CN108828351A - A kind of highly reliable chip protective device self-checking circuit - Google Patents

Abstract

The invention relates to the technical field of integrated circuits, in particular to a highly reliable chip protection device self-test circuit. The present invention includes: a protection core, a communication core and a self-check logic; wherein, the protection core includes a protection logic circuit and a protection MCU core, and the communication core includes a communication logic circuit and a communication MCU core; the self-check logic and the communication core pass through the communication core The self-inspection logic and the protection core are connected through the debugging interface of the protection core; the self-inspection electric quantity generated by the communication core is output through the IO port of the communication core; the data between the protection core and the communication core is shared memory Interaction, control interaction through interrupt signal and IO port; other connections are straight-line connections. The invention greatly improves the reliability of the protection device; realizes a high degree of simulation of the normal working state of the protection device, improves the coverage of the self-inspection function; loads different fault simulation programs according to specific protection scenarios, and improves the applicable scenarios of the protection device.

Description

A highly reliable chip-based protection device self-test circuit

technical field

The invention relates to the technical field of integrated circuits, in particular to a highly reliable chip protection device self-test circuit.

Background technique

At present, the technology related to smart substation has made great progress. Electronic transformers, merging units, intelligent terminals and other new equipment are widely used. The layout of intelligent IED equipment is transitioning from secondary small rooms to outdoor cabinets and prefabricated cabins. The application of new technologies and new equipment and the installation methods The changes have created new problems for secondary majors. Too many intermediate transmission nodes in conventional relay protection lead to a decrease in the quickness index of relay protection; the secondary equipment installed in the outdoor cabinet has a low protection level and a high failure rate.

The on-site miniaturized device can reduce the intermediate links of data transmission and further improve the speed and reliability of relay protection; the on-site device realizes plug-and-play based on the aviation plug to improve the operation and maintenance efficiency, and reduces the number of screens and The construction area reduces the construction cost of the whole station. At present, in-situ line protection only realizes the single-bay protection function. Due to the different implementation modes of busbar protection and transformer protection across bays, higher requirements are put forward for hardware network performance, synchronization performance, and data processing capabilities. The hardware of in-situ line protection cannot meet the above requirements.

In recent years, low-power chip integration technology and optical fiber communication technology have developed rapidly, which is both an opportunity and a challenge for the relay protection profession. The development of chip technology has greatly improved the performance of integrated circuits. The processing capacity of the chip has increased by more than 10 times compared with 10 years ago, and the power consumption has been reduced by more than 80%. The integrated and localized design of the protection device hardware has a material basis. More than 90% of the core chips in the current power system rely on imports, and there is a problem of high cost and long delivery cycle. Therefore, taking the opportunity of in-situ protection, the development of protection devices based on special chips can meet the performance requirements of in-situ protection devices for substation lines, busbars, and main transformers, and at the same time promote the application of special chips in power systems, driving The development of the domestic chip industry.

The protection device is used to realize the protection of the primary equipment, therefore, its own reliability requirement is very high.

Based on this, the present invention proposes to design a highly reliable chip-based protection device based on the dual-core architecture of the chip-based protection device. When the protection device is initialized, the communication check is used to check the protection core for self-test, so as to improve the overall reliability.

Contents of the invention

Aiming at the above-mentioned problems in the prior art, the present invention proposes a highly reliable chip protection device self-test circuit, the purpose of which is to ensure the reliability of the relay protection device. Add self-inspection logic to the chip-based relay protection device. The relay protection device first performs a self-inspection when it is initialized, and sends an alarm when the self-inspection fails, and then enters the normal working state after the self-inspection passes.

In order to achieve the above-mentioned purpose of the invention, the present invention is achieved through the following technical solutions:

A highly reliable chip protection device self-test circuit, including: protection core, communication core and self-test logic; wherein, the protection core includes a protection logic circuit and a protection MCU core, and the communication core includes a communication logic circuit and a communication MCU core The self-test logic and the communication core are connected through the debugging interface of the communication core; the self-test logic and the protection core are connected through the debugging interface of the protection core; the self-test electric quantity generated by the communication core is output through the IO port of the communication core; the protection core and the Communication cores perform data interaction through shared memory, and control interaction through interrupt signals and IO ports; other connections are straight-line connections.

The self-inspection logic controls the switching between the self-inspection state and the normal state, controls the communication core to load the self-inspection code, monitors the output state of the protection core and performs correctness judgment, and sends an alarm signal when the function of the protection core is abnormal.

The self-inspection method of the self-inspection circuit of a kind of highly reliable chip-based protection device comprises the following steps:

As the main control unit of the self-test function, the self-test logic takes over the entire device when the self-test function needs to be started every time the power is turned on, and puts the protection core, communication core and other units in the designated state;

The self-test logic switches the output of the protection core so that the protection signal is only output to the self-test logic;

The self-test logic switches the input of the protection core so that it can receive the self-test electrical quantity input from the communication core;

The self-test logic control communication core first runs the self-test program of the communication core itself, and then starts to run the self-test signal generation code after passing, and generates the self-test electrical quantity, which is used to simulate normal signals and various fault signals. The self-test signal generation code should support Online upgrade, load the corresponding signal generation code according to the probability of failure;

The self-inspection logic monitors the output of the protection core. If the output meets expectations, the self-inspection passes, otherwise the self-inspection fails; the expected output signal is generated by the communication core and matches the corresponding self-inspection electrical quantity input;

If the self-test passes, it will report normal and automatically exit the self-test state: make the protection core and communication core in the initial state and switch the input signal and output signal of the protection core to the normal working mode; if the self-test fails, report an exception and enter the waiting state; report The function is completed by the communication core under the control of self-test logic.

