CN109001615A - Auto-Test System for the detection of active implantation medical equipment - Google Patents

Abstract

The invention provides an automatic test system for detecting active implantable medical instruments, including: a shifting tool, a power supply and a computer; the shifting tool is provided with a charging programmer, an induction coil and a test board, and the The shift tooling is used to change the relative position of the charging programmer and the induction coil; the test board is provided with elements for providing load to the circuit board under test and connecting the circuit board under test and the induction coil interface; the computer is respectively connected with the test board, the charging programmer and the power supply, and is used to control the components on the test board to provide loads to the circuit board under test, and to control the charging programmer through the The induction coil and the circuit board under test charge the power supply, and obtain the working parameters of the circuit board under test through the charging programmer.

Description

Automatic Test System for Testing Active Implantable Medical Instruments

technical field

The invention relates to the technical field of medical equipment testing, in particular to an automatic testing system for testing active implantable medical instruments.

Background technique

Human implantable medical device (Implantable Medical Device, IMD) is a medical device installed inside the user's body. This device has a battery, a circuit board (with sensors, chips and other components) inside, and the IMD depends on the set program And operating parameters to achieve corresponding therapy, these operating parameters can adopt different settings according to the user's disease situation. Because of the different causes and conditions of users, the implantable medical devices installed in different users generally have different operating states. These operating states are reflected in the battery voltage, operating time, power, and current of the implantable medical devices. Size, frequency and many other aspects.

In order to ensure the stability and safety of the implanted part, it is usually necessary to conduct a comprehensive inspection of the implanted part. The existing scheme uses manual inspection of the whole machine, which is inefficient, and the whole machine includes circuit boards, batteries, etc. And electrodes and other components, the pertinence of the detection process needs to be improved.

Contents of the invention

The invention provides an automatic test system for detection of active implantable medical instruments, comprising: a shifting tool, a power supply and a computer; the shifting tool is provided with a charging programmer, an induction coil and a test board, and the The shift tooling is used to change the relative position of the charging programmer and the induction coil; the test board is provided with components for providing load to the electric board under test and an interface connecting the circuit board under test and the induction coil The computer is respectively connected with the test board, the charging programmer and the power supply, and is used to control the components on the test board to provide load to the circuit board under test, and to control the charging programmer through the The induction coil and the circuit board under test charge the power supply, and obtain the working parameters of the circuit board under test through the charging programmer.

Preferably, the power supply is also used to provide power to the charging programmer, the test board and the circuit board under test, so that the circuit under test outputs waveform signals according to the load board provided by the test board.

Preferably, the system further includes an acquisition card for acquiring the waveform signal output by the circuit board under test; the computer acquires the waveform signal output by the circuit board under test through the acquisition card.

Preferably, the charging programmer is also used to read the inherent information of the circuit board under test through the induction coil; the computer determines signals for controlling the components on the test board according to the inherent information.

Preferably, the computer is also used to control the displacement tool to change the relative position of the induction coil and the charging programmer during the charging process.

Preferably, the shifting tool is also provided with a magnet; the computer is also used to control the shifting tool to change the relative position of the magnet and the circuit board under test, and detect the position of the electromagnetic switch on the circuit board under test. working status.

Preferably, the interface on the test board for connecting the circuit board under test is a golden finger interface.

Preferably, the working parameters include charging current, charging voltage and temperature.

Preferably, the computer is also used to read the working parameters of the charging programmer, and calculate the charging efficiency according to the working parameters of the tested circuit board and the working parameters of the charging programmer.

Preferably, the computer is also used to set the output parameters of the tested circuit board through the charging programmer and the induction coil.

The test system provided by the invention utilizes a power supply to simulate the battery of the implanted device, utilizes a charging programmer to simulate an in vitro charging device, utilizes an induction coil to simulate the coil of the implanted device, and utilizes a test board to simulate the peripheral circuit of the tested circuit board, so that the tested circuit The board is in the actual working environment, and at the same time, use the shifting tool to change the relative position of the charging programmer coil and the induction coil, so as to simulate the charging operation that may occur in the actual use process of the user, and control the charging process through the computer and read the tested circuit According to the working parameters of the board, the system conducts a highly targeted test on the circuit board of the implanted device. The entire test process is automated and has high work efficiency.

Description of drawings

The features and advantages of the present invention will be more clearly understood by referring to the accompanying drawings, which are schematic and should not be construed as limiting the invention in any way. In the accompanying drawings:

Fig. 1 is the structural representation of the automatic test system that is used for active implantable medical instrument detection in the embodiment of the present invention;

Fig. 2 shows a schematic structural view of a displacement tooling for automatic testing of an implanted medical instrument circuit board according to an embodiment of the present invention;

Fig. 3 shows a structural schematic diagram of another viewing angle of the displacement tooling for automatic testing of implanted medical instrument circuit boards according to an embodiment of the present invention;

Fig. 4 shows a schematic structural view of a displacement tooling for automatic testing of an implanted medical instrument circuit board according to another embodiment of the present invention;

Fig. 5 shows a structural schematic diagram of another perspective of the displacement tooling for automatic testing of implanted medical instrument circuit boards according to another embodiment of the present invention;

FIG. 6 is a flow chart of a method for detecting a circuit board in an embodiment of the present invention;

7 is a flowchart of another circuit board detection method in an embodiment of the present invention;

8 is a schematic structural diagram of a circuit board in an embodiment of the present invention;

Fig. 9 is a schematic structural view of a test board in an embodiment of the present invention;

Fig. 10 is a schematic diagram of the specific structure of the test board in the embodiment of the present invention.

Detailed ways

The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

The implanted device communicates wirelessly and charges/powers the battery/capacitor implanted in the body. Implanted devices generally include circuit boards, charging and communication coils, batteries, output electrodes, and several sampling resistors. The circuit board under test in the embodiment of the present invention is a circuit board in the implanted device. The circuit board is provided with various electrical components, which is the core component of the implanted device and is used to control the working state of the implanted device.

An embodiment of the present invention provides an automatic test system for active implantable medical instrument detection, the system can be used to detect DBS (deep brain stimulation, deep brain stimulation), VNS (vagusneve stimulation, vagus nerve stimulation), SCS ( Spinal cord stimulation, spinal cord stimulation) and SNM (Sacral Neuromodulation, sacral nerve stimulation system) and other rechargeable and non-rechargeable products. As shown in FIG. 1 , the system includes: a shifting tool 11 , a power supply 12 and a computer 13 . The shift tool 11 is provided with a charging programmer 14 , an induction coil 15 and a test board 16 , and the shift tool 11 is used to change the relative positions of the charging programmer 14 and the induction coil 15 .

