CN108615490A - test circuit - Google Patents
test circuit Download PDFInfo
- Publication number
- CN108615490A CN108615490A CN201810217305.6A CN201810217305A CN108615490A CN 108615490 A CN108615490 A CN 108615490A CN 201810217305 A CN201810217305 A CN 201810217305A CN 108615490 A CN108615490 A CN 108615490A
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- voltage
- test
- signal
- switch pipe
- test voltage
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
Abstract
A kind of test circuit for liquid crystal display is disclosed, including：Signal processor generates pulse signal for receiving trigger signal according to the trigger signal；First level shifting circuit is connected with the signal processor, and for receiving the pulse signal, the control signal is obtained according to the pulse signal；Output module, it is connected with first level shifting circuit, for receiving the control signal, the first test voltage and the second test voltage, one of the first test voltage and the second test voltage are provided as output test voltage according to the control signal, wherein, the voltage value of second test voltage is more than the voltage value of first test voltage, automatically adjusts test voltage, improves testing efficiency.
Description
Technical field
The present invention relates to field of liquid crystal, relate more specifically to a kind of test circuit for liquid crystal display.
Background technology
Liquid crystal display (Liquid Crystal Display, LCD) is the orientation using liquid crystal molecule in electric field
Under the action of the phenomenon that changing change the display device of light source light transmittance.High-quality, small and work(is shown due to having
Low advantage is consumed, liquid crystal display has been widely used for the display terminal of such as mobile phone and the large scale of such as flat panel TV is aobvious
Show in panel.
Existing liquid crystal display includes mainly display panel and provides the printing electricity of various working signals for display panel
Road plate.Display panel includes multiple pixel units arranged into an array, and each pixel unit includes thin film transistor (TFT) and pixel electricity
The grid of pole, thin film transistor (TFT) is connected by grid line with gate driving circuit, the source electrode of thin film transistor (TFT) by source electrode line with
Source electrode drive circuit is connected, and drain electrode is connected with pixel electrode.Gate driving circuit for scanning a plurality of grid line in order so that
The first film transistor of corresponding line is connected；Source electrode drive circuit is used for when first film transistor is connected on the pixel electrode
Apply gray scale voltage corresponding with display data.
Electric power management circuit is integrated on printed circuit board, electric power management circuit is used for gate driving circuit and source electrode
Driving circuit provides operating voltage.
Can all voltage fluctuation test be carried out to liquid crystal display, but the prior art is usually before liquid crystal display manufacture
By artificially changing input voltage, not only trivial operations, but also waste human resources.
Therefore, it is necessary to provide a kind of test circuit, test voltage can be automatically adjusted, is become for voltage of LCD
The test of change improves testing efficiency.
Invention content
In view of this, the purpose of the present invention is to provide a kind of test circuit, test voltage can be automatically adjusted, improves and surveys
Try efficiency.
According to a kind of test circuit for liquid crystal display provided by the invention, including：Signal processor, for receiving
Trigger signal generates pulse signal according to the trigger signal；First level shifting circuit is connected with the signal processor,
For receiving the pulse signal, the control signal is obtained according to the pulse signal；And
Output module is connected with first level shifting circuit, for receiving control signal, the first test voltage and the
Two test voltages provide one of the first test voltage and the second test voltage according to control signal and are used as output test voltage,
In, the voltage value of the second test voltage is more than the voltage value of the first test voltage.
Preferably, test circuit further includes voltage generation module, is connected with output module, for receiving supply voltage, root
The second test voltage is generated according to supply voltage.
Preferably, output module includes：First switch pipe, the control terminal of first switch pipe and the first level shifting circuit phase
Even to receive control signal, the first path terminal is connected with voltage generation module to receive the second test voltage；Second switch pipe, the
The control terminal of two switching tubes is connected with the first level shifting circuit controls signal to receive, and alternate path end receives the first test electricity
Pressure；First path terminal of first switch pipe is connected with the alternate path end of second switch pipe exports test voltage to provide, control
When signal is effective, the conducting of first switch pipe, when controlling invalidating signal, the conducting of second switch pipe.
