CN108663546B - Test socket - Google Patents
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- CN108663546B CN108663546B CN201810259401.7A CN201810259401A CN108663546B CN 108663546 B CN108663546 B CN 108663546B CN 201810259401 A CN201810259401 A CN 201810259401A CN 108663546 B CN108663546 B CN 108663546B
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- top cover
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
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- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Connecting Device With Holders (AREA)
Abstract
公开一种测试插座。本发明公开的所述测试插座包括:底座,该底座配置为在其上座设有电子元件,并且具有形成在其上部的向下倾斜的斜面;顶盖,该顶盖形成为能够在所述底座上方沿竖直方向移动;以及压紧模块,该压紧模块滑动地连接于所述顶盖,并且配置为当所述顶盖下降时向下压紧所述电子元件。在所述顶盖下降的过程中,所述压紧模块由所述斜面推动以滑动至所述电子元件的上方。根据本发明,可以提供一种测试插座,其中操作者能够在检测过程中观察到电子模块,安装所述插座的空间的高度减小,并且所述连接销和所述连接器在理想的连接方向上相互连接。
A test socket is disclosed. The test socket disclosed in the present invention comprises: a base configured to seat an electronic component on the base and having a downwardly inclined slope formed on the upper part thereof; and a top cover formed to be able to be installed on the base The upper part moves in a vertical direction; and a pressing module is slidably connected to the top cover and is configured to press down the electronic components when the top cover is lowered. During the descending process of the top cover, the pressing module is pushed by the inclined surface to slide above the electronic components. According to the present invention, it is possible to provide a test socket in which an operator can observe an electronic module during testing, the height of a space in which the socket is installed is reduced, and the connection pin and the connector are in an ideal connection direction connected to each other.
Description
技术领域technical field
本发明涉及一种测试插座,更具体地,涉及一种配置为用于将完全组装的电子元件连接于检测装置的测试插座。The present invention relates to a test socket, and more particularly, to a test socket configured for connecting a fully assembled electronic component to a testing device.
背景技术Background technique
通过提供操作信号和电源对半导体、LCD模块、图像传感器、相机模块等进行质量检测,以检测它们是否正常工作,该操作信号与施加给在各组件完成组装后实际安装的电子元件的操作信号相同,或者相似。Quality inspection of semiconductors, LCD modules, image sensors, camera modules, etc., to detect whether they are working properly by supplying operating signals and power that are the same as those applied to the electronic components actually mounted after each component is assembled , or similar.
测试插座是一种配置为将LCD模块、相机模块或类似物连接于检测装置的装置,以便于检测装置的信号能够传递到LCD模块、相机模块或类似物。A test socket is a device configured to connect an LCD module, camera module, or the like to a testing device so that signals from the testing device can be passed to the LCD module, camera module, or the like.
在这方面,专利号为1006243的韩国专利公开了一种用于检测电子模块的插座。该由韩国专利No.1006243公开的插座包括:主体部分,该主体部分具有其上座设有被检测的电子模块的阀座部;盖单元,该盖单元铰接于主体部分的一侧,配置为与主体部分的上表面接触以选择性地按压电子模块,并且配置为覆盖主体部分的上部以防止电子模块脱出;操作单元,该操作单元设置于主体部分的一侧或两侧以及盖单元上,以在盖单元闭合时半自动操作盖单元;夹片单元,该夹片单元配置为使盖单元的闭合状态由操作单元维持;销组件,该销组件设置在主体部分上以在盖单元闭合时连接于电子模块;以及印刷电路板,该印刷电路板连接于销组件并与检测装置电连接。In this regard, Korean Patent No. 1006243 discloses a socket for detecting electronic modules. The socket disclosed by Korean Patent No. 1006243 includes: a main body part having a valve seat part on which an electronic module to be detected is seated; and a cover unit hinged to one side of the main body part and configured to be connected with The upper surface of the main body part contacts to selectively press the electronic module, and is configured to cover the upper part of the main body part to prevent the electronic module from coming out; the operation unit is provided on one side or both sides of the main body part and the cover unit to The cover unit is semi-automatically operated when the cover unit is closed; a clip unit configured to maintain the closed state of the cover unit by the operation unit; a pin assembly provided on the main body portion to be connected to the cover unit when the cover unit is closed an electronic module; and a printed circuit board connected to the pin assembly and electrically connected to the detection device.
在韩国专利No.1006243中,形成有操作结构,其中,当操作者旋转盖单元时,设置在盖单元上的部件(连接销块或推块)将电子模块按压在阀座部上,从而使测试插座连接销(以下简称“连接销”)与电子模块连接器(以下简称“连接器”)连接。In Korean Patent No. 1006243, an operation structure is formed in which, when the operator rotates the cover unit, a member (connection pin block or push block) provided on the cover unit presses the electronic module against the valve seat portion, thereby making The test socket connecting pin (hereinafter referred to as "connecting pin") is connected with the electronic module connector (hereinafter referred to as "connector").
但是,韩国专利No.1006243具有以下缺点。However, Korean Patent No. 1006243 has the following disadvantages.
(1)由于连接销和连接器在盖单元覆盖电子模块的状态下相互连接,电子模块和检测装置形成一种结构,其中电子模块和检测装置在遮蔽操作者对电子模块的视线的状态下电连接。因此,操作者无法直观地确认连接销和连接器是否相互正常连接。(1) Since the connecting pin and the connector are connected to each other in a state where the cover unit covers the electronic module, the electronic module and the detection device form a structure in which the electronic module and the detection device are electrically powered in a state where the operator's line of sight to the electronic module is blocked connect. Therefore, the operator cannot visually confirm whether the connecting pin and the connector are normally connected to each other.