There are multiple options for the specific structure of the shift tooling 11, for example, it can be an electric device with one or more guide rails, and the charging programmer 14 and the induction coil 15 can be respectively placed on two platforms that can realize relative movement, so that Changes in position between the two can be achieved. The measured object in the embodiment of the present invention has only the tested circuit board 10, and the induction coil 15 is a part of the test system, which simulates the charging and communication coil of the implanted device; the charging programmer 14 simulates an external charging device, charging An induction coil is also arranged inside the programmer 14 . The relative position in this embodiment may be a relative distance, and may also include a relative angle, etc., depending on the structure of the shifting tool 11. The present invention provides a preferred structure, which will be described in detail in subsequent embodiments.

The test board 16 is provided with components for providing load to the tested circuit board 10, the peripheral circuit of the tested circuit board 10 and the interface connecting the tested circuit board 10 and the induction coil 15, and the induction coil 15 communicates with the tested circuit board 16 through the test board 16. The circuit board 10 is connected. Components on the test board 16, for example, can include components such as several simulated loads, relays, simulated switches, electrodes, resistors, etc., these components are used to simulate the circuit board under test 10 connected in actual products such as output electrodes, sampling resistors, etc. device and simulate the actual load condition of the circuit board 10 under test.

Computer 13 is respectively connected with test board 16, charging programmer 14 and power supply 12, is used to control the component on the test board 16 to provide load to circuit board 10 under test, and the coil of control charging programmer 14 passes induction coil 15 and tested The circuit board 10 charges the power supply (the power supply is a battery simulator, which is set as a rechargeable battery during the charging test) 12, and obtains the operating parameters of the tested circuit board 10 through the charging programmer 14. These operating parameters can be collected by peripheral circuits on the test board 16 (such as temperature sampling resistors), and transmitted to the charging programmer 14 through the induction coil 15 .

During the charging process of the power supply 12, the shift tooling 11 can change the relative position of the coil of the charging programmer 14 and the induction coil 15, and the change of the distance or angle between the two will affect the working parameters of the circuit board 10 under test, for example, Including charging current, charging voltage, temperature, etc. The coil of the charging programmer 14 will communicate wirelessly with the induction coil 15 to read these parameters. For collecting the charging current, an ammeter 17 can be set between the power supply 12 and the test board 16 to measure the charging current, and then the computer 13 can compare the data with the charging current of the current sensor of the circuit board under test 10 carried by wireless communication. , these working parameters will be used as test results to judge whether the tested circuit board 10 is qualified and reliable. In the non-charging state, that is, the stage when the tested circuit board 10 is performing a treatment test, the ammeter 17 can be used to read the power consumption test data of the power supply.

The test system provided by the embodiment of the present invention uses a power supply (battery simulator) to simulate the battery of the implanted device, uses a charging programmer to simulate an external charging device, uses an induction coil to simulate the coil of the implanted device, and uses a test board to simulate the circuit board under test. The peripheral circuit makes the circuit board under test in the actual working environment, and at the same time uses the shifting tool to change the relative position of the charging programmer coil and the induction coil, so as to simulate the charging operation that may occur during the actual use of the user, and control the charging through the computer process and read the working parameters of the circuit board under test. The system performs a highly targeted test on the circuit board implanted in the device. The entire test process is automated and has high work efficiency.

As a preferred implementation, the computer 13 in this embodiment can also read the working parameters of the charging programmer 14, and calculate the charging efficiency according to the working parameters of the tested circuit board 10 and the working parameters of the charging programmer 14. Charging efficiency=charging current of the tested circuit board 10*voltage of the tested circuit board 10/(charging programmer voltage*charging programmer current).

The charging current and voltage of the tested circuit board 10 can be sampled by the tested circuit board 10 itself, the voltage and current of the charging programmer 14 can be sampled by the charging programmer, and the charging efficiency can also be calculated by the charging programmer 14 and sent to the computer 13.

Another embodiment of the present invention provides a system for detecting a circuit board implanted in a medical instrument. On the basis of the previous embodiment, the shifting tool 11 of this embodiment is further provided with a magnet. The implanted device is usually equipped with an electromagnetic switch for reset, and the user can trigger the switch through a magnet to achieve corresponding control. The magnet in this embodiment is used to detect the reset function of the circuit board 10 under test, and the computer 13 can control the shift tooling 11 Change the relative position of the magnet and the tested circuit board 10, and detect the working state of the electromagnetic switch on the tested circuit board 10.

As a preferred embodiment of the present invention, the shift tooling 11 of this embodiment is to control the position changes of two groups of devices, that is, the relative position between the magnet and the tested circuit board 10, and the relative position between the charging programmer 14 coil and the induction coil 15. For this reason, the present embodiment provides a preferred shifting tooling 11 structure, as shown in Figure 2 and Figure 3, the shifting tooling 11 includes: Y-axis guide rail A, X-axis guide rail B, translation stage 111, induction coil tooling 112, charging programmer coil tooling 113, magnet tooling 114, test board platform 115. The X-axis guide rail B is movably arranged on the Y-axis guide rail A and driven by the Y-axis guide rail A. The X-axis guide rail B and the Y-axis guide rail A are vertically arranged. The translation stage 111 is movably arranged on the X-axis guide rail B and driven by The X-axis guide rail B is driven, the induction coil tooling 112 and the magnet tooling 114 are fixedly installed on the translation platform 111 , and the induction coil tooling 112 and the magnet tooling 114 are arranged orthogonally on the translation platform 111 . The charging programmer coil tooling 113 is located at one end of the X-axis guide rail B and is fixedly arranged relative to the X-axis guide rail B; the test board platform 115 is located at one end of the Y-axis guide rail A and is fixedly arranged relative to the Y-axis guide rail A.

The induction coil tooling 112 is used to install the induction coil, and the charging programmer coil tooling 113 is used to install the coil of the charging programmer. The induction coil tooling 112 and the charging programmer coil tooling 113 can realize the detachable installation of the induction coil and the charging programmer.

In the shifting tool 11 of this embodiment, the coil of the charging programmer 14 is installed in the charging programmer coil tooling 113 , and the induction coil 15 is installed in the induction coil tooling 112 . In order to adapt to the testing of different types of products and enhance the versatility of the shift tooling 11, the charging programmer coil tooling and the induction coil tooling 1 adopt a unified fixing and wiring method. When testing different products, only need to replace the charging programmer Coil tooling and induction coil tooling are sufficient.

