CN108645532B - Temperature testing device with temperature testing and alarming functions and temperature testing method - Google Patents
Temperature testing device with temperature testing and alarming functions and temperature testing method Download PDFInfo
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Abstract
本发明提供一种具有测试温度告警功能的温度测试装置及温度测试方法，监测人员可以手持温度测试装置，通过网络连接控制按键获取网络连接控制指令，调取通信模块，使通信模块与待测服务器进行网络通信连接；通信模块与待测服务器网络连接成功后，向处理器回复网络连接成功信号，处理器将网络连接成功信号显示到显示屏上；处理器通过温度测试控制按键获取待测服务器测温控制指令，调取温度获取模块获取待测服务器的温度信息；并将温度信息与温度阈值设置模块设置的温度阈值进行比对判断是否超出阈值；处理器将当前的待测服务器的温度信息储存至存储器；当待测服务器的温度信息超出阈值时，语音提示模块发出提示信息。The present invention provides a temperature testing device and a temperature testing method with a function of testing temperature alarms. The monitoring personnel can hold the temperature testing device, obtain network connection control instructions through network connection control buttons, and retrieve the communication module, so that the communication module can be connected to the server to be tested. Carry out network communication connection; after the communication module is successfully connected to the server to be tested, it will reply the successful signal of network connection to the processor, and the processor will display the successful signal of network connection on the display screen; temperature control instruction, call the temperature acquisition module to obtain the temperature information of the server to be tested; compare the temperature information with the temperature threshold set by the temperature threshold setting module to determine whether it exceeds the threshold; the processor stores the current temperature information of the server to be tested to the memory; when the temperature information of the server to be tested exceeds the threshold, the voice prompt module sends out prompt information.
Description
Technical Field
The invention relates to the field of server temperature testing, in particular to a temperature testing device with a temperature testing alarm function and a temperature testing method.
Background
With the advent of the big data age, data has become the most important wealth for businesses, institutions, and individuals. Data concentration becomes a great trend, and more enterprises select to build a cloud storage system or directly transfer data to a storage server. As a result, convenience is brought, and at the same time, higher requirements are made on the stability and reliability of the storage server, and the storage server also has more strict requirements on the operation condition of the whole chassis. Currently, the storage server has an operating temperature managed by BMC/CMC or OSES. The monitoring mode is based on a device carried by the system. If the detection is based on random detection in the actual use process or the detection is carried out within a period of time and the detection mode is not limited to the detection operation temperature of one or more storage servers, a uniform detection mode is required. How to configure can guarantee to detect the operating temperature in a period of time, and the detection mode is not restricted to the detection operating temperature of a certain storage server or a certain number of storage servers for the technical problem to be solved at present.
Disclosure of Invention
In order to overcome the above-mentioned deficiencies in the prior art, the present invention provides a temperature testing device with a temperature alarm testing function, comprising: a device body; the device body is provided with a display screen network connection control key and a temperature test control key;
a main board is arranged in the device body, and a voice prompt module, a processor, a communication module, an IO interface module, a memory and a power supply battery for supplying power to elements of the device body are arranged on the main board;
the voice prompt module, the display screen, the communication module and the memory are respectively connected with the processor;
the network connection control key and the temperature test control key are respectively connected with the processor through the IO interface module;
the temperature acquisition module and the temperature threshold setting module are stored in the memory;
the processor acquires a network connection control instruction through the network connection control key, calls the communication module to enable the communication module to be in network communication connection with the server to be tested, replies a network connection success signal to the processor after the communication module is successfully in network connection with the server to be tested, and displays the network connection success signal on the display screen;
the processor acquires a temperature measurement control instruction of the server to be tested through the temperature test control key, and the temperature acquisition module is called to acquire temperature information of the server to be tested; comparing the temperature information with a temperature threshold value set by a temperature threshold value setting module to judge whether the temperature information exceeds the threshold value; the processor stores the current temperature information of the server to be tested to the memory; and when the temperature information of the server to be tested exceeds the threshold value, the voice prompt module sends prompt information.
