CN108917923B - Power measurement method and electronic equipment - Google Patents

Abstract

The invention discloses a power measurement method and electronic equipment, which relate to the field of optics and are applied to electronic equipment. The electronic equipment includes: a filter unit, a power measurement unit, and a plurality of spectrum measurement units. The method includes: measuring The unit measures the light beam from the supercontinuum light source, and obtains the spectral data of multiple bands of the light beam. The spectral data of the multiple bands are spliced to obtain the total spectral data of the beam. Through the filtering unit, the light beam from the supercontinuum light source is filtered to obtain the light beam of the preset wavelength band. The power measurement unit measures the light beam of the preset waveband to obtain the power of the light beam of the preset waveband. The total power of the beam is generated according to the total spectral data of the beam and the power of the beam in the preset wavelength band. The method can improve the accuracy of measuring the total power of a supercontinuum light source.

Description

Power measurement method and electronic device

technical field

The invention relates to the field of optics, in particular to a power measurement method and electronic equipment.

Background technique

With the rapid development of science and technology in recent years, supercontinuum light sources are widely used in civil and military fields such as spectroscopy, environmental monitoring, chemical sensing, biochemistry, and infrared countermeasures due to their high brightness, high coherence, and ultra-bandwidth. . At present, laser power meters are usually used to measure the total power of supercontinuum light sources, but the bandwidth of supercontinuum light sources is extremely wide, and the measurement range of laser power meters is limited. Therefore, multiple laser power meters are required to measure supercontinuum light sources. Different laser power meters have different calibration methods for laser power in different bands, so there is a problem that the measurement of the total power of the supercontinuum light source is not accurate enough.

Contents of the invention

The main purpose of the embodiments of the present invention is to provide a power measurement method and electronic equipment, which can improve the accuracy of measuring the total power of a supercontinuum light source.

The first aspect of the embodiments of the present invention provides a power measurement method, which is applied to electronic equipment, and the electronic equipment includes: a filter unit, a power measurement unit, and a plurality of spectrum measurement units, and the method includes: using a plurality of the spectrum The measuring unit measures the light beam from the supercontinuum light source to obtain spectral data of multiple bands of the light beam; splicing the spectral data of the multiple bands to obtain the total spectral data of the light beam; through the A filtering unit is configured to filter the beam from the supercontinuum light source to obtain a beam of a preset band; through the power measurement unit, measure the beam of the preset band to obtain a beam of the preset band the power of the light beam; generating the total power of the light beam according to the total spectral data of the light beam and the power of the light beam in the preset wavelength band.

The second aspect of the embodiment of the present invention provides an electronic device, the electronic device includes: a plurality of spectral measurement units, used to measure the light beam from the supercontinuum light source, and obtain the spectral data of multiple bands of the light beam The splicing unit is connected to a plurality of the spectral measurement units, and is used to splice the spectral data of the multiple bands to obtain the total spectral data of the light beam; the filtering unit is used to filter the light from the supercontinuum The light beam is filtered to obtain the light beam of the preset waveband; the power measurement unit is connected to the filtering unit, and is used to measure the light beam of the preset waveband to obtain the power of the light beam of the preset waveband; the generation unit , connected to the splicing unit and the power measuring unit, configured to generate the total power of the light beam according to the total spectral data of the light beam and the power of the light beam in the preset wavelength band.

It can be seen from the above-mentioned embodiments that the spectral data of multiple bands is obtained by direct measurement through multiple spectral measurement units, the light source is filtered by the filter unit to obtain the beam of the preset band, and the beam of the preset band is directly measured by the power measurement unit, Then calculate the total power of the light source by directly measuring the spectral data of multiple bands and the power of the preset bands, without using power meters in different bands to measure the light source and sum to obtain the total power of the light source, thus avoiding the The errors caused by different calibration methods of power meters in different bands further improve the accuracy of measuring the total power of supercontinuum light sources.

Description of drawings

FIG. 1 is a schematic diagram of the application of the power measurement method in the first embodiment provided by the present invention;

Fig. 2 is a schematic diagram of the implementation flow of the power measurement method in the first embodiment provided by the present invention;

Fig. 3 is a schematic diagram of the implementation flow of the power measurement method in the second embodiment provided by the present invention;

Fig. 4 is a schematic structural diagram of an electronic device in a third embodiment provided by the present invention.