In the shift tooling 11 of this embodiment, the coil tooling 113 of the charging programmer and the coil of the charging programmer 14 are fixedly installed on one end of the X-axis guide rail B; corresponding to the coil of the charging programmer 14, it is movably arranged on The translation platform 111 on the X-axis guide rail B, the translation platform 111 is provided with an induction coil tooling 112 aligned with the coil of the charging programmer 14, the induction coil 15 is installed on the induction coil tooling 112, and the translation platform 111 is also provided with The magnet tooling 114 arranged orthogonally to the induction coil tooling and the magnet installed on the magnet tooling 114, the translation platform 111 is controlled by the X-axis guide rail B to move, and the translation platform 111 drives the induction coil and the magnet to move together. In the shift tooling 11 of this embodiment, one end of the Y-axis guide rail A is provided with a test board platform 115, and a test board 16 is provided on the test platform; the X-axis guide rail B is vertically arranged on the Y-axis guide rail A, and the X-axis guide rail B and All the structures installed on the X-axis rail B are controlled by the Y-axis rail A. In the shifting tool 11 of this embodiment, the motion control of the Y-axis guide rail A and the X-axis guide rail B can be independently performed.

In order to meet the requirements of the communication test and ensure the stability of the communication during the test, in the shift tooling 11 of the present embodiment, the coil alignment of the induction coil 15 and the charging programmer 14 is not affected by the movement of the translation platform 111; the induction coil 15 The relative distance to the coil of the charging programmer 14 is controlled by the X-axis guide rail B and changes with the movement of the translation platform 111 .

As an alternative way, as shown in Figure 4, the coil tooling of the charging programmer can also be set on the translation platform and move with the movement of the translation platform, and the induction coil tooling is fixed on one end of the X-axis guide rail, that is, the In the embodiment, the induction coil tooling and the charging programmer tooling are interchanged.

In order to satisfy the detection of the reset function of the circuit under test 10 and enhance the versatility of the shifting tool 11 , the shifting tool 11 in this embodiment can realize relative position adjustment between the magnet and the circuit board under test 10 . In the shifting tool 11 of this embodiment, the magnet is installed on the magnet tooling 114 , and the position of the magnet on the magnet tooling 114 can be adjusted. One end of the Y-axis guide rail A is provided with a test board platform 115 , and a test board 16 is provided on the test platform, and the tested circuit board 10 is mounted on the test board 16 . In the displacement platform 11, the magnet tooling 114 and the X-axis guide rail B can adjust the alignment of the magnet and the electromagnetic switch on the circuit board 10 under test, and the Y-axis guide rail A controls the movement of the X-axis guide rail B to realize the alignment between the magnet and the circuit board 10 under test. relative distance adjustment.

The translation platform 111 of the shift tooling of this embodiment is provided with a second mounting frame 1111 and a first mounting frame 1112 arranged orthogonally, the induction coil tooling 112 is detachably mounted on the second mounting frame 1111, and the magnet tooling 114 can be It is detachably installed on the first mounting frame 1112. In order to ensure that the magnet on the X-axis guide rail B can be aligned with the electromagnetic switch on the circuit board 10 under test during the magnet function test, the magnet tooling 114 includes a sliding frame 1141 and a slider 1142, the sliding frame 1141 is installed on the first mounting frame 1112 slidably up and down through the vertical slide rails arranged on the first mounting frame 1112, the sliding frame 1141 is provided with a horizontal sliding rail along the X-axis direction, and the sliding block 1142 It can be horizontally slid left and right through the horizontal slide rail and installed on the sliding frame 1141. The slider 1142 is provided with a magnet installation part 1142a for installing the magnet, so that the magnet can be adjusted by moving up and down, left and right relative to the circuit board under test during the magnet function test. To ensure the alignment of the magnetic switch on the circuit board under test. Since the induction coil tooling 112 and the magnet tooling 114 are all arranged on the translation platform 111, in order to avoid the interference of the induction coil by the magnet tooling 114, the distance between the center of the induction coil tooling 112 of the present embodiment and the center distance of the magnet mounting part 1142a on the magnet tooling 114 Not less than 5cm.

In addition, the shifting tooling of this embodiment is also provided with a first locking structure for locking the sliding frame 1141 on the first mounting frame 1112 and a first locking structure for locking the sliding block on the sliding frame 1141. The second locking structure, when the magnet is aligned with the electromagnetic switch of the circuit board under test, the position of the magnet is locked by the first locking structure and the second locking structure, and the first locking structure and the second locking structure are preferably fasteners.

In addition to the above-mentioned components, the shifting tooling of this embodiment also includes a tooling base 116, and the X-axis guide rail B, the Y-axis guide rail A, the charging programmer coil tooling 113 and the test board platform 115 are all fixedly arranged on the On the frock base 116.

The test functions involved in using the shift tooling of this embodiment are introduced below in conjunction with the accompanying drawings, as shown in Figures 2 and 3:

1. Communication function:

Control the translation platform 111 to move along the X-axis guide rail B, adjust the distance between the charging programmer coil and the induction coil, and perform a communication distance test.

2. Magnet control function:

a Control the translation platform 111 to move along the X-axis guide rail B, adjust the distance between the charging programmer coil and the induction coil, realize communication, and confirm the magnet control test;

b Control the movement of the translation platform 111 along the X-axis guide rail B, so that the magnet on the translation platform 111 is aligned with the electromagnetic switch on the circuit board under test; control the X-axis guide rail B to move along the Y-axis guide rail A, so that the magnet is close to the circuit under test Electromagnetic switch on the board;

c Control the X-axis guide rail B to move along the Y-axis guide rail A, so that the magnet is far away from the electromagnetic switch on the circuit board under test;

d The charging programmer coil communicates with the induction coil to read the test results.

3. Hardware reset function:

a Control the translation platform 111 to move along the X-axis guide rail B, adjust the distance between the charging programmer coil and the induction coil, realize communication, and confirm the hardware reset test;

b Control the translation table 111 to move along the X-axis guide rail B, make the induction coil close to the charging programmer coil, and align the magnet with the electromagnetic switch on the circuit board under test;

c Control the X-axis guide rail B to move along the Y-axis guide rail A, so that the magnet is close to the electromagnetic switch on the circuit board under test;

d wait for a while;

e controls the X-axis guide rail B to move along the Y-axis guide rail A, so that the magnet is away from the electromagnetic switch on the circuit board under test; controls the translation table 111 to move along the X-axis guide rail B, so that the induction coil is far away from the charging programmer coil, and returns to the initial position.

f The charging programmer coil communicates with the induction coil to read the test results.

4. Charging distance:

a Control the translation platform 111 to move along the X-axis guide rail B, adjust the distance between the charging programmer coil and the induction coil, realize communication, and confirm the magnet control test;

b According to the test requirements, control the translation table 111 to move along the X-axis guide rail B, so that the distance between the charging programmer coil and the induction coil reaches 0cm, 1cm, 2cm, and up to 10cm;

c Under different distance conditions, charge and return test results.