The self-test logic, the bidirectional signal between it and the protection core, is used to control the protection core to be in a specified state and monitor the running state of the protection core.

The self-inspection logic, the bidirectional signal between it and the communication core, is used to control the communication core to be in a specified state and monitor the running state of the communication core.

The self-inspection logic and the one-way control signal between the protection core output module are used to switch the output signal of the protection core; the self-inspection logic and the control signal of the protection core input module are used to switch the input signal of the protection core.

The input signal of the protection core comes from the external electrical quantity input and the self-test output signal of the communication core.

The input signal of the self-test logic comes from the protection core in the self-test state.

The output signal of the protection core is the output of the protection action in the normal operation mode and the self-test mode.

The communication core has a self-test output signal, which simulates an external electrical quantity in a self-test state.

The present invention has the following advantages and beneficial effects:

The invention designs a built-in self-inspection circuit, which greatly improves the reliability of the protection device; fully utilizes the characteristics of the dual-core structure, realizes a high degree of simulation of the normal working state of the protection device, and improves the coverage of the self-inspection function; The present invention also utilizes the programmable feature of the communication core to load different fault simulation programs according to specific protection scenarios, thereby improving the applicable scenarios of the protection device.

The specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, but it should be understood that the protection scope of the present invention is not limited by the specific embodiments.

Description of drawings

The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate exemplary embodiments, features, and aspects of the invention and together with the description, serve to explain the principles of the invention.

FIG. 1 is a schematic structural diagram of a highly reliable chip-based protection device self-test circuit provided by an embodiment of the present invention.

In the figure: bidirectional signal between self-test logic and protection core (1), bidirectional signal between self-test logic and communication core (2), unidirectional control signal between self-test logic and protection core output module (3), protection Core input signal (4), self-test logic input signal (5), protection core output signal (6), communication core self-test output signal (7), self-test logic and protection core input module control signal (8), external electrical quantity input (9), control signal output of the protection device (10).

Detailed ways

In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention. Unless expressly stated otherwise, throughout the specification and claims, the term "comprise" or variations thereof such as "includes" or "includes" and the like will be understood to include the stated elements or constituents, and not Other elements or other components are not excluded.

The word "exemplary" is used exclusively herein to mean "serving as an example, embodiment, or illustration." Any embodiment described herein as "exemplary" is not necessarily to be construed as superior or better than other embodiments.

In addition, in order to better illustrate the present invention, numerous specific details are given in the specific embodiments below. It will be understood by those skilled in the art that the present invention may be practiced without certain of the specific details. In some instances, methods, means, and elements well known to those skilled in the art are not described in detail in order to highlight the gist of the present invention.

The present invention is a highly reliable chip-based protection device self-test circuit, as shown in FIG. 1 , which is a schematic diagram of the highly reliable chip-based protection device self-test circuit of the present invention. In the figure, the solid line is the interaction signal when the chip protection device is working normally, and the dotted line is the additional interaction signal when the chip protection device is self-testing. The circuit includes: protection core, communication core and self-test logic. Wherein, the protection core includes a protection logic circuit and a protection MCU core, and the communication core includes a communication logic circuit and a communication MCU core.

The self-inspection logic and the communication core are connected through the debugging interface of the communication core; the self-inspection logic and the protection core are connected through the debugging interface of the protection core; the self-inspection electric quantity generated by the communication core is output through the IO port of the communication core; the protection core and the communication Data interaction between cores is performed through shared memory, and control interaction is performed through interrupt signals and IO ports; other connections are straight-line connections.

The self-inspection logic controls the switching between the self-inspection state and the normal state, controls the communication core to load the self-inspection code, monitors the output state of the protection core and performs correctness judgment, and sends an alarm signal when the function of the protection core is abnormal.

The interface signals between the functional modules in Figure 1 are described as follows:

The bidirectional signal (1) between the self-test logic and the protection core is used to control the protection core to be in a specified state and monitor the operating state of the protection core;

The bidirectional signal (2) between the self-test logic and the communication core is used to control the communication core to be in a specified state and monitor the operation status of the communication core;

The one-way control signal (3) between the self-test logic and the protection core output module is used to switch the output signal of the protection core;

The input signal (4) of the protection core comes from the external electrical quantity input (9) and the self-inspection output signal (7) of the communication core; the self-inspection output signal (7) of the communication core simulates the external electrical quantity in the self-inspection state;

The input signal (5) of the self-test logic comes from the protection core of the self-test state;

The output signal (6) of the protection core, the protection action output in the normal working mode and the self-test mode; the output through the control signal output (10) of the protection device.