Detailed ways

In order to make the purpose, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative efforts belong to the protection scope of the present invention.

Referring to FIG. 1 , FIG. 1 is a schematic diagram of the application of the power measurement method in the first embodiment provided by the present invention, and the method is applied to electronic equipment. As shown in FIG. 1 , the electronic device includes a filter unit 101 , a power measurement unit 102 and multiple spectrum measurement units 103 . Exemplarily, multiple spectral measurement units 103 receive light beams from supercontinuum light sources 105 through multimode fiber jumpers 104 for measurement. The filtering unit 101 may be a bandpass filter, the power measuring unit 102 may be a laser power meter, and the spectrum measuring unit 103 may be a spectrometer.

Referring to FIG. 2 , FIG. 2 is a schematic flowchart of an implementation of the power measurement method in the first embodiment provided by the present invention. As shown in Figure 2, the power measurement method includes:

201. Using multiple spectral measurement units, measure the light beam from the supercontinuum light source to obtain spectral data of multiple bands of the light beam.

Specifically, since the supercontinuum light source has the characteristics of extremely wide bandwidth, and the measurement range of a single spectral measurement unit is limited, multiple spectral measurement units with different measurement ranges are used to measure the beam from the supercontinuum light source, and the corresponding , each spectral measurement unit measures the light beam to obtain spectral data within its own measurement range. That is to say, the wavelength band of the spectral data measured by each spectral measurement unit is not larger than the measurement range of each spectral measurement unit. It can be understood that, in order to obtain spectral data of the full bandwidth of the supercontinuum light source, the sum of the measurement ranges of the multiple spectral measurement units includes the full bandwidth of the supercontinuum light source.

202. Splice the spectral data of the multiple bands to obtain the total spectral data of the light beam.

Specifically, since the spectral data measured by each spectral measurement unit is the spectral data of a partial band of the light beam from the supercontinuum light source, the multiple spectral data measured by each spectral measurement unit are spliced, and the multiple spectral data The corresponding wavebands are different, that is to say, the spectral data of each waveband are spliced to obtain the total spectral data of the beam.

203. Using the filtering unit, perform filtering processing on the light beam from the supercontinuum light source to obtain a light beam in a preset wavelength band.

Specifically, since the bandwidth of the light beam from the supercontinuum light source is extremely wide, and the measurement range of the power measurement unit is limited, the light beam is filtered by the filtering unit before being measured by the power measurement unit to obtain a preset wavelength band Beam. In practical applications, the filter unit can be a band-pass filter, which is a device that allows waves of a specific frequency band to pass through while shielding other frequency bands. It can be understood that the band that the filter unit allows to pass is the preset band The wavelength band of the beam of the preset wavelength band is within the bandwidth of the beam from the supercontinuum light source.

204. Use the power measurement unit to measure the light beam in the preset wavelength band to obtain the power of the light beam in the preset wave band.

Specifically, after the light beam is filtered by the filtering unit, the light beam of the preset waveband is obtained, and then the light beam of the preset waveband is measured by the power measurement unit to obtain the power of the light beam of the preset waveband. It can be understood that the wavelength band of the light beam of the preset wavelength band is not larger than the measurement range of the power measurement unit, and the measurement range of the power measurement unit is smaller than the bandwidth of the light beam from the supercontinuum light source.

205. Generate the total power of the beam according to the total spectral data of the beam and the power of the beam in the preset wavelength band.

Specifically, the total power of the light beam is generated by splicing the spectral data of multiple bands to obtain the total spectral data and the power of the light beam of the preset wave band measured by the power measurement unit. In this process, only one power measurement unit is needed to obtain the total power of the beam through subsequent calculation.

In the embodiment of the present invention, the spectral data of multiple bands is directly measured by multiple spectral measurement units, the light source is filtered by the filtering unit to obtain the beam of the preset band, and the beam of the preset band is directly measured by the power measurement unit , and then calculate the total power of the light source by directly measuring the spectral data of multiple bands and the power of the preset bands, without using power meters in different bands to measure the light source and sum to obtain the total power of the light source, thereby avoiding The error caused by different calibration methods of power meters in different bands is eliminated, and the accuracy of measuring the total power of supercontinuum light sources is improved.