The control of the above-mentioned relative position by the shifting tool 11 may be performed independently, for example, it may be independently controlled by a controller provided in the shifting tool 11 . In order to improve the overall convenience, the present embodiment adopts computer 13 to control the shift tool 11, that is, the computer 13 in this embodiment is also used to control the shift tool 11 to change the induction coil 15 and charging programming during charging or communication. The relative position of the device 14 coils.

The realization of the present invention is not limited to the above-mentioned preferred embodiment, but also includes other embodiments, such as shown in Figure 4 and Figure 5, the difference between the shift tool and the shift tool of the above-mentioned preferred embodiment is: the test of the shift tool The board and the tested circuit board are fixedly arranged on one side of the induction coil 112 of the translation stage, and the magnet tooling is fixedly arranged on one end of the Y-axis guide rail and relative to the Y-axis guide rail. The advantage of setting the test board and the induction coil on the translation platform is that the connection between the two will not move with the movement of the translation platform, which further ensures the stability and accuracy of the test.

Specifically, the test board and the tested circuit board of the shifting tool are also arranged on the translation platform, and the test board is located on one side of the coil or induction coil of the charging programmer on the translation platform, and the tested The circuit board and the coil or induction coil of the charging programmer are arranged orthogonally; the magnet tooling includes a second fixed platform 118 that is arranged at one end of the Y-axis guide rail and is fixedly arranged relative to the Y-axis guide rail and is movably arranged on the Y-axis guide rail. The magnet position adjustment mechanism on the second fixed table 118, the magnet is installed on the magnet adjustment mechanism, the position of the magnet can be adjusted by the magnet adjustment mechanism so that the magnet is aligned with the circuit board under test Calibrate and adjust the distance between the two.

Further, the magnet position adjustment mechanism includes a sliding table 119, a first mounting frame and a sliding frame, wherein the sliding table 119 is slidably arranged on the second fixed table 118 along the X-axis direction, and the first mounting frame is fixed on The sliding table 119 is arranged towards the side of the tested circuit board, and the sliding frame can be slidably installed on the board surface of the first installation frame facing the side of the tested circuit board, and the magnet is fixedly installed on the side of the tested circuit board. The first carriage is far away from the end of the coil or induction coil of the charging programmer. Through the arrangement of the above-mentioned magnet position adjustment mechanism, the position of the magnet can be adjusted relative to the tested circuit board in the X-axis direction, the Y-axis direction and the vertical height direction, so as to realize the required alignment or distance operation during the test.

Still further, the sliding frame is also provided with a slider that can slide along the X-axis direction, and the slider is provided with a magnet mounting portion for mounting the magnet. The position of the magnet in the X-axis direction can also be adjusted through the slider.

The test function related to the shift tooling using this alternative embodiment is introduced below in conjunction with the accompanying drawings, as shown in Figure 4 and Figure 5:

1. Communication function:

Control the translation platform 111 to move along the X-axis guide rail B, adjust the distance between the charging programmer coil and the induction coil, and perform a communication distance test.

2. Magnet control function:

a Control the translation platform 111 to move along the X-axis guide rail B, adjust the distance between the charging programmer coil and the induction coil, realize communication, and confirm the magnet control test;

b controls the sliding table 119 to move along the X-axis direction on the second fixed table 118, so that the magnet is aligned with the electromagnetic switch on the tested circuit board on the translation table; controls the X-axis guide rail B to move along the Y-axis guide rail A, so that The electromagnetic switch of the circuit board under test is close to the magnet;

c Control the X-axis guide rail B to move along the Y-axis guide rail A, so that the electromagnetic switch of the circuit board under test is far away from the magnet;

d The charging programmer coil communicates with the induction coil to read the test results.

3. Hardware reset function:

a Control the translation platform 111 to move along the X-axis guide rail B, adjust the distance between the charging programmer coil and the induction coil, realize communication, and confirm the hardware reset test;

b Control the translation table 111 to move along the X-axis guide rail B, make the induction coil close to the charging programmer coil, and control the sliding table 119 to move along the X-axis direction on the second fixed table 118, so that the magnet is aligned with the electromagnetic on the circuit board under test switch;

c Control the X-axis guide rail B to move along the Y-axis guide rail A, so that the magnet is close to the electromagnetic switch on the circuit board under test;

d wait for a while;

e controls the X-axis guide rail B to move along the Y-axis guide rail A, so that the electromagnetic switch on the circuit board under test is away from the magnet; controls the translation table 111 to move along the X-axis guide rail B, so that the induction coil is far away from the charging programmer coil, and returns to the initial position.

f The charging programmer coil communicates with the induction coil to read the test results.

4. Charging distance:

a Control the translation platform 111 to move along the X-axis guide rail B, adjust the distance between the charging programmer coil and the induction coil, realize communication, and confirm the magnet control test;

b According to the test requirements, control the translation table 111 to move along the X-axis guide rail B, so that the distance between the charging programmer coil and the induction coil reaches 0cm, 1cm, 2cm... until 10cm;

c Under different distance conditions, charge and return test results.

The control of the above-mentioned relative position by the shifting tool 11 may be performed independently, for example, it may be independently controlled by a controller provided in the shifting tool 11 . In order to improve the overall convenience, the present embodiment adopts computer 13 to control the shift tool 11, that is, the computer 13 in this embodiment is also used to control the shift tool 11 to change the induction coil 15 and charging programming during charging or communication. The relative position of the device 14 coils.

It should be noted that, using the shifting tool of this embodiment, the relative position of the circuit board under test 10 and the operator is convenient for the operator to insert and remove the circuit board under test from the golden finger socket with both hands. The magnet is placed in the magnet tooling on the translation platform. The translation platform can adjust the distance between the tested circuit board and the magnet along the Y axis. The magnet is close to the magnet at 0-2cm when testing the hardware reset function, and the distance is kept at 0-2cm when testing other items. More than 8cm to avoid the unintended effect of the magnet on the dry reed switch on the circuit board under test. The coil of the charging programmer is placed in the coil tooling of the charging programmer on the translation platform, and the induction coil is placed at the fixed end of the X-axis guide rail. The translation platform can adjust the distance between the coil of the charging programmer and the induction coil along the X-axis to meet Communication distance (0-5cm), charging distance (0-2cm) test. The hardware reset function requires the cooperation of the X-axis and the Y-axis. When testing the hardware reset function, the distance between the tested circuit board and the magnet is adjusted to 0-2cm, and the distance between the coil of the charging programmer and the induction coil is adjusted to 0-5cm. The magnet and the charging programmer coil are all located on the tooling placed on the translation platform 99, and the distance between them is not less than 5cm. The coil of the charging programmer and the induction coil must move synchronously, always keeping the central axis centered. The circuit board under test should always keep a distance of more than 8cm from the magnet, and only approach it during hardware reset and magnet function testing.