Preferably, a test duration setting module is further stored in the memory;
the processor acquires a temperature measurement control instruction of the server to be tested through the temperature test control key, calls the temperature acquisition module to acquire temperature information of the server to be tested, and tests the temperature of the server to be tested according to the test duration set by the test duration setting module.
Preferably, the element temperature test values of the server under test include: the test device comprises a CPU temperature test value, a hard disk temperature test value, a display card temperature test value, a power supply temperature test value and a case internal temperature test value.
Preferably, the device body is also provided with an RS485 communication interface, a CAN network communication interface, an Ethernet communication interface and an RS232 communication interface;
the communication module is in communication connection in a Bluetooth mode, or in communication connection in a WIFI mode, or in communication connection in a radio frequency mode, or in communication connection in an infrared mode, or in communication connection in a GSM mode.
Preferably, the apparatus body further includes: a WeChat client;
the wechat client is used for enabling the device body to be in communication connection with the wechat client, transmitting data information of the device body to the wechat client, and enabling the plurality of device bodies and the user terminal to obtain temperature information of the server to be measured through the wechat client.
Preferably, the mainboard is also provided with a test initial setting circuit, a direct current transformation circuit and a voltage stabilizing circuit;
the device body is provided with a test initial control key;
the test initial control key is connected with the processor through the test initial setting circuit and used for carrying out test initial setting on the processor according to the received test initial instruction;
the testing device comprises a power supply battery, a testing initial control key, a direct current voltage transformation circuit, a voltage stabilizing circuit, a testing initial setting circuit and a processor which are sequentially connected;
the test initial control key is used for acquiring a test initial setting control instruction input by a user and enabling the power supply battery to supply power to the test initial setting circuit to realize the test initial setting of the processor after the preset pressing duration is reached.
Preferably, the test initial setting circuit includes: the device comprises an initial resistor R1, an initial resistor R2, an initial resistor R3, an initial capacitor C1, an initial capacitor C2, an initial diode VD and an initial triode Q; the first end of the initial resistor R3 and the positive electrode of the initial capacitor C1 are both connected with the input end of the test initial setting circuit; the cathode of the initial capacitor C1 is connected with one end of the initial resistor R1 and the cathode of the initial diode VD; the other end of the initial resistor R1 is connected with one end of the initial resistor R2 and the b pole of the initial triode Q; the C pole of the initial triode Q is connected with the first end of the initial capacitor C2; the second end of the initial resistor R3, the anode of the initial diode VD, the second end of the initial resistor R2, the e pole of the initial triode Q and the second end of the initial capacitor C2 are all grounded.
Preferably, the server under test is configured to encapsulate temperature information sent to the processor, where the temperature information includes: MAC address layer, processor IP layer, data frame section;
the data frame section comprises a server address code to be tested, a CPU temperature test value, or/and a hard disk temperature test value, or/and a display card temperature test value, or/and a power supply temperature test value, or/and a case internal temperature test value;
parity information encoding is set in the data frame section, when the parity information encoding is even, the message is a request, and when the parity information encoding is odd, the message is a response; when the message is a basic control request or status response, the bytes are 00h and 01 h;
a serial number which is automatically generated by the processor is also arranged in the data frame section, and is used for identifying different requests when the processor sends a plurality of temperature acquisition requests; requesting to obtain a CPU temperature test value, or/and a hard disk temperature test value, or/and a display card temperature test value, or/and a power supply temperature test value, or/and a case internal temperature test value.
A temperature testing method with a temperature testing alarm function comprises the following steps:
step one, a processor acquires a network connection control instruction through a network connection control key, and calls a communication module to enable the communication module to be in network communication connection with a server to be tested;
after the communication module is successfully connected with the server to be tested through the network, a network connection success signal is replied to the processor, and the processor displays the network connection success signal on a display screen;
acquiring a temperature measurement control instruction of the server to be tested by the processor through the temperature test control key, and acquiring temperature information of the server to be tested by the temperature acquisition module; comparing the temperature information with a temperature threshold value set by a temperature threshold value setting module to judge whether the temperature information exceeds the threshold value; the processor stores the current temperature information of the server to be tested to the memory;
and step four, when the temperature information of the server to be tested exceeds a threshold value, the voice prompt module sends prompt information.