Preferably, voltage generation module includes：It is sequentially connected in series first resistor between supply voltage and ground, variable resistance
And second resistance, the adjustable side of variable resistance are connected to the node between variable resistance and second resistance；Operational amplifier, fortune
The normal phase input end for calculating amplifier is connected with the node between second resistance and variable resistance, inverting input and output end phase
Even, output end is for providing the second test voltage；Capacitance, the first end of capacitance are connected with the adjustable side of variable resistance, second end
Ground connection.
Preferably, trigger signal includes line synchronising signal, wherein control module is set as the rising edge in line synchronising signal
Keep control signal effective, makes control invalidating signal in the failing edge of line synchronising signal.
Preferably, test circuit further includes second electrical level conversion circuit, for receiving the first test voltage, is surveyed according to first
It tries voltage and generates trigger signal, when the first test voltage is effective, trigger signal is effective.
Preferably, control module further includes reduction voltage circuit, for receiving supply voltage, is generated at signal according to supply voltage
Manage the operating voltage of device.
Preferably, variable resistance includes swept resistance, and the adjustable side of variable resistance includes the sliding end of swept resistance.
Preferably, first switch pipe is p-type field-effect tube, and second switch pipe is N-type field-effect tube.
The advantageous effect of test circuit provided in an embodiment of the present invention is, control letter can be automatically generated according to trigger signal
Number, when it is high level to control signal, output module exports the second test voltage, when it is low level to control signal, exports mould
Block exports the first test voltage, can automatically adjust test voltage, improves the working efficiency of testing liquid crystal display limiting voltage.
Description of the drawings
By referring to the drawings to the description of the embodiment of the present invention, above-mentioned and other purposes of the invention, feature and
Advantage will be apparent from.
Fig. 1 shows the circuit diagram of the test circuit of first embodiment of the invention；
Fig. 2 shows the circuit diagrams of the test circuit of second embodiment of the invention；
Fig. 3 shows the work schedule schematic diagram of the test circuit of first embodiment of the invention；
Fig. 4 shows the work schedule schematic diagram of the test circuit of second embodiment of the invention.
Specific implementation mode
Hereinafter reference will be made to the drawings is more fully described the present invention.In various figures, identical element is using similar attached
Icon is remembered to indicate.For the sake of clarity, the various pieces in attached drawing are not necessarily to scale.In addition, may not show in figure
Go out certain well known parts.
Many specific details of the present invention, such as the structure of component, material, size, processing work is described hereinafter
Skill and technology, to be more clearly understood that the present invention.But it just as the skilled person will understand, can not press
The present invention is realized according to these specific details.
In the whole instruction and claims, when describing an element " connected " to another element, which can
With " being directly connected to " to another element, or pass through third element " electrical connection " to another element.
Fig. 1 shows the circuit diagram of the test circuit of first embodiment of the invention.
As shown in Figure 1, the test circuit 100 of first embodiment of the invention includes control module 110, voltage generation module
120 and output module 130.Control module 110 is used to be believed according to the control that trigger signal is obtained for controlling output module 130
Number Ctrl, wherein trigger signal is, for example, being moved for controlling the display panel gate driving circuit in (not shown) in Fig. 1
The line synchronising signal STV of position.In an embodiment of the present invention, control module 110 further includes signal processor 112 and the first electricity
Flat conversion circuit 113.Signal processor 112 is for receiving line synchronising signal STV, according to line synchronising signal STV output pulse letters
Number, in preferred embodiment of the present invention, high level is exported in the rising edge signal processor 112 of line synchronising signal STV, is expert at
The failing edge signal processor 112 of synchronizing signal STV exports low level.Level shifting circuit 113 is for receiving signal processor
The pulse signal of 112 outputs, and the pulse signal that signal processor 112 exports is converted to control signal Ctrl.
