CN108169785A - A kind of component Space Radiation Effects detection device - Google Patents

Abstract

The invention discloses a kind of component Space Radiation Effects detection devices, increase radiation environment probe, while the in-orbit experiment of progress electronic component, obtain the space radiation environment information of current position in real time.The present invention combines the space radiation environment measured in real time and tested component is examined, and improves the precision of electronic component space environment adaptability teaching.

Description

A device for detecting space radiation effects of components

technical field

The invention relates to the technical field of space environment detection, in particular to a device combining electronic components and space radiation environment detection.

Background technique

The on-orbit verification of domestic electronic components is one of the important tasks of spaceborne experiments. The main purpose of on-orbit verification of electronic components is to assess the radiation resistance of electronic components in the space radiation environment. For example, the space radiation effect experimental unit carried in our satellites assesses the space adaptability of electronic components under the action of space radiation, so as to provide support for the evaluation of future electronic components in orbit. In the design of the experimental device, the detection circuit is mainly designed around the device under test. The detection circuit can detect the voltage, current, and single event upset of the device under test in real time. This is also the mainstream design method for component experimental devices at present. Since the space radiation environment is often different at different locations and at different times in space, this method only assesses electronic components under space radiation conditions, but fails to combine the information of the space environment on orbit. Therefore, the assessment results are somewhat inaccurate Spend.

Contents of the invention

In view of this, the present invention provides a device for detecting the space radiation effect of components, which evaluates the tested components in combination with the space radiation environment measured in real time, and improves the accuracy of evaluating the space environment adaptability of electronic components.

Specific embodiments of the present invention are as follows:

A component space radiation effect detection device, the detection device includes a radiation environment probe, a component detection module, an amplification module, a control module, a power module and a casing;

The radiation environment probe is used to detect space radiation environment information and transmit it to the amplification module; the component detection module is used to detect the voltage, current and single event effect information of the measured components and transmit it to the amplification module; The radiation environment probe and component detection module are arranged in parallel above the inside of the casing;

The amplification module is in one-to-one correspondence with the radiation environment probe and the component detection module, including the probe amplification module and the component amplification module; the probe amplification module is used to amplify and process the space radiation environment information and identify effective particle events, and then transmit them to the control Module; the component amplification module is used to amplify and process voltage, current and single event effect information and transmit them to the control module;

The control module identifies effective single event effect information according to the amplified processed voltage, current and single event effect information and controls the component detection module to work normally, and at the same time transmits the collected output information of the amplifying module to an external satellite platform;

The power supply module supplies pressure to the component detection module, the amplification module and the control module, and independently supplies pressure to the radiation environment probe.

Further, the radiation environment probes include LET probes and proton probes.

Further, the LET probes include low LET probes and high LET probes.

Further, the low LET probe, the high LET probe and the proton probe are respectively connected to corresponding amplification modules.

Beneficial effect:

1. The present invention adds a radiation environment probe, which solves the problem of combining the verification of the space radiation effect of electronic components with the real radiation environment in space, improves the accuracy of the evaluation of the space environment adaptability of electronic components, and improves the space adaptability of electronic components. The evaluation provides a new carrier; in addition to meeting the requirements of component verification, it can also meet the needs of scientific detection of space radiation environment. At the same time, the radiation environment probe and the amplification module are independent of each other, small in size and easy to install.

2. The LET probes of the present invention include low LET probes and high LET probes, and different probes are used to detect different spectral bands, so that the detection results are more accurate.

3. The structure of the LET probe and the proton probe of the present invention are independent, respectively connected to the corresponding amplification modules, small in size, and convenient for installation and debugging.

Description of drawings

Fig. 1 is the composition schematic diagram of the present invention;

Fig. 2 is a structural perspective view of the present invention;

Fig. 3 is a structural perspective view of different viewing angles in Fig. 2;

Fig. 4 is a side view of the present invention;

Fig. 5 is a top view of the present invention;

Figure 6 is a schematic diagram of the composition of the probe amplification module;

Figure 7 is a schematic diagram of the power supply module of the device;

Fig. 8 is a schematic diagram of a high voltage generating circuit module.

Among them, 1-radiation environment probe, 2-component detection module, 3-amplification module, 4-control module, 5-power supply module, 6-casing, 7-connecting screw.

Detailed ways

The present invention will be described in detail below with reference to the accompanying drawings and examples.

The present invention provides a detection device for space radiation effects of components, as shown in Figure 1, Figure 2, and Figure 3, the detection device includes a radiation environment probe 1, a component detection module 2, an amplification module 3, a control module 4, and a power supply module 5 and casing 6, the front cover and back cover of casing 6 are fixedly connected by connecting screw rod 7.