Preferably, step three further comprises: the processor acquires a temperature measurement control instruction of the server to be tested through the temperature test control key, calls the temperature acquisition module to acquire temperature information of the server to be tested, and tests the temperature of the server to be tested according to the test time set by the test time setting module;
the processor sends a temperature information acquisition control instruction to the server to be tested, is attached with a serial number generated by the processor, and is used for identifying different requests when the processor sends a plurality of temperature acquisition requests; requesting to obtain a CPU temperature test value, or/and a hard disk temperature test value, or/and a display card temperature test value, or/and a power supply temperature test value, or/and a case internal temperature test value;
the server to be tested acquires a control instruction according to the temperature information sent by the processor, sends the temperature information of the element to be tested to the processor, and packages and sends the temperature information;
the first step also comprises the following steps: and the test initial setting circuit is used for supplying power to the test initial setting circuit by the power supply battery to realize the test initial setting of the processor after the test initial command received by the test initial control key reaches the preset pressing duration.
According to the technical scheme, the invention has the following advantages:
monitoring personnel can hold the temperature testing device by hands, acquire a network connection control instruction through a network connection control key, and call the communication module to enable the communication module to be in network communication connection with a server to be tested; after the communication module is successfully connected with the server to be tested through the network, a network connection success signal is replied to the processor, and the processor displays the network connection success signal on the display screen; the processor acquires a temperature measurement control instruction of the server to be tested through the temperature test control key, and the temperature acquisition module is called to acquire temperature information of the server to be tested; comparing the temperature information with a temperature threshold value set by a temperature threshold value setting module to judge whether the temperature information exceeds the threshold value; the processor stores the current temperature information of the server to be tested to the memory; and when the temperature information of the server to be tested exceeds the threshold value, the voice prompt module sends prompt information. If the temperature is normally checked on the display screen or the past detection information is called through the memory, the temperature test has traceability.
The temperature testing device can simultaneously detect a plurality of servers to be tested, and also can detect the servers to be tested by a plurality of temperature testing devices. Thus, the detection efficiency is improved.
The temperature testing device can ensure that the operation temperature is detected within a period of time, and the detection mode is not limited to the detection operation temperature of one or more storage servers. And the temperature testing device is in communication connection with the server to be tested through remote wireless, so that the convenience of detection is realized.
Drawings
In order to more clearly illustrate the technical solution of the present invention, the drawings used in the description will be briefly introduced, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a schematic diagram of a temperature testing device with a temperature alarm function;
FIG. 2 is a circuit diagram of test initial setup;
FIG. 3 is a flow chart of a temperature testing method with a test temperature alarm function.
Detailed Description
The present invention provides a temperature testing device with a temperature testing and alarming function, as shown in fig. 1 to 2, comprising: an apparatus body 1; the device body 1 is provided with a display screen 2, a network connection control key and a temperature test control key 3;
a main board is arranged in the device body 1, and a voice prompt module, a processor 11, a communication module, an IO interface module, a memory and a power supply battery 12 for supplying power to elements of the device body 1 are arranged on the main board; the voice prompt module, the display screen 2, the communication module and the memory are respectively connected with the processor 11; the network connection control key and the temperature test control key 3 are respectively connected with the processor 11 through an IO interface module;
the temperature acquisition module and the temperature threshold setting module are stored in the memory; the processor 11 acquires a network connection control instruction through the network connection control key, calls the communication module to enable the communication module to be in network communication connection with the server to be tested, replies a network connection success signal to the processor 11 after the communication module is successfully in network connection with the server to be tested, and the processor 11 displays the network connection success signal on the display screen 2; the processor 11 acquires a temperature measurement control instruction of the server to be tested through the temperature test control key 3, and the temperature acquisition module is called to acquire temperature information of the server to be tested; comparing the temperature information with a temperature threshold value set by a temperature threshold value setting module to judge whether the temperature information exceeds the threshold value; the processor 11 stores the current temperature information of the server to be tested in the memory; and when the temperature information of the server to be tested exceeds the threshold value, the voice prompt module sends prompt information.