当检测结果确认电子模块性能良好时,操作者可以认为连接销与连接器正常连接。但是,当检测结果确认电子模块有缺陷时,无法准确地确定该缺陷是否是由于异常连接或电子模块的缺陷引起的。因此,很难在这方面进行额外的检测。When the test result confirms that the electronic module has good performance, the operator can consider that the connecting pin and the connector are normally connected. However, when the inspection result confirms that the electronic module is defective, it cannot be accurately determined whether the defect is caused by abnormal connection or a defect of the electronic module. Therefore, it is difficult to perform additional detection in this regard.
(2)当操作者手动旋转盖子时,会形成操作结构,其中连接销连接于连接器,并且盖单元在主体部分的一侧形成大约90度的回转半径。因此,安装测试插座的空间占用相当于主体部分的平面面积和盖单元的高度加上操作者操作所需的空间。(2) When the operator manually rotates the cover, an operation structure is formed in which the connecting pin is connected to the connector, and the cover unit forms a turning radius of about 90 degrees on one side of the main body portion. Therefore, the space for installing the test socket occupies a space equivalent to the plane area of the main body portion and the height of the cover unit plus the space required for the operator's operation.
在进行电子模块检测过程的实验室中,各种材料和设备都安装在有限的空间内。为了检测任务的方便性和效率性,各种材料和设备设置在离操作者距离较近的地方。因此,随着测试插座在实验室中的占用空间的增加,检测任务的方便性和效率性降低。In the laboratory where the electronic module inspection process is carried out, various materials and equipment are installed in a limited space. For the convenience and efficiency of the inspection task, various materials and equipment are placed close to the operator. Therefore, as the footprint of the test socket in the laboratory increases, the convenience and efficiency of the inspection task decreases.
(3)由于盖单元旋转以使连接销连接于连接器,因此盖单元在产生用于将连接销和连接器连接的外力的同时会进行曲线运动,在曲线运动中力的方向瞬间改变。因此,盖单元的旋转力在相对于连接销和连接器的连接方向倾斜的方向上传递给连接销和连接器(直到连接销和连接器完全连接),并且由于外力作用,连接销与连接器之间的接触区域会产生摩擦力,这与理想的连接方向不一致。(3) Since the cover unit rotates to connect the connecting pin to the connector, the cover unit performs a curved motion while generating an external force for connecting the connecting pin and the connector, and the direction of the force changes instantaneously in the curved motion. Therefore, the rotational force of the cover unit is transmitted to the connecting pin and the connector in a direction inclined with respect to the connecting direction of the connecting pin and the connector (until the connecting pin and the connector are completely connected), and due to the external force, the connecting pin and the connector are The contact area between them creates friction, which is inconsistent with the ideal connection direction.
结果,连接销和连接器被摩擦力损伤。特别地,由于摩擦力造成的损伤的逐渐积累的,因此连接到多个连接器的连接销的寿命会迅速降低。As a result, the connecting pins and connectors are damaged by friction. In particular, due to the gradual accumulation of damage caused by frictional forces, the life of connecting pins connected to a plurality of connectors may decrease rapidly.
在这方面,韩国专利No.759081公开了一种用于检测相机模块的插座。该由韩国专利No.759081公开的插座包括:主体部分,该主体部分上座设有被检测的相机模块;操作单元,该操作单元连接于主体部分以便于其上下移动;升降引导件,该升降引导件用于引导操作单元沿竖直方向的升降;夹片单元,该夹片单元配置为固定操作单元以使得操作单元保持在下降状态;销组件,该销组件位于操作单元的一侧,并连接于相机模块的连接销;印刷电路板,该印刷电路板连接于销组件;连接布线线路,该连接布线线路配置为连接印刷电路板和检测装置;以及镜头压紧部分,该镜头压紧部分设置在操作单元上。In this regard, Korean Patent No. 759081 discloses a socket for detecting a camera module. The socket disclosed by Korean Patent No. 759081 includes: a main body part on which a camera module to be detected is seated; an operation unit connected to the main body part to facilitate its up and down movement; and a lift guide, the lift guide The parts are used to guide the lifting and lowering of the operating unit in the vertical direction; the clip unit is configured to fix the operating unit to keep the operating unit in a lowered state; the pin assembly is located on one side of the operating unit and is connected to a connecting pin to the camera module; a printed circuit board connected to the pin assembly; a connecting wiring line configured to connect the printed circuit board and the detection device; and a lens pressing portion provided with on the operating unit.
(4)在韩国专利No.759081中,由于操作单元形成有沿竖直方向上下移动的操作结构,因此可以部分地解决上述问题(1)到(3)。但是,由于镜头压紧部分位于座板的上方,相机模块向座板移动可能发生与镜头压紧部分相碰撞的事故,相机模块因此可能会断裂。镜头压紧部分具有干扰操作者对于座板的视线的结构问题。(4) In Korean Patent No. 759081, since the operation unit is formed with an operation structure that moves up and down in the vertical direction, the above problems (1) to (3) can be partially solved. However, since the lens pressing portion is located above the seat plate, the camera module may move toward the seat plate to collide with the lens pressing portion, and the camera module may therefore be broken. The lens pressing portion has a structural problem of interfering with the operator's line of sight to the seat plate.
[现有技术文件][PRIOR ART DOCUMENT]
[专利文件][patent document]
(专利文件1)韩国专利No.1006243(2010年12月29日登记)(Patent Document 1) Korean Patent No. 1006243 (registered on December 29, 2010)
(专利文件2)韩国专利No.759081(2007年9月10日登记)(Patent Document 2) Korean Patent No. 759081 (registered on September 10, 2007)
发明内容SUMMARY OF THE INVENTION
本发明一方面提供一种测试插座,其中,操作者能够在检测期间观察到电子模块,安装插座的空间的高度减小,并且连接销和连接器在理想的连接方向上相互连接。An aspect of the present invention provides a test socket in which an operator can observe an electronic module during inspection, a space in which the socket is installed is reduced in height, and a connection pin and a connector are connected to each other in a desired connection direction.