In order to test the performance of the circuit board more comprehensively, the present embodiment also collects the output signal of the circuit board 10 under test. The power supply 12 in this embodiment is also used to provide electric energy to the charging programmer 14, the test board 16 and the circuit board under test 10, so that the load board output waveform signal provided by the circuit under test according to the test board 16, such as electric pulse stimulation Signal.

Correspondingly, the system also includes an acquisition card 18 for acquiring the waveform signal output by the circuit board 10 under test, and the computer 13 acquires the waveform signal output by the circuit board 10 through the acquisition card.

The computer 13 can also set the output parameters of the tested circuit board through the charging programmer 14 and the induction coil 15 . The computer 13 controls the charging programmer to program the tested circuit board 10 through wireless communication, and the pulse output amplitude and frequency of the tested circuit board 10 can be set, for example, according to test requirements.

The testing of the output waveform, the testing of the charging process, and the testing of the reset function can be performed in any order, and these testing operations do not conflict.

Those skilled in the art can understand that there are usually various types and models of implant devices provided by manufacturers, such as brain pacemakers and spinal cord stimulators. In order to enable the detection system provided by the present invention to detect circuit boards from different implanted devices, as a preferred embodiment, the charging programmer 14 in this embodiment is also used to read the circuit board 10 under test through the induction coil 15. Intrinsic information from which the computer 13 can determine signals for controlling the components on the test board 16 . Therefore, suitable load signals can be provided to different types of circuit boards, so that the system has good scalability.

The above-mentioned process of reading inherent information should be carried out before the detection starts. Integrating the above-mentioned detection functions, the embodiment of the present invention also provides a detection method, which is executed by the above-mentioned computer 13, as shown in FIG. 6 , the method includes the following steps:

S1, obtain the inherent information of the tested circuit board 10 implanted in the device through the charging programmer 14, which can be recorded in the tested circuit board 10 or in the charging programmer 14, specifically can be type information, model information, etc.;

S2A, determine the distance value and the charging parameter according to the inherent information, the distance value represents the distance between the coil of the charging programmer 14 and the induction coil 15; the charging parameter can be, for example, the charging current. Before testing, each inherent information and its corresponding test scheme (comprising distance value and charging parameter) can be stored in the computer 13, when the test board 16 is connected with the circuit board under test 10 after the detection starts, the computer 13 can Obtain the inherent information, and query the corresponding test plan (including distance value and charging parameters).

S3A, sending the charging parameters to the charging programmer 14 and the circuit board 10 under test. The charging parameters in this embodiment include power output parameters suitable for the charging programmer 14 and power receiving parameters suitable for the tested circuit board 10 . These charging parameters can specify, for example, that the charging programmer 14 outputs electric energy at one or more charging currents, and correspondingly can also specify that the circuit board under test 10 switch appropriate resistance parameters to adapt to the charging current. As mentioned above, the computer 13 is connected to the test board 16 , and the charging parameters can be transmitted to the circuit board 10 under test through the test board 16 .

S4A, control the mobile tooling 11 according to the distance value to adjust the distance between the coil of the charging programmer 14 and the induction coil 15, the computer 13 sets the power supply 12 to a charged state, and controls the charging programmer 14 to pass through the induction coil 15 and the circuit board under test 10 Line charging of the power source 12 based on the charging parameters. This step can be implemented in a variety of ways. For example, one or more of the above-mentioned distance values can be set, that is, the two can be wirelessly charged at a fixed or multiple different distances; at each distance, the corresponding charging parameters It is also possible to set one or more devices to flexibly and comprehensively detect the charging effect according to the needs of products and users.

S5A, receiving the operating parameters fed back by the tested circuit board 10 according to the charging parameters, specifically the operating parameters recorded by the sensors on the tested circuit board 10 can be read through the test board 16, such as charging voltage, charging current, and temperature values Wait;

For some operating parameters, such as temperature values, the test board 16 also has some peripheral circuits, which can include temperature sampling resistors, that is, the test board 16 can also collect operating parameters such as temperature generated in the charging process at the same time, so The aforementioned working parameters may also include parameters detected by the test board 16 .

S6A, judge whether the tested circuit board 10 is normal according to the working parameters, for example, judge whether the charging voltage, charging current, temperature value, etc. of the tested circuit board 10 meet expectations, so as to determine whether its state is normal.

The detection method provided by the embodiment of the present invention determines the corresponding test parameters by automatically obtaining the inherent information of the circuit board under test, and sends appropriate charging parameters to the charging programmer and the circuit board under test, so that the circuit board under test is in the actual working environment At the same time, the relative position of the coil of the charging programmer and the induction coil is changed by using the shift tooling to simulate the charging operation that may occur during the actual use of the user. This method controls the charging process by the computer and reads the work of the tested circuit board. Parameters, so as to carry out targeted detection on the circuit board of the implanted device. The detection process realizes automatic operation and has high work efficiency.

In order to improve convenience and accuracy, the above-mentioned inherent information is preferably stored in the tested circuit board 10, and the above-mentioned step S1 may specifically include the following steps:

S11 , sending a starting signal to the charging programmer 14 , and waiting for the charging programmer 14 to communicate with the circuit board under test 10 through the induction coil 15 to obtain intrinsic information.

S12 , receiving the inherent information fed back by the charging programmer 14 .

The start signal can be a simple digital signal. After receiving the start signal, the charging programmer 14 can wirelessly send a handshake signal to the circuit board under test 10. The signal can be a waveform signal; the circuit board under test 10 can analyze the handshake signal In response, the inherent information is sent to the charging programmer 14 and then to the computer 13 .

As a preferred implementation manner, the charging parameters in this embodiment include charging time and charging current, wherein each distance value corresponds to the same charging time and multiple charging currents. For example, four distance values X1...X4, charging time t, and charging current A1...A4 can be preset. These parameters can form various combinations, and S4A can include the following steps:

S4A1, control the mobile tooling 11 to set the charging programmer 14 and the induction coil 15 respectively at various distances and stay for a corresponding charging time;

S4A2, controlling the charging programmer 14 to charge the power supply 12 based on multiple charging currents respectively through the induction coil 15 and the circuit board under test 10 during the stay.

For example, you can stay at least 4*t (four time periods of the same length) at the distance of X1, and use A1...A4 to charge in each time period, thereby completing the corresponding charging action of X1; then adjust the distance to X2 , also stay in four time periods of the same length, and use A1...A4 to charge in each time period, and then use the same operation method at X3 and X4 distances to complete the corresponding charging actions of X1...X4.