The element temperature test value of the server to be tested comprises the following steps: the test device comprises a CPU temperature test value, a hard disk temperature test value, a display card temperature test value, a power supply temperature test value and a case internal temperature test value. Of course, the temperature to be detected in the present invention is not limited to the above, and more temperature acquisition types may be provided according to actual use requirements.
In order to make the objects, features and advantages of the present invention more obvious and understandable, the technical solutions of the present invention will be clearly and completely described below with reference to specific embodiments and drawings. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the scope of protection of this patent.
In the embodiment provided by the invention, a test duration setting module is also stored in the memory; the processor 11 acquires a temperature measurement control instruction of the server to be tested through the temperature test control key 3, calls the temperature acquisition module to acquire temperature information of the server to be tested, and performs temperature test on the server to be tested according to the test duration set by the test duration setting module.
If implemented in hardware, the invention relates to an apparatus, which may be, for example, the processor 11 or an integrated circuit device, such as an integrated circuit chip or chipset. Alternatively or additionally, if implemented in software or firmware, the techniques may implement a data storage medium readable at least in part by a computer, comprising instructions that when executed cause the processor 11 to perform one or more of the above-described methods. For example, a computer-readable data storage medium may store instructions such as those executed by processor 11.
In the embodiment provided by the invention, the mainboard is also provided with a test initial setting circuit, a direct current transformation circuit 14 and a voltage stabilizing circuit 15; the device body 1 is provided with a test initial control key 13; the test initial control key 13 is connected with the processor 11 through a test initial setting circuit and is used for carrying out test initial setting on the processor 11 according to a received test initial instruction; the power supply battery 12, the test initial control key 13, the direct current transformation circuit 14, the voltage stabilizing circuit 15, the test initial setting circuit and the processor 11 are connected in sequence; the test initial control key 13 is used for acquiring a test initial setting control instruction input by a user, and after a preset pressing duration is reached, the power supply battery 12 supplies power to the test initial setting circuit to realize test initial setting of the processor 11.
The test initial setting circuit includes: the device comprises an initial resistor R1, an initial resistor R2, an initial resistor R3, an initial capacitor C1, an initial capacitor C2, an initial diode VD and an initial triode Q; the first end of the initial resistor R3 and the positive electrode of the initial capacitor C1 are both connected with the input end of the test initial setting circuit; the cathode of the initial capacitor C1 is connected with one end of the initial resistor R1 and the cathode of the initial diode VD; the other end of the initial resistor R1 is connected with one end of the initial resistor R2 and the b pole of the initial triode Q; the C pole of the initial triode Q is connected with the first end of the initial capacitor C2; the second end of the initial resistor R3, the anode of the initial diode VD, the second end of the initial resistor R2, the e pole of the initial triode Q and the second end of the initial capacitor C2 are all grounded.
The initial test setting circuit adopts the initial capacitor C1 as the initial test delay setting, and the initial diode VD and the initial capacitor C1 form a loop to accelerate the charge release of the initial capacitor C1, thereby ensuring the next initial test delay setting in a shorter time and ensuring higher working reliability of the initial test setting circuit. After the test initial control key is pressed for a preset time, the test initial setting circuit is powered on, the initial capacitor C1 is charged, in the process of charging the initial capacitor C1, the current in the circuit can pass through the initial capacitor C1, the b pole of the initial triode Q has instantaneous voltage, the instantaneous voltage is greater than 0.7V, therefore, the initial triode Q is conducted instantaneously, the potential connected with the processor is pulled down instantaneously, and when the processor detects that the potential is pulled to be in a low level state, the test initial setting response is made. When the initial capacitor C1 is fully charged, the initial capacitor C1 is equivalent to an open circuit, at which time the initial transistor Q is turned off, the test initial setup process is completed, and the processor performs the current temperature test.