另外,本发明另一方面提供一种测试插座,其中,连接销与连接器之间的连接通过基于机械力的自动连接结构实现,而不是通过操作者的手动操作来实现。In addition, another aspect of the present invention provides a test socket, wherein the connection between the connection pin and the connector is realized by an automatic connection structure based on mechanical force, rather than by an operator's manual operation.
为了达到上述方面,本发明提供一种测试插座,包括:底座,该底座配置为在其上座设有电子元件,并且具有形成在其上部的向下倾斜的斜面;顶盖,该顶盖形成为能够在所述底座上方沿竖直方向移动;以及压紧模块,该压紧模块滑动地连接于所述顶盖,并且配置为当所述顶盖下降时向下压紧所述电子元件。在所述顶盖下降的过程中,所述压紧模块由所述斜面推动以滑动至所述电子元件的上方。In order to achieve the above-mentioned aspect, the present invention provides a test socket, comprising: a base configured to have electronic components disposed thereon and having a downwardly inclined slope formed on an upper portion thereof; and a top cover formed as a capable of moving in a vertical direction above the base; and a pressing module slidably connected to the top cover and configured to press down the electronic components when the top cover is lowered. During the descending process of the top cover, the pressing module is pushed by the inclined surface to slide above the electronic components.
所述底座或所述压紧模块可设置有连接销,该连接销配置为沿竖直方向连接于所述电子元件的连接器。The base or the pressing module may be provided with a connecting pin configured to be connected to the connector of the electronic component in a vertical direction.
所述底座和所述顶盖中的一者可设置有竖轴,所述底座和所述顶盖中的另一者可设置有轴槽,所述竖轴插入所述轴槽中并能够沿竖直方向移动。One of the base and the top cover may be provided with a vertical shaft, and the other of the base and the top cover may be provided with a shaft groove into which the vertical shaft is inserted and can be Move vertically.
所述顶盖和所述压紧模块可通过第一弹性件相互连接,并且所述压紧模块可以在所述顶盖升降的过程中通过所述第一弹性件的恢复力与所述斜面紧密接触。The top cover and the pressing module can be connected to each other by a first elastic member, and the pressing module can be tightly connected to the inclined surface by the restoring force of the first elastic member during the lifting and lowering of the top cover touch.
所述测试插座还可包括插设在所述底座和所述顶盖之间的第二弹性件,当移除用于降低所述顶盖的外力时,所述顶盖可通过所述第二弹性件的恢复力上升,并且所述压紧模块可配置为通过所述第一弹性件的恢复力沿远离所述电子元件的方向滑动。The test socket may further include a second elastic member interposed between the base and the top cover, and when the external force for reducing the top cover is removed, the top cover can pass through the second elastic member. The restoring force of the elastic member rises, and the pressing module may be configured to slide in a direction away from the electronic component by the restoring force of the first elastic member.
所述顶盖可通过驱动器沿垂直方向移动,并且当所述驱动器提升所述顶盖时,所述压紧模块可配置为通过所述第一弹性件的恢复力沿远离所述电子元件的方向滑动。The top cover may be moved in a vertical direction by a driver, and when the driver lifts the top cover, the pressing module may be configured to move in a direction away from the electronic component by the restoring force of the first elastic member slide.
所述顶盖上可设置有轨道,并且所述压紧模块可包括配置为沿所述轨道滑动的滑块、连接于所述滑块并配置为向下推动所述电子元件的推块以及可转动地连接于所述滑块以在所述斜面上滚动的滚动件。A track may be provided on the top cover, and the pressing module may include a slider configured to slide along the track, a push block connected to the slider and configured to push the electronic component downward, and A rolling element that is rotatably connected to the slider to roll on the slope.
所述顶盖和所述压紧模块可通过第一弹性件相互连接,并且所述底座可具有设置于所述斜面下方的竖直面。所述滚动件在其通过所述第一弹性件的恢复力与所述竖直面紧密接触的状态下在所述竖直面上滚动,以使得所述推块向下压紧所述电子元件。The top cover and the pressing module may be connected to each other through a first elastic member, and the base may have a vertical surface disposed below the inclined surface. The rolling member rolls on the vertical surface in a state in which it is in close contact with the vertical surface by the restoring force of the first elastic member, so that the push block presses down the electronic component .
根据本发明,在所述顶盖下降的过程中,所述斜面推动所述压紧模块,从而使所述电子元件向上滑动。因此,可以提供一种测试插座,其中操作者能够在检测过程中观察到电子模块,安装所述插座的空间的高度减小,并且所述连接销和所述连接器在理想的连接方向上相互连接。According to the present invention, during the descending process of the top cover, the inclined surface pushes the pressing module, so that the electronic component slides upward. Therefore, it is possible to provide a test socket in which the operator can observe the electronic module during the inspection, the height of the space in which the socket is installed is reduced, and the connection pin and the connector are mutually in the ideal connection direction connect.
另外,当所述驱动器向上移动所述顶盖时,所述压紧模块通过所述第一弹性件的恢复力沿远离所述电子元件的方向滑动。因此,可以提供一种测试插座,其中连接销与连接器之间的连接通过基于机械力的自动连接结构实现,而不是通过操作者的手动操作来实现。In addition, when the driver moves the top cover upward, the pressing module slides in a direction away from the electronic component by the restoring force of the first elastic member. Therefore, it is possible to provide a test socket in which the connection between the connection pin and the connector is achieved by an automatic connection structure based on mechanical force, rather than by an operator's manual operation.