S5A is carried out synchronously with S4A, and the computer 13 collects the operating parameters of the circuit board 10 under test in the above-mentioned charging process in real time, thus four sets of parameters can be obtained, that is, the corresponding operating parameters of four different distances, wherein each set of parameters includes the same The working parameters corresponding to the four charging currents.

The above preferred detection solution can accurately detect the working state of the tested circuit board under different charging parameters at different distances, thereby improving the reliability of the detection results.

In order to further improve the reliability and convenience of the detection operation, after the above step S1, it may also include:

S1A, determining the criterion parameter according to the inherent information, this step can be performed synchronously with S2A. The criterion parameters therein should correspond to the working parameters collected in step S5A, for example, may include standard charging voltage, standard charging current, temperature upper limit and so on.

In the case that the criterion parameter can be obtained, step S6A may include the following steps:

S6A1, comparing the working parameter with the criterion parameter;

S6A2, judge whether the circuit board 10 under test is normal according to the comparison result, for example, judge whether the working parameter is consistent with the criterion parameter, or whether the error between the two is within an acceptable range, so as to determine whether the circuit board 10 under test is normal.

The following is an introduction to the detection operation of the output waveform. After step S1, the computer 13 can control the charging programmer 14 to set the tested circuit board 10 through wireless communication, such as setting its output amplitude and frequency, etc., and then carry out the detection process of the output signal, specifically, as shown in the figure As shown in 7, the method may also include the following steps:

S2B, determine the load parameter and the power supply parameter according to the inherent information, the load parameter and the power supply parameter may also be part of the test plan, and this step may be performed synchronously with the above step S2A. The load parameters and power supply parameters of various types or models are different. The load parameters are, for example, 1k resistors for neurostimulators, and 500 ohm resistors for spinal cord stimulators; the power supply parameters are, for example, supply voltage.

S3B, control the power supply 12 to supply power to the tested circuit board 10 according to the power supply parameters, and the computer 13 sets the power supply 12 to an output power state, and supplies power to the tested circuit board 10 to simulate the actual working state;

S4B, send load parameters to the test board 16 connected to the circuit board under test 10, the test board 16 will adjust its component state according to the received load parameters to simulate the load of the circuit board under test 10, so that the circuit board under test 10 is under load Output waveform signal under the influence of parameters;

S5B, obtaining the waveform signal output by the circuit board 10 under test through the acquisition card 18;

S6B, judging whether the tested circuit board 10 is normal according to the waveform signal.

The above steps S3B-S6B and steps S3A-S6A are performed in isolation without interfering with each other. This method performs automatic detection on the output signal of the circuit board 10 under test, further improving the comprehensiveness and convenience of the detection operation.

For the judgment of the output waveform, similar to step S1A, it may also include after step S1:

S1B, determining a criterion signal according to inherent information;

In this case step S6B may include:

S6B1, comparing the waveform signal with the criterion signal;

S6B2, judging whether the tested circuit board 10 is normal according to the comparison result, there are many specific ways of signal comparison, which will not be repeated in the present invention.

In addition to the detection of the charging function and the output signal, the step of detecting the reset function of the circuit board 10 under test can also be added. This step is carried out under the state that the power supply 12 is guaranteed to supply power to the circuit board 10 under test, and the computer 13 controls the mobile tooling 11 The magnet on the top is close to the tested circuit board 10, and at the same time, it can be checked whether the tested circuit board 10 is reset (various parameters are restored to the initial value) through the charging programmer 14.

An embodiment of the present invention provides a computer device, including: at least one processor; and a memory connected in communication with the at least one processor; wherein, the memory stores a computer program that can be executed by the at least one processor, and the computer program is executed by at least one processor. The processor is executed, so that at least one processor executes the above-mentioned detection method for the circuit board of the implanted medical instrument.

The test board 16 and the circuit board under test 10 in the embodiment of the present invention will be described in detail below with reference to FIG. 8 and FIG. 9 .

An embodiment of the present invention provides a tested circuit board 10, which includes a base 101 and a tested part 102, wherein the tested part 102 is a circuit board of an implanted device.

The base part 101 is provided with a through hole for accommodating the part under test 102 . In this embodiment, the tested part 102 is an approximately arc-shaped structure, and correspondingly, the middle part of the base part 101 is cut out to form a through hole.

The edge of the tested part 102 is connected to the edge of the through hole through several cuttable parts 103 , and the tested part 102 and the base part 101 are in the same plane. In order to make the connection between the two more stable, a plurality of cuttable parts 103 are provided in this embodiment, and gaps are left at positions other than the cuttable parts 103 .

One end of the base 101, that is, the upper position of FIG. 8 is provided with a plurality of conductive contacts 104 for connecting external test equipment (such as the test board 16 in the above-mentioned embodiment), and these conductive contacts 104 form golden finger plugs (test boards). 16 is provided with the corresponding gold finger socket) laying on the end of the base 101. The conductive contacts 104 are respectively connected to each connection point on the tested part 102 through wires arranged in the base part 101 and the tested part 102, and the wires can pass through the gap between the base part 101 and the tested part 102 through the adjacent cuttable part 103 .

So set, when the circuit board under test 10 is inserted into the test board 16, the components on the test board 16 (peripheral circuits, such as sampling resistors, output electrodes, etc.) and the connection points on the part under test 102 form an electrical connection relationship, and the test The board 16 provides analog loads, power supply, charging coils and communication coils, titanium shell temperature sampling analog resistors and battery temperature sampling analog resistors to the tested part 102, so that the tested part 102 responds.

According to the circuit board under test provided in the embodiment of the present invention, the base part surrounds the part under test. When testing is required, equipment such as operators or manipulators can clamp the base part and insert it into the test equipment. The base part is used as an actual force-bearing object. The tested part can be well protected, and the tested part can be cut off from the base after the test is completed, so that the whole test process is safe and convenient.

The part under test 102 in the circuit board under test provided in the embodiment of the present invention is provided with a charging coil connection point 105 and a communication antenna connection point 106, both of which extend to the outside of the part under test 102. In this embodiment, the two are distributed On both sides of the measured portion 102 , extending outward from the straight end. In order to effectively protect the coil connection point, the area of the through hole needs to be sufficient to accommodate the measured part, the charging coil connection point 105 and the communication coil connection point 106, and the shape of the through hole is also set according to the protruding length of the antenna connection point. Further, the connection point 105 of the charging antenna and the connection point 106 of the communication antenna are respectively connected to the edge of the through hole through several cuttable parts 103 .