The terms "first," "second," "third," "fourth," and the like in the description and in the claims, as well as in the drawings, if any, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," as well as any variations thereof, are intended to cover non-exclusive inclusions.
In the embodiment provided by the invention, the device body 1 is also provided with an RS485 communication interface, a CAN network communication interface, an Ethernet communication interface and an RS232 communication interface; the communication module is in communication connection in a Bluetooth mode, or in communication connection in a WIFI mode, or in communication connection in a radio frequency mode, or in communication connection in an infrared mode, or in communication connection in a GSM mode.
The apparatus body 1 further includes: a WeChat client; the wechat client is used for enabling the device body to be in communication connection with the wechat client, transmitting data information of the device body to the wechat client, and enabling the plurality of device bodies and the user terminal to obtain temperature information of the server to be measured through the wechat client.
In the embodiment provided by the invention, in order to improve the accuracy of data acquisition and transmission, the server to be tested is used for encapsulating the temperature information sent to the processor, and the temperature information comprises: MAC address layer, processor IP layer, data frame section; the data frame section comprises a server address code to be tested, a CPU temperature test value, or/and a hard disk temperature test value, or/and a display card temperature test value, or/and a power supply temperature test value, or/and a case internal temperature test value; parity information encoding is set in the data frame section, when the parity information encoding is even, the message is a request, and when the parity information encoding is odd, the message is a response; when the message is a basic control request or status response, the bytes are 00h and 01 h; a serial number which is automatically generated by the processor is also arranged in the data frame section, and is used for identifying different requests when the processor sends a plurality of temperature acquisition requests; requesting to obtain a CPU temperature test value, or/and a hard disk temperature test value, or/and a display card temperature test value, or/and a power supply temperature test value, or/and a case internal temperature test value.
If the system is provided with a plurality of temperature testing devices, the information sent by each temperature testing device can be distinguished by the serial number of the data frame segment during testing, and the server to be tested can distinguish the information sent by each temperature testing device according to the serial number of the data frame segment and send the temperature information in a targeted manner. If a plurality of servers to be tested are detected, the servers to be tested can be distinguished based on the address codes of the servers to be tested, and accurate transmission of test information is guaranteed.
The invention also provides a temperature testing method with a temperature testing alarm function, as shown in fig. 3, the method comprises the following steps:
step one, a processor acquires a network connection control instruction through a network connection control key, and calls a communication module to enable the communication module to be in network communication connection with a server to be tested;
after the communication module is successfully connected with the server to be tested through the network, a network connection success signal is replied to the processor, and the processor displays the network connection success signal on a display screen;
acquiring a temperature measurement control instruction of the server to be tested by the processor through the temperature test control key, and acquiring temperature information of the server to be tested by the temperature acquisition module; comparing the temperature information with a temperature threshold value set by a temperature threshold value setting module to judge whether the temperature information exceeds the threshold value; the processor stores the current temperature information of the server to be tested to the memory;
and step four, when the temperature information of the server to be tested exceeds a threshold value, the voice prompt module sends prompt information.
If the temperature is normal, the temperature can be viewed on a display screen or the previous detection information can be retrieved through a memory.