附图说明Description of drawings
本发明的上述和其他方面、特征和优点通过以下与附图结合的详细描述将更加明显,其中:The above and other aspects, features and advantages of the present invention will be more apparent from the following detailed description taken in conjunction with the accompanying drawings, wherein:
图1是根据本发明的一种实施方式的测试插座的透视图;1 is a perspective view of a test socket according to one embodiment of the present invention;
图2是图1的测试插座的使用状态的透视图;Figure 2 is a perspective view of the test socket of Figure 1 in use;
图3是图1的测试插座的爆炸图;Fig. 3 is an exploded view of the test socket of Fig. 1;
图4是图1的测试插座的剖视图;4 is a cross-sectional view of the test socket of FIG. 1;
图5是图2的测试插座的剖视图;5 is a cross-sectional view of the test socket of FIG. 2;
图6是根据本发明的另一种实施方式的测试插座的透视图;6 is a perspective view of a test socket according to another embodiment of the present invention;
图7是图6的测试插座的剖视图;并且Figure 7 is a cross-sectional view of the test socket of Figure 6; and
图8是图6的测试插座的使用状态的剖视图。FIG. 8 is a cross-sectional view of the test socket of FIG. 6 in a use state.
具体实施方式Detailed ways
以下,将参照相应附图详细说明本发明的示例性实施方式。在本发明的说明中,为了使本发明的主题清楚,将省略已知功能或结构的描述。Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the corresponding drawings. In the description of the present invention, descriptions of known functions or constructions will be omitted in order to make the subject matter of the present invention clear.
本发明的测试插座配置为使得操作者能够在检测过程中观察到电子模块,安装插座的空间的高度减小,并且连接销和连接器在理想的连接方向上相互连接。The test socket of the present invention is configured such that the operator can observe the electronic module during the inspection process, the height of the space in which the socket is installed is reduced, and the connection pins and the connectors are connected to each other in a desired connection direction.
另外,本发明的测试插座配置为使得连接销和连接器之间的连接通过基于机械力的自动连接结构实现,而不是通过操作者的手动操作来实现。In addition, the test socket of the present invention is configured such that the connection between the connecting pin and the connector is achieved by an automatic connection structure based on mechanical force, rather than manual operation by an operator.
图1是根据本发明的一种实施方式的测试插座的透视图,图2是图1的测试插座的使用状态的透视图,并且图3是图1的测试插座的爆炸图。图4是图1的测试插座的剖视图并且图5是图2的测试插座的剖视图。图6是根据本发明的另一种实施方式的测试插座的透视图,图7是图6的测试插座的剖视图,并且图8是图6的测试插座的使用状态的剖视图。1 is a perspective view of a test socket according to an embodiment of the present invention, FIG. 2 is a perspective view of a use state of the test socket of FIG. 1 , and FIG. 3 is an exploded view of the test socket of FIG. 1 . 4 is a cross-sectional view of the test socket of FIG. 1 and FIG. 5 is a cross-sectional view of the test socket of FIG. 2 . 6 is a perspective view of a test socket according to another embodiment of the present invention, FIG. 7 is a cross-sectional view of the test socket of FIG. 6 , and FIG. 8 is a cross-sectional view of a use state of the test socket of FIG. 6 .
如图1-图5所示,根据本发明的一种实施方式的测试插座10适用于将组装的电子元件L与检测装置连接,并且测试插座10包括底座100、顶盖200和压紧模块300。As shown in FIGS. 1-5 , the
电子元件L表示安装在测试插座10上并通过检测装置进行质量检测的半导体、LCD模块、图像传感器、相机模块等。附图示出作为电子元件L的LCD模块的一端。为了便于理解本发明,电子元件L的上、下部分将在附图所示的状态中分开描述。The electronic component L represents a semiconductor, an LCD module, an image sensor, a camera module, and the like, which are mounted on the
如图1-图3所示,底座100配置为在其上座设有电子元件L,并形成大致为长方体的块状。底座100的上表面形成有座设电子元件L的阀座部110。As shown in FIGS. 1-3 , the
测试插座10是一种用于将电子元件L连接于检测装置的装置,电子元件L的连接器C连接于测试插座10的连接销P。连接器C根据电子元件L的种类和类型设置在电子元件L的上侧或下侧。The
连接销P安装在底座100或压紧模块300上,并且沿竖直方向连接于电子元件L的连接器C。用于检测具有安装于下侧的连接器C的电子元件L的测试插座10具有安装在底座100的阀座部110上的连接销P,用于检测具有安装于上侧的连接器的电子元件的测试插座具有安装于推块的连接销。The connection pin P is mounted on the base 100 or the
图1-图8示出用于检测LCD模块的测试插座10,LCD模块具有位于下侧的连接器C,也就是,测试插座10为连接销P设置在阀座部110上的类型。以下,为了便于理解本发明,将对附图中所示的测试插座10的类型(连接销P设置在阀座部110上)进行说明。印刷电路板(PCB)连接到底座100的底面。连接销P连接于PCB。FIGS. 1-8 show a
如图3-图5所示,向下的斜面121形成在底座100的上部。更具体地,底座100的上侧设置有引导件120,引导件120具有斜面121和竖直面122。倾斜部分形成朝向阀座部110的向下斜坡。竖直面122形成在斜面121下方。As shown in FIGS. 3-5 , a