Referring to FIG. 3 , FIG. 3 is a schematic flowchart of an implementation of a power measurement method in a second embodiment provided by the present invention, and the power measurement method is applied to an electronic device. As shown in Figure 3, the method mainly includes the following steps:

301. Measure a light beam from a supercontinuum light source by using multiple spectral measurement units, and obtain spectral data of multiple wavelength bands of the light beam.

302. Convert the linear spectral data into transformed logarithmic spectral data, and select any spectral data from the logarithmic spectral data and the transformed logarithmic spectral data as the reference logarithmic spectral data.

Specifically, because part of the spectral measurement unit measures the light beam to obtain logarithmic spectral data, and part of the spectral measurement unit measures the light beam to obtain linear spectral data, so the spectral data of several bands in the spectral data of multiple bands are logarithmic spectra data, and the spectral data of the remaining bands are linear spectral data. In order to further process multiple spectral data, the linear spectral data is converted into transformed logarithmic spectral data. Optionally, use the following formula to convert linear spectral data into transformed logarithmic spectral data:

y=-10lg(x)

In the formula, x is the linear intensity value of a certain wavelength measured by the spectral measurement unit, and y is the logarithmic intensity value of the corresponding wavelength.

Among them, the logarithmic spectral data and transformed logarithmic spectral data are both in the form of wavelength and the logarithmic intensity value of the corresponding wavelength. Among the logarithmic spectral data and transformed logarithmic spectral data, any spectral data is selected as the reference logarithmic spectral data .

Optionally, in the logarithmic spectral data and converted logarithmic spectral data, select the spectral data containing the minimum wavelength as the reference spectral data, or, in the logarithmic spectral data and transformed logarithmic spectral data, select the spectral data containing the data from the supercontinuum The spectral data of the intermediate wavelength of the light beam of the light source is used as the reference data, or the spectral data including the maximum wavelength is selected from the logarithmic spectral data and the converted logarithmic spectral data as the reference spectral data.

303. From the remaining logarithmic spectral data and the converted logarithmic spectral data, select spectral data whose corresponding waveband overlaps with the waveband of the reference logarithmic spectral data, as the logarithmic spectral data to be spliced.

Specifically, among the logarithmic spectral data and converted logarithmic spectral data except the reference logarithmic spectral data, the spectral data overlapping with the band of the reference logarithmic spectral data is selected as the logarithmic spectral data to be spliced. Exemplarily, the waveband of the reference logarithmic spectral data is 350-750nm (unit: nanometer), and the wavebands of the remaining two spectral data are: 650-1250nm and 1150-1700nm, wherein the waveband range is the spectrum of 650-1250nm The bands of the data overlap with the reference spectral data, and the spectral data with a band range of 1150-1700nm does not overlap with the reference spectral data. Therefore, the spectral data with a band range of 650-1250nm is the logarithmic spectral data to be spliced.

304. Based on the overlapping bands of the reference logarithmic spectral data and the logarithmic spectral data to be spliced, calculate and obtain the connection wavelength according to a preset algorithm.

Specifically, due to the increased error and uncertainty caused by the boundary of the measurement range of the spectral measurement unit, after determining the overlapping bands of the reference logarithmic spectral data and the spectral data to be spliced, the wavelength of the boundary of the overlapping bands is not selected as the connection Instead, the connection wavelength is calculated according to the overlapping bands according to a preset algorithm, which can be designed according to the actual situation. Exemplarily, the wavelength band of the reference logarithmic spectral data is 350-750nm, the wavelength range of the logarithmic spectral data to be spliced is 650-1250nm, and the overlapping band of the reference logarithmic spectral data and the logarithmic spectral data to be spliced is 650-750nm, Then, the middle wavelength of the overlapped band can be selected as the connection wavelength, that is, 700 nm is obtained as the connection wavelength calculated according to (650+750)÷2=700 nm.

