CN108169656A - A kind of RF IC test equipment - Google Patents
A kind of RF IC test equipment Download PDFInfo
- Publication number
- CN108169656A CN108169656A CN201611114602.5A CN201611114602A CN108169656A CN 108169656 A CN108169656 A CN 108169656A CN 201611114602 A CN201611114602 A CN 201611114602A CN 108169656 A CN108169656 A CN 108169656A
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- CN
- China
- Prior art keywords
- module
- test equipment
- host computer
- erecting bed
- test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The present invention relates to test equipment, more particularly to RF IC test equipment.A kind of RF IC test equipment including host computer, interchanger, PXI cabinets and interface system, test equipment and device erecting bed, is provided with CPU module, interface module, circuit function setup module and parametric testing module in the host computer；Interface module is used to connect with interface system；Circuit function setup module is used to that the operating mode for testing system to be configured and selected；Parametric testing module carries out corresponding power function setting for selecting test parameter, to test parameter；Test equipment reads the data of RF IC to be measured by device erecting bed, is output to host computer.The advantageous effect of RF IC test equipment of the present invention is：The compatible multiple interfaces of the present invention, various protocols are, it can be achieved that multi-functional, entry multiplexing, due to being provided with transmission line calibration module, ensure that measuring accuracy.
Description
Technical field
The present invention relates to test equipment, more particularly to RF IC test equipment.
Background technology
With the development of integrated circuit, increasingly tend to numerical model analysis monolithic integrated optical circuit.Pass through number inside circuit
Function module controls analog portion, therefore for the test analysis of integrated circuit, it is necessary first to verify digital function mould
Block portion point, to reach the normal work that analog portion is controlled by digital function module.It is internally integrated due to different circuits
Digital function module is simultaneously different, including I2C communication protocols, SPI serial communication protocols, logic level control etc..And
It is right
In RF IC, according to receiving channel, the transmission channel unit different from frequency synthesizer etc., parameter index otherness compared with
Greatly.
Therefore it for different circuits, needs that the hardware components for testing system are fabricated separately, it is more to expend the time.
At present, test system control combination of the prior art is mainly by switch, protective device, connector and corresponding attached
Belong to mechanical structure to form.In design, these combinations are generally using customizations design architecture, the development of each test system model
It is often required for powering up control combination to it and be customized, lead to the power-up control as Auto-Test System corollary equipment
Combination
A large amount of unnecessary man power and materials are expended, do not adapt to the short production requirement of testing field system development cycle completely.
Invention content
The object of the present invention is to provide RF IC test equipments, in order to achieve the object of the present invention, the skill of use
Art scheme is：
A kind of RF IC test equipment, including host computer, interchanger, PXI cabinets and interface system, test equipment and device
Part erecting bed is provided with CPU module, interface module, circuit function setup module and parameter testing in the host computer
Module；Interface module is used to connect with interface system；Circuit function setup module is used to carry out the operating mode for testing system
It is provided and selected；Parametric testing module carries out corresponding power function for selecting test parameter, to test parameter and sets
It puts；The function call of automatic test is provided；Control is written and read to test equipment；It is qualified or not to test result progress to sentence
Break and indicated；The host computer, interchanger, PXI cabinets are connected by interface system；RF IC to be measured is mounted on
On device erecting bed, RF IC to be measured is communicated by device erecting bed and interface system with host computer, also, is treated
RF IC is surveyed to output signals to test equipment by device erecting bed or receive the signal that test equipment exports；Test
Instrument receives the signal of the parametric testing module output of host computer, and the number of RF IC to be measured is read by device erecting bed
According to being output to host computer.By network interface system, test device erecting bed and host computer are linked together, device installation
Platform, which can be realized, is read out the data of mainboard to be tested, and data are then transferred to host computer.
Further, circuit function setup module is additionally operable to post the RF IC to be measured for having register manipulation
The Read-write Catrol of storage；And data transmission to CPU module bus interface corresponding with device erecting bed is read, into
Host computer is sent to by interface system after row processing.
Further, the interface module includes serial port module and parallel port module, and the parallel port module passes through conversion circuit
Control is written and read to RF IC to be measured with device erecting bed；The conversion circuit exports the parallel port module of host computer
Level signal converted after RF IC to be measured is output to by device erecting bed；And radio frequency to be measured is integrated into electricity
Road is output to host computer after being converted by the data that device erecting bed exports.