如图1-图3所示,第一杆L1和第二杆L2可转动地设置在底座100上,并且顶盖200上形成有与第一杆L1接合的接合部220。As shown in FIGS. 1-3 , the first lever L1 and the second lever L2 are rotatably disposed on the
多个第一杆L1分别可转动地连接于底座100的相对侧。每个第一杆L1通过扭簧(未示出)旋转地偏向接合部220。如图2所示,当顶盖200下降时,连接销P连接于连接器C,接合部220与第一杆L1的上端接合。当接合部220与第一杆L1接合时,阻止了顶盖200的上移,并且连接销P与连接器C保持在连接状态。第一杆L1的下端朝底座100向下延伸。The plurality of first rods L1 are respectively rotatably connected to opposite sides of the
如图4和图5所示,第二杆L2可转动地连接于底座100的一端。第二杆L2的一端向外伸出,第二杆L2的另一端位于第一杆L1的另一端的下方。当操作者在如图5所示的状态按压第二杆L2的一端时,第二杆L2的另一端提起第一杆L1的下端以旋转第一杆L1,并释放接合部220与第一杆L1的接合。由于第一杆L1和第二杆L2不是本发明的主要部分,所以将省略对它们的详细描述。As shown in FIGS. 4 and 5 , the second rod L2 is rotatably connected to one end of the
如图1-图5所示,顶盖200配置为沿竖直方向移动压紧模块300,并且形成为能够在底座100的上方沿竖直方向移动。As shown in FIGS. 1-5 , the
底座100上安装有竖轴130。虽然没有详细示出,但底座100上形成有槽,并且竖轴130插入所述槽中。顶盖200上形成有轴槽SH,并且竖轴130插入轴槽SH中以使顶盖200能够沿竖直方向移动。因此,在竖轴130插入轴槽SH的状态下,顶盖200处于在底座100上方沿竖直方向可移动的状态。A
在底座100和顶盖200之间插设有多个第二弹性件E2。第二弹性件E2配置为压缩弹簧。底座100和顶盖200上形成有多个安装槽IH,第二弹性件E2的上端和下端均插入安装槽IH中。第二弹性件E2插入安装槽IH中以防止其移动。A plurality of second elastic members E2 are inserted between the base 100 and the
图1和图4示出顶盖200通过第二弹性件E2的恢复力上升到最高的状态。阻挡件131连接于底座100,并且在图1和图4所示的状态中,顶盖200的下端与阻挡件131接合,由于阻挡件131的干涉,因此顶盖200不能再向上移动,并且保持在图1和图4中所示的状态。1 and 4 show a state in which the
图2和图5示出顶盖200由操作者推动下降的状态(而第二弹性件E2被压缩)。当将用于使顶盖200下降至图2和图5所示状态的外力(操作者施加的推力)移除时,顶盖200通过第二弹性件E2的恢复力上升至图1和图4所示的状态。2 and 5 show a state in which the
如图3所示,顶盖200上形成有一对轨道210(滑块310在其上滑动)。轨道210形成在与斜面121的向下的倾斜方向相同的延伸平面上。As shown in FIG. 3 , a pair of
如图3-图5所示,压紧模块300配置为当顶盖200下降时向下压紧电子元件L,压紧模块300包括滑块310、推块320和滚动件330。As shown in FIGS. 3-5 , the
滑块310配置为沿轨道210滑动,并通过一对安装部311安装于轨道210。当安装部311分别安装于轨道210时,滚动件310处于只能沿轨道210的轴向线性移动的状态。The
推块320配置为当顶盖200下降时直接接触并压紧电子元件L。推块320连接于滑块310。更具体地,推块320连接于滑块310的朝向阀座部110的一侧的端部。推块320是由弹性橡胶或硅材料制成的。The
滚动件330配置为在斜面121和竖直面122上滚动,滚动件330形成为圆柱形并通过螺栓或销可转动地连接于滑块310。The rolling
如图3-图5所示,顶盖200和压紧模块300通过第一弹性件E1相互连接。第一弹性件E1配置为使滚动件330与斜面121和竖直面122紧密接触。第一弹性件E1配置为压缩弹簧,并且在与阀座部110相对的一侧将滑块310连接于顶盖200。滑块310和顶盖200上分别形成有孔,第一弹性件E1的两端部接合在所述孔中。As shown in FIGS. 3-5 , the
如图4和图5所示,第一弹性件E1配置为使滚动件330与斜面121或者竖直面122紧密接触(通过恢复力沿远离电子元件L的方向拉动滑块310)。因此,当顶盖200升降时,滚动件330在与斜面121或竖直面122紧密接触的状态下滚动。As shown in FIGS. 4 and 5 , the first elastic member E1 is configured to make the rolling
在图1和图4所示的状态中,也就是,在顶盖200通过第二弹性件E2的恢复力上升到最大位置处的状态中,滚动件330通过第一弹性件E1的恢复力与斜面121的上端部紧密接触。此时,推块320位于顶盖200的下方,操作者可以容易地将电子元件L座设在阀座部110上。In the state shown in FIGS. 1 and 4 , that is, in the state in which the
此后,当操作者推动顶盖200时,压紧模块300在顶盖200下降的过程中由斜面121推动,从而滑动到电子元件L的上方,然后沿竖直方向朝向电子元件L下降。Thereafter, when the operator pushes the
参照图4,R1表示滚动件330在斜面121上滚动时滚动件330的移动路径,W1表示滚动件330在斜面121上滚动时推块320的移动路径。当滚动件330在斜面121上滚动时,滑块310沿着轨道210移动,并且滚动件330和推块320的移动路径相对于斜面121的向下的斜度形成相同的角度。4 , R1 represents the moving path of the rolling
参照图4,R2表示滚动件330在竖直面122上滚动时滚动件330的移动路径,W2表示滚动件330在竖直面122上滚动时推块320的移动路径。当滚动件330在竖直面122上滚动时,滑块310不再沿轨道210移动,滚动件330和推块320形成沿竖直方向的移动路径。4 , R2 represents the moving path of the rolling
推块320在移动路径W1上与电子元件L隔开,并通过移动路径W2向下(在连接器C和连接销P的连接方向上)压紧电子元件L。在图5所示的状态中,连接器C和连接销P通过推块320的压紧力保持稳定连接状态。The
当操作者在检测装置检测完成后推动第二杆L2时,顶盖200通过第二弹性件E2的恢复力上升,压紧模块300通过第一弹性件E1的恢复力沿远离电子元件L的方向滑动。也就是,当顶盖200上升时,滚动件330由于第一弹性件E1的恢复力在与竖直面122和斜面121紧密接触的状态下上升,推块320沿与移动路径W2相反方向的移动路径上升,然后沿与移动路径W1相反方向的移动路径移动,从而再次位于顶盖200的下方(参见图1和图4)。When the operator pushes the second lever L2 after the detection by the detection device, the
在韩国专利No.1006243中,形成有操作结构,其中,当操作者旋转盖单元时,设置在盖单元上的部件(连接销块或推块)将电子模块按压在阀座部上,从而使测试插座连接销(以下简称“连接销”)与电子模块连接器(以下简称“连接器”)连接。In Korean Patent No. 1006243, an operation structure is formed in which, when the operator rotates the cover unit, a member (connection pin block or push block) provided on the cover unit presses the electronic module against the valve seat portion, thereby making The test socket connecting pin (hereinafter referred to as "connecting pin") is connected with the electronic module connector (hereinafter referred to as "connector").