305. From the reference logarithmic spectral data and the logarithmic spectral data to be spliced, respectively obtain a reference logarithmic intensity value and a logarithmic intensity value to be spliced corresponding to the connection wavelength;

306. Subtracting the reference logarithmic intensity value from the logarithmic intensity value to be spliced to obtain a deviation value, and subtracting the deviation value from all logarithmic intensity values in the logarithmic spectrum data to be spliced according to the deviation value, The logarithmic spectral data to be spliced and the reference logarithmic spectral data are spliced together at the connection wavelength, and the spliced reference logarithmic spectral data and the logarithmic spectral data to be spliced are used as a new reference logarithmic spectrum data.

Specifically, in theory, the intensity value of a certain wavelength of the beam from the same light source should be a constant value, but due to the systematic error between different spectral measurement units, for the same wavelength measurement from the same light source There will be errors in the obtained intensity value, so the acquired reference logarithmic intensity value corresponding to the connection wavelength and the logarithmic intensity value to be spliced may not be equal.

Therefore, subtract the reference logarithmic intensity value from the logarithmic intensity value to be spliced to obtain the deviation value. Understandably, the deviation value may be zero. After determining the deviation value, it means that the error of the logarithmic intensity value of the logarithmic spectral data to be spliced is equivalent to the reference logarithmic intensity value as the deviation value. Therefore, subtract all logarithmic intensity values in the logarithmic spectral data to be spliced The deviation value is to make the logarithmic intensity value to be spliced at the connecting wavelength equal to the reference logarithmic intensity value at the connecting wavelength, that is, the point at the connecting wavelength of the reference logarithmic spectral data and the logarithmic spectral data to be spliced The points at the connecting wavelengths can be coincident. After the points coincide, it can be regarded as splicing the reference logarithmic spectral data and the logarithmic spectral data to be spliced in the coordinate system where the abscissa is the wavelength and the ordinate is the logarithmic intensity. together. It can be understood that the reference logarithmic spectral data and the logarithmic spectral data to be spliced are combined to form a new spectral data set, and the new spectral data set is the new reference logarithmic spectral data.

Wherein, based on the new reference logarithmic spectral data, steps 303-306 are repeatedly executed, and when there is no remaining logarithmic spectral data and transformed logarithmic spectral data, step 307 is executed: until the spectral data of the multiple bands are all Stitched together, the total logarithmic spectral data of the beam is obtained.

308. Convert the total logarithmic spectral data of the light beam to obtain the total linear spectral data of the light beam.

Specifically, in order to facilitate subsequent calculation of the total power of the beam, the total logarithmic spectrum data of the beam is converted to obtain the total linear spectrum data of the beam. Exemplarily, conversion can be performed according to the following formula:

In the formula, x is the logarithmic intensity value corresponding to a certain wavelength in the total logarithmic spectral data, and y is the linear intensity value corresponding to the wavelength.

309. Through the filtering unit, filter the light beam from the supercontinuum light source to obtain a light beam in a preset wavelength band.

310. Using the power measurement unit, measure the light beam in the preset wavelength band to obtain the power of the light beam in the preset wave band.

311. Sum the total linear spectral data of the light beam to obtain the total spectral intensity of the light beam; select and sum the spectral data of the preset band from the total linear spectral data of the light beam to obtain the spectral data of the preset band The spectral intensity of the light beam; according to the total spectral intensity of the light beam, the spectral intensity of the light beam in the preset wavelength band and the power of the light beam in the preset wave band, the total power of the light beam is generated.

Specifically, the total linear spectral data of the light beam is summed, that is, the total linear spectral intensity of the light beam is integrated, the lower limit of the integral is the minimum wavelength in the total linear spectral data, and the upper limit of the integral is the total linear spectral data The maximum wavelength in to get the total spectral intensity of the beam.

Because the preset band is included in the band of the total linear spectral data, in order to obtain the spectral intensity of the beam of the preset band, the spectral data of the preset band can be selected from the bus type spectral data of the beam for summation , that is to integrate the spectral data of the preset band, the lower limit of the integration is the minimum wavelength of the preset band, and the upper limit of the integration is the maximum wavelength of the preset band.