In order to realize the detection of the charging function, the connection points related to the charging function on the tested circuit board 10 need to be connected with the test board 16, so the conductive contact piece 104 in this embodiment includes a charging coil for connecting the tested part. The first conductive contact of the connection point 105 and the communication coil connection point 106 . 1, when the charging programmer 14 is charged through the induction coil 15, the charging antenna and the communication antenna connected to the test board 16 start to work, so that the charging coil connection point 105 and the communication coil connection point 106 receive signals.

The conductive contact piece 104 also includes a second conductive contact piece for connecting the temperature sampling resistor connection point 107 on the measured part. For example, the second conductive contact piece may include a conductive contact piece for connecting the connection point of the temperature sampling resistor of the titanium metal shell and a conductive contact piece for connecting the connection point of the battery temperature sampling resistor. Combined with the system shown in Figure 1, when the charging programmer 14 is charged through the induction coil 15, the titanium metal shell temperature sampling resistor and the battery temperature sampling resistor on the test board 16 generate temperature signals, and transmit them to the measured temperature through the second conductive contact piece. The temperature sampling resistor connection point 107 of the circuit board 10 enables the relevant components on the measured part to complete the collection of temperature values.

The conductive contact piece 104 also includes a third conductive contact piece for connecting the power supply connection point 108 on the tested part, so that the tested part 102 is connected to the power source 12 to implement power supply or charging operation.

In order to realize the detection of the output waveform, the conductive contact piece 104 also includes a fourth conductive contact piece for connecting the signal output electrode connection point 109 on the measured part. In this embodiment, the tested part 102 is provided with sixteen signal output electrode connection points, and the base 101 is provided with a conductive contact piece corresponding to each electrode connection point, which are respectively connected to multiple loads on the test board 16 . Combined with the system shown in FIG. 1 , when the power supply 12 starts to supply power, the signal output electrode connection point 109 will output a waveform signal, and transmit it to the signal output electrode on the test board 16 , and finally transmit it to the computer 13 through the acquisition card 18 .

Conductive contact piece 104 also comprises the 5th conductive contact piece that is used for writing program, is mainly used for writing program to the single-chip microcomputer on the tested circuit board 10, after circuit board soldering finishes and reliability test, may write into the automatic function of single-chip microcomputer. The testing procedure is different, and setting the fifth conductive contact can improve the efficiency of the writing procedure.

The specifications of the base portion 101 of the circuit board under test provided by the embodiment of the present invention may be fixed, that is, a base portion 101 may be applicable to the portion under test 102 of different products, and for the portion under test 102 of different products, the The types of connection points may be different; the number may be different, for example, the number of connection points of output electrodes is different. For this reason, enough conductive contacts need to be set on the base 101 to cope with different measured parts 102, and the number of conductive contacts 104 needs to be greater than or equal to the number of connection points on the tested part 102 to improve versatility. There is no need to produce different bases 101 for each type of part 102 to be tested, and production costs can be reduced.

The circuit boards of different implanted products have the same definition of gold finger tube legs, and the test board 16 can be used in common, that is, one test board 16 can take into account DBS (deep brain stimulation, deep brain stimulation), VNS (vagusneve stimulation, vagus nerve stimulation), SCS ( Spinal cord stimulation, spinal cord stimulation) and SNM (Sacral Neuromodulation, sacral nerve stimulation system) and other rechargeable and non-rechargeable products have good versatility and high test efficiency.

Correspondingly, an embodiment of the present invention provides an implanted medical instrument detection circuit board as the above-mentioned test board 16, as shown in FIG. 9 , the test board 16 includes:

The tested circuit board connection part 161 is used to connect the tested circuit board 10. In this embodiment, the gold finger socket is used to connect with the gold finger plug (conductive sheet arranged at the end) of the tested circuit board 10. The gold finger The socket can accommodate circuit boards of different thicknesses.

The peripheral circuit 162 of the circuit board under test includes various electrical components, which are required to be implanted in the device and work together with the circuit board under test 10 , such as sampling resistors, communication antennas, output electrodes and so on. These components are connected to the connection points on the tested circuit board 10 through the tested circuit board connecting portion 161 , simulating the actual working conditions of the tested circuit board to ensure the normal operation of the tested circuit board 10 .

The load unit 163 is used to simulate the load of the circuit board under test. The implanted device will bear a certain load in the human body. The loads of implanted devices of different types and uses are different. This unit can be equipped with various load elements to simulate the loads borne by different circuit boards 10 under test. For example, there can be 1k resistors for neurostimulators, 500 ohm resistors for spinal cord stimulators, etc.

A selection unit 164 and a collection device connection part 165 . The acquisition device connection part 165 is connected to the electrical components in the peripheral circuit 162 of the circuit board under test through the selection unit 164 , for example, may be connected to the output electrodes. Wherein the effect of selection unit 164 is to control the communication relationship between the collection device connection part 165 and the electrical components connected thereto. signal from below.

In practice, peripheral circuits usually include more electrical components. Taking output electrodes as an example, a brain pacemaker may have more than ten output electrodes, and each output electrode can send a stimulation signal independently. In order to perform accurate detection, the detection program may only control some output electrodes to send signals at the same time. Correspondingly, the acquisition device connection part 165 can connect all output electrodes through the selection unit 164, and the selection unit 164 can only connect one of them at the same time. Part of the electrode that is outputting a signal.

According to the implanted medical instrument detection circuit board provided by the embodiment of the present invention, the circuit board under test can be connected with external detection equipment, and the circuit board under test can simulate the actual working state through the peripheral circuit and the load unit, and at the same time, it can be controlled by the selection unit The connection state between the external equipment and the detected component, so as to obtain the signal sent by the tested component controlled by the tested circuit board, the system does not need to rely on other components in the implanted device, and the circuit board implanted in the medical instrument is targeted Strong detection, at the same time, the selection unit can be flexibly set to meet different detection requirements, with high work efficiency.

As a preferred embodiment, as shown in FIG. 10 , the peripheral circuit 162 of the circuit board under test includes a plurality of output electrodes 1621 implanted in the medical instrument and a metal shell interface 1622 implanted in the medical instrument.

The selection unit 164 includes a plurality of analog switches, and the analog switches are respectively connected to the corresponding output electrodes 1621 and the metal shell interface 1622 in one-to-one correspondence, wherein one end of the metal shell interface 1622 is connected to the metal shell (not shown in FIG. 10 , the metal shell can be used as The positive pole of the pulse output), the other end is connected to one of the analog switches of the selection unit 164. Thus, the connection relationship between the output electrode and the connection part 165 of the collection device is controlled by the open and closed state of the analog switch, and the connection between the connection part 165 and the connection part of the collection device is controlled. The connection relationship of the metal shell. The acquisition device connection part 165 outputs the waveform signal emitted by the electrodes under the influence of the load to an external acquisition device.