The control signal (8) of the self-test logic and protection core input module is used to switch the input signal of the protection core.

The self-inspection function of the self-inspection circuit of the highly reliable chip protection device of the present invention specifically includes the following steps:

As the main control unit of the self-test function, the self-test logic takes over the entire device when the self-test function needs to be started every time the power is turned on, and puts the protection core, communication core and other units in the designated state;

The self-test logic switches the output of the protection core so that the protection signal is only output to the self-test logic;

The self-test logic switches the input of the protection core so that it can receive the self-test electrical quantity input from the communication core;

The self-test logic control communication core first runs the self-test program of the communication core itself, and then starts to run the self-test signal generation code after passing, and generates the self-test electrical quantity, which is used to simulate normal signals and various fault signals. The self-test signal generation code should support Online upgrade, the corresponding signal generation code can be loaded according to the probability of failure occurrence.

The self-test logic monitors the output of the protection core. If the output meets expectations, the self-test passes, otherwise the self-test fails. The expected output signal is generated by the communication core and matches the corresponding self-test electrical quantity input;

If the self-test passes, it will report normal and automatically exit the self-test state: make the protection core and communication core in the initial state and switch the input signal and output signal of the protection core to the normal working mode; if the self-test fails, report an exception and enter the waiting state; report The function is completed by the communication core under the control of self-test logic.

Claims (10)

1. a kind of highly reliable chip protective device self-checking circuit, it is characterized in that：Including：Protect core, communication core and self-test Logic；Wherein, protection core includes relay protective scheme circuit and protection MCU core, and communication core includes that communication logic and communication are used MCU core；Self-test logical AND communication core is attached by the debugging interface of communication core；Self-test logical AND protects core to pass through protection core Debugging interface be attached；The self-test electrical quantity for communicating karyogenesis passes through the I/O port output of communication core；Protect core and communication core Between data interaction is carried out by way of shared drive, control interaction is carried out by interrupt signal and I/O port；Remaining connection is Straight line connection.

2. the highly reliable chip protective device self-checking circuit of one kind according to claim 1, it is characterized in that：The self-test The output state of core is protected in logic, switching, communication control core load self-test code, the monitoring for controlling self-test state and normal condition And it carries out correctness judgement, issue alarm signal when protecting kernel function exception.

3. the self checking method of the highly reliable chip protective device self-checking circuit of one kind according to claim 1, feature It is：Include the following steps：

Main control unit of the self-test logic as self-checking function, every time power on need to start self-checking function when adapter tube whole device, It sets the units such as protection core, communication core and is in designated state；

Self-test logic switch protects the output of core, exports protection signal only and gives self-test logic；

Self-test logic switch protects the input of core, it is made to receive the self-test electrical quantity input from communication core；

Self-test logic control communication core runs the self-check program of communication core itself first, and the self-test signal that brings into operation after generates Code generates self-test electrical quantity, and for simulating normal signal and various faults signal, self-test signal generates code and should support online Upgrading loads corresponding signal according to the probability that failure occurs and generates code；

Self-test Logical Supervisory Control protects the output of core, and self-test passes through if output meets expection, and otherwise self-test does not pass through；It is expected defeated Signal matches corresponding self-test electrical quantity input by communication karyogenesis out；

Self-test is by then reporting normal and automatically exiting from self-test state：Make to protect core and communicate core to be in original state and switch guarantor It protects the input signal of core and outputs signal to normal mode of operation；Self-test does not pass through, and reports abnormal and enters wait state；On Reporting achievement can be completed under self-test logic control by communication core.

4. the highly reliable chip protective device self-checking circuit of one kind according to claim 1, it is characterized in that：The self-test Logic, and protects internuclear two-way signaling, for control protection core be in designated state and to protect the operating status of core into Row monitoring.

5. the highly reliable chip protective device self-checking circuit of one kind according to claim 1, it is characterized in that：The self-test Logic, and communicates internuclear two-way signaling, for communication control core be in designated state and to communicate the operating status of core into Row monitoring.

6. the highly reliable chip protective device self-checking circuit of one kind according to claim 1, it is characterized in that：The self-test Unidirectionally controlled signal between logic, with protection core output module, the output signal for switch protecting core；Self-test logical AND is protected The control signal for protecting core input module part is used for the input signal of switch protecting core.

7. the highly reliable chip protective device self-checking circuit of one kind according to claim 1, it is characterized in that：The protection Core, input signal input and communicate the self-test output signal of core from external electrical tolerance.

8. the highly reliable chip protective device self-checking circuit of one kind according to claim 1, it is characterized in that：The self-test Logic, protection core of the input signal from self-test state.

9. the highly reliable chip protective device self-checking circuit of one kind according to claim 1, it is characterized in that：The protection Core, protection act output when output signal is normal mode of operation and Auto-Sensing Mode.

10. the highly reliable chip protective device self-checking circuit of one kind according to claim 1, it is characterized in that：It is described logical Interrogate core, self-test output signal, the electrical quantity outside self-test state Imitating.