaged, it is easy to operate succinct without being designed like system.
To achieve the above object, the present invention provides following schemes:
A kind of dual-energy imaging method, which comprises
The picosecond laser is loaded on metal fibril, the sigmatron of Microfocus X-ray, high brightness is generated；
According to the power spectrum of the sigmatron, filter disc and image forming medium combination are selected；The filter disc and image forming medium combination
Including two filter discs and two image forming mediums；The filter disc and the image forming medium cross arrangement；
The sigmatron is irradiated on metal object, through filter and image forming medium combined imaging, obtains metal visitor
The dual intensity physical image of body.
Optionally, the Source size of the sigmatron is 10 μm, energy 10keV-1MeV.
Optionally, the thickness of two filter discs is respectively 0.5mm and 1mm.
Optionally, the sigmatron is irradiated on metal object described, is combined into through filter and image forming medium
Picture obtains the dual intensity physical image of metal object, later further include:
The surface density of dual intensity physical image described in imaging grayscaling using metal step sample obtains surface density number
According to.
Optionally, the surface density of dual intensity physical image described in the imaging grayscaling using metal step sample, is obtained
Surface density data are obtained, are specifically included:
Obtain each step imaging gray value of the metal step sample；
Obtain the thickness of each step of the metal step sample；
The relationship being fitted between the imaging gray value and the thickness, obtains matched curve；
Obtain the gray value of the dual intensity physical image；
According to the gray value of the dual intensity physical image and the matched curve, the optical thickness of metal object is determined；
According to the density of the optical thickness of the metal object and the metal object, the surface density is calculated.
A kind of dual-energy imaging system, the system comprises:
Loading module generates the high energy X of Microfocus X-ray, high brightness for the picosecond laser to be loaded into metal fibril
Ray；
Selecting module selects filter disc and image forming medium combination for the power spectrum according to the sigmatron；The filter disc
It include two filter discs and two image forming mediums with image forming medium combination；The filter disc and the image forming medium cross arrangement；
Dual intensity physical image determining module, for the sigmatron to be irradiated to metal object, through filter and at
As combination of media imaging, the dual intensity physical image of metal object is obtained.
Optionally, the Source size of the sigmatron is 10 μm, energy 10keV-1MeV.
Optionally, the thickness of two filter discs is respectively 0.5mm and 1mm.
Optionally, the system also includes:
Demarcating module, for utilizing the surface density of dual intensity physical image described in the imaging grayscaling of metal step sample,
Obtain surface density data.
Optionally, the demarcating module specifically includes:
Gray value acquiring unit is imaged in step, and gray value is imaged in each step for obtaining the metal step sample；
Step thicknesses acquiring unit, for obtaining each step thicknesses of the metal step sample；
Fitting unit, the relationship for being fitted between the imaging gray value and the step thicknesses, obtains matched curve；
Gray value acquiring unit, for obtaining the gray value of the dual intensity physical image；
Optical thickness determination unit, for according to the dual intensity physical image gray value and the matched curve, really
The optical thickness of deposit category object；
Surface density computing unit, for according to the optical thickness of the metal object and the density of the metal object,
Calculate the surface density.
Compared with prior art, the present invention has following technical effect that the present invention is produced using the effect of high power picosecond laser
The dual-energy imaging diagnosis of raw Microfocus X-ray, sigmatron (imaging energy segment limit 50-200keV), thus there is high time-space resolution, list
The advantages that hair imaging；Using filter disc effectively modulation of X-ray power spectrum, be imaged under different power spectrums etc. efficiency point exist it is poor
It is different, realize dual-energy imaging.Being different from general dual-energy imaging mode can the main line required by multilayer film reflection of point selection
Shape X-ray realizes that sigmatron can effectively penetrate image forming medium, and loses smaller, only passes through filter disc and image forming medium group
Conjunction can realize dual-energy imaging, easy to operate succinct without other imaging systems.
Detailed description of the invention
It in order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, below will be to institute in embodiment
Attached drawing to be used is needed to be briefly described, it should be apparent that, the accompanying drawings in the following description is only some implementations of the invention
Example, for those of ordinary skill in the art, without any creative labor, can also be according to these attached drawings
Obtain other attached drawings.
Fig. 1 is the flow chart of dual-energy imaging of embodiment of the present invention method；
Fig. 2 is the schematic illustration of dual-energy imaging of embodiment of the present invention method；
Fig. 3 is the schematic diagram that the embodiment of the present invention selects suitable filter disc and image forming medium according to sigmatron power spectrum；
Fig. 4 is the imaging gray scale of step of embodiment of the present invention sample and the relation curve schematic diagram of thickness；
Fig. 5 is that the different imaging plate of figure of the embodiment of the present invention shows that the surface density of low energy point and high energy point X-ray diagnoses model
Enclose schematic diagram；
Fig. 6 is the structural block diagram of dual-energy imaging of embodiment of the present invention system.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
In order to make the foregoing objectives, features and advantages of the present invention clearer and more comprehensible, with reference to the accompanying drawing and specific real
Applying mode, the present invention is described in further detail.