Voltage generation module 120 is used to obtain the second test voltage Vin2 according to supply voltage VDD.As shown in Figure 1, voltage
Generation module 120 includes first resistor R1, second resistance R2, swept resistance VR and operational amplifier U1.Wherein, first resistor
R1, swept resistance VR and second resistance R2 are series between supply voltage VDD and ground.The normal phase input end of operational amplifier U1
It is connected with the intermediate node of swept resistance VR and second resistance R2, inverting input and the operational amplifier U1 of operational amplifier U1
Output end be connected, the output end of operational amplifier U1 exports the second test voltage Vin2.Voltage generation module 120 further includes electricity
Hold C1, the first end of capacitance C1 is connected with the intermediate node of swept resistance VR and second resistance R2, second end ground connection.In addition, sliding
The sliding end of dynamic resistance VR is connected with the first end of capacitance C1.
Output module 130 includes first switch pipe Q1 and second switch pipe Q2.The control terminal and first of first switch pipe Q1
Level shifting circuit 113 is connected controls signal Ctrl to receive, the first path terminal and the voltage generation module of first switch pipe Q1
120 are connected to receive the second test voltage Vin2.The control terminal of second switch pipe Q2 be connected with the first level shifting circuit 113 with
The first path terminal for receiving control signal Ctrl, second switch pipe Q2 receives the first test voltage Vin1.First switch pipe Q1's
First path terminal is connected with the alternate path end of second switch pipe Q2, and wherein intermediate node is used for the first test voltage Vin1 and the
Two test voltage Vin2 are as output test voltage Vout.
In embodiment one, first switch pipe Q1 is N-type TFT, and second switch pipe Q2 is P-type TFT.
When the control signal Ctrl that control module 110 provides is high level, the Q1 conductings of first switch pipe, the Q2 shutdowns of second switch pipe,
Output module 130 exports the second test voltage Vin2.When the control signal Ctrl that control module 110 provides is low level, the
Two switching tube Q2 conductings, the Q1 shutdowns of first switch pipe, output module 130 export the first test voltage Vin1.It is verified with this
There is influence of the big voltage to it suddenly when working normally in display.Certainly, system that the present invention is not limited thereto, the present invention's
In other embodiment, first switch pipe Q1 is P-type TFT, and second switch pipe Q2 is N-type TFT, this field
Technical staff can select the type of first switch pipe Q1 and second switch pipe Q2 as the case may be.
Fig. 2 shows the circuit diagrams of the test circuit of second embodiment of the invention.
As shown in Fig. 2, the test circuit 200 that second embodiment of the invention provides includes control module 210, voltage generation mould
Block 220 and output module 230 and second electrical level conversion circuit 240.
Control module 210 is for providing control signal Ctrl.In the embodiment of fig. 2, control module 210 includes at signal
Manage device 212, the first level shifting circuit 213 and reduction voltage circuit 214.The supply voltage VDD that reduction voltage circuit 214 is used to receive
It is supplied to signal processor 212 after being converted to the operating voltage of signal processor 212.First level shifting circuit 213 is used for will
Signal Ctrl is supplied to output module 230 in order to control for the pulse signal conversion that signal processor 212 exports.
Second electrical level conversion circuit 240 is generated for receiving the first test voltage Vin1 according to the first test voltage Vin1
Trigger signal.Signal processor 212 is for receiving the trigger signal, and when trigger signal is effective, signal processor 212 will produce
One pulse signal with certain duty ratio, the first level shifting circuit 213 obtain control signal according to the pulse signal
Ctrl。
The voltage generation module 120 with Fig. 1 respectively and output may be used in voltage generation module 220 and output module 230
The structure of module 130, details are not described herein.When the control signal Ctrl that control module 210 provides is high level, first switch
Pipe Q1 conductings, the Q2 shutdowns of second switch pipe, output module 230 export the second test voltage Vin2.It is provided when control module 210
When control signal Ctrl is low level, the Q2 conductings of second switch pipe, the Q1 shutdowns of first switch pipe, the output of output module 230 first
Test voltage Vin1.With this come achieve the purpose that display boot up the moment limit verification, certainly, the present invention is not with this
For limitation.Those skilled in the art can implement the present invention according to actual needs.