Further, it is additionally provided with transmission line calibration module in the host computer；Transmission line calibration module is used for radio frequency
The test cable that port uses is calibrated, and calibration data is stored, and provides calibration data to parametric testing module.
Further, the device erecting bed includes power-feed connector, and the power-feed connector connects including supply input
Connect device, power supply out connector and power supply control connector.
Further, the device erecting bed has further included emergency stop button.It is tight by being set on device erecting bed
Anxious stop button, as the stringent effort being abnormal in mainboard test process.
Further, the interface system includes LAN, RS485, MXI-4.
The advantageous effect of RF IC test equipment of the present invention is：It is the compatible multiple interfaces of the present invention, a variety of
Agreement, due to being provided with transmission line calibration module, ensure that measuring accuracy, it can be achieved that multi-functional, entry multiplexing；The present invention
Easy to use, function is more, efficient, can realize automatic test, can be widely applied to radio-frequency receiving-transmitting channel, frequency synthesizer, modulator
Control and test analysis with the radio circuits such as demodulator, have a good application prospect.
Description of the drawings
Fig. 1 is the functional block diagram of radio frequency integrated circuit test system of the present invention.
Fig. 2 is the structure chart of radio frequency integrated circuit test system of the present invention.
Specific embodiment
Referring to Fig. 1, radio frequency integrated circuit test system is by kind of a RF IC test equipment, by host computer 1, interchanger
2nd, PXI cabinets 3 and interface system 4, test equipment 5 and device erecting bed 6 are formed；Wherein：Interface is provided in host computer 1
Module 12, circuit function setup module 13, parametric testing module 15, parallel port module 11 and transmission line calibration module 14, wherein：
Serial port module 121 communicates for host computer 1 with central processing unit 11；Circuit function setup module 13 is used for test
The operating mode of system is configured and selects；Including being used to be configured the bus operation mode for testing system；To be measured
The receiving and transmitting mode of RF IC carries out selection setting；The circuit gain of RF IC to be measured is selected
Control；The selection gated to the switching circuit of RF IC to be measured；Circuit function setup module（13）It is additionally operable to pair
The RF IC to be measured for having register manipulation carries out the Read-write Catrol of register；Parametric testing module 15 is used for test
Parameter is selected, and corresponding power function setting is carried out to test parameter；The calling of general purpose interface bus is provided；It provides automatic
Change the function call of test；Control is written and read to test equipment 5；Qualified or not judgement and progress are carried out to test result
Instruction；Test result is shown and is stored；Transmission line calibration module 14 be used for the test cable that prevention at radio-frequency port uses into
Row calibration, stores calibration data, and provide calibration data to parametric testing module.
Parallel port module 122 is written and read control by conversion circuit and device erecting bed 6 to RF IC to be measured；
The conversion circuit is installed after the level signal that the parallel port module 122 of host computer 1 exports is converted by testing device
Platform 6 is output to RF IC to be measured；And by RF IC to be measured by the data that device erecting bed 6 exports into
Host computer 1 is output to after row conversion.
RF IC to be measured be mounted on device erecting bed 6 on, RF IC to be measured by device erecting bed 6 with
Host computer 1 is communicated, also, RF IC to be measured by device erecting bed 6 output signals to test equipment 5 or
Person receives the signal that test equipment 5 exports；Test equipment 5 receives the signal that the parametric testing module 15 of host computer 1 exports,
The data of RF IC to be measured are read by device erecting bed 6, are output to host computer 1.
The specific embodiment of the present invention has been carried out above to retouch last should be noted that：Above example is only to illustrate
The present invention and not limit technical solution described in the invention；Therefore, although this specification is with reference to above-mentioned each embodiment
To present invention has been detailed description, still, it will be understood by those of ordinary skill in the art that, it still can be to the present invention
It modifies or equivalent replacement；And all do not depart from technical solution and its improvement of the spirit and scope of the present invention, should all contain
It covers in scope of the presently claimed invention.