In this embodiment, the selection unit 164 is provided with two switch groups, and the acquisition device connection part 165 is provided with corresponding two access ports Out1 and Out2, and each access port is connected to the peripheral circuit through a different switch group. Electrical components, that is, the output electrode and the metal shell interface. In this embodiment, the port Out1 is connected to one end of the first switch group 1641, and the other end of the first switch group 1641 is connected to all output electrodes and the metal casing interface; the port Out2 is connected to one end of the second switch group 1642, and the second switch group 1642 The other end is connected to all the output electrodes and the metal shell interface.

The two ports Out1 and Out2 of the acquisition device connection part 165 are connected to any two of the sixteen output electrodes 1621 and the metal shell interface 1622 in the peripheral circuit 162 of the circuit board under test. The states of the first switch group 1641 and the second switch group 1642 can be controlled by a single chip microcomputer. Specifically, any two output electrodes are connected to a computer interface, a serial port chip and a single-chip microcomputer, and the computer controls the corresponding analog switches in the first switch group 1641 and the second switch group 1642 according to the test requirements, thereby realizing the acquisition Card and electrode output connections.

In practical applications, in order to collect more output signals at the same time, more access ports and more switch groups can also be set.

In a preferred embodiment, the load unit 163 may include:

Multiple groups of load elements 1631 are respectively used to simulate loads of different types of implanted devices;

A plurality of analog switches, these analog switches form a third switch group 1632 for controlling the connection status of multiple groups of load elements 1631 to the connection part 165 of the collection device and the output electrodes 1621 . The two ports Out1 and Out2 are connected to both ends of the load. By connecting with the computer interface, serial chip and single-chip microcomputer, the computer can control the corresponding analog switch in the third switch group 1632 according to the test requirements, so as to realize the connection between the two ports Out1 and Out2 and different loads. Optional loads include DBS load, SCS load, VNS load and SNM (Sacral Neuromodulation, sacral nerve stimulation system) load, etc.

In this way, loads of different product categories are connected to any two output electrodes, and at the same time, the output waveforms of the circuit board 10 under test are connected to ports Out1 and Out2, and are fed back to the acquisition card 18 for processing.

Regarding the collection of power supply and charging current of the test board 16 , the power supply 12 and the ammeter 17 can be connected to the test board 16 . The power supply 12 can provide two ways of power supply, one way is a variable voltage power supply 10 (range is 4.1V ~ 2V), using a battery simulation power supply (rechargeable product for charging function test), connected to the tested device through the golden finger socket on the test board 16 The circuit board 10 supplies power; the other circuit is a constant voltage, which supplies power to the electrical components on the test board 16 through the voltage chip.

Specifically, the peripheral circuit 162 of the circuit board under test includes a power supply circuit, one end of the power supply circuit is connected in series with the external power supply 12 and the ammeter 17 , and the other end is connected to a corresponding power supply connection point on the circuit board under test 10 .

In the charging detection application, the power supply circuit can be used to receive the electric energy input by the external charging programmer through the tested circuit board 10, and charge the external power supply 12, and the ammeter 17 can display the charging current.

In other performance testing applications such as signal output, the power supply circuit can be used to receive power input from the external power supply 12 and supply power to the circuit board 10 under test.

For different products, the circuit board 10 under test can be selected to be connected to different charging and communication antennas, such as SCS charging and communication antennas and DBS charging and communication antennas. In a preferred embodiment, the peripheral circuit 162 of the circuit board under test may include various communication antennas and/or various charging antennas. Specifically, a computer can be used to control the single-chip microcomputer on the detection circuit board, and the single-chip microcomputer sets the circuit board under test 10 to connect a communication antenna and/or a charging antenna.

The peripheral circuit of the circuit board under test may also include temperature sampling resistors, such as battery temperature sampling resistors and metal case temperature sampling resistors. The temperature sampling resistors are connected to corresponding connection points on the circuit board under test 10 through the circuit board connection part 161 . The collection of temperature parameters can be obtained through wireless communication between the external charging programmer and the circuit board 10 under test, without additional ports and devices for connecting temperature sampling resistors.

The specific embodiments described above have further described the purpose, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above descriptions are only specific embodiments of the present invention and are not intended to limit the scope of the present invention. Protection scope, within the spirit and principles of the present invention, any modification, equivalent replacement, improvement, etc., shall be included in the protection scope of the present invention.

Claims (10)

1. An automatic test system for active implantable medical instrument detection, characterized in that, comprising: Relocation tooling, power supply and computer; The shifting tool is provided with a charging programmer, an induction coil and a test board, and the shifting tool is used to change the relative position of the charging programmer and the induction coil; The test board is provided with components for providing a load to the circuit board under test, peripheral circuits of the circuit board under test, and an interface connecting the circuit board under test and the induction coil; The computer is respectively connected with the test board, the charging programmer and the power supply, and is used to control the components on the test board to provide loads to the circuit board under test and control the peripheral circuits to cooperate with the circuit board under test to perform Action, and control the charging programmer to charge the power supply through the induction coil and the circuit board under test, and obtain the working parameters of the circuit board under test through the charging programmer. 2. The system according to claim 1, wherein the power supply is also used to provide electric energy to the charging programmer, the test board and the circuit board under test, so that the circuit under test The provided load board outputs waveform signals. 3. system according to claim 2, is characterized in that, described system also comprises acquisition card, is used for collecting the waveform signal that tested circuit board outputs; Described computer obtains the wave signal that tested circuit board outputs by described acquisition card waveform signal. 4. The system according to claim 1, wherein the charging programmer is also used to read the inherent information of the circuit board under test through the induction coil; The test board and the signals of the components on the circuit board under test. 5 . The system according to claim 1 , wherein the computer is further used to control the shifting tool to change the relative position of the induction coil and the charging programmer during the charging process. 6. The system according to claim 1, wherein the shifting tool is also provided with a magnet; the computer is also used to control the shifting tool to change the relative position of the magnet and the circuit board under test , and detect the working state of the electromagnetic switch on the circuit board under test. 7. The system according to claim 1, characterized in that, the interface on the test board for connecting the circuit board under test is a golden finger interface. 8. The system according to claim 1, wherein the working parameters include charging current, charging voltage and temperature. 9. The system according to claim 1, wherein the computer is also used to read the operating parameters of the charging programmer, and according to the operating parameters of the circuit board under test and the operating parameters of the charging programmer Calculate charging efficiency. 10. The system according to claim 1, wherein the computer is also used to set the output parameters of the tested circuit board through the charging programmer and the induction coil.