Fig. 3 shows the work schedule schematic diagram of the test circuit of first embodiment of the invention.
The operation principle of the test circuit 100 of first embodiment of the invention is carried out specifically referring to Fig. 1 and Fig. 3
It is bright.
As shown in Figure 1, voltage generation module 120 is for generating the second test voltage Vin2, it is preferable that adjusting can be passed through
Swept resistance VR changes the voltage value of the second test voltage Vin2.In addition, the voltage value of the second test voltage Vin2 is more than first
The voltage value of test voltage Vin1, as shown in figure 3, for example, the voltage value of the second test voltage Vin2 is 4.5V, the first test is electric
It is 3.3V to press the voltage value of Vin1, and but not limited to this.When it is high level to control signal Ctrl, output module 130 is by second
Test voltage Vin2 is as output test voltage Vout, and when it is low level to control signal Ctrl, output module 130 is surveyed first
Voltage Vin1 is tried as output test voltage Vout.
Fig. 4 shows the work schedule schematic diagram of the test circuit of second embodiment of the invention.
The operation principle of the test circuit 200 of second embodiment of the invention is carried out specifically referring to Fig. 2 and Fig. 4
It is bright.
As shown in Fig. 2, voltage generation module 220 is for obtaining the second test voltage Vin2, it is preferable that adjusting can be passed through
Swept resistance VR changes the voltage value of the second test voltage Vin2.Meanwhile second the voltage value of test voltage Vin2 be more than the
The voltage value of one test voltage Vin1, as shown in figure 4, the voltage value of the second test voltage Vin2 is 4.5V, the first test voltage
The voltage value of Vin1 is 3.3V.Second electrical level conversion module 240 is used to provide trigger signal according to the first test voltage Vin1, when
When trigger signal is effective, signal processor 212 will produce a pulse signal with certain duty ratio, it is preferable that the pulse
The duty ratio of signal can be adjusted, and those skilled in the art can carry out the duty ratio of strobe pulse signal as the case may be.
The pulse signal that first level shifting circuit 213 is used to be provided according to signal processor 212 obtains control signal Ctrl.Work as control
When signal Ctrl is high level, output module 230 is using the second test voltage Vin2 as output test voltage Vout, when control is believed
When number Ctrl is low level, output module 230 is using the first test voltage Vin1 as exporting test voltage Vout.
In conclusion test circuit provided in an embodiment of the present invention, control signal is generated according to trigger signal, when control is believed
Number be high level when, output module export the second test voltage, when control signal be low level when, output module output first survey
Try voltage.Test voltage can be automatically adjusted, the working efficiency of test is improved.
It should be noted that herein, relational terms such as first and second and the like are used merely to a reality
Body or operation are distinguished with another entity or operation, are deposited without necessarily requiring or implying between these entities or operation
In any actual relationship or order or sequence.Moreover, the terms "include", "comprise" or any other variant be intended to it is non-
It is exclusive to include, so that the process, method, article or equipment including a series of elements includes not only those elements,
But also include other elements that are not explicitly listed, or further include solid by this process, method, article or equipment
Some elements.In the absence of more restrictions, the element limited by sentence "including a ...", it is not excluded that including
There is also other identical elements in the process, method, article or equipment of the element.
As described above according to the embodiment of the present invention, there is no all details of detailed descriptionthe for these embodiments, also not
Limit the specific embodiment that the invention is only described.Obviously, as described above, can make many modifications and variations.This explanation
These embodiments are chosen and specifically described to book, is in order to preferably explain the principle of the present invention and practical application, belonging to making
Technical field technical staff can utilize modification of the invention and on the basis of the present invention to use well.The present invention is only by right
The limitation of claim and its full scope and equivalent.
Claims (9)
1. a kind of test circuit for liquid crystal display, which is characterized in that including：
Signal processor generates pulse signal for receiving trigger signal according to the trigger signal；
First level shifting circuit is connected with the signal processor, for receiving the pulse signal, is believed according to the pulse
Number obtain the control signal；And
Output module is connected with first level shifting circuit, for receiving the control signal, the first test voltage and
Two test voltages provide one of the first test voltage and the second test voltage as output test electricity according to the control signal
Pressure, wherein the voltage value of second test voltage is more than the voltage value of first test voltage.