Fig. 1 is the flow chart of dual-energy imaging of embodiment of the present invention method.As shown in Figure 1, a kind of dual-energy imaging method includes
Following steps:
Step 101: the picosecond laser being loaded on metal fibril, the sigmatron of Microfocus X-ray, high brightness is generated.
It is applied to metal fibril target (microfilament materials A u, diameter 12m) using picosecond laser, generates Microfocus X-ray, sigmatron source, source ruler
It is very little in 10m magnitude, X-ray energy range 10keV-1MeV, this X-ray can penetrate the sparse fracture area of metal material；Every hair
The total number of light photons mesh of generation reaches 1013, can be used for the single-shot imaging of high contrast；X-ray pulse can be used for height in 50ps or so
Time-resolved imaging.
Step 102: according to the power spectrum of the sigmatron, selecting filter disc and image forming medium combination.As shown in Fig. 2, described
Filter disc and image forming medium combination include two filter discs and two image forming mediums；The filter disc and the image forming medium cross arrangement.
By filter disc and image forming medium combination choose imaging can section (50-200keV), the filter disc thickness selected here be respectively 0.5mm and
1mm, image forming medium are imaging plate (Fuji, BAS-IPSR2025).Filter disc is mainly used for ending 50keV low energy X ray below,
Imaging plate essential record can effectively select imaging can section 50-200keV in 200keV X-ray below.Such as Fig. 3 institute
Show, sigmatron is simulated through the power spectrum after different filter discs, image forming medium by Monte Carlo software, it can be seen that more
Significant change occurs for imaging power spectrum under the conditions of kind filter disc, and X-ray absorption coefficient has apparent difference.
Step 103: the sigmatron being irradiated on metal object, through filter and image forming medium combined imaging, is obtained
To the dual intensity physical image of metal object.Sigmatron through imaging plate X-ray lose very little, thus can pass through filter disc, at
As the combination of plate, filter disc, imaging plate, the X-ray energy spectrum being imaged under the conditions of a variety of filter discs is chosen.
The sigmatron is irradiated on metal object described, through filter and image forming medium combined imaging, is obtained
The dual intensity physical image of metal object, later further include:
The surface density of dual intensity physical image described in imaging grayscaling using metal step sample obtains surface density number
According to.Obtain each step imaging gray value of the metal step sample；Obtain the thickness of each step of the metal step sample；
The relationship being fitted between the imaging gray value and the thickness, obtains matched curve；Obtain the ash of the dual intensity physical image
Angle value；According to the gray value of the dual intensity physical image and the matched curve, the optical thickness of metal object is determined；According to
The density of the optical thickness of the metal object and the metal object, calculates the surface density.
Using the surface density of step sample imaging grayscaling imaging, multiple steps are set here, and thickness is respectively
0.15mm, 0.3mm, 0.4mm, 0.45mm, 0.6mm, 0.75mm, 0.8mm, 1.2mm, 1.6mm and 2.0mm.By different filters
After piece, X-ray energy spectrum has biggish difference, thus on two pieces of imaging plates, the imaging gray scale of step sample and the relationship of thickness
There is biggish difference, as shown in figure 4, illustrating that the corresponding X-ray energy point of the two has very big difference.This is also confirmed that being capable of benefit
With filter disc and imaging plate combination, the dual-energy imaging of sigmatron can be realized.The step visitor surveyed by further inverting
Honorable density, Fig. 5 are shown in different x-ray and can put down, and the surface density diagnostic area of the two also has very big difference.Low energy point
Radiodiagnosis surface density range be 0-0.6g/cm2, and the surface density range of the radiodiagnosis of high energy point is 0-1.4g/
cm2.Mode described in the result this project can be realized dual-energy imaging.
The specific embodiment provided according to the present invention, the invention discloses following technical effects: the present invention utilizes high power
Picosecond laser effect generates the dual-energy imaging diagnosis of Microfocus X-ray, sigmatron (imaging energy segment limit 50-200keV), thus has
There are high time-space resolution, single-shot imaging；Using filter disc effectively modulation of X-ray power spectrum, it is imaged under different power spectrums
Etc. efficiency point have differences, realize dual-energy imaging.Selection can be put by, which being different from general dual-energy imaging mode, mainly passes through multilayer
Film reflects required linear X-ray to realize, sigmatron can effectively penetrate image forming medium, and loss is smaller, only passes through filter
Piece and image forming medium combination can realize dual-energy imaging, easy to operate succinct without other imaging systems.
Fig. 6 is the structural block diagram of dual-energy imaging of embodiment of the present invention system.As shown in fig. 6, a kind of dual-energy imaging system packet
It includes:
Loading module 601 generates the height of Microfocus X-ray, high brightness for the picosecond laser to be loaded into metal fibril
It can X-ray.The Source size of the sigmatron is 10 μm, energy 10keV-1MeV.
Selecting module 602 selects filter disc and image forming medium combination for the power spectrum according to the sigmatron；The filter
Piece and image forming medium combination include two filter discs and two image forming mediums；The filter disc and the image forming medium cross arrangement.Two
The thickness of a filter disc is respectively 0.5mm and 1mm.