In the method, the third step further comprises: the processor acquires a temperature measurement control instruction of the server to be tested through the temperature test control key, calls the temperature acquisition module to acquire temperature information of the server to be tested, and tests the temperature of the server to be tested according to the test time set by the test time setting module;
the processor sends a temperature information acquisition control instruction to the server to be tested, is attached with a serial number generated by the processor, and is used for identifying different requests when the processor sends a plurality of temperature acquisition requests; requesting to obtain a CPU temperature test value, or/and a hard disk temperature test value, or/and a display card temperature test value, or/and a power supply temperature test value, or/and a case internal temperature test value;
the server to be tested acquires a control instruction according to the temperature information sent by the processor, sends the temperature information of the element to be tested to the processor, and packages and sends the temperature information;
the first step also comprises the following steps: and the test initial setting circuit is used for supplying power to the test initial setting circuit by the power supply battery to realize the test initial setting of the processor after the test initial command received by the test initial control key reaches the preset pressing duration.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (5)
1. A temperature testing method with temperature alarm testing function is characterized in that,
the method adopts a temperature testing device with a temperature testing and alarming function, and the temperature testing device comprises: a device body (1); the device body (1) is provided with a display screen (2), and a network connection control key and a temperature test control key (3);
a mainboard is arranged in the device body (1), and a voice prompt module, a processor (11), a communication module, an IO interface module, a memory and a power supply battery (12) for supplying power to elements of the device body (1) are arranged on the mainboard;
the voice prompt module, the display screen (2), the communication module and the memory are respectively connected with the processor (11);
the network connection control key and the temperature test control key (3) are respectively connected with the processor (11) through an IO interface module;
the temperature acquisition module and the temperature threshold setting module are stored in the memory;
the processor (11) acquires a network connection control instruction through the network connection control key, calls the communication module to enable the communication module to be in network communication connection with the server to be tested, replies a network connection success signal to the processor (11) after the communication module is successfully in network connection with the server to be tested, and the processor (11) displays the network connection success signal on the display screen (2);
the processor (11) acquires a temperature measurement control instruction of the server to be tested through the temperature test control key (3), and calls the temperature acquisition module to acquire temperature information of the server to be tested; comparing the temperature information with a temperature threshold value set by a temperature threshold value setting module to judge whether the temperature information exceeds the threshold value; the processor (11) stores the current temperature information of the server to be tested into the memory; when the temperature information of the server to be tested exceeds a threshold value, the voice prompt module sends prompt information;
the mainboard is also provided with a test initial setting circuit, a direct current transformation circuit (14) and a voltage stabilizing circuit (15);
the device body (1) is provided with a test initial control key (13);
the test initial control key (13) is connected with the processor (11) through a test initial setting circuit and is used for carrying out test initial setting on the processor (11) according to a received test initial instruction;
the device comprises a power supply battery (12), a test initial control key (13), a direct current transformation circuit (14), a voltage stabilizing circuit (15), a test initial setting circuit and a processor (11) which are sequentially connected;
the test initial control key (13) is used for acquiring a test initial setting control instruction input by a user and enabling the power supply battery (12) to supply power to the test initial setting circuit to realize test initial setting of the processor (11) after a preset pressing time is reached;
the test initial setting circuit includes: the device comprises an initial resistor R1, an initial resistor R2, an initial resistor R3, an initial capacitor C1, an initial capacitor C2, an initial diode VD and an initial triode Q; the first end of the initial resistor R3 and the positive electrode of the initial capacitor C1 are both connected with the input end of the test initial setting circuit; the cathode of the initial capacitor C1 is connected with one end of the initial resistor R1 and the cathode of the initial diode VD; the other end of the initial resistor R1 is connected with one end of the initial resistor R2 and the b pole of the initial triode Q; the C pole of the initial triode Q is connected with the first end of the initial capacitor C2; the second end of the initial resistor R3, the anode of the initial diode VD, the second end of the initial resistor R2, the e pole of the initial triode Q and the second end of the initial capacitor C2 are all grounded;
the server to be tested is used for packaging the temperature information sent to the processor, and the temperature information comprises: MAC address layer, processor IP layer, data frame section;
the data frame section comprises a server address code to be tested, a CPU temperature test value, or/and a hard disk temperature test value, or/and a display card temperature test value, or/and a power supply temperature test value, or/and a case internal temperature test value;