2. test circuit according to claim 1, which is characterized in that further include voltage generation module, the voltage generates
Module is connected with the output module, and for receiving supply voltage, second test voltage is generated according to the supply voltage.
3. test circuit according to claim 1, which is characterized in that the output module includes：
First switch pipe, the control terminal of the first switch pipe are connected with first level shifting circuit to receive the control
Signal, the first path terminal are connected with the voltage generation module to receive second test voltage；
Second switch pipe, the control terminal of the second switch pipe are connected with first level shifting circuit to receive the control
Signal, alternate path end receive first test voltage；
First path terminal of the first switch pipe is connected with the alternate path end of the second switch pipe to provide the output
Test voltage,
When the control signal is effective, the first switch pipe conducting, when the control invalidating signal, the second switch pipe is led
It is logical.
4. test circuit according to claim 2, which is characterized in that the voltage generation module includes：
First resistor, variable resistance and the second resistance being sequentially connected in series between supply voltage and ground, the variable resistance
Adjustable side is connected to the node between variable resistance and second resistance；
Operational amplifier, the section between the normal phase input end of the operational amplifier and the second resistance and the variable resistance
Point is connected, and inverting input is connected with output end, and the output end is for providing second test voltage；
Capacitance, the first end of the capacitance are connected with the adjustable side of the variable resistance, second end ground connection.
5. test circuit according to claim 1, which is characterized in that the trigger signal includes line synchronising signal, wherein
The control module is set as keeping the control signal effective in the rising edge of the line synchronising signal, in the line synchronising signal
Failing edge make the control invalidating signal.
6. test circuit according to claim 1, which is characterized in that further include second electrical level conversion circuit, for receiving
First test voltage generates the trigger signal according to first test voltage, effective in first test voltage
When, the trigger signal is effective.
7. test circuit according to claim 1, which is characterized in that further include reduction voltage circuit, for receiving supply voltage,
The operating voltage of the signal processor is generated according to the supply voltage.
8. test circuit according to claim 4, which is characterized in that the variable resistance includes swept resistance, it is described can
The adjustable side for becoming resistance includes the sliding end of swept resistance.
9. test circuit according to claim 3, which is characterized in that the first switch pipe is p-type field-effect tube, described
Second switch pipe is N-type field-effect tube.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810217305.6A CN108615490B (en) | 2018-03-16 | 2018-03-16 | Test circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810217305.6A CN108615490B (en) | 2018-03-16 | 2018-03-16 | Test circuit |
Publications (2)
| Publication Number | Publication Date |
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| CN108615490A true CN108615490A (en) | 2018-10-02 |
| CN108615490B CN108615490B (en) | 2022-03-01 |
Family
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|---|---|---|---|
| CN201810217305.6A Active CN108615490B (en) | 2018-03-16 | 2018-03-16 | Test circuit |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020093447A1 (en) * | 2018-11-09 | 2020-05-14 | 惠科股份有限公司 | Driver circuit of display device |