但是,韩国专利No.1006243具有以下缺点。However, Korean Patent No. 1006243 has the following disadvantages.
(1)由于连接销和连接器在盖单元覆盖电子模块的状态下相互连接,电子模块和检测装置形成一种结构,其中电子模块和检测装置在遮蔽操作者对电子模块的视线的状态下电连接。因此,操作者无法直观地确认连接销和连接器是否相互正常连接。(1) Since the connecting pin and the connector are connected to each other in a state where the cover unit covers the electronic module, the electronic module and the detection device form a structure in which the electronic module and the detection device are electrically powered in a state where the operator's line of sight to the electronic module is blocked connect. Therefore, the operator cannot visually confirm whether the connecting pin and the connector are normally connected to each other.
当检测结果确认电子模块性能良好时,操作者可以认为连接销与连接器正常连接。但是,当检测结果确认电子模块有缺陷时,无法准确地确定该缺陷是否是由于异常连接或电子模块的缺陷引起的。因此,很难在这方面进行额外的检测。When the test result confirms that the electronic module has good performance, the operator can consider that the connecting pin and the connector are normally connected. However, when the inspection result confirms that the electronic module is defective, it cannot be accurately determined whether the defect is caused by abnormal connection or a defect of the electronic module. Therefore, it is difficult to perform additional detection in this regard.
(2)当操作者手动旋转盖子时,会形成操作结构,其中连接销连接于连接器,并且盖单元在主体部分的一侧形成大约90度的回转半径。因此,安装测试插座的空间占用相当于主体部分的平面面积和盖单元的高度加上操作者操作所需的空间。(2) When the operator manually rotates the cover, an operation structure is formed in which the connecting pin is connected to the connector, and the cover unit forms a turning radius of about 90 degrees on one side of the main body portion. Therefore, the space for installing the test socket occupies a space equivalent to the plane area of the main body portion and the height of the cover unit plus the space required for the operator's operation.
在进行电子模块检测过程的实验室中,各种材料和设备都安装在有限的空间内。为了检测任务的方便性和效率性,各种材料和设备设置在离操作者距离较近的地方。因此,随着测试插座在实验室中的占用空间的增加,检测任务的方便性和效率性降低。In the laboratory where the electronic module inspection process is carried out, various materials and equipment are installed in a limited space. For the convenience and efficiency of the inspection task, various materials and equipment are placed close to the operator. Therefore, as the footprint of the test socket in the laboratory increases, the convenience and efficiency of the inspection task decreases.
(3)由于盖单元旋转以使连接销连接于连接器,因此盖单元在产生用于将连接销和连接器连接的外力的同时会进行曲线运动,在曲线运动中力的方向瞬间改变。因此,盖单元的旋转力在相对于连接销和连接器的连接方向倾斜的方向上传递给连接销和连接器(直到连接销和连接器完全连接),并且由于外力作用,连接销与连接器之间的接触区域会产生摩擦力,这与理想的连接方向不一致。(3) Since the cover unit rotates to connect the connecting pin to the connector, the cover unit performs a curved motion while generating an external force for connecting the connecting pin and the connector, and the direction of the force changes instantaneously in the curved motion. Therefore, the rotational force of the cover unit is transmitted to the connecting pin and the connector in a direction inclined with respect to the connecting direction of the connecting pin and the connector (until the connecting pin and the connector are completely connected), and due to the external force, the connecting pin and the connector are The contact area between them creates friction, which is inconsistent with the ideal connection direction.
结果,连接销和连接器被摩擦力损伤。特别地,由于摩擦力造成的损伤的逐渐积累的,因此连接到多个连接器的连接销的寿命会迅速降低。As a result, the connecting pins and connectors are damaged by friction. In particular, due to the gradual accumulation of damage caused by frictional forces, the life of connecting pins connected to a plurality of connectors may decrease rapidly.