Wherein, according to the following formula, the total power of the beam can be generated according to the total spectral intensity of the beam, the spectral intensity of the beam in the preset band and the power of the beam in the preset band:

In the formula, P _always represents the total power of the beam, S _always represents the total spectral intensity of the beam, S represents the spectral intensity of the beam in the preset band, and P represents the power of the beam in the preset band.

Optionally, the total spectral intensity of the light beam is divided by the total power of the light beam to obtain a ratio between the total spectral intensity of the light beam and the total power of the light beam.

All the intensity values in the total spectral intensity of the light beam are divided by the ratio value to obtain the spectral power density data of the light beam.

Specifically, the power density is an important parameter to characterize the performance of a supercontinuum light source and an important criterion for judging the quality of a light source, and its unit is generally mw/nm (unit: milliwatt/nanometer). There is a certain relationship between the spectral intensity distribution of the beam and the spectral power density distribution. The greater the spectral intensity of a certain band, the greater the spectral power density of this band. Therefore, after obtaining the total spectral intensity of the beam. The total spectral intensity of the beam is divided by the total power of the beam to obtain a ratio value between the total spectral intensity of the beam and the total power of the beam. Divide all the data of the linear spectral intensity by the slope to obtain the power density data of the beam, divide all the intensity values in the total spectral intensity of the beam by the ratio value, and obtain the spectral power density data of the beam .

Optionally, in order to improve the intuition and convenience of the total logarithmic spectral data, total linear spectral data and spectral power density data of the beam, according to the total logarithmic spectral data of the beam, the total linear spectral data of the beam and the The spectral power density data of the beam is plotted to obtain the total logarithmic spectrum of the beam, the total linear spectrum of the beam and the power density distribution of the beam.

In the embodiment of the present invention, the spectral data of multiple bands is directly measured by multiple spectral measurement units, the light source is filtered by the filtering unit to obtain the beam of the preset band, and the beam of the preset band is directly measured by the power measurement unit , and then calculate the total power of the light source by directly measuring the spectral data of multiple bands and the power of the preset bands, without using power meters in different bands to measure the light source and sum to obtain the total power of the light source, thereby avoiding The error caused by different calibration methods of power meters in different bands is eliminated, and the accuracy of measuring the total power of supercontinuum light sources is improved. Moreover, the intuition and convenience of the method are improved by plotting the total logarithmic spectral data, total linear spectral data and spectral power density data.

Referring to FIG. 4 , FIG. 4 is a schematic structural diagram of an electronic device in a third embodiment provided by the present invention. . As shown in Figure 4, the electronic equipment mainly includes:

A plurality of spectrum measuring units 401 are used to measure the light beam from the supercontinuum light source to obtain spectral data of multiple bands of the light beam.

The splicing unit 402 is connected to multiple spectral measurement units 401, and is used to splice the spectral data of multiple bands to obtain the total spectral data of the light beam.

The filtering unit 403 is configured to perform filtering processing on the light beam from the supercontinuum light source to obtain a light beam in a preset wavelength band.

The power measuring unit 404 is connected to the filtering unit 403 and is used to measure the light beam in the predetermined wavelength band to obtain the power of the light beam in the predetermined wave band.

The generating unit 405 is connected with the splicing unit 402 and the power measuring unit 404, and is configured to generate the total power of the beam according to the total spectral data of the beam and the power of the beam in a preset wavelength band.

Further, among the spectral data of multiple bands, the spectral data of several bands are logarithmic spectral data, and the spectral data of the remaining bands are linear spectral data,

The splicing unit 402 is further configured to convert the linear spectral data into transformed logarithmic spectral data, and select any spectral data from the logarithmic spectral data and the transformed logarithmic spectral data as the reference logarithmic spectral data.

The splicing unit 402 is also used to select spectral data whose corresponding waveband overlaps with that of the reference logarithmic spectral data from the remaining logarithmic spectral data and converted logarithmic spectral data, as the logarithmic spectral data to be spliced.

The splicing unit 402 is further configured to calculate the connection wavelength according to a preset algorithm based on overlapping bands of the reference logarithmic spectral data and the logarithmic spectral data to be spliced.