parity information encoding is set in the data frame section, when the parity information encoding is even, the message is a request, and when the parity information encoding is odd, the message is a response; when the message is a basic control request or a status response, the byte is 00h or 01 h;
a serial number which is automatically generated by the processor is also arranged in the data frame section, and is used for identifying different requests when the processor sends a plurality of temperature acquisition requests; requesting to obtain a CPU temperature test value, or/and a hard disk temperature test value, or/and a display card temperature test value, or/and a power supply temperature test value, or/and a case internal temperature test value;
the method comprises the following steps:
the test initial setting circuit is used for receiving a test initial command received by the test initial control key and enabling the power supply battery to supply power to the test initial setting circuit to realize the test initial setting of the processor after the preset pressing duration is reached;
step one, a processor acquires a network connection control instruction through a network connection control key, and calls a communication module to enable the communication module to be in network communication connection with a server to be tested;
after the communication module is successfully connected with the server to be tested through the network, a network connection success signal is replied to the processor, and the processor displays the network connection success signal on a display screen;
acquiring a temperature measurement control instruction of the server to be tested by the processor through the temperature test control key, and acquiring temperature information of the server to be tested by the temperature acquisition module; comparing the temperature information with a temperature threshold value set by a temperature threshold value setting module to judge whether the temperature information exceeds the threshold value; the processor stores the current temperature information of the server to be tested to the memory;
the processor acquires a temperature measurement control instruction of the server to be tested through the temperature test control key, calls the temperature acquisition module to acquire temperature information of the server to be tested, and tests the temperature of the server to be tested according to the test time set by the test time setting module;
the processor sends a temperature information acquisition control instruction to the server to be tested, is attached with a serial number generated by the processor, and is used for identifying different requests when the processor sends a plurality of temperature acquisition requests; requesting to obtain a CPU temperature test value, or/and a hard disk temperature test value, or/and a display card temperature test value, or/and a power supply temperature test value, or/and a case internal temperature test value;
the server to be tested acquires a control instruction according to the temperature information sent by the processor, sends the temperature information of the element to be tested to the processor, and packages and sends the temperature information;
and step four, when the temperature information of the server to be tested exceeds a threshold value, the voice prompt module sends prompt information.
2. The temperature test method with a test temperature alarm function according to claim 1,
the memory is internally stored with a test duration setting module;
the processor (11) acquires a temperature measurement control instruction of the server to be tested through the temperature test control key (3), calls the temperature acquisition module to acquire temperature information of the server to be tested, and tests the temperature of the server to be tested according to the test duration set by the test duration setting module.
3. The temperature test method with a test temperature alarm function according to claim 1 or 2,
the element temperature test value of the server to be tested comprises the following steps: the test device comprises a CPU temperature test value, a hard disk temperature test value, a display card temperature test value, a power supply temperature test value and a case internal temperature test value.
4. The temperature test method with a test temperature alarm function according to claim 1,
the device body (1) is also provided with an RS485 communication interface, a CAN network communication interface, an Ethernet communication interface and an RS232 communication interface;
the communication module is in communication connection in a Bluetooth mode, or in communication connection in a WIFI mode, or in communication connection in a radio frequency mode, or in communication connection in an infrared mode, or in communication connection in a GSM mode.
5. The temperature test method with a test temperature alarm function according to claim 1,
the device body (1) further comprises: a WeChat client;
the wechat client is used for enabling the device body to be in communication connection with the wechat client, transmitting data information of the device body to the wechat client, and enabling the plurality of device bodies and the user terminal to obtain temperature information of the server to be measured through the wechat client.
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| CN110069116A (en) * | 2019-04-24 | 2019-07-30 | 苏州浪潮智能科技有限公司 | A kind of method and system of radiate test data processing and temperature alarming |
| CN110661202B (en) * | 2019-10-14 | 2021-08-10 | 国网山东省电力公司潍坊供电公司 | Automatic detection device for wire |
| CN111124784A (en) * | 2019-12-20 | 2020-05-08 | 浪潮商用机器有限公司 | A test method, device and equipment for the temperature alarm function of a server |
| CN113823073A (en) * | 2021-09-17 | 2021-12-21 | 深圳市金友精密机械有限公司 | Inside high temperature early warning system of smart TV and heat sink |
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