在这方面,韩国专利No.759081公开了一种用于检测相机模块的插座。该由韩国专利No.759081公开的插座包括:主体部分,该主体部分上设置有被检测的相机模块;操作单元,该操作单元连接于主体部分以便于其上下移动;升降引导件,该升降引导件用于引导操作单元沿竖直方向的升降;夹片单元,该夹片单元配置为固定操作单元以使得操作单元保持在下降状态;销组件,该销组件位于操作单元的一侧,并连接于相机模块的连接销;印刷电路板,该印刷电路板连接于销组件;连接布线线路,该连接布线线路配置为连接印刷电路板和检测装置;以及镜头压紧部分,该镜头压紧部分设置在操作单元上。In this regard, Korean Patent No. 759081 discloses a socket for detecting a camera module. The socket disclosed by Korean Patent No. 759081 includes: a main body part on which a camera module to be detected is disposed; an operation unit connected to the main body part to facilitate its up and down movement; and a lift guide, the lift guide The parts are used to guide the lifting and lowering of the operating unit in the vertical direction; the clip unit is configured to fix the operating unit to keep the operating unit in a lowered state; the pin assembly is located on one side of the operating unit and is connected to a connecting pin to the camera module; a printed circuit board connected to the pin assembly; a connecting wiring line configured to connect the printed circuit board and the detection device; and a lens pressing portion provided with on the operating unit.
(4)在韩国专利No.759081中,由于操作单元形成有上下移动的操作结构,因此可以部分地解决上述问题(1)到(3)。但是,由于镜头压紧部分位于座板的上方,相机模块向座板移动可能发生与镜头压紧部分相碰撞的事故,相机模块因此可能会断裂。镜头压紧部分具有干扰操作者对于座板的视线的结构问题。(4) In Korean Patent No. 759081, since the operation unit is formed with an operation structure that moves up and down, the above problems (1) to (3) can be partially solved. However, since the lens pressing portion is located above the seat plate, the camera module may move toward the seat plate to collide with the lens pressing portion, and the camera module may therefore be broken. The lens pressing portion has a structural problem of interfering with the operator's line of sight to the seat plate.
本发明的测试插座10配置为当顶盖200下降时,使得压紧模块300移动到电子元件L的上方,并在连接销P和连接器C的连接方向上压紧电子元件L。从而解决了上述现有技术中的问题(1)到(4)。The
即使当如图2所示的顶盖200下降时,也可以确认位于推块320下方的连接器C的位置和角度。因此,操作者能够直观地确认连接销P和连接器C是否相互正常连接,从而能够解决上述相关技术中的问题(1)。Even when the
如图4所示,顶盖200形成沿竖直方向移动的没有旋转的操作结构。顶盖200仅通过竖直面122和斜面121的高度提起。由于竖直面122和斜面121的高度不一定是连接器C和连接销P或更多之间的连接深度的几十倍或更多。因此,可以通过减小测试插座10在实验室中的占用高度,来解决上述相关技术中的问题(2)。As shown in FIG. 4 , the
另外,推块320在移动路径W1上与电子元件L隔开,并通过移动路径W2向下(在连接器C和连接销P的连接方向上)压紧电子元件L,由此解决上述相关技术中的问题(3)。In addition, the
进一步地,当顶盖200上升时,推块320在顶盖200下方移动远离阀座部110的上侧,由此解决上述相关技术中的问题(4)。Further, when the
如图6-图8所示,根据本发明的另一种实施方式的测试插座20,测试插座20配置为通过驱动器A沿竖直方向移动顶盖200。测试插座20包括底座100、顶盖200和压紧模块300。As shown in FIGS. 6-8 , according to the
如图6所示,底座100配置为在其上座设有电子元件L,并形成大致为长方体的块状。底座100的上表面形成有座设电子元件L的阀座部110。As shown in FIG. 6 , the
如图6-图8所示,底座100的上面设置有引导件120,引导件120上形成有向下倾斜的斜面121。倾斜部分形成朝向阀座部110的向下的斜坡。在引导件120中,斜面121的下方形成有竖直面122。As shown in FIGS. 6-8 , a
顶盖200形成为能够通过驱动器A在底座100上方沿竖直方向移动。如图7和图8所示,驱动器A可以是气压缸。驱动器A可采用使用电或液压的类型。The
驱动器A的主体A1连接于底座的下端,驱动器A的拉杆A2朝向顶盖200延伸穿过形成在底座100上的孔。拉杆A2通过螺栓连接于顶盖200。上面没有说明的BH,表示供螺栓插入的孔。The main body A1 of the driver A is connected to the lower end of the base, and the pull rod A2 of the driver A extends through the hole formed on the base 100 toward the
竖轴230设置在顶盖200上。虽然未详细示出,但顶盖200上形成有槽,并且竖轴插入所述槽中。顶盖100上设置有孔,并且竖轴230插入所述孔中以使顶盖200能够沿竖直方向移动。这样,在竖轴230插入所述孔的状态下,顶盖200处于能够在底座100上方沿竖直方向移动的状态。The
图6和图7示出顶盖200通过驱动器A上升的状态,图8示出顶盖200通过驱动器A下降的状态并且连接销P和连接器C相互连接。6 and 7 show a state where the
参照图7和图8,顶盖200上形成有一对轨道210(滑块310在其上滑动)。一对轨道210形成在与斜面121的向下的倾斜方向相同的延伸平面上。Referring to FIGS. 7 and 8 , a pair of
如图6-图8所示,压紧模块300配置为在顶盖200下降时向下压紧电子元件L,压紧模块300包括滑块310、推块320和滚动件330。As shown in FIGS. 6-8 , the
滑块310配置为沿轨道210滑动,并通过一对安装部311安装于轨道210。当安装部311分别安装于轨道210时,滚动件310处于只能沿轨道210的轴向线性移动的状态。The
推块320配置为在顶盖200下降时直接接触并压紧电子元件L。推块320连接于滑块310。更具体地,推块320连接于滑块310的朝向阀座部110的一侧的端部。推块320是由弹性橡胶或硅材料制成的。The
滚动件330配置为在斜面121和竖直面122上滚动,滚动件330形成为圆柱形并通过螺栓或销可转动地连接于滑块310。The rolling
如图7和图8所示,顶盖200和压紧模块300通过第一弹性件E1相互连接。第一弹性件E1配置为产生使滚动件330与斜面121和竖直面122紧密接触的恢复力。第一弹性件E1配置为压缩弹簧,并且在与阀座部110相对的一侧将滑块310连接于顶盖200。滑块310和顶盖200上分别形成有孔,第一弹性件E1的两端部接合在所述孔中。As shown in FIG. 7 and FIG. 8 , the