The splicing unit 402 is further configured to respectively acquire a reference logarithmic intensity value and a logarithmic intensity value to be spliced corresponding to the connection wavelength from the reference logarithmic spectral data and the logarithmic spectral data to be spliced.

The splicing unit 402 is also used to subtract the reference logarithmic intensity value from the logarithmic intensity value to be spliced to obtain a deviation value, and according to the deviation value, subtract the deviation value from all the logarithmic intensity values in the logarithmic spectral data to be spliced, To stitch the logarithmic spectral data to be spliced and the reference logarithmic spectral data together at the connecting wavelength.

The splicing unit 402 is also used to use the spliced reference logarithmic spectral data and the logarithmic spectral data to be spliced as new reference logarithmic spectral data, and based on the new reference logarithmic spectral data, perform In the data and converted logarithmic spectral data, select the spectral data whose corresponding wave band overlaps with the wave band of the reference logarithmic spectral data, as the step of the logarithmic spectral data to be spliced, until all the spectral data of multiple bands are spliced together, Obtain the total logarithmic spectral data of the beam.

The splicing unit 402 is also used to convert the total logarithmic spectral data of the light beam to obtain the total linear spectral data of the light beam.

Further, the generation unit 405 is further configured to sum the total linear spectral data of the light beam to obtain the total spectral intensity of the light beam.

The generation unit 405 is further configured to select spectral data of a predetermined band from the total linear spectral data of the light beam and perform summation to obtain the spectral intensity of the light beam of the predetermined band.

The generating unit 405 is further configured to generate the total power of the light beam according to the total spectral intensity of the light beam, the spectral intensity of the light beam in a predetermined wavelength band, and the power of the light beam in a predetermined wave band.

Further, the electronic equipment also includes:

The calculating unit 406 is connected with the generating unit 405, and is used for dividing the total spectral intensity of the beam by the total power of the beam to obtain a ratio value between the total spectral intensity of the beam and the total power of the beam.

The calculation unit 406 is further configured to divide all the intensity values in the total spectral intensity of the light beam by the proportional value to obtain the spectral power density data of the light beam.

The drawing unit 407 is connected with the generation unit 405 and the calculation unit 406, and is used for drawing according to the total logarithmic spectral data of the beam, the total linear spectral data of the beam and the spectral power density data of the beam, and respectively obtain the total logarithmic spectrum of the beam , the total linear spectrum of the beam and the power density distribution of the beam.

Further, the generating unit 405 is also configured to generate the total power of the beam according to the total spectral intensity of the beam, the spectral intensity of the beam in the preset wavelength band, and the power of the beam in the preset wavelength band according to the following formula:

In the formula, P _total represents the total power of the beam, S _total represents the total spectral intensity of the beam, S represents the spectral intensity of the beam in the preset band, and P represents the power of the beam in the preset band.

In the embodiment of the present invention, the spectral data of multiple bands is directly measured by multiple spectral measurement units, the light source is filtered by the filtering unit to obtain the beam of the preset band, and the beam of the preset band is directly measured by the power measurement unit , and then calculate the total power of the light source by directly measuring the spectral data of multiple bands and the power of the preset bands, without using power meters in different bands to measure the light source and sum to obtain the total power of the light source, thereby avoiding The error caused by different calibration methods of power meters in different bands is eliminated, and the accuracy of measuring the total power of supercontinuum light sources is improved.

It should be noted that, for the sake of simplicity of description, the aforementioned method embodiments are expressed as a series of action combinations, but those skilled in the art should know that the present invention is not limited by the described action sequence. Because of the present invention, certain steps may be performed in other orders or simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification belong to preferred embodiments, and the actions and modules involved are not necessarily required by the present invention.

In the foregoing embodiments, the descriptions of each embodiment have their own emphases, and for parts not described in detail in a certain embodiment, reference may be made to relevant descriptions of other embodiments.

The above is the description of the power measurement method and electronic equipment provided by the present invention. For those of ordinary skill in the art, according to the idea of the embodiment of the present invention, there are changes in the specific implementation and application range. In summary, this The content of the description should not be construed as limiting the present invention.