The radiation environment probe 1 is used to obtain space radiation environment data; the radiation environment probe 1 includes a LET probe and a proton probe, and the LET probe includes a low LET probe and a high LET probe. The three probes are respectively installed in independent structures, and each is connected to the corresponding amplifying module 3 through lead-out wires. The amplification module 3 is independent, which can reduce the volume of the whole device.

The low LET probe mainly detects the LET spectrum of 0.01-0.1MeV/mg/cm ² ; the high LET probe mainly detects the LET spectrum of 0.1-37MeV/mg/cm ² . Both the low LET probe and the high LET probe adopt the lens barrel structure of the telescope, and the two silicon sensors are equivalent to the eyepiece and objective lens of the telescope. Geometry factor G of a cylindrical telescope:

Among them, R ₀ is the sensor radius, θ ₀ is the detection field of view, and tg is the tangent trigonometric function.

The relationship between the LET spectrum and the average flux can be obtained through simulation, and the effective diameter, field angle, and geometric factors of the semiconductor sensor are determined by comprehensively considering the detector size, particle count, and detection field of view. Considering factors such as deposition energy and mechanical environment, the thickness of the semiconductor sensor is selected, and the thickness of the two silicon sensors used in each group of LET probes is 300um. The space particles incident on the sensor with different LET values have different loss energy ΔE in the sensor, and the deposited energy of the particles in the sensor increases linearly with the LET value.

Based on the simulation and calculation results, the relationship between LET spectrum, energy loss, generated charge and particle count is further obtained. These parameters will provide reference for subsequent circuit design.

The proton probe consists of an entrance window, a collimator, and two ion-implanted semiconductor sensors, which are equivalent to the eyepiece and objective lens of the telescope. Through the simulation, the relationship between the spatial proton spectrum and the average flux can be obtained, and the particle count, sensor size, detection field of view and other factors are comprehensively considered to determine the effective diameter, field of view, and geometric factors of the semiconductor sensor, and give the particle count.

After multiple simulations and considering reducing the pollution caused by electrons during measurement (the deposition energy of electrons in the detector overlaps with the deposition energy of protons), the thickness of each semiconductor sensor is finally determined. The thickness of the two silicon sensors used is 1000um.

Combining the above simulation and calculation results, the relationship between the detection proton spectrum, energy loss and particle count is obtained, and the deposition energy and charge generation of protons with different energies in the silicon sensor are given, as well as the particle count corresponding to each energy channel, as The following circuit design provides input.

The component detection module 2 is used to detect the voltage, current and single event effect information of the components under test. It is composed of the electronic components under test and electronic modules. The radiation environment probe 1 and the component detection module 2 are arranged in parallel inside the casing 6 On the top, the component detection module 2 includes a plurality of electronic components to be tested, and the electronic components are arranged on the top of the casing 6, and there is no other shielding on the top except the equipment casing 6, as shown in Figure 4; the radiation environment probe 1 The incident windows of the three sub-probes, the low-LET probe, the high-LET probe and the proton probe, are embedded in the equipment casing 6 and parallel to the upper surface of the electronic components near the top of the casing 6 to ensure the detection of space particles in the same direction, as shown in Figure 5 shown.

The electronic module includes a memory refresh access submodule, a working current detection submodule and a working power supply control submodule.

Memory refresh access sub-module: regularly read and refresh memory data through the control module 4, and detect the single event flipping caused by the single event effect in the storage area;

Working current detection sub-module: regularly collect the working current of the tested components through the control module 4, and detect the single event locking caused by the single event effect;

Working power supply control sub-module: When the working state of the tested components is abnormal due to single particle lock, etc., the control module 4 controls the on-off of the working power of the tested components, realizes functions such as unlocking, and restores the components to normal work state.

The amplification module 3 corresponds to the radiation environment probe 1 and the component detection module 2 one by one, and includes a probe amplification module and a component amplification module. The probe amplification module is used to amplify and process space radiation environment information and identify effective particle events, and then transmit it to the control module 4; the component amplification module is used to amplify and process voltage, current and single event effect information and transmit it to the control module 4, single event The effect information mainly includes single event reversal information and single event locking information, etc., and the single event reversal information can be directly transmitted to the control module 4 without going through the amplification module 3 .