如图4和图5所示,第一弹性件E1配置为使滚动件330与斜面121或者竖直面122紧密接触(通过恢复力沿远离电子元件L的方向拉动滑块310)。当顶盖200升降时,滚动件330在与斜面121或竖直面122紧密接触的状态下滚动。As shown in FIGS. 4 and 5 , the first elastic member E1 is configured to make the rolling
在图6和图7所示的状态中,顶盖200通过驱动器A上升到最大位置处,滚动件330通过第一弹性件E1的恢复力与斜面121的上端部紧密接触。此时,推块320位于顶盖200的下方,操作者可以容易地将电子元件L座设在阀座部110上。In the state shown in FIGS. 6 and 7 , the
如图8所示,当顶盖200通过驱动器A下降时,压紧模块300在顶盖200下降的过程中由斜面121推动,使得压紧模块滑动到电子元件L的上方,然后沿竖直方向下降。As shown in FIG. 8 , when the
当滚动件330在斜面121上滚动时,推块320与电子元件L分离,并且当滚动件330在竖直面122上滚动时,推块320向下(在连接器C和连接销P的连接方向上)压紧电子元件L。在图8所示的状态中,连接器C和连接销P通过推块320的压紧力保持稳定连接状态。When the rolling
在检测装置检测完成后,顶盖200通过驱动器A自动上升。当顶盖200上升时,压紧模块300通过第一弹性件E1的恢复力沿远离电子元件L的方向滑动。After the detection by the detection device is completed, the
因此,当顶盖200通过驱动器A上升或下降时,可以控制顶盖200的速度使其保持恒定,从而使连接器C和连接销P更稳定地连接。由于操作者不需要用手来压紧顶盖200等,因此具有可以使测试插座20在实验室中的占用高度最小化的优点。Therefore, when the
根据本发明,在顶盖下降的过程中,压紧模块由斜面推动以滑动至电子元件的上方。因此,可以提供一种测试插座,其中,操作者能够在检测过程中观察到电子模块,安装插座的空间的高度减小,并且连接销和连接器在理想的连接方向上相互连接。According to the present invention, during the descending process of the top cover, the pressing module is pushed by the inclined surface to slide above the electronic components. Therefore, it is possible to provide a test socket in which the operator can observe the electronic module during the inspection, the height of the space in which the socket is installed is reduced, and the connection pins and the connectors are connected to each other in an ideal connection direction.
此外,当驱动器升起顶盖时,压紧模块通过第一弹性件的恢复力沿远离电子元件的方向滑动。因此,可以提供一种测试插座,其中,连接销和连接器的连接通过机械力操作的自动连接结构实现,而不是通过操作者的手动操作来实现。In addition, when the driver lifts the top cover, the pressing module slides in a direction away from the electronic component by the restoring force of the first elastic member. Therefore, it is possible to provide a test socket in which the connection of the connection pin and the connector is achieved by an automatic connection structure operated by mechanical force, rather than by manual operation by an operator.
尽管上面已经描述了本发明的具体实施方式,显然,对于本领域技术人员来说,本发明并不限于在此公开的实施方式,并且可以在不背离本发明的精神和范围的情况下进行各种修改和变化。因此,不应从本发明的精神或观点单独解释这种修改和变化,并且应当理解修改后的实施方式属于本发明的权利要求。Although specific embodiments of the present invention have been described above, it will be apparent to those skilled in the art that the present invention is not limited to the embodiments disclosed herein, and various modifications may be made without departing from the spirit and scope of the present invention. modifications and changes. Therefore, such modifications and changes should not be interpreted solely from the spirit or viewpoint of the present invention, and it should be understood that the modified embodiments belong to the claims of the present invention.
Claims (7)
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KR1020170038688A KR101926690B1 (en) | 2017-03-27 | 2017-03-27 | Test socket |
KR10-2017-0038688 | 2017-03-27 |
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KR102172376B1 (en) * | 2019-08-23 | 2020-10-30 | (주)마이크로컨텍솔루션 | Test socket |
KR102171508B1 (en) * | 2019-08-27 | 2020-10-29 | 주식회사 엘비엘 | Socket for testing both sides of semiconductor chips |
US12210036B2 (en) | 2020-04-07 | 2025-01-28 | Smiths Interconnect Americas, Inc. | Test socket for semiconductor integrated circuits |
KR102218871B1 (en) * | 2020-04-27 | 2021-02-23 | 디플러스(주) | Socket for testing a product |
KR102358770B1 (en) * | 2020-07-03 | 2022-02-07 | 주식회사 네오셈 | SSD Tester Automation System |
KR102608592B1 (en) * | 2021-09-17 | 2023-12-04 | 디플러스(주) | Circuit board aligning apparatus for product test socket |
KR102371861B1 (en) * | 2022-01-11 | 2022-03-08 | 주식회사 프로이천 | Pin board adapter with hook fastening method |
KR102758347B1 (en) * | 2022-03-31 | 2025-01-22 | 주식회사 에스엔씨솔루션 | Substrate insert and remove fixing device |
KR102675471B1 (en) * | 2023-01-09 | 2024-06-14 | 주식회사 파워로직스 | Camera module calibration apparatus and calibration method |
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KR101926690B1 (en) | 2018-12-07 |
KR20180109303A (en) | 2018-10-08 |
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