Claims (6)

1. A power measurement method, characterized in that it is applied to an electronic device, the electronic device comprising: a filtering unit, a power measurement unit and a plurality of spectrum measurement units, the method comprising: The light beam from the supercontinuum light source is measured by a plurality of the spectrum measurement units to obtain spectrum data of a plurality of bands of the light beam, wherein the spectrum data of a plurality of bands of the spectrum data are logarithmic spectrum data, and the spectrum data of the remaining bands are linear spectrum data; The spectral data of the multiple bands are spliced to obtain the total spectral data of the light beam, including: Converting the linear spectrum data into converted logarithmic spectrum data, and selecting any one of the logarithmic spectrum data and the converted logarithmic spectrum data as reference logarithmic spectrum data; Among the remaining logarithmic spectrum data and the converted logarithmic spectrum data, spectrum data whose corresponding wavebands overlap with the wavebands of the reference logarithmic spectrum data are selected as the logarithmic spectrum data to be spliced; Based on the overlapping wavelengths of the reference logarithmic spectrum data and the logarithmic spectrum data to be spliced, a connection wavelength is calculated according to a preset algorithm; In the reference logarithmic spectrum data and the logarithmic spectrum data to be spliced, respectively obtaining a reference logarithmic intensity value and a logarithmic intensity value to be spliced corresponding to the connection wavelength; Subtracting the reference logarithmic intensity value from the logarithmic intensity value to be spliced to obtain a deviation value, and according to the deviation value, subtracting the deviation value from all logarithmic intensity values in the logarithmic spectral data to be spliced, so as to splice the logarithmic spectral data to be spliced and the reference logarithmic spectral data together at the connection wavelength; The spliced reference logarithmic spectral data and the logarithmic spectral data to be spliced are used as new reference logarithmic spectral data, and based on the new reference logarithmic spectral data, the step of selecting spectral data whose corresponding bands overlap with the bands of the reference logarithmic spectral data from the remaining logarithmic spectral data and the converted logarithmic spectral data as the logarithmic spectral data to be spliced is performed, until all the spectral data of the multiple bands are spliced together to obtain the total logarithmic spectral data of the light beam; Converting the total logarithmic spectrum data of the light beam to obtain the total linear spectrum data of the light beam; The light beam from the supercontinuum light source is filtered by the filtering unit to obtain a light beam of a preset wavelength band; Measuring the light beam in the preset wavelength band by the power measuring unit to obtain the power of the light beam in the preset wavelength band; Generating the total power of the light beam according to the total spectrum data of the light beam and the power of the light beam in the preset wavelength band comprises: summing the total linear spectrum data of the light beam to obtain the total spectrum intensity of the light beam; Selecting the spectrum data of the preset wavelength band from the total linear spectrum data of the light beam and summing the data to obtain the spectrum intensity of the light beam of the preset wavelength band; The total power of the light beam is generated according to the total spectral intensity of the light beam, the spectral intensity of the light beam in the preset wavelength band, and the power of the light beam in the preset wavelength band. 2. The power measurement method according to claim 1, characterized in that the method further comprises: Dividing the total spectral intensity of the light beam by the total power of the light beam to obtain a ratio between the total spectral intensity of the light beam and the total power of the light beam; Dividing all intensity values in the total spectral intensity of the light beam by the ratio value to obtain spectral power density data of the light beam; According to the total logarithmic spectrum data of the light beam, the total linear spectrum data of the light beam and the spectral power density data of the light beam, the total logarithmic spectrum diagram of the light beam, the total linear spectrum diagram of the light beam and the power density distribution diagram of the light beam are respectively obtained. 3. The power measurement method according to claim 1, characterized in that the total power of the light beam is generated according to the total spectral intensity of the light beam, the spectral intensity of the light beam in the preset wavelength band, and the power of the light beam in the preset wavelength band according to the following formula:

In the formula,

represents the total power of the beam,

represents the total spectral intensity of the beam,

represents the spectral intensity of the light beam in the preset wavelength band,