Dual intensity physical image determining module 603, for the sigmatron to be irradiated to metal object, through filter
With image forming medium combined imaging, the dual intensity physical image of metal object is obtained.
The system also includes:
Demarcating module, for utilizing the surface density of dual intensity physical image described in the imaging grayscaling of metal step sample,
Obtain surface density data.
The demarcating module specifically includes:
Gray value acquiring unit is imaged in step, and gray value is imaged in each step for obtaining the metal step sample；
Step thicknesses acquiring unit, for obtaining each step thicknesses of the metal step sample；
Fitting unit, the relationship for being fitted between the imaging gray value and the step thicknesses, obtains matched curve；
Gray value acquiring unit, for obtaining the gray value of the dual intensity physical image；
Optical thickness determination unit, for according to the dual intensity physical image gray value and the matched curve, really
The optical thickness of deposit category object；
Surface density computing unit, for according to the optical thickness of the metal object and the density of the metal object,
Calculate the surface density.
Each embodiment in this specification is described in a progressive manner, the highlights of each of the examples are with other
The difference of embodiment, the same or similar parts in each embodiment may refer to each other.For system disclosed in embodiment
For, since it is corresponded to the methods disclosed in the examples, so being described relatively simple, related place is said referring to method part
It is bright.
Used herein a specific example illustrates the principle and implementation of the invention, and above embodiments are said
It is bright to be merely used to help understand method and its core concept of the invention；At the same time, for those skilled in the art, foundation
Thought of the invention, there will be changes in the specific implementation manner and application range.In conclusion the content of the present specification is not
It is interpreted as limitation of the present invention.
Claims (10)
1. a kind of dual-energy imaging method, which is characterized in that the described method includes:
The picosecond laser is loaded on metal fibril, the sigmatron of Microfocus X-ray, high brightness is generated；
According to the power spectrum of the sigmatron, filter disc and image forming medium combination are selected；The filter disc and image forming medium combination include
Two filter discs and two image forming mediums；The filter disc and the image forming medium cross arrangement；
The sigmatron is irradiated on metal object, through filter and image forming medium combined imaging, obtains metal object
Dual intensity physical image.
2. dual-energy imaging method according to claim 1, which is characterized in that the Source size of the sigmatron is 10 μm,
Energy is 10keV-1MeV.
3. dual-energy imaging method according to claim 1, which is characterized in that the thickness of two filter discs is respectively
0.5mm and 1mm.
4. dual-energy imaging method according to claim 1, which is characterized in that be irradiated to the sigmatron described
On metal object, through filter and image forming medium combined imaging, the dual intensity physical image of metal object is obtained, later further include:
The surface density of dual intensity physical image described in imaging grayscaling using metal step sample obtains surface density data.
5. dual-energy imaging method according to claim 4, which is characterized in that the imaging ash using metal step sample
Scale determines the surface density of the dual intensity physical image, obtains surface density data, specifically includes:
Obtain each step imaging gray value of the metal step sample；
Obtain the thickness of each step of the metal step sample；
The relationship being fitted between the imaging gray value and the thickness, obtains matched curve；
Obtain the gray value of the dual intensity physical image；
According to the gray value of the dual intensity physical image and the matched curve, the optical thickness of metal object is determined；
According to the density of the optical thickness of the metal object and the metal object, the surface density is calculated.
6. a kind of dual-energy imaging system, which is characterized in that the system comprises:
Loading module generates the sigmatron of Microfocus X-ray, high brightness for the picosecond laser to be loaded into metal fibril；
Selecting module selects filter disc and image forming medium combination for the power spectrum according to the sigmatron；The filter disc and at
As combination of media includes two filter discs and two image forming mediums；The filter disc and the image forming medium cross arrangement；
Dual intensity physical image determining module is situated between for the sigmatron to be irradiated to metal object through filter and imaging
Matter combined imaging obtains the dual intensity physical image of metal object.
7. dual-energy imaging method according to claim 1, which is characterized in that the Source size of the sigmatron is 10 μm,
Energy is 10keV-1MeV.
8. dual-energy imaging system according to claim 1, which is characterized in that the thickness of two filter discs is respectively
0.5mm and 1mm.
9. dual-energy imaging system according to claim 1, which is characterized in that the system also includes:
Demarcating module is obtained for the surface density of dual intensity physical image described in the imaging grayscaling using metal step sample
Surface density data.
10. dual-energy imaging system according to claim 9, which is characterized in that the demarcating module specifically includes:
Gray value acquiring unit is imaged in step, and gray value is imaged in each step for obtaining the metal step sample；
Step thicknesses acquiring unit, for obtaining each step thicknesses of the metal step sample；
Fitting unit, the relationship for being fitted between the imaging gray value and the step thicknesses, obtains matched curve；
Gray value acquiring unit, for obtaining the gray value of the dual intensity physical image；
Optical thickness determination unit, for according to the dual intensity physical image gray value and the matched curve, determine gold
Belong to the optical thickness of object；
Surface density computing unit, for calculating according to the optical thickness of the metal object and the density of the metal object
The surface density.
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