Wherein, the probe amplifying module includes circuits such as amplification, shaping, and peak hold of the electrical signal output by the probe, so that the electrical signal output by the probe can be collected by the control module 4 after conditioning. As shown in Figure 6, it includes a main amplifier circuit, an effective particle event determination circuit, a peak hold circuit and an engineering parameter detection circuit.

The main amplifier circuit further amplifies the output signal of the probe preamplifier circuit and forms a quasi-Gaussian shape.

The effective particle event determination circuit compares with the trigger threshold set by the control module 4 to identify effective particle events, generates a trigger pulse, and notifies the control module 4 of the occurrence of effective particle events.

The peak hold circuit holds the peak value of the pulse generated by the main amplifier so that the AD converter can collect it. After the AD acquisition is completed, the peak signal is cleared to keep the pulse peak value of the next particle event.

The engineering parameter detection circuit includes a sensor characteristic detection circuit, a power supply detection circuit and a temperature detection circuit.

The control module 4 sets the trigger thresholds of effective particle events and single event effects, and identifies effective single event effect information according to the amplified processed voltage, current and single event effect information to control the component detection module 2 to work normally. When an abnormality occurs under the single event effect, the control module 4 controls the on-off of the working power of the component under test, realizes functions such as unlocking, and restores the component to a normal working state; at the same time, the collected output information of the amplification module 3 is transmitted to the external satellite platform , Complete detection data collection, component working parameter collection, system function control, etc. It can complete the initialization of the system, control the reading and writing and refreshing of the tested components, complete the monitoring and control of the working status of each module, collect various data and communicate with the spacecraft platform, and complete the reception and analysis of data and instructions at the same time and execute.

The power supply module 5 includes two independent modules, namely: a device power supply module and a high voltage generation circuit module. On the one hand, it supplies power to the equipment, that is, the component detection module 2 , the amplification module 3 and the control module 4 , and on the other hand, it independently provides high bias voltage for the radiation environment probe 1 .

The equipment power supply module converts the external power supply into +5.2V and ±12V secondary power supplies required by the equipment. This module mainly includes: overcurrent protection circuit, surge suppression circuit, filter and DC/DC module, as shown in Figure 7. The external power supply provides a voltage of 28V, which is sequentially processed by the current protection circuit, surge suppression circuit, filter and DC/DC module, and outputs +5.2V and ±12V secondary power respectively.

High-voltage generation circuit module, with +5.2V as the input to provide high-voltage bias for the equipment probe, about 150V and 60V, the entire high-voltage generation circuit can be divided into an oscillation transformer module, a voltage doubler rectifier and filter module, an error feedback module and a telemetry output module, as shown in Figure 8. The voltage doubler rectifier and filter module are respectively connected to the error feedback module and the telemetry output module, the telemetry output module outputs the telemetry signal and communicates with the outside, the error feedback module provides feedback for the oscillation transformer module, and the oscillation transformer module controls the voltage doubler rectifier and filter according to the feedback module, the voltage doubler rectifier and filter module output high voltage under the control of the oscillation transformer module.

To sum up, the above are only preferred embodiments of the present invention, and are not intended to limit the protection scope of the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention shall be included within the protection scope of the present invention.

Claims (4)

1. A component space radiation effect detection device, characterized in that, the detection device comprises a radiation environment probe, a component detection module, an amplification module, a control module, a power supply module and a casing; The radiation environment probe is used to detect space radiation environment information and transmit it to the amplification module; the component detection module is used to detect the voltage, current and single event effect information of the measured components and transmit it to the amplification module; The radiation environment probe and component detection module are arranged in parallel above the inside of the casing; The amplification module corresponds to the radiation environment probe and the component detection module one by one, including the probe amplification module and the component amplification module; the probe amplification module is used to amplify and process the space radiation environment information and identify effective particle events, and then transmit it to the control module ;The component amplification module is used to amplify and process voltage, current and single event effect information and transmit them to the control module; The control module identifies effective single event effect information according to the amplified processed voltage, current and single event effect information and controls the component detection module to work normally, and at the same time transmits the collected output information of the amplifying module to an external satellite platform; The power supply module supplies pressure to the component detection module, the amplification module and the control module, and independently supplies pressure to the radiation environment probe. 2 . The device for detecting radiation effects in space of components according to claim 1 , wherein the radiation environment probes include LET probes and proton probes. 3 . 3. The device for detecting space radiation effects of components according to claim 2, wherein the LET probe includes a low LET probe and a high LET probe. 4 . The device for detecting space radiation effects of components according to claim 3 , wherein the low LET probe, the high LET probe and the proton probe are respectively connected to corresponding amplification modules.