Indicates the power of the light beam in the preset wavelength band. 4. An electronic device, characterized in that the electronic device comprises: A plurality of spectrum measurement units, used for measuring the light beam from the supercontinuum light source to obtain spectrum data of a plurality of wavebands of the light beam, wherein the spectrum data of a plurality of wavebands of the spectrum data of the plurality of wavebands are logarithmic spectrum data, and the spectrum data of the remaining wavebands are linear spectrum data; A splicing unit, connected to the plurality of spectrum measurement units, for splicing the spectrum data of the plurality of bands to obtain total spectrum data of the light beam, comprising: Converting the linear spectrum data into converted logarithmic spectrum data, and selecting any one of the logarithmic spectrum data and the converted logarithmic spectrum data as reference logarithmic spectrum data; Among the remaining logarithmic spectrum data and the converted logarithmic spectrum data, spectrum data whose corresponding wavebands overlap with the wavebands of the reference logarithmic spectrum data are selected as the logarithmic spectrum data to be spliced; Based on the overlapping wavelengths of the reference logarithmic spectrum data and the logarithmic spectrum data to be spliced, a connection wavelength is calculated according to a preset algorithm; In the reference logarithmic spectrum data and the logarithmic spectrum data to be spliced, respectively obtaining a reference logarithmic intensity value and a logarithmic intensity value to be spliced corresponding to the connection wavelength; Subtracting the reference logarithmic intensity value from the logarithmic intensity value to be spliced to obtain a deviation value, and according to the deviation value, subtracting the deviation value from all logarithmic intensity values in the logarithmic spectral data to be spliced, so as to splice the logarithmic spectral data to be spliced and the reference logarithmic spectral data together at the connection wavelength; The spliced reference logarithmic spectral data and the logarithmic spectral data to be spliced are used as new reference logarithmic spectral data, and based on the new reference logarithmic spectral data, the step of selecting spectral data whose corresponding bands overlap with the bands of the reference logarithmic spectral data from the remaining logarithmic spectral data and the converted logarithmic spectral data as the logarithmic spectral data to be spliced is performed, until all the spectral data of the multiple bands are spliced together to obtain the total logarithmic spectral data of the light beam; Converting the total logarithmic spectrum data of the light beam to obtain the total linear spectrum data of the light beam; A filtering unit, used for filtering the light beam from the supercontinuum light source to obtain a light beam of a preset wavelength band; A power measurement unit, connected to the filtering unit, and configured to measure the light beam in the preset wavelength band to obtain the power of the light beam in the preset wavelength band; A generating unit, connected to the splicing unit and the power measuring unit, for generating the total power of the light beam according to the total spectrum data of the light beam and the power of the light beam in the preset wavelength band, comprising: summing the total linear spectrum data of the light beam to obtain the total spectrum intensity of the light beam; Selecting the spectrum data of the preset wavelength band from the total linear spectrum data of the light beam and summing the data to obtain the spectrum intensity of the light beam of the preset wavelength band; The total power of the light beam is generated according to the total spectral intensity of the light beam, the spectral intensity of the light beam in the preset wavelength band, and the power of the light beam in the preset wavelength band. 5. The electronic device according to claim 4, characterized in that the electronic device further comprises: a calculation unit, connected to the generation unit, and configured to divide the total spectral intensity of the light beam by the total power of the light beam to obtain a ratio between the total spectral intensity of the light beam and the total power of the light beam; The calculation unit is further used to divide all intensity values in the total spectral intensity of the light beam by the ratio value to obtain spectral power density data of the light beam; A drawing unit is connected to the generating unit and the calculating unit, and is used for drawing according to the total logarithmic spectrum data of the light beam, the total linear spectrum data of the light beam and the spectral power density data of the light beam, so as to obtain the total logarithmic spectrum diagram of the light beam, the total linear spectrum diagram of the light beam and the power density distribution diagram of the light beam respectively. 6. The electronic device according to claim 4, characterized in that: The generating unit is further configured to generate the total power of the light beam according to the total spectral intensity of the light beam, the spectral intensity of the light beam in the preset wavelength band, and the power of the light beam in the preset wavelength band according to the following formula:

; In the formula,

represents the total power of the beam,

represents the total spectral intensity of the beam,

represents the spectral intensity of the light beam in the preset wavelength band,

Indicates the power of the light beam in the preset wavelength band.

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