Claims (7)
1. a kind of RF IC test equipment, including host computer（1）, interchanger（2）, PXI cabinets（3）And interface system
（4）, test equipment（5）, device erecting bed（6）And central processing unit（7）, it is characterised in that：The host computer（1）In be provided with
CPU module（11）, interface module（12）, circuit function setup module（13）And parametric testing module（15）；Interface mould
Block（12）For and interface system（4）Connection；Circuit function setup module（13）For being carried out to the operating mode for testing system
It is provided and selected；Parametric testing module（15）For selecting test parameter, corresponding function letter is carried out to test parameter
Number setting；The function call of automatic test is provided；To test equipment（5）It is written and read control；It is qualified that test result is carried out
Whether judgement and indicated；The host computer（1）, interchanger（2）, PXI cabinets（3）Pass through interface system（4）Connection；It treats
It surveys RF IC and is mounted on device erecting bed（6）On, RF IC to be measured passes through device erecting bed（6）With interface system
System（2）With host computer（1）It is communicated, also, RF IC to be measured passes through device erecting bed（6）Output signals to test
Instrument（5）Or receive test equipment（5）The signal of output；Test equipment（5）Receive host computer（1）Parametric testing module it is defeated
The signal gone out passes through device erecting bed（6）The data of RF IC to be measured are read, are output to host computer（1）.
2. the RF IC test equipment according to claim 1, it is characterised in that：Circuit function setup module
（13）It is additionally operable to the Read-write Catrol to there is the RF IC to be measured of register manipulation to carry out register；And data transmission is arrived
CPU module（7）With device erecting bed（6）Corresponding bus interface is read, and passes through interface system after being handled（4）
It is sent to host computer（1）.
3. the RF IC test equipment according to claim 1 or 2, it is characterised in that：The interface module
（12）Including serial port module（121）With parallel port module（122）, the parallel port module（122）It is installed by conversion circuit and device
Platform（6）Control is written and read to RF IC to be measured；The conversion circuit is by host computer（1）Parallel port module（122）It is defeated
The level signal gone out converted after by device erecting bed（6）It is output to RF IC to be measured；And by radio frequency to be measured
Integrated circuit passes through device erecting bed（6）The data of output are output to host computer after being converted（1）.
4. the RF IC test equipment according to claim 3, it is characterised in that：The host computer（1）In also set
It is equipped with transmission line calibration module（14）；Transmission line calibration module（14）Test cable for using prevention at radio-frequency port carries out school
Standard stores calibration data, and provides calibration data to parametric testing module（15）.
5. the RF IC test equipment according to claim 1, it is characterised in that：The device erecting bed（6）Packet
Power-feed connector is included（61）, the power-feed connector（61）Including supply input connector, power supply out connector and power supply
Control connector.
6. the RF IC test equipment according to claim 1, it is characterised in that：The device erecting bed（6）Also
Include emergency stop button.
7. the RF IC test equipment according to claim 1, it is characterised in that：The interface system（4）Including
LAN、RS485、MXI-4。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611114602.5A CN108169656A (en) | 2016-12-07 | 2016-12-07 | A kind of RF IC test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611114602.5A CN108169656A (en) | 2016-12-07 | 2016-12-07 | A kind of RF IC test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108169656A true CN108169656A (en) | 2018-06-15 |
Family
ID=62526357
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201611114602.5A Pending CN108169656A (en) | 2016-12-07 | 2016-12-07 | A kind of RF IC test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108169656A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111521924A (en) * | 2020-04-29 | 2020-08-11 | 西安博瑞集信电子科技有限公司 | Automatic testing method for small portable detachable chip product |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102495353A (en) * | 2011-12-27 | 2012-06-13 | 重庆西南集成电路设计有限责任公司 | Radio frequency integrated circuit test system and control method thereof |
| CN202393878U (en) * | 2011-12-27 | 2012-08-22 | 重庆西南集成电路设计有限责任公司 | Testing system of radio frequency integrated circuit |
| CN106160890A (en) * | 2015-03-27 | 2016-11-23 | 江苏艾科半导体有限公司 | A kind of RF IC test equipment |
-
2016
- 2016-12-07 CN CN201611114602.5A patent/CN108169656A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102495353A (en) * | 2011-12-27 | 2012-06-13 | 重庆西南集成电路设计有限责任公司 | Radio frequency integrated circuit test system and control method thereof |
| CN202393878U (en) * | 2011-12-27 | 2012-08-22 | 重庆西南集成电路设计有限责任公司 | Testing system of radio frequency integrated circuit |
| CN106160890A (en) * | 2015-03-27 | 2016-11-23 | 江苏艾科半导体有限公司 | A kind of RF IC test equipment |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111521924A (en) * | 2020-04-29 | 2020-08-11 | 西安博瑞集信电子科技有限公司 | Automatic testing method for small portable detachable chip product |
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Application publication date: 20180615 |