| CN111855154A (en) * | 2020-07-22 | 2020-10-30 | 格力电器（郑州）有限公司 | A liquid crystal screen testing device with liquid crystal screen equipment and its testing method |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001133487A (en) * | 1999-11-01 | 2001-05-18 | Mitsubishi Heavy Ind Ltd | Potential sensor |
| CN1744440A (en) * | 2004-08-05 | 2006-03-08 | 索尼株式会社 | Level shifting, supply voltage generation, shifting, shift register circuits, and display devices |
| CN1975848A (en) * | 2005-11-28 | 2007-06-06 | 元太科技工业股份有限公司 | Common voltage setting circuit and method |
| CN101196629A (en) * | 2006-12-07 | 2008-06-11 | Lg.菲利浦Lcd株式会社 | Liquid crystal display device and driving method thereof |
| US20080150856A1 (en) * | 2006-12-22 | 2008-06-26 | Samsung Electronics Co., Ltd. | Liquid crystal display, connector and method of testing the liquid crystal display |
| CN101282115A (en) * | 2007-04-05 | 2008-10-08 | 松下电器产业株式会社 | multi-channel semiconductor integrated circuit |
| US20110205221A1 (en) * | 2010-02-19 | 2011-08-25 | Chih-Lung Lin | Display and compensation circuit therefor |
| CN102201214A (en) * | 2011-04-12 | 2011-09-28 | 友达光电股份有限公司 | Scanning line driving device of liquid crystal display |
| CN102323844A (en) * | 2011-06-20 | 2012-01-18 | 旭曜科技股份有限公司 | Conversion system with wide output range |
| CN104078018A (en) * | 2014-07-15 | 2014-10-01 | 苏州华兴源创电子科技有限公司 | Full-high-definition liquid crystal array drive circuit |
| CN106782237A (en) * | 2016-12-14 | 2017-05-31 | 深圳Tcl新技术有限公司 | The test device of lcd panel test plate and television set |
| CN106847141A (en) * | 2016-12-29 | 2017-06-13 | 深圳市宇顺电子股份有限公司 | A kind of display screen test circuit |
-
2018
- 2018-03-16 CN CN201810217305.6A patent/CN108615490B/en active Active
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001133487A (en) * | 1999-11-01 | 2001-05-18 | Mitsubishi Heavy Ind Ltd | Potential sensor |
| CN1744440A (en) * | 2004-08-05 | 2006-03-08 | 索尼株式会社 | Level shifting, supply voltage generation, shifting, shift register circuits, and display devices |
| CN1975848A (en) * | 2005-11-28 | 2007-06-06 | 元太科技工业股份有限公司 | Common voltage setting circuit and method |
| CN101196629A (en) * | 2006-12-07 | 2008-06-11 | Lg.菲利浦Lcd株式会社 | Liquid crystal display device and driving method thereof |
| US20080150856A1 (en) * | 2006-12-22 | 2008-06-26 | Samsung Electronics Co., Ltd. | Liquid crystal display, connector and method of testing the liquid crystal display |
| KR100843148B1 (en) * | 2006-12-22 | 2008-07-02 | 삼성전자주식회사 | Liquid crystal display device, connector for test of liquid crystal display device and test method thereof |
| CN101282115A (en) * | 2007-04-05 | 2008-10-08 | 松下电器产业株式会社 | multi-channel semiconductor integrated circuit |
| US20110205221A1 (en) * | 2010-02-19 | 2011-08-25 | Chih-Lung Lin | Display and compensation circuit therefor |
| CN102201214A (en) * | 2011-04-12 | 2011-09-28 | 友达光电股份有限公司 | Scanning line driving device of liquid crystal display |
| CN102323844A (en) * | 2011-06-20 | 2012-01-18 | 旭曜科技股份有限公司 | Conversion system with wide output range |
| CN104078018A (en) * | 2014-07-15 | 2014-10-01 | 苏州华兴源创电子科技有限公司 | Full-high-definition liquid crystal array drive circuit |
| CN106782237A (en) * | 2016-12-14 | 2017-05-31 | 深圳Tcl新技术有限公司 | The test device of lcd panel test plate and television set |
| CN106847141A (en) * | 2016-12-29 | 2017-06-13 | 深圳市宇顺电子股份有限公司 | A kind of display screen test circuit |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020093447A1 (en) * | 2018-11-09 | 2020-05-14 | 惠科股份有限公司 | Driver circuit of display device |
| US11210974B2 (en) * | 2018-11-09 | 2021-12-28 | HKC Corporation Limited | Driving circuit of display apparatus |
| CN111855154A (en) * | 2020-07-22 | 2020-10-30 | 格力电器（郑州）有限公司 | A liquid crystal screen testing device with liquid crystal screen equipment and its testing method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108615490B (en) | 2022-03-01 |
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